Assay processing system
- Cepheid
Latest Cepheid Patents:
- UNIVERSAL ASSAY CARTRIDGE AND METHODS OF USE
- DIAGNOSTIC DETECTION CHIP DEVICES AND METHODS OF MANUFACTURE AND ASSEMBLY
- Transfer learning methods and models facilitating defect detection
- SYSTEM, DEVICE AND METHODS OF SAMPLE PROCESSING USING SEMICONDUCTOR DETECTION CHIPS
- Diagnostic detection chip devices and methods of manufacture and assembly
Description
The broken lines immediately adjacent the shaded areas represent the bounds of the claim, while all other broken lines are directed to environment the broken lines form no part of the claimed design.
Claims
The ornamental design for an assay processing system, as shown and described.
Referenced Cited
U.S. Patent Documents
Patent History
Patent number: D907793
Type: Grant
Filed: May 16, 2018
Date of Patent: Jan 12, 2021
Assignee: Cepheid (Sunnyvale, CA)
Inventors: Ronald Chang (Redwood City, CA), Steven M. Montgomery (Los Angeles, CA), Gregory Mote (Sunnyvale, CA)
Primary Examiner: Anhdao Doan
Application Number: 29/647,906
Type: Grant
Filed: May 16, 2018
Date of Patent: Jan 12, 2021
Assignee: Cepheid (Sunnyvale, CA)
Inventors: Ronald Chang (Redwood City, CA), Steven M. Montgomery (Los Angeles, CA), Gregory Mote (Sunnyvale, CA)
Primary Examiner: Anhdao Doan
Application Number: 29/647,906
Classifications
Current U.S. Class:
Specimen Handling, Preparation Or Testing (62) (D24/216)