Electron microscope
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Description
The broken lines form no part of the claimed design.
Claims
We claim the ornamental design for an electron microscope, as shown and described.
Referenced Cited
U.S. Patent Documents
Other references
D141832 | July 1945 | Holley |
2424791 | July 1947 | Bachman et al. |
D172780 | August 1954 | Briskin et al. |
D173282 | October 1954 | Pike |
D182583 | April 1958 | Goldberg |
D182698 | April 1958 | Wells |
3202047 | August 1965 | Lawler |
3551019 | December 1970 | Michel |
D223669 | May 1972 | Nishino |
D225580 | December 1972 | Reinecke |
4210384 | July 1, 1980 | Meyer et al. |
D299861 | February 14, 1989 | Hunsdale et al. |
4812029 | March 14, 1989 | Onanhian |
D303267 | September 5, 1989 | Takahashi et al. |
D332616 | January 19, 1993 | Hashimoto et al. |
D491272 | June 8, 2004 | Alden et al. |
D516121 | February 28, 2006 | Suzuki et al. |
D572464 | July 8, 2008 | Koshiishi |
D574280 | August 5, 2008 | Wakamatsu et al. |
D591864 | May 5, 2009 | Schmidt |
D607569 | January 5, 2010 | Yukikado et al. |
D623211 | September 7, 2010 | Oonuma et al. |
- U.S. Patent Application of Oonuma et al., U.S. Appl. No. 29/343,661, filed Sep. 17, 2009.
Patent History
Patent number: D632323
Type: Grant
Filed: Mar 2, 2010
Date of Patent: Feb 8, 2011
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Mitsuru Oonuma (Tokyo), Akira Omachi (Komae), Masahiko Ajima (Hitachinaka), Tomohisa Ohtaki (Hitachinaka)
Primary Examiner: Paula Greene
Attorney: Antonelli, Terry, Stout & Kraus, LLP.
Application Number: 29/356,731
Type: Grant
Filed: Mar 2, 2010
Date of Patent: Feb 8, 2011
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Mitsuru Oonuma (Tokyo), Akira Omachi (Komae), Masahiko Ajima (Hitachinaka), Tomohisa Ohtaki (Hitachinaka)
Primary Examiner: Paula Greene
Attorney: Antonelli, Terry, Stout & Kraus, LLP.
Application Number: 29/356,731
Classifications
Current U.S. Class:
Microscope (D16/131)