Mass microscope

- Shimadzu Corporation
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Description

FIG. 1 is a perspective view of a mass microscope showing my new design;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top view thereof; and,

FIG. 7 is a bottom view thereof.

The broken line portions of the mass microscope present unclaimed portions of the claimed design and form no part thereof.

Claims

The ornamental design for a mass microscope, as shown and described.

Referenced Cited
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Patent History
Patent number: D715843
Type: Grant
Filed: Apr 30, 2013
Date of Patent: Oct 21, 2014
Assignee: Shimadzu Corporation (Kyoto)
Inventor: Jun Kawai (Kyoto)
Primary Examiner: Paula Greene
Application Number: 29/453,477
Classifications
Current U.S. Class: Microscope (D16/131)