X-ray analyzer
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Claims
The ornamental design for a X-ray analyzer, as shown and described.
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Type: Grant
Filed: Apr 21, 2020
Date of Patent: Nov 30, 2021
Assignee: SHIMADZU CORPORATION (Kyoto)
Inventor: Tomoya Sugie (Kyoto)
Primary Examiner: Anhdao Doan
Application Number: 29/732,030