Abstract: A system and associated methodology for quickly and accurately determining a remaining capacity of a battery. The system measures battery terminal voltage during each application of one or more constant power loads to the battery, and compares either the measured voltage, or an internal impedance calculated from the measured voltage, with a pre-characterization of the relationship between battery capacity and battery voltage or impedance for the given battery type and operating conditions. This relationship may be obtained from data provided by the battery manufacturer, derived empirically or otherwise determined. This relationship may be represented by data stored in memory or by a mathematical function implemented in hardware, software, firmware or a combination thereof.

Abstract: A battery protection circuit includes back-to-back connected metal-oxide-semiconductor field-effect transistors (MOSFETs). Detection circuitry detects whether the battery is in a normal charge condition, an overcharged condition, or an over-discharged condition, and for the overcharged and over-discharged conditions the circuitry asserts a corresponding enable signal. For each MOSFET, a corresponding gate voltage regulating circuit controls the gate voltage such that (i) when the corresponding enable signal is de-asserted, the gate voltage is sufficient to enable the MOSFET to strongly conduct current in either direction, and (ii) when the corresponding enable signal is asserted, the gate voltage is a function of the polarity of drain-to-source voltage of the MOSFET.

Abstract: A lead-acid battery pack has an electronically-controlled power switch connected in series with the battery. A voltage monitor/controller is connected in series with a normally-open ON/OFF switch across the battery, the controller controlling a ramped pulse width modulator which provides a switch control signal to the power switch. The controller is program controlled so that, a fraction of a second after the ON/OFF switch is closed, the modulator will provide a constant DC level control signal to the power switch to hold it closed. If the battery voltage drops below a first level for several seconds, the modulator will produce a PWM switch control signal of gradually decreasing pulse width and duty cycle until the power switch is permanently open. This gradual decrease of power delivered from the battery will occur immediately upon the battery voltage dropping below a second level lower than the first level.

Abstract: An electronic unit for charging a unit to be charged having an accumulator section which can be repeatedly charged has a charging section for charging the accumulator section according to a charging control signal and a charging control section. The charging control section monitors a battery voltage (or a charging current), and maintains an effective charging period per unit time for a long term when the battery voltage (or the charging current) of an accumulator battery is lower than a limit voltage (or the charging current corresponding to the limit voltage) selected in advance. After the battery voltage (or the charging current) reaches the limit voltage (or the charging current corresponding to the limit voltage), however, the charging control section reduces the effective charging period per unit time.

Abstract: A vehicle AC-generator controller includes a storage battery to be charged by a rectification output of an AC generator having a field coil, a voltage regulator for controlling an output voltage of the AC generator to a predetermined value by controlling a field current flowing through the field coil, an indicator lamp for indicating a power-generation state and a no-power generation state of the AC generator, an indicator-lamp driving element for turning on and off the indicator lamp, a power-supply driving element for driving power supply of the voltage regulator in accordance with a turn-on-lamp output of the indicator-lamp driving element, and a power-supply cutoff element for cutting off the power-supply driving apparatus by controlling the turn-on-lamp output to the ground potential when the AC generator is brought into the no-power-generation state.

Abstract: In a method for controlling a secondary voltage (US) in a transformer device connected to a power network with a given system frequency (f1), which transformer device comprises a tap-changer (TC) which, in dependence on a supplied control signal (RCS), influences the voltage ratio (RAT) of the transformer device, a voltage variable (uE) is formed in dependence on the secondary voltage. The voltage variable comprises at least one first control component (u1, &phgr;1) which represents a fundamental component of the secondary voltage, and a control quantity (EPV, EEV) is formed in dependence on the voltage variable. The control signal is formed in dependence on a deviation (DPV, DEV) between the control quantity and a given reference value (PVR, EVR) therefor and is supplied to the tap-changer. The actual fundamental frequency (f1*) of the power network is continuously sensed and the voltage variable is formed in dependence thereon.

Abstract: An on-chip, e.g., on a microprocessor, super filter-regulator acts as a voltage regulator and a low-pass filter. The voltage regulator generates a constant DC output voltage and regulates the DC voltage against instantaneous load changes. The low-pass filter and actively filters AC interference out of the DC output voltage. The super filter-regulator provides the filtered and regulated DC voltage to a phase locked loop circuit.

Abstract: A PWM switching power supply of the buck regulator type converts an unfiltered rectified d.c. input voltage into a regulated stepped down d.c. output voltage for use by load circuits. The power supply includes a PWM switching regulator which controls the duty cycle of an N-channel field effect transistor (FET) power switch which has its source connected to a Schottky flyback diode. The flyback diode is connected to an LC output filter which generates the stepped down output voltage. The PWM regulator includes a 555 timer operating in conjunction with an RC timing network in a modulated a stable mode. Timer 555 has an output lead electrically connected to the gate of the FET for switching the FET on/off in response to an output voltage modulating feedback input from a feedback path with the source of the FET serving as the “ground” for the PWM regulator.

Abstract: The present invention relates to a method and apparatus for reducing voltage sags in the battery supply lines of the circuit arrangement which is used to regulate or control the current input of a consumer in an automotive vehicle, wherein the consumer current is regulated or controlled by pulse-width modulation (PWM) and a controllable switch is used. To this end, a circuit is used which influences the edges of a pulse-width modulated signal, and a signal representative of the rate of change in the current in the battery supply lines to the consumer is produced. This signal is fed back to the input signal by way of a capacitor.

Abstract: In order to implement a method of graduating the dissipation of an alternating electrical power signal, provision is made to place the position (Reg3) of a period of the alternating signal in correspondence with the binary inverse (Reg4) of a digitized set-point parameter. It is shown that, in this way, the periods of dissipation are ideally distributed among the periods of non-dissipation. This has the principal effect of reducing the effects of blinking which are particularly undesirable when the rise time of the phenomenon to be controlled is short as regards the period of the alternating electrical signal.

Abstract: To measure phase noise of an output signal of a test specimen with a spectrum analyzer whose measuring branch comprises a plurality of serially-connected heterodyne stages, a compensation generator is provided which comprises a plurality of heterodyne stages arranged serially-connected in reverse order to that of the heterodyne stages of the measuring branch and which has an input oscillator which corresponds to a last intermediate frequency of the measuring branch; the output signal of this compensation generator being added to an output signal of the test specimen, having an approximate equal-value level and being approximately oppositely phased thereto, in an adder stage which is connected serially to the measuring branch.

Abstract: A method, and apparatus for accomplishing the method, for determining the frequency of an RF signal that operates by sequentially applying a received RF signal to sequentially selected individual filters having predetermined frequency pass bands and comparing the magnitudes of the filtered and unfiltered RF signals. The frequency of the RF signal is determined as being within the predetermined frequency pass band of a filter that outputs a largest magnitude output signal relative to the magnitude of the RF signal. Signals of insufficient magnitude are not processed by the system.

Abstract: A method and arrangement for determining the phase difference between two timing signals provides that the first timing signal is ed to a delay line multiple times, whereby the number of passes through the delay line is obtained. The phase difference is determined in that a first transit time information is determined that corresponds to that number of delay elements of the delay line that are passed through by the first timing signal during a differential time-span between the two timing signals. Second transit time information is further obtained corresponding to that number of delay elements passed through by the first timing signal during a timing pulse period of time second timing signal. The determination of the first and second transit time information occurs dependent on the number of total passes of the first timing signal through the delay line, respectively, which is obtained at the respective determination time.

Abstract: A power source voltage controller which can set the optimal margin for a replica circuit and shorten the time for the power source voltage to converge to the optimal value, having a replica circuit for monitoring a delay time of a critical path by propagating a reference signal having a power source voltage-delay characteristic approximately equivalent to a critical path in a semiconductor circuit, a phase difference detection circuit and an encoder receiving a delay signal by the replica circuit and the reference signal and detecting the phase difference of the delay signal from the reference signal and outputting the detection result as phase difference information, voltage control circuits for generating a power source voltage of a value based on a phase difference information signal and supplying it to the semiconductor circuit and the replica circuit, and a delay error correction circuit arranged at the input side of the reference signal of the replica circuit and correcting the delay difference with the

Abstract: A Rogowski coil measures a current in a conductor and includes first and second loops electrically connected in series with each other. The first loop is wound with a substantially constant winding density in a first direction around a first core that has a substantially constant cross section. The second loop is wound with a substantially constant winding density in a second direction around a second core that has a substantially constant cross section. A direction of the first loop is substantially perpendicular to the normal of the first core cross section. Moreover, a direction of the second loop is substantially perpendicular to the normal of the second core cross section.

Abstract: A position sensor, such as a rotary position sensor, includes the signal-conditioning electronics in the housing. The signal-conditioning electronics are disposed on a printed wiring board, which is assembled with another printed wiring board including the sensor windings to provide a sub-assembly. A mu-metal shield is interposed between the printed wiring boards to prevent magnetic interference. The sub-assembly is disposed in the sensor housing adjacent to an inductor board which turns on a shaft. The inductor board emanates an internally or externally generated excitation signal that induces a signal in the sensor windings. The induced signal represents the rotary position of the inductor board relative to the sensor winding board.

Abstract: A rotational sensing assembly including a ferromagnetic sensor wheel rotationally fixed to a shaft having a tooth pattern including a missing tooth. An inductive sensor is mounted adjacent the periphery of the sensor wheel and in communication with a processor. The sensor produces a generally sinusoidal signal in response to the wheel rotation, with voltage zero crossings that are time stamped by the processor. The geometry of the sensor wheel around the missing tooth location is altered to equalize the induced voltage in the sensor for fixed time intervals in order to maintain proper timing of the zero crossings in the sensor signal.

Abstract: A sensor device for detecting the direction of an external magnetic field using a magnetoresistive sensor element, includes a GMR multilayer system having at least one soft magnetic measurement layer, at least one harder bias layer and at least one nonmagnetic intermediate layer disposed therebetween. The sensor element is to include at least two element parts, the multilayer systems of which are constructed on a common substrate and the magnetization directions of which include an angle which is unequal to 0° or unequal to 180° and the measurement signals of which are to be evaluated in common.

Abstract: A device for measuring components of a magnetic field includes a scalar magnetometer surrounded by at least two conductor windings supplied continuously with currents from different generators. A processing circuit demodulates the signal supplied by the scalar magnetometer and supplies signals corresponding to the components of the field to be measured along the axes of the conductor windings.

Abstract: A method of magnetic resonance imaging includes subjecting a number of regions of an object being imaged to a magnetic resonance calibration pulse sequence. Each calibration pulse sequence generates a single calibration echo. Each of the calibration echoes are collected and therefrom correction factors are generated. Thereafter, the method includes subjecting the regions of the object being imaged to a plurality of magnetic resonance imaging pulse sequences. Each of the imaging pulse sequences generates a single imaging echo. Each imaging echo is collected into k-space as a plurality of sampled data points. The plurality of sampled data points are adjusted in accordance with the correction factors as each imaging echo is collected into k-space.

Abstract: An MRI system has two sets of gradient coils driven by two corresponding sets of gradient amplifiers. Logical gradient waveforms produced during a pulse sequence are rotated to produce corresponding physical gradient waveforms and these are distributed to drive both sets of coils simultaneously. Each distributed set of physical gradient waveforms is separately compensated for Eddy current errors, and a polarizing field Eddy current compensation signal is produced and used to modulate the RF reference frequency of the system transceiver.

Abstract: A double-resonance coil for use in MRI having a coil element, a first input/output terminal coupled to the coil element, and a second input/output terminal coupled to the coil element. A first resonance means is coupled between the coil element and the first input/output terminal to cause the MRI coil to resonate at a first MRI frequency, and a second resonance means is coupled between the coil element and the second input/output terminal to cause the MRI coil to resonate at a second MRI frequency substantially different than the first MRI frequency. The double resonance coil includes a first frequency-blocking means coupled to the coil element for substantially preventing the second MRI frequency from being detected at the first input/output terminal and a second frequency-blocking means coupled to the coil element for substantially preventing the first MRI frequency from being detected at the second input/output terminal.

Abstract: A magnetic field generator for an MRI includes a generator main body. The generator main body includes a pair of plate yokes opposed to each other with space in between, a permanent magnet disposed in each of the opposed surfaces of the plate yokes, and a column yoke for magnetically connecting the plate yokes. As a packing member, a shielding member, and if necessary, a stud pin as well as a fixing member are prepared. When packing, the shielding member is attached to the generator main body for shielding an opening. The stud pin may be used for providing a gap between the generator main body and the shielding member. For an open-type generator, the fixing member should preferably be attached to bridge the pair of plate yokes at a middle portion of the opening.

Abstract: A short radio frequency coil for magnetic resonance imaging of the head to provide a homogeneous magnetic field including parallel conductors forming a first cylindrical portion with end rings supporting the conductors which then continue at an angle to form the frustum of a cone and further continuing to form a reduced diameter second cylindrical portion. A third conductive end ring of reduced diameter positioned at the open end of the second cylindrical portion supports the end of the conductors and provides a reduced diameter opening. An asymmetrical coil surrounds portions of the radio frequency coil including the first cylindrical and frustum of a cone portions.

Abstract: The magnetic field in the working volume of an apparatus for the measurement of magnetic resonance, in particular nuclear magnetic resonance, is homogenized in that shim platelets are arranged in stacks in pre-calculated positions around the working volume and for a fine adjustment in the mounted state they are continuously displaced from these positions, preferably by means of piezo translators.

Abstract: A high voltage sensor that is adapted to be connected to a terminal. The terminal is disposed in a housing having an outer surface and having a chute extending inwardly from the outer surface to a distal position inside of the housing. The high voltage sensor includes a sensor body that is adapted to be inserted into the chute and has a distal end and a proximal end. A contact is mounted on the distal end of the sensor body. An indicator circuit is substantially enclosed in the sensor body and includes an indicator lamp. The indicator circuit is electrically connected to the contact and the terminal is in electrical contact with the contact upon insertion of the sensor body into the chute of the housing.

Abstract: A method for determining switchgear-specific data at contacts in switchgear and/or operation-specific data in a network connected to the switchgear includes detecting a so-called contact follow-through travel at a switching path as an equivalent criterion for an erosion of contacts, particularly for contactor contacts. A resilience change during a shutdown cycle is measured, can be used to determine the erosion and can be converted into a remaining contact life for the contacts. Accurate measurement of the armature movement from a start of the armature movement to a start of contact opening is required for that purpose. Switching states of a switching device and of the electrical network are additionally detected from signals for resilience detection. An apparatus for carrying out the method is also provided.

Abstract: A set battery which generates a high voltage comprises a number of battery modules connected to each other in series. A module voltage of each of the battery modules is detected by a corresponding differential voltage detecting circuit and is transmitted to an A/D convertor. Each of Several voltage detecting blocks is constituted by a plurality of the differential voltage detecting circuits for detecting module voltages of a plurality of the battery modules contiguous to each other. Each of the differential voltage detecting circuits belonging to the same voltage detecting block is applied with a common reference potential which is used to detect the module voltage. The reference potential is set to values which differ from each other for the respective voltage detecting blocks.

Abstract: A dual-channel photo-ionization detector (PID) and a method for calculating the gas concentration in the PID are disclosed. The PID includes a UV light source which produces a UV light to ionize a gas, first and second identical ion detectors for measuring first and second currents including ion, and a UV shield which differentially shields the ion detectors from the UV light. The differential shielding of the ion detectors enables the PID to differentiate between current caused by ions and current caused by the photoelectric effect of the UV light. The detector measures a concentration of the gas irrespective of a variation of an intensity of the UV light. A heater in the PID stabilizes the temperature for measurements and prevents condensation in the PID.

Abstract: A method for identifying short circuits in a low-voltage network includes the step of determining a first envelope and a second envelope for a plurality of locus curves of a current steepness as a function of a current in a low voltage network, the first and second envelopes including all switching angles, the first envelope being determined for a lower power factor, the second envelope being determined for an upper power factor. Additionally a third envelope is determined taking into account rated-current switching operations between the lower power factor and the upper power factor. A resultant envelope is formed from a combination of the first, second, and third envelopes by overlaying the first, second, and third envelopes. The resultant envelope defines a tolerant locus curve criterion indicating a short circuit for values outside the tolerant locus curve criterion. A configuration for identifying short circuits is also provided.

Abstract: A method and system diagnose and measure partial discharge on-line in a power transmission system. A first wideband directional clamp-on detector detects pulses corresponding to partial discharge transmitted via a transmission line. A second wideband directional detector detects pulses corresponding to partial discharge output from at least one bushing tap of a high voltage device. The first and second pulses are nulled and then added and/or subtracted, and a diagnostic and measurement system analyzes the results to determine whether the high voltage device and/or an external source produces partial discharge, determine the type of discharge, and measure the level of discharge. For analysis of internal partial discharge, external partial discharges are rejected. The diagnostic and measurement system simultaneously analyzes multiple phases of the output of the high voltage device, while the device is energized. A method and system also diagnose and measure partial discharge off-line in a high voltage device.

Abstract: A system for detecting arcing faults in an electrical distribution network having a line conductor carrying an electrical signal between a power source and a load, the system being capable of detecting series arcs, line-to-neutral arcs and line-to-ground arcs. The system includes a sensor coupled to the line conductor for monitoring the electrical signal and generating a sensor signal representing the electrical signal. The system generates an arc-indicative signal in response to the sensor signal having characteristics indicative of an arcing fault. The system can include a testing system in which a test wire is coupled to the sensor simultaneously with the line conductor and a test signal is periodically produced on the test line. The sensor simultaneously monitors the test signal and the electrical signal and produces a sensor signal representing both the test signal and the electrical signal when the test signal is present on the test line.

Abstract: A system for testing an arcing fault detection system in an electrical distribution network having a line conductor carrying an electrical signal between a power source and a load, the arcing fault detection system including a sensor coupled to the line conductor for monitoring the electrical signal and generating a sensor signal representing the electrical signal, the arcing fault detection system generating an arc-indicative signal in response to the sensor signal having characteristics indicative of an arcing fault. The testing system couples the sensor to a test line simultaneously with the line conductor and periodically produces a test signal on the test line. The sensor simultaneously monitors the test signal and the electrical signal and produces a sensor signal representing both the test signal and the electrical signal when the test signal is present on the test line.

Abstract: A method and apparatus of detecting termites in which microwaves are transmitted into a region and reflected microwaves are detected. The received signals are processed to identify the presence or otherwise of termites or other insects. Various hardware configurations and signal processing algorithms are described including planar antenna arrays and neural net signal processing. The system comprises a microwave assembly, modulator and a processor. Microwaves are transmitted into a structure and the reflected microwaves are received in the microwave assembly. The output of the processor is displayed on a display.

Abstract: An apparatus for measuring a voltage standing wave ratio of a base station. The apparatus comprises: a unit for measuring the voltage standing wave ratio of a transmitting terminal by coupling an input signal from the base station, and by comparing the difference of the coupled signal and a signal reflected from a transmitting antenna; and another unit for measuring the voltage standing wave ratio of a receiving terminal by comparing an input signal from a base-station test unit with the signal reflected from a receiving terminal.

Abstract: In a method and apparatus for determining the volumetric proportion of water in snow and the density of snow, a probe consisting of at least three parallel, but differently spaced, electrical conductors is installed in an area so that the probe is surrounded by the snow, an electromagnetic signal is applied repeatedly to pairs of the conductors for determining different dielectricity coefficients, wherefrom the actual dielectricity coefficient is calculated based on probe-specific calibration data and the measuring steps are repeated with a different frequency for which the dielectricity coefficients of the water and ice are known and the volumetric parts of the snow, that is of the water, ice and air in the snow cover is calculated using the law of mass conservation.

Abstract: A hand-held or permanently attached corrosion sensor is described that uses electrochemical impedance spectroscopy (EIS, also known as AC impedance) to detect coating and structural degradation caused by excessive moisture uptake of coated and uncoated composite laminations or honeycomb or adhesively bonded structures. The hand-held sensor is pressed against the surface of the structure or specimen to be inspected. Alternatively, the sensor electrode may be permanently or temporarily attached. An EIS spectrum can then be obtained in the field or under arbitrary conditions and the degree of moisture uptake or coating or material degradation can be determined from the resultant spectrum. There are no restrictions on the configuration of the structure being inspected. The area of detection is controlled by controlling the extent and degree of wetness of the surface. A dry surface will provide a localized measurement; a wet surface will allow inspection of the wetted area.

Abstract: Disclosed is anew technique for measuring the resistivity of ultra-thin carbon films (less than 200 Å). The technique involves using a probe with very smooth surface, a thin layer lubricant (20-30Å)that enables the intimate and stable electrical contact between probe and the thin film, and measurement of I-V curve to determine resistance. Resistivity measurements were conducted on carbon films doped with hydrogen and nitrogen at different mixture ratios and different thicknesses, and the results were compared with those obtained on a commercially available machine that uses a mercury probe. The advantages of the present technique include simple in use, less expensive and quick measurements with reasonably good accuracy.

Abstract: Measurement of pulse CV characteristics and an SIMS measurement of a semiconductor substrate are made at the same position. An SIMS profile is calibrated by a method of least squares so that a dose amount determined from the SIMS profile coincide with a dose amount determined from the concentration profile of a carrier which is calculated from the pulse CV characteristics in a range where accuracy of the carrier concentration is secured. In the case where plural impurities are introduced, a measurement of pulse CV and SIMS measurement are made and the distribution of impurity concentration and the distribution of carrier concentration are estimated by simulation every time when an impurity is introduced. When an impurity is introduced in a high concentration, an impurity of the inverse conductive-type to that of the former impurity is introduced.

Abstract: A wafer probe station is equipped with an integrated environment control enclosure substantially surrounding a supporting surface for holding a test device, such enclosure limiting fluid communication between the interior and exterior of the enclosure and preferably also providing EMI shielding and a dark environment. The limited communication between the interior and exterior of the enclosure is kept substantially constant despite positioning movement of either the supporting surface or probe holders. The positioning mechanisms for the supporting surface and probe holders each have portions located at least partially outside of the enclosure for transferring movement mechanically to the surface or holders, respectively.

Abstract: Disclosed herein is the formation of a ball grid array testing receiver that is scalable for design consideration of miniaturization. A dielectric layer is formed upon a substrate that is substantially conformal to the upper surface of the substrate. A patterned masking layer is formed upon the dielectric layer and a subsequent etch forms a depression within the substrate and forms a ledge on the surface of the substrate that is adjacent to the depression. After formation of the ledge, a metal layer is formed continuously on the ledge and within the depression. Following the formation of the metal layer, a masking layer is formed upon the metal layer. The masking layer is patterned so as to form a desired arrangement of metal lines by etching the underlying metal layer. The formation of the ledge enables the masking layer to resist formation of a breach between the surface of the substrate and the depression.

Abstract: A semiconductor carrier and system for testing bumped semiconductor components, such as dice and packages, having contact bumps are provided. The carrier includes a base, an interconnect, and a force applying mechanism. The interconnect includes patterns of contact members adapted to electrically contact the contact bumps. The interconnect can include a substrate having contact members formed as recesses, or as projections, covered with conductive layers. Alternately, the interconnect can be a multi layered tape bonded directly to a base of the carrier. In addition to providing electrical connections, the contact members perform an alignment function by self centering the contact bumps within the contact members. The carrier can also include an alignment member configured to align the components with the interconnect. The system can include the carrier, a socket, and a testing apparatus such as a burn-in board in electrical communication with test circuitry.

Abstract: A test and burn-in apparatus for semiconductor chip package devices, an in-line system which includes the test and burn-in apparatus, and a test method which employs the in-line system are provided. A test and burn-in apparatus for testing semiconductor devices allows various testing processes, including a burn-in process, to be performed at the same testing stage. The apparatus employs test trays which contain the semiconductor devices. These test trays are used throughout the in-line system so that an entire back-end process can be performed without the need for loading/unloading the semiconductor devices into and from device trays between the various tests. The test and burn-in apparatus according to this invention can therefore occupy less space than the prior art testing apparatuses. The in-line system includes multiple test and burn-in apparatuses as well as a single sorting unit which performs a composite sorting operation after all the testing processes have been performed.

Abstract: An IC chip testing apparatus provided with an IC socket to which an IC chip is brought into electrical contact, a printed circuit board with one terminal which is electrically connected to a terminal of a test head and with another terminal which is electrically connected to a terminal of the IC socket, and a heating element provided at the printed circuit board. The IC chip testing apparatus may be provided with a socket to which an IC chip to be tested is detachably mounted; a socket guide; a chamber opening to which the socket guide is attached so that an IC chip mounting opening of the socket faces inside a chamber which is maintained at a predetermined state less than ordinary temperature; a printed circuit board; and a heating board which is provided around the chamber opening.

Abstract: An IC chip testing apparatus comprising a chamber 6 having inside it a test stage 8 for testing an IC chip 22, cooling units 60, 62 able to cool the inside of the chamber 6 to a temperature less than ordinary temperature, heating units 60, 62 able to heat the inside of the chamber 6 to return it to ordinary temperature, temperature sensors 72, 74 for detecting the temperature inside the chamber 6, and a temperature controller 70 for controlling the outputs of the cooling units and/or heating units 60, 62 in accordance with the outputs from the temperature sensors. The apparatus not only makes the temperature control stop but also automatically performs ordinary temperature reset processing when an alarm signal of a temperature abnormality inside the chamber is detected. Further, the apparatus automatically performs ordinary temperature reset processing when the time of continuous operation of the device testing apparatus is more than a predetermined time.

Abstract: The semiconductor component has an electronic circuit in or on a main surface of a semiconductor chip. Connecting surfaces or pads are disposed on the main surface of the semiconductor chip and are electrically coupled to the electronic circuit. This allows electrical access to the circuit from outside the chip. The electronic circuit is operable in a test mode, which can normally be carried out in the wafer composite of the semiconductor chips and in which an externally supplied test signal is applied to a predetermined pad, and in an operating mode in which operating signals are applied to the pads. At least one pad is assigned a switching device which allows changing the function of that pad from the test mode to the operating mode.

Abstract: A method of testing leakage current at a contact-making point in an integrated circuit includes applying a test potential to the contact-making point through an output of an application device. The output of the application device is connected to a high impedance or is isolated from the contact-making point. The potential at the contact-making point is determined as a measure of the leakage current being produced.

Abstract: In an IC testing apparatus, a sense line which is used for purpose of voltage measurement and a force line which is used for purpose of current supply are connected to a terminal of an IC under test through a first switch and a second switch, respectively, and a functional tester is connected to the terminal of the IC under test through a third switch. The first to the third switch are formed by semiconductor switches, and a fourth switch formed by a semiconductor switch having a reduced on resistance is connected across terminals of the first switch and the second switch which are located opposite from their terminals connected to the terminal of the IC under test. During an overload test in the DC test, the fourth switch is turned on to execute the test.

Abstract: A circuit for isolating a short-circuited integrated circuit (IC) formed on the surface of a semiconductor wafer from other ICs formed on the wafer that are interconnected with the short-circuited IC includes control circuitry within the short-circuited IC for sensing the short circuit. The control circuitry may sense the short circuit in a variety of ways, including sensing excessive current drawn by the short-circuited IC, and sensing an abnormally low or high voltage within the short-circuited IC. Switching circuitry also within the short-circuited IC selectively isolates the short-circuited IC from the other ICs on the wafer in response to the control circuitry sensing the short circuit. As a result, if the wafer is under probe test, for example, testing can continue uninterrupted on the other ICs while the short-circuited IC is isolated.

Abstract: A CMOS impedance matching circuit includes an amplifier and a feedback circuit. The amplifier allows control of the impedance by controlling the V/I characteristic. The amplifier is sized to provide the desired impedance. The feedback circuit clamps the maximum excursions of the input signal, thereby maximizing signal speed. It also provides a higher impedance to noise beyond the dead band. In one embodiment of the present invention, the amplifier includes an amplifier circuit in parallel with an amplifier buffer. The amplifier buffer provides no gain and simply performs the inverting function when no gain is required for impedance matching. In one embodiment, the amplifier circuit includes a plurality of switchable amplifiers coupled in parallel with each other. Each of the switchable amplifiers has a different gain, and the one with the right amount of gain for the needed impedance matching is chosen using control inputs.