Patents Issued in June 21, 2007
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Publication number: 20070139021Abstract: an operational amplifier generates a power supply potential from a reference potential. An impedance adjuster adjusts an output impedance of the operational amplifier in accordance with a control signal. A charge accumulator accumulates an output charge of the operational amplifier whose impedance is adjusted by the impedance adjuster. A comparator compares an output voltage of the operational amplifier before the impedance adjustment by the impedance adjuster and the output voltage of the operational amplifier after the impedance adjustment by the impedance adjuster to each other, and the comparator further generates the control signal in accordance with a result of the comparison so as to output the generated control signal to the impedance adjuster.Type: ApplicationFiled: December 15, 2006Publication date: June 21, 2007Inventors: Tomokazu Kojima, Minoru Honda
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Publication number: 20070139022Abstract: An input voltage detection method, for a PWM cycloconverter whose operation can be stably continued though a power voltage sharply fluctuates, and an apparatus therefor are provided. For a PWM cycloconverter, provided are: an input power voltage phase detector 41, for detecting the phase of three-phase AC power; an artificial DC bus voltage detector 42, for detecting the magnitude of the three-phase AC power; an input voltage upper and lower limit calculator 43, for employing the output of the artificial DC bus voltage detector to calculate upper and lower limits for an input voltage; and a voltage comparator 46, for comparing a voltage value, detected by the artificial DC bus voltage detector, with the upper and lower limit values obtained by the input voltage upper and lower limit calculator.Type: ApplicationFiled: December 16, 2004Publication date: June 21, 2007Inventors: Eiji Yamamoto, Hidenori Hara, Kouichi Eguchi
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Publication number: 20070139023Abstract: Disclosed are a control circuit and control method for a comparator-controlled type DC-DC converter that can prevent the generation of audible noise due to the difference between relevant switching frequencies and prevent the increase in the input power source ripple voltage. A phase comparator FC outputs a compared-result signal CONT in correspondence with the phase difference between an output signal FP2 and a delay signal FR1. A delay circuit DLY2 performs a feedback control for adjusting the amount of retardation time in correspondence with the compared-result signal CONT. And, the delay circuit DLY2 outputs a delay signal FR2 after the passage of a prescribed amount of retardation time from the time when the falling edge of an output signal SQB2 has been input.Type: ApplicationFiled: March 7, 2006Publication date: June 21, 2007Inventor: Morihito Hasegawa
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Publication number: 20070139024Abstract: A method for regulating a voltage in an integrated circuit device includes providing a first regulated output based upon a first voltage input range and subsequently receiving the first regulated output and providing a second regulated output based upon a second voltage input range of the first regulated output. A circuit is further provided that operates accordingly. Additionally, a clipper circuit is provided at the input to protect for over voltage conditions that may results, for example, from a charging battery to cause an output voltage of the battery to substantially exceed ordinary output voltage levels.Type: ApplicationFiled: December 20, 2005Publication date: June 21, 2007Inventor: Alireza Zolfaghari
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Publication number: 20070139025Abstract: A PFM-type voltage regulator circuit converts an unregulated input voltage into a regulated output voltage using a first transistor controlled by a pulse control circuit and a second transistor controlled by a linear regulator circuit. The linear regulator circuit controls the second transistor when the regulated output voltage falls to a predetermined minimum target voltage level, thereby maintaining the regulated output voltage at the minimum target voltage level. The pulse control circuit detects the current passing through the second transistor, and in response generates a pulse signal having a predetermined duration that fully turns on the first transistor. The voltage through the first transistor is converted to an increasing inductor current that refreshes the regulated output voltage to a maximum target voltage level. When the pulse signal ends, the regulated output voltage again begins to fall toward the predetermined minimum target voltage level, and the cycle is repeated.Type: ApplicationFiled: December 21, 2005Publication date: June 21, 2007Applicant: Micrel, IncorporatedInventors: Charles Vinn, Raymond Zinn
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Publication number: 20070139026Abstract: Disclosed is a system and method for synchronizing switching regulators in an electronic system so that switching interference from the regulators may be kept from a given spectral region of interest. The system does this by selecting a fundamental frequency such that each of the switching frequencies corresponding to each of the switching regulators is a harmonic of the fundamental frequency. Further, the fundamental frequency is selected so that none of the switching regulators, each of which are driven by an harmonic of the fundamental frequency, generates switching interference in the spectral region of interest. Each of the switching regulators has a synchronization clock, which multiplies or divides the master clock frequency by an allocated harmonic factor. Each harmonic factor is selected to that the switching frequency is within the operating range of the particular switching regulator.Type: ApplicationFiled: December 21, 2005Publication date: June 21, 2007Inventor: Dongwen Jiang
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Publication number: 20070139027Abstract: There are provided a DC-to-DC converter control circuit capable of implementing compatibility between low ripple voltage characteristics, and stable and fast response characteristics at the time of a sudden change in load, and a DC-to-DC converter control method using the same. An add-up signal of an output voltage signal obtained according to an output voltage of a DC-to-DC converter, and an AC current signal obtained according to an AC current component of a coil current is outputted from an arithmetic circuit, and the add-up signal is compared with a reference signal by a comparator. Switching control of the DC-to-DC converter is executed according to a result of comparison by the comparator.Type: ApplicationFiled: March 28, 2006Publication date: June 21, 2007Inventor: Eiji Nishimori
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Publication number: 20070139028Abstract: A method and a system for current limiting using PWM control have been provided. The method includes sensing a load current to produce a control voltage. The control voltage is compared with a reference voltage to produce a detected output signal. Thereafter, the detected output signal is delayed and multiplied with a master PWM signal.Type: ApplicationFiled: December 20, 2005Publication date: June 21, 2007Inventor: Stanley Cox
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Publication number: 20070139029Abstract: A reference circuit can include a reference section that provides a reference value for other circuits of an integrated circuit and can be enabled and disabled in response to an enable signal. The reference circuit can include at least a first node, draw a reference current in the enabled mode, and draw essentially no current in the disabled mode. A pulse start-up section can provides a low impedance path between the first node and a first potential for a predetermined duration in response to the reference circuit being enabled. A continuous start-up section can provide a low impedance path between the first node and the first potential based on a logic state of an enable signal.Type: ApplicationFiled: August 25, 2006Publication date: June 21, 2007Inventors: Damaraju Naga Radha Krishna, Badrinarayanan Kothandaraman, Sushma Nirmala Sambatur
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Publication number: 20070139030Abstract: A bandgap voltage generating circuit includes a circuit coupled to a first node and a second node, driving the first and the second nodes to the same voltage level. A first impedance element is coupled to the first node and a second impedance element is coupled to the second node, wherein the impedance of the second impedance element is larger than the impedance of the first impedance element. A first transistor is coupled to the first impedance element, and a second transistor is coupled to the second impedance element and the first transistor. The bandgap generating circuit generates a bandgap voltage at the second node.Type: ApplicationFiled: December 15, 2006Publication date: June 21, 2007Inventors: Chao-Cheng Lee, Cheng-Chung Hsu
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Publication number: 20070139031Abstract: A method for characterizing the current as a function of applied electric field for a resistor exposed to a high electric fields is described. The method uses current versus voltage measurements at low electric fields, where the resistor is not damaged and the current does not saturate. An example illustrating the importance of such resistor characterization is provided.Type: ApplicationFiled: December 19, 2005Publication date: June 21, 2007Inventors: Sangjune Park, Jay Fukumoto, Kenneth Paradis
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Publication number: 20070139032Abstract: A current sensor includes coupled inductors that generate an output current responsive to a detected current. The coupled inductor is implemented in an integrated circuited. An integrator circuit generates a sensed voltage responsive to the output current.Type: ApplicationFiled: December 19, 2005Publication date: June 21, 2007Inventors: Timothy Dupuis, John Pavelka
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Publication number: 20070139033Abstract: The use of centralized electric meters to record energy consumption prevents the energy consumer from interacting with the process of energy savings. The inability of a centralized electric meter to quickly feedback energy usage, prohibits their use in interactive energy saving. The monitoring of energy consumption using a sub-metering or distributed architecture, whereby all wall mounted AC toggle switches and AC receptacles contain electric meters capable of recording and displaying energy consumption in the form of an accumulated cost of energy per outlet or electronic device, gives energy consumers the motive necessary to save energy.Type: ApplicationFiled: December 20, 2006Publication date: June 21, 2007Inventor: Alex Pogostin
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Publication number: 20070139034Abstract: According to the present invention, there is provided a semiconductor device having: a switching element serially connected to a resistive element to be measured; a plurality of transistors respectively connected in parallel to a series circuit consisting of the resistive element to be measured and the switching element, which will respectively take desired resistance values when turned on; and a measurement section which measures a resistance value of a parasitic resistance which occurs so as to be coupled to the resistive element to be measured by turning off the switching element and then controlling switching operations of the plurality of transistors to change the resistance values of resistors formed by the plurality of transistors, and subsequently measures a resistance value of the resistive element to be measured based on a resistance value of the parasitic resistance by turning on the switching element while turning off the plurality of transistors.Type: ApplicationFiled: December 8, 2006Publication date: June 21, 2007Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Shuichi Takada, Eisuke Tanaka, Takeshi Abiru
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Publication number: 20070139035Abstract: A magnetized body (12) is constituted by a resin bonded magnet, and is fixed to a support member (11) in accordance with an integral injection molding, in such a manner that a come-off preventing portion (15) engaging with an outer peripheral portion of a flange portion (14) is formed in an outer periphery of the magnetized body (12). An elastic layer (17) is interposed between the magnetized body (12) and the flange portion (14) A side surface of the flange portion (14) is provided with a concave portion (16) having a depth corresponding to a thickness of the elastic layer (17).Type: ApplicationFiled: December 15, 2006Publication date: June 21, 2007Applicant: JTEKT CorporationInventors: Yasuhiko ISHII, Naoki Morimura, Katsura Koyagi, Tetsuaki Numata, Nobutsuna Motohashi
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Publication number: 20070139036Abstract: A rotation detecting device includes a rotation detecting unit for providing first and second rotation signals in response to rotation of a rotating object and a signal processing circuit for processing the signals to provide rotation data such as the rotation direction, rotation speed and rotation position.Type: ApplicationFiled: December 19, 2006Publication date: June 21, 2007Applicant: DENSO CORPORATIONInventor: Kenji Kondo
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Publication number: 20070139037Abstract: A testing device for testing Hall-Effect type speed and proximity sensors and their associated pulse detection systems is provided by the present invention. The device includes a housing containing an internal battery, an LED display, an input connector, an output cable, a power switch, a test function switch, and a built in reference magnetic label. The magnetic label is polarized with a reference pattern such as alternating north and south magnetic poles. To test a Hall-Effect sensor, the sensor output is connected to the testing device and the sensor is swiped along the magnetic strip. The output of the sensor is then displayed such that it can be examined to determine if the sensor is working properly. A pulse generator is included that produces a known pulse train that is used to evaluate an associated pulse detection circuit. The output of the pulse detection circuit in response to the reference pulse train is examined to determine if the pulse detection circuit is functioning properly.Type: ApplicationFiled: February 23, 2007Publication date: June 21, 2007Applicant: WHITE DRIVE PRODUCTS, INCInventor: Richard Daigre
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Publication number: 20070139038Abstract: A vane actuated drive mode sensor is generally composed of two primary components, including a drive mode sensor array and an actuator. The sensor array can be provided as a housing composed of a plurality of Hall Effect (HE) sensors, magnets and the electronics associated with the sensors. The actuator, also referred to as a vane, can be provided as a plate constructed from a magnetic material, such as, for example, ferrous steel, and can be provided with holes punched thereon at different places depending on the requirement of a user. The actuator can be connected to a user's driver and can slide on and/or within the housing.Type: ApplicationFiled: December 21, 2005Publication date: June 21, 2007Inventors: Eugene Alfors, Kenneth Eichholz, Lawrence Frazee, John Patin
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Publication number: 20070139039Abstract: Position sensors in stick design for installation. e.g. in hydraulic cylinders, can be maintained and replaced without leakage, with the sensor head housing having a attachable and detachable dome- and cap shaped sensor head cover, which can be opened without removing the remaining housing out of the piston cylinder unit, opening the access to the functional components of the sensor.Type: ApplicationFiled: December 19, 2006Publication date: June 21, 2007Inventor: Klaus Steinich
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Publication number: 20070139040Abstract: There is described a sensor comprising an excitation winding, a signal generator operable to generate an excitation signal and arranged to apply the generated excitation signal to the excitation winding, a sensor winding electromagnetically coupled to the excitation winding and a signal processor operable to process a periodic electric signal generated in the sensor winding when the excitation signal is applied to the excitation winding by the signal generator to determine a value of a sensed parameter. The excitation signal comprises a periodic carrier signal having a first frequency modulated by a periodic modulation signal having a second frequency, the first frequency being greater than the second frequency. In this way, the sensor is well suited to using digital processing techniques both to generate the excitation signal and to process the signal induced in the sensor windings. In an embodiment, the sensor is used to detect the relative position of two members.Type: ApplicationFiled: February 22, 2007Publication date: June 21, 2007Applicant: TT Electronics Technology LimitedInventors: Ross Jones, Richard Doyle, Mark Howard, David James, Darran Kreit, Colin Sills
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Publication number: 20070139041Abstract: Position sensors in stick design for installation in hydraulic cylinders, can be maintained and replaced without leakage, with the sensor head housing having a attachable and detachable sensor head cover, which can be opened without removing the remaining housing out of the piston cylinder unit, opening the access to the functional components of the sensor.Type: ApplicationFiled: December 19, 2006Publication date: June 21, 2007Inventor: Klaus Steinich
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Publication number: 20070139042Abstract: The invention concerns a position sensor in which the irregular pole includes resources for correcting the value of its magnetic field so as to stabilize the differential signal in such a way that the part of the differential signal taken at the passage through zero, and located between the parts of the differential signal corresponding to the passages of the adjacent poles, has a slope whose value, in absolute terms, is more-or-less identical to the values of the slopes of the parts of the differential signal obtained at the passage through zero and corresponding to the passages of the other poles.Type: ApplicationFiled: December 18, 2006Publication date: June 21, 2007Applicant: ELECTRICFIL AUTOMOTIVEInventor: Bertrand LEGRAND
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Publication number: 20070139043Abstract: An eddy current monitoring system may include an elongated core. One or more coils may be coupled with the elongated core for producing an oscillating magnetic field that may couple with one or more conductive regions on a wafer. The core may be translated relative to the wafer to provide improved resolution while maintaining sufficient signal strength. An eddy current monitoring system may include a DC-coupled marginal oscillator for producing an oscillating magnetic field at a resonant frequency, where the resonant frequency may change as a result of changes to one or more conductive regions. Eddy current monitoring systems may be used to enable real-time profile control.Type: ApplicationFiled: August 16, 2006Publication date: June 21, 2007Inventors: G. Miller, Boguslaw Swedek, Manoocher Birang
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Publication number: 20070139044Abstract: A sensor package apparatus includes a lead frame substrate that supports one or more electrical components, which are connected to and located on the lead frame substrate. A plurality of wire bonds are also provided, which electrically connect the electrical components to the lead frame substrate, wherein the lead frame substrate is encapsulated by a thermoset plastic to protect the plurality of wire bonds and at least one electrical component, thereby providing a sensor package apparatus comprising the lead frame substrate, the electrical component(s), and the wire bonds, while eliminating a need for a Printed Circuit Board (PCB) or a ceramic substrate in place of the lead frame substrate as a part of the sensor package apparatus. A conductive epoxy and/or solder can also be provided for maintaining a connection of the electrical component(s) to the lead frame substrate. The electrical components can constitute, for example, an IC chip and/or a sensing element (e.g.Type: ApplicationFiled: December 20, 2005Publication date: June 21, 2007Inventors: Wayne Lamb, Scott Michelhaugh, Peter Schelonka, Joel Stolfus
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Publication number: 20070139045Abstract: A magnetic resonance imaging apparatus imaging a subject on the basis of a magnetic resonance signal radiated from the subject in a static magnetic field, includes a radio frequency coil which receives the magnetic resonance signal and has a direction dependency on a flux direction of the static magnetic field, and a support member which rotatably supports the radio frequency coil.Type: ApplicationFiled: December 16, 2005Publication date: June 21, 2007Applicants: Kabushiki Kaisha Toshiba, Toshiba Medical Systems CorporationInventor: Manabu Ishii
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Publication number: 20070139046Abstract: An NMR probe head for investigating a temperature-sensitive test object in a volume under investigation with at least one RF receiver coil which is cooled to cryogenic temperatures during operation, and is surrounded by a housing, wherein at least one heatable separating wall is provided between the RF receiver coil and the test object, is characterized in that the separating wall is produced from a material having excellent heat conducting properties, wherein the separating wall is coupled in a heat conducting fashion to at least one heating element at a separation from the volume under investigation via at least one contact location. The inventive NMR probe head permits disposition of the RF receiver coil in close proximity to the test object to be measured without inadvertently cooling it.Type: ApplicationFiled: December 12, 2006Publication date: June 21, 2007Applicant: Bruker BioSpin MRI GmbHInventors: Ralf Haueisen, Daniel Marek, Marco Sacher
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Publication number: 20070139047Abstract: A method for controlling the operation of a solenoid (14), in which solenoid the movement of the plunger is caused by bringing electric energy to the solenoid, whereby an electric current flows through the solenoid, the method comprising the following steps. defining a model (6) for describing the current signal of the solenoid at certain time intervals from the activation moment of the solenoid onwards, measuring the true current signal (7) of the solenoid at time intervals corresponding with the model, defining a residual signal (8), which is the remainder between the signal of the model (6) and the true current signal (7), and performing a threshold analysis (25) for the residual signal.Type: ApplicationFiled: May 6, 2004Publication date: June 21, 2007Inventor: Fredrik Ostman
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Publication number: 20070139048Abstract: A diagnosis method diagnoses an electronic apparatus that is operable with a battery pack having a memory which stores information. The diagnosis method reads information from the battery pack, and sets the electronic apparatus to a diagnosis mode when the read information indicates the diagnosis mode.Type: ApplicationFiled: February 16, 2007Publication date: June 21, 2007Applicant: Fujitsu LimitedInventor: Nobuyuki Koike
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Publication number: 20070139049Abstract: An object sensing system (50), and method, employing electric field sensing, also known as quasi-electrostatic sensing and which may be termed cross capacitive sensing, is described. The system (50) comprises at least one electrode arrangement (30), each electrode arrangement (30) comprising one electric field sensing reception electrode (32) and two electric field sensing transmission electrodes (34, 36). One of the electric field sensing transmission electrodes (36) is driven with an alternating voltage (130) comprising at least some antiphase portions, for example an inverted signal, in comparison to an alternating voltage (120) with which the other electric field sensing transmission electrode (34) is driven. This improves the spatial precision of object sensing performed by detecting changes in the current induced in the electric field reception electrode (32).Type: ApplicationFiled: October 30, 2003Publication date: June 21, 2007Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.Inventor: Cornelis Van Berkel
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Publication number: 20070139050Abstract: An electrostatic discharge testing system comprises a measurement chamber to hold a discharge electrode and a target electrode in separation from each other, a first conductive path to supply an ESD pulse to the discharge electrode, and a second conductive path to receive a discharge pulse from the target electrode. A transmission line, field-coupled to the second conductive path, generates a measurement signal in response to the discharge pulse.Type: ApplicationFiled: December 20, 2005Publication date: June 21, 2007Applicant: Dell Products L.P.Inventors: Vsevolod Ivanov, Steve Williams
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Publication number: 20070139051Abstract: The invention relates to a circuit arrangement comprising a multi-wire line for supplying current to a sensor and for emitting a signal that corresponds to a measured value to an evaluation module via a signal line. To eliminate measuring errors caused by short-circuits, a first and second resistor (7, 8), the second resistor (8) being provided with a current tap, and a transistor (10), which is connected to a clock pulse generator (9) that bridges the first resistor in a clocked manner, are connected in series to the signal emission line. A comparator (17) for comparing the values obtained via the resistors (7,8) in the successive switching positions of the transistor and for emitting a short-circuit error message to the evaluation module (3), if the measured values differ in the successive clock pulses, is connected downstream of the resistors (7, 8).Type: ApplicationFiled: July 20, 2004Publication date: June 21, 2007Inventors: Petrus Akkerman, Andreas Lemke, Ingmar Bonig
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Publication number: 20070139052Abstract: A slant detection device is used for detecting whether the to-be-tested pin of a connector is slanted. The connector has a socket. The to-be-tested pin is disposed in the socket. The detection device includes a detector and a sensor. The detector includes a body, a first protrusion and a second protrusion. The first and second protrusions are protruded from one side of the body for being inserted into the socket. The first and second protrusions are spaced to define a gap. The width of the gap is greater than the width of the to-be-tested pin. If the pin is normal, the to-be-tested pin is inserted into the gap. If the to-be-tested pin is slanted, the to-be-tested pin touches the first or second protrusion to cause a short circuit. The sensor is electrically connected to the detector, for outputting a sensing signal when sensing the short circuit.Type: ApplicationFiled: September 26, 2006Publication date: June 21, 2007Applicant: Quanta Computer Inc.Inventors: Hsiao-Tsu Ni, Yaw-Tzorng Tsorng, Chung-Ping Liu, Chen-Sheng Tang
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Publication number: 20070139053Abstract: A magnetic head testing apparatus having the function of evaluating pin holes in a tunnel barrier layer of a TMR element by a non destructive inspection is disclosed. The testing apparatus comprises a temperature control unit which sets a circumferential temperature of a TMR element, a bias electric current control unit which applies an electric current for measuring a resistance value, an element resistance measuring unit and a CPU which calculates a temperature coefficient. The CPU determines a pin hole state in the tunnel barrier layer based on the temperature coefficient.Type: ApplicationFiled: February 9, 2007Publication date: June 21, 2007Applicant: KABUSHIKI KAISHA TOSHIBAInventor: Hiroyuki Naka
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Publication number: 20070139054Abstract: A measurement system, a chaotic lock-in amplifier, and methods use chaotic lock-in amplification to measure a stimulus response from one or more of a device under test, a sample under test and a system under test. The measurement system includes a chaotic reference source, a chaotic excitation source and a chaotic lock-in amplifier to facilitate detection of a chaotic response signal from the respective item(s) under test. A chaotic lock-in amplifier includes an inverse system that removes a chaotic component from the chaotic response signal. A method of measuring a response to a stimulation includes using the chaotic reference signal to achieve chaotic lock-in amplification that preferentially removes a chaotic component from the chaotic response signal.Type: ApplicationFiled: December 21, 2005Publication date: June 21, 2007Inventors: Nicholas Tufillaro, Gregory VanWiggeren
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Publication number: 20070139055Abstract: A testing system for a plurality of electric circuits, such as those, for example, powered by circuit breakers or fuses in a building structure, is disclosed. A receiver module includes a battery-powered microprocessor that includes a radio receiver interconnected with an antenna, as well as a plurality of indicator LEDs. A plurality of transmitter modules is included, each of which includes a microprocessor powered by a transformer connected to at least two power prongs for drawing power from a conventional power outlet, or to a standard light bulb threaded base for drawing power from a conventional light bulb socket. The microprocessor of each transmitter module includes a radio transmitter interconnected with an antenna which transmits a confirmation signal when the transmitter module is receiving power. The confirmation signal of each transmitter module includes a unique differentiating component.Type: ApplicationFiled: January 4, 2007Publication date: June 21, 2007Inventor: Clinton Cockrill
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Publication number: 20070139056Abstract: A partial discharge detection apparatus of an electrical rotating machine includes a metal frame connected to a stator frame of the electrical rotating machine, a power line connected to one of a stator winding corresponding to one phase of three phases in the metal frame and a neutral point lead line connected to a neutral point of three-phase stator windings and arranged in the metal frame to propagate a partial discharge signal generated by degradation of the stator winding, a sensor including a rod antenna which is installed around the power line or neutral point lead line in the metal frame to electrostatically and magnetically induce the partial discharge signal propagated to the power line or neutral point lead line, and a detector which receives, via a signal lead line, a signal generated in the sensor and detects partial discharge by signal processing.Type: ApplicationFiled: February 20, 2007Publication date: June 21, 2007Inventors: Hiroshi KANEIWA, Masahiro Sakai, Yoshiyuki Inoue, Shinobu Sekito
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Publication number: 20070139057Abstract: Methods, systems, and apparatuses for testing radio frequency identification (RFID) tags are described. The tags are tested using a direct connection scheme, where a testing apparatus makes direct contact with a portion of a tag in order to perform a test on the tag. For example, the testing apparatus may read data from the tag to verify operation. Any number of tags may be tested at a time, including one tag at a time, or multiple tags in parallel.Type: ApplicationFiled: December 15, 2005Publication date: June 21, 2007Applicant: Symbol Technologies, Inc.Inventors: Danny Nguyen, Mark Duron, Francisco Naranjo, David Reed, Gary Seims
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Publication number: 20070139058Abstract: A method for analyzing length differences in differential signal paths includes: loading a design file of the differential signal paths from a storage device (9); simulating the differential signal paths based on the design file; dividing simulated differential signal paths into a plurality of segments by impedance division positions that show impedance discontinuity; predefining an acceptable length difference limit for each divided segment, and calculating an real length difference for each divided segment; comparing the real length difference with the acceptable length difference limit correspondingly to generate a plurality of analyzed results corresponding to the plurality of divided segments; selecting one or more compared segments to check analyzed results of selected segments; and locating the selected segments in the simulated differential signal paths, and generating analyzed information comprising analyzed results of the selected segments. A related system is also disclosed.Type: ApplicationFiled: October 26, 2006Publication date: June 21, 2007Applicant: HON HAI PRECISION INDUSTRY CO., LTD.Inventors: SHOU-KUO HSU, CHENG-SHIEN LI
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Publication number: 20070139059Abstract: An optical measuring system for detecting geometric data of surfaces of at least one object is described, comprising a beam delivery section, a probe system which is connected to the latter and has a plurality of probe outputs for output of a particular measuring beam to an assigned particular surface location and recording the light reflected back by the surface, and having a downstream analyzer unit for determining the geometric data on the basis of light reflected back by the surface locations. A very accurate and mechanically robust determination of surface geometric data, e.g.Type: ApplicationFiled: June 19, 2004Publication date: June 21, 2007Inventors: Michael Lindner, Bernd Schmidtke
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Publication number: 20070139060Abstract: The present invention discloses a method and system compensating for thermally induced motion of probe cards used in testing die on a wafer. A probe card incorporating temperature control devices to maintain a uniform temperature throughout the thickness of the probe card is disclosed. A probe card incorporating bi-material stiffening elements which respond to changes in temperature in such a way as to counteract thermally induced motion of the probe card is disclosed including rolling elements, slots and lubrication. Various means for allowing radial expansion of a probe card to prevent thermally induced motion of the probe card are also disclosed. A method for detecting thermally induced movement of the probe card and moving the wafer to compensate is also disclosed.Type: ApplicationFiled: October 10, 2006Publication date: June 21, 2007Inventors: Rod Martens, Benjamin Eldridge, Gary Grube, Ken Matsubayashi, Richard Larder, Makarand Shinde, Gaetan Mathieu
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Publication number: 20070139061Abstract: A probing apparatus can comprise a substrate, conductive signal traces, probes, and electromagnetic shielding. The substrate can have a first surface and a second surface opposite the first surface, and the electrically conductive first signal traces can be disposed on the first surface of the first substrate. The probes can be attached to the first signal traces, and the electromagnetic shielding structures can be disposed about the signal traces.Type: ApplicationFiled: December 1, 2006Publication date: June 21, 2007Applicant: FORMFACTOR, INC.Inventors: Benjamin Eldridge, Carl Reynolds, Takao Saeki, Yoichi Urakawa
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Publication number: 20070139062Abstract: An embodiment may comprise a test probe to measure electrical properties of a semiconductor package having ball-shaped terminals. The probe may include a signal tip and a ground tip. The signal tip may have a spherical lower surface allowing good contact with a ball-shaped signal terminal. The ground tip may be extended from a lower end of a ground barrel that encloses the signal tip. The ground tip may move independent of the signal tip by means of a barrel stopper and a spring. Thus, the probe can be used regardless of the size of and the distance between the package terminals.Type: ApplicationFiled: February 20, 2007Publication date: June 21, 2007Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventor: Sun-Won Kang
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Publication number: 20070139063Abstract: An apparatus comprising a printed circuit board having a front side and a back side, and having therein a plurality of conductive layers, each conductive layer including one or more signal channels; a stub extending from the front side to the back side, the stub being electrically coupled to at least one signal channel; and an impedance matching terminal electrically coupled to the stub and to a ground. A process comprising providing a printed circuit board including a front side and a back side, and having therein a plurality of conductive layers, each conductive layer including one or more signal channels, and a stub extending from the front side to the back side, the stub being electrically coupled to at least one signal channel and being designed to receive a signal from a component attached to the printed circuit board; and coupling an impedance matching terminal to the stub and to a ground.Type: ApplicationFiled: December 21, 2005Publication date: June 21, 2007Inventors: Xingjian Cai, Xiao-Ming Gao, Qing-Iun Chen
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Publication number: 20070139064Abstract: A method is provided for testing semiconductor devices. In accordance with the method, a first usage temperature T1 is obtained which represents the maximum or minimum temperature to which a semiconductor device will be exposed during its first use by a customer. The semiconductor device is then tested for defects while ramping the temperature to which the device is exposed from a first temperature T0 to the temperature T1.Type: ApplicationFiled: December 16, 2005Publication date: June 21, 2007Inventors: Paul Whipple, Vincent Vu
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Publication number: 20070139065Abstract: A system, apparatus and method for testing and measuring high frequency signals on a trace is described. In one embodiment of the invention, a footprint is manufactured on a trace to allow the testing of a signal while reducing the amount of distortion caused by prior art structures and methods. The footprint is designed to reduce stub effects and capacitance on a signal being communicated on the trace.Type: ApplicationFiled: December 16, 2005Publication date: June 21, 2007Inventor: George Tang
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Publication number: 20070139066Abstract: An integrated current sensor package includes an integrated circuit having a coil in a metal layer of the circuit. A wire is placed close enough to the coil such that the coil and the wire are inductively coupled with each other.Type: ApplicationFiled: December 19, 2005Publication date: June 21, 2007Inventors: Timothy Dupuis, John Pavelka
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Publication number: 20070139067Abstract: A device for testing thin elements, such as wafers or individual substrates, while at the same time offering a facility for inspecting the reverse side of the thin elements is provided in which any deflection of the substrate as a consequence of high contact power of the probe card is avoided and which is also suitable for substrate diameters of 200 mm and above. The device includes a stable plate with a central opening positioned on the basic construction, a frame which can be moved and/or turned on the plate in an x/y direction and, if required, in a theta direction, a highly-rigid substrate support which can be mounted in the frame, and substrates which can be mounted on the substrate support, wherein the mounting is effected through a vacuum, using mechanical elements (clamping ring, clamping foil or other suitable clamping elements), gel pack pads, or adhesive etc.Type: ApplicationFiled: December 21, 2005Publication date: June 21, 2007Applicant: SUSS MicroTec Test Systems GmbHInventors: Uwe Beier, Dietmar Runge, Stefan Kreissig, Steffen Grauer, Matthias Rottka, Botho Hirschfeld, Joerg Kiesewetter
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Publication number: 20070139068Abstract: Forming a wafer level chip scale flip chip package includes determining isolation requirements of an integrated circuit formed in a semi conductive substrate from package signal connections of the wafer level chip scale flip chip package. Operation may further include, based upon the integrated circuit characteristics, selecting a thickness of at least one dielectric layer isolating a top metal layer of the integrated circuit from the package signal connections of the wafer level chip scale flip chip package, determining a minimum pitch of the package signal connections of the wafer level chip scale flip chip package, and determining a maximum lateral distance from the signal pad to a servicing package signal connection of the wafer level chip scale flip chip package and determining a position of the servicing package signal connection of the wafer level chip scale flip chip package based upon the maximum lateral distance.Type: ApplicationFiled: March 14, 2006Publication date: June 21, 2007Applicant: Broadcom Corporation, a California CorporationInventors: Arya Behzad, Matthew Kaufmann, Malcolm MacIntosh, Jacob Rael, Henry Chen
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Publication number: 20070139069Abstract: A test method for a liquid crystal display panel in which the pixels providing liquid crystal elements having sealed in liquid crystal material are arranged in a matrix between opposing electrodes is comprised of a charging process for supplying charge to the above-mentioned liquid crystal element of a pixel under test, a measurement process for discharging the charge from the above-mentioned charged liquid crystal element and measuring the amount of charge discharged, and a decision process for determining whether defects are present in the liquid crystal element of the above-mentioned pixel under test from the above-mentioned measurement results.Type: ApplicationFiled: August 17, 2006Publication date: June 21, 2007Inventor: Yasuhiro Miyake
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Publication number: 20070139070Abstract: For one disclosed embodiment, a driver may generate an output signal on a line. A predriver may receive an input signal and control the driver in response to the input signal to help improve symmetry of rise and fall transitions in the output signal. Other embodiments are also disclosed.Type: ApplicationFiled: December 19, 2005Publication date: June 21, 2007Inventors: Yanmei Tian, Marlene Chan, Mohammed Atha, Harry Muljono