Patents Issued in July 12, 2007
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Publication number: 20070159153Abstract: A load control device is adapted to be disposed in series with an AC voltage source and an electrical load and is operable to provide substantially all voltage provided by the AC voltage source to the load. The load control device comprises a controllably conductive device, a controller, a zero-crossing detector, and a power supply for generating a substantially DC voltage for powering the controller. The power supply is operable to charge an energy storage device to a predetermined amount of energy each half-cycle. The controller is operable to determine when the power supply has stopped charging from the zero-crossing detector each half-cycle, and to immediately render the controllably conductive device conductive to conduct the full load current. Before the controllably conductive device begins to conduct each half-cycle, only a minimal voltage develops across the power supply to allow the energy storage device to charge.Type: ApplicationFiled: February 23, 2007Publication date: July 12, 2007Inventors: William Fricke, Aaron Dobbins, James Steiner, Chen Wu, Russell Weightman, David Perreault, Ryan Lane, Joseph Sapp, Kyle McCarter
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Publication number: 20070159154Abstract: The invention relates to a voltage regulator circuit arrangement comprising a voltage regulator for generating an out-put voltage in dependence of a reference signal, characterized in that a reference signal generation circuit is provided for generating said reference signal comprising a plurality of inputs connected to internal terminals, whereby a sub-set of said plurality internal terminals is connected to an external terminal.Type: ApplicationFiled: January 10, 2005Publication date: July 12, 2007Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.Inventors: Aloysius Boomkamp, Harm Voss, Stefan Butselaar, Clemens Gerhardus Haas, Gerrit Bollen, Ruurd Visser
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Publication number: 20070159155Abstract: A constant voltage circuit is disclosed that includes a constant voltage generator circuit part converting an input voltage into a predetermined constant voltage in accordance with an externally input control signal and outputting the constant voltage; a first capacitor connected to the output end of the constant voltage generator circuit part; a second capacitor charging the first capacitor; and a switch circuit part controlling charging and discharging of the second capacitor in accordance with the control signal. The switch circuit part charges the second capacitor and blocks the discharging of the second capacitor to the first capacitor when the constant voltage generator circuit part is caused to stop outputting the constant voltage by the control signal, and stops applying the input voltage to the second capacitor and charges the first capacitor when the constant voltage generator circuit part is caused to start outputting the constant voltage by the control signal.Type: ApplicationFiled: February 22, 2007Publication date: July 12, 2007Inventor: Kohzoh Itoh
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Publication number: 20070159156Abstract: The present invention generally relates to a method for rapidly counting micron and/or submicron particles by passing such particles through any of a plurality of orifices simultaneously with an ion current and measuring the signal generated thereby. The present invention also generally relates to a device for practicing the method of the present invention. Some embodiments can include methods and/or devices for distinguishing between and counting particles in mixtures. Still other embodiments can include methods and/or devices for identifying and/or counting bioparticles and/or bioactive particles such as pollen.Type: ApplicationFiled: October 23, 2006Publication date: July 12, 2007Inventors: Jun Hu, Jiang Zhe
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Publication number: 20070159157Abstract: Microscopic particle decentralized solution having microscopic particles with different diameters are decentralized, wherein: the microscopic particle decentralized solution has two peaks in a granularity distribution, at a large diameter and a small diameter; and microscopic particle mixtures satisfying the following relationships are decentralized in the solution; R>r and n>3.84×(R/r)3×N, where R is a large particle diameter, r is a small particle diameter, N is the number of large particles, and n is the number of small particle.Type: ApplicationFiled: September 29, 2006Publication date: July 12, 2007Inventors: Yuichiro Sano, Toru Miyasaka
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Publication number: 20070159158Abstract: A multimeter has a housing with at least three input connections, configured as female connectors, for connecting to two measurement lines. When a measurement variable is changed, it is possible to connect at least one of the measurement lines to another input connection. The multimeter has a measurement-range switch which can be moved to a switching position associated with the selected measurement variables, and a mechanical blocking apparatus coupled to the switch. The blocking apparatus allows specific input connections to be blocked such that contact can be made only with the input connections which have an associated measurement variable which corresponds to the measurement variable set by the switch. The blocking apparatus is formed as a pivotable angle lever, and the switch moves end regions of strip-shaped angle limbs of the angle lever to a position aligned with the input connections to be blocked.Type: ApplicationFiled: December 26, 2006Publication date: July 12, 2007Inventors: Gunter Fischer, Dietmar Koops
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Publication number: 20070159159Abstract: A current sensor that can reduce a measurement error due to isotropic elongation or strain owing to temperature and the like. A first half bridge circuit is placed in a first region divided by a center line of a mounting substrate, and a second half bridge circuit is placed in a second region, and the half bridge circuits are equally formed and placed point symmetrically about the central point of the mounting substrate. Even if elongation or strain occurs isotropically in the mounting substrate of magnetoresistive elements owing to temperature, the half bridge circuits undergo the influence of the elongation or strain equally as the bridge circuit. Thus, it can cancel the effect and reduce the measurement error due to the isotropic elongation or strain owing to temperature.Type: ApplicationFiled: December 28, 2006Publication date: July 12, 2007Applicants: MITSUBISHI ELECTRIC CORPORATION, KOHSHIN ELECTRIC CORPORATIONInventors: Akira Okada, Junji Miyamoto
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Publication number: 20070159160Abstract: A visual inspector for inspecting a flat panel display device and a visual inspecting method using the same are disclosed. The visual inspector includes an inspection unit including a base frame and a loading stage rotatably coupled to the base frame to load a display panel on a front side thereof and to transmit a light to the flat panel device; a reflective illumination unit installed in the upper space of the inspection unit to illuminate the display panel loaded on the front side of the loading stage; and a transparent illumination unit coupled to the rear side of the loading stage of the inspection unit to illuminate the display panel loaded on the front side of the loading stage.Type: ApplicationFiled: June 26, 2006Publication date: July 12, 2007Inventors: Kyeung Yoon, Dong-Hyon Nam
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Publication number: 20070159161Abstract: A wireless position feedback device incorporated in a monitored device. The position feedback device measures a position of a moving element of the monitored device, generates a local power supply based upon local environmental characteristics and conditions. The wireless feedback device stores the local power supply for use in transmitting the measured position to a remote control system. The remote control system adjusts at least one operational parameter for the monitored device based upon the measured position.Type: ApplicationFiled: August 8, 2006Publication date: July 12, 2007Applicant: Honeywell ASCA, Inc.Inventor: Patrick W.G. Neill
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Publication number: 20070159162Abstract: Disclosed is a method and an apparatus for self-calibrating a Direct Current (DC) offset and an imbalance between orthogonal signals, which may occur in a mobile transceiver. In the apparatus, a transmitter of a mobile terminal functions as a signal generator, and a receiver of the mobile terminal functions as a response characteristic detector. Further, a baseband processor applies test signals to the transmitter, receives the test signals returning from the receiver, and compensates the imbalance and DC offset for the transmitter side and the receiver side by using the test signals. The test signal is applied to only one of the I channel path and the Q channel path, and an RF band signal output from the transmission side by the test signal is used as an input signal to the reception side.Type: ApplicationFiled: December 8, 2006Publication date: July 12, 2007Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Hyun-Il Kang, Jae-Kon Lee, Young-Hwan Lee, Hyeong-Seok Yu, Sang-Hyun Woo
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Publication number: 20070159163Abstract: The invention refers to a sample device to be inserted inside an external tube, having a substantially circular cross-section, and carrying a substantially circular plate as part of a turntable to be rotated within the external tube around two substantially orthogonal axes. Two substantially coaxial tubes, with the turntable being supported by the outer tube, and two meshing gears, with the first gear being connected to the inner tube and the second gear being connected to the turntable, and/or a special cable guide being connected with its first end with the turntable and its second end, being substantially perpendicular to the first end, with the supporting means, with the inner tube, the outer tube and/or the cable guide being connected with a driving unit, are provided for maximizing the surface of the plate to be rotated within the external tube.Type: ApplicationFiled: December 30, 2003Publication date: July 12, 2007Applicant: European Organisation for Nuclear Research CERNInventor: Felix Bergsma
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Publication number: 20070159164Abstract: The invention concerns a magnetoresistive magnetic field sensor comprising a stack (1) of a reference element (2), a separation element (3) and an element (4) sensitive to the magnetic field, in which the reference element (2) and the sensitive element (4) have respectively a first and a second magnetic anisotropy (5, 6) in a first and a second direction. The sensitive element (4) comprises the superposition of a layer of a ferromagnetic material (FM1) and a layer of an antiferromagnetic material (AF1) which is arranged in order to obtain a magnetic moment (10) whose component oriented in the direction of the field to be measured varies reversibly in relation to the strength of the magnetic field to be measured, and linearly in an adjustable field range. The invention also concerns a use of such a sensor.Type: ApplicationFiled: March 10, 2004Publication date: July 12, 2007Inventors: Michel Hehn, Alain Schuhl, Gregory Malinowski, Christophe Nicot, Christophe Duret
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Publication number: 20070159165Abstract: A device (1) comprising a generator (6) of magnetic flux (32) connected to the rotating body and a magnetoresistive sensor (8) connected to the support (4). The magnetic flux generator (6) takes the form of a ring or a portion of a ring and comprises alternating poles (10, 12) making up a series of magnets generating magnetic fluxes in substantially parallel directions (30).Type: ApplicationFiled: January 19, 2005Publication date: July 12, 2007Applicant: SIEMENS VDO AUTOMOTIVEInventor: Gerard Mouaici
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Publication number: 20070159166Abstract: A rotating head for a device for the nondestructive testing of metallic test specimens has probe carriers, stray flux or eddy current sensors, a coupling ring and elastic coupling elements. In this way, tandem-like, roughly forced coupling of the pivoting motions of the probe carriers is produced.Type: ApplicationFiled: December 20, 2006Publication date: July 12, 2007Applicant: Prueftechnik Dieter Busch AGInventor: Bernd ZIMMERMANN
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Publication number: 20070159167Abstract: A compact sensor system integrates electric and/or magnetic field sensors to accurately measure, with a high level of sensitivity, one or more electric and magnetic vector components of fields. The electric and magnetic field data can be utilized separately or combined. The sensor system is self-contained so as to include a built-in power source, as well as data storage and/or transmission capability. The integrated sensor system also preferably includes a global positioning system (GPS) to provide timing and position information, a sensor unit which can determine the orientation and tilt of the sensor system, and self-calibrating structure which produces local electric and/or magnetic fields used to calibrate the sensor system following deployment.Type: ApplicationFiled: October 20, 2006Publication date: July 12, 2007Inventors: Andrew Hibbs, Robert Matthews, David Jabson
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Publication number: 20070159168Abstract: A method for driving a power supply (84) of a magnetic field coil (85) for generating a predetermined magnetic field profile B(r,t) in the volume under investigation of a nuclear magnetic resonance (=NMR) apparatus (81), wherein for compensation of distortions caused by the apparatus, an input signal i(t) is predistorted, that predetermines the time behavior of the magnetic field profile, wherein the power supply (84) is driven by the predistorted signal o(t), is characterized in that the predistortion is performed using a transfer function of the form G ? ( s ) = O ? ( s ) I ? ( s ) = ? n = 0 N ? s n ? b n ? n = 0 N ? s n ? a n , with s=?+j?, s?C, and with N?2, wherein O(s) is the Laplace transform of o(t), and I(s) is the Laplace transform of i(t). This inventive method improves compensation of distortions of one or more gradient fields including their correlations during rapid switching.Type: ApplicationFiled: January 3, 2007Publication date: July 12, 2007Applicant: Bruker BioSpin GmbHInventors: Frank Schneider, Birk Schutz
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Publication number: 20070159169Abstract: A method for reducing acoustic noise in a medical imaging system is described. The method includes attaching a material to an area affected by an acoustic noise generated by the imaging system. The material is configured to bend upon receiving an electrical signal.Type: ApplicationFiled: January 12, 2006Publication date: July 12, 2007Inventor: Michael Sellers
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Publication number: 20070159170Abstract: A nuclear magnetic resonance probe head comprising at least two coil/resonator configurations A1 and A2, wherein at least one of the coil/resonator configurations A1 has two saddle-shaped coils S1 and S2 (1, 2; 21; 41, 42; 53), wherein each coil (1, 2; 21; 41, 42; 53) has a window (9) about which N windings (3, 4; 26, 28, 30) are disposed which are connected in series, wherein N?2, wherein the coil/resonator configurations A1 and A2 are aligned perpendicularly to each other, and wherein the coil/resonator configurations A1 and A2 have different resonance frequencies is characterized in that each coil S1 and S2 (1, 2; 21; 41, 42; 53) is formed mirror-symmetrically relative to a central plane (5) of the respective coil (1, 2; 21; 41, 42; 53), which is perpendicular to the window (9) of the respective coil, and wherein the central planes (5) of the coils S1 and S2 are identical to minimize the electromagnetic coupling between the two coil/resonator configurations A1 and A2 at the resonance frequency of A2.Type: ApplicationFiled: October 2, 2006Publication date: July 12, 2007Applicant: Bruker BioSpin AGInventors: Nicolas Freytag, Daniel Marek, Alia Hassan, Stephen Graf, Peter Scheuzger
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Publication number: 20070159171Abstract: Eddy current generated around a magnetic circuit in an MRI apparatus is one of the causes of deviation from an ideal magnetic field gradient waveform and causes image distortion, loss of strength, ghost generation, loss of signal, and spectral distortion. An object of the present invention is to suppress the generation of the eddy current. In an MRI apparatus, a ferromagnetic material formed from powder is used in a part of a magnetic circuit: the powder mainly comprising a mother phase containing iron or cobalt and showing ferromagnetism; and a high-resistance layer having a resistance not less than ten times as high as the mother phase and a Vickers hardness lower than that of the mother phase being formed in layers along parts of the surface of the powder on parts or the entire of the surface.Type: ApplicationFiled: December 20, 2006Publication date: July 12, 2007Inventors: Matahiro Komuro, Yuichi Satsu, Takao Imagawa, Katsumi Ishikawa, Takeyuki Itabashi
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Publication number: 20070159172Abstract: A magnetic resonance imaging apparatus includes a movement unit which moves a subject placed in a static magnetic field, a collector which collects data corresponding to a magnetic resonance signal emitted from the subject, a detector which detects a position of a particular section of the subject in the static magnetic field, a reconstruction unit which reconstructs an image, based on the collected data, when the detected position falls within an allowable area, and a controller which controls the movement unit to compensate for a deviation of the detected position from a reference position.Type: ApplicationFiled: January 3, 2007Publication date: July 12, 2007Applicants: KABUSHIKI KAISHA TOSHIBA, TOSHIBA MEDICAL SYSTEMS CORPORATIONInventor: Satoshi Sugiura
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Publication number: 20070159173Abstract: Magnetic resonance device comprising a preferably essentially cylindrical vacuum housing containing a magnet together with a cooling device, said vacuum housing having an inner wall, an outer wall and two end walls, the inner wall and/or one or each end wall being fashioned as a composite component consisting of one or more components made of a non-metallic composite material and a plurality of metal components serving to provide mechanical reinforcement and having a lamellar or annular form for forming the inner wall or having the form of a segment of a circle for forming an end wall such that a reduction in eddy currents is produced.Type: ApplicationFiled: January 4, 2007Publication date: July 12, 2007Inventors: Peter Dietz, Ralph Kimmlingen, Johann Schuster, Stefan Stocker
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Publication number: 20070159174Abstract: A magnetic resonance imaging system includes a high-frequency magnetic field generating unit for generating and applying a high-frequency magnetic field to a subject placed in a static magnetic field, a gradient magnetic field generating unit for generating a gradient magnetic field to be superimposed on the static magnetic field, and a sequencer for controlling the high-frequency magnetic field generating unit and the gradient magnetic field generating unit to acquire, within a specified part of the heartbeat of the subject, MR data that pertains to a plane through which an axis substantially identical to the body axis of the subject in a k-space extends, and to cause the plane to rotate, at every heartbeat, about the axis substantially identical to the body axis.Type: ApplicationFiled: March 2, 2007Publication date: July 12, 2007Inventor: Koichi Oshio
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Publication number: 20070159175Abstract: A method and a device for on-chip magnetic resonance spectroscopy (FMR, SPR, EPR, ESR, NMR) is proposed. On-chip magnetic resonance spectroscopy may be applied to non-magnetic as well as magnetic materials and to solids, liquids and gases. The method of the present invention is suitable for miniaturised materials analysis such as for example microfluidics. The strength of the method lies in the combination of highly efficient spin excitation near on-chip current wires with very sensitive on-chip magnetic sensors. The method and device also allows to separately detect different types of magnetic particles or molecules.Type: ApplicationFiled: January 14, 2005Publication date: July 12, 2007Inventor: Menno Prins
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Publication number: 20070159176Abstract: A coil array for an imaging apparatus using nuclear magnetic resonance (NMR) for the transmission or reception, or both, of the Lamor frequency signals, assembled in fields, or arrays, includes individual coils made from a conductor track that defines an area. An electrical conductor is applied, at least in the defined area, and is arranged either within or outside the individual coils, and completely surrounding the individual coils and forming a closed circuit.Type: ApplicationFiled: February 10, 2005Publication date: July 12, 2007Inventors: Titus Lanz, Mark Griswold
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Publication number: 20070159177Abstract: An automotive vehicle electrical system diagnostic apparatus includes first and second electrical connections configured to electrically couple to an electrical system of an automotive vehicle which includes a battery. Digital samples are obtained during operation of the vehicle which are related to the system. The digital samples are stored in memory.Type: ApplicationFiled: October 24, 2006Publication date: July 12, 2007Applicant: Midtronics, Inc.Inventors: Kevin Bertness, William Sampson
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Publication number: 20070159178Abstract: An occupant detection system comprises a weight sensor and an electric field sensor, each operatively coupled to a seat. The electric field sensor generates an electric field from at least one electrode in the seat bottom of the seat, provides for generating a response to an influence of the occupant thereupon, and is adapted to provide for discriminating from the response a seated infant or child seating condition from another seating condition. If a measure of weight from the weight sensor is less than a threshold, or if a seated child seating condition is detected by the electric field sensor, then a signal processor provides for disabling an associated restraint actuator. The electric field sensor may comprise a plurality of electrodes over separate first and second regions of differing proximity to a seated infant or child, or at least one electrode in cooperation with a shield or void over at least one of the regions.Type: ApplicationFiled: February 20, 2007Publication date: July 12, 2007Inventors: James Stanley, Robert Stopper
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Publication number: 20070159179Abstract: Disclosed are a test system and a test method using a virtual review, capable of driving a test device and reduce the number of operators by allowing an operator to perform review and determination based on a captured image of a defect on a substrate. The test system using a virtual review comprises: a test device that takes an image of a defect on an array substrate or color filter substrate to acquire a captured image and provides examination information related to the defect. A main server constructs the examination information from the test device as a database and transmits them to a review host. The review host determines whether a defect exosts on the array substrate or color filter substrate based on the examination information from the main server to yield a determination result and resends the determination result to the main server.Type: ApplicationFiled: December 22, 2006Publication date: July 12, 2007Inventors: Ho Sun Park, Moon Seong Eom, Sang Ho Nam
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Publication number: 20070159180Abstract: The invention concerns a device for controlling a final power-output stage, the latter comprising three half-bridges consisting respectively of a series circuit including an upper semiconductor switch and a lower semiconductor switch and subjected to a service voltage, the connection points of the semiconductor switches of the half-bridges forming outputs which are connected to the windings of a motor having at least three phases. The invention is characterized in that there is provided a control device for shifting on-state respectively one semiconductor switch or simultaneously several semiconductor switches according to a predetermined programme and for determining whether the respective voltages at the outputs are respectively within a predetermined tolerance range for the corresponding switching state.Type: ApplicationFiled: November 9, 2004Publication date: July 12, 2007Inventors: Wolfgang Bay, Michael Henninger
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Publication number: 20070159181Abstract: A voltage detection system comprising a first circuit board, a second circuit board, and a voltage detection circuit. The voltage detection circuit comprises a first connection unit, a second connection unit, a resistor, and a voltage detection unit. Dummy lines of the first and second connection units are coupled in series. When lines of the first and second connection units are not aligned to lines of the first and second circuit boards, an entirety equivalent impedance of the dummy lines is decreased. When detecting that the entirety of equivalent impedance is decreased to be less than a predetermined value, the voltage detection unit enables a control signal.Type: ApplicationFiled: July 27, 2006Publication date: July 12, 2007Applicant: AU OPTRONICS CORP.Inventors: Po-Tang Hsu, Meng-Chang Tsai
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Publication number: 20070159182Abstract: Embodiments of the present invention relate to circuits to be inserted in a signal path between a signal generator and a test port of a vector network analyzer (VNA), where the circuits enable the VNA to make scattering parameter measurements for a load (RL) connected to the test port when the signal generator generates signals having frequencies that are below a low frequency limit (e.g., 2 MHz) of an actual dual directional coupler of the VNA. Embodiments of the present invention are also directed to a VNA that includes such circuits.Type: ApplicationFiled: December 22, 2005Publication date: July 12, 2007Applicant: Anritsu CompanyInventor: Donald Bradley
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Publication number: 20070159183Abstract: A capacitive physical quantity sensor includes a sensor element and a detecting element. The sensor element includes first and second fixed electrodes facing a movable electrode. A first voltage is applied to the first fixed electrode and a second voltage is applied to the second fixed electrode. The detecting circuit includes a capacitance-voltage conversion circuit, in which an operational amplifier, a capacitor and a switch including a P-channel MOS transistor and a N-channel MOS transistor are disposed. The transistors have a back gate potential, which is approximately equal to an average voltage of the first voltage and the second voltage.Type: ApplicationFiled: December 21, 2006Publication date: July 12, 2007Applicant: DENSO CORPORATIONInventors: Akinobu Umemura, Junji Hayakawa
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Publication number: 20070159184Abstract: Methods and apparatus are provided for measuring a ratio of capacitances.Type: ApplicationFiled: December 22, 2006Publication date: July 12, 2007Applicant: SYNAPTICS INCORPORATEDInventors: Joseph REYNOLDS, Kirk HARGREAVES
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Publication number: 20070159185Abstract: Security scanning devices based on electrical tomography, including tomography systems based on the measurement of capacitance (ECT) and electromagnetic tomography (EMT), in combination with knowledge-based image analysis and understanding. Each device comprises a sensing head or transducer, sensing electronics, image reconstruction and image analysis microprocessor (either microcontroller, DSP, laptop or desktop PC), a display unit and accompanying software for identifying dangerous materials and items. The security scanning devices enable enhancement of image resolution with ECT and EMT. More sensors, more sensitive circuits and flexible/optimal measurement protocols may be employed for obtaining more independent measurements and enable implementation of data fusion to combine the complementary sensitivity of ECT and EMT to different material properties, while providing architecture to implement image knowledge bases, which may characterize objects, whose image attributes are acquired from multiple sensors.Type: ApplicationFiled: October 6, 2006Publication date: July 12, 2007Inventors: Wuqiang Yang, A. Hennessey
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Publication number: 20070159186Abstract: A Transmission Line Pulse (“TLP”) measurement system for testing devices such as integrated circuits (“ICs”), and especially for testing the electrostatic discharge (“ESD”) protection structures connected to terminals on such ICs. The TLP measurement system measures the pulsed voltage and/or current of a device under test (“DUT”) by recording voltage and/or current pulse waveforms traveling in a constant impedance cable to and from the DUT. The pulses going to and returning from the DUT are processed to create signal replicas of the voltage and current pulses that actually occurred at the DUT. Oscilloscope operating settings optimize the recording of these signal replicas by improving the measurement signal-to-noise ratio. This improved TLP system is especially useful when very short width pulses on the order of less than 10 nanoseconds are used to test the DUT's response.Type: ApplicationFiled: January 11, 2007Publication date: July 12, 2007Inventor: Evan Grund
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Publication number: 20070159187Abstract: A corrosion detection apparatus is provided. The corrosion detection apparatus is capable of detecting corrosion on a surface of a pipe or a vessel where the surface contacts a fluid that is corrosive to the surface. The corrosion detection apparatus includes a corrodible element having a contact surface; at least two electrodes that are in electrical communication with each other through a segment of the corrodible element; and a detector in communication with the at least two electrodes. The detector detects a characteristic impedance value from the at least two electrodes through the corrodible element segment.Type: ApplicationFiled: March 13, 2007Publication date: July 12, 2007Applicant: GENERAL ELECTRIC COMPANYInventors: Weiguo Chen, Yu Zhang, Gaorong He, Peter Allison, Yikang Gu, Yao Chen, Wei Cai, Brian Lasiuk, Shengxian Wang, Chang Wei
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Publication number: 20070159188Abstract: A pass through test system for testing an electronic module includes an interface board, and test contactors movably mounted to the interface board for electrically engaging terminal contacts on the module with a zero insertion force on the modules. The interface board is configured for mounting to an automated or manual pass through test handler in electrical communication with test circuitry. In a first embodiment the interface board includes test pads in electrical communication with the test circuitry, and rotatable test contactors having spring contacts configured to simultaneously engage the test pads and the terminal contacts on the module. In a second embodiment the interface board includes test pads in electrical communication with the test circuitry, and slidable test contactors having beam leads configured to simultaneously engage the test pads and the terminal contacts on the module.Type: ApplicationFiled: March 5, 2007Publication date: July 12, 2007Inventor: Daniel Cram
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Publication number: 20070159189Abstract: An apparatus and method for evaluating driving characteristics of a scanner by precisely measuring the driving angle of a scanning mirror rotating within a large angle range of about ±12 degrees. The apparatus includes: a light source emitting a beam; an object lens disposed between the scanning mirror and the light source and having a focal point placed on the scanning mirror; a PSD receiving the beam reflected from the scanning mirror and passed through the object lens for detecting the rotation angles of the scanning mirror; a signal processing unit processing a signal detected by the PSD, wherein the beam reflected from the scanning mirror and passed through the object lens becomes parallel with the beam emitted from the light source and incident onto the object lens regardless of the rotation angles of the scanning mirror.Type: ApplicationFiled: June 1, 2006Publication date: July 12, 2007Inventors: Yong-chul Cho, Seok-mo Chang
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Publication number: 20070159190Abstract: Disclosed are an optical test apparatus, related test method and method of operation, and related probe card adapted to optically test an image sensor. An illumination source of the optical test apparatus provides an optical test signal to the image sensor through the probe card. The optical test signal has a property variably defined by a feedback loop formed between a reference image sensor associated with the probe card and a control unit connected between the reference image sensor and the illumination source.Type: ApplicationFiled: July 14, 2006Publication date: July 12, 2007Inventors: Jongmoon Lee, Juntaek Lee
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Publication number: 20070159191Abstract: Probe accessories, and methods for routing signals between a target and a test instrument using the probe accessories, are disclosed. Some of the probe accessories include a flexible circuit and first and second pairs of contacts. Flexible circuit design varies, but one embodiment has first and second regions, a first conductor and a second conductor, and a separation feature. The first conductor extends into the first region while the second conductor extends into both the first and second regions and has a fixed spacing with respect to the first conductor. A separation feature extends between first and second regions and is operable to create two independently maneuverable legs, each leg comprising an end portion of the first and second regions, while maintaining a fixed spacing between the first and second conductors. The first and second pairs of contacts electrically couple the probe accessories between test points and test instruments.Type: ApplicationFiled: January 12, 2006Publication date: July 12, 2007Inventors: Brock LaMeres, Brent Holcombe, Kenneth Johnson
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Publication number: 20070159192Abstract: A probing apparatus comprising: an inspection stage for receiving a flat plate-like device under test with a plurality of electrodes and moving the device under test on the inspection stage in at least three directions, that is, an X direction and a Y direction intersecting each other within a parallel plane to the device under test, and a Z direction intersecting both the directions; a probe card having a plurality of probes and spaced apart from the inspection stage in the Z direction such that the probe tips face the inspection stage; a displacement mechanism for relatively displacing the probe card and the inspection stage for adjustment of parallelism of the device under test on the inspection stage and the probe card; a plurality of measuring instruments respectively for measuring the interval between the inspection stage and the probe card and arranged at intervals in one of the inspection stage and the probe card in the X direction and the Y direction; a control portion for controlling at least the meType: ApplicationFiled: January 4, 2007Publication date: July 12, 2007Inventors: Yoshiei Hasegawa, Hikaru Masuda, Katsuo Yasuda, Kenichi Washio, Masashi Hasegawa
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Publication number: 20070159193Abstract: An information reproducing apparatus and a method using a semiconductor probe are provided. The information reproducing apparatus includes a semiconductor probe including a semiconductor tip including a channel varying with an electric field generated by an information recording medium; a modulator applying a high frequency modulation signal to the semiconductor probe to form a modulation electric field so as to modulate an information signal induced by the electric field; a signal detector detecting a signal generated by the semiconductor probe; and a demodulator extracting the information signal modulated by the modulation electric field from the signal detected by the signal detector.Type: ApplicationFiled: January 9, 2007Publication date: July 12, 2007Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Dong-ki Min, Seung-bum Hong, Hong-sik Park
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Publication number: 20070159194Abstract: A probing apparatus comprising: an inspection stage for receiving a flat plate-like device under test with a plurality of electrodes and moving the device under test on the inspection stage in at least three directions, that is, an X direction and a Y direction intersecting each other within a parallel plane to the device under test, and a Z direction intersecting both the directions; a probe card having a plurality of probes and spaced apart from the inspection stage in the Z direction such that the probe tips face the inspection stage; a displacement mechanism for relatively displacing the probe card and the inspection stage for adjustment of parallelism of the device under test on the inspection stage and the probe card; a plurality of measuring instruments respectively for measuring the interval between the inspection stage and the probe card and arranged at intervals in one of the inspection stage and the probe card in the X direction and the Y direction; a control portion for controlling at least the meType: ApplicationFiled: January 9, 2007Publication date: July 12, 2007Inventors: Yoshiei Hasegawa, Hikaru Masuda, Katsuo Yasuda, Kenichi Washio, Masashi Hasegawa
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Publication number: 20070159195Abstract: A differential measurement probe has a ground clip system for electrically coupling outer shielding conductors of differential probing tips together. In one embodiment, the probing tips independently move vertically relative to each other with the ground clip system secured to each of the outer shielding conductors of the probing tips. In a further embodiment, the probing tips move both vertically and horizontally and the ground clip system has a spring wire member that is secured to the probe. The spring wire member is formed with various sections having various angles to each other that allows one section to slidably engage one of the outer shielding conductors on one of the probing tips and another section to slidably engage the outer shielding conductor of the other probing tip.Type: ApplicationFiled: March 21, 2007Publication date: July 12, 2007Applicant: TEKTRONIX, INC.Inventors: Kei-Wean Yang, Mark Nightingale, Paul Chastain
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Publication number: 20070159196Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.Type: ApplicationFiled: March 5, 2007Publication date: July 12, 2007Inventors: Leonard Hayden, Scott Rumbaugh, Mike Andrews
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Publication number: 20070159197Abstract: A testing apparatus is described with a housing, a power source, a carrier assembly, and a backbone connecting the carrier assembly to the power source. A resource board is disposed on the carrier assembly and is connected thereto, thereby receiving power from the power source through the carrier assembly. The resource board is adapted to perform a test on a device under test and to generate data reflecting results of the test on the device under test. A test pin assembly is disposed at one end of the resource board and is connectable with a loadboard. A controller operatively connects to the power supply, the carrier assembly, and the resource board. The controller is adapted to communicate with the resource board to execute instructions to test the device under test. The controller also receives the result data from the resource board, permitting analysis of the device under test.Type: ApplicationFiled: January 10, 2006Publication date: July 12, 2007Applicant: Telco Testing Systems LLCInventors: Roger Brueckner, Michael Costello, James Hopkins, Rudolph Sterbenz
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Publication number: 20070159198Abstract: The automatic loading and unloading of devices for burn-in testing is facilitated by loading burn-in boards in a magazine with the stacked boards in the magazine moved into and out of a burn-in oven by means of a trolley. The trolley can include an elevator whereby a plurality of magazines can be stacked in the oven for the simultaneous burn-in testing of devices mounted on the burn-in boards. Each board has rollers on one end which are engagable by pneumatically actuated cam mechanisms for inserting the board into an electrical contact in the oven for burn-in tests. Preferably, the cam mechanisms allow for extraction of a single board for inspection.Type: ApplicationFiled: June 19, 2006Publication date: July 12, 2007Applicant: SPANSION LLCInventors: Wan Yen TEOH, Paiboon SUBPANYADEE, Kurt Joseph PEREZ, Chai Soon TEO, Swee Hin ONG
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Publication number: 20070159199Abstract: According to some embodiments, a method includes placing a device under test (DUT) in a test chamber and applying a pulse-modulated RF wireless test signal to the DUT in the test chamber. The method further includes detecting an acoustic output of the DUT. In addition or as an alternative to applying the pulse-modulated test signal, the test signal strength may be at a level of 30 V/m or 90 V/m. If the DUT is a telephone, it may be coupled via a voice signal path to another telephone, and an output of the other telephone may also be detected.Type: ApplicationFiled: December 11, 2006Publication date: July 12, 2007Inventors: Vivek Talwar, Stephen Berger, Werner Schaefer, Jeff Rodman, Tony Griffiths, Joseph Liguori
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Publication number: 20070159200Abstract: An adaptor for inspection of circuit boards includes a wiring board for connection, on a front surface of which a plurality of connecting electrodes are formed correspondingly to electrodes to be inspected, and an anisotropically conductive elastomer sheet detachably arranged on the front surface of the wiring board for connection. The anisotropically conductive elastomer sheet has a surface roughness of 0.5 to 5 ?m on its front surface coming into contact with the circuit board, and a surface roughness of at most 0.3 ?m on its back surface coming into contact with the wiring board for connection. The wiring board for connection has, on its front surface, an insulating layer formed such that each of the connecting electrodes is exposed, and the insulating layer has a surface roughness of at most 0.2 ?m on its front surface.Type: ApplicationFiled: February 17, 2005Publication date: July 12, 2007Applicant: JSR CorporationInventors: Kiyoshi Kimura, Sugiro Shimoda
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Publication number: 20070159201Abstract: A SIP (system in package) with a chip and a memory mode, capable of performing integration test on the memory module even if the memory module does not include any scan chain is provided. The chip has a built-in self-test (BIST) circuit, which generates test pattern signals to test the memory module in response to a mode signal. Under a test mode, after the memory module receives the test pattern signals, the memory module outputs responsive readout signals to the BIST circuit and the BIST circuit determines and outputs a test result and a test record in response to the readout signals. If the test fails, conditions of the faulty memory module are recognized from the test record.Type: ApplicationFiled: January 11, 2006Publication date: July 12, 2007Inventors: Wang-Jin Chen, Aviles Chang
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Publication number: 20070159202Abstract: A method and system of testing an electronic device can be performed by estimating the die temperature using correlation data previously collected for other electronic devices. In one embodiment, correlation data can include (1) die temperatures measured and (2) currents drawn by the electronic devices, testing voltages for the electronic devices, or powers consumed by the electronic devices during the testing. The correlation data can be used to generate an equation or be stored in a table. A method of testing a subsequent electronic device can include testing the subsequent electronic device. The method can also include estimating a die temperature for the subsequent electronic device during testing, wherein the die temperature can be estimated at least in part using a current drawn by the subsequent electronic device, a testing voltage for the subsequent electronic device, or a power consumed by the subsequent electronic device.Type: ApplicationFiled: January 10, 2006Publication date: July 12, 2007Applicant: Freescale Semiconductor, Inc.Inventors: Michael Noel, Douglas Grover