Patents Issued in June 19, 2008
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Publication number: 20080143328Abstract: The present invention relates to a method and an apparatus for measuring magnetic properties of a document (5) and to a measuring head (12) suitable therefor for measuring magnetic field changes. The apparatus comprises a device (2, 3) for generating an electromagnetic alternating field, a measuring element (6) and a lock-in amplifier (7). The measuring element (6) is so adapted that it converts an electrical input signal of the measuring element (6) into an electrical output signal in dependence on changes of the magnetic field when the document (5) with magnetic properties is brought into the magnetic field. The measuring element (6) used is preferably as a GMR or SDT element which changes its electrical resistance comparatively strongly upon even small changes of the electromagnetic alternating field. The measuring head (12) for use in the apparatus comprises a printed circuit board (13) with coils (14) disposed thereon and a GMR or SDT element (6).Type: ApplicationFiled: February 24, 2006Publication date: June 19, 2008Inventors: Klaus Thierauf, Helmut Pradel
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Publication number: 20080143329Abstract: A semiconductor integrated circuit for detecting a magnetic field includes: a magneto-electric conversion element for detecting the magnetic field and converting a detected magnetic field to an electric signal, a conductive pattern for flowing a test current therethrough, the conductive pattern disposed around the magneto-electric conversion element; a detection element for detecting the electric signal of the magneto-electric conversion element when the test current flows through the conductive pattern; and an output element for outputting a test result based on the electric signal detected by the detection elementType: ApplicationFiled: November 29, 2007Publication date: June 19, 2008Applicant: DENSO CORPORATIONInventor: Masato Ishihara
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Publication number: 20080143330Abstract: Certain embodiments are directed to devices, systems and methods for determining a penetration depth of an induced oscillation in a porous medium. In certain examples, the devices, systems and methods are designed to detect a magnetic resonance signal in the presence of an induced oscillatory fluid flow in a porous medium to determine penetration depth of the induced oscillation in the porous medium. In some examples, the mobility of a fluid in the porous medium may be determined from the determined penetration depth.Type: ApplicationFiled: December 18, 2006Publication date: June 19, 2008Applicant: SCHLUMBERGER TECHNOLOGY CORPORATIONInventors: David P. Madio, David Linton Johnson
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Publication number: 20080143331Abstract: An MRI apparatus includes a MRI gradient coil and an MRI cooling system. The MRI cooling system is thermally connected to the MRI gradient coil and includes a cooling circuit. A chiller is connected to the cooling circuit and configured to pump a coolant through the cooling circuit and extract heat from the coolant. The coolant includes both a carrier fluid and a phase-change material.Type: ApplicationFiled: December 15, 2006Publication date: June 19, 2008Inventors: Mehmet Arik, Michael Kent Cueman
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Publication number: 20080143332Abstract: A magnetic resonance system has a base unit and a patient bed. The base unit embodies a magnet system by which magnetic fields can be generated in an excitation region, these magnetic fields causing nuclear spins in an examination subject in the excitation region to be excited to emit a magnetic resonance signal. The patient bed can be moved in a travel direction relative to the base body over a travel range. By movement of the patient bed the examination subject can be brought into the excitation region. A number of base unit coupling elements that are connected with an evaluation device for evaluation of magnetic resonance signals are arranged to be stationary at the base unit relative to the base unit. A number of patient bed coupling elements that are connected with a local coil for acquisition of the magnetic resonance signal are arranged on the patient bed so as to be stationary relative to the patient bed.Type: ApplicationFiled: December 11, 2007Publication date: June 19, 2008Inventors: Martin Hergt, Thomas Kundner
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Publication number: 20080143333Abstract: An array antenna for magnetic resonance applications has at least one first and one second conductor loop in which radio-frequency currents oscillate in respective current flow directions in the operation of the array antenna. The respective conductor loops are divided into first or second loop segments in their respective current flow directions. The first loop segments are capacitively coupled with one another by first capacitors, the second loop segments are capacitively coupled with one another of second capacitors. The loop segments are fashioned as conductor traces of a circuit board that has at least one first and one second electrically insulating support layer. The support layers abut one another with the exception of conductor traces arranged between the first support layer and the second support layer. The capacitors are respectively formed by end regions of the first or second loop segments abutting one another as viewed in the respective current flow direction.Type: ApplicationFiled: December 5, 2007Publication date: June 19, 2008Inventors: Helmut Greim, Martin Hemmerlein
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Publication number: 20080143334Abstract: A frequency synthesizer for RF pulses for RF coils used in MRI apparatuses, includes: a D/A converter which converts digital values of the waveform of a fundamental wave whose frequency is lower than a Nyquist frequency, which is half the sampling frequency, into an analog waveform; and a band-pass filter which passes only a prescribed alias out of an alias group whose frequency is higher than the Nyquist frequency, contained in said analog waveform, wherein: said prescribed alias having passed said band-pass filter is transmitted from said RF coil as an RF pulse.Type: ApplicationFiled: December 12, 2007Publication date: June 19, 2008Inventor: Shigeru Kagami
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Publication number: 20080143335Abstract: Multiple sources are provided for a transmitter cable for use in electromagnetic surveying. The transmitter cable includes a dipole antenna comprising a pair of spaced apart electrodes mounted on their respective cables. Two antennas may be powered from each source. Alternatively, the outputs of each source are connected to a common antenna pair. A single large power supply may be mounted on a vessel to supply power through the tow cable. Alternatively, a number of power supplies may be provided aboard the vessel, with each power supply having dedicated conductors through the tow cable to power the plurality of current sources.Type: ApplicationFiled: December 10, 2007Publication date: June 19, 2008Applicant: Schlumberger Technology CorporationInventors: Ransom Reddig, Philip Heelan
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Publication number: 20080143336Abstract: A system and method to determine earth formation properties by positioning a logging tool within a wellbore in the earth formation, the logging tool having a tool rotation axis and a first, a second, and a third tilted transmitter coil, and a tilted receiver coil; rotating the logging tool about the tool rotation axis; energizing each transmitter coil; measuring a coupling signal between each transmitter coil and the receiver coil for a plurality of angles of rotation; determining a coupling tensor; and determining the earth formation properties using the coupling tensor.Type: ApplicationFiled: December 14, 2006Publication date: June 19, 2008Inventors: Emmanuel Legendre, Jean Seydoux, Reza Taherian
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Publication number: 20080143337Abstract: A method for evaluating the safety of a battery under an internal short-circuit condition. The method for evaluating an internal short-circuit of a battery is characterized in that a short-circuit can be caused at a desired location inside the battery. According to the evaluation method of the invention, the evaluation result is not affected by the constitution of the outermost part of the battery unlike nail penetration tests which are conventional evaluation methods. Also, unlike crush tests which are conventional evaluation methods, the locations of short-circuits do not vary among tests and the safety under an internal short-circuit condition can be evaluated accurately.Type: ApplicationFiled: May 15, 2007Publication date: June 19, 2008Inventors: Masato Fujikawa, Shinji Kasamatsu, Hajime Nishino, Mikinari Shimada
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Publication number: 20080143338Abstract: A wire disconnection inspecting device includes a vehicle position recognition unit for detecting that a vehicle has reached an inspection position; a preparation timing recognition unit for detecting that a step preceding by one is reached; a terminal for transmitting an operation signal to an ECU so as to make an electrical connection to a heating conductor; an infrared camera for imaging a rear shield of the vehicle; and a main processing unit for acquiring thermal image data from the infrared camera and inspecting disconnection of the heating conductor. The main processing unit recognizes that the vehicle has reached a step preceding by one according to the preparation timing recognition unit and makes electrical connection to the heating conductor via the terminal. The main processing unit acquires the image data from the infrared camera when the vehicle has reached the inspection position.Type: ApplicationFiled: November 25, 2005Publication date: June 19, 2008Applicant: Honda Motor Co., Ltd.Inventors: Keita Sekine, Kazuyuki Fukamachi, Katsumi Takeishi, John Cheek
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Publication number: 20080143339Abstract: The present invention enables connections of electronic components of an electronic apparatus to be inspected easily and reliably. To accomplish this, an electronic apparatus including a plurality of electronic components, includes a control circuit which controls input and output of an electric signal to and from the plurality of electronic components and a plurality of inspection circuits which inspect connections of the plurality of electronic components. The plurality of inspection circuits are connected in series, the control circuit is connected to an end of the series, inspection signals output from the plurality of inspection circuits are superimposed on one another in sequence into an signal and the signal is input into the control circuit, and determination is made at the control circuit as to whether each of the plurality of electronic components is connected properly or not.Type: ApplicationFiled: December 14, 2007Publication date: June 19, 2008Applicant: CANON KABUSHIKI KAISHAInventor: Yukimasa Iseki
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Publication number: 20080143340Abstract: A method and a circuit are provided for the continuous detection of a line break in a full bridge controlling an inductive load. When the full bridge is switched off or on, a pre-determinable switching device of the circuit is switched first, and then a potential applied to a connection between the switching device and the load is tapped. The tapped potential is then compared with the ground potential when the switching device is connected to the supply potential, or with the supply potential when the switching device is connected to the ground potential. A line break is then determined when the two compared potentials are not different in the free running state thereof.Type: ApplicationFiled: January 25, 2006Publication date: June 19, 2008Applicant: SIEMENS AKTIENGESELLSCHAFTInventors: Ralf Forster, Gunther Wolfarth
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Publication number: 20080143341Abstract: A method is provided for testing an electrical characteristic of a rotor. In one embodiment, the method may include applying current to the rotor, measuring voltage drop between first and second positions on the rotor, and evaluating the electrical characteristic of the rotor based at least on the voltage drop and the current. In another embodiment, the method may include coupling a first set of leads to a first end portion of the rotor at a first set of angular positions about an axis of the rotor. The method also may include coupling a second set of leads to a second end portion of the rotor at a second set of angular positions about the axis of the rotor. In addition, the method may include coupling the first and second sets of leads to a current source to provide a current flow through the rotor from the first end portion to the second end portion. Furthermore, the method may include engaging a first probe to the first end portion and a second probe to the second end portion to measure voltage drop.Type: ApplicationFiled: September 29, 2006Publication date: June 19, 2008Inventor: Stephen D. Umans
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Publication number: 20080143342Abstract: A method for screening electrolytic capacitors places a capacitor in series with a resistor in series with a resistor, applying a test voltage and following the charge curve for the capacitor. A high voltage drop indicates high reliability and a low voltage drop is used to reject the piece. The leakage current is not adversely affected during the test.Type: ApplicationFiled: December 18, 2006Publication date: June 19, 2008Inventor: Yuri Freeman
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Publication number: 20080143343Abstract: An approach is provided for correcting the feedback from electrical measurement converters to the device under test in the case of measurements in the high-frequency and/or microwave range. At least three measurements are implemented with respectively different input impedances of the measurement converter, and that the feedback-free measured value is then calculated from these.Type: ApplicationFiled: February 2, 2006Publication date: June 19, 2008Applicant: Rohde & Schwartz GmbH & Co. KGInventor: Thomas Reichel
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Publication number: 20080143344Abstract: Systems and methods for detecting anomalies, such as corrosion, on internal surfaces of hollow elongate bodies, such as pipelines. The pipeline is treated as a circular waveguide, and a fast rise time pulse or a spectrum of electromagnetic waves is launched down the waveguide to perform time domain, or equivalent of time domain (e.g., frequency domain), reflectometry. Anomalies in the internal structure of the pipeline cause reflections which can be measured and related to the physical parameters of the pipeline structure and identified to a particular location.Type: ApplicationFiled: November 30, 2007Publication date: June 19, 2008Inventors: Ronald J. Focia, Charles A. Frost
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Publication number: 20080143345Abstract: An automotive urea solution monitoring device is deployed in conjunction with the urea tank of a selective catalytic reduction vehicle. An RF signal of a constant frequency may be generated across a resonant circuit, which may be comprised of an inductor and a PCB trace capacitor, or the like. Electromagnetic radiation is propagated into the automotive urea solution in the urea tank. The conductivity and dielectric properties of the liquid change the impedance of the discrete/trace capacitor and or the discrete/trace inductor. These changes are proportional to ammonia content, temperature, and/or level of the automotive urea solution in the urea tank and are preferably detected by a microcontroller, or the like, and then transmitted to a selective catalytic reduction vehicle engine management system, or the like.Type: ApplicationFiled: May 8, 2007Publication date: June 19, 2008Inventors: Idir Boudaoud, Alan Kenneth McCall, Adrian M. Page
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Publication number: 20080143346Abstract: A method of determining change in actuator position includes determining a slope of the inductor current with time and determining whether the slope exceeds a first predetermined slope for a first predetermined time, determining whether the slope is less than a second predetermined slope for a second predetermined time when the slope exceeds the first predetermined slope for the first predetermined time, and determining whether the slope exceeds a third predetermined slope for a third predetermined time when the slope is less than the second predetermined slope for the second predetermined time. The method further includes determining the change in actuator position when the slope exceeds the third predetermined slope for the third predetermined time.Type: ApplicationFiled: December 18, 2006Publication date: June 19, 2008Inventor: Stephen Rober
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Publication number: 20080143347Abstract: The composition of a fluid is measured with a sensor with a tube having: (i) a cavity for holding contents therein; and (ii) at least one opening in the tube being in communication with the cavity of the tube and the content held therein. The sensor further includes a sensor body attached to the tube having: (i) a circuit board; and (ii) a header, the header comprising a plurality of contacts that are electrically coupled to the circuit board; wherein the plurality of contacts of the header are in communication with the cavity of the tube. A method for measuring the composition of the fluid using the sensor is also described.Type: ApplicationFiled: December 15, 2006Publication date: June 19, 2008Applicant: KAVLICO CORPORATIONInventors: GARY CASEY, SALEH AHMED
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Publication number: 20080143348Abstract: The present invention relates to a on-chip circuit for on silicon interconnect capacitance (Cx) extraction that is self compensated for process variations in the integrated transistors. The circuit (10) comprises signal generation means (20) for generating a periodical pulse signal connected to first and to second signal delaying means (31, 32) for respective delaying said pulse signal, wherein said second signal delaying means (32) are configured to have a delay affected by said interconnect capacitance (Cx); a logical XOR gate (35) for connecting respective first and said second delay signals of said respective first and second delay means (31, 32), said logical XOR gate (35) being connected to signal integrating means (40); and said signal integrating means (40) being connected to analog to digital converting means (50).Type: ApplicationFiled: December 19, 2005Publication date: June 19, 2008Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.Inventors: Praveen Pavithran, Marcel Pelgrom, Jean Wieling, Hendricus Joseph Veendrick
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Publication number: 20080143349Abstract: In a leak testing and leak localization arrangement for leak testing and localization for flat roofs or the like which are sealed by at least one electrically insulating sealing web (6), at least one voltage source (12) is applied between an upper side of the sealing web and below an underside of the sealing web. The upper side of the sealing web is sampled by means of a measuring device (9) provided with two measurement sensors (10, 11). In order to achieve reliable leak testing and precise leak localization with contact being made in an uncomplicated manner with the voltage source (12), web-shaped electrically conductive material is arranged on the underside of the sealing web (6) and is connected to one terminal of the voltage source (12). For this purpose, at least one metal grating web is provided as the web-shaped electrically conductive material, which web can be laid easily and is non-combustible and durable.Type: ApplicationFiled: April 25, 2006Publication date: June 19, 2008Inventors: Bernd Lorenz, Markus Bruhl, Klaus Burger
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Publication number: 20080143350Abstract: Embodiments of the present invention provide estimates of soil moisture by measuring the change in electrical conductivity near the surface of the earth using surface-propagated electromagnetic fields. A method is provided for estimating near-surface soil moisture, including measuring signals from an electromagnetic ground wave propagating between one or more receiving element locations, determining a transfer characteristic proportional to an average electrical conductivity between pairs of locations; and determining estimated soil moisture in one or more regions derived from analyzing the determined electrical conductivity between pairs of locations and a predetermined regional relationship between electrical conductivity and soil moisture.Type: ApplicationFiled: December 7, 2007Publication date: June 19, 2008Inventor: Kenneth L. Cummins
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Publication number: 20080143351Abstract: A system and method for determining the time to change the oil of an automobile engine including a power source unit for converting power into necessary power and supplies power at the startup time. A degradation detection unit is installed in an engine oil chamber and is formed using carbon nanotubes as a sensor capable of detecting degradation of the engine oil. A small signal amplification unit amplifies the signals detected from the oil conditions and amplifies the minute signal output from the degradation detection unit. The oil-condition determination unit compares value, corresponding to the degraded state of the engine oil, with a set reference value, to determine the time to change the engine oil. The display unit displaying the oil-condition in text form as information about the time to change oil.Type: ApplicationFiled: April 11, 2006Publication date: June 19, 2008Applicants: VNF Innovation Co. Ltd.Inventors: Min Ho Lee, Dae Suk Na
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Publication number: 20080143352Abstract: A titanium oxide extended gate field effect transistor (EGFET) device and fabricating method thereof. Titanium oxide is formed on an EGFET by sputtering, coating a detection membrane therefor. Current-voltage relationships at different pH values are also measured via a current measuring system. Sensitivity parameter of the titanium oxide EGFET is calculated according to a relationship between a pH value and a gate voltage.Type: ApplicationFiled: February 26, 2008Publication date: June 19, 2008Applicant: NATIONAL YUNLIN UNIVERSITY OF SCIENCE AND TECHNOLOGYInventors: Jung-Chuan Chou, Hung-Hsi Yang
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Publication number: 20080143353Abstract: A pair of conductive rubber electrodes including measurement surfaces opposite to a surface of a dielectric layer of an electrostatic chuck as an objective of measurement, in which the measurement surfaces are arranged at an interval individually on the same plane, are provided. A direct-current power supply and an ammeter are connected to the pair of conductive rubber electrodes. The conductive rubber electrodes have resistance values equal to each other, and have a shape in which the measurement surfaces have areas equal to each other, in which volume resistivities are 1×105 ?·cm or less, and hardness is within a range of 60 to 80 Hs in JIS-A hardness. An interval between the conductive rubber electrodes is six times or more a thickness of the dielectric layer of the electrostatic chuck as the objective of the measurement.Type: ApplicationFiled: December 12, 2007Publication date: June 19, 2008Applicant: NGK Insulators, Ltd.Inventors: Minoru YOKOTA, Kazuhiro NOBORI
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Publication number: 20080143354Abstract: Sheet resistance, junction leakage and contact conductivity of a semiconductor layer, associated with an ultra-shallow junction layer or metal film are measured by contacting the surface with a plurality of probes. The probes can be used, in conjunction with a four-point probe system, to determine sheet resistivity. Junction leakage through an ultra-shallow junction is determined by establishing a reverse bias across the junction set at a predetermined voltage value, measuring through a first probe a total junction current conduction value, measuring through second, third, and fourth probes a plurality of voltage values. The junction leakage value is then directly computed based on the sheet resistivity value, reverse bias potential, wafer radius, and the measured voltage values. Contact conductivity between a metal film and semiconductor layer can be similarly directly computed.Type: ApplicationFiled: December 14, 2007Publication date: June 19, 2008Inventors: James T.C. Chen, Dimitar B. Dimitrov
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Publication number: 20080143355Abstract: A method for testing or measuring electric elements, includes applying a beam of particles to a location of an electric element. Charges are liberated under the effect of the application of the beam of particles. The liberated charges are collected by a collector. The collected quantity of charges is measured, and an electric feature is deduced from the measure of the collected quantity of charges.Type: ApplicationFiled: July 31, 2007Publication date: June 19, 2008Applicant: BEAMINDInventor: Gerard DELABOUGLISE
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Publication number: 20080143356Abstract: A conductive filled polymer contact which is molded at an aperture through a carrier sheet includes an elongated conductive frame introduced prior to the molding process as an insert which is held captive in the molded contact and which extends from at or near the upper contact surface, through the aperture and terminates at the opposite end at or near the lower contact surface to provide a continuous conductive path through the length of the contact, whereby the sequence of particle to particle interfaces within the molded polymer contact is reduced in number to increase reliability.Type: ApplicationFiled: October 18, 2006Publication date: June 19, 2008Inventor: William Louis Brodsky
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Publication number: 20080143357Abstract: A high power Cobra interposer with an integrated guard plate, which is utilized for the testing of electrical products. The guard plate and the upper die of the interposer assembly are integrated into a single unit, thereby eliminating a portion of the structure. The Cobra structure utilizes a novel hole configuration in the upper die portion of the interposer structure, whereby only a small portion of the Cobra tip protrudes, rendering it less susceptible to being damaged in comparison with current designs.Type: ApplicationFiled: December 13, 2006Publication date: June 19, 2008Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Paul M. Gaschke, Karlheinz G. Schoenfeld
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Publication number: 20080143358Abstract: A method of fabricating a guard structure can include depositing an insulating material over at least a portion of electrical signal conductors disposed on a component of a probe card assembly, and depositing an electrically conductive material onto the insulating material and at least a portion of electrical guard conductors disposed on the component of the probe card assembly. Each signal conductor can be disposed between a pair of the guard conductors. The probe card assembly can include a plurality of probes disposed to contact an electronic device to be tested. The signal conductors can be part of electrical paths within the probe card assembly to the probes.Type: ApplicationFiled: December 14, 2006Publication date: June 19, 2008Applicant: FormFactor, Inc.Inventor: Keith J. Breinlinger
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Publication number: 20080143359Abstract: Embodiments of reinforced resilient elements and methods for fabricating same are provided herein. In one embodiment, a reinforced resilient element includes a resilient element configured to electrically probe a device to be tested, the resilient element having a first end and an opposing second end; and a reinforcement member having a first end affixed to the resilient element at the first end thereof or at a point disposed between the first and the second ends of the resilient element, an opposing second end disposed in a direction towards the second end of the resilient member, and a resilient portion disposed between the first and second ends, wherein the resilient portion is not affixed to the resilient member.Type: ApplicationFiled: December 17, 2006Publication date: June 19, 2008Applicant: FORMFACTOR, INC.Inventor: John K. Gritters
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Publication number: 20080143360Abstract: An SOC tester having test cards with memory cards is presented. The SOC tester may be running a test on a device under test using test programs stored on one set of memory cards. Test programs may be down loaded to a second set of memory cards during testing using test programs from the first set of memory cards or during off times.Type: ApplicationFiled: December 15, 2006Publication date: June 19, 2008Inventor: Daven Septon
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Publication number: 20080143361Abstract: An SOC tester having test cards with memory cards is presented. The SOC tester may automatically swap memory cards between a memory card rack and a test head between tests on devices under test. Test programs and data on the memory cards may be down loaded onto memory cards in the memory test rack during testing or down times.Type: ApplicationFiled: December 15, 2006Publication date: June 19, 2008Inventors: Kristin N. Casterton, Daven Walt Septon
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Publication number: 20080143362Abstract: The present invention provides an electrical connecting apparatus in which no strong stress acts on a coupling portion of an arm portion continuing into a base portion by a moment force acting on the arm portion. A probe sheet comprising a probe sheet main body and a plurality of probes formed to be protruded from one surface of the probe sheet main body is provided. For formation of the arm portion of the probe, a metal material for an arm main body portion continuing into a probe tip portion is deposited on a base table with an approximately uniform height dimension. Also, a metal material for a reinforcing portion constituting an arm portion together with the arm main body portion is deposited at an area on the arm main body portion distanced from the probe tip portion with an approximately uniform height dimension.Type: ApplicationFiled: November 9, 2007Publication date: June 19, 2008Applicant: KABUSHIKI KAISHA NIHON MICRONICSInventors: Satoshi NARITA, Kenji SASAKI, Nobuyuki YAMAGUCHI
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Publication number: 20080143363Abstract: A water block heat dissipation on a probe card interface for cooling active components and other devices requiring heat dissipation on the probe card is presented.Type: ApplicationFiled: December 14, 2006Publication date: June 19, 2008Inventors: John Andberg, Romi Mayder
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Publication number: 20080143364Abstract: A probe card with an air channel over the active components for cooling the active components on the probe card is provided.Type: ApplicationFiled: December 14, 2006Publication date: June 19, 2008Inventors: Romi Mayder, John Andberg
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Publication number: 20080143365Abstract: A prober is described that is suitable for testing of semiconductor substrates under atmospheric conditions that deviate from ambient conditions. The prober includes a chuck for mounting of a semiconductor substrate and a probe holder for mounting of test tips for electrical contacting of the semiconductor substrate. The semiconductor substrate and test tips are arranged within a housing sealed relative to the surrounding atmosphere. The housing comprises two housing parts joined with a seal. The seal can be inflated with two different pressures and is less deformable at higher pressure. For testing of the semiconductor substrate, coarse positioning of the semiconductor substrate relative to the test tips occurs under atmospheric conditions and then fine positioning with the sealed housing and deformable seal before the lower deformability of the seal is produced at higher pressure in the seal and the semiconductor substrate is contacted by the test tips and tested.Type: ApplicationFiled: November 21, 2007Publication date: June 19, 2008Applicant: SUSS Micro Tec Test Systems GmbHInventors: Jorg Kiesewetter, Stefan Kreissig, Stojan Kanev, Claus Dietrich
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Publication number: 20080143366Abstract: A contact pin (50) for contacting a terminal of a wafer and supplying a signal to that wafer is provided with a first conductive layer (51b) composed of a first conductive material having a relatively higher hardness than the oxide film formed on the terminal of the wafer, a second conductive layer (51c) composed of a second conductive material having a relatively lower hardness than the oxide film, and a base material (51a) with the first conductive layer (51b) and second conductive layer (51c) formed at the outside, the first conductive layer (51b) being formed so as to closely contact the outside of the second conductive layer (51c), the first conductive layer (51b) and second conductive layer (51c) both being exposed at the front end face (50a) of the contact pin (50).Type: ApplicationFiled: December 14, 2004Publication date: June 19, 2008Inventors: Fumio Kurotori, Takaji Ishikawa, Tadao Saito
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Publication number: 20080143367Abstract: A spring loaded electrical contact assembly for making a connection between two surfaces that consist of two U-shaped components axially opposed and rotated 90 degrees with respect to each other and configured to allow them to pass over each other while contacting in a wiping manner. When compressed to a test position, the components completely envelop a spring and provide a minimal solid height at maximum compliance while providing a low and reliable electrical contact.Type: ApplicationFiled: November 27, 2007Publication date: June 19, 2008Inventor: Scott Chabineau-Lovgren
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Publication number: 20080143368Abstract: The present invention provides a probe manufacturing method in which, after a metal material for a probe is deposited on a base table, the probe can be detached from the base table relatively easily without giving damage on the probe. A recess corresponding to a flat surface shape of a probe is formed by a resist mask on a sacrificial layer on a base table. By depositing a probe material in the recess, a probe made of the probe material is formed over the base table via the sacrificial layer. Thereafter, the resist mask is removed, and further the sacrificial layer is removed by an etching process with a part of the sacrificial layer remaining. For the purpose of forming an opening for control of the remaining part of the sacrificial layer in the etching process in the probe so as to let the opening pass through the probe in its plate thickness direction, a hole-forming portion for the opening is formed in the resist mask.Type: ApplicationFiled: November 5, 2007Publication date: June 19, 2008Applicant: KABUSHIKI KAISHA NIHON MICRONICSInventors: Takayuki HAYASHIZAKI, Hideki HIRAKAWA, Akira SOMA, Shinji KUNIYOSHI
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Publication number: 20080143369Abstract: An electrical connecting apparatus is used for electrical inspection of a device under test having electrodes each of which a recess is formed on a flat upside. The electrical connecting apparatus is provided with a plurality of probes, each probe including a base portion combined with a probe board, an elastically deformable arm portion extending above the electrodes of the device under test from the base portion along the probe board and at a distance therefrom, and a tip portion projecting from the arm portion in a direction to be away from the probe board. The front end of the tip portion of each probe can abut a flat surface area except the recess on the upside of the electrode in a state that no flexural deformation is caused in the arm portion.Type: ApplicationFiled: November 13, 2007Publication date: June 19, 2008Applicant: KABUSHIKI KAISHA NIHON MICRONICSInventors: Satoshi NARITA, Yoko ICHINOHE, Nobuyuki YAMAGUCHI
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Publication number: 20080143370Abstract: An I/O port tester includes a first relay, a second relay, a first resistor, a second resistor, a plurality of serial plugs, a water sensor plug, a direct current (DC) voltage plug, and two data plugs. A half of the serial plugs is correspondingly connected to the other half of the serial plugs. The DC voltage plug is connected to the water sensor plug via a switch of the first relay and the first resistor, and connected to the water sensor plug via a switch of the second relay and the second resistor. The first and second resistors respectively simulate two different working conditions. The data plugs are respectively connected to an inductance coil of the first relay, and an inductance coil of the second relay.Type: ApplicationFiled: June 7, 2007Publication date: June 19, 2008Applicant: HON HAI PRECISION INDUSTRY CO., LTD.Inventor: MING-CHIH HSIEH
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Publication number: 20080143371Abstract: A mode decode/latch circuit decodes an input signal based on a latch timing signal to output a test mode signal to a test execution circuit. Test mode signal line includes a high-resistance portion extending from the mode decode/latch circuit toward the vicinity of the test execution circuit and a low-resistance portion connecting together the distal end of the high-resistance portion and the input of the test execution circuit. A latch circuit for latching the test mode signal based on the latch timing signal is inserted in the low-resistance portion.Type: ApplicationFiled: December 13, 2007Publication date: June 19, 2008Applicant: ELPIDA MEMORY, INC.Inventor: Yoshifumi MOCHIDA
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Publication number: 20080143372Abstract: Systems and methods for closed loop feedback control of integrated circuits. In one embodiment a plurality of controllable inputs to an integrated circuit is adjusted to achieve a predetermined value of a dynamic operating indicator of the integrated circuit. An operating condition of an integrated circuit is controlled via closed loop feedback based on dynamic operating indicators of the integrated circuit's behavior.Type: ApplicationFiled: February 26, 2008Publication date: June 19, 2008Applicant: TRANSMETA CORPORATIONInventors: Kleanthes G. Koniaris, James B. Burr
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Publication number: 20080143373Abstract: Techniques and systems whereby operation of and/or access to particular features of an electronic device may be controlled after the device has left the control of the manufacturer are provided. The operation and/or access may be provided based on values stored in non-volatile storage elements, such as electrically programmable fused (eFUSES).Type: ApplicationFiled: February 29, 2008Publication date: June 19, 2008Inventors: Anthony R. BONACCIO, Karl R. ERICKSON, John A. FIFIELD, Chandrasekharan KOTHANDARAMAN, Phil C. PAONE, William R. TONTI
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Publication number: 20080143374Abstract: Protection against anti single event effects associated with strikes of energetic particles is provided in current-mode logic (CML) or similar integrated circuits (ICs) using a current-switching architecture.Type: ApplicationFiled: December 13, 2006Publication date: June 19, 2008Inventors: Vladimir Katzman, Vladimir Bratov
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Publication number: 20080143375Abstract: A first clock signal of frequency F is used to couple data to an off-chip driver (OCD) using a master/slave flip flop (FF), wherein the master latch is clocked with the first clock signal and the slave latch is clocked with the complement of the first clock signal. A second clock signal of frequency F/2 is generated from the first clock signal. The second clock signal is shifted a time equal to substantially one-half the cycle of the first clock signal. In one embodiment, the second clock is shifted using a delay line circuit. In another embodiment, the second clock is shifted using a master/slave FF, wherein the master latch is clocked with the complement of the first clock signal and the slave latch is clocked with the first clock signal. The logic state transitions of the data between edges of the propagating clock thereby reducing coupling to the clock transitions and thus reducing edge jitter.Type: ApplicationFiled: December 15, 2006Publication date: June 19, 2008Inventors: Bao G. Truong, Daniel Mark Dreps, Anand Haridass, John C. Schiff, Joel D. Ziegelbein
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Publication number: 20080143376Abstract: A leakage efficient anti-glitch filter. In accordance with a first embodiment of the present invention, a leakage efficient anti-glitch filter with variable delay stages comprises a plurality of variable delay stages and a coincidence detector element for detecting coincidence of an input signal to the delay element and an output of the delay element. The plurality of variable delay stages may comprise stacked inverter circuits or stacked NAND circuits.Type: ApplicationFiled: February 19, 2008Publication date: June 19, 2008Applicant: TRANSMETA CORPORATIONInventor: Robert Paul Masleid
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Publication number: 20080143377Abstract: An impedance calibration circuit and a semiconductor device including the same are provided. An embodiment of the invention provides an impedance calibration circuit with a variable reference voltage generation unit. The impedance calibration circuit maximizes the number of semiconductor devices that can be tested in test equipment at one time and permits the operation of an impedance matching unit (e.g., an on-die-termination (ODT) circuit and/or an off-chip-driver (OCD)) to be tested for a variety of reference resistor values.Type: ApplicationFiled: September 12, 2007Publication date: June 19, 2008Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Yong-Ki CHO, Mi-Jin LEE, Sung-Jinn CHUNG