Patents Issued in May 31, 2012
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Publication number: 20120133914Abstract: A lithographic reticle is illuminated to transfer a pattern to a substrate, inducing distortions due to heating. The distortions are calculated using reference marks in a peripheral portion of the reticle and measuring changes in their relative positions over time. A plurality of cells are defined for which a system of equations can be solved to calculate a dilation of each cell. In an embodiment, each equation relates positions of pairs of marks to dilations of the cells along a line (s, s1, s2) connecting each pair. Local positional deviations can be calculated for a position by combining calculated dilations for cells between at least one measured peripheral mark and the position. Corrections can be applied in accordance with the result of the calculation. Energy may be applied to the patterning device (for example by thermal input or mechanical actuators) to modify a distribution of the local positional deviations.Type: ApplicationFiled: November 29, 2011Publication date: May 31, 2012Applicant: ASML NETHERLANDS B.V.Inventors: Vitaliy Prosyentsov, Willem Jurrianus Venema, Kars Zeger Troost, Adrianus Martinus Van der Wielen
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Publication number: 20120133915Abstract: Disclosed is a light source optimizing method wherein: a light source shape obtained as the result of SMO is set as a target, the SMO being an optimizing calculation method for optimizing a mask pattern and illumination light source, a spatial light modulator is controlled such that a deviation from the target is within an acceptable range, and the shape of the illumination light source is set; the image of the pattern obtained as the results of the SMO is formed on a wafer, using illumination light emitted from the illumination light source having the set light source shape, an OPE is evaluated as image-forming performance using the detection results obtained by detecting the image of the pattern thus formed; and the light source shape is optimized.Type: ApplicationFiled: February 6, 2012Publication date: May 31, 2012Applicant: NIKON CORPORATIONInventors: Tomoyuki MATSUYAMA, Naonori KITA
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Publication number: 20120133916Abstract: In one aspect, the present invention provides a wafer level optical assembly comprising a first wafer level optical element, the first wafer level optical element comprising a first alignment structure and a second wafer level optical element, the second wafer level optical element comprising a second alignment structure, wherein the first alignment structure contacts the second alignment structure.Type: ApplicationFiled: November 30, 2010Publication date: May 31, 2012Inventors: David Ovrutsky, William Hudson Welch, Roman C. Gutierrez, Robert J. Calvet
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Publication number: 20120133917Abstract: A distance-measuring device for contactless measurement of a distance to an object, including a housing; a contactless measuring apparatus utilizing an optical measuring beam arranged in the housing and having a radiation unit, an optical unit with optical elements encompassing at least a transmitting and receiving lens system, an optical transmitting path with an optical axis for emitting a measuring beam onto the target object, an optical receiving path with an optical axis for receiving a measuring beam that is reflected and/or scattered by the target object. At least one optical element is movable relative to an initial position; a motion sensor detects a movement of the object, the optical element movable out of the initial position into a variable compensation position so that the transmitting path can be stabilized at a spatially fixed position.Type: ApplicationFiled: November 29, 2011Publication date: May 31, 2012Applicant: Hilti AktiengesellschaftInventors: Stefan TIEFENTHALER, Johann HOFER, Torsten GOGOLLA
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Publication number: 20120133918Abstract: A surveying device includes a surveying unit configured to measure a direction and a distance to a target object, a control unit configured to control the surveying unit, a communication unit configured to allow the control unit to communicate with an outside network, and a status input unit with which operation status information on the surveying unit is input, wherein the control unit transmits the operation status information input with the status input unit to the outside network via the communication unit.Type: ApplicationFiled: November 30, 2011Publication date: May 31, 2012Applicant: KABUSHIKI KAISHA TOPCONInventors: Ritsuo Sakimura, Sora Otaguro
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Publication number: 20120133919Abstract: A distance-measuring device for the contactless measurement of the distance to a target, including a housing; a measuring apparatus which utilizes an optical measuring beam, which is arranged in a housing, and by which the distance to the target can be measured contactlessly; at least one reference stop arranged on the housing and that can be selected by the user in order to carry out the measurement; an operating and input array arranged on the housing and serving to operate at least one measuring apparatus; a visual display arranged on the housing and coupled to the operating and input array to indicate an operating state and/or the measured distance from a selected reference stop to the target. The housing has at least one optical signaler separate from the visual display and unambiguously associated with a reference stop and being activatable whenever that reference stop is selected.Type: ApplicationFiled: November 29, 2011Publication date: May 31, 2012Applicant: Hilti AktiengesellschaftInventors: Torsten GOGOLLA, Stefan TIEFENTHALER
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Publication number: 20120133920Abstract: An optical inspection system includes a printed circuit board (PCB) transport and an illuminator that provides at least a first strobed illumination field. The illuminator includes a light pipe having a first end proximate the PCB, and a second end opposite the first end and spaced from the first end. An array of cameras is configured to digitally image the PCB and to generate a plurality of images of the PCB with the at least first strobed illumination field type. At least one structured light projector is disposed to project structured illumination on the PCB. The at least one array of cameras is configured to digitally image the PCB while the PCB is illuminated with structured light, to provide a plurality of structured light images. A processing device is configured to generate an inspection result as a function of the plurality of images and the plurality of structured light images.Type: ApplicationFiled: December 1, 2011Publication date: May 31, 2012Inventors: Timothy A. Skunes, Carl E. Haugan, Paul R. Haugan, Eric P. Rudd, Steven K. Case, Beverly Caruso
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Publication number: 20120133921Abstract: A sporting device may include a proximity detector, and a housing for carrying the proximity detector. The proximity detector may comprise a single photon avalanche diode for measuring the speed of an object struck by the housing. For example, the housing may define a tennis racket.Type: ApplicationFiled: November 29, 2011Publication date: May 31, 2012Applicant: STMicroelectronics (Research & Development) LimitedInventor: John Kevin MOORE
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Publication number: 20120133922Abstract: An improved optical infrared and ultraviolet imaging and testing system including a primary imaging device with a target portion and a secondary imaging device for determining the presence and nature of various external (e.g. magnetic field, microwave, bioelectric or incident infrared, thermal, ultraviolet, radiation, or x-rays) or internal stresses (e.g., photo-generated carriers or photo-induced resistance) or other conditions acting upon the primary detection device which are optically enhanced for detection by the secondary detection device or devices.Type: ApplicationFiled: October 7, 2011Publication date: May 31, 2012Applicant: Attofemto, Inc.Inventor: Paul L. Pfaff
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Publication number: 20120133923Abstract: Disclosed is a fiber optic interferometer including: a wideband optical source having a decoherence time ?DC; a coil including N turns of a fiber optic with length L; an optical element separating the incident beam into first and second beams coupled to first and second ends of the fiber respectively, so the first beam travels through the fiber optic in a first direction and the second beam travels through the fiber optic in a counter propagating direction; and a detector detecting the intensity of the output beam. The fiber optic is a high polarization mode dispersion type, and the length L of the fiber optic coil is more than twice the fiber correlation length, so the fiber operates in a coupled PMD mode, and the propagation differential group delay between two orthogonal polarization states, accumulated over the length of the fiber, is greater than the decoherence time of the source.Type: ApplicationFiled: August 5, 2010Publication date: May 31, 2012Applicant: IXBLUEInventors: Herve Claude Lefevre, Cedric Alain Jacky Molucon, Joachin Honthaas
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Publication number: 20120133924Abstract: A method measures the positions of centres of curvature of optical surfaces of a multi-lens optical system. The spacings between the surfaces are measured along a reference axis using an interferometer. Subsequently the centres of curvature of the surfaces are measured using an optical angle-measuring device. In the course of the measurement of the position of the centre of curvature of a surface situated within the optical system, the measured positions of the centres of curvature of the surfaces situated between this surface and the angle-measuring device and the previously measured spacings between the surfaces are taken into consideration computationally. In this way, a particularly high accuracy of measurement is achieved, because desired spacings do not have to be fallen back upon.Type: ApplicationFiled: November 22, 2011Publication date: May 31, 2012Applicant: Trioptics GmbHInventors: Josef Heinisch, Stefan Krey, Eugen Dumitrescu, Aiko Ruprecht, Patrik Langehanenberg
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Publication number: 20120133925Abstract: A light intensity measuring unit for measuring an intensity of light emitted from a microscope includes an aperture stop, a field stop, at least one measurement lens arranged between the aperture stop and the field stop, and an interface for attachment to a microscope. The aperture stop is positioned on or close to a back focal plane of the at least one measurement lens. The field stop is positioned on or close to a front focal plane of the at least one measurement lens.Type: ApplicationFiled: November 17, 2011Publication date: May 31, 2012Applicant: OLYMPUS CORPORATIONInventor: Eiji NAKASHO
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Publication number: 20120133926Abstract: A method and apparatus of inspecting a defect of a surface of a sample in which a laser beam is irradiated on a sample surface so that at least a part of an illumination field of the laser beam illuminates a first area of the sample surface, a plurality of scattered light rays from the first area caused by the irradiation is detected with a plurality of detectors, detection errors of inclination of an illumination apparatus and a sensor for the plurality of scattered light rays detected by the plurality of detectors are corrected, at least one of adding and averaging the corrected plurality of scattered light rays, and a defect on the sample surface is determined based on the plurality of scattered light rays in accordance with the correction of errors of inclination of the illumination apparatus and the sensor.Type: ApplicationFiled: February 6, 2012Publication date: May 31, 2012Inventors: Toshiyuki Nakao, Yoshimasa Oshima, Yuta Urano
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Publication number: 20120133927Abstract: A defect inspection apparatus for inspecting defects on an inspecting object includes an illuminator which irradiates a beam of light on the inspecting object, a photo-detector which detects rays of light from the inspecting object due to the irradiation of the light beam by the illuminator, a defect detector which detects a defect by processing a signal obtained through detection by the photo-detector, a characteristic quantity calculator which calculates a characteristic quantity related to a size of the defect, and a defect size calculator which uses a relation between size and characteristic quantity which is calculated by an optical simulation and calculates a size of the detected defect.Type: ApplicationFiled: February 8, 2012Publication date: May 31, 2012Inventors: Akira HAMAMATSU, Hisae Shibuya, Shunji Maeda
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Publication number: 20120133928Abstract: A defect inspection method wherein illumination light having a substantially uniform illumination intensity distribution in a certain direction on the surface of a specimen is radiated onto the surface of the specimen; wherein multiple components of those scattered light beams from the surface of the specimen which are emitted mutually different directions are detected, thereby obtaining corresponding multiple scattered light beam detection signals; wherein the multiple scattered light beam detection signals is subjected to processing, thereby determining the presence of defects; wherein the corresponding multiple scattered light detecting signals is processed with respect to all of the spots determined to be defective by the processing, thereby determining the sizes of defects; and wherein the defect locations on the specimen and the defect sizes are displayed with respect to all of the spots determined to be defective by the processing.Type: ApplicationFiled: June 9, 2010Publication date: May 31, 2012Inventors: Yuta Urano, Shigenobu Maruyama, Toshiyuki Nakao, Toshifumi Honda
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Publication number: 20120133929Abstract: The present invention provides an inspection apparatus and inspection method. The inspection apparatus includes a stage mechanism for supporting an object under inspection. A spatial filter is provided in the detection optical system to inspect the object. A printer is used to print the results of the spatial filter. The spatial filter can be provided in the form of a Fourier transformed image.Type: ApplicationFiled: January 10, 2012Publication date: May 31, 2012Inventors: Akira HAMAMATSU, Minori NOGUCHI, Hidetoshi NISHIYAMA, Yoshimasa OHSHIMA, Takahiro JINGU, Sachio UTO
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Publication number: 20120133930Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.Type: ApplicationFiled: January 27, 2012Publication date: May 31, 2012Inventors: Jason CHRISTIANSEN, Robert Pinard, Maciej P. Zerkowski, Gregory R. Tedeschi
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Publication number: 20120133931Abstract: A frequency comb laser providing large comb spacing is disclosed. At least one embodiment includes a mode locked waveguide laser system. The mode locked waveguide laser includes a laser cavity having a waveguide, and a dispersion control unit (DCU) in the cavity. The DCU imparts an angular dispersion, group-velocity dispersion (GVD) and a spatial chirp to a beam propagating in the cavity. The DCU is capable of producing net GVD in a range from a positive value to a negative value. In some embodiments a tunable fiber frequency comb system configured as an optical frequency synthesizer is provided. In at least one embodiment a low phase noise micro-wave source may be implemented with a fiber comb laser having a comb spacing greater than about 1 GHz. The laser system is suitable for mass-producible fiber comb sources with large comb spacing and low noise. Applications include high-resolution spectroscopy.Type: ApplicationFiled: November 29, 2010Publication date: May 31, 2012Applicant: IMRA AMERICA, INC.Inventors: Martin FERMANN, Ingmar HARTL
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Publication number: 20120133932Abstract: In one embodiment, a method and system is provided for detecting target materials using a combination of stroboscopic signal amplification and Raman spectroscopy techniques.Type: ApplicationFiled: January 25, 2008Publication date: May 31, 2012Applicant: ADA TECHNOLOGIES, INC.Inventors: Kent D. Henry, Blase Yamona, John S. Lovell
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Publication number: 20120133933Abstract: The application provides a method for reducing the loss of electromagnetic radiation caused by passing electromagnetic radiation through material with a rough surface. The method comprises applying a surface layer, such as a liquid or plastic film, to the material. The surface layer masks or decreases the surface irregularities or effects therefrom resulting in decreased loss of electromagnetic energy.Type: ApplicationFiled: May 10, 2010Publication date: May 31, 2012Applicant: SMITHS DETECTION INC.Inventors: Peng Zou, Dustin Levy
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Publication number: 20120133934Abstract: A technique for determining the temperature of a sample including a semiconductor film 20 having a measurable optical absorption edge deposited on a transparent substrate 22 of material having no measurable optical absorption edge, such as a GaN film 20 deposited on an Al2O3 substrate 20 for blue and white LEDs. The temperature is determined in real-time as the film 20 grows and increases in thickness. A spectra based on the diffusely scattered light from the film 20 is produced at each incremental thickness. A reference division is performed on each spectra to correct for equipment artifacts. The thickness of the film 20 and an optical absorption edge wavelength value are determined from the spectra. The temperature of the film 20 is determined as a function of the optical absorption edge wavelength and the thickness of the film 20 using the spectra, a thickness calibration table, and a temperature calibration table.Type: ApplicationFiled: June 21, 2010Publication date: May 31, 2012Applicant: K-SPACE ASSOCIATES, INC.Inventors: Darryl Barlett, Charles A. Taylor, II, Barry D. Wissman
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Publication number: 20120133935Abstract: A measuring system for measuring absorption or scattering of a medium at a plurality of different wavelengths, whereby the measurements for the different wavelengths are performable as simultaneously and as accurately as possible. The measuring system comprises: a measuring chamber; a transmitting unit, which sends light of its respective wavelength into the measuring chamber; a control, which operates each light source with a different time modulation of transmission intensity for each wavelength; a detector for measuring a total radiation intensity. The total radiation intensity corresponds to a superpositioning of each intensity portion striking the detector for each wavelength; and a signal processing system, which determines for each of the wavelengths the associated intensity portion based on the total radiation intensity measured by detector and the modulations.Type: ApplicationFiled: November 22, 2011Publication date: May 31, 2012Applicant: Endress + Hauser Conducta Gesellschaft fur Mess- und Regeltechnik mbH + Co. KGInventor: Ralf Bernhard
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Publication number: 20120133936Abstract: A particle counting method that can count the number of the particles precisely. The method discriminates a wave pattern of the scattered light from a normal particle (subject of the counting) and a wave pattern of the light scattered by the agitation such as a floating particle, a radiation or changes in the intensity of the light. In one embodiment, a method for counting particles is disclosed which irradiates a light to a sample gas, detects a scattered light from a particle included in the sample gas by a photoelectric conversion device, counts the number of the particles of every particle size division by the output voltage wave pattern of the photoelectric conversion device, calculate a time difference (Ta?T1) from a point (T1) being a peak of output voltage wave pattern and a point (Ta) being a falling detection threshold (A), when the time difference (Ta?T1) is beyond counting cancellation time (B), the output voltage wave pattern is not counted as a particle.Type: ApplicationFiled: November 30, 2011Publication date: May 31, 2012Applicant: RION CO., LTD.Inventors: Takehiro IMAI, Tomonobu MATSUDA, Toshiyuki ABE, Tsutomu NAKAJIMA
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Publication number: 20120133937Abstract: A method of obtaining, in a single exposure, imaging information from an object (16) representative of more than two distinct illumination images, the method comprising the steps of generating first electromagnetic waves (14) at least some of which having spatially modulated polarisation; illuminating the object with the first electromagnetic waves; and capturing second electromagnetic waves (18) emanating from the object.Type: ApplicationFiled: May 7, 2010Publication date: May 31, 2012Inventors: Rainer Heintzmann, Kai Wicker
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Publication number: 20120133938Abstract: A pattern formed on a substrate includes first and second sub-patterns positioned adjacent one another and having respective first and second periodicities. The pattern is observed to obtain a combined signal which includes a beat component having a third periodicity at a frequency lower than that of the first and second periodicities. A measurement of performance of the lithographic process is determined by reference to a phase of the beat component. Depending how the sub-patterns are formed, the performance parameter might be critical dimension (CD) or overlay, for example. For CD measurement, one of the sub-patterns may comprise marks each having of a portion sub-divided by product-like features. The measurement can be made using an existing alignment sensor of a lithographic apparatus. Sensitivity and accuracy of the measurement can be adjusted by selection of the first and second periodicities, and hence the third periodicity.Type: ApplicationFiled: November 29, 2011Publication date: May 31, 2012Applicant: ASML NETHERLANDS B.V.Inventors: David DECKERS, Franciscus Godefridus Casper BIJNEN, Sami MUSA
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Publication number: 20120133939Abstract: Methods and compositions useful for gas storage and separation are provided. More particularly, compositions and methods for CO2 storage and separation are provided comprising an open metal organic framework.Type: ApplicationFiled: June 18, 2010Publication date: May 31, 2012Applicant: THE REGENTS OF THE UNIVERSITY OF CALIFORNIAInventors: Omar M. Yaghi, David Kyle Britt, Bo Wang
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Publication number: 20120133940Abstract: The invention relates to the scan methods and means for tomographic examination of two-dimensional structure of planar objects. The invention aims at developing a method of studying nanodimensional or microscopic objects with a resolution of the order of 30 nanometer and means of implementation of such a method. The task in view is performed such that the scanning microscope comprises a radiation source 1, as well as, positioned along the radiation rays, an opaque screen 2 with a slit, an object stage 4 with a mobility device for disposing of and maneuvering with an object under examination within the scan plane 7, a radiation detector 8 connected to an information processing unit 9, wherein according to the embodiment, the opaque screen is supplied with at least one slit shutter 3 movable in the plane of the opaque screen, the slit shutter providing the variability of cross-sectional dimensions of the slit.Type: ApplicationFiled: November 15, 2011Publication date: May 31, 2012Applicant: OOO TSENTR INNOVATSIONNYH TEHNOLOGII - ESInventors: Mihail Aleksandrovich YUDAKOV, Yurii Petrovich VOLKOV, Aleksei Olegovich MANTUROV
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Publication number: 20120133941Abstract: A photoacoustic apparatus obtains information on a specimen by receiving photoacoustic waves which are generated from the specimen resulting from light irradiated to the specimen. The apparatus includes a light source for irradiating light to the specimen, an acoustic wave receiver for receiving the photoacoustic waves, and a light reflection member for causing the light, which is radiated out of the specimen by optical diffusion thereof after having entered an interior of the specimen from the light source, to reenter the interior of the specimen, wherein the light reflection member allows elastic waves to pass therethrough. As a result, a photoacoustic apparatus and a probe are provided which can confine scattered light from the specimen into the specimen, and which can reliably prevent photoacoustic waves from being generated from a receiving element region of the probe by the scattered light.Type: ApplicationFiled: February 7, 2012Publication date: May 31, 2012Applicant: CANON KABUSHIKI KAISHAInventors: Takao Nakajima, Kazuhiko Fukutani, Yasufumi Asao, Ryuichi Nanaumi
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Publication number: 20120133942Abstract: The invention relates to a gas sampling device comprising a probe for sampling gas, an exploiting device for exploiting the gases sampled, a pipe for transmitting the gases sampled by the probe to the exploiting device, and means for lowering the pressure of the gases sampled in the pipe, to lower the dew point of the gases sampled, the means for lowering the pressure comprising an expansion nozzle arranged in the probe and communicating with the pipe, and a suction device for sucking the gases sampled in the pipe through the exploiting device. Application of the invention to the analysis of hot gases loaded with water vapor.Type: ApplicationFiled: May 24, 2011Publication date: May 31, 2012Applicant: AP2EInventors: Lucien Lonigro, Pierre Cholat
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Publication number: 20120133943Abstract: Systems and methods for sensing a surface plasmon resonance (SPR) biosensor using two or more wavelengths and with reduced chromatic aberration are disclosed. The system includes a beam-forming optical system that has chromatic aberration at the two or more wavelengths. A light source system provides respectively light of the two or more wavelengths, with light of each wavelength provided from a different distance from the beam-forming optical system. The different distances are selected to reduce or eliminate adverse effects of chromatic aberration on the formation of a focus spot on the SPR biosensor chip. An illumination system for illuminating a SPR biosensor using different light having different wavelengths is also disclosed.Type: ApplicationFiled: November 29, 2010Publication date: May 31, 2012Inventors: Norman Henry Fontaine, Guangshan Li, Anping Liu, Jinlin Peng
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Publication number: 20120133944Abstract: An optical device includes: an image-forming optical system forming an image of light from a subject; an imaging unit receiving light of the image formed by the image-forming optical system; a reflection spectroscopic device covering a given area in an imaging area of the imaging unit; and a spectrum detection unit detecting a spectroscopic spectrum of light reflected by the reflection spectroscopic device.Type: ApplicationFiled: October 31, 2011Publication date: May 31, 2012Applicant: Sony CorporationInventor: Masanori Iwasaki
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Publication number: 20120133945Abstract: An interactive display device is disclosed. The interactive display device comprises: a housing, a user interface surface which is coupled with the housing, a display panel which is disposed under the user interface surface, an area light detector which is disposed under the display panel and configured to detect invisible light reflected by an object which is on or adjacent to the user interface surface, a plane light guide plate which is disposed under the area light detector, and an invisible light source which is disposed at the side of the plane light guide plate. The interactive display device has small size and better appearance, and thus is easy to be transported and more competitive.Type: ApplicationFiled: July 2, 2010Publication date: May 31, 2012Inventors: Xinlin Ye, Zhenzhong Zou, Jianjun Liu, Xinbin Liu
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Publication number: 20120133946Abstract: An optical probe has optical components of an interferometer and includes an optical axis, at least one optical source for emitting light along an illumination path that is at least partially coaxial with the optical axis, a first beam splitter and a first lens. The first beam splitter intersects the optical axis and splits the light from the at least one optical source into a first beam for traveling along a reference path that is coaxial with the optical axis to a reference surface and a second beam for traveling along a test path that is coaxial with the optical axis to a specimen. The first lens is interposed along the reference path.Type: ApplicationFiled: May 20, 2011Publication date: May 31, 2012Applicant: PROMET INTERNATIONAL, INC.Inventors: Ryan Elliot Eckman, Peter David Koudelka, Lubomir Koudelka
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Publication number: 20120133947Abstract: An optical module comprising a tunable interference filter including a first substrate, a second substrate facing the first substrate, a first reflective film formed on the first substrate, a second reflective film formed on the second substrate and facing the first reflective film, a gap changing unit changing a gap between the first reflective film and the second reflective film, and a driving electrode line electrically connected to the gap changing unit, a temperature sensor detecting temperature of the tunable interference filter and including a first sensor wiring and a second sensor wiring, the first sensor wiring being electrically connected to the driving electrode line, a switch electrically connected to the second sensor wiring, and a temperature detecting circuit electrically connected to the switch.Type: ApplicationFiled: November 2, 2011Publication date: May 31, 2012Applicant: SEIKO EPSON CORPORATIONInventor: Takeshi NOZAWA
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Publication number: 20120133948Abstract: A spectrometer includes: a tungsten lamp which emits light with no peak wavelength within a wavelength range of visible light and having a light amount increasing as the wavelength becomes longer; a violet LED which emits light having a peak wavelength within the wavelength range of visible light; a light mixer which mixes light emitted from the tungsten lamp and the violet LED; an etalon which receives light mixed by the light mixer and transmits light contained in the received mixed light and having a particular wavelength; a light receiving unit which receives light transmitted by the etalon; and a measurement control unit which changes the wavelength of light that can pass through the etalon and measures spectral characteristics of the light having passed through the etalon based on the light received by the light receiving unit.Type: ApplicationFiled: September 8, 2011Publication date: May 31, 2012Applicant: SEIKO EPSON CORPORATIONInventor: Tatsuaki FUNAMOTO
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Publication number: 20120133949Abstract: Embodiments of the invention relate to an apparatus and methods of using the apparatus wherein the apparatus includes a plurality of interferometers wherein the plurality of interferometers enable interference of an electromagnetic input signal, wherein the plurality of interferometers are configured to receive a plurality of sensor input signals from a plurality of sensors where the plurality of sensor input signals provide an indication of a plurality of sensed characteristics and the sensor input signals control the interference of the electromagnetic input signal by the plurality of interferometers, and wherein the plurality of interferometers are configured to provide a first output when the plurality of characteristics sensed by the sensors correspond to a first context and a second output when the plurality of characteristics sensed by the sensors correspond to a second context.Type: ApplicationFiled: November 29, 2010Publication date: May 31, 2012Inventor: Antti NISKANEN
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Publication number: 20120133950Abstract: Provided is a tomographic imaging method, which acquires tomographic images of an object to be inspected, based on combined beams respectively acquired by combining reference beams and return beams acquired by irradiating the object to be inspected with a plurality of measuring beams. The tomographic imaging method includes a first step of acquiring the respective combined beams by reflecting information regarding the plurality of measuring beams which is stored in advance and irradiating the object to be inspected with the plurality of measuring beams, and a second step of generating the tomographic images based on the respective combined beams.Type: ApplicationFiled: November 2, 2011Publication date: May 31, 2012Applicant: CANON KABUSHIKI KAISHAInventors: Nobuhito Suehira, Yoshihiko Iwase
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Publication number: 20120133951Abstract: A method for measuring spacings between optical surfaces of a multi-lens optical system includes detecting the centring state of the optical system by taking into consideration all optical surfaces of the optical system. Then the optical system is adjusted in such a way, taking the centring state into consideration, that the optical axis of the optical system is aligned as far as possible with a reference axis. In a next step the spacings between the optical surfaces are determined with the aid of a short-coherence interferometer. The measuring-light ray directed onto the optical system for this purpose runs likewise along the reference axis.Type: ApplicationFiled: November 22, 2011Publication date: May 31, 2012Applicant: Trioptics GmnHInventors: Josef Heinisch, Stefan Krey, Eugen Dumitrescu, Aiko Ruprecht, Patrik Langehanenberg
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Publication number: 20120133952Abstract: A system and a method of measuring irregularity of a glass substrate using only a reflection light reflected by an upper surface of reflection lights reflected by the upper surface and a lower surface of the glass substrate are disclosed. The system includes a light source section configured to output a first light to the glass substrate and a screen.Type: ApplicationFiled: April 26, 2011Publication date: May 31, 2012Applicant: SEMISYSCO CO., LTD.Inventors: Soon-Jong Lee, Bong-Joo Woo, Byoung-Chan Park, Seong-Jin Choi, Jae-Hoon Chung
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Publication number: 20120133953Abstract: In a method for optically scanning and measuring an object by a laser scanner by a procedure in which a emission light beam modulated with a target frequency is emitted by means of a light emitter, a reception light beam reflected or otherwise scattered in some way from an object in the surroundings of the laser scanner is received, with a measuring clock, as a multiplicity of samples by means of a light receiver and in each case at least the distance from the object is determined from the phase angles of the multiplicity of samples for a plurality of measuring points by means of a control and evaluation device, for determining the distances, a phase shift caused by a distance difference of temporal adjacent samples is corrected in order to correct the distances.Type: ApplicationFiled: July 20, 2010Publication date: May 31, 2012Applicant: FARO TECHNOLOGIES, INC.Inventors: Martin Ossig, Philipp Schumann
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Publication number: 20120133954Abstract: A measuring apparatus includes a projection control unit configured to cause a projection unit to project, onto an object, a first light pattern with light and dark portions, a second light pattern, which is smaller in distance between the light and dark portions than that of the first light pattern and has a boundary position between the light and dark portions common to the first light pattern, and a third light pattern in which the light and dark portions of the second light pattern are reversed to each other, an acquisition unit configured to acquire a first captured image of the object onto which the first light pattern is projected, a second captured image of the object onto which the second light pattern is projected, and a third captured image of the object onto which the third light pattern is projected, and a calculation unit configured to calculate the boundary position between the light and dark portions of the first captured image based on the second and the third captured image to measure the poType: ApplicationFiled: July 28, 2010Publication date: May 31, 2012Applicant: CANON KABUSHIKI KAISHAInventors: Shiki Takabayashi, Hiroshi Yoshikawa
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Publication number: 20120133955Abstract: An electronic device may include a housing having a mousing surface, and a navigation device carried by the housing and comprising a proximity detector. The proximity detector may include a single photon avalanche diode (SPAD) configured to detect movement of an activator adjacent the mousing surface. For example, the proximity detector may detect movement along three axes.Type: ApplicationFiled: September 23, 2011Publication date: May 31, 2012Applicant: STMicroelectronics (Research & Development) LimitedInventor: David Patrick BAXTER
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Publication number: 20120133956Abstract: The internal propagation of radiation between a radiation source and radiation detector mounted within a sensor package is prevented by the use of an optical isolator. The optical isolator is formed by the combination of a baffle mounted between the source and detector and a groove formed in an upper surface of the sensor package between the source and detector. A bottom of the groove is positioned adjacent to an upper edge of the baffle.Type: ApplicationFiled: September 23, 2011Publication date: May 31, 2012Applicant: STMICROELECTRONICS (RESEARCH & DEVELOPMENT) LIMITEDInventors: Ewan Findlay, Colin Campbell, Gemma Ramsey, Eric Saugier
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Publication number: 20120133957Abstract: The present invention provides apparatus for a non-contact method of obtaining accurate three-dimensional measurements of a dry contact lens, more specifically, using dry lens metrology to know the exact thickness of a contact lens.Type: ApplicationFiled: November 28, 2011Publication date: May 31, 2012Inventors: Michael F. Widman, John B. Enns, P. Mark Powell, Peter W. Sites, Christopher Wildsmith
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Publication number: 20120133958Abstract: The present invention provides apparatus for a non-contact method of obtaining accurate three-dimensional measurements of a dry contact lens, more specifically, using dry lens metrology to know the exact thickness of a contact lens.Type: ApplicationFiled: November 28, 2011Publication date: May 31, 2012Inventors: Michael F. Widman, John B. Enns, P. Mark Powell, Peter W. Sites, Christopher Wildsmith
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Publication number: 20120133959Abstract: An image forming apparatus includes an image formation stopping unit that, in a case of comparing the length of recording paper to actually be fed with the length of recording paper set and having determined that the recording paper length detected by a recording paper length detecting unit is shorter than the length of the recording paper input through a recording paper size inputting unit, causes an image forming operation to a photoconductor by the image forming unit to stop before an image formation length in a vertical scanning direction by the image forming unit reaches a recording paper length according to the recording paper length detecting unit.Type: ApplicationFiled: November 22, 2011Publication date: May 31, 2012Inventor: Masami SHIBAHARA
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Publication number: 20120133960Abstract: A method of providing calibration data for a printer includes printing a calibration target using the printer. The target includes a plurality of patch sets, each including a plurality of test patches, each patch having a respective color. Scanned patch data for one of the sets are received from a spot scanner. The scanned patch data values are compared to respective aims to determine a reproduction error value for the scanned patch set. A processor automatically determines which of the sets should be scanned next using the calculated reproduction error value. The process is repeated until all sets have been scanned, or until the reproduction error value is less than or equal to a selected threshold. Calibration data are automatically generated using the scanned patch data.Type: ApplicationFiled: November 30, 2010Publication date: May 31, 2012Inventor: Thomas A. Henderson
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Publication number: 20120133961Abstract: A method of making a calibration target for a printer having a color gamut includes selecting in-gamut test colors interrelated by successor relationships. The successor(s) of each test color are to be measured with or after that test color. A processor automatically divides the test colors into a plurality of patch sets and determines a set order of the patch sets. Each patch set has a position in the set order prior to the position of any other patch set containing successors of the test colors in that patch set. The patch sets are printed on a receiver in the determined set order to form the calibration target. Color patches corresponding to the test colors in each patch set are printed adjacent to each other on the receiver.Type: ApplicationFiled: November 30, 2010Publication date: May 31, 2012Inventor: THOMAS A. HENDERSON
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Publication number: 20120133962Abstract: A calibration system including: an image forming unit that outputs a chart including patches corresponding to input CMY values of tertiary and secondary colors; a color measuring unit that measures patch colors and outputs colorimetric values; and a control unit that sets a target profile correlating the input CMY values of the tertiary and secondary colors with target color values; inputs the colorimetric values; calculates differences between the input colorimetric values and the target color values; acquires corrected CMY values relative to the input CMY values of the tertiary and secondary colors; acquires first and second color components based on the corrected CMY values of the tertiary and secondary colors, respectively; calculates output CMY values of a primary color through weighted averaging of the first and second color components; and generates a primary color correction table to determine the output CMY values relative to the input CMY values.Type: ApplicationFiled: November 16, 2011Publication date: May 31, 2012Applicant: Konica Minolta Business Technologies, Inc.Inventor: Katsuji Kondo
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Publication number: 20120133963Abstract: An image reader includes a path switching part, located at a branch point that switches between a double-sided path and a single-sided path. The double-sided path defines a conveyance route that passes through a reading position from the branch point to enter a conveyance path that causes a document to make a U-turn, and then again passes through the reading position to be discharged to a paper discharge tray. The single-sided path defines a conveyance route that, without passing through the reading position, merges into the conveyance path from the branch point.Type: ApplicationFiled: June 21, 2010Publication date: May 31, 2012Applicant: MURATA MACHINERY, LTD.Inventor: Osamu Oshima