Abstract: The present invention discloses a transcription activator-like effector-based strategy, termed “TALEColor”, for labeling specific repetitive DNA sequences in human chromosomes. TALEs were custom designed for human telomeric repeats and fused with any of numerous fluorescent proteins (FPs). TALE-telomere-FP fusion proteins were used to detect telomeric sequence in both living cells and fixed cells. Using human cells with different average telomere lengths, TALEColor signals correlated positively with telomere length. TALEs were also designed to detect centromeric sequences unique to specific chromosomes, enabling localization of these specific human chromosomes in live cells. These methods may have significant potential both for basic chromosome and genome research as well as in clinical applications.

Abstract: Provided herein are methods for making water-soluble nanoparticles comprising a core/shell nanocrystal that is coated with a surface layer comprising enough hydrophilic ligands to render the nanoparticle water soluble or water dispersable. Methods for crosslinking molecules on the surface of a nanoparticle, which methods can be used on the above water-soluble nanoparticles also are provided. Nanoparticle compositions resulting from these methods are also provided.

Abstract: A sensor for detecting and/or quantifying the amount of analyte in a sample, the sensor including: a sensing region; and a barrier layer including a reactive oxygen species (ROS)-quenching, analyte-permeable membrane having an ROS-quenching agent adsorbed thereto; wherein the sensor is adapted so that the sample enters the sensing region of the sensor through said barrier layer.

Abstract: Successful application of an engineered protein as therapeutics or in other industries would require the protein to have good expression level, good biophysical properties and often desired affinity to its target. The present invention provides a method of screening large numbers of protein candidates (PCs) in all three aspects simultaneously. PCs are fused to a protein anchor, which is captured by the target/antigen. The captured PCs are evaluated for their expression levels, biophysical properties and affinities using conventional methods.

Abstract: There is provided antibodies, epitopes and methods for detecting ubiquitinated polypeptides and ubiquitination sites in proteins. The antibodies recognize a fragment of ubiquitin that is created after samples are treated with the proteoloytical enzyme LysC (or LysN).

Abstract: Use of acetylated tubulin as a biomarker for predicting the response to a compound, preferably resistance of a disease such as cancer in a subject to said compound, wherein the compound is a furazanobenzimidazoles compound of general formula (I).

Abstract: The present invention relates to haptoglobin-haemoglobin (Hp-Hb) complex or a part thereof or a mimic thereof being operably linked to a substance and capable of binding a CD163 receptor. Furthermore, the invention relates to a CD163 variant, membrane bound or soluble, capable of binding at least one haptoglobin-haemoglobin (Hp-Hb) complex, and the use of the Hp-Hb complex and the CD163 receptor for therapy.

Abstract: The present invention provides an insulin-specific assay and an assay reagent capable of sensitively and specifically assaying insulin using an antibody having a property of reacting with insulin bound to an anti-insulin antibody while not reacting with insulin not bound to an anti-insulin antibody, without being affected by proinsulin and insulin analogs.

Abstract: The present invention relates to methods for detecting the activity of an ion channel in a cell. The methods comprise providing a loading buffer solution to a cell that has an ion channel. The loading buffer comprises at least one thallium indicator (e.g., an environmentally sensitive, luminescent dye) and a physiological concentration of chloride ions. The methods further comprise providing a stimulus buffer to the cell, wherein the stimulus buffer comprises thallium (e.g., thallium ions). Providing the stimulus buffer causes thallium influx into the cell through the ion channel. After providing the stimulus buffer, the luminescence (e.g., fluorescence) of the dye in the cell is detected. The luminescence of the dye can change in the presence or absence of thallium. The methods may be used to measure influx or efflux of thallium through an ion channel.

Abstract: Provided are an automated analyzer and an automatic analysis method for highly accurately determining presence or absence of abnormality based on reaction process data obtained when concentration of a chemical component or an activity level of an enzyme is measured. The reaction process data is approximated by a function, and shape feature quantities indicating features of a shape of a curve section at an early stage of reaction are calculated. The obtained shape feature quantities are used to determine the presence or absence of abnormality.

Abstract: When a STAT sample which needs to be centrifuged is inputted in the system, a measure to quickly realize centrifugation of the STAT sample is necessary. In view of the foregoing problem, the invention provides a specimen processing and conveying system in which a centrifuge module incorporated, the centrifuge module being capable of discriminating the operation status of the system at the time point when a STAT sample is inputted and the attribute of the inputted sample and starting centrifugation operation on the basis of the input interval of samples or the arrival interval at the device carrying out centrifugation, and thus capable of starting centrifugation operation quickly when a single or a group of plural samples of urgency is inputted.

Abstract: An automated sample processing system having a sample input adapted to simultaneously receive a number of sample containers, a reagent input adapted to receive one or more new reagent supplies, a consumable input adapted to receive one or more new consumable supplies, a solid waste output adapted to receive used consumable supplies, a liquid waste output adapted to receive one or more used reagent supplies, and a processing center. The processing center includes a decapper adapted to remove a lid from at least one sample container, an aspirator adapted to remove a specimen from the at least one sample container and transfer the specimen to an output vessel, and a capper adapted to replace the lid on the at least one sample container.

Abstract: Disclosed are a sample inspection apparatus and a control method thereof. The sample inspection apparatus includes a housing, a cartridge insertable into one side of the housing and configured to receive a sample, a pressing member disposed within the housing and configured to press the cartridge to inspect the sample, a fluid storage part configured to transfer a fluid to the pressing member so that the pressing member presses the cartridge, and a fluid supply part configured to supply the fluid into the fluid storage part.

Abstract: A physical quantity sensor has a resonance frequency f1 in same-phase mode and a resonance frequency f3 in same-phase absorptive mode greater than the resonance frequency f1. An absolute value ?f3 is a difference between the resonance frequency f3 in the same-phase absorptive mode and a value that is the product of the resonance frequency f1 in the same-phase mode multiplied by n; an avoidance difference D indicates a degree of deviation of the absolute value ?f3 from the resonance frequency f1 in the same-phase mode. A relation (?f3>n·f1·D) is satisfied, and, simultaneously, the avoidance difference D is provided to be greater than 0%. This can avoid the vibrational excitation by resonance interference from becoming the maximum displacement.

Abstract: A sensor device and a manufacturing method thereof are provided in which no resin seal is used when a sensor is packaged, a change in connection relation according to a change in specifications of the control IC and others is facilitated when a control IC is packaged together with the sensor and high reliability is kept. The sensor device of the present invention includes a substrate containing an organic material and being formed a wiring, a sensor arranged on the substrate and electrically connected to the wiring, and a package cap arranged on the substrate and containing an organic material and covering the sensor, and the inside of the package cap is hollow.

Abstract: A circuit to detect a movement of an object provides a threshold selection module or a peak identifier module that uses one or more threshold signals identified prior to a present cycle of magnetic field signal in order to establish a threshold signal used for a present cycle of the magnetic field signal. A method associated with the circuit is also described. The circuit and method can be tailored to store values associated with a least common multiple of a set of possible quantities of detectable features on target objects.

Abstract: The present invention includes a first substrate having a sensor part for measuring a measured factor and a second substrate that is to be detachably stacked on a lower side of the first substrate, the second substrate including: a signal processing part that processes a measurement signal obtained by measurement by the sensor part; a power supply part for feeding power to the sensor part; and at least either a memory that stores measurement data obtained by being processed in the signal processing part or a communication part for transmitting the measurement data by wireless, wherein the second substrate is in common use for a plurality of kinds of first substrates different in measured factor measured by the sensor part from each other.

Abstract: Three light emitting elements and one light receiving element are provided on a surface of a substrate. An arithmetic processing portion of a signal processing circuit separates three reflected light signals from a light detection signal from the light receiving element. The arithmetic processing portion calculates a square sum of the difference between the entire waveforms of the reflected light signals while the reflected light signal is shifted. The arithmetic processing portion calculates a phase difference between the reflected light signals on the basis of a shift amount with which the calculated value is minimum. On the basis of similar processing, the arithmetic processing portion calculates a phase difference between the reflected light signals. The arithmetic processing portion identifies a movement direction of a detection object on the basis of the phase differences.

Abstract: The application discloses a device that determines how much material is dispensed from a container by measuring the angle at which the container is tilted. The device includes an accelerometer for measuring an angle by which the container is tilted, and an electronic component for transmitting data based on the angle measured by the accelerometer. In some embodiments, the accelerometer measures the angle by which the container is tilted at a multiple different times.

Abstract: An accelerometer, comprises, a measurement mass, a top cap silicon wafer and a bottom cap silicon wafer, which both are coupled with the said measurement mass; the measurement mass comprises a support frame, a mass, and a plurality of resilient beams; the mass and the resilient beams are located within the support frame; the mass and the support frame are connected by several sets of the resilient beams, and each set comprises two resilient folding beams; the resilient folding beams are symmetrically provided with respect to the midline of the mass; a connection beam is provided in between each set of the resilient folding beams to connect the resilient folding beams together. Silicon wafers with electrodes are bonded on the top and bottom surfaces of the measurement mass; and forms a capacitor with the measurement mass. The accelerometer in the present invention has a large mode isolation ratio, and it is symmetrical in high order vibrational modes , which further decreases the noise of the MEMS chip.

Abstract: In an acceleration sensor having two redundantly disposed micromechanical sensor elements having redundant signal paths with a separate A/D converter, a monitor includes a substitute circuit, integrated in the evaluation unit, for a sensor element, and a redundant further A/D converter, which converts the fixed, acceleration-independent output signal of the substitute circuit as a function of the shared operating parameters of all A/D converters to plausibilize the output signals of the acceleration sensor by means of the monitor. This makes it possible to detect faulty triggering of an airbag due to faults in both A/D converters.

Abstract: A sensor element includes: a detection electrode section; a movable body that is provided to face the detection electrode section; and a protruding section that is provided in a region where the detection electrode section is provided in a plan view of the detection electrode section seen in a vertical direction and protrudes toward the movable body. At least a part of a surface of the protruding section is made of an insulating material.

Abstract: A capacitive acceleration sensor with an “H”-shaped beam and a preparation method. The sensor at least includes: a first electrode structural layer, a middle structural layer and a second electrode structural layer; the first electrode structural layer and the second electrode structural layer are provided with electrode lead via holes, respectively; the middle structural layer includes: a frame formed at SOI silicon substrate having a double device layer, a seismic mass whose double sides are symmetrical, and an “H”-shaped elastic beam whose double sides are symmetrical, with one end connected to the frame and the other end connected to the seismic mass, there are anti-overloading bumps and damping grooves symmetrically provided on the two sides of the seismic mass, and the “H”-shaped elastic beam and a bulk silicon layer of the oxygen containing silicon substrate satisfy the requirements therebetween: ?{square root over (2)}(a+b+c)<h, ?{square root over (2)}d<h.

Abstract: An accelerometer comprises a support (12), a proof mass (14) supported for movement relative to the support (12) by a plurality of mounting legs (16), a plurality of fixed capacitor fingers associated with the support (12) and a plurality of movable capacitor fingers associated with the proof mass (14), the fixed capacitor fingers being interdigitated with the movable capacitor fingers, the mounting legs (16) being of serpentine shape, each mounting leg (16) comprising at least a first generally straight section (16a), a second generally straight section (16a), and an end section (16b) of generally U-shaped form interconnecting the first and second generally straight sections (16a), wherein the thickness Te of the end section (16b) is greater than the thickness Tc of a central part (16c) of both of the first and second generally straight sections (16a).

Abstract: An object is mounted on a surface of a sample carrier. Properties of the surface of the object are measured and/or modified by means of a plurality of independently movable heads, each comprising a microscopic probe. The heads being located between the surface of a reference grid plate and the surface of the sample carrier. Head specific target locations are selected for the heads. Each head is moved over the surface of the reference grid plate, to the target location of the head. During movement a position of the head is determined from markings on the reference grid plate sensed by sensor in the head. When the sensor has indicated that the head is at the target location selected for the head a force between the head and the reference grid plate is switched to seat and/or clamp the head on the reference grid plate.

Abstract: A test terminal block is formed of a series terminal block and a test plug block pluggable onto the series terminal block and fastening clamps for releasably securing them together. Each of two fastening clamps has a clamp housing contains at least two catch elements and the housing of each has at least two corresponding mating catch elements that determine two interlocking positions of fastening parts in the fastening clamps, one position is arranged after the other in the plug-on direction of the fastening parts. An unlocking element is movably arranged in the housing of each of the two fastening parts, which unlocking element can be brought into a first unlocking position and a second unlocking position, the locking of the first interlocking position being released in the first unlocking position and the locking of the second interlocking position being released in the second unlocking position by the unlocking element.

Abstract: The present invention provides a test socket adaptable for testing different Integrated Circuit (IC) pad size during an IC testing. The test socket comprising a molded socket having an inner space and a plurality of through-apertures disposed on its surface; and a plurality of contact elements disposed within the inner space of the molded socket, each contact element has a pin contact edge and a pin-end; wherein each pin contact edge extends through the through-apertures of the molded socket; wherein each pin contact edge provides a linear surface area for contact with the DUT's lead; and wherein each pin contact edge provides a large contact area for various DUT's lead size.

Abstract: The present invention is a probe having a distal end made of one material, a tip and a portion disposed between the distal end and the tip that is a different second material. The probe is laser machined manufactured using a nanosecond or picosecond laser.

Abstract: A Kelvin inspection fixture is provided with contact probes, wherein the contact probe comprises an electrode side contact terminal in contact with a solder ball, and a land side contact terminal in contact with a land, and the contact probe comprises an electrode side contact terminal in contact with the solder ball, and a land side contact terminal in contact with a land. The contact probes are disposed so that an electrode side inclined face and an electrode side inclined face are held in an opposite relationship with respect to each other and so that a land side inclined face and a land side inclined face are held in a face to face relationship with respect to each other.

Abstract: A probe card includes a wiring substrate including an opening portion, a first connection pad, and a second connection pad arranged in an opposite area to the first connection pad, a resin portion formed in the opening portion, a first wire buried in the resin portion, in which one end is connected to the first connection pad and other end constitutes a first contact terminal, and a second wire buried in the resin portion, in which one end is connected to the second connection pad and other end constitutes a second contact terminal, wherein the first and second wires extend on one line, and the first and second contact terminals are arranged on the one line, and the first and second contact terminals are gathered to be separated such that the first and second contact terminals touch one electrode pad of a text object with a pair.

Abstract: Recesses are formed on one surface of a substrate. A conductive film covers an inner surface of each of the recesses. This conductive film contacts a bump of a semiconductor device to be inspected and is electrically connected to the bump. It is therefore possible to prevent damages of the bump to be caused by contact of a probe pin.

Abstract: Embodiments relate to magnetic field current sensors.

Abstract: An overcurrent detection apparatus includes a sense emitter current detection unit that detects a sense emitter current output from a sense emitter of an IGBT as a sense emitter voltage, and a comparison unit that detects an overcurrent by comparing the sense emitter voltage detected by the sense emitter current detection unit with a threshold voltage. The overcurrent detection apparatus also includes a correction current detection unit that detects a correction current corresponding to a current flowing between a gate and the sense emitter of the IGBT as a corrected voltage; and a voltage correction unit that calculates a sense emitter corrected voltage by subtracting the correction voltage detected by the corrected current detection unit from the sense emitter voltage detected by the sense emitter current detection unit, and supplies the sense emitter corrected voltage to the comparison unit.

Abstract: A power theft inspection apparatus (100) is mounted on a power transmitting apparatus (10) which has a power transmission unit (13) and a power supply unit (12) configured to supply alternating current (AC) power to the power transmission unit. The power theft inspection apparatus has a controlling device (101) configured to (i) control the short-circuiting device (SW1, SW2) to electrically cut off the power transmission unit from the power supply unit and to short-circuit the input unit of the power transmission unit, and further (ii) transmit, to the power receiving apparatus (20), a signal indicating a request to open the power reception unit (23), upon power theft inspection, and a determining device (101) configured to determine whether or not there is power theft according to current detected by a current detecting device (102) upon the power theft inspection.

Abstract: An alternating current detector with automatic judging of the amount of element under testing and monitoring, comprising a detecting input unit, a first output level unit, a second delay unit, a second output level unit and a cascade next element unit. The detecting input unit comprises a first delay unit and a first inverter. The first delay unit receives and delays an input signal. The input terminal of the first inverter is connected to the first delay unit and inverts the input signal. The first output level unit comprises a first NAND gate, a first diode and first resistor. The input terminal of the first NAND gate is connected to the alternating current signal of an element, another input terminal of the first NAND gate is connected to the output terminal of the first inverter.

Abstract: A current measurement connector may include a first part and a second part. Each part may include a mount and a joint. The first and second part may be joined via the respective joints through a current transformer interposed between the first and second parts. The respective mounts may be configured to receive a current from a current source and pass the received current through the current transformer via the first and second parts inducing a current in the current transformer. The induced current may be useable to measure the current from the current source. Methods for fabricating the current measurement connector may include die casting the first and second parts and press fitting the first and second parts at the respective joints through the current transformer. Methods for use may include withstanding a fault current pulse and dissipating heat associated with the pulse via the first and second parts.

Abstract: Described is a method and devices to determine root-mean-square of a delta-sigma modulated signal. The method includes filtering the delta-sigma modulated signal to produce a multi-bit filtered signal, delaying a copy of the delta-sigma modulated signal by a fixed number of samples to align with the filtered input, setting a sign of each multi-bit value of the multi-bit filtered signal based upon a corresponding sample value of the delayed copy of the delta-sigma modulated signal, to generate a hybrid signal, summing the hybrid signal to produce a summed signal, and determining the average of the summed signal and the square root of the average to produce a root-mean-square value.

Abstract: A method may include deactivating a switch of a measurement circuit during a measurement portion of at least one voltage regulator phase, wherein each of the at least one voltage regulator phase is integral to a voltage regulator and each of the at least one voltage regulator phase comprises a power stage. The power stage may include a high-side switch for delivering electrical current to the at least one information handling resource in conformity with a first duty cycle of the high-side switch. The power stage may also include a low-side switch for sinking electrical current to an electrical ground in conformity with a second duty cycle of the low-side switch. The method may also include measuring a voltage across a sense resistor of the measurement circuit during the measurement portion, wherein the sense resistor is coupled in parallel with non-gate terminals of the switch.

Abstract: According to one embodiment, a measuring device includes a clock output unit, a receiving unit, an adjusting unit, a generating unit, and a transmitting unit. The clock output unit generates a clock, counts the clock, and outputs a count value. The receiving unit receives a first message including time information. The adjusting unit adjusts time at which acquires a physical amount on the basis of the time information included in the first message and the count value output from the clock output unit when the first message is received. The generating unit generates a second message including a value of the physical amount acquired at the adjusted time. The transmitting unit transmits the second message to a device, which is a transmission source of the first message.

Abstract: A method identifying a material, includes: measuring an electromagnetic radiation spectrum emitted through the material; determining at least one measurement energy band, and spectral coefficients of a comparison function in the measurement band, using the measured spectrum; estimating, using the determined spectral coefficients, a nature and/or thickness of the material based on a set of reference spectral parameters relating to reference materials and/or thicknesses and defined in reference bands.

Abstract: A sensor system has a first sensor device and a second capacitive sensor device for detecting a movement of the object relative to a detection surface, wherein the sensor system is configured to be operated in a first mode of operation and in a second mode of operation, wherein the sensor system is configured to be switched over from the first mode of operation into the second mode of operation, wherein the second capacitive sensor device has a number of second sensor electrodes, and wherein in the sensor system at least in the second mode of operation at least one signal path connectable with a predetermined fixed electric potential is provided, which is parallel to a parasitic capacitance of the first sensor device.

Abstract: The invention relates to a method for electromagnetically testing an object, a method in which electromagnetic radiation is directed by a probe in a predetermined main aiming direction toward a predetermined test point at which the object is located. The invention is characterized in that the probe and a stand for the object are moved relative to one another by a mechanical moving device according to a movement representative of a predetermined angular spread statistic relative to the main aiming direction, in order to generate, by means of the probe, electromagnetic radiation having said predetermined angular spread statistic relative to the main aiming direction.

Abstract: In one embodiment, a method for determining electrostatic discharge (ESD) includes building a slider delta comparison map using slider electrical and/or row bar quasi testing results, wherein row bar quasi testing is performed on row bars of multiple sliders, and wherein slider electrical testing is performed on individual sliders, determining whether a test device in a parent job passes primary ESD delta criteria, when the test device fails the primary ESD delta criteria: flagging the parent job of the test device as a reroute job and performing automatic actual parts rerouting for any jobs related to the parent job to pull parts from a test bin as opposed to a supply bin, wherein all parts pulled from the test bin are tested prior to assembly as opposed to parts pulled from the supply bin which are not 100% tested.

Abstract: A structure to detect changes in the integrity of vertical electrical connection structures including a semiconductor layer and an electrically conductive material extending through an entire depth of the semiconductor layer. The electrically conductive material has a geometry that encloses a pedestal portion of the semiconductor layer within an interior perimeter of the electrically conductive material. At least one semiconductor device is present on the pedestal portion of the semiconductor layer within the perimeter of the electrically conductive material.

Abstract: A test system for testing a sensor system includes a high-impedance resistor for forming a voltage divider with any corrosion or foreign substance that might be present between a signal conductor and a ground conductor. While a voltage is applied across the voltage divider, the voltage can be measured across the high-impedance resistor for determining whether an undesirable amount of conductance exists between the signal wire and ground. The test system also includes switching means for switching between any number of signal wires of a system undergoing testing.

Abstract: Propagating pin corrections through physically mating devices including bending one of a plurality of connectors of a first mating device; and mating the first mating device having the bent connector with an unmodified second mating device; wherein the mating of the first mating device and the unmodified second mating device bends a connector corresponding to the bent connector of the first mating device.

Abstract: A method determines a location of a fault in a faulty feeder section of an ungrounded power distribution system based on a type of the fault and the type of the faulty line. The method determines, if the faulty line is the lateral and the fault is phase-to-phase or double-phase-to-ground fault, the fault at a first point on an un-faulty phase of the lateral where a fault current equals a load current. The method determines, if the faulty line is the lateral and the fault is the three-phase fault, the location of the fault at a point with a minimal difference between imaginary parts of equivalent fault impedances. The method determines, if the faulty line is the mainline, the location of the fault at a point partitioning the faulty segment on two sub-segments with a ratio of lengths determined based on the voltages at the buses of the faulty segment.

Abstract: A location of a fault in an ungrounded power distribution system is determined by identifying a faulty feeder section and a type of the fault using voltages and currents measured before and after the fault and selecting the location of the fault at the faulty feeder section by testing a relationship of a current over a voltage measured at boundaries of the faulty feeder section after the fault with different equivalent admittance matrices of the faulty feeder section determined for different candidate locations of the fault of the determined type. The fault is a short-circuit fault including one or combination of a single-phase-to-ground fault, a phase-to-phase fault, a double-phase-to-ground fault, a three-phase-to-ground fault, and a phase-to-phase-to-phase fault.

Abstract: Systems and methods which utilize spread spectrum sensing on live circuits to obtain information regarding a circuit under test are provided. In some embodiments S/SSTDR testing may be utilized to obtain R, L, C and Z measurements from circuit components. In yet further embodiments, these measurements may be utilized to monitor the output of sensors on a circuit.

Abstract: A method includes coupling a gate pulse generator to a gate terminal of a power transistor device under test, coupling a drain pulse generator to a drain terminal of the power transistor device under test; for a first set of test conditions, activating the drain pulse generator for each of the test conditions to apply a voltage pulse to the drain terminal, and for each of the test conditions, applying a voltage pulse to the gate terminal, the gate pulse rising only after the drain pulse falls below a predetermined threshold; for a second set of test conditions, applying a voltage pulse to the drain terminal, and applying a voltage pulse to the gate terminal, the drain pulse generator and the gate pulse generator both being active so that there is some overlap; and measuring the drain current into the power transistor device under test. An apparatus is disclosed.