Abstract: The present invention relates to systems and methods of determining quality compliance for one or more biological sample testing instruments used with one or more type of single-use blood testing cartridge, at the point-of-care in a hospital, or other location that deliver medical care.

Abstract: Material transfer/interrogation devices (e.g. liquid handling workstations) have been designed in the past for transferring material from a source to a destination location or for interrogating a material at a location, where the locations remain fixed. The invention provides methods and apparatuses for transferring or interrogating materials by one or more carrier devices to one or more receiving devices, where the carrier and receiving devices move independently and simultaneously on multiple axes. In some embodiments, one or more of the carrier and receiving devices can move along an X, Z, Y, and Theta axis, which allows the source and destination locations to rotate and translate relative to each other. Due to this rotation and translation, containers can be positioned to minimize the distance traveled between a pick location from the source and a place location on the destination, greatly increasing the speed at which material transfer can occur.

Abstract: A configurable speed indication system for an engine is provided. The configurable speed indication system includes a dial having an arc. The dial also includes an overlay of a plurality of speed limits provided along the arc spaced apart at pre-defined intervals from each other. The dial further includes a first indicator cluster. The first indicator cluster includes a plurality of first light emitting devices. The dial includes a second indicator cluster. The second indicator cluster includes a plurality of second light emitting devices. The configurable speed indication system further includes a control module communicably coupled to the dial. The control module is configured to receive a signal indicative of a type of the engine. The control module is also configured to trigger the activation of each of the sets of the first and second light emitting devices respectively.

Abstract: Systems, methods and computer-readable mediums are disclosed for GNSS velocity estimation for pedestrians. In some implementations, a method includes receiving a periodic sensor signal; determining a fundamental motion frequency of the periodic sensor signal; extracting a periodicity feature from the periodic sensor signal based on the fundamental motion frequency; and responsive to the extracting, initiating pedestrian velocity estimation.

Abstract: A flow angle probe is provided comprising: (a) a probe vane configured to contact a moving fluid within a fluid conduit; (b) an optional probe mounting mechanically coupled to the probe vane; (c) a rotary shaft coupled either to the optional probe mounting or the probe vane; (d) a rotary encoder coupled to the rotary shaft; (e) a sensor hermetically isolated from the probe vane and configured to sense a change in position of the rotary encoder; and (f) a probe housing encompassing at least a portion of the rotary shaft, the rotary encoder and the sensor. The novel flow angle probes disclosed herein may be used in a wide variety of turbomachines and fluid processing systems, and applications, including turbomachine design and operational control, as well as in flow assurance.

Abstract: A sensing structure for an accelerometer includes a support and a proof mass mounted to the support by flexible legs for in-plane movement in response to an applied acceleration along a sensing direction. The proof mass includes a plurality of moveable electrode fingers extending substantially perpendicular to the sensing direction and spaced apart in the sensing direction. The structure also includes at least one pair of fixed capacitor electrodes comprising first and second sets of fixed electrode fingers extending substantially perpendicular to the sensing direction and spaced apart in the sensing direction; the first set of fixed electrode fingers arranged to interdigitate with the moveable electrode fingers with a first offset in one direction from a median line therebetween, and the second set of fixed electrode fingers arranged to interdigitate with the moveable electrode fingers with a second offset in the opposite direction from a median line therebetween.

Abstract: A control methodology for scanning tunneling microscopy is disclosed. Instead of utilizing Integral-based control systems, the methodology utilizes a dual-control algorithm to direct relative advancement of a STM tip towards a sample. A piezo actuator and stepper motor advances an STM tip towards a sample at a given distance until measuring a current greater than or equal to a desired setpoint current. Readings of the contemporaneous step are analyzed to direct the system to change continue or change direction and also determine the size of each step. In simulations where Proportion and/or Integral control methodology was added to the algorithm the stability of the feedback control is decreased. The present methodology accounts for temperature variances in the environment and also appears to clean and protect the tip electrode, prolonging its useful life.

Abstract: A measurement method in which a sensing unit acquires surface data of a measurement target while scanning the surface of the measurement target and at least one of the sensing unit and the measurement target is moved in order for the sensing unit to scan the surface along a plurality of fast scan lines on the surface of the measurement target, includes: a first step in which the sensing unit scans a surface along any one fast scan line of the plurality of fast scan lines to acquire the surface data along the any one fast scan line; and a second step in which the sensing unit acquires a surface data along a fast scan line most adjacent to the any one fast scan line while at least one of the sensing unit and the measurement target is moved along the most adjacent fast scan line, after the first step.

Abstract: Apparatus and method for nano-identification a sample by measuring, with the use of evanescent waves, optical spectra of near-field interaction between the sample and optical nanoantenna oscillating at nano-distance above the sample and discriminating background backscattered radiation not sensitive to such near-field interaction. Discrimination may be effectuated by optical data acquisition at periodically repeated moments of nanoantenna oscillation without knowledge of distance separating nanoantenna and sample. Measurement includes chemical identification of sample on nano-scale, during which absolute value of phase corresponding to near-field radiation representing said interaction is measured directly, without offset. Calibration of apparatus and measurement is provided by performing, prior to sample measurement, a reference measurement of reference sample having known index of refraction.

Abstract: Disclosed herein is a scanning probe microscope including a cantilever, a three-dimensional moving mechanism moving a sample stage in three dimensions, and a measurement chamber sealed not to be exposed to external air. At least the cantilever, the sample stage, and the three-dimensional moving mechanism are accommodated in the measurement chamber. The measurement chamber is provided with a pair of guide rails used to transport the sample stage. The sample stage has an engagement portion. The three-dimensional moving mechanism is disposed in the vicinity of a predetermined position and between the guide rails. The three-dimensional moving mechanism can be moved to above the guide rails and below the guide rails. When the sample stage is transported to the predetermined position in a horizontal direction, the three-dimensional moving mechanism is lifted up to the bottom surface of the sample stage so that the scanning probe microscope can perform measurement.

Abstract: Systems and methods are disclosed that describe a MEMS device and a method of sensing based on a consensus algorithm. The MEMS device is a sensor comprising multiple piezoelectric layers attached to a microcantilever. It can be used to sense deflections or variations in corresponding parameters of systems in micro- and nano-scales. Multiple piezoelectric elements on a microcantilever can provide a more accurate measurement of the microcantilever's deflection. The device can eliminate bulky laser sensors in SPMs and provide additional use as a biosensor, or chemical sensor at the micro- and nano-scale. The consensus sensing algorithm can provide added robustness into the system. If one of the sensing elements or electrodes fails during a sensing process, other elements can compensate and allow for near zero-error measurement.

Abstract: A display panel testing bench, wherein the display panel testing bench comprises: a bench base, a chassis, a probe assembly, and a linkage assembly; a bench base moving assembly is disposed on the chassis; the bench base is movable on the chassis by the bench base moving assembly, the bench base is configured to fix a display panel; the linkage assembly is disposed on the chassis, and is configured to perform a joint movement of the probe assembly and the bench base; the probe assembly is disposed above the bench base; wherein, when the bench base is moved on the chassis by the bench base moving assembly, the bench base drives the linkage assembly, and the probe assembly is driven by the linkage assembly to move above the display panel.

Abstract: A test device for an interface which can test the performance of an interface of an electronic product is provided. The test device includes a securing module configured to secure the electronic product and an adjustment module. The securing module includes a shell and a securing member configured to be secured in the shell. The adjustment module includes two adjustment members slidably installed in the shell and a test card mounted on the adjustment member. The adjustment members are slidable relative to the shell to align the test card with the interface, and the test card is configured to be inserted into and extracted from the interface for testing.

Abstract: A measuring device for accommodating and electrically contacting a device under test to be tested in cooperation with a test apparatus, the measuring device comprising a casing comprising a first interface member being electrically couplable to the test apparatus when the test apparatus is connected to a test plug of the casing, and an exchangeable connector configured to be exchangeably assembled with the casing and comprising a second interface member being electrically couplable to a device under test when located at a device under test receptacle of the connector, wherein the first interface member and the second interface member are configured for establishing an electrically conductive connection from the device under test receptacle to the test plug upon assembling the connector with the casing.

Abstract: A testing probe and a testing apparatus are disclosed. The testing probe including: a housing, including a test end and a fixed end, and with a test opening at the test end; a piston, being capable of sliding between the test end and the fixed end along an inner wall of the housing, and a conductive adhesive agent chamber being formed by the piston and the fixed end of the housing and being configured to be filled with a conductive adhesive agent; and the conductive adhesive agent being allowed to overflow from a gap between the piston and the inner wall of the housing by squeezing the piston; an elastic member with a first end fixed to the piston and a second end extending toward the test end; a sphere being disposed at the test opening and separated from the second end of the elastic member by a preset distance.

Abstract: A wired rubber contact including a lower film, an upper film, a plurality of conductive wires, a rubber layer, and a film guide. The lower film includes a plurality of lower electrode parts formed in openings. A periphery of the upper film is disposed within an interface between the central area and the peripheral area. The conductive wires are disposed between the lower film and the upper film, and connect between the lower electrode parts and the upper electrode parts. The rubber layer includes elastic material. A periphery of the rubber layer is protruded toward an outer side from the periphery of the upper film. The rubber layer maintains a constant distance between the lower film and the upper film. The film guide is disposed in the peripheral area of the lower film along a side surface of the rubber layer and integrally formed with the lower film.

Abstract: The invention relates to a method and a device for detecting a current in a measuring path, the current in said measuring path corresponding to a current in a power path. An electric current is detected by a current measuring instrument in the measuring path, whilst simultaneously part of the electric current is conducted parallel to the current measuring instrument by a bypass device, in order to reduce the load on the current measuring instrument.

Abstract: A current meter having a movably mounted swivel element, in which an angle is subtended between a first leg and a second leg of the swivel element. A free end of the first leg is coupled to the handle and a free end of the second leg is coupled to the first receiving element, these being movable relative to each other, so that upon activating the handle an activating force engaging with the first leg can be generated. The activating force can be converted by the swivel element into a displacement force on the second leg, directed transversely to the activating force, so that by this displacement force the first receiving element can be moved.

Abstract: A system for measuring current includes a conductive trace comprising N substantially parallel straight sections having a substantially constant cross-section, N?4. Adjacent substantially straight sections are spaced apart by a given distance and each pair of adjacent straight sections is connected by a respective loop of the current trace such that current in odd-numbered straight sections flows in a first direction and current in even-numbered straight sections flows in an opposite direction. The N magnetic field based current sensors are each positioned on a respective straight section of the conductive trace.

Abstract: A current sensor chip and systems and methods for calibrating thereof are provided. The current sensor chip includes a first magnetic field sensor element configured to generate a first analog sensor signal representing a magnetic field caused by a primary current passing through an external primary conductor, an analog-to-digital converter coupled to the first magnetic field sensor element and configured to generate a digital sensor signal based on the first analog sensor signal, a digital signal processor coupled to the analog-to-digital converter to receive the digital sensor signal and configured to determine, based on the digital sensor signal and based on calibration parameters stored in memory, a corresponding current measurement signal that represents the primary current, and an external output pin coupled to the first magnetic field sensor element to receive the first analog sensor signal or an analog signal derived therefrom by analog signal processing.

Abstract: Embodiments relate to magnetic field current sensors having sensor elements for sensing at least two magnetic field components, for example Bx and By. The current in a conductor is estimated by Bx and Bx/By, wherein Bx is the primary measurement and Bx/By is a corrective term used to account for position tolerances between the sensor and the conductor. In other embodiments, the corrective term can be dBx/By, where dBx is a difference in between components sensed at different sensor elements. The particular field components can vary in embodiments; for example, the current can be estimated by By and By/Bx, or dBy/Bx or some other arrangement.

Abstract: Apparatus and associated methods relate to a measurement system that calculates a current in a conductor based on an odd-order spatial derivative function of signals representing magnetic-field strengths within a hole in the conductor. In an illustrative embodiment, the odd-order spatial derivative function may generate an output signal representing a spatial derivative of the in-hole magnetic field greater than the first-order. The three or more magnetic-field sensors may be configured to align on the hole's axis when inserted into the hole. When inserted into the hole, the sensors may be aligned on an axis perpendicular to a direction of current flow and be responsive to a magnetic-field directed perpendicular to both the direction of current flow and the aligned axis. Some embodiments may advantageously provide a precise measurement indicative an electrical current in the electrical conductor while substantially rejecting a stray magnetic field originating from an adjacent electrical conductor.

Abstract: An interferometric sensor and related methods are provided, with a sensing element whereby a measurand induces a relative phase shift between two waves, at least one detector measuring an interference signal between the two waves, and further including a phase shift detection unit having as input the interference signal and determining a first measure representative of the principal value of the relative phase shift, and a contrast detection unit having as input the interference signal for determining a second measure representative of the cross-correlation between the two waves, and a further a processing unit for converting the first and second measures to a measurand value.

Abstract: A loss-phase lack-voltage detection circuit for three-phase input power includes a half-wave rectifier circuit, a bleeder circuit, an optical coupler circuit and a digital signal processor sequentially connected with each other. The half-wave rectifier circuit serves to rectify the input power. The bleeder circuit has multiple bleeder resistors for stepping down the voltage. The optical coupler circuit serves to generate judgment signal in form of pulse wave. The digital signal processor serves to calculate the duration for which the pulse wave stays at the peak value to judge the loss-phase state of the input power.

Abstract: A current detecting circuit includes: a shunt resistor; an amplifier; a first signal line connecting a first terminal of the shunt resistor to a first input terminal of the amplifier; a second signal line connecting a second terminal of the shunt resistor to a second input terminal of the amplifier; and a third signal line connecting the second terminal of the shunt resistor to a first power supply terminal of the amplifier.

Abstract: An apparatus and method measures and analyzes DC current passing through a substantially insulating member or dielectric material that is electrically connected to, or otherwise conductive, between an energized DC electrical transmission line and an Earth potential or ground. An apparatus may utilize a DC current measuring device, a DC voltage level selection switch, a DC display, a graphical display of momentary leakage current, and an audio speaker. A process may entail extending a substantially insulating member or dielectric material between an energized DC electrical transmission line and an Earth potential, detecting a DC momentary leakage current, using a DC momentary leakage current meter to measure DC current through the member or material, and a computer to analyze and compare the DC current, and deliver results or a warning that the DC current has reached a threshold value.

Abstract: An overload monitoring device for an electrical system including a measuring device for current and/or voltage, a time measuring device and an evaluation device connected to the measuring device and the time measuring device being provided, the evaluation device being designed for generating parameters from measured values of the measuring device and/or for detecting an overload situation based on the measured values and/or the parameters using time data of the time measuring device. A method for overload monitoring of an electrical system is also described, measured values being determined for a current and/or a voltage of the electrical system; time data being determined; parameters based on the measured values being generated; and an overload situation being detected based on the measured values and/or the parameters using the time data.

Abstract: A circuit has a supply line, a reference line and circuitry coupled between the supply line and the reference line. The circuitry outputs a regulated voltage and a measurement voltage. An analog-to-digital converter (ADC) generates a digital signal indicative of variations of potential differences between the supply line and the reference line based on the regulated voltage and the measurement voltage. The generated digital signal may be used to control the circuit.

Abstract: An electronic device includes an input power detection unit, a transmission control unit and a converter. The input power detection unit is configured to determine an input voltage value and an input current value of an input power. In response to the input power, the transmission control unit is configured to determine a first voltage value and a first current value associated with another electronic device via a handshake process. The voltage converter is configured to convert the input power into a first power required by the another electronic device.

Abstract: Embodiments herein disclose a power managing method. The power managing method includes receiving a scan command for a load apparatus connected to a multi-tap type energy measuring apparatus. Further, the power managing method includes determining a power consumption pattern of the load apparatus for a predetermined time based on a signal corresponding to the scan command from the user terminal. Further, the power managing method includes receiving information of the load apparatus. Further, the power managing method includes registering the load apparatus based on the determined power consumption pattern and the information of the load apparatus received from the user terminal.

Abstract: There is described an electric meter center comprising electric meter sockets and breakers. The electric meter center comprises an electric meter area comprising compartments, each one of the electric meter sockets being in one of the electric meter area compartments. It further comprises a breaker area distinct from the electric meter area and comprising compartments, each one of the breakers being in one of the breaker area compartments. There is a physical separation between the breaker area and the electric meter area. There is provided a plurality of panels, each one of the panels for covering at least one compartment, the at least one compartment to be covered by one of the panels being only within the same area.

Abstract: The present invention relates to a novel means and a novel method for detecting a capacitance connected to AC power, which detect a sensor capacitance on the basis of a charge sharing phenomenon occurring due to a difference between voltages applied to a sensor capacitor and an auxiliary capacitor connected to a detection system when an AC voltage applied to the detection system alternates. According to the present invention, since the sensitivity of a signal detected by a detection system is improved, a magnitude and a change amount of a sensor capacitance are stably acquired.

Abstract: An electromagnetic chamber absorber provided improved absorption across a wideband and both lower diffuse and specular scatter and a method for constructing the same. An exemplary device can compromise a periodic arrangement of disconnected electromagnetically lossy elements where the periodicity of the lattice is adjusted to suppress all or most grating lobe scattering. Because the electromagnetically lossy elements are disconnected, scalable manufacturing approaches are enabled. The lossy elements can be easily fabricated via shaping, which includes rolling, folding and cutting resistive and/or magnetic sheet materials. The lossy elements can be repeatably placed in a periodic lattice using low density scaffolding approaches and/or other alignment mechanisms. The absorption at the lower frequency part of the electromagnetic bands (below 1-2 GHz) can be improved via the addition of parallel lossy sheets into the low-density scaffolding.

Abstract: A test board between a first connector of a cable extending from a source device and a second connector of a sink device including a display panel, includes: a bypass circuit, the bypass circuit to supply a first power from a first output terminal of the first connector to a hot plug detect (HPD) input terminal of the first connector, the first power including a HPD signal.

Abstract: A signal compensating high-speed data cable connects a first device to a second device. The cable comprises a signal frequency-shaping device configured to provide a signal boost in the cable, wherein an equalizer circuit in the second device receives the boosted signal and the equalizer circuit outputs a desired frequency response to conform to a desired standard. A system and method for testing high-speed data cables is also described.

Abstract: A signal compensating high-speed data cable connects a first device to a second device. The cable comprises a signal frequency-shaping device configured to provide a signal boost in the cable, wherein an equalizer circuit in the second device receives the boosted signal and the equalizer circuit outputs a desired frequency response to conform to a desired standard. A system and method for testing high-speed data cables is also described.

Abstract: A capacitor life diagnosis device includes: a first fluctuation detecting unit configured to detect a maximum value of fluctuation in output voltage of a first capacitor every fixed time; and an output unit configured to predict a residual life of the first capacitor on the basis of temporal transition of the maximum value of fluctuation in the output voltage detected by the first fluctuation detecting unit, and output a signal indicating the residual life of the first capacitor.

Abstract: An integrated circuit includes an insulated gate bipolar transistor (“IGBT”), a clamp element coupled to a control gate of the IGBT to allow current flow in a first direction when voltage is applied to the control gate of the IGBT, and a blocking element coupled to the control gate of the IGBT and to the clamp element. The blocking element allows current flow in a second direction when voltage is removed from the control gate of the IGBT, the second direction is opposite the first direction. A resistive element has a first terminal and a second terminal, the first terminal is coupled between an anode of the clamping element and an anode of the blocking element and the second terminal is coupled to an output of test circuitry.

Abstract: A method for testing semiconductor dies includes: providing a test apparatus; providing an electrically conductive carrier; providing a semiconductor substrate having a first main face, a second main face opposite to the first main face, and a plurality of semiconductor dies, the semiconductor dies including a first contact element on the first main face and a second contact element on the second main face; placing the semiconductor substrate on the carrier with the second main face facing the carrier; electrically connecting the carrier to a contact location disposed on the first main face; and testing a first semiconductor die of the plurality of semiconductor dies by electrically connecting the test apparatus with the first contact element of the first semiconductor die and the contact location.

Abstract: Disclosed are a flexible printed circuit and a detecting device, a detecting method and a display device thereof. The flexible printed circuit comprises a body and an interface structure that is connected with the body, wherein the interface structure is provided with a plurality of mark lines dividing the interface structure into a plurality of interfaces with the same structure. When a front end interface of the flexible printed circuit of the disclosure is damaged, the front end interface can be removed along the mark line, and then an exposed rear end interface can be used successively, thus preventing a situation where the flexible printed circuit cannot be used because the only interface is damaged, thereby extending the life span of the flexible printed circuit, reducing productivity loss due to frequent replacements of the flexible printed circuit and reducing production cost.

Abstract: Roughly described, a method of restricting access of a debug controller to debug architecture on an integrated circuit chip, the debug architecture comprising an access controller, a plurality of peripheral circuits, and a shared hub, the shared hub being accessible by the access controller and the plurality of peripheral circuits, the method comprising: at the access controller, authenticating the debug controller; at the access controller, following authentication, assigning to the debug controller a set of access rights, the set of access rights granting the debug controller partial access to the debug architecture; and after assigning the set of access rights, allowing the debug controller access to the debug architecture as allowed by the set of access rights.

Abstract: An apparatus for testing DUTs is disclosed. The apparatus comprises a socket operable to enable coupling between a Ball Grid Array (BGA) packaged DUT and a Printed Circuit Board (PCB), wherein the socket comprises a plurality of pogo pin connectors. The apparatus also comprises a pogo pin connector operable to couple a ball on the BGA packaged DUT to a trace on the PCB, wherein the pogo pin connector comprises a first end in contact with the ball on the BGA packaged DUT and a second end in contact with the PCB, wherein the first end is thicker than a shaft of the pogo pin connector, wherein the PCB comprises at least a ground plane and a signal plane comprising signal traces, and wherein the ground plane is nearer to the second end relative to the signal plane.

Abstract: An IC handler (4) of the present invention transfers an IC device (D) to a test head (2). The test head (2) is provided with a socket (3), which has a placing surface (3a) having the IC device (D) placed thereon, and which attaches the IC device (D) placed on the placing surface (3a) to the test head (2). The IC handler (4) is provided with a non-contact displacement meter (71) that is disposed by being spaced apart from the socket (3) in the direction perpendicular to the placing surface (3a). The non-contact displacement meter (71) measures a distance from the non-contact displacement meter (71) to the IC device (D) placed on the placing surface (3a) by emitting a laser beam toward the placing surface (3a) of the socket (3).

Abstract: A method in accordance with various embodiments may include: measuring a contact force between at least one probe and at least one contact pad for a plurality of probe overdrive positions, and determining a relationship between contact force and probe overdrive position from the measured contact forces; determining a first region in the relationship exhibiting a non-linear dependence of the contact force from the probe overdrive position, and a second region exhibiting a linear dependence of the contact force from the probe overdrive position; and determining a process window for a pad probing process based on the determined first region and second region.

Abstract: A method for performing contactless signal testing includes receiving, with a testing pad of an integrated circuit, a signal within a beam. The method further includes converting, with a number of diodes connected to a positive voltage supply, an electrical current signal created by the electron beam to a voltage signal, wherein the number of diodes includes a diode stack of multiple diodes. The method further includes extracting, with a digital inverter, a test signal from the voltage signal.

Abstract: According to an exemplary embodiment, a method of detecting edge cracks in a die under test is provided. The method includes the following operations: receiving a command signal; providing power from the command signal; providing a response signal based on the command signal; and self-destructing based on the command signal.

Abstract: A test apparatus for generating reference scan chain test data comprises a test pattern generator and an output data modifier. The test pattern generator modifies a scan chain test input bit sequence by replacing a predefined number of start bits of the scan chain test input bit sequence by a predefined start bit sequence. Further, the test pattern generator provides the modified scan chain test input bit sequence to a device under test. The output data modifier modifies a scan chain test output bit sequence received from the device under test and caused by the modified scan chain test input bit sequence. The scan chain test output bit sequence is modified by replacing a predefined number of end bits of the scan chain test output bit sequence by a predefined end bit sequence to obtain the reference scan chain test data.

Abstract: A test pattern generation apparatus includes an input unit, an output unit, and a pattern generating unit configured to, when a source code based on a system description language is created through the input unit, store an execution file created from the source code, generate a test pattern from the execution file according to an external command for testing a semiconductor apparatus as a DUT, and output the generated test pattern through the output unit.

Abstract: An embodiment provides a circuit for testing an integrated circuit. The circuit includes an input converter that receives N scan inputs and generates M pseudo scan inputs, where M and N are integers. A scan compression architecture is coupled to the input converter and generates P pseudo scan outputs in response to the M pseudo scan inputs. An output converter is coupled to the scan compression architecture and generates Q scan outputs in response to the P pseudo scan outputs, wherein P and Q are integers. The input converter receives the N scan inputs at a first frequency and generates the M pseudo scan inputs at a second frequency and the output converter receives the P pseudo scan outputs at the second frequency and generates the Q scan outputs at the first frequency.

Abstract: An integrated circuit includes combinational logic with flip-flops, parallel scan paths with a scan input for receiving test stimulus data to be applied to the combinational logic, combinational connections with the combinational logic for applying stimulus data to the combinational logic and receiving response data from the combinational logic, a scan output for transmitting test response data obtained from the combinational logic, and control inputs having an enable input and a select input for operating the parallel scan paths, each scan path includes flip-flops of the combinational logic that, in a test mode, are connected in series, compare circuitry indicates the result of a comparison of the received test response data and the expected data at a fail flag output, and one of the scan paths includes a scan cell having an input coupled to the fail flag output.