Abstract: Provided herein are assay control materials comprising stable analytes and lyophilized unstable analytes, and methods of making and using the same.

Abstract: An automated system is provided for performing slide processing operations on slides bearing biological samples. In one embodiment, the disclosed system includes a slide tray holding a plurality of slides in a substantially horizontal position and a workstation that receives the slide tray. In a particular embodiment, a workstation delivers a reagent to slide surfaces without substantial transfer of reagent (and reagent borne contaminants such as dislodged cells) from one slide to another. A method for automated processing of slides also is provided.

Abstract: A substrate for sample analysis has a rotation axis, a first chamber having a first space for retaining a liquid, a second chamber having a second space for retaining the liquid to be discharged from the first chamber, and a first channel having a path connecting the first chamber and the second chamber. The first space includes a first portion and a second portion, and a coupling portion located between the first and second portions. The substrate includes a wall portion partitioning the first and second portions from each other. The second chamber is more distant from the rotation axis than is the first portion. The coupling portion is closer to the rotation axis than is the wall portion. The second portion at least includes a portion which is more distant from the rotation axis than is the first portion.

Abstract: A substrate for sample analysis on which transfer of a liquid is to occur with rotational motion includes: a substrate having a rotation axis; a first chamber being located in the substrate and having a first space for retaining a liquid and magnetic particles; a second chamber being located in the substrate and having a second space for retaining the liquid to be discharged from the first chamber; a channel being located in the substrate and having a path connecting the first chamber and the second chamber; and a magnet being located in the substrate and near the first space in the substrate for capturing the magnetic particles in the first chamber.

Abstract: An automatic analytical apparatus includes a reaction container for mixing a sample with a reagent to react the sample to the reagent, a measurement unit that irradiates a reaction solution in the reaction container with light and measures the intensity of transmitted light or scattered light, a control unit that processes time-series light intensity data obtained through the measurement in the measurement unit, a storage unit that stores one or more approximation functions each approximating to a time-series change in the light intensity data, and an output unit that outputs a processing result of the control unit.

Abstract: A laboratory sample distribution system and a laboratory automation system comprising such a laboratory sample distribution system are presented. The laboratory sample distribution system comprises a number of sample container carriers adapted to move autonomously and to communicate with each other and with a central control unit.

Abstract: An object moving device includes: a first drive mechanism configured to move a head unit in a first direction and in a second direction; a second drive mechanism configured to move an illumination unit in the first direction; and a third drive mechanism configured to move a camera unit in the first direction. A control unit controls the first drive mechanism to move the head unit on a first path. The control unit controls the second and third drive mechanisms to move the illumination unit and the camera unit on the first path between the first container and the second container. When the head unit and the illumination unit interfere with each other on the first path, the control unit implements control such that the head unit moves in the second direction and the head units moves in the first direction on a second path parallel to the first path.

Abstract: A laboratory sample distribution system is presented. The system comprises sample container carriers carrying a sample container and comprising a magnetically active device. The system also comprises a transport plane supporting the sample container carriers and comprises drive modules comprising first line shaped conductors extending in a first direction and arranged parallel to each other and second line shaped conductors extending in a second direction and arranged parallel to each other. The system comprises a driver electrically connected to each of the first and second conductors of the drive modules. The driver selectively applies a drive current and/or voltage to the first and second conductors such that a conductor current results in the conductors driven by the drive current and/or voltage. The conductor current selectively causes a drive force to the sample container carriers such that the sample container carriers move along individual transport paths on the transport plane.

Abstract: A sample container carrier for a laboratory sample distribution system having a cover above a magnet in order to suitably align magnetic field lines is presented. A laboratory sample distribution system having such a sample container carrier and to a laboratory automation system containing such a laboratory sample distribution system are also presented.

Abstract: A system for analysis of biopsy samples includes a tissue sample transport mechanism linking a biopsy sample excision tool to a tissue sample holder disposed in a staging area of an analysis unit. The tissue sample is automatically transported from the excision tool to the specimen holder, where the tissue sample is analyzed in the staging area of the analysis unit. The transport mechanism may include tubing and a vacuum source. The tissue sample holder may be configured to slow or temporarily stop a tissue sample for individual analysis, or collect multiple tissue samples for analysis as a group. A tissue sample sorting mechanism may be employed that allows separation of specimens that can be correlated to the analysis.

Abstract: A liquid sample loader for an analytical instrument includes a sample holder with a sample well for holding a liquid sample and a sample passageway extending upwardly at an inclined angle from a bottom portion of the well, a pump positioned upstream from the sample holder and an upstream passageway coupled between the sample and the pump. A controller controls the pump to push the sample in the sample well downstream through the sample passageway toward the measuring instrument.

Abstract: An method is offered which can clean the nozzles of a reaction cuvette wash unit. A first detergent is put in first reagent containers located on a first reagent turntable. A computer controller drives a first reagent pipette to aspirate the detergent from the first reagent containers and to deliver the detergent into reaction cuvettes. The controller drives a reaction turntable to bring each reaction cuvette holding the detergent therein to the reaction cuvette wash unit. The controller drives the reaction cuvette wash unit to aspirate the detergent from inside the reaction cuvettes using reaction cuvette wash nozzles to thereby clean the wash nozzles. A second detergent is then used to clean the nozzles.

Abstract: A pipetting device (100) for an apparatus (164) for processing a sample or reagent is disclosed. The pipetting device (100) comprises a coupling mechanism (102), wherein the coupling mechanism (102) comprises at least a first coupling unit (104) adapted to be coupled to a first pipetting tip and a second coupling unit (106) adapted to be coupled to a second pipetting tip, and a tilt mechanism (112) for moving the first coupling unit (104) between an untilted position, in which the first coupling unit (104) and the second coupling unit (106) are arranged parallel to one another, and a tilted position, in which the first coupling unit (104) is tilted relative to the second coupling unit (106).

Abstract: A head device for mounting a dispensing tip includes a piston member, a first shaft member to move the piston member in an up-down direction, a tubular rod including a tubular space having a cylinder space in which the piston member is housed to move in the up-down direction and including a tip mounting portion into which a base end portion of the dispensing tip is fitted, a first frame equipped with the first shaft member and the tubular rod, a second shaft member engaging with the first frame to move the first frame, a second frame equipped with the second shaft member and including a guide portion configured to guide movement of the tubular rod in the up-down direction in association with the movement of the first frame in the up-down direction, and a shaft controller configured to control operation of the first and second shaft members.

Abstract: A sampling system is provided. The sampling system includes a housing. Mounted to the housing is a Hall effect sensor. A probe configured to contact a sample is inserted into the housing. The probe includes an elongated portion and a restorative spring inserted onto the elongated portion of the probe. The restorative spring provides sufficient restorative force to return the probe to a relaxed position. The Hall effect sensor is configured to sense a field strength generated by the proximity of the restorative spring of the probe in the extended position.

Abstract: A method is provided for disposing of a liquid within an automated analytical system for processing a fluid biological sample, wherein a contamination prevention shield including channels for pipets or pipet tips is reversibly docked to a container for liquid waste in order to reduce the risk of cross-contamination. A tip rack assembly is provided for processing a fluid sample, the assembly including a rack for pipet tips and the contamination prevention shield. An analytical system is provided using the tip rack assembly, wherein cross-contamination is avoided.

Abstract: The invention relates generally to the field of automated collection and deposition of fluid, semi-solid, and solid samples of biological or chemical materials. More specifically, the invention relates to the field of microarrayers, which are devices for autonomously depositing minute droplets of biological or chemical fluid samples in ordered arrays onto substrates. The invention also relates to tissue arrayers, which are devices for the collection and deposition of solid and semi-solid tissue samples in ordered arrays. Other aspects of the invention relate to fluidics robots, which are devices for the autonomous collection, dispensing and processing of biological or chemical fluid samples. The invention improves the throughput of microarrayers, tissue arrayers, and fluidics robots by providing methods and apparatuses to precisely and repeatably load supplies into the machines.

Abstract: The automated sampling system has a water tight case that encloses a testing instrument. In the preferred embodiment, the testing instrument is a field-portable ion chromatography instrument designed to test water samples. In operation, a controller directs a syringe pump to draw fluid from outside the system through a specialized filter with a continuous flow lower reservoir. When directed by the controller, the syringe pump then injects the sample water into a testing portion of the field-portable ion chromatography instrument.

Abstract: A method for particle velocity measurement may include transmitting an optical beam from an optical source, splitting the optical beam into a first beam and a second beam where the first beam and the second beam each have different polarizations, directing the first beam and the second beam toward an object, and determining a velocity of the object based on receiving the first and second beams reflected from the object.

Abstract: Systems and methods for detecting wheel speed are provided. An electric circuit for detecting a speed of a wheel may comprise: a transducer in electronic communication with an operational amplifier (OP-AMP), the transducer configured to output a variable signal in response to an angular velocity of a rotatable member of a wheel assembly; a constant voltage source in electronic communication with the OP-AMP; and a sensor in electronic communication with an output terminal of the OP-AMP configured to monitor an output signal of the OP-AMP, the output signal including a period; and a controller configured to receive the output signal and configured to calculate the speed of the wheel according to a pre-determined ratio of the wheel speed and the period. In various embodiments, the circuit may allow for slow wheel speed detection.

Abstract: Apparatus and techniques presented combine the features and benefits of amplitude modulated (AM) atomic force microscopy (AFM), sometimes called AC mode AFM, with frequency modulated (FM) AFM. In AM-FM imaging, the topographic feedback from the first resonant drive frequency operates in AM mode while the phase feedback from second resonant drive frequency operates in FM mode. In particular the first or second frequency may be used to measure the loss tangent, a dimensionless parameter which measures the ratio of energy dissipated to energy stored in a cycle of deformation.

Abstract: The invention is directed at a method of performing scanning probe microscopy on a substrate surface using a scanning probe microscopy system, the system including at least one probe head, the probe head comprising a probe tip arranged on a cantilever and a tip position detector for determining a position of the probe tip along a z-direction transverse to an image plane, the method comprising: positioning the at least one probe head relative to the substrate surface; moving the probe tip and the substrate surface relative to each other in one or more directions parallel to the image plane for scanning of the substrate surface with the probe tip; and determining the position of the probe tip with the tip position detector during said scanning for mapping nanostructures on the substrate surface; wherein said step of positioning is performed by placing the at least one probe head on a static carrier surface.

Abstract: A scanning probe microscope includes sample moving means 111 and 133 including a cylindrical piezoelectric scanner and configured to move a sample 110 arranged on an upper end surface of the piezoelectric scanner by bending the piezoelectric scanner 111 by an applied voltage, scanning control means configured to control a relative position of the probe 114 and the sample 110 by controlling the applied voltage, sample thickness acquisition means 138 configured to acquire a thickness value of the sample 110, and correlative information determination means 139 configured to determine correlative information showing a corresponding relationship between the applied voltage to the piezoelectric scanner 111 and a displacement amount of a surface of the sample 110 in a horizontal direction using the thickness value, wherein the scanning control means 132 performs controlling of the relative position using the correlative information.

Abstract: The disclosure describes a novel method and apparatus for improving silicon interposers to include test circuitry for testing stacked die mounted on the interposer. The improvement allows for the stacked die to be selectively tested by an external tester or by the test circuitry included in the interposer.

Abstract: Pulsed current circuitry for electromigration testing of semiconductor integrated circuits and components. The circuit includes a multiplexer that outputs analog voltage pulses, and is capable of generating both bipolar and unipolar voltage pulses. At least one operational amplifier and resistor receive the voltage pulses from the multiplexer and convert the voltage pulses to current pulses. A charge booster circuit is provided for minimizing overshoots and undershoots during transitions between current levels in the test circuit.

Abstract: Pulsed current circuitry for electromigration testing of semiconductor integrated circuits and components. The circuit includes a multiplexer that outputs analog voltage pulses, and is capable of generating both bipolar and unipolar voltage pulses. At least one operational amplifier and resistor receive the voltage pulses from the multiplexer and convert the voltage pulses to current pulses. A charge booster circuit is provided for minimizing overshoots and undershoots during transitions between current levels in the test circuit.

Abstract: A sensor for inductively measuring the current in a conductor flowing through a recess in a printed circuit board. Wire loops on the printed circuit board function as the inductive current sensor. Combined with a voltage measurement, the energy being dissipated in the conductor's load circuit can be determined and transmitted wirelessly. Control circuits can be integrated with the metering hardware to enable the remote modulation of the load's power. The inductive sensor(s) can be used to track differences between the load's supply and return currents. If a fault is detected, the circuit can be broken for safety, serving a ground fault circuit interruption (GFCI) purpose.

Abstract: The purpose of the present invention is to provide a current detection device which is less susceptible to a disturbance magnetic flux and does not easily cause the decrease of a detectable maximum current. A current detection device is provided with: a first magnetic shield member which has a side wall part that covers one side of a conductor and a protruding part that protrudes toward the other side from the side wall part; and a second magnetic shield member which has a side wall part that covers the other side of the conductor and a protruding part that protrudes toward the one side from the side wall part, and the protruding part of the first magnetic shield member and the protruding part of the second magnetic shield member form a gap therebetween while overlapping each other in the protruding direction of the protruding parts.

Abstract: A semiconductor device includes a period defining block suitable for generating a period defining signal corresponding to a predetermined test time period based on a test mode signal and one or more command signals; and a monitoring block suitable for generating a monitoring signal corresponding to an oscillation signal during the test time period based on the period defining signal.

Abstract: A system and corresponding method, in order to determine in a real-time manner the power of a plurality of decentralized technical units, which—are spatially distributed in order to generate and/or store and/or consume electrical energy and which—are connected to a power supply network in order to feed in and/or draw electrical energy and which—are connected to a control center by means of a communication connection in order to control the operation of the technical units, is characterized by—a data memory in the control center, which data memory is designed store a power value or a plurality of different power values for each of the technical units, and by—a trigger signal transmitter for each of the technical units, which is designed, in the case of each state change of the technical unit in question between the power value and zero or between the power value and another of the power values, to send a trigger signal, which signals the state change, to the control center, and by—a computer in the control cen

Abstract: A sensor device receives energy usage data from a standby power controller, and transmits the energy usage data to a remote monitoring entity (e.g., a utility) via a communications device. The energy usage data may include appliance energy usage data representing energy drawn through the standby power controller, and/or household energy usage data representing energy usage measured by an electricity meter. The energy usage data is transmitted to the communications device via wireless communications such as Bluetooth or Wi-Fi, whereas the communications device transmits the energy usage data to the remote monitoring entity via the internet. Household energy usage is transmitted from the electricity meter to the sensor device via a low-data, high-latency protocol such as ZigBee.

Abstract: A sensor circuit incorporates an analogue to digital converter for providing a digital signal derived from sensing elements connected in a bridge configuration. The sensor circuit comprises first and second paths comprising respective first and second sensing elements connected between first and second supply lines; an analogue to digital converter having a differential input connected to receive a differential voltage signal (Vinp-Vinn) between the first and second sensing elements and an output for providing a digital output signal (Dout) representing a difference between the first and second sensing elements, the analogue to digital converter comprising: current sources connected between the first and second supply lines, each current source being switchably connected to either the first or second sensing elements; and control logic configured to selectively switch current from each of the current sources to either the first path or the second path in dependence on the differential voltage signal.

Abstract: There is provided a dielectric constant analyzer device adapted to determine a dielectric property associated with a substrate material by measuring transmission and reflection parameters for a transmission line connected to said substrate material over a specified frequency range; determining a transmission phase response based on the transmission and reflection parameters; determining an anomalous phase slope characterized by a double slope reversals based on the transmission phase response; determining a resonance frequency based on a centre point of the anomalous phase slope reversals, where the center point corresponds to an anomalous phase at the resonance frequency; and determining the dielectric constant based on the resonance frequency, the anomalous phase at the resonance frequency and the anomalous phase slope. There is also provided a method and a microcomputer for doing the same.

Abstract: Systems and methods for analyzing a characteristic of a transmitter, a receiver, or a propagation channel are disclosed. At least one receiver signal resulting from at least one transmitter signal that has propagated through a propagation channel can be obtained. A first signal pair can be formed from a first receiver signal and a first transmitter signal, or from first and second receiver signals obtained from spatially-separated receiver antennas, or from first and second receiver signals which are attributable to different transmitter signals. Amplitude and phase information of a plurality of frequency components for each signal in the first signal pair can be determined. A set of comparison values for the first signal pair can be determined by comparing respective frequency component phases or respective frequency component amplitudes. A characteristic of the set of comparison values can then be analyzed.

Abstract: An embodiment of the invention provides an apparatus for detecting electrostatic discharges (ESD) events, comprising: an ESD detector configured to determine at least one process window that will permit the ESD detector to detect an ESD event; at least one antenna coupled to said ESD detector; and said ESD detector calibrated for at least one discharge energy. Another embodiment of the invention provides: a method for detecting electrostatic discharges (ESD) events, comprising: determining at least one process window that will permit an ESD detector to detect an ESD event; and calibrating the ESD detector for at least one discharge energy.

Abstract: A system for monitoring a pantograph of a railway vehicle, the pantograph being adapted to be connected to a catenary and electrically connected to a traction unit, the catenary being adapted to provide an alternating current to the railway vehicle, the system further including: a voltage step detection device for detecting a voltage step of a pantograph voltage at the pantograph, a zero crossing detection device for detecting a zero crossing of a line current, the line current being a portion of a pantograph current provided to the traction unit, the pantograph current being the current flowing through the pantograph; and a bouncing detection portion adapted to determine at least one bouncing time of the pantograph based on one or more detected voltage steps of the voltage step detection device and/or one or more detected zero crossings of the zero crossing detection device.

Abstract: The present disclosure relates to a short-circuit sensor for detecting a short-circuit current in an electrical line. The short-circuit sensor includes an integrator, a coupling device, and a detection device. The coupling device is configured to inductively couple the integrator to the electrical line and to supply an induced signal to the integrator. The integrator is configured to integrate the induced signal to obtain an integrated signal. The detection device is configured to compare an amplitude value of the integrated signal with a prescribed threshold value and to detect the short-circuit current if the amplitude value of the integrated signal exceeds the prescribed threshold value.

Abstract: A failure inspection system includes a main circuit section, an electrically conductive member, capacitors, a signal generating section, a measurement section and a judgement section. The signal generating section generates a high-frequency AC signal and a low-frequency AC signal. The judgement section determines whether either one of two types of failure has occurred based on the voltage or the current of the high-frequency AC signal. If it is determined that a failure is occurring, the judgment section specifies that which of failures, a leakage current failure or a short-circuit failure, the failure that has occurred is, based on a measurement value of the low-frequency AC signal derived from the measurement section.

Abstract: Power conversion systems, disclosed examples include power conversion systems, ground fault detection apparatus and methods to detect and identify ground faults in a power conversion system using AC coupling to sense a system voltage to determine a leakage flux linkage, and to identify a faulted converter phase based on a phase shift angle of the leakage flux linkage.

Abstract: Power conversion systems, disclosed examples include power conversion systems, ground fault detection apparatus and methods to detect and identify ground faults in a power conversion system using AC coupling to sense a system voltage to determine a leakage flux linkage, and to identify a faulted converter phase based on a phase shift angle of the leakage flux linkage.

Abstract: A system can include a memory that can store a fuse load database including a list of fuses, a list of loads each designed to be coupled to at least one fuse from the list of fuses and a list of current values each corresponding to a load from the list of loads. The system can also include an input device configured to receive a selection of a fuse from the list of fuses. The system can also include a modeling processor coupled to the memory and the input device. The modeling processor can determine one or more loads from the list of loads that are designed to be coupled to the selected fuse. The modeling processor can also generate load summary data corresponding to a sum of the current values that correspond to the one or more loads.

Abstract: The present disclosure relates to calculating a fault location in an electric power transmission system based on traveling waves. In one embodiment, a system consistent with the present disclosure may be configured to detect a fault in an electric power transmission system. The system may include a traveling wave detection subsystem configured to detect and measure traveling waves on a transmission line and a fault location estimation subsystem. The fault location estimation subsystem may receive from the traveling wave detection subsystem a first plurality of traveling waves on the transmission line generated during a reference event. The fault location estimation subsystem may receive from the traveling wave detection subsystem a second plurality of traveling waves generated during an unplanned event. An unmatched traveling wave in the second plurality of waves may be detected and a location of the unplanned event based on the unmatched traveling wave.

Abstract: A circuit for inspecting a semiconductor device includes: the semiconductor device that is an object to be inspected and includes a diode; a protection element that is connected in series with the semiconductor device and includes a protection diode having higher breakdown resistance than the diode; a switch that includes a switching element connected in series with the semiconductor device and the protection element; and a coil that provides a loop path together with the semiconductor device and the protection element when the switching element is turned off. Even when the semiconductor device including the diode is broken, an inspection device is restricted from being damaged.

Abstract: The invention relates to a diagnosis apparatus for detecting a defect of at least one of a plurality of light emitting diodes which are interconnected to form a light emitting diode series connecting a first supply terminal to a second supply terminal. The defect is intended to be detected with little wiring outlay. The invention provides that a resistance element is connected in parallel with each light emitting diode and a measuring device is configured to generate a diagnosis current between the two supply terminals in a luminous pause, during which none of the light emitting diodes emit light, said diagnosis current giving rise, at each resistance element, to a voltage lower than a forward voltage, starting from which the light emitting diode respectively connected in parallel emits light, and to provide a voltage value of a diagnosis voltage dropped between the supply terminals.

Abstract: A parallel concurrent test (PCT) system is provided for performing the parallel concurrent testing of semiconductor devices. The PCT system includes a pick and place (PnP) handler for engaging and transporting the semiconductor devices along a testing plane, the PnP handler including at least one manipulator. The PCT system also includes a device under test interface board (DIB), the DIB including a broadside test socket for broadside (BS) testing of the semiconductor devices, the broadside testing using at least half of a total number of a semiconductor device pins, and a plurality of design-for-test (DFT) test sockets for DFT testing, the DFT testing using less than half of the total number of the semiconductor device pins, and a tester in electrical contact with the DIB for testing the semiconductor devices in accordance with a stepping pattern test protocol.

Abstract: An IC test device includes a test circuit board and a test fixture. The fixture includes an interposer, a test socket, and a fastener. A protrusion is formed at a bottom face of the interposer, and a space is formed besides the protrusion. A plurality of first contacts is formed at the bottom of the protrusion for soldering with corresponding pads of the test circuit board. A plurality of second contacts is formed on a top face of the interposer and electrically connected to the first contacts. The socket defines a guide groove for receiving an IC. A plurality of conductors are arranged corresponding to the guide groove and extend through the test socket. Each conductor has a bottom end electrically connected to one corresponding second contact and a top end for contacting a pin of the IC. The fastener is mounted on the test socket to press the IC.

Abstract: In one embodiment, the present invention includes an interface apparatus for semiconductor testing. The interface apparatus comprises a housing substrate and two product substrates. The first product substrate has a first micro-scale conductive pattern and is situated within a first opening of the housing substrate. The second product substrate has a second micro-scale conductive pattern and is situated within a second opening of the housing substrate. The first and the second micro-scale conductive patterns are aligned to a conductive semiconductor wafer pattern using a continuous translucent media having targets corresponding to the conductive semiconductor wafer pattern.

Abstract: Systems, methods, and computer readable media to improve integrated circuit (IC) debug operations are described. In general, techniques are disclosed for acquiring/recording waveforms across an under-test IC during a single sweep of a laser scanning microscope (LSM). More particularly, techniques disclosed herein permit the acquisition of an integrated circuit's response to a test signal at each location across the IC in real-time. In practice the test signal consists of a stimulus portion that repeats after a given period. In one embodiment, the IC's response to multiple complete stimulus portions may be averaged and digitized. In another embodiment, the IC's response to multiple partial stimulus portions may be averaged and digitized. As used herein, the former approach is referred to as waveform mapping, the latter as gated-LVI.

Abstract: Methods and systems for localizing and resolving an integrated circuit include selecting one or more electrical stimuli to be applied to a device under test such that the electrical stimuli provide a baseline image and a distinguishing image effect when applied to the device under test. The one or more electrical stimuli are applied to the device under test. Emissions from the device under test are measured to provide a measurement data set and to collect the baseline image and the distinguishing image effect. The measurement includes dividing a field of view in a photon emission image into regions of interest. The measurement data set is analyzed to localize and evaluate circuit structures by comparing the baseline image and the distinguishing image effect. The analysis includes calculating a figure of merit for each region of interest that represents a degree of switching activity in the respective region of interest.

Abstract: Testing an integrated circuit (IC) that has a set of nominally similar cores and pairs of test data input (TDI) and test data output (TDO) pads common to the different cores. Similar scan chains in parallel in the different cores provide response signals as functions of corresponding TDI signals. Respective combined TDO signals are provided to the TDO pads. In the absence of a defect, the combined TDO signals are asserted and de-asserted like the response signals from corresponding chains in the different cores and like corresponding expected response signals. The combined TDO signals are different from the corresponding expected response signals in the presence of a defect in at least one of the cores. If the result is a fail, the ATE may identify a defective core using a diagnosis module in the IC providing response signals from a selected core.