Abstract: A microfluidic diagnostic chip may comprise a substrate, a plurality of fluidic slots extending through the substrate, a plurality of microfluidic channels each coupled to a respective one of the plurality of fluidic slots to receive a plurality of fluids from the plurality of fluidic slots, and a mixing region in fluid communication with the plurality of fluidic slots to receive the plurality of fluids such that the plurality of fluids are to mix. A diagnostic chip may comprise a number of fluid slots defined through a substrate and a plurality of microfluidic channels coupled to the fluid slots to receive from the fluid slots a plurality of different fluids wherein the microfluidic channels combine and mix the plurality of different fluids.

Abstract: A sensor housing for a wheel-sensor device for a vehicle includes a first receiving aperture, a second receiving aperture, a first rotational-speed sensor, a rotary transducer, and a second rotational-speed sensor. The first sensor is configured to be inserted into the first aperture, and the sensor housing with the inserted first sensor is configured to be mounted on the vehicle. The rotary transducer is configured to co-rotate with a vehicle wheel and to trigger a change in a first physical quantity. The second sensor is configured to be inserted adjacent to the first sensor in the first aperture or in the second aperture, and the sensor housing, with the inserted first and second sensors, is configured to be mounted on the vehicle. The rotary transducer co-rotating with the rotating wheel triggers the change in the first physical quantity and a change in a second physical quantity.

Abstract: An impulse ring centered on a central axis, for a sensor-bearing unit including a bearing is provided. The impulse ring includes a magnetized target that generates a magnetic fields adapted to be sensed by a sensor, and an annular target holder. The target holder provides an inner axial tubular portion adapted to be fixed to a rotatable inner ring of the bearing, an outer axial tubular portion holding the magnetized target that is positioned radially beyond an outer ring of bearing, and an intermediate portion that radially extends between the inner axial tubular portion and outer axial tubular portion. The intermediate portion provides a radial part, an inclined part and a plurality of stiffening ribs.

Abstract: A turbocharger rotation detector includes an oscillator circuit that includes a coil generating a magnetic field inducing an eddy current in blades of a compressor wheel and outputs as a detection signal an AC signal having an amplitude varying with approach and recession of the blades, a first detector circuit for detecting, of the detection signal, a signal component of a positive voltage higher than a reference potential, a second detector circuit for detecting, of the detection signal, a signal component of a negative voltage lower than the reference potential, a first interrupter circuit that, of an output signal of the first detector circuit, interrupts a DC component, a second interrupter circuit that, of an output signal of the second detector circuit, interrupts a DC component, and a differential amplifier circuit to which the signals passing through the first and second interrupter circuits are input.

Abstract: A method for manufacturing a semiconductor device includes: preparing a first substrate; forming a metal film having a Ti layer as the most outermost surface on one surface of the first substrate a metal film having a Ti layer as the outermost surface; patterning the metal film to form a first pad portion; preparing a second substrate; forming on one surface of the second substrate a metal film having a Ti layer as the outermost surface; patterning the metal film to form a second pad portion; vacuum annealing the first substrate and the second substrate to remove an oxide film formed on the Ti layer in the first pad portion and the second pad portion; and bonding the first pad portion and the second pad portion together.

Abstract: The invention relates to an acceleration sensor (100) having a sensor material (120) which is mounted by means of spring elements (130) so as to be movable along a movement axis (x) over a substrate (110), first trim electrodes (140) which are connected to the sensor material (120), and second trim electrodes (150) which are connected to the substrate (110) and are associated with the first trim electrodes (140). When the sensor material is deflected along the movement axis, a spring force acting on the sensor material (120) is generated by the spring elements (130), and when the sensor material (120) is deflected, au electrostatic three acting on the sensor material (120), which counteracts the spring force, is generated by application of an electrical trim voltage between the first trim electrodes (140) and the second trim elements (150).

Abstract: A scanning probe microscope includes a tip. A quantum dot is applied to the tip.

Abstract: A temperature-controlled module for electronic devices and a testing apparatus provided with the same mainly include a temperature-controlled tray, an upper board and a dry-air supply device. The temperature-controlled tray includes holding cavities for accommodating electronic devices and a fluid chamber for cooling fluid. The upper board is furnished with through holes, while the upper board and the temperature-controlled tray are spaced by a predetermined distance. The dry-air supply device provides dry air to a space between the temperature-controlled tray and the upper board. Thereupon, by having cooling fluid to flow inside the temperature-controlled tray, the temperature-controlled tray can be kept in a lower predetermined temperature so as to rapidly cool down the electronic device. In addition, by providing the upper board and the dry-air supply device to allow dry air to flow through the surface of the electronic device, then the water-condensation phenomenon and air leakage can avoided.

Abstract: A method of making a cantilever MEMS probe module includes the steps of forming a cantilever MEMS probe on a first surface of a circuit substrate by a MEMS fabrication process in a way that the cantilever MEMS probe has a support post electrically and mechanically connected with an electric contact of the first surface, a cantilever arm connected with the support post, and a needle connected with the cantilever arm, and forming a through hole penetrating through the first surface and a second surface opposite to the first surface of the circuit substrate and corresponding in position to the needle and a part of the cantilever arm by using a cutting tool to cut the circuit substrate from the second surface toward the first surface of the circuit substrate. A probe module made by the method is disclosed too.

Abstract: The embodiments of the present disclosure provide an apparatus, system and method for testing electrical functions. The apparatus for testing electrical functions comprises: at least one clamping tool configured to be capable of being clamped in the vicinity of at least one bonding area of an electronic device; at least one row of probes configured to be electrically connected to multiple pins in the at least one bonding area respectively when the at least one clamping tool is clamped; and at least one multiplex switch. Each multiplex switch has a first terminal comprising multiple ports, and a second terminal comprising at least one port and capable of being connected to a measurement instrument, and the at least one multiplex switch is configured to turn on or turn off an electrical connection between the multiple ports of the first terminal and at least one port of the second terminal.

Abstract: A probe apparatus has probe wires with a contact pattern on one side. The contact pattern is for contacting a respective contact pattern on another test equipment or component, such as a circuit board. The probe wires have tips that probe a device desired for testing. Signals are transmitted through the probe wires from the probe card, for example, through a circuit board to other diagnostic equipment. The contact of the probe card with the circuit board allows signals to be transferred through the probe wires to the other diagnostic equipment. On another side of the probe card is a connector structure. The connector structure includes a retainer that can allow the probe card to be replaced from a test system, such as allowing it to be connected and disconnected from a holder.

Abstract: It is described a contact probe for a testing head for a testing apparatus of electronic devices, the probe comprising a probe body extended in a longitudinal direction between respective end portions adapted to contact respective contact pads, the second end being a contact tip adapted to abut onto a contact pad of the device under test, the body of each contact probe having a length of less than 5000 ?m, and including at least one pass-through opening extending along its longitudinal dimension. Conveniently, the at least one pass-through opening is filled by a filling material, in order to define at least one first and one second lateral portions in the body, being parallel and joined to each other by a connecting central portion realized by the filling material at the pass-through opening, the connecting central portion made of the filling material acting as a strengthening element.

Abstract: A probe card for a testing apparatus of electronic devices comprises at least one testing head housing a plurality of contact probes, each contact probe having at least one contact tip abutting onto contact pads of a device under test, as well as at least one space transformer realizing a spatial transformation of the distances between contact pads made on its opposite sides and connected by means of suitable conductive tracks or planes, as well as a plurality of filtering capacitors provided between the space transformer and a PCB, which comprises direct conductive tracks or planes contacting conductive portions of the filtering capacitors.

Abstract: The invention relates to a coupling for electrically and mechanically connecting medium-voltage or high-voltage components, in particular for voltages of 1 kV to 52 kV, comprising a first connecting piece for mechanically and electrically connecting a medium-voltage or high-voltage component, in particular for connecting to a complementary connecting piece of a bushing of a switchgear cabinet, and a second connecting piece for mechanically and electrically connecting another medium-voltage or high-voltage component, in particular for connecting to a complementary connecting piece of an electrical cable, wherein the two connecting pieces of the coupling belong to complementary connection types, which fit together mechanically, and comprising a low-resistance current sensing resistor, which is built into the coupling and electrically connected between the first connecting piece and the second connecting piece in order to measure a current flow between the first connecting piece and the second connecting piece.

Abstract: A small wire is wound several times around a powdered metal toroidal core to sense voltage produce by single polarity current flowing through a larger wire passing through the toroid. An integrator circuit integrates the voltage in the small wire to produce an output voltage as a measure of AC and DC components of the single polarity current, such as a full wave rectified current.

Abstract: To accurately detect the presence or absence of a signal. A signal detector includes an input-signal amplifying circuit, a reference-signal amplifying circuit, and a comparator. In the signal detector, the input-signal amplifying circuit amplifies an input signal with a predetermined gain. The reference-signal amplifying circuit amplifies a reference signal at a constant signal-level with a gain that substantially matches the predetermined gain. The comparator compares a signal level of the amplified input signal with a signal level of the amplified reference signal, and outputs the comparison result as a detection signal.

Abstract: A sample and hold circuit takes a sample of the current flowing through an inductor of a buck switched-mode power supply (SMPS) at substantially the middle of the low side portion (50 percent point during low side switch ON) of the pulse width modulation (PWM) period. This sample of the current through the SMPS inductor during the low side ON 50% point may be considered as the “average” or “DC output” current of the SMPS, and taken every time at precisely the same low side ON 50%. A constant current source and sink are used to charge and discharge a timing capacitor whose voltage charge is monitored by a high speed voltage comparator to provide precise sample timing.

Abstract: A system for determining a voltage out-of-range high condition of a battery module is provided. A microcontroller determines first, second, and third voltage values from first, second, and third voltage sensors, respectively, coupled to first, second, and third battery cells, respectively; and determines a battery module voltage value based on a fourth signal. The microcontroller sums the first, second, and third voltage values to obtain a battery module high voltage sum value. The microcontroller generates a first control signal to induce a contactor to transition to an open operational position to electrically decouple the battery module from an electrical load, if a difference between the battery module high voltage sum value and the battery module voltage value is greater than or equal to a battery module voltage out-of-range high error value.

Abstract: The power supply determining part determines whether there is a power supplied from outside of the vehicle to the battery at start-up of the engine. The alarming part alarms to prompt a driver to manually operate the automatic stop control part when it is determined that there is a power supplied from the outside by the power supply determining part.

Abstract: Methods, apparatus, systems and tangible computer readable storage media are disclosed to determine an operational status of a device. Disclosed example apparatus include a first sensor to be positioned a first distance from a wire to measure a first magnetic field associated with the wire, and a second sensor to be positioned a second distance, greater than the first distance, from the wire to measure a second magnetic field, the second distance to reduce detectability of the first magnetic field by the second sensor. Disclosed example apparatus further include a comparator to compare the first magnetic field and the second magnetic field to determine an operational status of the device, and a meter to collect audience measurement data based at least in part on the operational status of the device.

Abstract: A system is provided to analyze cross-modulation distortion in audio devices, which may include testing with audio frequencies. One or more distortion signals from the audio device may be measured for an amplitude, phase, and or frequency modulation effect. In another embodiment a musical signal may be used as a test signal. Providing additional test signals to the audio device can induce a time varying cross-modulation distortion signal from an output of the audio device. Also utilizing at least one additional filter, filter bank, demodulator and or frequency converter and or frequency multiplier provides extra examination of distortion.

Abstract: A measuring carrier for position-resolved meteorological determination of a measurement variable dependent on the dielectric permittivity of a device under test. The measuring carrier has a supporting means comprising a measuring surface, to which the device under test can be applied, and a measuring transmission line which entirely or partially forms the measuring surface and comprises a multiplicity of transmission line cells for the purpose of transmitting a radio-frequency measurement signal which can be injected at the input port. The measuring surface is structured in a cellular manner, wherein each of the transmission line cells has a cell-individual propagation constant with respect to the radio-frequency measurement signal in a state free of a device under test. This constant differs from the respective cell-individual constants of the other transmission line cells.

Abstract: A system and method for measuring noise parameters of a linear device-under-test is provided. The system includes a noise source, an impedance generator, a receiver for measuring noise power of the device-under-test, and a processor and memory. The impedance generator has a plurality of impedance generator settings to generate a plurality of driving-port impedances over a plurality of frequencies. The processor is configured for identifying a plurality of stable driving-port impedances, calculating an aggregate driving-port impedance for each of the stable driving-port impedances, identifying a minimal set of impedance generator settings for a user-selected frequency range, and calculating the noise parameters of the device-under-test based on the noise power measured by the receiver. The minimal set of impedance generator settings provide at least one aggregate driving-port impedance located within each of four linearly independent regions of a Smith Chart over the user-selected frequency range.

Abstract: A system and method of electronic component authentication or component classification can reduce the vulnerability of systems (e.g., satellites, weapons, critical infrastructure, aerospace, automotive, medical systems) to counterfeits. Intrinsic deterministically random property data can be obtained from a set of authentic electronic components, processed, and clustered to create a classifier that can distinguish whether an unknown electronic component is authentic or counterfeit.

Abstract: An apparatus includes an interruption circuit in a power delivery path, and a fault detection circuit configured to provide a fault signal to selectively cause the interruption circuit to interrupt power delivery, wherein the fault detection circuit includes a fault detection integrated circuit and a sensing coil configured to sense a differential current between a phase conductive path and a neutral conductive path in the power delivery path. A processor is configured to selectively control a fault simulation circuit to simulate a fault in the power delivery path, detect a response of the fault detection circuit to the simulated fault, and determine if the response of the fault detection circuit is an expected response. The processor provides an override signal to the interruption circuit to prevent the interruption circuit from receiving a fault signal from the fault detection circuit during, and for a predetermined time after, the simulated fault.

Abstract: To ascertain a parameter of a transformer (40) that has a high voltage side (41) and a low voltage side (43), a test signal generated by a source (13) is impressed on the low voltage side (43). A test response of the transformer (40) is recorded. A leakage reactance and/or a leakage inductance of the transformer (40) is determined by an evaluation device (18) of an apparatus (10) on the basis of the test response of the transformer (40).

Abstract: A capacitor detection system and an active-type pin-diverging module thereof are disclosed. The active-type pin-diverging module is applied to two conductive pins of a capacitor, and active-type pin-diverging module includes a base structure and a swingable structure. The swingable structure is swingably disposed on the base structure, and the swingable structure includes two swingable elements. The two conductive pins of the capacitor respectively pass through two through holes of a seat board, and each conductive pin has a lateral contact surface. The two swingable elements concurrently slidably contact the two lateral contact surfaces of the two conductive pins of the capacitor so as to diverge the two conductive pins of the capacitor, and the seat board is held by the two diverged conductive pins so as to prevent the seat board from being separated from the capacitor.

Abstract: An inspection method for a touch panel control substrate, with which inspection for mounting failure is able to be simply executed, is provided. On the basis of a response that is obtained, in response to a drive signal supplied to a first drive line terminal (101E), in a different drive line terminal (102E, 103E), an electrical connection state between the first drive line terminal (101E) and the drive line terminal (102E, 103E) is detected.

Abstract: An objective of the application is to provide a method for detecting a disturbance in a power system within a digital substation and an apparatus using the same. The method includes: sensing electrical parameters at an end of a transmission line; sampling the sensed electrical parameters; extracting traveling-wave information from high frequency component of the samples using a signal processing method; and if the extracted traveling-wave information indicating occurrence of the disturbance, transmitting the extracted traveling-wave information to an intelligent electronic device of the digital substation from a merging unit or non-conventional instrument transformer of the digital substation. As compared with the amount of the sample data of the sensed electrical parameters, the amount of the data representing the extracted traveling-wave information is reduced.

Abstract: A method for characterizing a fault affecting a cable in which a reference signal s of limited time support is injected and a measurement r of the reflection of the reference signal s in the cable is taken, comprises the following steps: identifying a section of the measurement r corresponding to a fault, this measurement section being called the signature of the fault; generating a modified reference signal s?, of parameterizable amplitude, equal to the sum of the reference signal s and of the reference signal s inverted and delayed by a parameterizable delay; determining conjointly the values of the parameterizable delay and of the parameterizable amplitude that minimize the error between the modified reference signal s? and the signature of the fault; and deducing therefrom an estimation of the length of the fault from the determined value of the delay.

Abstract: A method and a device for inspecting an optoelectronic component are disclosed. In an embodiment, the method includes exciting at least one electromagnetic resonant circuit, formed by the at least one optoelectronic component and the connection board, such that the at least one optoelectronic component emits electromagnetic radiation, wherein exciting the electromagnetic resonant circuit comprises applying an electrical alternating voltage in the electromagnetic resonant circuit by generating a temporally variable electromagnetic alternating field by a first coil and a second coil, wherein the first coil and the second coil are movable with respect to the connection board.

Abstract: The disclosure relates to a device for measuring an electrical characteristic of a substrate comprising a support made of a dielectric material having a bearing surface, the support comprising an electrical test structure having a contact surface flush with the bearing surface of the support, the bearing surface of the support and the contact surface of the electrical test structure being suitable for coming into close contact with a substrate. The measurement device also comprises at least one connection bump contact formed on another surface of the support and electrically linked to the electrical test structure. This disclosure also relates to a system for characterizing a substrate and a method for measuring a characteristic of a substrate employing the measurement device.

Abstract: A semiconductor integrated circuit of the present disclosure includes: first power and second power supply lines that are coupled to a protected circuit; a third power supply line that is supplied with a voltage different from voltages supplied to the first and second power supply lines; a detection circuit that is coupled between the first and second power supply lines and detects a surge occurring in the first power supply line; an inverter circuit that includes one or more inverters coupled in series, and is coupled between the first and second power supply lines; a protection transistor that is coupled between the first and second power supply lines, and is controlled by an output of the detection circuit to cause the surge to flow through the second power supply line; and a time constant circuit that is coupled to at least the third power supply line and the protection transistor.

Abstract: A high volume system level testing of devices with POP structures such as POP memories includes a POP array that includes floating nests that can adjust in the XY direction in order to align individually with respective pads found on the DUTs. The floating nests also include a mechanically fixed PCB that is fixed to the nest and can either mate to a memory contactor array that can accept an unattached POP device such as a memory or can include an attached memory in order to accommodate different POP requirements. In a method, the POP array includes a number of floating nests with memory loaded are aligned and presented to their respective DUTs just prior to testing the combined DUT and POP memory assemblies.

Abstract: A method and circuit for implementing register array repair using Logic Built In Self Test (LBIST), and a design structure on which the subject circuit resides are provided. Register array repair includes identifying and creating a list of any repairable Register Arrays (RAs) that effect an LBIST fail result. Next a repair solution is detected for each of the repairable Register Arrays (RAs) isolating a failing location for the detected repair solution for each array.

Abstract: A process and apparatus provide a JTAG TAP controller (302) to access a JTAG TAP domain (106) of a device using a reduced pin count, high speed DDR interface (202). The access is accomplished by combining the separate TDI and TMS signals from the TAP controller into a single signal and communicating the TDI and TMS signals of the single signal on the rising and falling edges of the TCK driving the DDR interface. The TAP domain may be coupled to the TAP controller in a point to point fashion or in an addressable bus fashion. The access to the TAP domain may be used for JTAG based device testing, debugging, programming, or other type of JTAG based operation.

Abstract: An integrated circuit structure including a reference circuit and at least two core circuits is provided. The reference circuit provides a reference current. The at least two core circuits are coupled to the reference circuit for receiving the reference current. Each of the core circuits includes a current-calibration circuit. The current-calibration circuit generates a bias current according to the reference current in the core circuit. The core circuits use the bias current to replace the reference circuit. In an IC test process, the reference circuit provides the reference current through the pin of the integrated circuit electronically connected to the external impedance. After the IC test process, the connection of the reference circuit and the pin of the integrated circuit is disconnected.

Abstract: One or more non-transitory computer-readable storage media is provided, the storage media is configured to store instructions that, when executed by a processor included in an apparatus, cause the processor to perform operations comprising: identify a plurality of transition faults that is to possibly occur in a circuit; generate a plurality of modified fault expressions, at least one of the plurality of modified fault expressions being associated with a corresponding transition fault of the plurality of transition faults; identify a plurality of test patterns, wherein at least one test pattern of the plurality of test patterns results in satisfiability of corresponding one or more of the plurality of modified fault expressions; and output the plurality of test patterns to a testing arrangement to test the circuit

Abstract: A testing system includes a slot configured to receive a device-under-test (DUT), and a core testing processor configured to communicate with a user interface and with the slot, wherein the core testing processor is associated with communication that is independent of any other communications transmitted within the system, and wherein the core testing processor executes a set of tests associated with the DUT.

Abstract: A configuration and testing method and system for an FPGA chip using a bumping process are disclosed, the method includes creating configuration files for an FPGA chip under test and storing them in a memory; reading, by a master FPGA, a configuration code stream of corresponding configuration codes from the mass memory, configuring the FPGA chip under test via an external test interface, and determining whether the configuration is successful; if the configuration is successful, converting the configuration code stream into a test signal source file that is recognizable, executable and reusable by multiple pieces of test equipment by a developed algorithm and a conversion tool; and automatically loading the test signal source file onto the FPGA chip under test in real time by advanced test equipment.

Abstract: A semiconductor integrated circuit for monitoring a switch, including: a first detection part that detects a state of a first switch; a second detection part that detects a state of a second switch; a sub-voltage monitoring part that monitors whether the sub-voltage is within a predetermined range; a switch monitoring part that monitors a change in a state of the first switch and a change in a state of the second switch; a setting part that determines an invalid period, during which the monitoring result of the switch monitoring part regarding the change in the state of the second switch is invalidated; and a transmission part that transmits the monitoring result of the switch monitoring part and information on the invalid period.

Abstract: A power supply protective device, when obtaining an open voltage when a second switch is brought into a closed state and a first switch is brought into an open state during discharging of a power supply, and obtaining a close voltage when the second switch is brought into the closed state and the first switch is brought into the closed state during discharging of the power supply, diagnoses the first switch as having a failure or not on the basis of the open voltage and the close voltage. When executing first a close instruction to the first switch and the second switch, if a voltage difference is less than a first threshold voltage, the first switch is determined to have no open failure, and/or when not less than a second threshold voltage, the second switch is determined to have no open failure.

Abstract: A bus-based information collection system with micro power consumption for battery packages comprises a plurality of batteries (1) connected in series, each of the batteries (1) is connected to a separate sampling board (2) which is sampling information of the batteries, each of the sampling board (2) is mounted near a corresponding battery (1) and is connected to a communication bus (4) arranged nearby, the communication bus (4) is connected to a secondary control board (3) used for data summarization. For each of the batteries (1) there is one sampling board (2) arranged nearby, each of the sampling boards (2) is proximally connected to the communication bus (4), and a wire is led from the communication bus (4) to the secondary control board (3), so that the wire harness inside the battery box are greatly simplified and sampling errors caused by long wire, electromagnetic interference, and the interference of various unpredictable problems can be effectively reduced.

Abstract: A battery monitoring system includes: an input circuit to which voltage signals of battery cells are inputted; a multiplexer selecting a battery cell for voltage detection from the battery cells, selecting voltage signals inputted from the input circuit, and outputting the selected voltage signals; first and a second voltage measuring circuits simultaneously measuring voltages based on the voltage signals in first and second routes outputted from the multiplexer; a comparator comparing measurement results by the first voltage measuring circuit and by the second voltage measuring circuit; and a control unit that judges, on a basis of a comparison result by the comparator, at least one of a voltage of each battery cell, an operation check of equalizing the voltages of the battery cells, a presence or absence of a disconnection of a detection line of each battery cell, and a presence or absence of a failure in the multiplexer.

Abstract: The present invention relates to an apparatus and a method for estimating a state of a battery, and more particularly, an apparatus for estimating a state of a battery includes: a first SOC estimating unit estimating a first state of charging (SOC) of the battery based on open circuit voltage and a temperature of the battery; a first SOH estimating unit estimating a first state of health of the battery based on the first SOC and the current of the battery; and a second SOC estimating unit estimating a second SOC of the battery based on the first SOH, charging/discharging voltage, the temperature, and the current of the battery or estimating the second SOC of the battery based on the charging/discharging voltage, the temperature, and the current of the battery.

Abstract: A state-of-charge (SOC) estimating device includes detector, a current-integration SOC calculator, a state estimation SOC calculator, a convergence determiner, and SOC selector. The detector detects a charge/discharge current and a voltage between terminals of a secondary battery. The current-integration SOC calculator calculates a state-of-charge value of the secondary battery by a current integration method. The state estimation SOC calculator calculates a state-of-charge value of the secondary battery by a state estimation method. The convergence determiner determines the convergence of the state estimation by the state estimation SOC calculator. The SOC selector selects a state-of-charge of the secondary battery from the calculated state-of-charge values according to the determination result of the convergence determiner.

Abstract: A battery monitoring system includes a multiplexer, a self-diagnosis voltage generation circuit, a first voltage measuring circuit and a voltage measuring circuit which measure voltage signals in a first route and a second route inputted through the multiplexer, based on the self-diagnosis voltage generated from the self-diagnosis voltage generation circuit or based on the voltages of battery cells outputted from the input circuit, a comparator which compares measurement results of the first and second voltage measuring circuits, and a control unit which judges the presence/absence of a failure in a measuring route connected to the first voltage measuring circuit or the second voltage measuring circuit and the presence/absence of a failure of the first voltage measuring circuit itself or the second voltage measuring circuit itself, based on a comparison result by the comparator and which controls the input circuit, the multiplexer, the comparator, and the self-diagnosis voltage generation circuit.

Abstract: Systems and methods for detection and analysis of battery condition information may be used with respect to, for example, battery powered hand hygiene product dispensers. The battery condition information may be used to identify potential low battery conditions, the type of dispenser, the type or form of product dispensed, and/or to detect occurrence of a battery replacement event in a hand hygiene product dispenser. The battery condition information may further be used to determine a number of dispenses remaining for a hand hygiene product dispenser. The battery condition information may further be used to provide battery condition information for battery operated hand hygiene product dispensers in hand hygiene compliance systems.

Abstract: The present disclosure pertains to detection of anomalous conditions in a variety of types of systems. In one embodiment, a system may be configured to identify anomalous conditions in a stream of measurements. The system may include a communications interface configured to receive a stream of measurements. An archive subsystem may maintain a data archive comprising a statistical representation of the stream of measurements. A pre-processing subsystem may divide the stream of measurements into a plurality of data windows. The plurality of data windows may be analyzed by an analysis subsystem configured to generate a plurality of normalized representations based on the data archive. The plurality of normalized representations may be grouped into a plurality of ranges. An anomaly detection subsystem may perform a comparison of the plurality of normalized representations to at least one threshold and may determine that the comparison indicates an anomalous condition.

Abstract: Methodologies and systems are described herein whereby the electrical performance of a device may be tested. In one or more embodiments, a system for testing the electrical performance comprises a monitoring device configured to perform a set of operations including concurrently monitoring at least three different test points of a device under test (DUT) and aggregating test data comprising signal information collected concurrently from at least three different test points of the DUT. In one or more embodiments, the system is configured to monitor at least three channels wherein at least one channel corresponds to a frequency range of less than 300 kHz and the phases of signals on at least three channels are different.