Patents Issued in November 29, 2018
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Publication number: 20180340955Abstract: This disclosure reveals a resonator where at least one suspended inertial mass is driven into rotational oscillation by a piezoelectric drive transducer, or where the rotational motion of at least one suspended inertial mass is sensed by a piezoelectric sense transducer. The disclosure is based on the idea of attaching suspenders to the inertial mass with at least one flexure, which allows the end of the suspender which is attached to the inertial mass to rotate in relation to the inertial mass at this attachment point when the inertial mass is in motion. The resonator may be employed in a resonator system, a clock oscillator or a gyroscope.Type: ApplicationFiled: May 24, 2018Publication date: November 29, 2018Inventor: Heikki KUISMA
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Publication number: 20180340956Abstract: A method of conductively bonding a test probe tip having an electrically conductive element to a device under test (DUT) having an electrical connection point, the method comprising: positioning the electrically conductive element of the test probe tip proximate to the electrical connection point of the DUT; dispensing a UV-cure conductive adhesive between the electrically conductive element and the electrical connection point of the DUT, the dispensed UV-cure conductive adhesive continuously covering at least a portion of the electrically conductive element and at least a portion of the electrical connection point of the DUT; and bonding the dispensed UV-cure conductive adhesive to the electrically conductive element and the electrical connection point of the DUT by applying UV-light from a UV-light source to the dispensed UV-cure conductive adhesive.Type: ApplicationFiled: May 11, 2018Publication date: November 29, 2018Applicant: Tektronix, Inc.Inventors: Julie A. Campbell, Regina R. Mrozik
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Publication number: 20180340957Abstract: A probe pin includes an elastic hollow cylinder that expands and contracts along a central axis, a conductive first plunger extending in the cylinder along the central axis from a first end of the cylinder, and a conductive second plunger extending in the cylinder along the central axis from a second end of the cylinder. The first and second plungers are coupled together in the cylinder in a manner movable relative to each other along the central axis. The first plunger includes a first plunger body contained in the cylinder, and a first terminal connected to the first plunger body and located outside the cylinder. The second plunger includes a second plunger body contained in the cylinder, and a second terminal connected to the second plunger body and located outside the cylinder.Type: ApplicationFiled: January 5, 2017Publication date: November 29, 2018Applicant: OMRON CorporationInventors: Hirotada TERANISHI, Takahiro SAKAI
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Publication number: 20180340958Abstract: Embodiments herein describe structures of low-force wafer test probes and formation thereof. Structures of low-force wafer test probes and their formation via gray scale etch or electroplating is described. Structures are described that include a lower base structure on top of a substrate and an upper blade structure on top of the lower base structure. In various embodiments, a crown of a C4 bump is accommodated by one or both of: i) a cavity present in the lower base structure; and ii) a height of the upper blade structure. Processes for fabricating probe structures are described that include forming lower base structures upon a substrate and forming upper blade structures on top of the lower base structures. The upper blade structures include at least one blade. Each of the blade(s) include a cutting edge that points toward a center point within the probe structure.Type: ApplicationFiled: May 25, 2017Publication date: November 29, 2018Inventors: David M. Audette, S J. Chey, Doreen D. DiMilia, Sankeerth Rajalingam, Grant Wagner
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Publication number: 20180340959Abstract: Embodiments herein describe structures of low-force wafer test probes and formation thereof. Structures of low-force wafer test probes and their formation via gray scale etch or electroplating is described. Structures are described that include a lower base structure on top of a substrate and an upper blade structure on top of the lower base structure. In various embodiments, a crown of a C4 bump is accommodated by one or both of: i) a cavity present in the lower base structure; and ii) a height of the upper blade structure. Processes for fabricating probe structures are described that include forming lower base structures upon a substrate and forming upper blade structures on top of the lower base structures. The upper blade structures include at least one blade. Each of the blade(s) include a cutting edge that points toward a center point within the probe structure.Type: ApplicationFiled: February 6, 2018Publication date: November 29, 2018Inventors: David M. Audette, S J. Chey, Doreen D. DiMilia, Sankeerth Rajalingam, Grant Wagner
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Publication number: 20180340960Abstract: Provided is a contact probe which may achieve improved heat resistance even when a spring portion thereof is compressed and released in a high temperature environment. The contact probe includes an Ni—P layer, and the Ni—P layer has different concentrations of P at different positions in a thickness direction of the Ni—P layer.Type: ApplicationFiled: May 25, 2018Publication date: November 29, 2018Inventors: Masami YAMAMOTO, Norihiro OTA, Shigeki SAKAI
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Publication number: 20180340961Abstract: A system includes a controller for automated test equipment (ATE) contactor to interface with a device under test (DUT) including a power converter having a primary and secondary side, each side has an input/output (I/O) pin. The controller causes the ATE contactor to apply a load current on the secondary side of the power converter at a first value and vary the load current to a second value. The contactor receives first and second indications, at the first and second load currents, of a voltage on the primary side I/O pin, a voltage on the primary side of the power converter, an input current on the primary side of the power converter, a voltage on the secondary side I/O pin, and a voltage on the secondary side of the power converter. The controller determines a primary and secondary side ATE contactor resistances based on the first and second indications.Type: ApplicationFiled: May 24, 2018Publication date: November 29, 2018Inventors: Arun ADONI, Suvadip BANERJEE, Sreeram Subramanyam NASUM, Prajkta VYAVAHARE
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Publication number: 20180340962Abstract: Disclosed are an apparatus and method for diagnosing electric power equipment. The apparatus includes a measuring unit including a pan/tilt module mounted on the top of a vehicle and an imaging module mounted on an upper portion of the pan/tilt module, a determination unit for determining whether electric power equipment is detected by the measuring unit, a controller for performing control to capture a thermal image of the electric power equipment using the measuring unit, and a processing unit for dividing the thermal image into an analysis target equipment region, a non-interest equipment region, and a background noise region through pattern analysis of the thermal image and diagnosing the electric power equipment as being normal or as being abnormal on the basis of temperature information included in the analysis target equipment region.Type: ApplicationFiled: August 29, 2016Publication date: November 29, 2018Applicants: Korea Electric Power Corporation, Korea Electric Power CorporationInventors: Kwang-Heung JANG, Kang-Se LEE, Byoun-Hun JUNG, Doc-Jun BYUN, Min-Hee CHOI, Yong-Woo PARK
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Publication number: 20180340963Abstract: An apparatus for measuring the capacitance to be measured is proposed. It comprises a first sine-wave oscillator, the measuring oscillator, and a second sine-wave oscillator, the reference oscillator. The frequency of the output signal of the measuring oscillator, hereinafter also referred to as measuring frequency, is dependent on the capacitance to be measured. The frequency of the output signal of the reference oscillator, hereinafter also referred to as reference frequency, is dependent on a reference capacitance. The apparatus comprises a sub-apparatus which produces the ratio of the frequency value of the frequency of the output signal of the reference oscillator and the frequency value of the frequency of the output signal of the measuring oscillator and subsequently squares this ratio to provide the result of this squaring as a measured value.Type: ApplicationFiled: August 25, 2017Publication date: November 29, 2018Inventor: Norbert Raehse
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Publication number: 20180340964Abstract: A current sensor circuit is provided. The circuit includes a voltage integration circuit connected in parallel to an inductive element. The voltage integration circuit is configured to integrate an inductive element current through the inductive element between a first potential at a first end of the inductive element and a second potential a second end of the inductive element. The voltage integration circuit provides a voltage analog of the inductive element current. A voltage current convertor circuit is electrically connected to the voltage integration circuit. The voltage current convertor circuit is configured to convert the voltage analog of the voltage integration circuit to an output current that is proportional to the inductive element current.Type: ApplicationFiled: May 25, 2017Publication date: November 29, 2018Inventor: PAUL RANUCCI
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Publication number: 20180340965Abstract: A system is provided. The system comprises: a processing system comprising a memory coupled to a processor; wherein the processing system is configured to be coupled to at least one sensor; wherein the memory comprises a grid adaptation system, a system model, measurement data, and an estimation system; wherein the measurement data comprises data measured by the at least one sensor; wherein the estimation system is configured to provide probability density functions (PDFs) for a predictive estimate and a filtered estimate of a state in a form of a point-mass density; and wherein the grid adaption system is configured to adapt grid parameters of a predictive estimate and a filtered estimate.Type: ApplicationFiled: May 26, 2017Publication date: November 29, 2018Inventors: Milos Sotak, Milos Vesely, Jindrich Dunik
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Publication number: 20180340966Abstract: A test system for measuring beam characteristics of a device under test (DUT) is provided. The system comprises a DUT, a measurement antenna configured to receive electro-magnetic radiation emitted by the DUT, a link antenna configured to provide a test communication link to the DUT, and a control and analyzing unit configured to control a beam steering of the device under test and to analyze signals from the device under test received by the measurement antenna. The test communication data transmitted to the device under test comprises beam steering control data in order to control the beam steering of the DUT.Type: ApplicationFiled: May 26, 2017Publication date: November 29, 2018Inventors: Sebastian SCHMITZ, Corbett ROWELL, Vincent ABADIE
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Publication number: 20180340967Abstract: A test system for measuring beam characteristics of a device under test (DUT), comprising a first antenna for receiving electro-magnetic radiation emitted by the device under test or for establishing a first test communication link to exchange test communication data with the DUT. The system further comprises a switch for setting the mode of the first antenna to a measuring or communication mode, and a test interface for inputting beam steering and/or communication data to the DUT. The system further comprises a control/analyzing processor for controlling beam steering of the DUT and to analyze signals from the DUT, e.g., received by the first antenna operated in the measuring mode. When the first antenna is set to the communication mode, test communication data is transmitted to the DUT through the first antenna. The test communication data comprises beam steering control data for controlling the beam steering of the DUT.Type: ApplicationFiled: September 15, 2017Publication date: November 29, 2018Inventors: Corbett ROWELL, Vincent ABADIE
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Publication number: 20180340968Abstract: An over-the-air measurement system is provided for analyzing a device under test. The over-the-air measurement system includes a first measurement unit, a first antenna connected to the first measurement unit, a second measurement unit, and a second antenna connected to the second measurement unit. The first measurement unit is configured to establish a communication link, within a communication link frequency range, to the device under test via the first antenna. The second measurement unit is configured to measure radio frequency radiation, within a measurement frequency range, of the device under test via the second antenna. The communication link frequency range and the measurement frequency range do not overlap each other.Type: ApplicationFiled: March 21, 2018Publication date: November 29, 2018Inventor: Vincent ABADIE
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Publication number: 20180340969Abstract: A method for detecting an error in a generator unit which has an electric machine (100) with a rotor winding (110) and a stator winding (120) and a rectifier (130) connected thereto, via which rectifier the electric machine (100) is connected to an electrical system (150) of a motor vehicle, the excitation current (IE) flowing through the rotor winding (110) of the electric machine (100) being plotted and it being concluded that there is an error in the generator unit depending on whether a frequency component (A) of a frequency spectrum of the plot of the excitation current (IE) in a frequency range above a lower speed limit (SW) is larger than a threshold value (S).Type: ApplicationFiled: October 28, 2016Publication date: November 29, 2018Inventors: Manuel Mueller, Miriam Riederer, Paul Mehringer, Sebastian Paulus, Zoltan Ersek
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Publication number: 20180340970Abstract: The disclosure is related to a system and method for monitoring the integrity of fluid filled connector systems. The system includes a connector with a first space and a first measurement probe. A module or a receptacle is connected to the connector and includes first wiring that is coupled with second wiring in the connector. The module or the receptacle includes a second space in fluid connection with the first space. The first space and the second space include a fluid sealed within. The second space includes a second measurement probe. A measurement device is connected to the first measurement probe and the second measurement probe to determine an impedance value across the first space and the second space. The impedance value corresponds to an integrity measure for the system based at least in part on the fluid sealed within.Type: ApplicationFiled: May 16, 2018Publication date: November 29, 2018Applicant: Hydril USA Distribution LLCInventor: Francis Emerich
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Publication number: 20180340971Abstract: An insulation detector for highly accurately detecting or measuring, with a simple configuration, insulation resistance of a load or an apparatus to a ground or a housing and connected to an electric apparatus including one or both of an intra-apparatus capacitor and a battery, the insulation detector including an intra-insulation detector capacitor, a voltage detecting unit that detects a voltage of the intra-insulation detector capacitor, and a current-path forming switch for connecting the ground or the housing, the intra-apparatus capacitor, and the intra-insulation detector capacitor in series and forming a current path including insulation resistance of the electric apparatus. The insulation detector measures the insulation resistance by measuring a time constant of a change in the voltage of the intra-insulation detector capacitor.Type: ApplicationFiled: August 7, 2018Publication date: November 29, 2018Applicant: Mitsubishi Electric CorporationInventors: Taichiro TAMIDA, Masayuki UEMATSU, Akira TANABE, Yoshitomo HAYASHI, Yoji TSUTSUMISHITA, Kosuke TSUJIKAWA
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Publication number: 20180340972Abstract: A pulse current application circuit for applying a pulse current to a current application target. The pulse current application circuit includes a first switching element and an inductive load connected in series between a power supply and a reference potential, a second switching element connected in series with the current application target, the second switching element and the current application target being connected between the reference potential and a connection point of the first switching element and the inductive load, and a commutation circuit connected in parallel to the inductive load, the commutation circuit having a current flowing therethrough and having no current flowing therethrough respectively when the second switching element is in a cut-off state and a conductive state.Type: ApplicationFiled: May 1, 2018Publication date: November 29, 2018Applicant: FUJI ELECTRIC CO., LTD.Inventor: Naoki KUMAGAI
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Publication number: 20180340973Abstract: Disclosed herein is method and system for facilitating fault rectification in power backup devices using a fault rectification system configured in the power backup device. The fault rectification system detects occurrence of fault events in the power backup device and retrieves information required for rectification of the fault events based on the complexity level of the fault event. The rectification information is provided to the user, thereby facilitating the user in rectification of the detected fault event, without requirement of the expert service personnel. The method of instant disclosure helps in reducing total turnaround time of rectifying the faults in the power backup devices by eliminating involvement of expert/customer service personnel in the rectification of the faults.Type: ApplicationFiled: July 11, 2017Publication date: November 29, 2018Inventor: Kothamangala ANANDAIAH SHETTY NAGARAJA
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Publication number: 20180340974Abstract: New cooling control techniques suitable for use in the testing of devices are disclosed. The new cooling control techniques are an improvement over existing cooling control techniques because the new cooling control techniques utilize inputs that are more representative of actual thermal conditions experienced by a DUT (device under test) and/or are more representative of various other parameters, such as DUT power consumption/dissipation, during testing. Also, the new cooling control techniques offer flexibility with respect to the cooling control algorithm to employ for the DUT during testing.Type: ApplicationFiled: May 26, 2017Publication date: November 29, 2018Inventors: Leon Chen, Rebecca Toy
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Publication number: 20180340975Abstract: An anechoic chamber for testing a device under test is provided. The anechoic chamber comprises at least one gas input means for inputting a gas into the anechoic chamber, and at least one gas output means for outputting the gas out of the chamber. In addition to this, the gas input means and the gas output means create a directed gas stream with respect to a predefined region of the anechoic chamber.Type: ApplicationFiled: May 24, 2017Publication date: November 29, 2018Inventors: Markus HERBRIG, Daniel MARKERT, Corbett ROWELL
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Publication number: 20180340976Abstract: A semiconductor device is manufactured at an improved efficiency. The method of the invention includes a step of carrying out an electrical test by bringing an external terminal electrically coupled to a semiconductor chip mounted on a semiconductor device into contact with a tip portion of a probe pin coupled to a test circuit and thereby electrically coupling the semiconductor chip to the test circuit. The probe pin has a tip portion comprised of a base material, a nickel film formed thereon, and a conductive film formed thereon and made of silver. The conductive film is thicker than the nickel film.Type: ApplicationFiled: April 17, 2018Publication date: November 29, 2018Inventors: Toshitsugu ISHII, Naohiro MAKIHIRA, Hidekazu IWASAKI, Jun MATSUHASHI
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Publication number: 20180340977Abstract: Test architectures for multi-die chips are provided herein according to embodiments of the present disclosure. In certain aspects, an exemplary test architecture enables an external tester to perform various tests on a multi-die chip that includes multiple dies. In a first test mode, the test architecture enables the external tester to currently perform die-level tests on the multiple dies. In a second test mode, the test architecture enables the external tester to perform a chip-level test on the multi-die chip. The chip-level test may include die-to-die tests for testing interconnections between the multiple dies on the multi-die chip. The chip-level test may also include a boundary input/output (I/O) test for testing external connections between the multi-die chip and one or more devices external to the multi-die chip.Type: ApplicationFiled: May 24, 2017Publication date: November 29, 2018Inventors: Tapan Jyoti Chakraborty, Alvin Leng Sun Loke, Hong Dai, Thomas Clark Bryan
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Publication number: 20180340978Abstract: An object of the present invention is to provide a highly-reliable content addressable memory. Provided is a content addressable memory including: a plurality of CAM cells; a word line joined to the CAM cells; a plurality of bit lines joined to the CAM cells; a plurality of search lines joined to the CAM cells; a match line joined to the CAM cells; a match amplifier joined to the match line; and a selection circuit that can select the output of the match amplifier in accordance with the value of the word line.Type: ApplicationFiled: March 8, 2018Publication date: November 29, 2018Inventors: Makoto YABUUCHI, Shinji TANAKA
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Publication number: 20180340979Abstract: A scannable circuit element includes a data path and a scan-data path that are respectively selected in response to a first operational mode and a second operational mode. The scan-data path includes an input element having an input node, an output node, a first power node and a second power node. A signal path between the input node and the output node is part of the scan-data path. The first power node is coupled to a first voltage potential, and the second power node is coupled to a mode-control signal that is at substantially the first voltage potential in the first operational mode and that is at substantially a second voltage potential in the second operational mode. In the second operational mode, the scannable element exhibits no switching current and no leakage current.Type: ApplicationFiled: July 28, 2017Publication date: November 29, 2018Inventor: Matthew BERZINS
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Publication number: 20180340980Abstract: A method for checking a battery state for at least one battery of at least one motor vehicle. A. determination of cell voltage differences of particular cell voltage values of at least two battery cells of the at least one battery at different points in time. B. comparison of the cell voltage differences with at least one predetermined cell voltage reference value assigned to the at least two battery cells, and determination of respective deviation values between the cell voltage differences and the at least one cell voltage reference value. C. determination of the battery state of the at least one battery, wherein, based on the particular deviation values, it is determined whether an inadmissible degradation of the battery state is imminent.Type: ApplicationFiled: May 22, 2018Publication date: November 29, 2018Applicant: AUDI AGInventor: Christian ROETTINGER
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Publication number: 20180340981Abstract: A method for estimating an operating current I dispensed by a battery pack or cell including the steps of acquiring characterization data of the battery pack or cell, related to measured time trends of a voltage Vm and of a characterization current Im of the battery pack or cell, associated with a respective characterization temperature value Tk; and then processing the characterization data to determine a plurality of parameters P of a model of the battery pack or cell, as a function of temperature and state of charge SOC. Measuring an operating voltage V of the battery pack or cell and an operating temperature T and for estimating the operating current I of the battery pack or cell. A plurality of time observation windows Wi is identified and characterization voltage Vmi values are detected.Type: ApplicationFiled: May 22, 2018Publication date: November 29, 2018Inventors: Rosanna SUGLIA, Danilo PRITELLI, Gianluca AURILIO
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Publication number: 20180340982Abstract: Methods are provided for generating an estimated number of workflow cycles able to be executed with a remaining battery capacity of a battery in a device. A workflow cycle comprising a predefined series of tasks of a work application executed during a defined timeframe is defined. Beginning battery capacity is determined at start of work application execution. End battery capacity at completion of work application execution is determined. Battery usage estimate associated with work application is calculated from difference between beginning battery capacity and end battery capacity. The estimated number of workflow cycles able to be executed is based on the remaining battery capacity and the battery usage estimate.Type: ApplicationFiled: May 26, 2017Publication date: November 29, 2018Inventors: Robert Arlan Kohtz, Rickey George Austin
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Publication number: 20180340983Abstract: The present disclosure relates to a battery capacity active estimation method for an electric vehicle. The method is capable of determining the battery capacity based on estimating a State Of Charge (SOC) of the battery before and after a discharge operation but without having to wait until an establishment of sufficient thermal and electric equilibria in the battery. The estimation of SOC may even be made while the battery is being slowly charged. Depending on the equilibrium state of the battery, SOCs may be either directly obtained by measuring Open Circuit Voltage of the battery when the battery is in electric equilibrium or calculated and estimated when the battery is not in electric equilibrium.Type: ApplicationFiled: August 25, 2017Publication date: November 29, 2018Inventors: Yonghua Li, Yang Zhang, Tiepeng Zhao, Zhiwei Zhang
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Publication number: 20180340984Abstract: A control device calculates an amount of increase ?Am in freezing temperature measurement value Am from an initial freezing temperature ?0 and calculates an amount of lowering in capacity corresponding to the amount of increase ?Am in freezing temperature as an amount of lowering in capacity ?Bx due to deterioration of a material. The control device calculates an amount of lowering in capacity measurement value Bm from an initial capacity B0 as a whole amount of lowering in capacity ?Bm and calculates a material deterioration ratio X by using ?Bx and ?Bm. The control device calculates a value resulting from subtraction of ?Bx from ?Bm as an amount of lowering in capacity ?By due to precipitation of Li and calculates an Li precipitation deterioration ratio Y by using ?By and ?Bm.Type: ApplicationFiled: April 20, 2018Publication date: November 29, 2018Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHAInventors: Ryo KANADA, Koji UMEMURA, Akemi NAKATAKE
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Publication number: 20180340985Abstract: Provided are a wafer probe card that matches in one-to-one correspondence with an LED wafer by implementing a probe system having the same size as the LED wafer, and inspects brightness and wavelength of light emitted from a plurality of LEDs provided on the LED wafer at once by controlling the plurality of LEDs to emit light, an analysis apparatus including the same, and a method of fabricating the wafer probe card.Type: ApplicationFiled: February 2, 2018Publication date: November 29, 2018Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Jong Hoon JUNG, Dae Sik KIM, Sung Yeol KIM, Seung Yong SHIN
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Publication number: 20180340986Abstract: A magnetic field sensor includes at least one coil responsive to an AC coil drive signal; at least one magnetic field sensing element responsive to a sensing element drive signal and configured to detect a directly coupled magnetic field generated by the at least one coil and to generate a magnetic field signal in response to the directly coupled magnetic field; a processor responsive to the magnetic field signal to compute a sensitivity value associated with detection of the directly coupled magnetic field and substantially independent of a reflected magnetic field reflected by a conductive target disposed proximate to the at least one magnetic field sensing element; and an output signal generator configured to generate an output signal of the magnetic field sensor indicative of the reflected magnetic field.Type: ApplicationFiled: May 26, 2017Publication date: November 29, 2018Applicants: Allegro MicroSystems, LLC, COMMISSARIAT À L'ÉNERGIE ATOMIQUE ET AUX ÉNERGIES ALTERNATIVESInventors: Alexander Latham, Claude Fermon, Jason Boudreau, Myriam Pannetier-Lecoeur, Bryan Cadugan, Hemán D. Romero
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Publication number: 20180340987Abstract: An apparatus comprises one or more substrates and one or more coils. At least one of the coils is configured to produce a first magnetic field that induces eddy currents in a conductive target, which generates a reflected magnetic field. One or more magnetic field sensing elements supported by the one or more substrates detect the reflected magnetic field. A conductive support structure supports the one or more substrates. The support structure includes a gap in an area adjacent to the one or more coils so that the support structure does not generate a reflected magnetic field in response to the first magnetic field.Type: ApplicationFiled: May 26, 2017Publication date: November 29, 2018Applicant: Allegro MicroSystems, LLCInventors: Alexander Latham, Michael C. Doogue, Jason Boudreau
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Publication number: 20180340988Abstract: An apparatus comprises a conductive material having varying thickness along its length, the varying thickness providing varying response along a length of the conductive material to a magnetic field having a non-zero frequency; wherein the magnetic field produces an eddy current in the conductive material which generates a reflected magnetic field, wherein the varying response causes the reflected magnetic field to vary in strength along the length of the conductive material. The apparatus may include one or more reference portions of conductive material.Type: ApplicationFiled: May 26, 2017Publication date: November 29, 2018Applicants: Allegro MicroSystems, LLC, COMMISSARIAT À L'ÉNERGIE ATOMIQUE ET AUX ÉNERGIES ALTERNATIVESInventors: Alexander Latham, Claude Fermon, Gerardo A. Monreal, Alejandro Gabriel Milesi
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Publication number: 20180340989Abstract: A magnetic field sensor includes at least one coil responsive to an AC coil drive signal; at least two spaced apart magnetic field sensing elements responsive to a sensing element drive signal and positioned proximate to the at least one coil; and a circuit coupled to the at least two magnetic field sensing elements to generate an output signal of the magnetic field sensor indicative of a difference between a distance of a conductive target with respect to each of the at least two spaced apart magnetic field sensing elements.Type: ApplicationFiled: May 26, 2017Publication date: November 29, 2018Applicants: Allegro MicroSystems, LLC, COMMISSARIAT À L'ÉNERGIE ATOMIQUE ET AUX ÉNERGIES ALTERNATIVESInventors: Alexander Latham, Claude Fermon, Myriam Pannetier-Lecoeur, Bryan Cadugan
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Publication number: 20180340990Abstract: A pressure sensor includes a chamber comprising a conductive portion and a deformable portion coupled to the conductive portion and susceptible to deformation in response to a pressure differential between an interior of the chamber and an exterior of the chamber; at least one coil responsive to an AC coil drive signal; at least one magnetic field sensing element disposed proximate to the at least one coil and to the conductive portion of the chamber and configured to generate a magnetic field signal in response to a reflected magnetic field generated by the at least one coil and reflected by the conductive portion; and a circuit coupled to the at least one magnetic field sensing element to generate an output signal of the pressure sensor indicative of the pressure differential between the interior of the chamber and the exterior of the chamber in response to the magnetic field signal.Type: ApplicationFiled: May 26, 2017Publication date: November 29, 2018Applicants: Allegro MicroSystems, LLC, COMMISSARIAT À L'ÉNERGIE ATOMIQUE ET AUX ÉNERGIES ALTERNATIVESInventors: Alexander Latham, Michael C. Doogue, Claude Fermon, Xavier Du Hamel De Milly, Myriam Pannetier-Lecoeur
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Publication number: 20180340991Abstract: High Q-value radio frequency (RF] coils are described. In general, the RF coils include multiple conductor layers that at least partially overlap to define a capacitive region that equalizes current flowing in each conductor. In some instances, the RF coil includes sets of layered conductors, where each set of layered conductors overlaps in an overlap region. In some other instances, the RF coil includes a spiraled conductor coupled to a dielectric material, where the number of turns of the spiral defines the overlap area. Multiple spiraled conductors can be interleaved. An equalization coil can also be provided to equalize currents along an axial dimension of each conductor in such RF coils. The thickness of the conductors is less than three skin depths, and preferably less than one skin depth, to overcome skin-depth limitations.Type: ApplicationFiled: November 20, 2015Publication date: November 29, 2018Inventors: Richard Raymond Mett, James Stuart Hyde, Jason Walter Sidabras
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Publication number: 20180340992Abstract: Some implementations provide an MRI system that includes: a housing having a bore accommodating a portion of a subject; a main magnet enclosed by said housing and configured to generate a substantially uniform magnet field within the bore; a gradient sub-system to provide perturbations to the substantially uniform magnet field; a flexible coil assembly configured to (i) receive radio frequency (RF) signals from the subject in response to the portion of the subject being scanned, and (ii) generate and apply B0 shimming to improve a field homogeneity of the substantially uniform magnetic field; and a control unit configured to: drive the gradient sub-system using a gradient waveform; and receive measurement results responsive to the gradient waveform such that a coupling between the gradient sub-system and the flexible coil assembly is determined and subsequently reduced in response to the determined coupling exceeding a pre-determined threshold.Type: ApplicationFiled: May 25, 2017Publication date: November 29, 2018Inventors: Chad Tyler Harris, Geron André Bindseil
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Publication number: 20180340993Abstract: An NMR probe head (1) comprising one or more HF coils (2) arranged around a vertical axis of symmetry (z), and an HF network (3) surrounded by an apparatus (4) for shielding from external HF radiation comprising an electrically conductive shielding tube (5) arranged along a z-axis and that can be moved around the HF coils and the HF network in a z direction towards a base disc (6)A shielding disc (7) is provided at an axial distance from the base disc, wherein a tensible HF seal (8) is arranged between the shielding disc and the shielding tube. When the shielding tube is in a mounted state, the HF seal, in a first mounting state, can slide over the shielding disc in an unbraced and force-free manner. When the HF seal is in a second mounting state, the HF seal is mechanically braced between the shielding disc and the shielding tube to ensure an electrically conductive connection.Type: ApplicationFiled: May 24, 2018Publication date: November 29, 2018Inventors: Roger MEISTER, Daniel SCHMIDIG
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Publication number: 20180340994Abstract: The invention pertains to advances in constructing predetermined magnets from appropriate magnetic material that allows for focusing the magnetic field in a target region.Type: ApplicationFiled: May 27, 2018Publication date: November 29, 2018Applicant: Elegant Mathematics LLCInventors: Olena Ibragimova, Ilgiz Ibragimov
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Publication number: 20180340995Abstract: A method for the simultaneous recording of magnetic resonance data relating to an examination subject from at least two different slices by a magnetic resonance sequence, wherein an excitation period of the magnetic resonance sequence that includes at least one sub-section that acts on only one of the slices, and that contains at least one high frequency pulse is used, wherein, to correct the main magnetic field inhomogeneities of the first order, for each slice affected by a sub-section, a correction parameter that modifies the gradient pulses that are to be emitted is determined, taking into account at least one main magnetic field map that describes the spatial distribution of the main magnetic field and a slice position of the affected slice and is applied in the emission of gradient pulses for the respective slice in the sub-section.Type: ApplicationFiled: May 11, 2018Publication date: November 29, 2018Inventor: Mario Zeller
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Publication number: 20180340996Abstract: A method is for adapting a parameter of a parameter set for a magnetic resonance measurement of an examination object. An embodiment of the method includes choosing a parameter set required for the magnetic resonance measurement of the examination object; determining at least one interaction indicator applicable to an interaction between electromagnetic radiation and a tissue of the examination object; comparing the interaction indicator with a previously defined upper limit for the interaction indicator and, upon the upper limit being exceeded, determining a group of parameters from the parameter set, adaptable with a view to complying with the upper limit. The method further includes calculating a modification suggestion for a multiplicity of parameters from the group with a view to complying with the upper limit, identifying a parameter to optimize a quality parameter of the magnetic resonance measurement, and adapting the identified parameter in accordance with its modification suggestion.Type: ApplicationFiled: May 22, 2018Publication date: November 29, 2018Applicant: Siemens Healthcare GmbHInventor: Stefan MEYER
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Publication number: 20180340997Abstract: The invention pertains to advances in real-time methods in nuclear magnetic resonance by offering: a new real-time processing method for nuclear magnetic resonance (NMR) spectrum acquisition without external resonator(s), which remains stable despite magnetic field fluctuations, a new processing method for nuclear magnetic resonance spectrum acquisition, which remains stable despite magnetic field fluctuations and resonator stability, a new method of constructing predetermined magnets from appropriate magnetic material that allows for focusing the magnetic field in a target region, a new dual frequency dynamic nuclear polarization (DNP) generator that polarizes the spin of electrons and acts as an NMR transmitter.Type: ApplicationFiled: May 27, 2018Publication date: November 29, 2018Applicant: Elegant Mathematics LLCInventors: Olena Ibragimova, Ilgiz Ibragimov
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Publication number: 20180340998Abstract: A method for determining a flow sensitive gradient block includes determine a gradient parameter for one or more echoes in an imaging sequence according to a scanning protocol. The method also includes determining one or more time origins for gradient moment calculation based on the gradient parameter and obtaining one or more target zeroth-order gradient moments and one or more target first-order gradient moments corresponding to the one or more time origins. The method further includes determining one or more parameters of the one or more flow sensitive gradient blocks with respect to the one or more target zeroth-order gradient moments and the one or more target first-order gradient moment and updating the gradient parameter according to the one or more parameters of the one or more flow sensitive gradient blocks.Type: ApplicationFiled: May 26, 2017Publication date: November 29, 2018Applicant: UIH AMERICA, INC.Inventor: Yongquan YE
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Publication number: 20180340999Abstract: A system and method for an electron paramagnetic resonance imaging (EPRI) system includes a magnet configured to apply a static magnetic field to a subject to be imaged and a gradient coil configured to apply a magnetic field gradient to the static magnetic field. The system also includes a parallel plate waveguide (PPWG) configured to use a traveling wave to generate a radio frequency (RF) magnetic field over a volume of interest (VOI) in the subject to elicit EPRI data from the VOI and a processor configured to reconstruct the EPRI data into an image of the VOI.Type: ApplicationFiled: May 26, 2017Publication date: November 29, 2018Inventors: Bahareh Behzadnezhad, Nader Behdad, Alan B. McMillan
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Publication number: 20180341000Abstract: An apparatus for determining a distance to an object is provided. The apparatus includes a first transceiver configured to transmit a first radio frequency signal. Further, the apparatus includes a second transceiver configured to transmit a second radio frequency signal in response to receiving the first radio frequency signal. The apparatus additionally includes a processing circuit configured to determine the distance to the object based on a transmission time of the first radio frequency signal and a reception time, at the first transceiver, of a reflected component of the second radio frequency signal that is reflected by the object.Type: ApplicationFiled: April 12, 2018Publication date: November 29, 2018Inventors: Alon Cohen, Eran Gerson, Gaby Prechner, Michael Bogdanov
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Publication number: 20180341001Abstract: An apparatus for determining information on a position of a transmitter. In one example, the apparatus includes an antenna apparatus, a control apparatus and a data processing apparatus. The antenna apparatus includes several different directional characteristics, wherein the directional characteristics are each related to an amount of spatially different receive sensitivities of the antenna apparatus. The control apparatus influences the antenna apparatus such that at least one of the directional characteristics of the antenna apparatus is activated. With the activated directional characteristic, the antenna apparatus receives a signal originating from the transmitter. The data processing apparatus processes the received signal and the amount of spatially different receive sensitivities allocated to the related activated directional characteristic to an amount of weighted receive values and determines the information on the position of the transmitter therefrom.Type: ApplicationFiled: August 2, 2018Publication date: November 29, 2018Applicant: Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.Inventors: Mario Schühler, Lars Weisgerber, Johannes Arendt, Rainer Wansch, Heinrich Milosiu, Frank Oehler
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Publication number: 20180341002Abstract: Certain aspects of the technology disclosed herein include measuring and reporting the unit planar area incident radiant flux striking multiple planes at known, determined angles of tilt from the horizontal and pre-determined angles of azimuthal orientation corresponding to that of an associated solar power generating apparatus which employs a single axis or two axis photovoltaic module tracking design.Type: ApplicationFiled: May 23, 2018Publication date: November 29, 2018Inventor: James Raymond Augustyn
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Publication number: 20180341003Abstract: An optical system comprises a pair of Risley prisms positioned along an optical axis to receive a light beam from a field of view, wherein at least one of the Risley prisms is rotatable, transverse to the optical axis, with respect to the other of the Risley prisms. At least one lens is positioned along the optical axis to receive the light beam from the pair of Risley prisms, with the at least one lens configured to focus the light beam. An optical detector array is positioned along the optical axis at an image plane, wherein the optical detector array receives the focused light beam on the image plane from the at least one lens. The optical system can be implemented as a light beam steering mechanism in a star tracker or celestial aided inertial navigation unit.Type: ApplicationFiled: May 24, 2017Publication date: November 29, 2018Inventors: Matthew Edward Lewis Jungwirth, Wesley J. Hawkinson, Sorin Mosor
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Publication number: 20180341004Abstract: A method for calculating a position of an object of interest in an environment. The method includes: predicting a position and an orientation of the object of interest in the environment; selecting a subset of base stations among a set of base stations located within the environment, by using the predicted position and orientation, and a radiation pattern of a system including the object of interest and a mobile transponder attached to the object of interest; and calculating an actual position of the object of interest, using time of arrival or time difference of arrival measurements between the base stations of the subset and the mobile transponder.Type: ApplicationFiled: December 2, 2016Publication date: November 29, 2018Applicants: Swiss Timing Ltd, Friedrich-Alexander-Universitaet Erlangen-NuernbergInventors: Thomas KAUTZ, Sebastian SCHOLZ, Bjoern ESKOFIER