Abstract: A device for accurate wind measurement includes a bench carrying a camera having camera optics and a moving object connected to the camera by a string. The camera is generally directed downward and takes images of the object's movement while influenced by gravity and aerodynamic forces and is configured to stream the images to a digital signal processor or computer, which is adapted to decode the images and compute the object location and spatial angles.

Abstract: A system for an aircraft includes a pneumatic sensor, an optical sensor, and a computer system. The pneumatic sensor is configured to sense a value external to the aircraft. The optical sensor is configured to emit an optical signal external to the aircraft and receive an optical response. The computer system is configured to receive the value and the optical response. The pneumatic sensor and the optical sensor do not extend beyond a boundary layer of the aircraft.

Abstract: An impact indicator includes a first tube having an outer dimension, a second tube having an inner dimension greater than the outer dimension of the first tube, and wherein at least a portion of the first tube is disposed within the second tube. A first fluid is disposed and held within the first tube via capillary action until a predetermined level of an acceleration event is received. A second fluid is disposed and held within the second tube via capillary action, and the second fluid is spaced apart from the first fluid by at least one plug. Responsive to receiving the predetermined level of the acceleration event, at least a portion of the first fluid exits the first tube and mixes into the second fluid to create a change in color of the second fluid to provide a visual indication of the acceleration event.

Abstract: A physical quantity sensor includes a substrate, a pair of first elements detecting acceleration in a first direction, and a pair of second elements detecting an acceleration in a second direction. The first element portion includes a first movable portion displaceable in the first direction, first and second movable electrode fingers disposed in the first movable portion, first and second fixing electrode fingers disposed to face the first and second movable electrode fingers, and first and second support portions supporting the first and second fixing electrode fingers. The second element includes a second movable portion displaceable in the second direction, third and fourth movable electrode fingers disposed in the second movable portion, third and fourth fixing electrode fingers disposed to face the third and fourth movable electrode fingers, and third and fourth support portions supporting the third and fourth fixing electrode fingers.

Abstract: This disclosure discloses an acceleration sensor and an accelerometer, and the acceleration sensor includes a base, a cantilever, and a mass body fixed on the base through the cantilever, where the shape of the mass body is a centrally symmetric shape; and the cantilever includes four L-shaped arms, where the respective L-shaped arms include long arms connected with the base, and short arms connected with the mass body, and any adjacent two of the L-shaped arms are arranged symmetric to an axis. Since the cantilever includes the four symmetrically arranged L-shaped arms holding each other transversally, there is high transversal interference robustness, the structure is simple, and there is low fabrication difficulty.

Abstract: A physical quantity sensor includes a base substrate, a movable part placed to be displaceable with respect to the base substrate, a supporting part that supports the movable part, a dummy electrode provided on the movable part side of the base substrate and placed to face the movable part, a first conducting part provided on the base substrate side of the movable part and placed to face the dummy electrode, and a second conducting part provided on the base substrate side of the supporting part, wherein the first conducting part and the second conducting part are connected by a third conducting part.

Abstract: An integrated circuit measures a differential change between first and second mutual capacitances having receiver electrodes joined to form a common electrode of an MEMS circuit. The integrated circuit performs charge transfer measurements to transfer charge to a reference capacitor and a variable capacitor is used to change the amount of charge stored in the reference capacitor. First and second charge transfer measurements are performed, each having a number of charge transfer cycles used to transfer charge from the common electrode to the reference capacitor. In the first measurement, a transmit electrode of the first capacitance is driven high first, and in the second measurement, a transmit electrode of the second capacitance is driven high first. The circuit compensates for parasitic capacitances in the MEMS circuit with a sample-and-hold circuit selectively connected to the common electrode to maintain its voltage during a charge phase of a charge transfer cycle.

Abstract: A MEMS device includes: a substrate as a base including a support portion and a detection electrode as a fixed electrode; a movable body supported to the support portion with a major surface of the movable body facing the fixed electrode; and an abutment portion facing at least a portion of an outer edge of the movable body and restricting rotational displacement in an in-plane direction of the major surface. The abutment portion includes an abutment surface including an abutment position at which the movable body abuts against the abutment portion due to the rotational displacement of the movable body, and a hollow portion provided opposing the abutment surface.

Abstract: The invention disclosed herein is a tool movement recording system that includes a tool movement module either built into an existing hand tool or assembled inside an attachable ancillary housing. The tool includes a primary measurement sensor that measures or senses' the tool's primary function or purpose. The primary measurement sensor is coupled to a microcontroller and may be connected to one or more secondary sensors, said as an accelerometer or gyroscope. The microcontroller is connected to a first Bluetooth transceiver configured to pair with a second Bluetooth transceiver located in a nearby Smart phone. The Smart phone includes a microcontroller with working memory and a software application configured to present the information received by the second Bluetooth transceiver and display the information on the Smart phone's display or into a save file.

Abstract: An inertial measurement system is disclosed. The inertial measurement system has an accelerometer processing unit that generates a calibrated accelerometer data. The inertial measurement system further includes a magnetometer processing unit generates a calibrated magnetometer data, and a gyroscope processing unit generates a calibrated gyroscope data. Using the calibrated accelerometer data, the calibrated magnetometer data, and the calibrated gyroscope data, the inertial measurement system generates a heading angle error indicative of the accuracy of the heading angle error.

Abstract: An AFM that suppress parasitic deflection signals is described. In particular, the AFM may use a cantilever with a probe tip that is offset along a lateral direction from a longitudinal axis of torsion of the cantilever. During AFM measurements, an actuator may vary a distance between the sample and the probe tip along a direction approximately perpendicular to a plane of the sample stage in an intermittent contact mode. Then, a measurement circuit may measure a lateral signal associated with a torsional mode of the cantilever during the AFM measurements. This lateral signal may correspond to a force between the sample and the probe tip. Moreover, a feedback circuit may maintain, relative to a threshold value: the force between the sample and the probe tip; and/or a deflection of the cantilever corresponding to the force. Next, the AFM may determine information about the sample based on the lateral signal.

Abstract: A method of operating an atomic force microscope, comprising a probe, the probe being moved forth and back during respective trace and retrace times of a scan line, the method comprising: a) during trace time, oscillating the probe, b) generating a z feedback signal to keep an amplitude of oscillation of the probe constant at a setpoint value, the z feedback signal being generated by a first feedback loop, c) during retrace time, placing the probe in a drift compensation state by changing the setpoint value to a different value so that the z feedback signal being generated by the first feedback loop causes the probe to move away from the sample and oscillate free, d) detecting an amplitude of free oscillation of the probe and adjusting with a second feedback loop its excitation signal to maintain the amplitude of free oscillation of the probe close to a set value.

Abstract: A method for commanding a tip of a probe is disclosed, wherein a command signal, representative of the force applied by said tip on the surface of a sample to be analyzed, includes at least one cycle successively defined by: a first step where the value of said command signal decreases from a maximum value (Smax) to a minimum value (Smin) so as to move said tip away from said surface at a predetermined distance called detachment height; a second step where the value of the command signal is maintained constant at said minimum value so as to maintain the tip at said detachment height; a third step where the value of the command signal increases from the minimum value up to said maximum value so as to bring the tip closer towards the surface to be analyzed until the tip comes into contact with the surface; and a fourth step where the value of the command signal is maintained constant at said maximum value to maintain the tip in contact with the surface to be analyzed under a constant force between the tip and t

Abstract: A scanning probe used to measure and determine the features of an electrically conductive surface and which can be used to determine present corrosion state of a bare or coated metal and monitor corrosion progression under coatings that previously had to be removed to assess the present corrosion state and corrosion progression of the underlying metal surface.

Abstract: A probe pin includes an elastic portion, a first contact portion having a pair of leg portions that extends from a first end of the elastic portion along a longitudinal direction and is bendable in a direction away from each other, and that has a pair of contact portions each of which is disposed at each tip of the pair of leg portion and is urged by the elastic portion in a direction along the longitudinal direction through the pair of leg portions to be able to be brought into contact with a projecting contact of an inspection object, and a second contact portion that is disposed at a second end of the elastic portion and is electrically connected to the first contact portion. Between the pair of leg portions, a gap into which the projecting contact of the inspection object can be inserted is provided, and in a state where the projecting contact is inserted into the gap, the pair of contact portions and the projecting contact can be brought into contact with each other.

Abstract: A system and computer-implemented method for determining load shapes for distributed generation (DG) customers in an electricity generation, distribution, and consumption system without using direct load research data. Existing billing data may provide the amount of electricity delivered to and received from each DG customer each month, interconnection data may provide the installed on-site electricity generation capacity for each DG customer, and the average hourly output from a sample of DG or utility/community scale facility may provide a representative generation profile. The load shapes may include the load delivered to DG customers, the excess generated electricity exported back to the electricity distribution network by the DG customers, the generated electricity consumed on-site, and the load in the absence of DG facility(ies)/customer(s).

Abstract: An oscilloscope comprises a number of analog signal inputs for receiving respective analog input signals, an analog-to-digital converter, ADC, for every analog signal input, each ADC comprising an analog input and a digital output, the analog inputs being coupled to the respective one of the analog signal inputs for receiving the respective analog input signal, and the digital outputs outputting respective digital signals, and a signal processor coupled to the digital outputs of the ADCs that performs predetermined signal processing functions based on at least one of the digital signals and outputs a number of respective digital output signals.

Abstract: A current sensor includes a main current path in which a main current flows, an auxiliary current path in which an auxiliary current flows, a magnetic detection element detecting intensity of a magnetic field in a magnetic detection direction and disposed around a detection target portion which is a part of the auxiliary current path, and a magnetic shield member disposed to surround the detection target portion and the magnetic detection element. The current sensor is configured to measure a magnitude of the auxiliary current flowing through the detection target portion based on the intensity of the magnetic field detected by the magnetic detection element. The auxiliary current path branches from the main current path and has a smaller cross-sectional area than that of the main current path.

Abstract: Traceable cables (e.g., networking cables, power cables, etc.). Some embodiments include a traceable power cable with a battery (e.g., that may be rechargeable from current from an external power source to which the power cable is electrically connected). Some embodiments include a traceable networking cable configured to draw power from power-over-Ethernet (POE) power sourcing equipment (PSE) even if the networking cable is not connected to a separate powered device (PD).

Abstract: A detection circuit of an electronic device includes a resistance detecting circuit and a voltage supplying circuit, wherein the detecting circuit is coupled to an input circuit which is coupled to the electronic device and comprises a plurality of resistors respectively coupled to a plurality of switches, wherein the resistance detecting circuit is arranged to detect whether the input circuit has a resistance variation and generate a detecting signal indicative of the resistance variation; and the voltage supplying circuit is coupled to the resistance detecting circuit to supply a first voltage signal, wherein the voltage supplying circuit receives the detecting signal, and selectively switches the first voltage signal to a second voltage signal according to the detecting signal; wherein the resistance detecting circuit determines whether at least one of the plurality of switches is closed according to the second voltage signal.

Abstract: One example relates to a monitoring circuit that includes a capacitive digital-to-analog converter that receives a binary code, a reference voltage, a monitored voltage, and a ground reference, the capacitive digital-to-analog converter outputting an analog signal based on the binary code, the reference voltage, the monitored voltage, and the ground reference. The monitoring circuit further includes a comparator including a first input coupled to receive the analog signal and a second input coupled to the reference voltage, the comparator comparing the analog signal to the reference voltage and outputting a comparator signal based on the comparison. The monitoring circuit yet further includes a binary code generator that generates the binary code based on the comparator signal, the binary code approximating a magnitude of the monitored voltage.

Abstract: Disclosed examples include systems to determine an on-state impedance of a high voltage transistor, and measurement circuits to measure the drain voltage of a drain terminal of the high voltage transistor during switching, including an attenuator circuit to generate an attenuator output signal representing a voltage across the high voltage transistor when the high voltage transistor is turned on, and a differential amplifier to provide an amplified sense voltage signal according to the attenuator output signal. The attenuator circuit includes a clamp transistor coupled with the drain terminal of the high voltage transistor to provide a sense signal to a first internal node, a resistive voltage divider circuit to provide the attenuator output signal based on the sense signal, and a first clamp circuit to limit the sense signal voltage when the high voltage transistor is turned off.

Abstract: An integrated circuit (IC) includes a first transistor having a first dopant type and a second transistor having a second dopant type opposite to the first dopant type. The first transistor includes a first terminal configured to receive a current, a second terminal connected to a node, and a first gate, and the second transistor includes a first terminal connected to a device under test (DUT), a second terminal connected to the node, and a second gate. Each one of the first gate, the node, or the second gate is capable of receiving a first voltage from a first voltage source simultaneously with another one of the first gate, the node, or the second gate receiving a second voltage from a second voltage source, the first voltage being different from the second voltage.

Abstract: A system and method for analyzing a device under test is provided. The system includes a signal source for generating an incident signal. The incident signal is routed to one or more inputs of the device under test. The system further includes signal separation and routing circuitry for measuring a portion of the incident signal to provide a reference signal and for separating the incident signal and a reflected signal at the one or more inputs of the device under test. The signal separation circuitry for separating the incident signal and the reflected signal at the input of the device under test is accomplished by a resistive device. The system may further include sampling device operationally coupled to the resistive device. The system and method may further include a signal switching mechanism for sequentially routing time slices of two or more signals to be coherently compared.

Abstract: A power supply unit that allows measurement of the capacitance without interrupting operation of the unit is disclosed. The unit includes a controller that causes a voltage change of a capacitor from a first threshold voltage between two periods of time. The time difference of when the voltage reaches a second threshold voltage is measured and the capacitance is determined from the time measurement, voltage change and power dissipation. The determination of capacitance may be performed while the power supply unit is actively supplying power.

Abstract: A sensor arrangement (10) comprises an amplifier (11) having a signal input (12) to receive an input signal (SIN) and a signal output (13) to provide an amplified sensor signal (SOUT) that is an inverted signal with respect to the input signal (SIN). Furthermore, the sensor arrangement (10) comprises a feedback path connecting the signal output (13) to the signal input (12), wherein the feedback path comprises a series connection of a capacitive sensor (14) and a feedback capacitor (15). A voltage source arrangement (19) of the sensor arrangement (10) is connected to a feedback node (18) between the capacitive sensor (14) and the feedback capacitor (15).

Abstract: The invention relates to a testing device for checking at least one first medical electrode (1), wherein the testing device comprises at least one first measuring electrode (2), which can be arranged relative to the first medical electrode (1) to be checked in such a way that the at least one first measuring electrode (2) and the first medical electrode (1) to be checked form a first capacitance (C11); a signal generating device (3), by way of which an alternating current voltage can be generated, by means of which the first capacitance (Cn) can be acted upon; an evaluation device (4), which is designed to determine at least one first test result (P11) in relation to the first capacitance (C11) from a measured impedance curve (I) of an impedance caused in response to the first capacitance (C11).

Abstract: An electromagnetic sensor includes a first magnetic pack unit and a first magnetic unit. The first magnetic unit forms a first magnetic pack, a second magnetic pack, and a third magnetic pack in a first direction. The structure of the electromagnetic sensor enables even and uniform distribution of the magnetic field on the electrode and provides a good sound effect under different frequencies.

Abstract: A MEMS-based atmospheric electric field sensor on the ground includes an arc-roof detection structure and a MEMS electric field measuring module. The arc-roof detection structure includes an electric conducting arc-roof rainproof housing, an electric conducting connecting column, a fixing-supporting chamber body upper part, and a fixing-supporting chamber body lower part. The top part of the electric conducting arc-roof rainproof housing is arc-shaped, and the bottom part of the same is provided with a groove facing towards the top part. The electric conducting connecting column is arranged on a top part of the groove and electrically connected to the arc-roof rainproof housing. The fixing-supporting chamber body upper part is a barrel in the groove. The fixing-supporting chamber body closes the bottom opening of the fixing-supporting chamber body upper part to form a fixing-supporting chamber body. The MEMS electric field measuring module is provided inside the fixing-supporting chamber body.

Abstract: A physical quantity measurement device includes a sensor element having a coupling capacitance formed between a drive electrode and a detection electrode, and a circuit device having a drive circuit adapted to supply a drive signal to the drive electrode, a detection circuit adapted to detect physical quantity information corresponding to a physical quantity based on a detection signal from the detection electrode, and a fault diagnosis circuit, and the fault diagnosis circuit has an electrostatic leakage component extraction circuit adapted to extract an electrostatic leakage component due to the coupling capacitance from one of the detection signal and an amplified signal of the detection signal, and performs a fault diagnosis based on the electrostatic leakage component extracted.

Abstract: A utility meter includes a meter housing that supports at least one current coil, a temperature sensor, and a processing circuit coupled to both. The current coil can be coupled to receive heat energy from a meter socket. The temperature sensor disposed generates a sensor signal based on a temperature within the meter housing. The processing circuit obtains the sensor signal and generates meter temperature information based at least in part thereon. The processing circuit also obtains a first predetermined threshold based on at least one of time of day information and date information. The processing circuit also determines whether an abnormal condition exists by comparing the meter temperature information to a value based on the first predetermined threshold, and generates an output signal to a memory, display or communication circuit responsive to determining that the abnormal condition exists.

Abstract: Provided is an in-field apparatus and method for automatic localization of a fault having occurred at power transmission lines of a power supply system, the in-field apparatus includes a preprocessing unit configured to process measured voltage and/or current raw time series data of the power transmission lines to provide a normalized raw data and/or feature representation of the measured raw time series data, and an artificial intelligence module configured to predict an optimal evaluation time used for evaluation of the measured voltage and/or current raw time series data to localize the fault based on the normalized raw data and/or feature representation.

Abstract: The present disclosure pertains to systems and methods for detecting traveling waves in electric power delivery systems. In one embodiment, a system comprises a capacitance-coupled voltage transformer (CCVT) in an electric power delivery system, the CCVT comprising a first capacitor disposed between an electrical bus and a first electrical node, and a second capacitor electrically disposed between the first electrical node and a ground connection. A resistive divider in electrical communication with a first node may generate a resistive divider electrical signal corresponding to a voltage value. An intelligent electronic device (IED) in electrical communication with the resistive divider monitors a resistive divider voltage signal. The IED detects a traveling wave based on the resistive divider voltage signal and a measurement of a primary current through an electrical bus in electrical communication with the CCVT; and analyzes the traveling wave to detect a fault on the electric power delivery system.

Abstract: An intelligent electronic device (IED) may detect arrival times and/or other characteristics of traveling waves and/or reflections thereof to determine a distance to a fault location in terms of per-unit length. An IED may convert between line distances, line-of-sight distances, straight-line distances, and/or terrain-based distances. An IED may refine one or more physical line parameters used for traveling wave-based location calculations for iterative improvements in accuracy. For instance, an IED may compare reported distances to fault locations with field-verified, confirmed fault locations to refine physical line parameters used in future location calculations. Similarly, an IED may identify which of a plurality of towers corresponds to a fault location based on a mapping of towers on a per-unit scale. Confirmed fault locations may be used to update or refine the mapping to improve future tower identification relative to per-unit fault location.

Abstract: A method for detecting soft faults in a transmission line includes the steps of: acquiring a time-domain reflectogram, calculating the integral of the time-domain reflectogram, selecting, in the integral, three samples P1, P2, P3, calculating a first distance equal to the difference in absolute value between the value of the second sample P2 and the value of the first sample P1 or of the third sample P3, calculating a second distance equal to the difference in absolute value between the value of the first sample P1 and of the third sample P3, performing a first comparison of the first distance to the second distance weighted by a weighting coefficient ?, deducing from the result of the first comparison information on the existence of a soft fault.

Abstract: The present disclosure pertains to systems and methods for analyzing traveling waves in an electric power delivery system. In one embodiment, a system may comprise a traveling wave identification subsystem to receive electric power system signals and identify a plurality of incident, reflected, and transmitted traveling waves. A first traveling wave may be selected from the incident and transmitted traveling waves, and a first distortion may be determined. A second traveling wave subsequent to the first traveling wave, may selected from the incident traveling waves and a second distortion may be determined. A traveling wave analysis subsystem may compare the first distortion and the second distortion and determine whether the first distortion is consistent with the second distortion. A protective action subsystem may implement a protective action based on a first determination that the first distortion is consistent with the second distortion.

Abstract: The present disclosure pertains to systems and methods to detect faults in electric power delivery systems. In one embodiment, a data acquisition system may acquire a plurality of electric power delivery system signals from an electric power transmission line. A traveling wave system may detect a traveling wave based on the plurality of electric power delivery system signals received from the data acquisition system. The traveling wave may be analyzed using a first mode to determine a first mode arrival time and using a second mode to determine a second mode arrival time. A time difference between the first mode arrival time and the second mode arrival time may be determined. A fault location system may estimate or confirm a location of the fault based on the time difference. A protection action module may implement a protective action based on the location of the fault.

Abstract: The present disclosure pertains to systems and methods for monitoring traveling waves in an electric power system. In various embodiments, a data acquisition subsystem may acquire electric power system signals. A traveling wave detection subsystem may detect two or more traveling waves based on the electric power system signals and determine a location of an event triggering the traveling waves. A traveling wave security subsystem may selectively generate a restraining signal based on the location of the event as within a blocking zone. A protection action subsystem may implement a protective action when the location is outside of a blocking zone. In various embodiments, a protective action will not be implemented for traveling waves launched from known locations of switching devices operating normally. Further, protective actions may be restrained if a magnitude of a traveling wave differs from an expected value based on a pre-fault voltage.

Abstract: An image sensor includes a pixel array and a test region adjacent to the pixel array. Each of the pixel array and the test region include a plurality of pixels, and each of the pixels in the test region include: a substrate including a photoelectric conversion element; and a transparent layer formed over the substrate and having an inclined top surface.

Abstract: Monolithic three-dimensional integration can achieve higher device density compared to 3D integration using through-silicon vias. A test solution for M3D integrated circuits (ICs) is based on dedicated test layers inserted between functional layers. A structure includes a first functional layer having first functional components of the IC with first test scan chains and a second functional layer having second functional components of the IC with second test scan chains. A dedicated test layer is located between the first functional layer and the second functional layer. The test layer includes an interface register controlling signals from a testing module to one of the first test scan chains and the second test scan chains, and an instruction register connected to the interface register. The instruction register processes testing instructions from the testing module. Inter-layer vias connect the first functional components, the second functional components, and the testing module through the test layer.

Abstract: New cooling assembly suitable for use in the testing of devices is disclosed. The new cooling assembly transfers heat that is in close proximity to, within vicinity of, and/or in surrounding area adjacent to a DUT (device under test) undergoing testing to a target location that is away from the DUT. Consequently, the DUT is cooled. By employing heat pipes coupled to plates in contact with the DUT, the new cooling assembly augments cooling capacity at the DUT's location and surrounding area. Yet, the use of an ambient air flow generated by a fan is sufficient to manage and dissipate the heat transferred to the target location. Also, the new cooling assembly is readily installable in DUT testing equipment because its design is quite flexible to adapt to various requirements and space constraints of DUT testing equipment for different DUT footprints or form factors.

Abstract: Disclosed herein is circuitry for bypassing a medium voltage regulator during testing. The circuitry includes a low voltage regulator to, in operation, generate a first voltage within a first voltage range for powering first circuitry, and a medium voltage regulator to, in operation, generate a second voltage within a second voltage range greater than the first voltage range for powering second circuitry. A low voltage regulator bypass circuit generates a low voltage regulator bypass signal that operates to selectively bypass the low voltage regulator. A medium voltage regulator bypass circuit bypasses the medium voltage regulator as a function of the low voltage regulator bypass signal and an external voltage regulator select signal, the bypass of the medium voltage regulator being such that an external voltage can be applied to the second circuitry.

Abstract: An embodiment of the present invention provides a computer-implemented method for functional test and diagnostics of integrated circuits. The computer-implemented method includes executing one or more functional test exercisers in a functional execution sequence for a device under test up to one or more checkpoints, applying dynamic clock switching to a clock of the device under test to identify one or more likely causes of a failure identified at the one or more checkpoints, and includes iteratively invoking a portion of the functional execution sequence between a plurality of the checkpoints to progressively isolate the one or more likely causes of the failure as a most likely failure source based at least in part on the applied dynamic clock switching.

Abstract: An embodiment of the present invention provides a computer-implemented method for functional test and diagnostics of integrated circuits. The computer-implemented method includes executing one or more functional test exercisers in a functional execution sequence for a device under test up to one or more checkpoints, applying dynamic clock switching to a clock of the device under test to identify one or more likely causes of a failure identified at the one or more checkpoints, and includes iteratively invoking a portion of the functional execution sequence between a plurality of the checkpoints to progressively isolate the one or more likely causes of the failure as a most likely failure source based at least in part on the applied dynamic clock switching.

Abstract: It is determined, if a simulated hardware signal of a design for an electronic circuit has an influence on a checker for simulation errors. To achieve this, a checker control flow database is generated for a static code description containing checkers and concerned simulated signals. Further, a database based on the output of instrumented verification code is generated, thus gaining dynamic information about the verification code. Herein, the hardware signal values will be associated with colored values or, alternatively, attributed values. For the checkers in the checker control flow database, a list of attributes is generated and stored. Based on the above operations, a hardware signal database is generated, wherein hardware signals are mapped to a list of checkers, based on determining, for each checker in the checker database, the associated hardware signals from its list of attributed values.

Abstract: It is determined, if a simulated hardware signal of a design for an electronic circuit has an influence on a checker for simulation errors. To achieve this, a checker control flow database is generated for a static code description containing checkers and concerned simulated signals. Further, a database based on the output of instrumented verification code is generated, thus gaining dynamic information about the verification code. Herein, the hardware signal values will be associated with colored values or, alternatively, attributed values. For the checkers in the checker control flow database, a list of attributes is generated and stored. Based on the above operations, a hardware signal database is generated, wherein hardware signals are mapped to a list of checkers, based on determining, for each checker in the checker database, the associated hardware signals from its list of attributed values.

Abstract: A scan chain collects scan chain data from testing of a functional circuit and outputs a scan chain signal containing the scan chain data. A voltage monitor circuit operates to compare a supply voltage against a threshold and assert a reset signal when the supply voltage crosses the threshold. The reset signal resets a flip flop circuit whose output signal controls operation of a logic circuit that blocks passage of the scan chain signal to an integrated circuit probe pad and instead applies a constant logic signal to the probe pad indicating a voltage monitoring error.

Abstract: During scan testing a voltage regulator is programmed to supply a first voltage to logic under test during a shift portion of the scan test, a second voltage during a first portion of a capture portion of the scan test and at least a third voltage during a second portion of the capture portion of the scan test. The availability of a programmable voltage regulator during shift and capture portions of scan testing allows a less stressful voltage to be used during a shift portion of the scan test to reduce shift failures and allows various voltages to be used during capture portions of the scan testing as a surrogate for testing at different temperatures and to provide more flexibility in testing margins.

Abstract: Methods of a scan partitioning a circuit are disclosed. One method includes calculating a power score for circuit cells within a circuit design based on physical cell parameters of the circuit cells. For each of the circuit cells, the circuit cell is assigned to a scan group according to the power score for the circuit cell and a total power score for each scan group. A plurality of scan chains is formed. Each of the scan chains is formed from the circuit cells in a corresponding scan group based at least in part on placement data within the circuit design for each of the circuit cells. Interconnect power consumption can be assessed to determine routing among circuit cells in the scan chains.

Abstract: The invention relates to a method for determining a load current, which is based on conducting a calibration current in a particular manner and on particular calculation methods.