Abstract: Provided is a composition including a combination of at least one short peptide and at least one peptide dimer, in defined ratio, to which autoantibodies found in elevated levels in schizophrenic patients bind.

Abstract: The present invention relates to a kit for quantitative analysis of glycated hemoglobin (HbA1c), and the kit for quantitative analysis of HbA1c according to the present invention has excellent long-term stability of an enzyme reagent and thus has an effect of easily overcoming the disadvantages of the conventional reagents used in enzyme assays (e.g., storage, accuracy, portability, convenience of use, etc.).

Abstract: Hemoglobin, its variants, and glycated forms of each are determined individually in a multiplex assay that permits correction of the measured level of HbA1c to account for glycated variants and other factors related to the inclusion of the variants in the sample. New antibodies that are particularly well adapted to the multiplex assay are also provided.

Abstract: Analyte collection and testing systems and methods, and more particularly to disposable oral fluid collection and testing systems and methods. Described herein are methods and apparatuses to achieve significant improvements in the detection of fluorescence signals in the reader.

Abstract: An apparatus for conveying a plurality of articles includes a transport belt, a bumper stopper, and a rotator. A motor moves the transport belt which is adapted to rotate the rotator as the belt conveys the plurality of articles. The stopper can move between first and second positions relative to the transport belt wherein the bumper stopper guides one article toward the rotator when the bumper stopper is in the first position. The bumper stopper allows the article to be conveyed to another location when the bumper stopper is in the second position. The transport belt can continue to convey other articles while the one article is temporarily held in place by the bumper stopper. The rotator is configured to rotate the article conveyed by the transport belt. The article can remain in contact with the transport belt while the rotator is rotating the article.

Abstract: A method for operating a laboratory system comprising laboratory instruments and a laboratory information system is presented. The method comprises grouping laboratory instruments into instrument cluster(s) and providing a cluster manager thereto. The plurality of laboratory instruments publishes their instrument resource descriptions. Each cluster manager maintains an inventory of cluster resources and publishes a list of processing capabilities of the instrument cluster. The laboratory information system assigns processing of test order(s) to instrument clusters. Each cluster manager assigns resources of the laboratory instruments corresponding to test orders from the laboratory information system in view of the inventory of cluster resources. Each laboratory instrument carries out the processing step(s) on the biological sample as instructed by the cluster manager.

Abstract: An automatic analyzer controls a sequence including optical measurement and cleaning and includes a discharge mechanism including a discharge nozzle for discharging a liquid into a reaction vessel; and an overflow suction mechanism including an overflow suction nozzle for sucking an overflow amount of the liquid in the reaction vessel. In a liquid discharge step included in a cleaning process and interposed between a preceding step using a detergent and a succeeding blank value measurement step, the automatic analyzer establishes a first state where a lower end of the discharge nozzle is located in a height-wise lower part of the reaction vessel and a lower end of the overflow suction nozzle is located in an upper part of the reaction vessel, and provides control to carry out the discharge of liquid from the discharge nozzle and the suction of the overflow amount of liquid through the overflow suction nozzle.

Abstract: Work, such as status confirmation, in a plurality of automatic analyzers is efficiently performed. In an automated analysis system, a tablet terminal 114 has a terminal information management unit 210 and a terminal display unit 208. A terminal information management unit 210 acquires device information showing the state status of a device from automatic analyzers 101a to 101d, and generates a status confirmation screen showing the device status of the automatic analyzer. A terminal display unit 208 displays the status confirmation screen. The status confirmation screen has a status information screen showing the device status of one automatic analyzer and a device switch button configured to switch the status information screen to a status information screen corresponding to another other automatic analyzer.

Abstract: Supplying a liquid to a detection chip including a housing having an opening portion and internally housing the liquid and including an elastic sheet covering the opening portion and having a penetrating portion providing communicating between the inside and the outside of the housing, specifically by inserting a liquid delivery nozzle to the housing via the penetrating portion and supplying the liquid into the housing in a state where the nozzle is in contact with the elastic sheet so as to close the penetrating portion. The penetrating portion is one of a hole and a notch. One of the maximum length of the opening of the hole and the maximum length of the notch is smaller than the outer diameter of the nozzle at a portion coming in contact with the elastic sheet when the nozzle is inserted to close the penetrating portion when a liquid is supplied into the housing.

Abstract: A sensor unit includes a plurality of terminal members each of which includes a lead portion and an external terminal portion having an external connection end face, a sensor device connected to the lead portions, and a resin member that covers the sensor device and a part of the plurality of terminal members. The lead portion includes a thin wall portion having a thickness thinner than the external terminal portion and a protruding portion protruding from the thin wall portion to an external connection end face side. In a plan view from a direction where the terminal member and the sensor device overlap, the sensor device is disposed at a position overlapping the protruding portion and not overlapping the external terminal portion.

Abstract: A system and method for determining the speed and direction of rotation of a wheel in a vehicle are provided. The system includes a tone wheel configured for rotation with the vehicle wheel and a wheel speed sensor facing the tone wheel. The sensor generates different pluralities of phase-shifted signals responsive to rotation of the tone wheel depending on the direction of rotation of the vehicle wheel. A controller receives one of the pluralities of phase-shifted signals from the sensor, receives a direction signal indicative of the direction of rotation of the vehicle wheel from a source other than the sensor, and associates the plurality of phase-shifted signals with the direction of rotation of the vehicle wheel indicated by the direction signal in a memory.

Abstract: The present invention discloses a MEMS device and electronic apparatus. The MEMS device comprises: a micro-LED; and a movable member, wherein the micro-LED is mounted on the movable member and is configured for moving with the movable member. According to an embodiment of this invention, the signal detection of a MEMS device can be simplified and/or the contents of signals produced by the MEMS device can be enriched.

Abstract: An inertial sensor includes: a substrate; a moving element swinging about a swing axis along a Y-axis; a detection electrode provided at the substrate, overlapping the moving element as viewed in a plan view from a Z-axis direction orthogonal to the Y-axis, and forming an electrostatic capacitance with the moving element; an exposure part provided at an inner side of the detection electrode and exposing a surface facing the moving element, of the substrate; a protrusion overlapping the moving element as viewed in a plan view from the Z-axis direction and protruding toward the moving element from the exposure part of the substrate; and a covered electrode provided at a top of the protrusion and having a same electric potential as the moving element.

Abstract: The present invention relates to an apparatus for examining and/or processing a sample, said apparatus comprising: (a) a scanning particle microscope for providing a beam of charged particles, which can be directed on a surface of the sample; and (b) a scanning probe microscope with a deflectable probe; (c) wherein a detection structure is attached to the deflectable probe.

Abstract: All fluids, when placed within a Kukharev region at a moment of gravitational resonance, form vibrations of different frequencies within themselves. If, at the same moments of gravitational resonance, forced oscillations of the same frequency are provided as a treatment on a living organism, a double resonance is formed within the fluid, and a sharp increase in the amplitude of oscillations within the fluid formed as a result of the double resonance in turn causes the destruction of the fluid. The method is determined utilizing Kukharev region data on the particular fluid desired to be destroyed or otherwise removed from the living organism. By further fine-tuning the forced oscillation (i.e., the directed radiation), the natural oscillations of the base fluid can be further adjusted to modify the fluid's properties.

Abstract: Provided is a wafer prober. The wafer probing stage of the wafer prober includes: a lower plate; a plurality of lifting pillars mounted on an upper surface of the lower plate; and an upper plate mounted on upper ends of the plurality of lifting pillars, wherein the plurality of lifting pillars are located between the upper plate and the lower plate and ends of the lifting pillars are configured to lift up and down in a vertical direction, and wherein a height and a slope of the upper plate are adjusted according to heights of the lifting pillars. The wafer probing stage can adjust a height of the chuck arranged on the upper plate and a slope or flatness of the chuck by adjusting a height of each lifting pillar according to a weight applied to each lifting pillar.

Abstract: The invention relates to a device for positioning a semiconductor die in a wafer prober, the device comprising a carrier plate and a clamp on a front surface of the carrier plate, the dimensions of the carrier plate matching a standard geometry required by the wafer prober for receiving a semiconductor wafer to be probed by the wafer prober, the clamp being reversibly movable against a force of an elastic element between an open position and a closed position, the clamp being adapted for fixing the die on the carrier plate in the closed position and for releasing the die in the open position.

Abstract: Embodiments are directed to microscale and millimeter scale multi-layer structures (e.g., probe structures for making contact between two electronic components for example in semiconductor wafer, chip, and electronic component test applications). One or more layers of the structures include shell and core regions formed of different materials wherein the core regions are offset from a symmetric, longitudinally extending position.

Abstract: An embodiment includes an apparatus comprising: a substrate including a surface that comprises first, second, and third apertures; and first, second, and third probes comprising proximal ends that are respectively included within and project from the first, second, and third apertures; wherein the first, second, and third probes: (a)(i) intersect a plane that is generally coplanar with the surface, (a)(ii) include distal ends configured to contact electrical contacts of a device under test (DUT), and (a)(iii) are generally linear and each include a major axis that is non-orthogonal to the plane. Other embodiments are described herein.

Abstract: Systems and methods described herein are directed towards integrating a shield layer into a current sensor to shield a magnetic field sensing element and associated circuitry in the current sensor from electrical, voltage, or electrical transient noise. In an embodiment, a shield layer may be disposed along at least one surface of a die supporting a magnetic field sensing element. The shield layer may be disposed in various arrangements to shunt noise caused by a parasitic coupling between the magnetic field sensing element and the current carrying conductor away from the magnetic field sensing element.

Abstract: Methods and apparatus for non-intrusive monitoring by sensing physical parameters such as electric and/or magnetic fields. Such apparatus and techniques may find application in a variety of fields, such as monitoring consumption of electricity, for example.

Abstract: A device to measure the voltage at a test point, also referred to as a test point voltage sensor, comprises a housing formed from a first material and a second material, wherein the first material comprises an insulating material and the second material comprises a conductive or semiconductive material. The housing includes an opening configured to cover a test point of a cable accessory. The device further includes a pressure pad, disposed in the housing, having a conductive mating surface configured to contact a test point of the basic insulation plug or end plug. The device further includes a low side capacitor embedded in the housing and electrically coupled to the conductive mating surface. The device further includes a signal wire electrically coupled to the low side capacitor.

Abstract: According to an embodiment(s), a current detection circuit has first and second main electrodes, a vertical structure output transistor that includes a first control electrode where a control signal is supplied thereto, a third main electrode that is connected to the first main electrode, a second control electrode that is connected to the first control electrode, and a vertical structure detection transistor that has a fourth main electrode. The current detection circuit has a voltage supply circuit that supplies a divided voltage of a voltage between the first and second main electrodes to the fourth main electrode.

Abstract: The present technology relates to a signal processing apparatus, a control method, an image pickup element, and an electronic appliance that achieve the suppression of an increase in electric power consumption. The signal processing apparatus may be configured to control an amount of electric current at a differential stage in a comparison unit that compares signal levels of a plurality of signals and reduce the amount of electric current for a period other than this comparison period. For example, the amount of electric current may be reduced by turning off part of a group of switches each capable of disconnecting a path of an electric current from an electric current source. In addition, for example, the amount of electric current may be reduced by causing a gate potential at the electric current source unit to decrease. The present technology can be applied to, for example, an image pickup element and an electronic appliance.

Abstract: A power consumption calculation apparatus identifies, from a history of a total power consumption Wx measured at a facility including power supply equipment, air conditioning equipment, and communication equipment; identifies, for each Wx, an air conditioning efficiency Ra; calculates a power consumption Wc? in a second area excluding a first area in the facility by applying each Wx and Ra to a relation Wc+Wa+(Wx×Rp)=Wx where Ra is calculated by dividing Wa being a power consumption of the communication equipment by Wa being a power consumption of the air conditioning equipment and Rp is a loss factor of Wx; and calculates a power consumption of the first or second area based on Wx corresponding to a second period in the history, Wc?, Rp, and an air conditioning efficiency Ra? corresponding to the second period.

Abstract: Methods and systems to detect power outage are provided herein. The system includes a Cable Modem Termination System (CMTS) to periodically poll cable modems and determine cable modems of the plurality of cable modems that are offline based on the poll. The system correlates and aggregates locations of the cable modems that are offline to determine a geographic area where a percentage of the cable modems that are offline is higher than a predetermined threshold. A report is generated indicating a power outage in the geographic area when the percentage is above the predetermined threshold.

Abstract: A charge calculation apparatus, system and method allow for a controller to administer an electric power charging operation to one or more client devices, such as an electric vehicle. The vehicle provides its ID to the controller, which in turn calculates a tax according to the vehicle making the request, and other factors such as taxing jurisdiction, amount of electricity used, timing, etc. By controlling the charging operation in this way, the taxing authorities are able to collect tax revenue for use in maintaining roads from the users of those roads by monitoring which vehicles are using electricity to operate the vehicles on the roads. By keeping track of the vehicle's movement within different tax jurisdictions, the tax may be apportioned amongst the different taxing authorities.

Abstract: A method is described for determining the resistance temperature characteristic of a ceramic glow plug, wherein the glow plug is heated at a specified power, wherein before the heating it is first determined whether the glow plug is an aged glow plug, and then, if the glow plug has not been detected as an aged glow plug, the glow plug is heated at a first specified power and the resistance value thereby achieved is assigned to a temperature that is anticipated to be the final temperature when heating a factory-outlet glow plug at this first power, or if the glow plug has been detected as an aged glow plug, the glow plug is heated at a reduced power which is smaller than the first power, and the resistance value achieved thereby is assigned to the same temperature that is also anticipated when heating a factory-outlet glow plug at the first power.

Abstract: Provided is a method for inspecting a piezoelectric element in which voltage is applied to a piezoelectric element and evaluation of the electrical characteristics of the piezoelectric element is performed. The method includes a first step in which the piezoelectric element is held on a flat plate-shaped slightly adhesive sheet and a second step in which voltage is applied to the piezoelectric element held on the slightly adhesive sheet and evaluation of the electrical characteristics of the piezoelectric element is performed.

Abstract: A switching network includes a switch, a driver for the switch, and a floating-regulator that powers the driver. The floating-regulator includes a shunt that is used only when testing the network. The shunt diverts biasing current so that it does not interfere with a measurement of an electrical property of a switch.

Abstract: Systems and methods for testing printed circuit boards (PCBs) are disclosed herein. In one embodiment, a tester for printed circuit boards (PCBs) includes a test fixture having a plurality of electrical contacts for contacting the PCBs that are units under test (UUTs). The test fixture carries a remote test peripheral master (RTPM) module, and a remote test peripheral slave (RTPS) module. The RTPM module and the RTPS module are connected through a remote test peripheral (RTP) bus.

Abstract: Technologies are described herein for enabling the automated testing of remote control units by providing a suitable test system that includes a plurality of test stations for simultaneously testing a plurality of remote control units. Each test station includes features that allow it to interact with the remote control unit's inputs, such as buttons and microphone, and outputs, such as IR and RF remote control codes, status LEDs, and audio output. Each test station may be controlled by a controller that executes test scripts or other routines that exercise the functionality of the remote control unit as desired.

Abstract: The present disclosure provides a testing fixture. The testing fixture includes a carrier, a plurality of sets of electrical lines and a plurality of electrical lines. The carrier includes a base and a frame extending along an upper surface of the base. The base and the frame define a first recess, a second recess extending longitudinally from the first recess, and a third recess extending transversely from the first recess. The plurality of sets of electrical contacts are disposed on the base and arranged in a rotationally symmetrical manner, and the electrical lines are electrically connected to the plurality of sets of electrical contacts.

Abstract: A method of determining whether a silicon-carbide semiconductor device, which has a metal oxide semiconductor (MOS) gate structure and a built-in diode, is a conforming product. The method includes measuring an ON voltage of the silicon carbide semiconductor device, passing a forward current through the built-in diode of the silicon carbide semiconductor device, measuring another ON voltage of the silicon carbide semiconductor device, which is the ON voltage of the silicon carbide semiconductor device after passing the forward current, calculating a rate of change between the ON voltage and the another ON voltage, and determining that the silicon carbide semiconductor device is a conforming product unless the calculated rate of change is less than 3%.

Abstract: A probing system includes a chuck configured to support a device under test (DUT); a probe card disposed above the chuck and including a plurality of probes protruding from the probe card toward the chuck; and a platen disposed between the chuck and the probe card and configured to support the probe card, wherein the chuck includes a shielding member disposed between the platen and the chuck.

Abstract: A wafer probe station includes a thermal chuck, a chuck stage, a platen, some probes, a first focusing device, a second focusing device and a thermal plate. The thermal chuck heats up to an operational temperature and holds a device under test (DUT). The chuck stage connects with the thermal chuck and moves the thermal chuck. The thermal chuck locates between the chuck stage and the platen. The probes are disposed on the platen and configured to contact with the DUT. The first focusing device is disposed on the platen to focus on the DUT. The second focusing device is disposed on the chuck stage to focus on the probes. The thermal plate locates between the second focusing device and the platen and is configured to heat up to the operational temperature. The thermal plate has a through hole aligning with the second focusing device.

Abstract: An address and command port interface selectively enables JTAG TAP domain operations and Trace domain operations within an IC. The port carries TMS and TDI input and TDO output on a single pin and receives a clock signal on a separate pin. The addressable two pin interface loads and updates instructions and data to the TAP domain within the IC. The instruction or data update operations in multiple ICs occur simultaneously. A process transmits data from an addressed target device to a controller using data frames, each data frame comprising a header bit and data bits. The logic level of the header bit is used to start, continue, and stop the data transmission to the controller. A data and clock signal interface between a controller and multiple target devices provides for each target device to be individually addressed and commanded to perform a JTAG or Trace operation.

Abstract: According to one embodiment, a semiconductor device includes: a first scan chain and a second scan chain each including a plurality of cascaded flip-flops; a plurality of power supply lines that supply a power supply voltage to the first and second scan chains, extend in a first direction, and are arranged in a second direction intersecting with the first direction; and a clock control circuit that supplies a first clock to the first scan chain and a second clock to the second scan chain, the second clock having timing different to that of the first clock. The plurality of flip-flops are arranged along the second direction.

Abstract: Disclosed is a semiconductor integrated circuit including a logic circuit, and a plurality of scan flip-flop circuits that hold input data or output data of the logic circuit and are capable of forming a scan chain for executing a scan test of the logic circuit. Each scan flip-flop circuit includes a scan data input part that receives input of scan data for the scan test, a normal data input part that receives input of normal data different from the scan data, and a data holding part capable of separately holding the normal data and the scan data.

Abstract: The present disclosure describes an apparatus, system, and method of use for detecting electrical faults in a multiphase electric machine. Often in platforms which require redundant reliability or have no readily available electrical connection to earth use ungrounded electrical architectures. This allows the system to continue normal operation even if there is an unintended short circuit or current path (electrical fault) between a phase of an electric machine and its case or some other part of the platform. It is important to be able to readily identify any fault in the phase windings of machinery operating in an ungrounded electrical architecture. Since a single fault in an ungrounded system will not cause any additional current draw or otherwise affect the system, it can be difficult to detect that a fault has even occurred. This provides an advanced warning system.

Abstract: A method and apparatus for correcting a state of charge (SOC), a battery management system and a storage medium are provided. The method includes: acquiring state data of a battery cell in a case where the battery cell meets a preset standing condition; determining, according to the state data of the battery cell, a near-steady-state battery model for characterizing a change in an open circuit voltage (OCV) over time in a near-steady-state and a steady-state time period threshold for characterizing whether a standing time period is sufficient; processing the steady-state time period threshold by using the near-steady-state battery model to obtain an estimated steady-state OCV value; determining a SOC corresponding to the estimated steady-state OCV value by using a preset correspondence between steady-state OCVs and SOCs; and correcting a current SOC by using the SOC corresponding to the estimated steady-state OCV value.

Abstract: A method with battery state estimation may include: generating a plurality of electrochemical-thermal (ECT) models corresponding to modeling conditions based on an arbitrary parameter of an ECT model configured to perform modeling of a battery; determining a target parameter of the ECT model based on an error between an actual state of the battery and a model-derived state of the battery obtained by a parallel operation of the plurality of ECT models; and estimating a state of the battery based on the target parameter.

Abstract: An over-discharge diagnosing method includes, among other things, evaluating concurrently, a voltage behavior of a battery pack, a current behavior of the battery pack, and a temperature behavior of the battery pack. The method further includes detecting an over-discharge based on the evaluating, and communicating an over-discharge notification in response to the detecting.

Abstract: A battery management apparatus, including: a sensing unit configured to measure a pack voltage value of a battery pack configured to be charged by receiving a charging current from an engine, output a starting current to turn on the engine, and output an operating current to operate electronic components, and a processor configured to: set a first voltage region by using a first current value (CV) of the charging current and an internal resistance value (IRV) of the battery pack, set a second voltage region by using a second CV of the starting current and the IRV, set a third voltage region by using a third CV of the operating current and the IRV, calculate a voltage change amount of the pack voltage value, compare the first, second, and third voltage regions with the voltage change amount, and determine whether the battery pack is charged or discharged.

Abstract: A system and method to determine battery lifetime of a remote meter transmission unit. Disclosed methods may comprise sampling a meter transmission unit's voltage and temperature while the unit is not transmitting any data; selecting a temperature curve based on the sampled temperature of the unit from a plurality of predetermined temperature curves, wherein each predetermined temperature curve representing the battery lifetime based on the unit's sampled voltage at the unit's sampled temperature; locating a position from the selected curve based on the voltage sampled of the unit; determining the battery's electrical power consumed and remained based on the position of the curve; and determining the battery's lifetime based on the power consumed and remained. The disclosed method may be used to estimate the battery's remaining lifetime. Disclosed products may utilize the disclosed method.

Abstract: A method for determining a battery state of charge (SOC) includes: determining a basic SOC of a battery of a terminal apparatus at a current time; determining rated and maximum power consumption parameters of the terminal apparatus in a time period between the current time and a reference time previous thereto; determining a reference SOC at the current time based on the rated power consumption parameter and an actual SOC at the reference time; determining a minimum SOC at the current time based on the maximum power consumption parameter and the actual SOC at the reference time; and judging whether the basic SOC is between the minimum SOC and the actual SOC at the reference time or not, and if yes, determining the basic SOC as an actual SOC at the current time, and if not, determining the actual SOC at the current time based on the reference and basic SOC.

Abstract: Systems and methods of monitoring and testing a battery module, including generating Electrochemical Impedance Spectra (EIS) of one or more battery modules, fitting the EIS spectra to an equivalent circuit model to establish equivalent circuit fit parameters, measuring an open circuit voltage of the one or more battery modules, measuring a temperature of the one or more battery modules, combining the EIS equivalent circuit fit parameters with measured open circuit and temperature values to determine weighting parameters of the equivalent circuit fit parameters, applying the weighting parameters to the equivalent circuit fit parameters to generate weighted equivalent circuit fit parameters, and generating a state-of-health (SoH) measurement of the one or more battery modules based on the weighted equivalent circuit fit parameters.

Abstract: The present application provides an insulation detection circuit, a method and a battery management system. The circuit includes: a first voltage dividing module, where, one end of the first voltage dividing module is connected to a positive electrode of a power battery to be detected, and the other end of the first voltage dividing module is connected to a first isolation module and a second voltage dividing module respectively; the second voltage dividing module, connected to a negative electrode of the power battery to be detected; the first isolation module, connected to one end of a sampling module; the sampling module, where, the other end of the sampling module is connected to one end of a signal generating module; the signal generating module, where, the other end of the signal generating module is connected to power ground; and the processing module.

Abstract: A device detects a deformation of an electrical energy store. The device has a measuring device which is designed to measure the electrical current/voltage behavior of the energy store, and an evaluation unit which is designed to detect a change in the current/voltage behavior and to determine the deformation on the basis of the change.

Abstract: An illustrative battery charging device may identify a battery to be charged, and charge the identified battery using charge settings that are optimized for the identified battery. In some embodiments, the battery charging device may determine the optimized settings based on monitoring charging performance and discharge activities of the battery over time. The battery charging device may exchange data with a battery management service device, such as by exchanging battery health information, battery settings, and/or other data. The battery charging device may determine charge setting and times to charge a battery that is intended to power an unmanned aerial vehicle to complete a flight path.