Abstract: A method for etching through a selected portion of a metallization layer of a wafer's layer stack in a high density plasma processing chamber includes performing a main etch by etching at least partially through the metallization layer of the layer stack with a main-etch etchant source gas that includes essentially Cl.sub.2 and BCl.sub.3 having a first Cl.sub.2 :BCl.sub.3 flow ratio. Thereafter, an over etch is performed by etching to a layer underlying the metallization layer with an over-etch etchant source gas that includes essentially Cl.sub.2 and BCl.sub.3 having a second Cl.sub.2 :BCl.sub.3 flow ratio that is higher than the first Cl.sub.2 :BCl.sub.3 flow ratio. The method may further include the step of performing a barrier layer etching step for etching a barrier layer of the layer stack prior to performing the over etch.

Abstract: Methods for improving adhesion between various materials utilized in the fabrication of integrated circuits. A first method relates to improving adhesion between a silicon nitride layer and a silicon dioxide layer. The method includes treating a surface of the silicon dioxide layer with a nitrogen plasma in a reactive ion etching process prior to depositing the silicon nitride film on the surface of the silicon dioxide layer. A second method relates to improving adhesion between a silicon nitride layer and a polyimide layer. The method includes the step of treating a surface of the silicon nitride layer with a oxygen/argon plasma in a reactive ion etching process prior to depositing the polyimide layer film on the surface of the silicon nitride layer. A third method relates to improving adhesion between a photoresist layer and a metal.

Abstract: It has been discovered that organic photoresists may be quickly, conveniently, and completely stripped using a hot hydrogen atmosphere. The substrates are preferably exposed to such atmosphere utilizing a hydrogen conveyor furnace. The gases from the furnace are burned to carbon dioxide and water thereby eliminating the need to dispose of a stripping agent.

Abstract: An object of the invention is to enhance the ashing speed of resist. A parallel plate electrode type plasma etching device is used in a mixed gas atmosphere of SF.sub.6 gas and O.sub.2 gas with the concentration of SF.sub.6 gas defined within 5 vol. % to 15 vol. %. A substrate to be treated, coated with a resist of hydrocarbon polymer is placed on a lower electrode. A high frequency electric power is applied to an upper electrode and lower electrode placed parallel to each other, and a plasma of mixed gas is generated in the reactor. A chemical reaction is induced in the resist and active ions of the plasma to vaporize and remove the resist.

Abstract: A plasma process apparatus capacitor operation significantly above 13.56 MHz can produce reduced self-bias voltage of the powered electrode to enable softer processes that do not damage thin layers that are increasingly becoming common in high speed and high density integrated circuits. A nonconventional match network is used to enable elimination of reflections at these higher frequencies. Automatic control of match network components enables the rf frequency to be adjusted to ignite the plasma and then to operate at a variable frequency selected to minimize process time without significant damage to the integrated circuit.

Abstract: Disclosed is a semiconductor etching method comprising exposing the wafer surface, in a plasma etching apparatus, to a radio-frequency plasma comprising a mixture of a noble gas and a saturated or unsaturated reduced carbon compound selected from the group consisting of acetylene (C.sub.2 H.sub.2), benzene (C.sub.6 H.sub.6), graphite or buckminsterfullerene (C.sub.60) and a halogen compound selected from the group consisting of fluorine, chlorine, bromine, hydrogen chloride, hydrogen fluoride, hydrogen bromide, sulphur hexafluoride and nitrogen trifluoride.

Abstract: The described embodiments of the present invention provide a trench etching technique having a high level of control over the sidewall profile of the trench and a high degree of selectivity to the etch mask. The described embodiments are for etching silicon and tungsten, but the invention is suitable for etching a wide variety of materials. A silicon etchant such as HBr, the combination of HBr/SF.sub.6, BCl.sub.3, SICl.sub.4 or other etchant is combined with a passivant such as carbon monoxide or nitrogen. The passivant gases include an interactive .pi. bonding system and/or paired electrons not involved in bonding. These passivant gases create a weak adductive bond to the dangling bonds or radicals generated during etching. The passivant gases also create a weak adductive bond to the sides of the trench being etched and are not removed due to the oblique angle of the sidewalls relative to the reactive ion flux vector corresponding to the trench etch.

Abstract: The invention generally includes a new technique for making cubic boron nitride films with low contamination from other forms of boron nitride such as hexagonal and amorphous boron nitride. Films including either hexagonal or amorphous boron nitride are etched in a gas atmosphere including a halogen and/or hydrocarbon radical, preferably a methyl radical (CH.sub.3 ). Such atmospheres may be a plasma etching atmosphere also including hydrogen and hydrogen atoms. The etching technique is successful in removing hexagonal or amorphous boron nitride and leaving cubic boron nitride, or in converting hexagonal or amorphous boron nitride into cubic boron nitride, thus increasing the concentration of cubic boron nitride in the film. Interestingly, little or no etching of hexagonal or amorphous boron nitride occurs using only hydrogen or hydrogen atoms.