With Radiation Source Patents (Class 250/339.06)
  • Patent number: 9816868
    Abstract: The present invention pertains to a device for measuring a temperature distribution, which can measure a temperature distribution without contacting a minor sample having a three-dimensional structure. More particularly, the device for measuring the temperature distribution can measure a three-dimensional temperature distribution for a sample, wherein the temperature distribution in a depth direction (direction z) of the sample is measured by a thermo-reflectance technique using a chromatic dispersion lens, a diffraction spectrometer and an optical detection array; and the temperature distribution in parallel directions (direction x-y axes) of the sample is measured by the thermo-reflectance technique using a biaxial scanning mirror.
    Type: Grant
    Filed: December 1, 2011
    Date of Patent: November 14, 2017
    Assignee: Korea Basic Science Institute
    Inventors: Ki Soo Chang, Hae Young Choi, Seon Young Ryu, Geon Hee Kim, Sun Cheol Yang
  • Patent number: 9752866
    Abstract: A measurement system is configured to measure a surface structure of a sample. The surface of the sample has a thin film and a via, the depth of the via is larger than the thickness of the thin film. The measurement system includes a light source, a first light splitter, a first aperture stop, a lens assembly, a second aperture stop, a spectrum analyzer and an analysis module. The first light splitter disposed in the light emitting direction of the light source. The first aperture stop disposed between the light source and the first light splitter. The lens assembly is disposed between the first light splitter and the sample. The second aperture stop is disposed between the lens assembly and the first light splitter. The spectrum analyzer is disposed to at a side of the first light splitter opposite to the sample.
    Type: Grant
    Filed: December 29, 2015
    Date of Patent: September 5, 2017
    Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Hsiang-Chun Wei, Yi-Sha Ku, Chia-Hung Cho, Chieh-Yu Wu, Chun-Wei Lo, Chih-Hsiang Liu
  • Patent number: 9541377
    Abstract: Provided is an apparatus for real-time non-contact non-destructive thickness measurement using a terahertz wave, and more particularly, an apparatus for real-time non-contact non-destructive thickness measurement using a terahertz wave, which is capable of measuring a thickness of a sample by irradiating a terahertz continuous wave, which is generated from a wavelength-fixed laser and a wavelength-swept laser and of which the frequency is changed at a high speed, to the sample and measuring the terahertz wave transmitting or reflected from the sample.
    Type: Grant
    Filed: November 9, 2015
    Date of Patent: January 10, 2017
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Dae-Su Yee, Ji Sang Yahng
  • Patent number: 9261351
    Abstract: A method is provided for operating a chromatic range sensor (CRS) system, which may comprise a chromatic point sensor (CPS) system including an optical pen, to measure a low reflectivity surface. The CRS system may include a high sensitivity measurement mode in which it uses an unconventional low sampling rate or “long” self-saturating exposure time, to measure the low reflectivity surface. The “long” self-saturating exposure time may cause one or more detector pixels to self-saturate to at least a saturation threshold level, which prevents them from indicating a valid wavelength peak. Such pixels may define an invalid peak portion of a nominal total measurement range. The CRS may still detect a valid wavelength peak or height measurement, when the surface is located in a valid subset of the nominal total measurement range of the CRS system determined such that it excludes the invalid peak portion.
    Type: Grant
    Filed: March 4, 2015
    Date of Patent: February 16, 2016
    Assignee: Mitutoyo Corporation
    Inventor: Andrew Michael Patzwald
  • Patent number: 9164042
    Abstract: The present invention provides a device for detecting foreign matter and a method for detecting foreign matter to detect a foreign matter on a surface of an object such as a film of an electrode mixture etc. or a foreign matter contained in the object, thereby to improve the reliability of the object. By irradiating an object with a terahertz illumination light 100 (wavelength of 4 ?m to 10 mm) and detecting a scattered light 660 from an electrode 10 as an example of the object by a scattered light detector 200, a foreign matter on a surface of the electrode 10 or contained in the electrode 10, for example, a metal foreign matter 720, is detected. The electrode 10 is one in which electrode mixture layers 700 each including an active material 701, conductive additive and a binder as components are coated on both surfaces of a collector 710. The scattered light 660 results from a part of a transmitted light 656 reflected by the metal foreign matter 720.
    Type: Grant
    Filed: February 1, 2012
    Date of Patent: October 20, 2015
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Kenji Aiko, Shigeya Tanaka, Yasuko Aoki, Hiroshi Kawaguchi, Kei Shimura
  • Patent number: 9040918
    Abstract: The present invention includes a slanted periodically poled device 12 including a light input surface 12a and a light output surface 12b parallel to each other and a terahertz wave input surface 12c orthogonal to the light input surface 12a and the light output surface 12b, a pump beam source 14 which emits pump beam 1 perpendicularly to the light input surface 12a, and a photodetector 16 which detects an up-conversion signal beam A converted from a terahertz wave 3 emitted perpendicularly from the light output surface 12b. The slanted periodically poled device 12 is configured to generate the up-conversion signal beam A in the same direction as and in parallel with the pump beam 1 by quasi phase matching between the terahertz wave 3 perpendicularly incident from the terahertz wave input surface 12c and the pump beam 1.
    Type: Grant
    Filed: April 9, 2014
    Date of Patent: May 26, 2015
    Assignee: RIKEN
    Inventors: Kouji Nawata, Hiroaki Minamide, Hiromasa Ito, Shin'ichiro Hayashi
  • Publication number: 20150136986
    Abstract: A prism member having an entrance surface for arranging a terahertz-wave generator for generating a terahertz wave in response to pump light incident thereon, an arrangement part for arranging an object to be measured, an exit surface for arranging a terahertz-wave detector for detecting a correlation between the terahertz wave transmitted through the object in the arrangement part and probe light, a first optical surface for collimating or condensing the terahertz wave incident thereon from the entrance surface toward the arrangement part, and a second optical surface for condensing the terahertz wave transmitted through the arrangement part toward the exit surface, the arrangement part forms a depression adapted to be filled with a liquid incapable of dissolving the object therein.
    Type: Application
    Filed: May 2, 2013
    Publication date: May 21, 2015
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Kouichiro Akiyama, Takashi Yasuda, Yoichi Kawada, Atsushi Nakanishi
  • Patent number: 9000374
    Abstract: A diagnostic system having a single-port EGR probe and a method for using the same. The system includes a light source, an EGR probe, a detector and a processor. The light source may provide a combined light beam composed of light from a mid-infrared signal source and a mid-infrared reference source. The signal source may be centered at 4.2 ?m and the reference source may be centered at 3.8 ?m. The EGR probe may be a single-port probe with internal optics and a sampling chamber with two flow cells arranged along the light path in series. The optics may include a lens for focusing the light beam and a mirror for reflecting the light beam received from a pitch optical cable to a catch optical cable. The signal and reference sources are modulated at different frequencies, thereby allowing them to be separated and the signal normalized by the processor.
    Type: Grant
    Filed: June 7, 2013
    Date of Patent: April 7, 2015
    Assignee: UT-Battelle, LLC
    Inventors: James E. Parks, II, William P. Partridge, Jr., Ji Hyung Yoo
  • Patent number: 8969805
    Abstract: The base plate is transmissive to terahertz waves, and a sample is disposed at the base plate. In the conductive periodic structure, plural transmission portions that transmit terahertz waves are arrayed with a predetermined period. The conductive periodic structure is disposed apart from a position at which the sample is disposed. The waveguide includes a total reflection surface provided at a boundary face with the conductive periodic structure. The total reflection surface totally reflects incident terahertz waves, and the waveguide guides incident terahertz waves toward the total reflection surface. The magnitudes of one or more of a distance between the position at which the sample is disposed and the conductive periodic structure, a property of the base plate, and the predetermined period are set such that a dip showing a characteristic absorption is formed in a predetermined frequency region of a spectrum of terahertz waves.
    Type: Grant
    Filed: April 5, 2013
    Date of Patent: March 3, 2015
    Assignees: The University of Tokyo, ARKRAY, Inc.
    Inventors: Takayuki Hasebe, Hitoshi Tabata, Shigeru Kitamura
  • Publication number: 20150048250
    Abstract: A process for detecting oil or lubricant contamination in a manufactured product (C), preferably a cigarette (C), the process comprising adding a fluorescent taggant to oils or lubricants contained in processing machinery for said product (C), conveying (131) said product (C) past an infrared detection apparatus (140), irradiating said product (C) with infrared radiation from said detection apparatus (140) as it passes the detection apparatus (140), and detecting infrared radiation emitted from said irradiated product (C). The taggant can be in the form of a composition containing a Stokes-shifting taggant, which absorbs radiation at a first wavelength and emits radiation at a second wavelength, different from said first wavelength, dissolved or dispersed in an oil or lubricant.
    Type: Application
    Filed: May 29, 2012
    Publication date: February 19, 2015
    Applicant: ALTRIA CLIENT SERVICES INC.
    Inventors: Edmond J. Cadieux, Jr., William James Faenza
  • Patent number: 8957380
    Abstract: An optical proximity sensor is provided that comprises an infrared light emitter an infrared light detector, a first molded optically transmissive infrared light pass component disposed over and covering the light emitter and a second molded optically transmissive infrared light pass component disposed over and covering the light detector. Located in-between the light emitter and the first molded optically transmissive infrared light pass component, and the light detector and the second molded optically transmissive infrared light pass component is a gap. Layers of infrared opaque, attenuating or blocking material are disposed on at least some of the external surfaces forming the gap to substantially attenuate or block the transmission of undesired direct, scattered or reflected light between the light emitter and the light detector, and thereby minimize optical crosstalk and interference between the light emitter and the light detector.
    Type: Grant
    Filed: April 30, 2011
    Date of Patent: February 17, 2015
    Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
    Inventors: James Costello, Rani Saravanan, Wee Sin Tan
  • Patent number: 8957377
    Abstract: An apparatus for analyzing, identifying or imaging an target including first and second laser beams coupled to a pair of photoconductive switches to produce CW signals in one or more bands in a range of frequencies greater than 100 GHz focused on and transmitted through or reflected from the target; and a detector for acquiring spectral information from signals received from the target and using a multi-spectral heterodyne process to generate an electrical signal representative of some characteristics of the target. The lasers are tuned to different frequencies and a frequency shifter in the path of one laser beam allows the terahertz beam to be finely adjusted in one or more selected frequency bands.
    Type: Grant
    Filed: October 15, 2013
    Date of Patent: February 17, 2015
    Assignee: Emcore Corporation
    Inventors: Ronald T. Logan, Joseph R. Demers
  • Publication number: 20150041655
    Abstract: Optopair for use in sensors and analyzers of gases such as methane, and a fabrication method therefor is disclosed. It comprises: a) an LED, either cascaded or not, having at least one radiation emitting area, whose spectral maximum is de-tuned from the maximum absorption spectrum line of the gas absorption spectral band; and b) a Photodetector, whose responsivity spectral maximum can be either de-tuned from, or alternatively completely correspond to the maximum absorption spectrum line of the absorption spectral band of the gas. Modeling the LED emission and Photodetector responsivity spectra and minimizing the temperature sensitivity of the optopair based on the technical requirements of the optopair signal registration circuitry, once the spectral characteristics of the LED and Photodetector materials and the temperature dependencies of said spectral characteristics are determined, provides the LED de-tuned emission and Photodetector responsivity target peaks respectively.
    Type: Application
    Filed: May 2, 2014
    Publication date: February 12, 2015
    Applicant: BAH HOLDINGS LLC
    Inventors: MICHAEL TKACHUK, Sergey Suchalkin
  • Publication number: 20150028211
    Abstract: The time-domain spectroscopy analysis system includes a splitter for splitting pulsed light entered, a variable delayer for delaying timing of a first part of the pulsed light split by the splitter, an electromagnetic wave generator for converting a second part of the pulsed light split by the splitter into an electromagnetic wave, a detector for detecting measurement data from a pulse having passed through a measurement object subjected to the electromagnetic wave emitted from the electromagnetic wave generator, and the pulse outputted from the variable delayer, and a comparator for detecting a phase difference between the pulsed light before being entered into the electromagnetic wave generator and the pulsed light outputted from the variable delayer, wherein a result obtained by the comparator is fed back to the variable delayer.
    Type: Application
    Filed: March 30, 2012
    Publication date: January 29, 2015
    Applicant: HITACHI, LTD.
    Inventors: Takahiro Nakamura, Nobuhiro Shiramizu
  • Publication number: 20150028210
    Abstract: The present invention is provided to remove scattering from other parts, except for an end part of a nano-probe, in a near-field microscope, and to enable a spectral analysis by delaying the generation of multiple reflections caused through the shaft of the nano-probe. A first characteristic of the present invention is to temporally delay generation of multiple reflections by manufacturing a probe portion to have a predetermined length or more in a tuning-fork based near-field probe. A second characteristic of the present invention is to provide a near-field microscope which includes a tuning-fork based near-field probe having a structure as above, and can measure a time-domain transient reaction of a scattered wave. A third characteristic of the present invention is to provide a method for performing a spectral analysis on a time-domain signal measured by the near-field microscope.
    Type: Application
    Filed: July 24, 2014
    Publication date: January 29, 2015
    Inventors: Hae Wook HAN, Young Woong DO, Ki Won MOON
  • Patent number: 8933417
    Abstract: A lens and reflector unit for optical measurements includes first and second convex surface sections of the lens and reflector unit. Both have their respective central normal lines. A first flat surface section has a normal direction that divides the angle between the central normal lines into equal halves. A third convex surface section has a third central normal line, and the fourth convex surface section has a fourth central normal line. A second flat surface section has a normal direction that divides the angle between the third and fourth central normal lines into to equal halves.
    Type: Grant
    Filed: January 18, 2010
    Date of Patent: January 13, 2015
    Assignee: Wallac Oy
    Inventor: Pauli Salmelainen
  • Publication number: 20140361172
    Abstract: Methods and systems for real time, in situ detection of a contaminant in a fluid, and particularly the determination of hydrogen sulfide concentration in a natural gas or other hydrocarbon stream, are provided. The system may include a scanning source with wavelength scanning range of 1560-1610 nm and wavelength resolution of 0.01 nm or better. The light from the scanning source is split to two portions: reference path to reference detector with no fluid in the transmission, and sample path to sample detector with fluid in the transmission. The major noise from the light source and transmitting optics is cancelled out by applying log ratio calculation to the two detector signals. The spectroscopic optical data, however obtained, must then be combined into an analytical processing module containing models that analyze the contaminant quantitative data.
    Type: Application
    Filed: June 11, 2014
    Publication date: December 11, 2014
    Inventors: Joseph Paul Little, III, William Tsakopulos, Matt Thomas
  • Publication number: 20140353504
    Abstract: An optical measurement device includes a light source unit including a first laser light source configured to emit a laser beam having a first wavelength and a second laser light source configured to emit a laser beam having a second wavelength, a measurement wave number setting unit, and a light source adjustment unit configured to adjust at least one of the first wavelength and the second wavelength such that a difference between or a sum of a first wave number corresponding to the first wavelength and a second wave number corresponding to the second wavelength matches a measurement wave number set through the measurement wave number setting unit.
    Type: Application
    Filed: May 29, 2014
    Publication date: December 4, 2014
    Inventors: Jumpei Naito, Kota Iwasaki, Masafumi Kyogaku, Yoichi Otsuka
  • Patent number: 8901499
    Abstract: In an embodiment, an apparatus includes a module assembly and a main assembly. The module assembly includes a module assembly housing, a first faceplate and an analysis unit attached to the first faceplate. The main assembly includes a main assembly housing, a second faceplate and an engine unit rigidly attached to the second faceplate. The engine unit generates a light that passes to the analysis unit via a first lens assembly and a second lens assembly. The first lens assembly is attached to the first faceplate and the second lens assembly is attached to the second faceplate. The module assembly when attached to the main assembly causes the first and second faceplates to act as a single mechanical unit that moves independent of movement of the module assembly housing and/or the main assembly housing.
    Type: Grant
    Filed: May 17, 2012
    Date of Patent: December 2, 2014
    Assignee: Thermo Scientific Portable Analytical Instruments Inc.
    Inventors: Kenneth J. Vachon, Jr., Walter J. Doherty, III, Leonid Y. Krasnobaev, Scott E. Miller
  • Publication number: 20140346357
    Abstract: A photoconductive device that includes a semiconductor substrate, an antenna assembly, and a photoconductive assembly with one or more plasmonic contact electrodes. The photoconductive assembly can be provided with plasmonic contact electrodes that are arranged on the semiconductor substrate in a manner that improves the quantum efficiency of the photoconductive device by plasmonically enhancing the pump absorption into the photo-absorbing regions of semiconductor substrate. In one exemplary embodiment, the photoconductive device is arranged as a photoconductive source and is pumped at telecom pump wavelengths (e.g., 1.0-1.6 ?m) and produces milliwatt-range power levels in the terahertz (THz) frequency range.
    Type: Application
    Filed: January 23, 2013
    Publication date: November 27, 2014
    Inventors: Mona Jarrahi, Christopher W. Berry, Ning Wang, Shang-Hua Yang, Mohammed Reza Mahmoodi Hashemi
  • Patent number: 8884228
    Abstract: An apparatus and process is provided to illustrate the manipulation of the internal electric field of CZT using multiple wavelength light illumination on the crystal surface at RT. The control of the internal electric field is shown through the polarization in the IR transmission image under illumination as a result of the Pockels effect.
    Type: Grant
    Filed: January 27, 2012
    Date of Patent: November 11, 2014
    Assignees: Savannah River Nuclear Solutions, LLC, Fisk University
    Inventors: Aaron L. Washington, II, Martine C. Duff, Lucile C. Teague, Arnold Burger, Michael Groza
  • Publication number: 20140299773
    Abstract: The present invention includes a slanted periodically poled device 12 including a light input surface 12a and a light output surface 12b parallel to each other and a terahertz wave input surface 12c orthogonal to the light input surface 12a and the light output surface 12b, a pump beam source 14 which emits pump beam 1 perpendicularly to the light input surface 12a, and a photodetector 16 which detects an up-conversion signal beam A converted from a terahertz wave 3 emitted perpendicularly from the light output surface 12b. The slanted periodically poled device 12 is configured to generate the up-conversion signal beam A in the same direction as and in parallel with the pump beam 1 by quasi phase matching between the terahertz wave 3 perpendicularly incident from the terahertz wave input surface 12c and the pump beam 1.
    Type: Application
    Filed: April 9, 2014
    Publication date: October 9, 2014
    Applicant: RIKEN
    Inventors: Kouji NAWATA, Hiroaki MINAMIDE, Hiromasa ITO, Shin'ichiro HAYASHI
  • Patent number: 8841618
    Abstract: For examining objects, in particular for inspecting persons for suspicious items, devices having a scanning system for scanning the object and having an evaluating system are known. An optical marking system is provided, which indicates the position of an item classified as suspicious on the object itself or in a mirror image of the object by means of visible light.
    Type: Grant
    Filed: November 7, 2012
    Date of Patent: September 23, 2014
    Assignee: Smiths Heimann GmbH
    Inventor: Michael Jeck
  • Publication number: 20140209802
    Abstract: An apparatus configured to acquire information on an object to be measured by an electromagnetic wave pulse, the apparatus includes: a generating unit configured to generate the electromagnetic wave pulse with which the object to be measured is irradiated; a detecting unit configured to detect the electromagnetic wave pulse from the object to be measured; a casing including at least a part of a propagation path of the electromagnetic wave pulse leading from the generating unit to the detecting unit; and a measuring window unit configured to change a propagation distance of the electromagnetic wave pulse by moving a measuring window disposed in a part of the casing. The object to be measured is disposed on an opposite side of the propagation path of the electromagnetic wave pulse inside the casing by interposing the measuring window.
    Type: Application
    Filed: January 22, 2014
    Publication date: July 31, 2014
    Applicant: CANON KABUSHIKI KAISHA
    Inventor: Takeaki Itsuji
  • Publication number: 20140197316
    Abstract: A method and apparatus for analyzing a bitumen-containing process stream and controlling a process. The method including directing a beam of infrared light at the bitumen-containing process stream, capturing light corresponding to the infrared light after interaction with the bitumen-containing process stream, and analyzing the captured light to obtain a spectrum. A composition estimate can be generated based on the spectrum and a calibrated model. A controller is operative to adjust a setpoint of the process in response to the composition estimate.
    Type: Application
    Filed: November 29, 2013
    Publication date: July 17, 2014
    Applicant: Suncor Energy Inc.
    Inventors: Ramesh KADALI, Enbo FENG
  • Patent number: 8779361
    Abstract: An optical proximity sensor is provided that comprises an infrared light emitter an infrared light detector, a first molded optically transmissive infrared light pass component disposed over and covering the light emitter and a second molded optically transmissive infrared light pass component disposed over and covering the light detector. Located in-between the light emitter and the first molded optically transmissive infrared light pass component, and the light detector and the second molded optically transmissive infrared light pass component is a substantially optically non-transmissive infrared light barrier component. The infrared light barrier component substantially attenuates or blocks the transmission of undesired direct, scattered or reflected light between the light emitter and the light detector, and thereby minimizes optical crosstalk and interference between the light emitter and the light detector.
    Type: Grant
    Filed: June 30, 2009
    Date of Patent: July 15, 2014
    Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
    Inventors: James Costello, Rani Saravanan, Wee Sin Tan
  • Publication number: 20140166883
    Abstract: According to the present invention, an electromagnetic wave measurement device includes: an electromagnetic wave detector, a frequency component acquisition unit, and a thickness indication quantity deriving unit. An object to be measured is disposed on a substrate and includes at least two layers, and the electromagnetic wave detector detects a substrate-surface-reflected electromagnetic wave which has been made incident to the object, has been reflected by the substrate, and has passed through the object. The frequency component acquisition unit acquires an amplitude of a frequency component of the substrate-surface-reflected electromagnetic wave. The thickness indication quantity deriving unit derives a thickness indication quantity based on the amplitude of the frequency component of the substrate-surface-reflected electromagnetic wave and a relationship between the thickness indication quantity and the amplitude of the frequency component of the substrate-surface-reflected electromagnetic wave.
    Type: Application
    Filed: December 17, 2013
    Publication date: June 19, 2014
    Inventors: Shigeru ONO, Kazunori SHIOTA, Masaichi HASHIMOTO, Akiyoshi IRISAWA
  • Patent number: 8716665
    Abstract: Various embodiments of a compact optical proximity sensor with a ball grid array and windowed or apertured substrate are disclosed. In one embodiment, the optical proximity sensor comprises a printed circuit board (“PCB”) substrate comprising an aperture and a lower surface having electrical contacts disposed thereon, an infrared light emitter and an infrared light detector mounted on an upper surface of the substrate, an integrated circuit located at least partially within the aperture, a molding compound being disposed between portions of the integrated circuit and substrate, an ambient light detector mounted on an upper surface of the integrated circuit, first and second molded infrared light pass components disposed over and covering the infrared light emitter and the infrared light detector, respectively, and a molded infrared light cut component disposed between and over portions of the first and second infrared light pass components.
    Type: Grant
    Filed: September 10, 2009
    Date of Patent: May 6, 2014
    Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
    Inventors: Yufeng Yao, Chi Boon Ong, Wee Sin Tan
  • Patent number: 8716667
    Abstract: The present invention relates to a switching apparatus, a switching method, and an electronic device with which it is possible to detect whether or not a proximal object is a human skin.
    Type: Grant
    Filed: April 6, 2010
    Date of Patent: May 6, 2014
    Assignee: Sony Corporation
    Inventor: Satoshi Mitani
  • Publication number: 20140097344
    Abstract: The base plate is transmissive to terahertz waves, and a sample is disposed at the base plate. In the conductive periodic structure, plural transmission portions that transmit terahertz waves are arrayed with a predetermined period. The conductive periodic structure is disposed apart from a position at which the sample is disposed. The waveguide includes a total reflection surface provided at a boundary face with the conductive periodic structure. The total reflection surface totally reflects incident terahertz waves, and the waveguide guides incident terahertz waves toward the total reflection surface. The magnitudes of one or more of a distance between the position at which the sample is disposed and the conductive periodic structure, a property of the base plate, and the predetermined period are set such that a dip showing a characteristic absorption is formed in a predetermined frequency region of a spectrum of terahertz waves.
    Type: Application
    Filed: April 5, 2013
    Publication date: April 10, 2014
    Applicants: ARKRAY, INC., THE UNIVERSITY OF TOKYO
    Inventors: Takayuki Hasebe, Hitoshi Tabata, Shigeru Kitamura
  • Publication number: 20140061475
    Abstract: A contactless thickness measuring apparatus is provided which includes an terahertz transmitter configured to receive the first optical path signal from the coupler and to generate a terahertz continuous wave using the first optical signal and an applied bias; an optical delay line configured to delay the second optical path signal output from the coupler; and an terahertz receiver configured to receive the terahertz continuous wave penetrating a sample and to detect an optical current using the terahertz continuous wave and the second optical path signal delayed. A thickness of the sample is a value corresponding to the optical current which phase value becomes a constant regardless of a plurality of measurement frequencies.
    Type: Application
    Filed: March 13, 2013
    Publication date: March 6, 2014
    Applicant: Electronics and Telecommunications Research Institute
    Inventor: Electronics and Telecommunications Research Institute
  • Publication number: 20140054463
    Abstract: According to an embodiment of the present disclosure, an apparatus of inspecting an overlapped substrate obtained by bonding substrates together is provided. The apparatus includes a first holding unit configured to hold and rotate the overlapped substrate, and a displacement gauge configured to measure displacements of peripheral sides of a first substrate and a second substrate constituting the overlapped substrate while rotating the overlapped substrate held by the first holding unit.
    Type: Application
    Filed: August 15, 2013
    Publication date: February 27, 2014
    Applicant: Tokyo Electron Limited
    Inventors: Shinji KOGA, Akinori MIYAHARA, Hiroshi TOMITA, Shuji IWANAGA, Takeshi TAMURA
  • Publication number: 20140021351
    Abstract: An apparatus for analyzing, identifying or imaging an target including first and second laser beams coupled to a pair of photoconductive switches to produce CW signals in one or more bands in a range of frequencies greater than 100 GHz focused on and transmitted through or reflected from the target; and a detector for acquiring spectral information from signals received from the target and using a multi-spectral heterodyne process to generate an electrical signal representative of some characteristics of the target. The lasers are tuned to different frequencies and a frequency shifter in the path of one laser beam allows the terahertz beam to be finely adjusted in one or more selected frequency bands.
    Type: Application
    Filed: September 20, 2013
    Publication date: January 23, 2014
    Applicant: Emcore Corporation
    Inventors: Ronald T. Logan, Joseph R. Demers
  • Patent number: 8633441
    Abstract: A method of aligning a die when the die is held with a circuit pattern on a first side of the die facing away from an infrared light source, wherein infrared light from the infrared light source is projected onto a second side of the die opposite to the first side such that the infrared light passes through a body of the die. From the second side of the die, an image of the infrared light reflected from the circuit pattern is detected and captured. Thereafter, an alignment of the die from the captured image of the die is determined.
    Type: Grant
    Filed: September 2, 2009
    Date of Patent: January 21, 2014
    Assignee: ASM Assembly Automation Ltd
    Inventors: Ran Shi Wang, Wing Hong Leung, Siu Wing Lau
  • Publication number: 20140001364
    Abstract: An optical system for use in a spectroscopy procedure includes one or more semiconductor diodes configured to generate an input signal beam with a wavelength shorter than 2.5 microns that is amplified and communicated through optical fiber(s) to a nonlinear element configured to broaden the spectral width to at least 50 nm through a nonlinear effect. A subsystem includes lenses or mirrors to deliver an output beam having a broadened spectrum selected to obtain a desired penetration depth and substantially minimize water absorption with a temporal duration greater than about 30 picoseconds to a sample to perform spectroscopy to characterize the sample. The output beam may have a repetition rate between continuous wave and one Megahertz or higher with a time averaged output power of 10 mW or more and a time averaged intensity of less than approximately 50 MW/cm2.
    Type: Application
    Filed: January 25, 2013
    Publication date: January 2, 2014
    Applicant: CHEETAH OMNI, L.L.C.
    Inventor: CHEETAH OMNI, L.L.C.
  • Patent number: 8614096
    Abstract: Method of determining a total HF concentration metric in an environment including measuring an uncorrected HF concentration metric in the environment based on a first infrared absorption measurement at a wavelength corresponding to a vibrational frequency of a non-hydrogen bonded gas phase HF molecule; determining an ambient H2O concentration metric in the environment available for reaction with the non-hydrogen bonded gas phase HF molecules at or about the time of obtaining the first infrared absorption measurement; calculating a HF hydrate concentration metric in the environment based on the uncorrected HF concentration metric, the ambient H2O concentration metric and a reaction equilibrium relationship between the non-hydrogen bonded gas phase HF molecule and the HF hydrate; and determining the total HF concentration metric in the environment based on the uncorrected HF concentration metric and an amount of HF determined by the HF hydrate concentration metric.
    Type: Grant
    Filed: September 1, 2011
    Date of Patent: December 24, 2013
    Assignee: ExxonMobil Research and Engineering Company
    Inventors: Manuel S. Alvarez, David B. Spry
  • Publication number: 20130334418
    Abstract: An improved laser module for a tunable diode laser spectroscopy analyzer. The improvement is a programmable non-volatile memory device (such as an EEPROM device) attached to the module. In addition, an improved method for updating the laser parameters for a tunable diode laser analyzer when a new laser module is installed in the analyzer. The improvement is the step of reading the parameters from a programmable non-volatile memory device (such as an EEPROM device) attached to the module.
    Type: Application
    Filed: June 17, 2013
    Publication date: December 19, 2013
    Inventors: Alan Cowie, Jie Zhu
  • Patent number: 8610071
    Abstract: The present invention provides a measuring method comprising the steps of holding a specimen on a flat-plate periodic structure, applying a linearly-polarized electromagnetic wave to the periodic structure, and measuring characteristics of the specimen based on change of the electromagnetic wave scattered forward or backward by the periodic structure, wherein the periodic structure is structured such that plural unit structures having the same shape are two-dimensionally and periodically interconnected in a direction of one reference plane, the unit structure has at least one aperture penetrating therethrough in a direction perpendicular to the reference plane, the electromagnetic wave is applied from a direction perpendicular to the reference plane, and the unit structure has a shape that is not mirror-symmetric with respect to an imaginary plane orthogonal to a polarizing direction of the electromagnetic wave.
    Type: Grant
    Filed: February 28, 2013
    Date of Patent: December 17, 2013
    Assignee: Murata Manufacturing Co., Ltd.
    Inventors: Seiji Kamba, Kazuhiro Takigawa, Takashi Kondo, Koji Tanaka
  • Publication number: 20130327943
    Abstract: A diagnostic system having a single-port EGR probe and a method for using the same. The system includes a light source, an EGR probe, a detector and a processor. The light source may provide a combined light beam composed of light from a mid-infrared signal source and a mid-infrared reference source. The signal source may be centered at 4.2 ?m and the reference source may be centered at 3.8 ?m. The EGR probe may be a single-port probe with internal optics and a sampling chamber with two flow cells arranged along the light path in series. The optics may include a lens for focusing the light beam and a mirror for reflecting the light beam received from a pitch optical cable to a catch optical cable. The signal and reference sources are modulated at different frequencies, thereby allowing them to be separated and the signal normalized by the processor.
    Type: Application
    Filed: June 7, 2013
    Publication date: December 12, 2013
    Inventors: James E. Parks, II, William P. Partridge, JR., Ji Hyung Yoo
  • Patent number: 8581193
    Abstract: An electronic device having one or more sensors is provided. The sensors may include any suitable type of sensor that emits or receives radiation (e.g., light waves) from the environment. The electronic device may include openings through which radiation may reach the sensors while keeping the sensors hidden from view. In some embodiments, the sensors may be placed underneath an opening used for an audio receiver such that radiation is piped to the sensors using a light path or a chamfered surface along the opening. In some embodiments, the sensors may be embedded in a screen such that the radiation emitted by the sensors exits the screen instead of being reflected on the screen. In some embodiments, the sensors may be placed along the periphery of the display, such that access to the sensors is provided via discontinuities in a gasket used to couple the display to the electronic device.
    Type: Grant
    Filed: November 16, 2012
    Date of Patent: November 12, 2013
    Assignee: Apple Inc.
    Inventors: Richard Hung Minh Dinh, Christopher T. Mullens, Ching Yu John Tam, Brian Q. Huppi
  • Patent number: 8546760
    Abstract: An apparatus for checking thickness dimensions in a semiconductor wafer (1) during grinding operations includes an optical probe (3) which transmits infrared radiations on the surface (2) being machined of the wafer (1), and detects beams that are reflected by said surface, by an opposite surface (2?) of the wafer and/or by surfaces (2?, 2??) separating different layers in the wafer. The beam of emitted and reflected radiations travels along a path (4) with known and constant discontinuities, in part through the air (15) and in part through a cushion (30) of low flow liquid, which flows with substantially laminar flow. A support and positioning element (7) for the optical probe includes hydraulic ducts (22,25) that generate the liquid cushion. A method for checking the thickness dimensions includes the generation of the liquid cushion at the path along which the beam of emitted and reflected radiations travels.
    Type: Grant
    Filed: July 18, 2008
    Date of Patent: October 1, 2013
    Assignee: Marposs Societa'per Azioni
    Inventor: Carlo Dall'Aglio
  • Publication number: 20130228688
    Abstract: A fast switching arbitrary frequency light source for broadband spectroscopic applications. The light source may operate near 1.6 um based on sideband tuning using an electro-optic modulator driven by an arbitrary waveform generator. A Fabry-Perot filter cavity selects a single sideband of the light source. The finesse (FSR/??FWHM) of the filter cavity may be chosen to enable rapid frequency switching at rates up to 5 MHz over a frequency range of 40 GHz (1.3 cm?1). The bandwidth, speed and spectral purity are high enough for spectroscopic applications where rapid and discrete frequency scans are needed. Significant signal-to-noise advantages may be realized using the rapid and broadband scanning features of this system in many areas of spectroscopy, e.g., process monitoring and control, reaction dynamics, and remote sensing (e.g., greenhouse gas monitoring, biological/chemical agent screening).
    Type: Application
    Filed: March 14, 2013
    Publication date: September 5, 2013
    Inventor: United States of America as represented by the Secretary of Commerce, NIST
  • Patent number: 8487238
    Abstract: A method for estimating a chemical composition of a material in a borehole penetrating the earth, the method includes: placing an analysis unit into the borehole; placing a sample of the material onto an enhanced surface of the analysis unit, the enhanced surface having a feature configured to increase an electric susceptibility of the sample at an interface between the sample and the enhanced surface; illuminating the sample at the interface with a first light beam and a second light beam; measuring sum frequency light generated from the illuminating; and analyzing the sum frequency light to estimate the chemical composition of the material.
    Type: Grant
    Filed: December 7, 2009
    Date of Patent: July 16, 2013
    Assignee: Baker Hughes Incorporated
    Inventor: Sebastian Csutak
  • Patent number: 8476592
    Abstract: Provided is a terahertz wave apparatus. The terahertz wave apparatus includes: a wavelength-fixed laser emitting a first laser light having a fixed first wavelength; a wavelength-swept laser emitting a second laser light having a tunable second wavelength; a coupler coupling the first laser light with the second laser light; and a generator converting a mixed light emitted from the coupler into a terahertz wave, wherein a frequency of the terahertz wave is continuously tunable.
    Type: Grant
    Filed: October 20, 2010
    Date of Patent: July 2, 2013
    Assignees: Electronics and Telecommunications Research Institute, Korea Research Institute of Standards and Science
    Inventors: Min Yong Jeon, Kyung Hyun Park, Dae-Su Yee
  • Patent number: 8445838
    Abstract: A method for generating a deselect mapping for a focal plane array according to one embodiment includes gathering a data set for a focal plane array when exposed to light or radiation from a first known target; analyzing the data set for determining which pixels or subpixels of the focal plane array to add to a deselect mapping; adding the pixels or subpixels to the deselect mapping based on the analysis; and storing the deselect mapping. A method for gathering data using a focal plane array according to another embodiment includes deselecting pixels or subpixels based on a deselect mapping; gathering a data set using pixels or subpixels in a focal plane array that are not deselected upon exposure thereof to light or radiation from a target of interest; and outputting the data set.
    Type: Grant
    Filed: February 4, 2009
    Date of Patent: May 21, 2013
    Assignee: Lawrence Livermore National Security, LLC
    Inventors: Jay V. Bixler, Timothy G. Brandt, James L. Conger, Janice K. Lawson
  • Patent number: 8445850
    Abstract: Disclosed is an open-path optical sensor. Typically, the optical sensor directs UV radiation from a source assembly to a detector assembly along a monitoring path. The source assembly emits UV radiation corresponding to a signal channel and to a reference channel. The detector assembly detects UV radiation corresponding to the signal channel and to the reference channel. The detector assembly is in communication with a data acquisition system, which compares the intensity of the detected UV radiation corresponding to the signal channel to the intensity of the UV radiation corresponding to the reference channel.
    Type: Grant
    Filed: June 20, 2011
    Date of Patent: May 21, 2013
    Assignee: The United States of America as represented by the Administrator of the U.S. Environmental Protection Agency
    Inventors: Eben Daniel Thoma, Cary Doman Secrest, William A. Mitchell, William C. Squier
  • Patent number: 8433526
    Abstract: A method of determining a steam quality of a wet steam located in an interior of a steam turbine includes emitting from an optical probe a plurality of wavelengths through the wet steam, measuring with the optical probe a wet steam intensity corresponding to each of the plurality of wavelengths emitted through the wet steam, determining an intensity ratio vector by dividing the wet steam intensity by a corresponding dry steam intensity for each of the plurality of wavelengths, successively applying scaling factors to the intensity ratio vector to obtain a scaled intensity ratio vector, calculating a suitable value for each of the scaling factors to obtain a plurality of residuals, determining a minimum residual of the plurality of residuals, determining a droplet size distribution by calculating the droplet number density corresponding to the minimum residual, and determining the steam quality based on the droplet size distribution.
    Type: Grant
    Filed: November 12, 2010
    Date of Patent: April 30, 2013
    Assignee: General Electric Company
    Inventors: Binayak Roy, Tao Guo
  • Patent number: 8421011
    Abstract: A glass pane (1) has an inner side (6) and an outer side (5) and a detector (10) located on the inner side (6) for electromagnetic radiation which, coming from the outer side (5), passes through the glass pane (1) and can be detected by means of the detector. The glass pane (1) is a composite pane, in particular a glass pane of composite safety glass of a motor vehicle, with an inner pane (3) and an outer pane (2), which are joined to each other with the aid of a film (4) arranged between the inner pane (3) and the outer pane (2). In order also to obtain a sufficient intensity of the electromagnetic radiation passing through the glass pane (1) and detectable by the detector (10) in glass panes with a small transmission coefficient, it is proposed that the beam path of the electromagnetic radiation leading to the detector (10) penetrate only the material of the outer pane (2) and pass through the plane of the inner pane (3) in the region of a continuous hole (7).
    Type: Grant
    Filed: September 4, 2008
    Date of Patent: April 16, 2013
    Assignee: Saint-Gobain Glass France
    Inventors: Martin Melcher, Jan Gruenert, Karl-Josef Ollfisch, Marc Maurer
  • Patent number: 8405032
    Abstract: A system for imaging a distribution of an absorbent material within an absorbent article. The system includes a radiation source and a detector positioned such that the absorbent article is situated between the radiation source and the detector. The absorbent article includes an absorbent material having a spatial distribution within the absorbent article. Infrared radiation within a particular wavelength range (e.g., 3 ?m to 3.2 ?m) is more likely to be absorbed by the absorbent material than by other materials within the absorbent article. The radiation source is configured to generate infrared radiation incident on the absorbent article. The detector is configured to detect a quantity of the infrared radiation within the particular wavelength range that was transmitted through the absorbent article. The radiation source is further configured to generate data indicative of the spatial distribution of the absorbent material based on the detected quantity of the infrared radiation.
    Type: Grant
    Filed: December 16, 2009
    Date of Patent: March 26, 2013
    Assignee: The Procter & Gamble Company
    Inventors: Stephen Michael Varga, Michael Dennis Kembel
  • Patent number: 8395122
    Abstract: Apparatus for detection of infrared radiation emitted from a taggant following excitation of the taggant sample measures the decay time of the radiation used. If the decay characteristic is accurately measured, the particular taggant can be accurately identified. The apparatus comprises an electronic controller, light-emitting diodes, a photo-detector, a first amplifier, a three-way sampling switch, filter/stores, second amplifiers and an output display. The infrared emission is excited by repeatedly illuminating the taggant for a period of microseconds every few milliseconds. When the light source is turned off, the sample continues radiating for a few milliseconds. The emission is detected by photo-detector sensitive to the 800 to 1000 nm waveband thereby rejecting interference from visible light sources.
    Type: Grant
    Filed: November 16, 2011
    Date of Patent: March 12, 2013
    Assignee: Filtrona C&SP Limited
    Inventors: Philip John Allen, Andrew John Gilbert