Abstract: Systems for THz transmission using new types of THz waveguides with low loss, negligible group velocity dispersion and structural simplicity are described herein. The THz system incorporates the use of a waveguide with two or more substantially parallel conductive elements which may enable many new THz sensing applications. It is now possible to direct the THz pulse inside of containers or around corners, where line-of-sight optics are not practical. Moreover, the systems allow use of either radially polarized or linearly polarized THz antennas. The disclosed systems are compatible with existing terahertz generation and detection techniques.

Abstract: Methods for determining corrosion products on a substrate are disclosed. In one embodiment, a non-destructive method for determining an amount of corrosion product on a metallic substrate includes non-destructively determining a value Ia of infrared energy absorbed in a corrosion product on a metallic substrate; and correlating the value Ia of the infrared energy absorbed to an amount of the corrosion product.

Abstract: A system for detecting the burn degree of skin includes a laser source for generating laser light, a light-splitting device for splitting the laser light into a pump beam and a probe beam, a modulation device positioned on the optical path of the pump beam, a sampling device positioned between the light-splitting device and the modulation device, a terahertz pulse emitter for generating terahertz pulses by irradiating of the pump beam, a terahertz pulse detector for detecting the terahertz pulse reflected by a sample, a current detector electrically connected to the terahertz pulse detector, and a phase lock-in amplifier electrically connected to the current detector. The terahertz pulse emitter includes a plurality of photoconductive antennas positioned in an array manner, and the system further includes a first fiber coupler for transmitting the pump beam from the modulation device to the photoconductive antennas of the terahertz pulse emitter.

Abstract: A radiation sensor that can operate in the THz regime comprising: a micro antenna, which may comprise a two-dimensional patterned thin-film metallizations on a thin dielectric pellicle fabricated by micro machining of a silicon wafer; a thermally isolated microstructure; a coupling mechanism for coupling the energy from the micro antenna to the microstructure, the coupling mechanism providing high thermal isolation between the micro antenna and the microstructure; a temperature signal detector on the microstructure; and signal processing electronics for receiving the temperature signal and processing it into useful data.

Abstract: A security detection system includes a radiation source configured to generate and direct terahertz radiation onto an object. Further, the system also includes a detector module configured to detect and process radiation from the object, the detector module comprising a parallel arrangement of at least two low noise amplifiers, each operable in a respective frequency band.

Abstract: Method and apparatus for determining a thickness of a deposited material. Energy is passed through the deposited material, wherein some of the energy is transmitted. The transmitted energy is received, and the received energy is used to determine a thickness of the deposited material.

Abstract: A method for determining a location of IR-cut filter film on a substrate, the filter film and the substrate cooperatively functioning as an IR-cut filter, includes the steps of: providing an infrared laser device, an IR-cut filter and an infrared laser sensor; emitting a laser from the IR laser device to a surface of the IR-cut filter in a manner such that the laser beam is obliquely incident on an edge portion of the IR-cut filter; and determining the location of the filter film on the substrate of the IR-cut filter in such a way that, if the intensity of the laser beam received by the infrared sensor is equal to or close to zero, the location of the filter film is on a surface of the substrate facing towards the infrared laser device; if the intensity of the laser beam received by the infrared sensor is the same as or close to an intensity of the laser beam emitted from the infrared laser device, the location of the filter film is on a surface of the substrate facing away from the infrared sensor.

Abstract: A system, method and detection arrangement for investigation of a sample are described. A laser illumination arrangement generates (i) a source laser energy that is incident on a source to cause emission of subcentimeter radiation, at least a portion of which interacts with the sample to serve as a sample influenced radiation incident on a detector and (ii) a detector laser energy that is incident on the detector to produce an optical component of the detector laser energy offset with respect to a corresponding optical component of the source laser energy so that the collective energy at the detector generates an electrical output signal responsive to the sample influenced radiation. In another aspect, a detection arrangement is used with at least two continuous wave lasers for causing the detector body to respond in a way which produces a frequency down-converted signal from an incident electromagnetic radiation.

Abstract: There is disclosed an apparatus comprising: a terahertz wave generation device which generates a terahertz wave; a terahertz wave irradiation device which irradiates an object to be inspected with the terahertz wave; and a scattering intensity detection device which cuts a rectilinear wave of the terahertz wave which has passed through the object to be inspected and which detects an intensity of a scattered wave, and a scattered material such as powder or foam contained in an envelope, a capsule, a container or the like is detected in a non-destructive manner without unsealing the envelope or the like.

Abstract: A coherent radiation imaging system that produces digital images with a reduced amount of speckle. Radiation from a long coherence length source is used to form an image of a sample. The output coherent wave is temporally divided into a plurality of wavelets. The spatial phase of each wavelet is then modulated a known and different amount. Each phase modulated wavelet illuminates the sample and is perturbed by its interaction with the sample. A spatial phase map of each perturbed wavelet is then created and converted to a sample image with an image reconstruction program. The plurality of sample images thus formed is statistically averaged to form a final averaged image. The high frequency speckle that is not optically resolvable tends to average to zero with continual statistical averaging, leaving only the optically resolvable lower frequency phase information.

Abstract: Optical corrosion monitoring and detection systems as well as methods to detect and monitor corrosion under process conditions and generally in real time using electromagnetic radiation, particularly light. The systems generally provide for incident light to be allowed to reflect from a coating which is exposed to the corroding action of the process stream. As the coating is corroded, the intensity, or other function, of the incident light is changed and this change is detected and used to extrapolate a level of corrosion.

Abstract: A method for remote analysis of materials embedded in a frozen surface, such as in the icy surface of a planetary body. A laser on board a spacecraft irradiates the frozen surface and thereby releases materials in a gas cloud, by a process of desorption. The laser wavelength is selected to maximize the release of substances by the desorption process, which does not fragment materials into their elemental components. An infrared (IR) spectrometer on the spacecraft detects thermal emissions from the gas cloud against a background provided by the frozen surface, and can readily identify a variety of organic, inorganic and biological materials from their thermal spectra.

Abstract: A method of analyzing a remotely-located object includes the steps of inducing a volume of an ionized ambient gas to emit pulsed terahertz radiation directed toward a targeted object by focusing an optical pump beam in the volume and ionizing another volume of the ambient gas to produce a sensor plasma by focusing an optical probe beam in the other volume of ambient gas. The interaction, in the sensor plasma, of the focused optical probe beam and an incident terahertz wave, which is produced by the targeted object reflecting, scattering, or transmitting the pulsed terahertz radiation, produces a resultant radiation. Detecting an optical component of the resultant radiation emitted by the sensor plasma facilitates detection of a signature of the targeted object imposed onto the incident terahertz radiation.

Abstract: A device for use with a source of radiation to provide a THz emission image representing a sample. The device comprises a substrate, a metallic probe having a tip adjacent to the substrate surface and a source of AC bias coupled between the probe tip and substrate. Radiation generated by the source of radiation is incident on the substrate surface in the vicinity of the probe tip and generates THz emission based at least on the AC bias coupled between the probe tip and substrate. A method for providing a THz emission image representing a sample is also provided.

Abstract: A system for detecting defects in paint coatings includes a temperature manipulation apparatus configured to change the temperature of a surface and a coating applied to the surface. The system may further include an infrared sensor for measuring the change in temperature (over time) of the surface and coating and a processor to compare the measured change in temperature of the surface and coating to an expected change of temperature (over time) in order to determine anomalies in the coatings. A self-referencing method of determining defects is also disclosed, wherein surrounding pixels are utilized as a reference in the detection process for calculating the change in temperature of each pixel. In addition, application of the inventive aspects to inspection of adhesion interfaces is also disclosed.

Abstract: Method and system to identify, verify and remediate subterranean anomalies. Infrared (IR) thermographic scanning [10] of a selected surface area obtains image area data [12, 14] inferring such an anomaly. Ground penetrating radar (GPR) is used [22] at predetermined surface locations penetrates subterraneously to a depth including the anomaly, creating vertical dimension radar data [120] showing anomaly depth. Surface image IR data is correlated with GPR data to verify the anomaly and its vertical dimension and finds [124] a central location in the anomaly. Anomaly volume is predetermined from the area data and vertical-dimension data. Grout injected [26, 124] into the central location at first pressure secures the anomaly by surrounding the central location. After verifying centrally securement, more grout is injected [32, 126] into the anomaly region at second pressure at least as great as the first pressure until the total grout injected approximates the predetermined anomaly volume.

Abstract: Methods are provided for determining the presence of cracks in razor blades during manufacturing. The methods may include, for example, providing a plurality of razor blades in a stack, inducing a current in the stack, and measuring a parameter that is related to the current and indicative of the presence or absence of cracks in the razor blades.

Abstract: An apparatus for investigating a sample comprising a source of a beam of radiation, a detector for detecting a beam of radiation reflected by or transmitted through a sample to be imaged, an optical subsystem for manipulating the beam between the source and detector and means for translating the optical subsystem along a first translation axis relative to the source and detector to scan the beam across the sample, wherein the source and the detector are on opposite sides of the subsystem and the beam from the source and the beam reflected or transmitted each enter and exit the subsystem in a direction parallel to the first direction of translation. The apparatus is also suitable for maintaining the relative phase of two beams of radiation, during translation of an optical subsystem.

Abstract: A defect detection system for thermally imaging a structure that has been energized by sound energy. The system includes a transducer that couples a sound signal into the structure, where the sound signal induces acoustic chaos in the structure that causes defects in the structure to heat up. In one embodiment, the transducer is a broadband transducer. A thermal imaging camera images the structure when it is heated by the sound signal.

Abstract: A millimeter wave imaging system that includes at least one millimeter wave frequency scanning antenna for collecting frequency dependent beams of millimeter wave radiation from a narrow one-dimensional field of view. The collected radiation is amplified at the collected frequencies and the amplified signals are separated into frequency dependent bins with a tapped-delay beam-former. These bins are then sampled to produce a one-dimensional image of the antenna field of view. A two dimensional image of a target may be obtained by moving the target across the field of view of the scanning antenna. In a preferred embodiment the antenna is only 4.5 inches in length and constructed from WR-10 waveguide with inclined slots cut in one of the narrow walls at 79 mil spacings. This geometry creates a frequency-scanned antenna spanning a 20 degree vertical field of view over a 75.5–93.5 GHz operational band of the sensor, starting at approximately 1 degree below horizontal at 93.

Abstract: A pulse controller device for controlling the excitation of a heat source used in thermographic imaging is disclosed. The pulse controller device comprises a power supply, a heat source coupled to the power supply, a device coupled to the power supply signaling the power supply to deliver electrical power to the heat source, a sensor for sensing the delivery of electrical power to the heat source, a flash duration module coupled to said sensor for measuring a duration of time, and a gate device coupled to said flash duration module for gating the electrical power utilized by the heat source. A method for thermographically evaluating a sample is also disclosed.

Abstract: An apparatus and method for imaging a sample, the apparatus including a source for irradiating a sample with a beam of substantially continuous electromagnetic radiation having a frequency in the range 25 GHz to 100 THz; means for subdividing an area of the sample which is to be imaged into a two dimensional array of pixels; means for detecting radiation from each pixel wherein the detector is configured to detect a phase dependent quantity of the detected radiation which is measured relative to the radiation which irradiates the sample.

Abstract: A security sensor system includes beam projecting and receiving units (1) and (2). The proper range of the received beam level is adjusted with change in time of the received beam level so that in the case that the received beam level departs from the proper range, the amount of beam projected from the beam projecting unit (1) can be adjusted to enable the received beam level to fall within the proper range. The unit (2) includes a received beam level detector (27), a level setting circuit (28) for setting a proper range of the received beam level, a request signal output circuit (30) for outputting a request signal requesting an adjustment of the amount of beam, and a transmitter (33) for transmitting the request signal to the unit (1). The unit (1) includes a beam projecting power adjustor (15) operable in response to the request signal.

Abstract: A thermal imaging method to detect heat flows from naturally-heated subsurface objects. The method uniquely combines precise, emissivity-corrected temperature maps, thermal inertia maps, temperature simulations, and automatic target recognition to display clear, clutter-free, three-dimensional images of contained hollow objects or structures, at depths to 20 times their diameter. Temperature scans are corrected using two different infrared bands. Co-registered object-site temperature scans image daily and seasonal temperature-spread differences, which vary inversely as the object's and surrounding host material's thermal inertias. Thermal inertia (resistance to temperature change) is the square root of the product (k?C), for thermal conductivity, k, density, ? and heat capacity, C.

Abstract: A detection apparatus is discloses comprising an emitter for emitting a plurality of optical pulses; a detector for receiving the optical pulses from the emitter; and a controller connected to the emitter and the detector, the controller comparing a difference between at least one pulse received at the detector and at least one other pulse received at the detector with a threshold to detect the presence of an object between the emitter and detector. Also discloses is an object processing system, which automatically detects the presence of objects at at least one predetermined location during object processing, comprising an object processing subsystem; and an object detection subsystem communicatively connected to the object processing subsystem.

Abstract: A method of obtaining a series of images of a three-dimensional object. The method includes the steps of transmitting pulsed terahertz (THz) radiation through the entire object from a plurality of angles, optically detecting changes in the transmitted THz radiation using pulsed laser radiation, and constructing a plurality of imaged slices of the three-dimensional object using the detected changes in the transmitted THz radiation. The THz radiation is transmitted through the object as a two-dimensional array of parallel rays. The optical detection is an array of detectors such as a CCD sensor.

Abstract: An apparatus and a method are disclosed for measuring at least one desired parameter of a patterned structure having a plurality of features defined by a certain process of its manufacturing, wherein the structure represents a grid having at least one cycle formed of at least two metal-containing regions spaced by substantially transparent regions with respect to incident light defining a waveguide. The method utilizes an optical model based on at least some of the features of the structure defined by a certain process of its manufacturing, and is capable of determining theoretical data representative of photometric intensities of light components of different wavelengths specularly reflected from the structure and of calculating said at least one desired parameter of the structure.

Abstract: A defect detection system for thermally imaging a structure that has been energized by sound energy. The system includes a transducer that couples a sound signal into the structure, where the sound signal causes defects in the structure to heat up. In one embodiment, a hard metal disk is positioned between the transducer and the structure to help couple the sound energy from the transducer into the structure. A predetermined force is applied to the transducer and a pulse duration and a pulse frequency of the sound signal are selected so that the sound energy induces acoustic chaos in the structure, thus generating increased thermal energy. A thermal imaging camera images the structure when it is heated by the sound signal.

Abstract: An optical density sensor disposed over a target surface in an image formation apparatus comprises an integrating cavity having a diffuse, reflective interior surface and a view port formed therein. An optical source directs light through the view port onto the target surface, without striking any interior surface of the cavity. Light reflected from the target surface is detected by an optical detector disposed within the cavity. The optical source may be disposed in a collimator, which may extend into the interior of the cavity, and may include a lens. A circuit card which may include an optical detector sensing circuit may be disposed proximate the optical detector. A compensating slot formed in the cavity may allow some reflected light to directly impact the optical detector as the gap between the cavity and the target surface increases.

Abstract: An image processing method is provided for obtaining a non-deteriorated pixel value as a pixel value of a pixel free from a defect such as a scar or dust from non-visible beam image information obtained from a defective recording medium having the scar or dust.

Abstract: A method of obtaining a series of images of a three-dimensional object by transmitting pulsed terahertz (THz) radiation through the entire object from a plurality of angles, optically detecting changes in the transmitted THz radiation using pulsed laser radiation, and constructing a plurality of imaged slices of the three-dimensional object using the detected changes in the transmitted THz radiation. The THz radiation is transmitted through the object as a scanning spot. The object is placed within the Rayleigh range of the focused THz beam and a focusing system is used to transfer the imaging plane from adjacent the object to a desired distance away from the object. A related system is also disclosed.

Abstract: In a defect inspection apparatus which combines a plurality of probes for measuring electric properties of a specimen including a fine circuit line pattern with a charged particle beam apparatus, the charged particle beam apparatus reduces a degradation in resolution even with an image-shift of ±75 ?m or more. The defect inspection apparatus has a CAD navigation function associated with an image-shift function. The CAD navigation function uses coordinates for converting an image-shift moving amount to a DUT stage moving amount in communications between an image processing unit for processing charged particle beam images and a memory for storing information on circuit line patterns. The defect inspection provides the user with significantly improved usability.

Abstract: Diffuse reflectance spectroscopy using near infrared and mid infrared radiation is used to detect the presence of organic chemical compounds in gems. Suitably, diffuse reflectance infrared Fourier transformation spectroscopy is employed to detect the presence of organic compounds in gems using mid infrared and near infrared radiation. The apparatus uses an integrating sphere or integrating cylinder with a probe that acts as both a source of near infrared radiation and a detector of reflected diffuse internal energy from the gem. Alternatively, the integrating sphere or integrating cylinder is replaced with a reflective fluid which surrounds the gem and causes total internal reflection.

Abstract: Systems and methods for reconstructing a plurality of images of an object. An exemplary system includes a radiation source adapted to emit radiation at a plurality of frequencies; a lens with frequency-dependent focal length, such as a Fresnel lens, adapted to receive radiation modified by the object and to project onto a fixed image plane a frequency-dependent image of a slice of the object perpendicular to the radiation path; a sensor for capturing the frequency-dependent image of the object; and apparatus for facilitating creation and capture of a plurality of frequency-dependent images of the object at the plurality of frequencies. A system for reconstructing a tomographic image of the object further includes apparatus for assembling the plurality of frequency-dependent images to reconstruct the tomographic image. Methods and systems are described for use in the visible, audible, and THz frequency ranges and with broadband or narrowband radiation sources.

Abstract: A smoke detector is shown in which blue light is directed through a scattering volume (9) from a radiation emitter (3) and infra-red radiation is also directed through the scattering volume (9) from an infra-red source (3A). Radiation forward-scattered by any particles in the scattering volume (9) is directed by a mirror (13) onto a photodiode (15) which produces an output to control means (16). The emitters (3,3A) are pulsed at different frequencies, enabling the control means (16) to produce separate signals (21,23) corresponding respectively to the scattered blue light and the scattered infra-red radiation. For smoke particles, significantly more blue light is scattered than infra-red radiation, but this is not so much the case for non-smoke particles. A comparator (25) takes the ratio of the two signals (21,23) to produce a smoke-dependent warning output.

Abstract: Systems and methods for detecting defects in a test specimen. The method generally includes applying a liquid detection medium to the test specimen and exciting the test specimen to cause the liquid detection medium to produce a defect signature for a defect in the test specimen. The liquid detection medium is monitored for defect signatures produced by the liquid detection medium.

Abstract: Methods for examining through holes of a component according to prior art generally use hot gases for the thermographic detection of blockages. The inventive method for examining the structure of through holes of a component considerably simplifies said techniques, using a medium which has at least one absorption edge in the region of the wavelength of the camera and thus appears opaque in the camera image.

Abstract: A method and apparatus for calibrating an acoustic thermography system 10 and/or enhancing the flaw detection abilities of such a system is provided. The method allows applying a material (e.g., 103) to a specimen 12 undergoing acoustic thermography inspection. The material is thermally responsive to acoustic energy transmitted to the specimen by the acoustic thermography system. In one aspect thereof, a thermal response of the material applied to the specimen when subjected to acoustic energy is processed to determine whether the level of acoustic energy applied by the acoustic thermographic system appropriately meets a desired amount of acoustic energy for inspecting the specimen. In another aspect thereof, the thermal response of the specimen in combination with the applied material may be processed to determine whether certain types of flaws (e.g.

Abstract: A flaw inspection system (10) contains a substrate (12) to be inspected, such as a generator tube wall, a rotor of a generator, an aircraft skin, having or thought to have interior defects (24, 26) such as stress cracks, where the substrate (12) has attached reference blocks (14, 16) also containing defects (18, 20) of the type that might be found in the substrate, where an ultrasonic generator (28) emits sound waves (30) which contact all the defects, causing heat (32) which is sensed by a thermal camera (50) which, in association with a controller (54) causes images (60, 62) to appear on a monitor (52) from which the type and number of defects (24, 26) in the substrate (12) can be determined.

Abstract: A terahertz (THz) frequency radiation source to emit radiation in a narrow wavelength band within a range of about 3 ?m to 3000 ?m. This source includes: a broad bandwidth emitter to generate a broad bandwidth emitted wavelength band within the wavelength range; a first planar waveguide optically coupled to the broad bandwidth emitter to transmit the broad bandwidth radiation; a disk resonator evanescently coupled to the first planar waveguide with a resonance wavelength band within the emitted wavelength band; and a second planar waveguide evanescently coupled to the disk resonator to transmit radiation in the narrow wavelength band. The emitted wavelength band has a bandwidth greater than or equal to about 0.01 times a mid-band wavelength. The resonance wavelength band has a resonance wavelength bandwidth of less than or equal to about 0.25 times the emitted bandwidth. The narrow wavelength band is substantially equal to the resonance wavelength band.

Abstract: An electromagnetic weapon that includes semi-randomly arranged antenna elements and a central weapon computer. The antenna elements are coordinated to function as an active phased array capable of finding and executing a resonate mode of a target. The central weapon computer controls all the antenna elements, and is able to determine the location of all the antenna elements.

Abstract: The present invention relates to metrologic methodologies and instrumentation, in particular laser-frequency domain infrared photocarrier radiometry (PCR), for contamination and defect mapping and measuring electronic properties in industrial Si wafers, devices and other semiconducting materials. In particular the invention relates to the measurement of carrier recombination lifetime, ?, carrier diffusivity, D, surface recombination velocities, S, carrier diffusion lengths, L, and carrier mobility, ?, as well as heavy metal contamination mapping, ion implantation mapping over a wide range of dose and energy, and determination of the concentration of mobile impurities in SiO2 layers on semiconductor substrates. The present invention provides a method and complete photocarrier radiometric apparatus comprising novel signal generation and analysis techniques (carrier-wave interferometry) as well as novel instrumental hardware configurations based on the physical principle of photocarrier radiometry.

Abstract: The present invention provides systems and methods for non-destructively detecting material abnormalities beneath a coated surface, comprising a mid-infrared (MIR) illumination unit for illuminating an area of the coated surface, and an MIR 2-D imager, which includes an MIR CCD or CMOS camera, for capturing an image of a material abnormalities under the illuminated area of the coated surface. In addition, the system may further comprise a scanning unit for moving the system to a next area.

Abstract: A methodology and concomitant system for the reconstruction of an object from measurements of the transmitted intensity of scattered radiation effected by irradiating the object with a source of radiation. The measurements of the transmitted intensity are both spatially sampled and limited. The transmitted intensity is related to either the absorption coefficient or diffusion coefficient, or both, of the object by an integral operator. The image is directly reconstructed by executing a prescribed mathematical algorithm, as determined with reference to the integral operator, on the transmitted intensity of the scattered radiation. In a preferred embodiment, the data is measured using a paraxial arrangement composed on a single source and a small number of on-axis and off-axis detectors with the arrangement being moved over the measurement surface to measure the set of sampled and limited data.

Abstract: A method for reconstructing internal surface geometry of a part includes registering a thickness map for the part with external surface data for the part. The thickness map has a number of thickness data. Internal surface data is generated using the thickness map and the external surface data to reconstruct the internal surface geometry.

Abstract: A system for detecting and characterizing media includes a light source, at least two sensors, and a media identification system. The light source is positioned to emit at least a portion of an illumination light towards a media path for media. The sensors are positioned to capture at least specular light and transmitted light from the emitted illumination light directed towards the media path for the media.

Abstract: In a method of evaluating a piezoelectric field, non-destructive spectrometry of piezoelectric fields is performed in a semiconductor heterojunction using a technique different from PR spectroscopy. In the method, at first, first and second absorption spectra are measured by irradiating the sample with infrared light at first and second angles, respectively. Then, a peak position of an absorption band having incident-angle dependent intensity is specified, based on the first and second absorption spectra. Thus, the piezoelectric field strength is obtained using a relationship between the piezoelectric field and an electron energy level corresponding to the peak position.

Abstract: A microscope for producing an image of a target using THz radiation. The microscope comprises a source for providing an optical pump pulse and an optical probe pulse; a THz emitter for activation by pump pulse to emit a THz pulse that irradiates the target to form a target-modified THz pulse; a THz detector for modulating the probe pulse with the target-modified THz pulse to create a modulated optical probe pulse characteristic of the target; an optical detection system for modifying and detecting the modulated optical probe pulse and converting the modulated optical probe pulse to electronic information; and a processor for receiving the electronic information and producing an image of the sample using the electronic information. The THz emitter and detector comprise one or more EO crystals. The target is positioned on one of the EO crystals in a near-field of the THz pulse.

Abstract: An infrared three-dimensional imaging system and method in which an object is irradiated by monochromatic radiation in the near-infrared or mid-infrared region of the spectrum. A spectral image is captured for each wavelength in a spectral range by a radiation detector to create a spectral image data block that is stored on a data storage device. The object is rotated by some predetermined angular increment until a complete three hundred and sixty degree view is obtained so that a spectral image data block is created for each angular position. Each spectral image data block is compressed to its most relevant spectral information and used to re-create a three dimensional image by a known computerized tomography algorithm.

Abstract: Mesoporous silica is shown to be a sample holder for laser desorption/ionization of mass spectrometry. Supported mesoporous silica was prepared by coating an ethanolic silicate solution having a removable surfactant onto a substrate to produce a self-assembled, ordered, nanocomposite silica thin film. The surfactant was chosen to provide a desired pore size between about 1 nanometer diameter and 50 nanometers diameter. Removal of the surfactant resulted in a mesoporous silica thin film on the substrate. Samples having a molecular weight below 1000, such as C60 and tryptophan, were adsorbed onto and into the mesoporous silica thin film sample holder and analyzed using laser desorption/ionization mass spectrometry.