Abstract: One variation of a method includes: capturing a first image depicting a target surface; accessing a toolpath including a set of keypoints for execution by the spray system; navigating the set of spray nozzles across a first segment of the target surface; applying paint onto the first segment of the target surface; capturing a second image depicting paint applied onto the first segment of the target surface; navigating the set of spray nozzles across a second segment of the target surface; applying paint onto the second segment of the target surface; capturing a third image depicting paint applied onto the second segment of the target surface; and aggregating the first image, the second image, and the third image into a paint map representing application of paint onto the first segment and the second segment of the target surface.

Abstract: An example of an apparatus is provided. The apparatus includes a printhead to dispense drops of print fluid on a media. The drops are to travel along a drop path through air from the printhead. In addition, the apparatus includes a light source to emit light across the drop path. The apparatus also includes a detector to detect an intensity of the light received from the light source. The drop path is to intersect an optical path from the light source to the detector. Furthermore, the apparatus includes a coating disposed on the optical path between the drop path and the detector. The coating is to absorb a threshold amount of the light.

Abstract: A printer according to an embodiment includes a conveying unit, a holding unit, a supporting unit, a second detecting unit, and a control unit. The conveying unit conveys paper. The holding unit includes a light emitting unit configured to radiate light and a first detecting unit configured to detect the light reflected on the paper. The supporting unit supports the holding unit to be movable in an orthogonal direction orthogonal to a conveying direction of the paper. The second detecting unit is disposed on an opposite side of the light emitting unit across a paper conveying path, on which the conveying unit conveys the paper, and detects the light radiated by the light emitting unit. The control unit determines, based on a detection result of the second detecting unit, whether the light emitting unit is present in a position opposed to the second detecting unit.

Abstract: Provided is a glass eccentricity measurement device which includes an irradiation unit that irradiates a side surface of a coated glass fiber obtained by coating the striated glass with light, and a light receiving unit that receives light scattered and/or refracted following irradiation of the side surface of the coated glass fiber therewith, and measures an eccentricity of the glass in the coated glass fiber by a pattern of brightness and darkness in the light received by the light receiving unit, in which three or more sets including the irradiation unit and a screen are provided around the coated glass fiber, and the sets are arranged respectively in directions having different angles on a circumference centered on the coated glass fiber.

Abstract: Scanning mirror systems for display devices are disclosed. A display device comprises a light source and a scanning mirror system coupled to a support structure, the scanning mirror system comprising a mirror, a flexure supporting the mirror, and a first anchor and a second anchor each coupled to the support structure. The scanning mirror system further includes a first arm extending between the first anchor and a first portion of the flexure, a second arm extending between the first anchor and a second portion of the flexure, and also includes a third arm, a fourth arm, and an actuator system. Each of the first arm and the second arm define a respective gap that extends inwardly from an outer perimeter of the scanning mirror system. The actuator system is configured to actuate the arms to vary a scan angle of the mirror.

Abstract: An apparatus for inspecting a wafer process chamber is disclosed. In one example, the apparatus includes: a sensor, a processor, and a lifetime predictor. The sensor captures information about at least one hardware part of the wafer process chamber. The processor processes the information to determine a hardware condition of the at least one hardware part. The lifetime predictor predicts an expected lifetime left for the at least one hardware part based on the hardware condition.

Abstract: When a film thickness of a second epitaxial film is measured, an infrared light is irradiated from a surface side of the second epitaxial film onto a base layer on which a first epitaxial film and the second epitaxial film are formed. A reflected light from an interface between the first epitaxial film and the base layer and a reflected light from a surface of the second epitaxial film are measured to obtain a two-layer film thickness, which is a total film thickness of the first epitaxial film and the second epitaxial film. The film thickness of the second epitaxial film is calculated by subtracting a one-layer film thickness, which is a film thickness of the first epitaxial film, from the two-layer film thickness.

Abstract: A system and method for Automated Detection and Measurement of Corneal Haze and the Demarcation Line is disclosed. Data extraction module performs visual data and statistics generation to detect corneal haze and calculate corneal attributes in images.

Abstract: Embodiments of the present disclosure provide techniques and configurations for inspection of a package assembly with a thermal solution, in accordance with some embodiments. In embodiments, an apparatus for inspection of a package assembly with a thermal solution may include a first fixture to house the package assembly on the apparatus, and a second fixture to house at least a portion of a thermal solution that is to be disposed on top of the package assembly. The apparatus may further include a load actuator, to apply a load to a die of the package assembly, via the thermal solution, and a plurality of sensors disposed around the thermal solution and the package assembly, to perform in situ thermal and/or mechanical measurements associated with the application of the load to the die of the package assembly. Other embodiments may be described and/or claimed.

Abstract: A processing end point detection method detects a timing of a processing end point (e.g., polishing stop, changing of polishing conditions) by calculating a characteristic value of a surface of a workpiece (an object of polishing) such as a substrate. This method includes producing a spectral waveform indicating a relationship between reflection intensities and wavelengths at a processing end point, with use of a reference workpiece or simulation calculation, based on the spectral waveform, selecting wavelengths of a local maximum value and a local minimum value of the reflection intensities, calculating the characteristic value with respect to a surface, to be processed, from reflection intensities at the selected wavelengths, setting a distinctive point of time variation of the characteristic value at a processing end point of the workpiece as the processing end point, and detecting the processing end point of the workpiece by detecting the distinctive point during processing of the workpiece.

Abstract: A method for determining change in temperature of different parts of an electronic or optoelectronic device between un-energized and energized states without contacting the device. The method includes establishing a reference image form an unexcited device by illuminating the device with an optical signal and capturing the reference image from the device in an un-energized state, illuminating the device with an optical signal during an energization pulse having a predetermined pulse width and pulse magnitude and capturing a plurality of on images from the device at different time delays, determining a transient temperature profile, calibrating the temperature profile for one or more regions of the device with unknown thermoreflectance coefficient based on the determined transient temperature profile for the one or more regions of the device with known thermoreflectance coefficient.

Abstract: A printing device includes a print media pathway connecting a print media source with a marking component. A flexible member, positioned in the pathway, is deflected by a moving sheet of media to be printed by the marking component. A sensor system outputs a signal in response to a detected deflection of the flexible member. A weight output component outputs a weight-related value for the sheet based on the output signal. The weight-related value may correspond to one of a predefined set of print media weight ranges, each range associated with one or more respective settings for the printing device. An adjustment component adjusts the settings of the printing device based on the weight-related value. This allows the printing device to respond dynamically to changes in print media weight without the need to be provided with the weight of the print media currently installed in the printer by a user.

Abstract: A thin-film coating applicator assembly is disclosed for coating substrates in outdoor applications. The innovative thin-film coating applicator assembly is adapted to apply performance enhancement coatings on installed photovoltaic panels and glass windows in outdoor environments. The coating applicator is adapted to move along a solar panel or glass pane while applicator mechanisms deposit a uniform layer of liquid coating solution to the substrate's surface. The applicator assembly comprises a conveyance means disposed on a frame. Further disclosed are innovative applicator heads that comprise a deformable sponge-like core surrounded by a microporous layer. The structure, when in contact with a substrate surface, deposits a uniform layer of coating solution over a large surface.

Abstract: A device for monitoring a machine movement of a movable constructional element includes a detecting device and a control device. The detection device comprises at least one transmission unit which transmits a signal, and a reception unit which receives the signal. The control device comprises an evaluation unit which evaluates the signal received at the reception unit. The control device allows the machine movement upon a receipt of the signal at the reception unit, and to output a first triggering pulse to stop the machine movement in an absence of the signal at the reception unit. The evaluation unit comprises a first threshold value measuring unit to detect a signal strength of the signal received at the reception unit and which, upon detection that a predetermined threshold value of a signal strength is fallen short of, outputs a second triggering pulse to stop the machine movement.

Abstract: Continuous on-line thin film measurements employ a sensor having a spectrometer for interferometric measurements and a stack of single channel detectors for adsorption measurements. The stack is separated from the spectrometer, which analyzes radiation that emerges (transmitted pass or reflected from) the film, whereas the stack analyzes radiation that has passed through the film multiple times. The spectrometer is (i) positioned directly opposite the source of radiation so that it detects transmitted radiation or (ii) disposed on the same side of the film as is the source of radiation so that the spectrometer detects radiation that is specularly reflected from the film. The sensor includes a broadband radiation source emitting visible to far infrared light which propagates through a measurement cell defined by reflective surfaces exhibiting Lambertian-type scattering. The sensor is capable of measuring thin plastic films with thicknesses down to 1 micron or less.

Abstract: An image forming apparatus includes: a toner image forming section; a transfer section; a fixing section; a conveyance roller section disposed on a downstream side of the fixing section in a sheet conveyance direction; a conveyance guide section disposed on a downstream side of the conveyance roller section and including a first guide member disposed on a fixing side of a sheet and a second guide member disposed on a rear surface side of the sheet; a feeding-path-switching section disposed on a downstream side of the conveyance guide section and configured to switch sheet feeding paths; and a nip angle adjusting section configured to change a nip angle of a conveyance nip in accordance with whether a sheet on which an image is formed on a first surface thereof is conveyed, or a sheet on which an image is formed on a second surface thereof is conveyed.

Abstract: An apparatus and a system for measuring the thickness of a thin film are provided. The apparatus includes a signal detector, a Fast Fourier Transform (FFT) generator, an Inverse Fast Fourier Transform (IFFT) generator, and a thickness analyzer. The signal detector detects an electric field signal with respect to a reflected light that is reflected from a thin film. The FFT generator performs FFT with respect to the electric field signal to separate a DC component from an AC component of the electric field signal. The IFFT generator receives the separated AC component of the electric field signal, performs IFFT with respect to the AC component, and extracts a phase value of the AC component. The thickness analyzer measures the thickness of the thin film using the extracted phase value.

Abstract: The objective is to develop a method for determining the quality of a liquid product containing polyphenols. The present invention is a method that is a significant improvement over existing methods that use conventional laboratory instrumentation to study the quality of liquid products. The method uses an adsorption cell with a small mirror as a reflecting surface and acts as a substrate for the adsorption of the liquid's polyphenols on its surface. The polyphenol's film thickness is measured by laser ellipsometry. Light from a monochromatic light source is reflected from the thin film of polyphenol, which changes the light's optical properties and are sensed using the principles of ellipsometry. The changes in state of polarized light are translated into graphical illustrations of measured and computed parameters that can be recognized and interpreted as distinctive properties of liquid product quality.

Abstract: An apparatus for measuring the thickness of a measurement object, preferably a measurement object in the form of a web or piece goods, in a measuring gap, with a measuring mechanism which is fitted to a machine frame, wherein the measuring mechanism for measuring the thickness comprises one or more travel measurement sensor(s) aimed at the measurement object, is characterized in that a compensation sensor which is coupled to a travel measurement sensor measures the distance to a reference rule in order to detect and compensate for a change in the measuring gap, in that the reference rule is in the form of a side of a frame-shaped reference device integrated in the measuring mechanism, and in that the reference device is configured in such a manner that the distance between the reference rule and that side of the reference device which is opposite the reference rule is known during the thickness measurement. A corresponding method for measuring the thickness is also stated.

Abstract: A print head protection device is used with an inkjet printer having a print head adapted for elevating. A roller is mounted upstream of the print heads and above the process path a predetermined distance. A cover on the roller outer surface contacts the sheet lead edge if sheet curl exceeds a set curl range. The cover will cause rotation of the roller by engaging the sheet. A rotary encoder is mounted for synchronous rotation with the roller. The rotary encoder generates a signal in response to rotation of the roller, raising the print head to preclude damage. Alternately, the sheet can be discarded.

Abstract: A method for measuring film thickness distribution, including calculating profile P1 indicating wavelength dependence of a reflectance of a first wafer being an object measured with respect to a light at wavelengths not less than a wavelength region of visible light; calculating profile P21 indicating wavelength dependence of a reflectance of a second wafer to light at wavelengths not less than wavelength region of visible light; obtaining a wavelength ?1 observed when profile P31 of a difference between calculated profiles P1 and P21 becomes zero; and selecting waveband including the obtained wavelength ?1 as a waveband of light for use in film thickness distribution measurement by reflection spectroscopy. The film thickness distribution of the first thin film is measured by reflection spectroscopy in a manner that a surface of the first wafer is irradiated with a light to selectively measure only reflected light at a selected waveband.

Abstract: A TEM grid provides posts having steps, the steps increasing the number of samples that can be attached to the grid. In some embodiments, each post includes a one sided stair step configuration. A method of extracting multiple samples includes extracting samples and attaching the samples to the different stair steps on the posts.

Abstract: A method of determining a media weight using a media stiffness sensor in an imaging device. A media sheet is staged having a cantilevered portion which is deflected by a contact member translated into the cantilevered portion. Based on the energy used to move the contact member through a travel distance, a media weight can be determined. An operating parameter of the imaging device may be adjusted based on the media weight that was determined.

Abstract: Embodiments of the present invention provide a method of determining at least one characteristic of a target surface, comprising providing a phase map for a first region of a target surface via radiation having a first wavelength, providing n further phase maps for the first region via radiation having a further n wavelengths each different from the first wavelength, and determining at least one characteristic at the target surface responsive to the first and further phase maps.

Abstract: Described herein is a method and apparatus for measuring the thickness of a deposited semiconductor material. A colorimeter has an optical source that illuminates a portion of a deposited semiconductor material with optical radiation, a sensor that collects and measures color information related to reflected radiation from the deposited semiconductor material, and a processor that receives the color information related to the reflected radiation from the sensor and calculates a thickness of the semiconductor material. The processor may control a semiconductor material deposition apparatus.

Abstract: A method for evaluating a thin-film-formed wafer, being configured to calculate a film thickness distribution of a thin film of the thin-film-formed wafer having the thin film on a surface of a substrate, wherein light having a single wavelength ? is applied to a partial region of a surface of the thin-film-formed wafer, reflected light from the region is detected, reflected light intensity for each pixel obtained by dividing the region into many pieces is measured, a reflected light intensity distribution in the region is obtained, and the film thickness distribution of the thin film in the region is calculated from the reflected light intensity distribution. The method enables a film thickness distribution of the micro thin film (an SOI layer) that affects a device to be measured on the entire wafer surface at a low cost with a sufficient spatial resolution in a simplified manner.

Abstract: An optical wall-thickness measuring device for transparent articles. This invention may be practiced with any transparent material, amorphous or crystalline, which has two surfaces in close proximity to each other, and has flat or positively curved shape. As used herein, transparent means clear, translucent or partially transmitting such that a discernible image of the second surface reflection can be formed and detected at some wavelength of electromagnetic radiation.

Abstract: An inspection device and an inspection method for boiler furnace water wall tubes. The inspection device includes a scanner including columns placed upright and fixed by magnets onto the surfaces of multiple water wall tubes extending in the up-down direction on the inner wall surfaces of the boiler furnace, a support frame fixed to the columns to support a displacement sensor producing laser light to be irradiated onto the surface of a water wall tube, and a moving mechanism for moving the displacement sensor in the axial direction of the water wall tube relative to the support frame. A signal processing unit calculates the amount of reduced wall thickness of the water wall tube from a difference between the cross-sectional surface shape of the water wall tube based on a signal from the displacement sensor and a reference shape without reduction in wall thickness.

Abstract: An automatic document feeder includes a transfer channel, a pick-up module and a thickness detecting module. The thickness detecting module includes a detecting member, a transmission member and an optical displacement sensing member. By the pick-up module, a sheet article is fed into the transfer channel. When the sheet article is transported across the detecting member, the sheet article is sustained against the detecting member, so that the detecting member is moved. The transmission member is connected to the detecting member. As the detecting member is moved, the transmission member generates a displacement amount. The optical displacement sensing member is used for detecting a displacement amount of the transmission member, thereby acquiring the thickness of the sheet article.

Abstract: One aspect of the invention provides a substrate position detecting method for charged particle beam photolithography apparatus in order to be able to measure accurately and simply a substrate position on a stage.

Abstract: A detection device detects a thickness anomoly region within a strip of stock and includes a first roller operatively rotating as the strip of stock passes over a first roller surface; a pivotally mounted pinch roller positioned to operatively pivot about a pivot axis against the strip of stock passing over the first roller; a photoeye mask positioned to rotate about the pivot axis responsive to pivotal movement of the pinch roller; a photoeye slot within the photoeye mask extending between a slot leading end and a slot trailing end; and the transmitting and receiving optical devices positioned on opposite sides of the photoeye slot of the photoeye mask and operative in an photoeye mask-aligned position to project a centered through-beam through the photoeye slot between the transmitting and receiving optical devices.

Abstract: The invention relates to a device (1) for measuring the width (B) and/or the position of a metal strip (2) or a slab, which has at least two measuring systems (3, 4), with each located on a side (5, 6) of the metal strip (2) or the slab, wherein each measuring system (3, 4) has a sensor (7) designed to detect the lateral end (8, 9) of the metal strip (2). To make the measuring device robust and to enable dynamic measurement, according to the invention the sensor (7) is located on a moving element (10) with which it can be moved in a straight line in a direction (Q) at right angles to the longitudinal direction (L) of the metal strip (2).

Abstract: An image sensor module may include an image sensor, a variable thickness member and a lens member. The image sensor may include a light receiver configured to receive a light. Further, a driving voltage may be applied to the image sensor. The variable thickness member may be arranged on the image sensor adjacent to the light receiver. Further, the variable thickness member may have a variable thickness along an optical axis of the light in accordance with the driving voltage through the image sensor.

Abstract: A reflective film thickness measurement method includes reading an original spectral image of a thin film measured by a broadband light source passing through a measurement system, transforming the original spectral image into a broadband reflectance wavelength function and then into a broadband frequency-domain function, dividing the broadband frequency-domain function by a single-wavelength frequency-domain function to obtain an ideal frequency-domain function, inverse-transforming the ideal frequency-domain function into an ideal reflectance wavelength function, and performing a curve fitting on the ideal reflectance wavelength function and a reflectance wavelength thickness general expression, so as to obtain a thickness of the thin film. A spectral image spatial axis direction processing method is performed to eliminate optical aberration in a deconvolution manner, so as to obtain spectral images of high spatial resolution.

Abstract: An image sensor module may include an image sensor, a variable thickness member and a lens member. The image sensor may include a light receiver configured to receive a light. Further, a driving voltage may be applied to the image sensor. The variable thickness member may be arranged on the image sensor adjacent to the light receiver. Further, the variable thickness member may have a variable thickness along an optical axis of the light in accordance with the driving voltage through the image sensor.

Abstract: A sensor is provided that measures web caliper using optical and magnetic measuring devices. The optical measuring devices may employ a confocal chromatic aberration method to accurately determine the distance to the moving web and the magnetic devices may be ferrite core coil and target. Means of stabilizing a moving web are included for improving dynamic measurement accuracy.

Abstract: Methods and systems are provided for monitoring a solid-liquid interface, including providing a vessel configured to contain an at least partially melted material; detecting radiation reflected from a surface of a liquid portion of the at least partially melted material that is parallel with the liquid surface; measuring a disturbance on the surface; calculating at least one frequency associated with the disturbance; and determining a thickness of the liquid portion based on the at least one frequency, wherein the thickness is calculated based on L = f 2 ? w 2 g , where g is the gravitational constant, w is the horizontal width of the liquid, and f is the at least one frequency.

Abstract: An electrophotographic image forming apparatus fuses an image to a recording medium by heat and pressure. To ensure that the recording medium does not stick to the fusing roller, a non-printable margin is normally reserved at the leading edge of the recording medium. When the recording medium has sufficient stiffness, however, as determined from its thickness and other factors such as its width or orientation, marginless printing is permitted. The setting of an unnecessary margin is thereby avoided.

Abstract: A method and apparatus for assessing a height of a specimen includes an electron beam unit having an electron beam source, lenses, a table for setting a specimen and controllable in a height direction, and a detector, and a height detection system for detecting height of the specimen set on the table while the specimen is irradiated by an electron beam. The height detection system further includes an illumination system, a collection system, first and second detectors, a device configured to receive output signals from the first and second detectors while the specimen is irradiated by the electron beam and to generate a comparison signal from the output signals, wherein the comparison signal is responsive to the height of the specimen.

Abstract: According to the method for characterizing fancy yarn, at least one characteristic of the fancy yarn is scanned along the longitudinal direction of the fancy yarn. Values of the scanning are evaluated and the results of the evaluation are outputted. The results of the evaluation are the fancy yarn parameters such as base yarn mass, base yarn diameter, slub distance, mass increase (?M) of a slub, slub diameter increase, slub diameter, slub length (LE) and/or slub total mass. The evaluation includes a smoothing or idealization of the scanning values, e.g. an idealization of the webs (91, 91?) as horizontal stretches and of the slubs (92, 92?) as trapeziums. the idealized course of the curve may be subtracted from the original course of the curve in order to obtain information on the slubs on the one hand, and on the virtual base yarn on the other hand. The occurring data quantity may be reduced by specifying parameters of the idealized course of the curve.

Abstract: A sensor for measuring sheet-like objects has a contact member and a screening member screening off light from a light source from a section of an array of photo sensitive elements. During an output cycle, output signals representing the light intensities received by the respective photo sensitive elements indicate where a transition from the exposed to the screened off section of the array is located. This location is determined by the position of the contact member, which is, in turn, determined by the thickness of the object with which it is in contact. When a timer is started simultaneously with the output cycle of the array and stopped when a predetermined trigger level is reached, the timer value represents a measure of the thickness of a measured object.

Abstract: An optical translation technique for moving the interrogation spot at which a triangulation system measures the displacement of a target is disclosed. In normal operation of the laser triangulation sensor, an incident laser beam is projected from a sensor head onto a surface of a web that is facing the sensor head. Radiation is reflected from the surface and detected by the sensor. The distance from the sensor head to the web surface is calculated by triangulation. With optical translation, both the incident ray path and the captured ray path are translated with a plurality of high refractive index geometries such that the nominal functioning of the triangulation sensor remains undisturbed. The optimal position on the sheet wherein the interrogation spot will be located can be ascertained.

Abstract: An on-line thickness gauge (OLTG) and method are described herein that are capable of measuring a thickness of a moving glass substrate. In the preferred embodiment, the OLTG includes a Y-guide and a stabilizing unit that respectively captures and stabilizes the moving glass substrate. The OLTG also includes a laser instrument which contains a laser source and a detector. The laser source emits a beam at the front surface of the moving glass substrate. And, the detector receives two beams one of which was reflected by the front surface of the moving glass substrate and the other beam which was reflected by the back surface of the moving glass substrate. The OLTG further includes a processor that analyzes the two beams received by the detector to determine a distance between the two beams which is then used to determine the thickness of the moving glass substrate.

Abstract: An apparatus for measuring characteristics of a substance is provided. The apparatus includes a light source to generate light to form an image. A splitter transmits the light from the light source to a first lens, which collimates the light. A second lens receives the collimated light and is adapted to oscillate with respect to the substance and adapted to transmit and focus the light to a focal region within the substance, such that the oscillation will cause the focal region to pass back and forth through the substance and its surfaces/interfaces. A sensor receives light reflected from the focal region and provides a signal indicative of characteristics of the substance at the focal region.

Abstract: A measuring instrument for a wafer for measuring the thickness of a wafer held on a chuck table using a laser beam includes a condenser for condensing and irradiating the laser beam on the wafer held on the chuck table, a light reception unit for receiving reflected light of the laser beam irradiated upon the wafer, a convergence light point changing unit for changing the convergence light point of the laser beam, and a control unit for measuring the thickness of the wafer based on a change signal from the convergence light point changing unit and a light reception signal from the light reception unit. The control unit stores a thickness control map. The control unit controls an angle adjustment actuator, provided for adjusting the installation angle of a pair of mirrors, to change the installation angle and detects two peaks of the light amount based on the reception signal from the light reception unit.

Abstract: According to the method for characterizing fancy yarn, at least one characteristic of the fancy yarn is scanned along the longitudinal direction of the fancy yarn. Values of the scanning are evaluated and the results of the evaluation are outputted. The results of the evaluation are the fancy yarn parameters such as base yarn mass, base yarn diameter, slub distance, mass increase (?M) of a slub, slub diameter increase, slub diameter, slub length (LE) and/or slub total mass. The evaluation includes a smoothing or idealization of the scanning values, e.g. an idealization of the webs (91, 91?) as horizontal stretches and of the slubs (92, 92?) as trapeziums. the idealized course of the curve may be subtracted from the original course of the curve in order to obtain information on the slubs on the one hand, and on the virtual base yarn on the other hand. The occurring data quantity may be reduced by specifying parameters of the idealized course of the curve.

Abstract: Light is irradiated from obliquely below to an end of a sheet conveyed. The light is received by plural light receiving elements arranged at predetermined intervals above the sheet to discriminate the thickness of the sheet. Image forming conditions of an image forming apparatus are changed according to a result of the discrimination to obtain a satisfactory image quality.

Abstract: The method for calibration of a single point laser system used in a measuring system for wood boards in a sawmill includes the steps of storing two orthogonal dimensions of a calibration bar, the values of the two dimensions being different from each other; placing the calibration bar within the scan zone of the measuring system, which is between two opposing lasers; measuring the distance to the calibration bar from each laser in a first dimension, and rotating the bar to its orthogonal dimension and again measuring the distance to the bar from each of the lasers. The distance information to the calibration bar and the known dimensional values of the bar in the two dimensions are then used to determine that a calibration bar is present rather than a wood board to be measured. If the presence of a calibration bar is confirmed, then the distance values and the dimension values are used to determine the actual distance between the two lasers.

Abstract: A system and method of estimating the thickness of the individual sheets in a stack of sheets in a print media sheet input stacking tray before printing with an electronic sensing system for electronically detecting individual sheet edges in the stack thereof and a movement system providing a known traversal distance of the sheet edge sensing system relative to one side of the stack to produce multiple signals corresponding to multiple detected individual sheet edges, and dividing that multiplicity of signals into the known traversal movement to estimate the thickness of the individual print media sheets in the stack and provide a corresponding electrical output can be used for automatic control of sheet feeder, printer or finisher functions. A relatively simple contacting or non-contacting sensor may be used.

Abstract: An apparatus is provided for determining thickness and thermal conductivity for an insulative coating disposed on a substrate in an object. The apparatus includes a source for rapidly applying a multiple optical pulses on a surface of the object, where the surface comprises the insulative coating. The system further includes a recording system configured to collect data representative of the propagation of the optical pulses in the object. The apparatus further includes a processor coupled to the recording system and configured to receive the data from the recording system and configured to determine a thickness value and a thermal conductivity value for the insulative coating.