Abstract: A sensor package including a metal carrier and a sensor chip arranged on the metal carrier and having a first sensor element. In an orthogonal projection of the sensor chip onto a surface of the metal carrier, at least two edge sections of the sensor chip are free of overlap with the surface of the metal carrier. The sensor chip is designed to detect a magnetic field induced by an electric current flowing through a current conductor.

Abstract: The present disclosure relates to voltage sensing mechanisms. One example embodiment includes a voltage-measurement device. The voltage-measurement device includes a housing. The voltage-measurement device also includes an extendible gripper configured to be removably attached to a wire under test. Additionally, the voltage-measurement device includes at least one power supply. Further, the voltage-measurement device includes a power management chip electrically coupled to the at least one power supply and configured to manage a range of input voltages from the at least one power supply. The power management chip comprises a synchronous boost voltage regulator. Additionally, the voltage-management device has a microprocessor electrically coupled to the power management chip and the extendible gripper. The microprocessor is configured to receive electrical power from the power management chip.

Abstract: A current sensing device includes a housing with a head adapted for releasably holding a wire of an electrical circuit without breaking the electrical circuit. The head has one or more current sensors configured to sense direct current in the wire without breaking the electrical circuit. The housing includes an alarm to indicate if the current sensing device senses a current in the electrical wire above a predefined threshold current. The head has a clip base and clip member that form an internal channel to closely receive the electrical wire and to releasably hold the electrical wire for testing. In some embodiments, the head has an internal channel that intersects the outer surface of the head and forms a longitudinal opening to allow insertion of the wire into the internal channel. The current sensing device has a processor programed to calibrate the current sensing device to compensate for electrical noise.

Abstract: An energy detection warning device includes a housing. An electronic indication component is disposed within the housing. One or more sensors are disposed within the housing and are configured to detect an energized conductor present within a particular proximity of a location of the energy detection warning device, and detect a direction in which the energized conductor is located with respect to the location of the energy detection warning device. The direction is an approximate direction. The device also includes a microcontroller configured to: receive input from the one or more sensors, and actuate the electronic indication component, in response to receipt of the input, to indicate the direction in which the energized conductor is located with respect to the location of the energy detection warning device.

Abstract: A sensor probe includes a body, a sleeve that is moveable along the body between open and closed positions, a clamp having first and second jaws that contain an interior region within the clamp, and a non-contact sensor coupled to the sleeve and positioned at or near a perimeter of the interior region within the clamp. When the sleeve is in the open position, the first and second jaws create a gap that allows an insulated conductor to pass into the interior region within the clamp. When the sleeve is in the closed position, the first and second jaws close the gap and thereby close the interior region within the clamp. The size of the interior region is reduced when the sleeve is moved toward the closed position. The non-contact sensor is configured to detect an electrical parameter of the insulated conductor without requiring galvanic contact with the conductor.

Abstract: Embodiments of the invention include a method of using a sensor. The method includes accessing a sample and exposing the sample to the sensor. The sensor includes a sensing circuit having with a field effect transistor (FET) having a gate structure. A cavity is formed in a fill material that is over the gate structure. A probe of the sensor is within a portion of the cavity. An upper region of the probe is above a top surface of the fill material, and a lower region of the probe is below the top surface of the fill material. The probe structure includes a 3D sensing surface structure, and a liner is formed on the 3D sensing surface and configured to function as a recognition element. A portion of the liner is on the lower region of the probe and positioned between sidewalls of the cavity and the 3D sensing surface.

Abstract: A lighting apparatus includes a base housing, an elongated light source module and at least one holder hook. The base housing has a main body and two arms. The two arms are extended from the main body. Each of the two arms has a base connector. The elongated light source module has two light connectors respectively detachably connected to the base connectors of the arms. The elongated light source module emits a light having a main direction. The elongated light source module is rotatable with respect to the base connectors for adjusting the main direction. At least one holder hook is extended from the main body for detachably hooking an object.

Abstract: Provided is an integrated circuit and a test method for an integrated circuit. The integrated circuit includes at least one first branch and at least one second branch. The first branch includes at least one first capacitor. The first end of the first branch is electrically connected to the first end of the second branch, and the second end of the first branch is not connected to the second end of the second branch, to conduct a low-frequency test. The low-frequency test includes application of a low-frequency test signal between the first end of the first branch and the second end of the first branch to test the first branch.

Abstract: In various examples, a stimulation needle apparatus is used for selectively administering a trial stimulation to body tissue of a patient. The stimulation needle apparatus includes a cannula assembly including a cannula and a cannula hub disposed at a proximal cannula end. A stylet assembly includes a stylet sized and shaped to fit within a cannula lumen. A stylet hub is disposed at the proximal stylet end and is configured to engage with the cannula hub. With the stylet hub engaged with the cannula hub, the distal stylet end extends distally from the distal cannula end. A stylet connection is electrically coupled with the stylet and is configured to electrically couple with a stimulator device, such that, a stimulation pulse delivered by the stimulator device is conducted from the stylet connection through the stylet to the distal stylet end to administer the trial stimulation.

Abstract: A probe for measurements on a device under test with low source impedance is described. The probe has a resistor coupled in series between a probe tip and a probe cable connected to a measuring apparatus. The resistor having an impedance equal to a characteristic impedance of the probe cable or equal to the difference between the characteristic impedance of the probe cable and an output resistance of the device under test. Further, a measuring system and a test setup are described.

Abstract: A passive slide screw load pull tuner structure can be used on-wafer, in millimeter-wave frequencies from 20 to 110 GHz. It uses a short external (not extended) slabline, mounted sloped and allowing direct contact with the wafer probe, thus permitting the tuning probe to come as close to the wafer probe as physically possible; this minimizes the insertion loss between tuner and DUT and, thus, generates the maximum possible tuning range of a passive electro-mechanical impedance tuner.

Abstract: A test system for testing a device under test that includes several communication lanes is described. The test system is a communication lane test system that includes a measurement instrument and a connecting interface for connecting the device under test, wherein the connecting interface is configured to connect at least two of the several communication lanes with the measurement instrument. The measurement instrument includes s a processor being configured to conduct an automatic conformance test on the at least two communication lanes concurrently. Moreover, a method for testing a device under test that includes s several communication lanes is described.

Abstract: A voltage mode signal transceiving device and a voltage mode signal transmitter thereof are provided. The voltage mode signal transmitter includes a driver, an output resistor, and a compensation capacitor. The driver provides a transmitting signal to an output end, where the output end is coupled to a receiver. The output resistor is connected in series to a coupling path between the driver and the receiver. The compensation capacitor and the output resistor are coupled in parallel. A capacitance value of the compensation capacitor is essentially equal to a capacitance value of an equivalent capacitor on an input end of the receiver.

Abstract: A test system for testing a device for use in a vehicle includes a coupling element that is one of (i) a capacitive coupling element, (ii) an inductive coupling element and (iii) a magnetic coupling element. The coupling element is electrically coupled to components of a PCB circuit of a vehicle device to at least one of (a) acquire analog or digital data or information or conditions from the PCB circuit and (b) induce information or conditions into the PCB circuit. The coupling element electrically couples to components of the PCB circuit without physical contact with the PCB circuit. The vehicle device may comprise a vehicle camera.

Abstract: Provided is an impedance measuring device for biological samples including one or a plurality of biological sample holding units configured to hold a biological sample, an applying unit configured to apply an AC voltage to a pair of electrodes in contact with the biological sample held by the biological sample holding unit, a measuring unit configured to measure an impedance of the biological sample obtained by an AC voltage being applied to the biological sample by the applying unit, and a measurement condition control unit configured to control a measuring time and/or a measuring frequency in the measuring unit.

Abstract: Provided is a method of assessing rotor temperature during operation of a permanent magnet synchronous machine, including a stator having at least one winding set, the method including: providing reference flux linkage values for different rotor and stator temperature values and current values of an operating winding set; measuring an actual rotor temperature value; measuring an actual stator temperature value; measuring an actual current value of an operating winding set; deriving and storing reference flux linkage values for a given set of operating conditions, in particular, by means of a reference run; deriving a reference flux linkage value (for the measured actual rotor and stator temperature values and the measured actual current value of the operating winding set) using the flux model; obtaining a voltage value; deriving an estimated flux linkage value; deriving a rotor temperature offset; and assessing the rotor temperature based on the rotor temperature offset.

Abstract: A testing apparatus includes a chip carrying device and a pressing device. The chip carrying device includes a circuit board and a plurality of electrically connecting units that are disposed on the circuit board and each can receive a chip. The pressing device includes a cover, an abutting member, and an airtight member. The cover is disposed on the circuit board to jointly define an accommodating space accommodating the abutting member and the electrically connecting units. The airtight member is arranged between the cover and the circuit board to seal the accommodating space. The cover has at least one exhaust hole. When an air suction apparatus exhausts air in the accommodating space through the at least one exhaust hole, the cover is abutted against the airtight member, and the abutting member is abutted against the chips to connect each of the electrically connecting units and the corresponding chip.

Abstract: A system includes a surge protection circuit electrically connected via a signal transmission line between a source and an oscilloscope, and including a diode configured to be reverse biased, responsive to a voltage of the source being less than a threshold, to decouple an impedance of the circuit from the transmission line and forward biased, responsive to the voltage being greater than the threshold, to couple the impedance to absorb excess energy of the voltage.

Abstract: A USB Type-C audio-visual adapter system includes a base module and an expansion module. The base module has a first housing with a first face and a second face, where the first face includes USB and A/V connectors and the second face includes a first expansion connector. The second face is offset inwardly from an edge of the first housing defined by a lip extending about the second face. The expansion module has a second housing with a first face that includes a second expansion connector, where the first face of the second housing is configured to be received within a recessed area formed by the lip of first housing to facilitate mechanical and electrical coupling of the first and second expansion connectors.

Abstract: Provided is an impedance measuring device for biological samples including one or a plurality of biological sample holding units configured to hold a biological sample, an applying unit configured to apply an AC voltage to a pair of electrodes in contact with the biological sample held by the biological sample holding unit, a measuring unit configured to measure an impedance of the biological sample obtained by an AC voltage being applied to the biological sample by the applying unit, and a measurement condition control unit configured to control a measuring time and/or a measuring frequency in the measuring unit.

Abstract: A test and measurement system for testing a device under test comprises a logic probe with a first probe tip for contacting the device under test, a logic receiver unit connected to the first probe tip for receiving a digital signal from the device under test via the first probe tip, and a DC voltage measuring unit connected to the first probe tip for measuring a DC voltage at the device under test via the first probe tip.

Abstract: A fully integral epoxy cap probe may comprise a body having a cavity disposed radially outward of a fan blade and comprising a first material, a frame disposed within the cavity and comprising a second material, a first sensor element and a ground plane disposed within the frame, the first sensor element and the ground plane comprising a third material, and a first soft lead in electronic communication with the first sensor element and the ground plane.

Abstract: Systems and methods for analysing a time-domain signal are described. The method comprising: in a mixer (150), mixing the time-decay signal (115) with a local oscillator signal (122) generated by a local oscillator (120), resulting in a mixed signal from which a Fourier transformed time-decay signal is generated comprising a fundamental transformed time decay signal at the fundamental frequency of the local oscillator signal (122) and a plurality of transformed time-decay signals at a plurality of frequencies; and determining the magnitude of each of the transformed time-decay signals at the fundamental frequency and at a frequency other than the fundamental frequency.

Abstract: The embodiments of the present disclosure provide an apparatus, system and method for testing electrical functions. The apparatus for testing electrical functions comprises: at least one clamping tool configured to be capable of being clamped in the vicinity of at least one bonding area of an electronic device; at least one row of probes configured to be electrically connected to multiple pins in the at least one bonding area respectively when the at least one clamping tool is clamped; and at least one multiplex switch. Each multiplex switch has a first terminal comprising multiple ports, and a second terminal comprising at least one port and capable of being connected to a measurement instrument, and the at least one multiplex switch is configured to turn on or turn off an electrical connection between the multiple ports of the first terminal and at least one port of the second terminal.

Abstract: A method for measuring the presence of water in gas oil filters and a water sensor for carrying out is provided by a functional assembly associated with a pair of electrodes that are arranged in the area for decanting water which is separated from the fuel in the gas-oil filters, an electrical current being applied to said electrodes by a current source and a switching bridge, in measurement cycles separated by periods of electricity, each cycle being determined as a current pulse train, the polarization of the electrodes being adapted in the first measurement cycle in order to optimize the detection of water in the medium containing same, adjusting the functional activity acting on the duration of the current pulses when the presence of water is detected.

Abstract: In various examples, a stimulation needle apparatus is used for selectively administering a trial stimulation to body tissue of a patient. The stimulation needle apparatus includes a cannula assembly including a cannula and a cannula hub disposed at a proximal cannula end. A stylet assembly includes a stylet sized and shaped to fit within a cannula lumen. A stylet hub is disposed at the proximal stylet end and is configured to engage with the cannula hub. With the stylet hub engaged with the cannula hub, the distal stylet end extends distally from the distal cannula end. A stylet connection is electrically coupled with the stylet and is configured to electrically couple with a stimulator device, such that, a stimulation pulse delivered by the stimulator device is conducted from the stylet connection through the stylet to the distal stylet end to administer the trial stimulation.

Abstract: A detection data storage device includes a detection probe, an inspection instrument, a processor and a storage controller. The processor includes a software component. The storage controller includes a key and a prompt lamp. When a circuit is detected by the detection probe, a detection signal is generated. After the detection signal is received by the inspection instrument, a detection data is generated and transmitted to the software component of the processor. If the software component judges that the detection data matches a standard value, the software components issues a prompt signal to the prompt lamp of the storage controller. In response to the prompt signal, the prompt lamp emits a light beam. After the light beam from the prompt lamp is received by the user and the key is pressed, the detection data is stored in a storage unit.

Abstract: Provided is a non-contact voltage measuring device capable of measuring, with given accuracy, measurement target voltages applied to various conducting wires having respective different shapes. An inner electrode which is deformable depending on a shape of a wire “w” is electrically connected, via a connecting section, to an outer electrode fixed to an electric field shield.

Abstract: An upgradeable distribution framework, cable connector and cabling management system is described. The distribution framework has a plurality of ports adapted to be connected by cable connectors and indicator elements arranged on the distribution framework wherein corresponding to at least a portion of the ports. A plurality of first communication units are detachably secured to the cable connectors and such that the first communication units are positioned outside the ports when the cable connectors are inserted into the ports. The distribution framework further includes a plurality of second communication units that correspond to at least a portion of the ports. The second communication units and the corresponding first communication units are configured to communicate with each other in a non-contact manner. A control modules is configured to control and read and write communications between at least a portion of the first communication units and the second communication units.

Abstract: A testing probe is provided. The testing probe includes a first testing tip; an insulation layer formed on a side surface of the first testing tip; and a second testing tip being coaxial with the first testing tip and surrounding the first testing tip formed on a side surface of the insulation layer.

Abstract: A network interface receives transaction information. A processor determines private information and public information from the received transaction information. The network interface communicates the private information to an obfuscation engine, and receives obfuscated private information. The processor then merges the obfuscated private information with the public information to create a temporary identifier, and then converts the temporary identifier into a transaction identifier. A printer then prints a portion of the public information and the transaction identifier on a transaction receipt.

Abstract: Disclosed is an electronic circuit with a first terminal for connecting an accessory thereto, and with a functionality for detecting the presence of an accessory connected to the first terminal.

Abstract: Provided is a cleanable conductivity sensor and related methods having a distal sensing end in which active sensing elements are positioned and an outer fin specially configured to minimize unwanted interference without impacting the ability for automated cleaning of the distal sensing end. A rotatable wiper or brush may be periodically rotated over the distal sensing end, thereby removing unwanted biological build-up and avoiding fouling, thereby increasing the sensor deployment time without active intervention and maintenance.

Abstract: A high voltage phasing voltmeter comprises first and second probes. Each probe comprises an electrode for contacting a high voltage electrical conductor. The electrodes are connected in series with a resistor. A meter comprises a housing enclosing an electrical circuit for measuring true rms voltage. The electrical circuit comprises an input circuit for connection to the first and second probes and developing a scaled voltage representing measured voltage across the electrodes. A converter circuit converts the scaled voltage to a DC signal representing true rms value of the measured voltage. A peak hold circuit is connected to the converter circuit to hold a peak value of the true rms value. A display is connected to the peak hold circuit for displaying the peak value of the true rms value.

Abstract: A browser probe has a probe body including a signal line, a nose of electrical insulating material integral with and projecting from the probe body, a pin supported by the probe body and electrically conductively connected to the signal line, a spring exerting a biasing force on the pin, an electrically conductive probe tip supported by the nose at a distal end of the nose remote from the probe body, and a plurality of discrete resistors interposed between the pin and the probe tip within the nose. The resistors are supported independently of another so as to be slidable within the nose. The probe tip is electrically conductively connected to the signal line via the resistors and the pin under the biasing force exerted by the spring.

Abstract: A signal interconnect includes a transmission line, a termination circuit coupled to the transmission line, and a high pass filter circuit coupled in series along the transmission line. The high pass filter circuit includes a first resistive circuit and a first capacitive circuit coupled in parallel. The first resistive circuit has a resistance based on a difference between a resistance of the transmission line at a high frequency and a resistance of the transmission line at a low frequency.

Abstract: An embodiment of a test apparatus for executing a test of a set of electronic devices having a plurality of electrically conductive terminals, the test apparatus including a plurality of electrically conductive test probes for exchanging electrical signals with the terminals, and coupling means for mechanically coupling the test probes with the electronic devices. In an embodiment, the coupling means includes insulating means for keeping each one of at least part of the test probes electrically insulated from at least one corresponding terminal during the execution of the test. Each test probe and the corresponding terminal form a capacitor for electro-magnetically coupling the test probe with the terminal.

Abstract: A probe card assembly can comprise a guide plate comprising probe guides for holding probes in predetermined positions. The probe card assembly can also comprise a wiring structure attached to the guide plate so that connection tips of the probes are positioned against and attached to contacts on the wiring structure. The attachment of the guide plate to the wiring structure can allow the wiring structure to expand or contract at a greater rate than the guide plate. The probes can include compliant elements that fail upon high electrical current and thermal stresses located away from the contact tips.

Abstract: The invention relates to a method for measuring the high-voltage induced degradation (PID) of at least one solar cell. According to the invention, a conductive plastic material is pressed on the upper side or bottom side of the respective solar cell, in particular on the front side thereof, and a DC voltage greater than 50 V is applied between the plastic material and the respective solar cell. Alternatively, corona discharges may be applied to solar cells or photovoltaic modules. In one embodiment, a characteristic electric parameter of the respective solar cell or of the photovoltaic module is repeatedly measured at time intervals. The method according to the invention can be carried out on individual solar cells, which can be further processed directly after passing the test and without further complex processing, e.g. to a photovoltaic module. In principle, the method is also suitable for measurements on complete photovoltaic modules.

Abstract: Provided is an internal switch-type salt meter in which an impact switching device operable by an impact applied into a main body is built in the main body so that it is unnecessary to separately waterproof the switching device. The salt meter includes a main body having the inside waterproofed against the outside, a sensor part disposed on an end of a side of the main body to detect salinity of an object to be measured, a display part disposed on a surface of a side of the main body to display a result measured by the sensor part, and a switching device built in the main body to generate a contact point by an impact with an external impact object, thereby operating the sensor part and the display part. The switching device may be built in the main body so that a separate waterproof process is not required.

Abstract: A system for derating a power limit associated with a battery pack is provided. The system includes a battery pack voltage sensor that measures a first battery pack output voltage of the battery pack at a first time, and a microprocessor that determines an initial power limit of the battery pack based on at least one operational parameter of the battery pack. The microprocessor further determines whether the first battery pack output voltage is greater than a threshold battery pack voltage. The microprocessor further determines a first power limit of the battery pack that is less than the initial power limit, if the first battery pack output voltage is greater than the threshold battery pack voltage.

Abstract: A resistor for suppressing magnetizing inrush current includes a container made of an insulating material and at least one resistive element housed in the container, the resistive element being connected to two bushings provided at the container, the outer surface of the container being coated with a conductive paint, and the paint being connected to the ground, thereby being able to be located between a cable and a switch, and being able to fix the outer surface thereof to a ground voltage level so that human contact safety is not impaired.

Abstract: A multifunction test instrument probe includes a housing having a hollow bore with an open end. A clamp plunger is carried in the hollow bore, with a first end including a thumb press, and a second end including an alligator clamp having a pair of jaws, with a compression spring normally biasing the thumb press away from the housing, and normally biasing the alligator clamp substantially within the hollow bore proximate the open end. A point plunger is also carried in the bore, with a first end including a thumb press, and a second end terminating in a point, with a second compression spring normally biasing the thumb press away from the housing, and biasing the point within the hollow bore proximate the open end.

Abstract: Disclosed is a coaxial probe comprising, an internal conductor comprising an upper contact configured to contact a semiconductor device; a lower contact configured to contact a tester for testing the semiconductor device; and an internal elastic member configured to elastically bias at least one of the upper and lower contacts to make the upper and lower contacts distant from each other; an external conductor configured to surround the internal conductor; a plurality of gap members which is respectively inserted into opposite ends between the internal conductor and the external conductor to create a predetermined air gap between the internal conductor and the external conductor; and at least one external elastic member that is inserted into an external circumferential surface of the external conductor to elastically bias at least one of the semiconductor device and the tester to a direction that makes either the semiconductor device or the test distant from the external conductor.

Abstract: A non-contact, hand-held voltage detector is used to determine if AC voltage is present in a tamper-resistant receptacle. The voltage detector includes a pair of pins to open both shutters of the tamper-resistant receptacle.

Abstract: The present invention generally relates to nanoscale wires for use in sensors and other applications. In various embodiments, a probe comprising a nanotube (or other nanoscale wire) is provided that can be directly inserted into a cell to determine a property of the cell, e.g., an electrical property. In some cases, only the tip of the nanoscale wire is inserted into the cell; this tip may be very small relative to the cell, allowing for very precise study. In some aspects, the tip of the probe is held by a holding member positioned on a substrate, e.g., at an angle, which makes it easier for the probe to be inserted into the cell. The nanoscale wire may also be connected to electrodes and/or form part of a transistor, such that a property of the nanoscale wire, and thus of the cell, may be determined. Such probes may also be useful for studying other samples besides cells.

Abstract: Disclosed are various embodiments of methods and systems related to stimulus responsive nanoparticles. In one embodiment includes a stimulus responsive nanoparticle system, the system includes a first electrode, a second electrode, and a plurality of elongated electro-responsive nanoparticles dispersed between the first and second electrodes, the plurality of electro-responsive nanorods configured to respond to an electric field established between the first and second electrodes.

Abstract: Various exemplary embodiments provide probes, systems and methods for measuring an effective electrical resistance/resistivity with high sensitivity. In one embodiment, the measuring system can include an upper probe set and a similar lower probe set having a sample device sandwiched there-between. The device-under-test (DUT) samples can be sandwiched between two conductors of the sample device. Each probe set can have an inner voltage sense probe coaxially configured inside an electrically-isolated outer current source probe that has a large contact area with the sample device. The measuring system can also include a computer readable medium for storing circuit simulations including such as FEM simulations for extracting a bulk through-plane electrical resistivity and an interface resistivity for an effective electrical z-resistivity of the DUT, in some cases, having sub-micro-ohm resistance.

Abstract: An embodiment of a system includes a utility meter having an enclosure, a first component and a second component in the enclosure, and a mounting assembly configured to couple the first and second components together in the enclosure. The mounting assembly includes a first mount having first and second prongs disposed about an intermediate space, a second mount configured to extend bi-directionally into the intermediate space between the first and second prongs in opposite first and second directions, and a snap-fit fastener. The snap-fit fastener includes first and second snap portions configured to bi-directionally engage one another in the opposite first and second directions to secure the first and second mounts.

Abstract: A de-embed probe including an input configured to connect to a device under test, a memory, a signal generator connected to the input, the signal generator configured to generate a test signal, and a controller connected to the signal generator and configured to control the signal generator. The de-embed probe may be used in a test and measurement system. The test and measurement system also includes a test and measurement instrument including a processor connected to the controller of the de-embed probe, the processor configured to provide instructions to the controller, and a test and measurement input to receive an output from the de-embed probe.