Abstract: A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, such that it includes three or more vertical arm portions. The vertical arm portions have substantial vertical overlap, and are laterally displaced from each other. When such a probe is vertically brought down onto a device under test, the probe deforms. During probe deformation, at least two of the vertical arm portions come into contact with each other. Such contact between the arm portions can advantageously increase the lateral scrub motion at the probe tip, and can also advantageously reduce the probe inductance.

Abstract: A pair of interlocking electrical test probes, each probe having an interlocking end which mates or can be easily joined together with the other's end such that the pair of test probes can be operable with one hand when their respective interlocking ends are joined together. The pair of interlocking electrical test probes also capable of being operated separately or independently, one in each hand when in the unjoined state. When joined together, the pair of interlocking electrical test probes are free to pivot about their interlocked or mated ends, thus allowing the distance between their contact points to be varied while being held in one hand, therefore freeing up an electrician's or technician's other hand to hold a meter, flashlight, schematic or for some other purpose.

Abstract: A current clamp meter having a current meter body and a detachable current clamp. The current meter body and the current clamp are configured so that the current clamp is detachable from the current meter body and the meter is operable with the current clamp either attached to the current meter body or detached from the current meter body.

Abstract: Embodiments of the present invention improve probes and probe assemblies. In one embodiment, the present invention includes a probe test head comprising a plurality of novel probes inserted in an array of holes in upper and lower dies of the assembly. The novel assembly includes a novel alignment layer for easy repair and maintenance of the probes.

Abstract: The invention concerns a probe with at least two test prods, which are provided on a changing device connected to the probe and which can be alternately connected to an electric waveguide running inside the probe.

Abstract: A system and method for voltage sensing at active power gated cores of a multi core CPU wherein a Controlled Collapse Chip Carrier bump in a gating region for an associated core is isolatable from an ungated power region by a power gate to allow voltage sensing at a designated location with substantially no current passing there through.

Abstract: A pair of interlocking electrical test probes, each probe having an interlocking end which mates or can be easily joined together with the other's end such that the pair of test probes can be operable with one hand when their respective interlocking ends are joined together. The pair of interlocking electrical test probes also capable of being operated separately or independently, one in each hand when in the unjoined state. When joined together, the pair of interlocking electrical test probes are free to pivot about their interlocked or mated ends, thus allowing the distance between their contact points to be varied while being held in one hand, therefore freeing up an electrician's or technician's other hand to hold a meter, flashlight, schematic or for some other purpose.

Abstract: Embodiments of a process comprising forming one or more micro-electro-mechanical (MEMS) probe on a conductive metal oxide semiconductor (CMOS) wafer, wherein each MEMS probe comprises a cantilever beam with a fixed end and a free end and wherein the CMOS wafer has circuitry thereon; forming an unsharpened tip at or near the free end of each cantilever beam; depositing a silicide-forming material over the tip; annealing the wafer to sharpen the tip; and exposing the sharpened tip.

Abstract: A stiffening connector assembly and methods of use are provided herein. In some embodiments a stiffening connector assembly includes a connector configured to be coupled to a substrate; and a mechanism coupled to the connector and configured to restrict rotational movement of the connector with respect to the substrate when coupled thereto. The mechanism may further provide a lateral degree of freedom of movement in a direction substantially parallel to the substrate.

Abstract: This system for determining the performance of an interconnection network of functional blocks of a specialized integrated circuit, comprises a set of probing modules disposed on the network and comprising means for detecting an event on at least one communication link of the network and means for determining a characteristic indicative of the activity of the said at least one link on the basis of the detection of the said event.

Abstract: A sensor comprising: at least one sensor probe comprising: a pair of electrodes; a vertically aligned nanotube disposed between the pair of electrodes; optionally a piezoelectric polymer on the nanotube; and optionally, a field source for generating a field, the field source operatively connected to the pair of electrodes; whereby when the sensor probe is contacted, a change in the field occurs or electricity is generated. Methods of using the sensors are also described.

Abstract: A controller is provided for use with a vehicle security system, particularly a remote start system. The controller includes a housing, means for detecting voltage of a vehicle wire, and means for displaying detected voltage. The means for detecting voltage can be an external probe. The means for displaying detected voltage can be a light indicator, a sound indicator, or a display screen. If a light indicator is used, such as an LED, the light indicator can emit different colors of light responsive to different voltages detected. If a sound indicator is used, the sound indicator emits different pitched sound tones or a different number of sound tones based on different voltages detected. The controller can include a means for detecting resistance of a wire and a switch for changing between detecting voltage and resistance. The controller can include a switch for changing between different detection states.

Abstract: A probe measurement system comprises a probe with a linear array of probe tips enabling a single probe to be used when probing a test structure with a differential signal.

Abstract: A remote display is provided for use with a portable meter, such as a portable meter used for obtaining electrical measurements. The remote display can optionally be mounted to an extremity of a user for displaying information obtained by the portable meter within an operating area of a user. The user may position leads that are coupled to the portable meter to obtain a measurement of an electrical apparatus, without having to look away, as the remote display may be positioned on the user's hand. Controls may also be located on the remote display, on a lead and/or on the portable meter for control of the display mode of the remote display and/or various operations of the portable meter.

Abstract: A portable voltage and current (VI) probe including voltage and current probes, a clamshell assembly, and insulation sections for attachment to at least one transmission line. A stripper tool removes sections of a cover and a shield from the transmission line. Probes are then installed onto the transmission line. A clamshell assembly is placed onto the exposed transmission line surrounding the probes. The probes are insulated and connected to at least one detecting circuit.

Abstract: In an exemplary embodiment of the present invention, a probe for sampling electromagnetic energy in a circuit is provided. The probe includes a mating portion for mating, in a broadside configuration, with an electromagnetic energy transmission media in the circuit. The probe also includes a correction device for correcting impedance mismatch resulting from mating the mating portion with the electromagnetic energy transmission media of the circuit.

Abstract: Passive balanced probes are disclosed for use with a signal analysis device. The probes are very low cost relative to typical commercially available probes and provide an extremely flat response over a frequency range of approximately 0 to at least 1.5 gigahertz. The probes include a probe body constructed primarily from conventional components, a first surface mount resistor electrically connected between a probe tip and a center conductor, and two surface mount resistors electrically connected and parallel between the center conductor and a conductive shield. The probes further include a coaxial cable for connection to an instrument combiner or other instrument connection device.

Abstract: A pin having a voltage probe pin-head is provided. The pin includes a pin-head having a substantially flat surface at one end and a pin-head tip at an opposing end, the substantially flat surface is configured to attach to a resistor, and the pin-head tip contacts an electrical test point. The pin also has a neck-like portion that extends between a shaft and the pin-head, wherein the neck-like portion is shorter than the shaft and has a diameter that is smaller than a diameter of a cross-section of the shaft.

Abstract: A cartridge system includes a main probing head body with electronics positioned therein. Further, the cartridge system includes a probing tip cartridge having a probing tip. A minimally inductive electrical contact mechanism electrically couples the electronics to the probing tip when the probing tip cartridge is in mating relationship with the main probing head body. The types may be, for example, a pointed tip, a socket tip, or a grabber tip. In one preferred embodiment the probing tip cartridge further includes at least one foot.

Abstract: This invention relates to the reduction of insertion losses and by consequence maximization of reflection factors for on-wafer load pull testing of high power or low noise transistor chips, using as much a direct integration as possible between the slotted airline of the tuners and low loss probes, said probes being either modified commercial probes or probes made as an extension of the tuner slotted airline itself.

Abstract: An electrical power probe is provided. In one aspect, an electrical power probe includes a power probe control unit adapted to connect to a direct current (DC) power source and receive an input source voltage from the DC power source. The power probe control unit comprises a power switch controlling the switching of the input source voltage to a cable. A power probe wand includes a conductive wand tip and a user controlled switch, with the wand tip being connected to the power switch by the cable. The power probe control unit sends a query message to the power probe wand. The power probe wand unit sends a response to the power probe control unit in response to the query message, with response indicating the position of the user controlled switch. The power probe control unit selectably switches the power switch based on the position of the user controlled switch.

Abstract: A testing device is operative to sense or monitor a radiated field emitted by an igniter for heating equipment such as an oil burner and to indicate the detection corresponding to a normal operating state of the igniter.

Abstract: An attachable/detachable variable spacing probing tip system has a housing that receives pivoting probing arms. Each probing arm has a support member and a probing arm portion of a flexible substrate having a conductive trace thereon. One end of each conductive trace is coupled to a probing contact and the other end coupled to an electrical contact pad on a electrical contact pad portion of the flexible substrate. Each of the probing arm portions has a generally S-shaped fold therein extending from the support members to the electrical contact portion of the flexible substrate. The housing includes means for pivoting the probing arms. The rear surface of the housing has a resilient member disposed therein. Latching means in the housing secures the electrical contact pad portion of the flexible substrate to the rear surface of the housing. Opposing attachment arms from a rear surface of the housing.

Abstract: In an exemplary embodiment of the present invention, a probe for sampling electromagnetic energy in a circuit is provided. The probe includes a mating portion for mating with a electromagnetic energy transmission media in the circuit. The probe also includes a correction device for correcting impedance mismatch resulting from mating the mating portion with the electromagnetic energy transmission media of the circuit.

Abstract: A solution to the problem of broken micro-browser probe assemblies caused by the accidental application of excessive force is to manufacture the rods out of a material that resists forces found in normal usage and appears stiff, but that will abruptly deform harmlessly under less force than causes permanent damage to other elements of the micro-browser. The sudden deformation serves as a signal to the operator to stop being a gorilla. That leaves the problem of re-shaping the rod. A preferred solution is to use as the rod a Nitinol superelastic metal wire that automatically returns to its previous shape once the force causing deformation is removed. An alternate solution is to make the rod from a length of Nitinol “memory metal” wire that restores itself to a pre-set shape upon the application of mild heat, such as immersion in a cup of hot water from an office coffee machine. The small circuit board and its components are not bothered by the bath.

Abstract: A hand held testing meter is provided which allows the meter to be viewed and securely supported on the user's hand, while the user's fingers are free to hold and manipulate test instruments. An elastomeric band is provided which is engageable to the meter extending substantially across the meter rear surface. The elastomeric band is resiliently extendable to securely receive a user's hand intermediate the meter rear surface and the elastomeric band.

Abstract: A distributed capacitive/resistive electronic device. An electronic device is described which includes a dielectric substrate, a first resistive component, a second resistive component, and a connecting component. The first resistive component is affixed to a first side of the dielectric substrate. The second resistive component is affixed to a second side of the dielectric substrate, wherein the second side is oppositely located from the first side. The connecting component is affixed to the dielectric substrate, wherein the connecting component electrically connects the first resistive component to the second resistive component, wherein the connecting component is electrically connectable to other electronic circuitry, and wherein, at a location removed from the connecting component, the second resistive component is electrically connectable to other electronic circuitry.

Abstract: A voltage probe includes a signal lead that is configured to be soldered to a probing location in a device that is to be probed by the voltage probe, and a first cable that is coupled to the signal lead and that is configured to conduct an output signal that is responsive to an input signal that is received by the signal lead from the device. The signal lead has a thermal conductivity of less than 200 Watts per meter Kelvin (W/mK). Methods and other systems for providing electrical connections to devices under test are disclosed.

Abstract: A voltage probe includes a first signal lead configured to receive a first signal from a device under test, a first probe-tip network that is coupled to the first signal lead and that has a frequency response that includes a first transmission zero, a first compensation network that is coupled to the first probe-tip network and that has a frequency response that includes a first transmission pole, a second signal lead configured to receive a second signal from the device under test, a second probe-tip network that is coupled to the second signal lead and that has a frequency response that includes a second transmission zero, a second compensation network that is coupled to the second probe-tip network and that has a frequency response that includes a second transmission pole, and a differential amplifier circuit that is coupled to the first compensation network and to the second compensation network, and that is configured to provide a third signal that is responsive to the first signal and to the second sign

Abstract: Systems and methods for wideband single-end probing of variably spaced probe points are provided. One such embodiment includes a probe housing. The probe housing at least partially surrounds a probe barrel. A probe barrel end cap extends from the probe barrel and at least partially surrounds a probe tip. The longitudinal axis of the probe tip is offset from the longitudinal axis of the probe barrel. A ground tip is adjacent to the probe tip and electrically connected to the probe barrel. Methods are also provided.

Abstract: Systems and methods for wideband differential probing of variably spaced probe points are provided. One such embodiment includes a probe housing at least partially surrounding a first probe barrel and a second probe barrel. A first probe barrel end cap and a second probe barrel end cap extend respectively from the first and second probe barrels and also at least partially surround respectively a first probe tip and a second probe tip. The longitudinal axes of the first and second probe tips are offset respectively from the longitudinal axes of the first and second probe barrels. Methods are also provided.

Abstract: A switchless, hand-held probe and method for detecting and alerting a user to the presence of an AC voltage on a conductor that minimizes the intermittent activation of the probe's indicator due to static charge build-up. The probe comprises an antenna, an indicator, detector circuitry and activation circuitry. The probe alerts a user through the use of an indicator to the presence of electrical energy on a conductor. The antenna senses the electrical energy radiated from the conductor. When the electrical energy sensed by the antenna satisfies a particular measurement threshold, a signal is generated by the detector circuitry and received by the activation circuitry. The activation circuitry activates the indicator after a sufficient number of signals are received from the detector circuitry during a given period of time.

Abstract: A cartridge system includes a main probing head body with electronics positioned therein. Further, the cartridge system includes a probing tip cartridge having a probing tip. A minimally inductive electrical contact mechanism electrically couples the electronics to the probing tip when the probing tip cartridge is in mating relationship with the main probing head body. The types may be, for example, a pointed tip, a socket tip, or a grabber tip. In one preferred embodiment the probing tip cartridge further includes at least one foot.

Abstract: An electrical test probe tip capable of establishing an electrical connection to test objects on a circuit board and particularly to rounded or irregularly shaped test objects preferably is a probing tip with a longitudinal planar axis and two planar contact surfaces. The contact surfaces substantially form an inverted “V” from the longitudinal planar axis when viewed from either side of the probing tip. The probing tip has a notch defined therein when viewed from both the front and the back. Optionally the preferred embodiment may have an exterior insulating coating.

Abstract: A probe for connecting a device under test to a measurement device that corrects for dc errors and noise generated by the current flowing through the ground shield of a transmission line used by the probe. The probe identifies a voltage drop in the ground preferably using an additional line between the device under test and the measurement device. The signal provided to the measurement device is corrected based on the identified voltage drop.

Abstract: A method for detecting a shorted turn in a synchronous machine having a rotor using a magnetic flux probe is disclose having the steps of: monitoring a signal from the flux probe during on-line operation of the machine; integrating the flux probe signal to generate a flux density data trace that repeats during each rotor revolution; upon detecting movement in the flux density zero-crossing, capturing the flux probe signal for a current rotor revolution for a variety of machine load conditions, and performing a shorted turn analysis with the captured flux signal data.

Abstract: A multi-meter test lead system has a probe having a pointed distal end and a proximal end couplable to supplemental electronic components. An outer sleeve has a distal end with a semi-cylindrical opening and a proximal end with a circular opening at the end and slots adjacent thereto. An inner sleeve has and open distal with an adjacent opening and a pair of diametrically opposed slots adjacent to the proximal end. The inner sleeve is adapted to slidably receive the probe and with the inner sleeve and probe are adapted to be slidably positioned within the outer sleeve to allow movement of the inner sleeve axially inwardly of the outer sleeve in response to a force by the user. A coil spring is within the outer sleeve. A pair of finger pads with an action pin extending through the outer sleeve and inner sleeve.

Abstract: An inexpensive RF test probe provides consistent monitoring of an RF signal while having minimal effect on the circuit under test. In one embodiment, an RF test probe comprises a return conductor and a probing conductor. The probing conductor is positioned within an insulator and a termination such as a 50 ohm resistor is electrically positioned between the ground conductor and probing conductor. The probe is used by placing a portion of the insulating material surrounding the probe conductor in contact with a circuit such as an RF microstrip carrying an RF signal to be monitored.

Abstract: A measurement probing system has a measurement probe having a housing, spring loaded coaxial probe assembly and a pressure sensor that generates a resistive activation signal in response to movement of the housing in relation to the spring loaded coaxial probe assembly. The activation signal is applied to control circuitry in a control module for generating an output signal to drive an RF relay to couple the probing tip of the measurement probe from electrical to input circuitry of a measurement test instrument. The control circuitry further includes a TTL buffer circuit for generating the output signal in response to a TTL logic signal from a controller for automated testing of a device under test.

Abstract: A micro tool set is described in which all of the tools are formed from stock no larger than 1.0 mm in diameter. Each tool is laser machined from stock no larger than 1.0 micron in diameter. Various shapes are “carved” from the original stock such that the finished tool does not extend beyond the nominal cylindrical shape of the stock. The tools are specifically adapted to be used for the repair of semiconductor test probe head wires.

Abstract: Systems and methods for wideband active probing of devices and circuits in operation are provided. One such embodiment includes a probe amplifier housing that at least partially contains a probe amplifier circuitry. The probe amplifier circuitry and the probe housing are configured to be separately arranged and positioned from connected probing and signal monitoring apparatuses. Methods are also provided.

Abstract: A probe whose characteristic impedance can be accurately adjusted to a desired value with the production of a small number of prototypes. The probe includes a first line with a signal terminal to be connected to a signal electrode of a circuit to be measured and at least one first region connected to the signal terminal and to which one end of a chip capacitor is connected, a second line connected to a terminal of the first line and a junction to be connected to a measuring instrument at the remaining terminal, and an impedance matched to a characteristic impedance of the measuring instrument, a ground connector with a ground terminal to be connected to the ground electrode of the circuit to be measured, and at least one second region connected to the ground terminal and on which the remaining terminal of the chip capacitor is mounted in one-to-one correspondence with the first region.

Abstract: A cartridge system includes a main probing head body with electronics positioned therein. Further, the cartridge system includes a probing tip cartridge having a probing tip. An electrical contact mechanism electrically couples the electronics to the probing tip when the probing tip cartridge is in mating relationship with the main probing head body. The types may be, for example, a pointed tip, a socket tip, or a grabber tip.

Abstract: A circuit tester (1) for testing circuit integrity in a series-wired string of Christmas fairy lights powered by domestic mains electricity.

Abstract: A contamination resistant probe attachment device attaches over an opening in a top cover of a disc drive to couple a testing probe to the interior of the disc drive. The attachment device has a base for surrounding and attaching around the opening in the top cover in the disc drive and a centrally located aperture for communicating with an upwardly extending flexible tube. The flexible tube having a first and second end, the first end attaching to the base and a second end defining an engagement opening throughwhich a disc drive testing probe is inserted.

Abstract: A low capacitance probe tip and socket for a measurement probe has a probe tip extending through an insulating plug and a recess defining a socket formed in the plug. The socket has an aperture formed therein that provides access the low capacitance probe tip. An electrically conductive contact is disposed in the aperture that extends into the socket and is in electrical contact with the low capacitance probe tip. In one embodiment, the socket is formed parallel to the low capacitance probe tip. In a further embodiment, the socket is formed at an angle to the low capacitance probe tip with the electrically conductive contact being an electrically conductive elastomeric material disposed at the distal end of the socket in electrical contact with the low capacitance probe tip.

Abstract: An electrical test probe tip capable of establishing an electrical connection to test objects on a circuit board and particularly to rounded or irregularly shaped test objects. A preferred embodiment of the notched electrical test probe tip of the present invention has a probing tip with a longitudinal planar axis. Two planar contact surfaces substantially form an inverted “V” from the longitudinal planar axis when viewed from either side of the probing tip. The probing tip has a notch defined therein when viewed from both the front and the back. Optionally the preferred embodiment may have an exterior insulating coating. This configuration can be constructed by starting with an elongate electrically conductive blank and drilling an at least partial central bore substantially parallel to the longitudinal planar axis. Then two planar cuts are made removing a portion of the blank to expose the contact surfaces.

Abstract: A micro tool set is described in which all of the tools are formed from stock no larger than 1.0 mm in diameter. Each tool is laser machined from stock no larger than 1.0 micron in diameter. Various shapes are “carved” from the original stock such that the finished tool does not extend beyond the nominal cylindrical shape of the stock. The tools are specifically adapted to be used for the repair of semiconductor test probe head wires.

Abstract: A metering module has a housing, a metering circuit in the housing for receiving and processing at least one signal corresponding to an electrical quantity, and developing an output signal. A connector mounted to the said housing is coupled to the metering circuit, and configured for engagement with a mating connector at least one of a sensor array module and a mounting and connection base. Mounting structure is provided on the housing for removably mounting the housing to at least one of a sensor array module and a mounting and connection base. A circuit in the housing delivers voltage and current signals received at the first and second connectors to a further connector mounted on the housing. First and second mounting structures are provided for mounting the housing to a surface and for mounting a removable metering module.

Abstract: A probe apparatus for use with analyzing devices, primarily oscilloscopes and logic analyzers, which uses pole-zero cancellation to provide a probe with low capacitance and wide bandwidth. Pole-zero cancellation enables the probe to have constant gain at all frequencies. In one embodiment, the coaxial cable between the probe tip and the replication amplifier is terminated in its characteristic impedance to provide constant gain at all frequencies regardless of cable length. Use of pole-zero cancellation and thick film technology enables building a probe with a small, durable tip.