Thickness Measuring Patents (Class 324/229)
  • Patent number: 10429435
    Abstract: Method of contactless measurement of the conductivity of semiconductors, said method being implemented by: a first assembly comprising a signal emission/reception system —a second assembly comprising at least one semi-conducting target and an inductor element, —a third assembly, said method comprising at least the following steps: a) the first assembly emits a multifrequency signal, b) the second assembly reflects or transmits at least one part of the multifrequency signal emitted, c) the first assembly receives the reflected multifrequency signal reflected by the second assembly, d) the third assembly calculates the coefficient of reflection or of transmission of the emitted signal, e) the third assembly provides the conductivity of the semiconducting target.
    Type: Grant
    Filed: April 7, 2016
    Date of Patent: October 1, 2019
    Assignees: Centre National De La Recherche Scientifique—CNRS, Universite Paris-Sud, Ecole Superieure D'Electricite
    Inventors: Denis Mencaraglia, Yann Le Bihan, Florent Loete
  • Patent number: 10428645
    Abstract: An integrated and rigless method of determining the location and the type of damage in casing or tubing of a wellbore that involves recording a thickness profile of the casing or tubing, a temperature log, and a noise log along the depth of the wellbore, followed by locating the damage from the thickness profile, and determining the type of damage from the temperature log and the noise log.
    Type: Grant
    Filed: October 4, 2018
    Date of Patent: October 1, 2019
    Assignee: King Fahd University of Petroleum and Minerals
    Inventors: Ali Musa Al-Hussain, M. Enamul Hossain
  • Patent number: 9977144
    Abstract: Methods and apparatus for analyzing nested tubulars via electromagnetic (EM) logging. An example method includes operating an EM logging tool within tubulars nested within a wellbore. The EM logging tool includes an EM transmitter and multiple EM receivers. Data obtained via the EM receivers is utilized to estimate an individual thickness of each tubular at each of multiple depths within the wellbore. The estimated individual thicknesses are utilized to estimate a cumulative thickness of the tubulars at each depth. Local variations of the estimated cumulative thicknesses are utilized to distinguish between actual and spurious indications of differences between the estimated individual thicknesses at neighboring depths.
    Type: Grant
    Filed: September 15, 2016
    Date of Patent: May 22, 2018
    Assignee: Schlumberger Technology Corporation
    Inventors: Martin David, Saad Omar, Dzevat Omeragic
  • Patent number: 9880130
    Abstract: A Pulsed Eddy Current device for inspecting an object made of an electrically conductive material comprising: at least one dual-purpose coil serving a dual purpose of producing a supplied magnetic field in the object and measuring a produced magnetic field emitted by the object, a transmitter circuit driving the dual-purpose coil(s) with an electrical signal, a shut-off current circuit for the transmitter circuit for cutting-off a current in the dual-purpose coil(s) during a cut-off phase of the electrical signal, the shut-off current circuit applying a voltage inversion on the dual-purpose coil(s) and a receiver circuit for reading the produced magnetic field from the dual-purpose coil(s). A method for inspecting an object comprising supplying a voltage on at least one dual-purpose coil, cutting-off a current in the dual-purpose coil(s) by applying a voltage inversion on the dual-purpose coil(s) and receiving, at the dual-purpose coil(s), a produced magnetic field.
    Type: Grant
    Filed: December 14, 2016
    Date of Patent: January 30, 2018
    Assignee: EDDYFI NDT INC.
    Inventors: Florian Hardy, Maxime Rochette, Marc Grenier, Vincent Demers-Carpentier
  • Patent number: 9472311
    Abstract: A method to assess light water reactor fuel integrity is presented having the steps of granting access in a nuclear reactor fuel pool to at least one of a discharged fuel rod and a nuclear fuel assembly, calculating an operating flux for the fuel rod, measuring a thickness of CRUD on the fuel rod, measuring a thickness of oxide on the fuel rod, calculating a maximized flux for the at least one fuel rod for a position of the one fuel rod in a nuclear reactor, calculating a maximized deposit for the fuel rod, calculating a maximized oxide thickness for the fuel rod, calculating a fuel condition index of the fuel rod, comparing the fuel condition index to an index constant, and removing the fuel rod from operation when the fuel condition index is greater than the index constant.
    Type: Grant
    Filed: April 23, 2014
    Date of Patent: October 18, 2016
    Assignee: AREVA Inc.
    Inventors: Mihai G. M. Pop, Brian Glenn Lockamon
  • Patent number: 9441961
    Abstract: A method includes measuring a caliper of a sheet of material using a caliper sensor having first and second sensor modules. The method also includes adjusting the caliper measurement based on a transverse displacement between a first sensor component in the first sensor module and a second sensor component in the second sensor module to generate a corrected caliper measurement. Adjusting the caliper measurement can include applying a corrector function that adjusts the caliper measurement based on the measured transverse displacement. The corrector function can be identified by repeatedly creating misalignment between the first and second sensor components, measuring a known distance using the caliper sensor, and identifying an error between the measurement of the known distance and the known distance.
    Type: Grant
    Filed: April 30, 2012
    Date of Patent: September 13, 2016
    Assignee: Honeywell Limited
    Inventors: Frank M. Haran, Sebastien Tixier, Michael K. Y. Hughes, Graham Duck, John F. Shakespeare
  • Patent number: 9335151
    Abstract: In one embodiment, a sample is tested by an eddy current sensor at two distances separated by a known incremental distance. In one aspect, at least one of an unknown distance of the sensor from the test sample and the film thickness of the test sample may be determined as a function of a comparison of sensor output levels of a single parameter and the known incremental distance to calibration data. In yet another aspect, the distance between the sensor and the test sample may oscillated to produce an oscillating sensor output signal having an amplitude and mean which may be measured and compared to calibration data to identify at least one of the unknown film thickness of a conductive film on a test sample, and the unknown distance of the test sample from the sensor. Other aspects and features are also described.
    Type: Grant
    Filed: October 26, 2012
    Date of Patent: May 10, 2016
    Assignee: APPLIED MATERIALS, INC.
    Inventors: Edward W. Budiarto, Todd J. Egan, Dmitry A. Dzilno
  • Patent number: 9170234
    Abstract: If surface defects, near surface defects, or internal defects of a ferromagnetic substance object, a paramagnetic substance object, or a mixture object of ferromagnetic and paramagnetic substances are not quantitatively analyzed, the detected results can be differently analyzed depending on the knowledge or skill of an inspector. A defect detection apparatus according to an exemplary embodiment of the present invention includes an induced current applier, a magneto-electric converter, a signal processor, a signal converter, and a data processor. The induced current applier applies a line or surface current to an object that is to be measured by using an alternating current (AC) having a frequency varying depending on a depth to be measured. The magneto-electric converter senses a magnetic field generated from the object by the Hn e or surface current and generates a magnetic field sensing signal corresponding to a strength of the sensed magnetic field.
    Type: Grant
    Filed: August 7, 2007
    Date of Patent: October 27, 2015
    Assignee: INDUSTRY-ACADEMIC COOPERATION FOUNDATION, CHOSUN UNIVERSITY
    Inventors: Jin-Yi Lee, Jong-Woo Jun, Ji-Seong Hwang
  • Patent number: 9170089
    Abstract: A system and method for measuring a pipe is provided. The system includes a frame rotatably receiving the pipe, a carriage movably positionable along the frame, a guide floatingly positionable about the carriage, at least one sensor for measuring a position of the pipe, and a measurement unit operatively linked to the sensor for collecting measurements therefrom. The guide has a mouth that receivingly engages the pipe and axially aligns therewith. The pipe is measured with the sensor(s) while moving at least one of the pipe, the carriage and the guide.
    Type: Grant
    Filed: November 30, 2012
    Date of Patent: October 27, 2015
    Assignee: National Oilwell Varco, L.P.
    Inventors: Kevin D. Logan, Andres C. Rodriguez, Claudio Aguirre, Clive C. Lam
  • Patent number: 9115979
    Abstract: A web thickness measuring equipment and a method of measuring a web thickness. A web thickness measuring equipment includes: a roller that is rotatable and configured to wind a web; a detection unit that detects a light amount on an outer circumferential surface of the roller or an external surface of the web wound on the roller, and detects a magnetic field of an internal surface of the web opposite to the external surface; and a processor unit configured to obtain a thickness of the web by generating profile data of the outer circumferential surface of the roller, generating displacement amount data of a target external surface of the web, generating displacement amount data of a target internal surface of the web, and comparing the displacement amount data of the target external surface of the web with the displacement amount data of the target internal surface of the web.
    Type: Grant
    Filed: February 11, 2013
    Date of Patent: August 25, 2015
    Assignee: Samsung SDI Co., Ltd.
    Inventors: Pilgoo Jun, Youngcheol Sim, Cheolhong Kim, Junsub Lee
  • Patent number: 9091526
    Abstract: An equipment for inspecting the thickness of fiber cloth and a method therefor. The method includes disposing a fiber cloth on a metal backboard; sensing an eddy current responding from the fiber cloth and the metal backboard by an eddy current sensing device to obtain a multilayer thickness value; and comparing the multilayer thickness value with a single-layer thickness value to obtain a cloth thickness value corresponding to the thickness of the fiber cloth, wherein the single-layer thickness value is obtained by sensing an eddy current responding from the metal backboard, thereby the thickness of fiber cloth can be obtained.
    Type: Grant
    Filed: December 12, 2012
    Date of Patent: July 28, 2015
    Assignee: TAIWAN POWER TESTING TECHNOLOGY CO., LTD.
    Inventor: Yu-Chiang Lin
  • Patent number: 9007059
    Abstract: Methods and apparatuses for calibrating eddy current sensors. A calibration curve is formed relating thickness of a conductive layer in a magnetic field to a value measured by the eddy current sensors or a value derived from such measurement, such as argument of impedance. The calibration curve may be an analytic function having infinite number terms, such as trigonometric, hyperbolic, and logarithmic, or a continuous plurality of functions, such as lines. High accuracy allows the omission of optical sensors, and use of eddy current sensors for endpoint detection, transition call detection, and closed loop control in which a process parameter is changed based on the measured magnetic flux density change in one or more processing zones.
    Type: Grant
    Filed: January 26, 2012
    Date of Patent: April 14, 2015
    Assignee: Novellus Systems, Inc.
    Inventors: Sudeep Kumar Lahiri, Paul Franzen
  • Patent number: 8917089
    Abstract: A device for detecting metal elements in slab form such as metal plates or sheets, includes an emission coil powered by suitable control elements and generating a magnetic field, a reception coil placed so as to enable generation via induction of a voltage across the terminals of the coil under the action of the magnetic field, and elements for processing and evaluating the voltage signal delivered by the at least one reception coil, enabling delivery of an information signal indicating the absence or presence of one or more metal elements near the coils. The emission coil (3) and the reception coil (5) are both mounted in a housing or a sensor head having an active detection face having an associated detection region, and are positioned at a defined inclination one relative to the other and relative to the face.
    Type: Grant
    Filed: May 10, 2011
    Date of Patent: December 23, 2014
    Assignee: Senstronic (Societe par Actions Simplifiee)
    Inventor: Rémy Kirchdoerffer
  • Patent number: 8884614
    Abstract: Present embodiments include eddy current array probes having differential coils capable of detecting both long and short flaws in a test specimen and, additionally or alternatively, multiplexed drive coils. For example, an eddy current array probe may include a first plurality of eddy current channels disposed in a first row and a second plurality of eddy current channels disposed in a second row. The first plurality and second plurality of eddy current channels overlap in a first direction but do not overlap in a second direction. The probe also includes a semi-circular drive coil disposed proximate to the first plurality and second plurality of eddy current channels and configured to generate a probing magnetic field for each sense coil of the eddy current channels.
    Type: Grant
    Filed: October 31, 2011
    Date of Patent: November 11, 2014
    Assignee: General Electric Company
    Inventors: Changting Wang, Yuri Alexeyevich Plotnikov, Mandar Diwakar Godbole, Aparna Chakrapani Sheila-Vadde
  • Patent number: 8749230
    Abstract: Methods and systems are provided for measuring a thickness of an object. A first portion of a device is positioned on a first side of the object, and a second portion of the device is positioned on an opposite side of the object. The first portion includes at least one first mount and at least one eddy current sensor coupled to the first mount. The second portion includes at least one second mount and at least one target coupled to the second mount. The first mount is magnetically coupled to the second mount such that the eddy current sensor is oriented to interact with the target to enable the thickness of the object to be measured.
    Type: Grant
    Filed: October 13, 2010
    Date of Patent: June 10, 2014
    Assignee: The Boeing Company
    Inventors: Michael D. Fogarty, William J. Tapia, Gary E. Georgeson, Martin L. Freet, Jeffrey G. Thompson, David W. Anderson, Ronald E. VonWahlde
  • Publication number: 20140125330
    Abstract: Disclosed is a Hall sensor probe that configured to be coupled with one of a plurality of magnetic targets for measuring the thickness of a non-ferromagnetic wall. The probe comprises a magnetic field source, a Hall sensor, a concentrator and a main housing. The novel aspects of the probe include a wear tip that is exchangeably affixed onto the main-housing, leaving a permanent gap from and disjoined from the concentrator in a manner that transfers stress from the tip directly onto the main-housing. To serve every aspects of the primary objective, being it mechanical, thermal and operational, the material of the tip preferably has a fracture toughness higher than 20 MPa·m1/2, wear coefficient higher than 100, and a magnetic susceptibility lower than 0.001.
    Type: Application
    Filed: November 7, 2012
    Publication date: May 8, 2014
    Inventors: Matthew Edward STANTON, Steven Abe LaBRECK
  • Publication number: 20140125331
    Abstract: The invention provides an equipment of inspecting thickness of fibre cloth and method therefor. The method includes following steps: disposing a fibre cloth on a metal backboard; sensing an eddy current responding from the fibre cloth and the metal backboard by an eddy current sensing device to obtain a multilayer thickness information; and comparing the multilayer thickness information with a single-layer thickness information to obtain a cloth thickness information corresponding to the thickness of the fibre cloth, wherein the single-layer thickness information is obtained by sensing an eddy current responding from the metal backboard, thereby the thickness of fibre cloth can be obtained.
    Type: Application
    Filed: December 12, 2012
    Publication date: May 8, 2014
    Applicant: TAIWAN POWER TESTING TECHNOLOGY CO., LTD.
    Inventor: YU-CHIANG LIN
  • Publication number: 20140117982
    Abstract: In one embodiment, a sample is tested by an eddy current sensor at two distances separated by a known incremental distance. In one aspect, at least one of an unknown distance of the sensor from the test sample and the film thickness of the test sample may be determined as a function of a comparison of sensor output levels of a single parameter and the known incremental distance to calibration data. In yet another aspect, the distance between the sensor and the test sample may oscillated to produce an oscillating sensor output signal having an amplitude and mean which may be measured and compared to calibration data to identify at least one of the unknown film thickness of a conductive film on a test sample, and the unknown distance of the test sample from the sensor. Other aspects and features are also described.
    Type: Application
    Filed: October 26, 2012
    Publication date: May 1, 2014
    Applicant: APPLIED MATERIALS, INC.
    Inventors: Edward W. BUDIARTO, Todd J. EGAN, Dmitry A. DZILNO
  • Patent number: 8704510
    Abstract: A method for identifying, measuring, and monitoring metal loss through corrosion ferromagnetic piping includes drive coils secured to the pipe and driven to emit a magnetic field which is transmitted through the object by magnetic domains in the object. Response coils detect the magnetic domains and generate a response signal. Response coils may be saddle or loop coils, or printed coils on flexible substrates that are applied to conform to the pipe peripheral surface. The system operates reiteratively over an extended period of time to detect loss of magnetic domains which is an important indicator of corrosion and deterioration of the object.
    Type: Grant
    Filed: December 12, 2012
    Date of Patent: April 22, 2014
    Inventor: Jerome R. Singer
  • Publication number: 20140062468
    Abstract: A device for globally measuring a thickness of a metal film (901), comprises: a base (10); a rotating unit (20) comprising a fixed member (21) fixed on the base (10) and a rotating member (22) having a rotating joint (23); a working table (50) fixed on the rotating member (22) and having a vacuum passage which is formed therein and connected with the rotating joint (23); a linear driving unit (30) including a guide rail (31) fixed on the base (10) and a sliding block (32) slidable along the guide rail (31); a cantilever beam (40) disposed horizontally and defining a first end fixed with the sliding block (32) and a second end; a measuring head (80) connected to the second end of the cantilever beam (40), facing a surface of the working table (50) and having an eddy current probe (82) disposed therein.
    Type: Application
    Filed: November 17, 2011
    Publication date: March 6, 2014
    Applicant: Tsinghua University
    Inventors: Xinchun Lu, Dewen Zhao, Zilian Qu, Qian Zhao, Yongyong He, Yonggang Meng
  • Patent number: 8432159
    Abstract: Magnetostrictive transducers for monitoring wall thinning in a pipe, and an apparatus and method for monitoring wall thinning in a pipe using magnetostrictive transducers are provided. The magnetostrictive transducers generate broadband multimode shear horizontal (SH) waves, and allow the generated SH waves to travel along the pipe, thus correctly monitoring a status of the wall thinning of the pipe. The apparatus includes a transmitting transducer which is installed outside of a pipe and generates shear horizontal (SH) waves traveling along the pipe, a receiving transducer which is spaced apart from the transmitting transducer and measures the shear horizontal (SH) waves traveling along the pipe, and a controller for monitoring wall thinning of the pipe by exciting and measuring output signals of the transmitting and receiving transducers.
    Type: Grant
    Filed: August 6, 2009
    Date of Patent: April 30, 2013
    Assignee: Korea Reseach Institute of Standards adn Scince
    Inventors: Seung Hyun Cho, Hyu Sang Kwon, Bong Young Ahn, Seung Seok Lee
  • Patent number: 8395376
    Abstract: An apparatus and method for identifying, measuring, and monitoring metal loss through corrosion or other deleterious factors in ferromagnetic piping and ferromagnetic objects. Drive coils secured to the object are driven to emit a magnetic field which is transmitted through the object by magnetic domains in the object. Response coils detect the magnetic domains and generate a response signal. The drive and response signals can penetrate insulating materials and non-ferromagnetic metallic coverings of the piping and vessels. The system operates reiteratively over an extended period of time, e.g., months or years, to detect loss of magnetic domains which is an important indicator of corrosion and deterioration of the object.
    Type: Grant
    Filed: November 22, 2010
    Date of Patent: March 12, 2013
    Assignee: 4D Imaging, Inc.
    Inventors: Jerome R. Singer, Glen Stevick, David Rondinone, John Zalabak
  • Patent number: 8390280
    Abstract: A device and method for inspecting an inspection object of in the vicinity of a further object, both of electrically conductive material, the device comprising a transmitter/receiver arrangement for generating an electromagnetic field in the inspection object, and for measuring a signal indicative of a transient eddy current which is generated in the inspection object by the electromagnetic field, wherein the device further comprises a magnetic shield means, providing at least a partial magnetic shield for the transmitter/receiver arrangement in a direction other than a measurement direction; use of the device from inside an annulus between an inner and an outer tubular, and a method of operating a hydrocarbon well having a well completion, and inspecting the well completion from inside an annulus.
    Type: Grant
    Filed: September 20, 2007
    Date of Patent: March 5, 2013
    Assignee: Shell Oil Company
    Inventors: Dave Badoux, Paulus Carolus Nicolaas Crouzen, Johan Van Der Steen
  • Patent number: 8368390
    Abstract: A well (2) doped for a conductivity type and provided as the sensor region is formed in a substrate (1) made of semiconductor material. Contact regions (4), arranged spaced apart from one another and doped for the same conductivity type as the well (2), are formed in a cover layer (3) that delimits the region with the conductivity type of the well. The contact areas (4) are electroconductively connected to the well (2) and provided for terminal contacts (6).
    Type: Grant
    Filed: August 26, 2010
    Date of Patent: February 5, 2013
    Assignee: Austriamicrosystems AG
    Inventors: Martin Schrems, Sara Carniello
  • Patent number: 8358126
    Abstract: A method of testing for defects in the bottom of an above ground storage tank, the tank bottom having a lip extending outwardly from the tank wall around the circumference of the tank. A special magnetostrictive sensor is designed to be placed on this lip. The sensor is placed over a strip of magnetostrictive material, which generally conforms in length and width to the bottom of the probe, with a couplant being applied between the strip and the lip surface. The sensor is then operated in pulse echo mode to receive signals from defects in the bottom of the tank. It is incrementally moved around the circumference of the tank.
    Type: Grant
    Filed: January 14, 2010
    Date of Patent: January 22, 2013
    Assignee: Southwest Research Institute
    Inventors: Glenn M Light, Alan R Puchot, Adam C Cobb, Erika C Laiche
  • Publication number: 20130009634
    Abstract: The present invention provides a probe apparatus and an associated method for measuring a magnetite deposit thickness, which apparatus and method is independent of the porosity and magnetic permeability of the magnetite deposit. The probe apparatus of this invention is an axial scanning and inside surface-following probe that can accurately and reliably measure the inside diameter of a tube. The probe apparatus of the present invention optionally comprises two modules: the first module is the surface-following module and the second module is a conventional eddy current probe.
    Type: Application
    Filed: June 25, 2010
    Publication date: January 10, 2013
    Inventors: Richard Lakhan, Brian Lepine, Joseph Renaud, Laurie Davey
  • Publication number: 20130000845
    Abstract: A device for measuring a thickness of a slurry used in a chemical mechanical polishing apparatus and a method using the same are provided. The chemical mechanical polishing apparatus comprises a polishing head (10), a rotary table (20), a polishing platen (30) and a polishing pad (40). The device for measuring the thickness of the slurry comprises: a distance sensor (50) disposed in the polishing platen (30) for measuring a distance between the distance sensor (50) and a wafer (11) in the polishing head (10); a processing unit (70) (60) disposed in the rotary table (20) and connected to the distance sensor (50) for converting a measuring signal from the distance sensor (50) into standard electrical signal; a processing unit (70) connected to distance converters (60) for acquiring the standard electrical signal to obtain a thickness of the slurry between the polishing head (10) and the polishing pad (40).
    Type: Application
    Filed: June 7, 2011
    Publication date: January 3, 2013
    Applicant: Tsinghua University
    Inventors: Xinchun Lu, Dewen Zhao, Yongyong He, Jianbin Luo
  • Patent number: 8319494
    Abstract: A pipeline inspection tool includes two pole magnets oriented at an oblique angle relative to the central longitudinal axis of the tool body. An array of sensor coil sets is located between opposing edges of the two pole magnets and oriented perpendicular to the central longitudinal axis. Each sensor coil set includes a transmitter coil and two opposing pairs of receiver coils that are gated to receive reflections from the wall of a tubular member. Because the line of sensor coils is rotated relative to the magnetic bias field, the receiver coils are in-line with, and have the same angular orientation as, the transmitter coil. The tool provides improved sensitivity to small defects, substantial decrease in RF pulser power requirements, full circumferential coverage, self-calibration of the transmitted signals, and less interference between transmitter coils caused by acoustic ring around.
    Type: Grant
    Filed: December 18, 2009
    Date of Patent: November 27, 2012
    Assignee: TDW Delaware Inc.
    Inventors: James Simek, Jed Ludlow, John H. Flora, Syed M. Ali, Huidong Gao
  • Patent number: 8284560
    Abstract: An apparatus for monitoring the thickness of a conductive layer on a substrate includes a support to hold a substrate having a conductive layer, an eddy current monitoring system including a first plurality of core portions, and a motor to cause relative motion between the support and the eddy current monitoring system such that the substrate moves across the first plurality of core portions in a direction that defines a first axis. At least one core portion is positioned further from a second axis than at least two other core portions. The second axis is orthogonal to the first axis.
    Type: Grant
    Filed: November 11, 2009
    Date of Patent: October 9, 2012
    Assignee: Applied Materials, Inc.
    Inventors: Hassan G. Iravani, Ingemar Carlsson, Boguslaw A. Swedek
  • Patent number: 8274282
    Abstract: The invention concerns a method for producing an assembly of at least one transmission coil (B1) and one reception coil (B2) for eddy current testing, the reception coil receiving in the absence of fault a complex amplitude signal VR, subject to a variation ?VR in the presence of a characteristic fault to be detected. The method consists in selecting the distance ?ER between the axes of the transmission coil and the reception coil so as to maximize the ratio I?VR/VRI.
    Type: Grant
    Filed: January 27, 2006
    Date of Patent: September 25, 2012
    Assignee: Commissariat a l'Energie Atomique
    Inventors: Jean-Marc Decitre, Thierry Sollier
  • Publication number: 20120126798
    Abstract: An apparatus and method for identifying, measuring, and monitoring metal loss through corrosion or other deleterious factors in ferromagnetic piping and ferromagnetic objects. Drive coils secured to the object are driven to emit a magnetic field which is transmitted through the object by magnetic domains in the object. Response coils detect the magnetic domains and generate a response signal. The drive and response signals can penetrate insulating materials and non-ferromagnetic metallic coverings of the piping and vessels. The system operates reiteratively over an extended period of time, e.g., months or years, to detect loss of magnetic domains which is an important indicator of corrosion and deterioration of the object.
    Type: Application
    Filed: November 22, 2010
    Publication date: May 24, 2012
    Inventors: David Rondinone, Jerome R. Singer, Glen Stevick, John Zalabak
  • Patent number: 8174258
    Abstract: A system and method for measurement of parameters of a conductive material, include generating an oscillating electromagnetic field (EMF) interacting with a sample portion from a remotely positioned source; measuring values of components of impedance of the electromagnetic; populating a system of equations including a theory of electromagnetism-based mathematical model of the electromagnetic system; solving the system of equations to calculate values of a distance between the sample portion and the source, thickness of the sample portion in proximity to a point of projection of the source onto the sample portion and electromagnetic properties of the sample portion; outputting the calculated values as the measured values; and repeating the steps of generating, populating, solving, outputting and repeating using the calculated values for the step of populating in place of the measured component values.
    Type: Grant
    Filed: April 20, 2009
    Date of Patent: May 8, 2012
    Assignee: Dolphin Measurement Systems LLC
    Inventors: Alexander M. Raykhman, Eugene Naidis, Ellis S. Waldman
  • Publication number: 20120095686
    Abstract: The apparatus employs the remote field eddy-current (RFEC) inspection technique to electromagnetically measure physical parameters of a metallic pipe. RFEC devices inserted into and displaced along a cylindrical pipes may be used to measure the ratio of pipe thickness to electromagnetic skin-depth and thus allow for the non-invasive detection of flaws or metal loss. Typically these RFEC thickness measurements exhibit a so-called double-indication of flaws, an undesired artifact due to a double-peaked geometrical sensitivity function of the device. The method describes a means by which this double indication artifact may be removed by an appropriate processing of RFEC measurements performed by an apparatus specifically designed for this purpose. The invention is particularly well designed for applications in the oilfield industry.
    Type: Application
    Filed: June 25, 2010
    Publication date: April 19, 2012
    Inventors: Emmanuel Legendre, Thilo M. Brill, Richard A. Rosthal, Gerald N. Minerbo
  • Patent number: 8154277
    Abstract: A method and an apparatus for measuring the thickness of a metal layer. The metal layer has a resistivity (?1) that differs from the resistivity (?2) of the metal object. The apparatus includes a first device arranged to generate a magnetic field in close vicinity of the metal layer, and to generate a variation of the magnetic field so that a current is induced in the surface of the metal layer, a second device arranged to measure the changes of the magnetic field outside the metal layer due to the induced current during a time period that is longer than the time it takes for the current to propagate through the metal layer, and a computing unit to determine the thickness of the layer based on a mathematical relation between the thickness of the layer and the measured values of the changes of the magnetic field.
    Type: Grant
    Filed: September 16, 2011
    Date of Patent: April 10, 2012
    Assignee: ABB AB
    Inventors: Sten Linder, Lennart Thegel
  • Patent number: 8106651
    Abstract: Methods and apparatuses for calibrating eddy current sensors. A calibration curve is formed relating thickness of a conductive layer in a magnetic field to a value measured by the eddy current sensors or a value derived from such measurement, such as argument of impedance. The calibration curve may be an analytic function having infinite number terms, such as trigonometric, hyperbolic, and logarithmic, or a continuous plurality of functions, such as lines. High accuracy allows the omission of optical sensors, and use of eddy current sensors for endpoint detection, transition call detection, and closed loop control in which a process parameter is changed based on the measured magnetic flux density change in one or more processing zones.
    Type: Grant
    Filed: April 17, 2008
    Date of Patent: January 31, 2012
    Assignee: Novellus Systems, Inc.
    Inventors: Sudeep Kumar Lahiri, Paul Franzen
  • Publication number: 20120001624
    Abstract: A method and an apparatus for measuring the thickness of a metal layer. The metal layer has a resistivity (?1) that differs from the resistivity (?2) of the metal object. The apparatus includes a first device arranged to generate a magnetic field in close vicinity of the metal layer, and to generate a variation of the magnetic field so that a current is induced in the surface of the metal layer, a second device arranged to measure the changes of the magnetic field outside the metal layer due to the induced current during a time period that is longer than the time it takes for the current to propagate through the metal layer, and a computing unit to determine the thickness of the layer based on a mathematical relation between the thickness of the layer and the measured values of the changes of the magnetic field.
    Type: Application
    Filed: September 16, 2011
    Publication date: January 5, 2012
    Inventors: Sten Linder, Lennart Thegel
  • Patent number: 8089274
    Abstract: The present invention relates to a method for evaluating the SOI wafer in a method for evaluating an SOI wafer in which a sheet resistance of a buried diffusion layer of an SOI wafer that has at least an SOI layer on an insulator layer and has a buried diffusion layer whose impurity concentration is higher than other region of the SOI layer in an interface area with the insulator layer of the SOI layer is evaluated, the method including the steps of measuring a sheet resistance of the whole SOI layer or the whole SOI wafer, and estimating the sheet resistance of the buried diffusion layer by assuming respective layers that compose the SOI wafer to be resistors connected in parallel and converting the measured result of the sheet resistance measurement. As a result of this, there is provided a method for evaluating the SOI wafer that can directly measure the SOI wafer itself to be the product to thereby evaluate the sheet resistance of the buried diffusion layer thereof, without fabricating a monitor wafer.
    Type: Grant
    Filed: May 10, 2007
    Date of Patent: January 3, 2012
    Assignee: Shin-Etsu Handotai Co., Ltd.
    Inventor: Kazuhiko Yoshida
  • Publication number: 20110260720
    Abstract: The invention relates to a measuring probe for non-destructive measuring of the thickness of thin layers on an object with a measuring head, which comprises at least one sensor element for contact on a measurement surface of an object, and with a support device for receiving the measuring head, which is at least partly surrounded by a housing, wherein at least one further measuring head, which is adjacent to and separated from the first measuring head, is arranged on the support device, which can be controlled independently of the first measuring head.
    Type: Application
    Filed: April 25, 2011
    Publication date: October 27, 2011
    Inventor: Helmut Fischer
  • Publication number: 20110260721
    Abstract: The invention relates to a measuring probe for non-destructive measuring of the thickness of thin layers, in particular in cavities, which are accessible by an opening or on curved surfaces, with a measuring head, which comprises at least one sensor element and at least one contact spherical cap, assigned to the sensor element on a surface, to be checked, of the cavity, and with a gripping element for positioning and guiding the measuring probe on and/or along the surface to be measured, wherein on the gripping element, a long, elastically yielding guide bar is provided, which accepts the at least one measuring head on its end opposing the gripping element, in such a way that it is moveable with at least one degree of freedom in relation to the guide bar.
    Type: Application
    Filed: April 25, 2011
    Publication date: October 27, 2011
    Inventor: Helmut Fischer
  • Publication number: 20110254544
    Abstract: The present invention relates to a method and a device for measuring the layer thickness of partially solidified melts, particularly on a conveyor belt, during continuous casting. In order to determine the layer thickness, magnetic fields are used, which are created by means of electromagnetic stirring coils that are present on one side of the layer. The reduced magnetic field is then detected on the other side of the layer and is used for calculating the layer thickness.
    Type: Application
    Filed: December 18, 2009
    Publication date: October 20, 2011
    Applicant: SMS SIEMAG AKTIENGESELLSCHAFT
    Inventors: Norbert Vogl, Jörg Bausch
  • Patent number: 8013598
    Abstract: Provided is an object detecting device, which can detect the shape of or the distance from an object made of an electrically conductive or magnetic material, and which can detect the position indicated by an object made of an electrically-non-conductive/non-magnetic material, such as a finger. The object detecting device detects the shape of or the distance from an object to be measured, which is placed on a detection surface and made of an electrically conductive or magnetic material, by using an electromagnetic induction. The object detecting device includes a first loop wire group of a plurality of first loop wires (1) arranged in parallel on the same plane, a second loop wire group of a plurality of second loop wires (2) arranged in parallel on the same plane, and a spacer (3) for keeping the distance between them at a constant. The plurality of the second loop wires (2) are individually arranged in a direction perpendicular to the plurality of the first loop wires (1).
    Type: Grant
    Filed: June 4, 2007
    Date of Patent: September 6, 2011
    Assignee: Newcom, Inc.
    Inventor: Yasuji Ogawa
  • Patent number: 7982457
    Abstract: The present invention is a method and an eddy current system for non-contact determination of the resistance between the current lead stripe and the coating during continuous fabrication of chemical power sources such as batteries, supercapacitors, photovoltaic modules and the like. Both the method and the non-destructive test system for practicing the method are described. The method includes placing of an integrated measuring transducer containing two strap-type eddy current probes above the surface of the coating applied to the metallic current lead stripe in the region of the shaft guiding the stripe movement, so that all the points of the operating surface of the transducer being at an equal distance from the stripe surface coating so that the two probes would take measurements on the same area of the coating.
    Type: Grant
    Filed: January 15, 2009
    Date of Patent: July 19, 2011
    Assignee: Enerize Corporation
    Inventors: Volodymyr I. Redko, Volodymyr Khandetskyy, Elena M. Shembel, Oxana V. Redko, Peter Novak
  • Publication number: 20110163740
    Abstract: A blanket probe for detecting the thickness of a wall having a non-planar surface has a probe portion comprising a planar substrate that is flexible in one or two dimensions, an array of detectors mounted on the substrate and at least one interface for communicating signals to and from each detector.
    Type: Application
    Filed: January 6, 2011
    Publication date: July 7, 2011
    Applicant: RUSSELL NDE SYSTEMS INC.
    Inventors: David Edward Russell, Hoan Van Nguyen, Yuwu Yu, Edwin Walter Reid
  • Patent number: 7960969
    Abstract: An electromagnetic imaging apparatus and method for electromagnetically measuring physical parameters of a pipe CJ, CC by means of a plurality of measuring arrangement ZMA, MCMA, MonMa, ImMA comprising a plurality of transmitter coil ZTX, LFTX, DTX and a plurality of receiver coil ZRX1, ZR2, MRX, MC, PRX1, PRX2, PRX3, PRX4, PRX5, PRX6, PRX7, PRX8, PRX9, PRX10, PRX11, PRX12, PRX13, PRX14, PRX15, PRX16, PRX17, PRX18, the transmitter coils and receiver coils being associated so as to form the plurality of measuring arrangement, the plurality of measuring arrangement being adapted to be positioned into the pipe and displaced through the pipe, the physical parameters being measured for a plurality of position along the pipe.
    Type: Grant
    Filed: November 28, 2006
    Date of Patent: June 14, 2011
    Assignee: Schlumberger Technology Corporation
    Inventors: Pierre Mouget, Emmanuel Legendre, Thilo Brill
  • Patent number: 7898246
    Abstract: A method and apparatus for nondestructive inspection of interwoven wire fabric components. The apparatus comprises a probe, a power source, and a display system. The probe is capable of creating a magnetic field for a plurality of wires in an interwoven wire fabric component such that disturbances of the magnetic field caused by the plurality of wires can be detected. The power is a source connected to the probe and is capable of sending an alternating current through the probe to generate the magnetic field for the wire. The display system is connected to the probe and is capable of displaying results from detecting the magnetic field and disturbances of the magnetic field.
    Type: Grant
    Filed: August 1, 2007
    Date of Patent: March 1, 2011
    Assignee: The Boeing Company
    Inventors: Gary E. Georgeson, James H. Lee
  • Patent number: 7888931
    Abstract: The present invention provides an improved magnetic winding and method of calculating desired winding parameters (winding layer thickness, number of winding layers and number of turns per winding layer) for a winding in a magnetic component. The invention may be applied to general boundary conditions in a magnetic winding or component and considers relative phase displacement for sinusoidal and nonsinusoidal winding currents. Ratios of magnetic surface field intensities at corresponding inner and outer boundaries of one or more winding layer(s) are calculated, and considered with relative phase displacement to select magnetic winding configurations having desired or optimal power dissipation. In certain aspects, a normalized loss function f(H,R,B,?) is utilized to determine a preferred construction among a plurality of iteratively generated selections.
    Type: Grant
    Filed: February 5, 2009
    Date of Patent: February 15, 2011
    Assignee: RAF Tabtronics, LLC
    Inventor: Victor W. Quinn
  • Patent number: 7885787
    Abstract: The present invention provides an improved magnetic winding and method of calculating desired winding parameters (winding layer thickness, number of winding layers and number of turns per winding layer) for a winding in a magnetic component. The invention may be applied to general boundary conditions in a magnetic winding or component and considers relative phase displacement for sinusoidal and nonsinusoidal winding currents. Ratios of magnetic surface field intensities at corresponding inner and outer boundaries of one or more winding layer(s) are calculated, and considered with relative phase displacement to select magnetic winding configurations having desired or optimal power dissipation. In certain aspects, a normalized loss function f(H,R,B,?) is utilized to determine a preferred construction among a plurality of iteratively generated selections.
    Type: Grant
    Filed: February 4, 2009
    Date of Patent: February 8, 2011
    Assignee: RAF Tabtronics, LLC
    Inventor: Victor W. Quinn
  • Patent number: 7876095
    Abstract: An apparatus is provided for determination of at least one interface of a slag layer on top of a molten metal. The apparatus has a carrier tube and a measuring head arranged on one end of the carrier tube with a body fixed within the carrier tube and an end face facing away from the carrier tube. The apparatus further includes an oscillator arranged within the measuring head and an induction coil connected with the oscillator and arranged outside of the body and in front of its end face.
    Type: Grant
    Filed: January 24, 2007
    Date of Patent: January 25, 2011
    Assignee: Heraeus Electro-Nite International N.V.
    Inventors: Johan Knevels, Guido Cappa
  • Patent number: 7859257
    Abstract: The invention concerns a system suited for carrying out eddy current measurements on components for nuclear reactors when these components are located in water. The system comprises a control unit, a measurement probe and a first cable suited to constitute at least a part of the connection between the control unit and the measurement probe. The system also comprises a switching unit, suited to be located in water and arranged to be connected with said first cable, and to be connected with the measurement probe. The switching unit has a switching device which can assume at least a first and a second state. In the first state, the first cable is connected with the measurement probe. In the second state, the first cable is not connected with the measurement probe. The invention also concerns the use of the system.
    Type: Grant
    Filed: June 16, 2006
    Date of Patent: December 28, 2010
    Assignee: Westinghouse Electric Sweden AB
    Inventors: Kurt-Åke Magnusson, Laust Pedersen, Lennart Ahlén, Bjorn Näsström, Holger Wiese
  • Patent number: 7854646
    Abstract: The present invention relates to a substrate polishing apparatus and a substrate polishing method for polishing a substrate such as a semiconductor wafer to a flat finish. The substrate polishing apparatus includes a polishing table (100) having a polishing surface (101), a substrate holder (1) for holding and pressing a substrate (W) against the polishing surface (101) of the polishing table (100), and a film thickness measuring device (200) for measuring a thickness of a film on the substrate (W). The substrate holder (1) has a plurality of pressure adjustable chambers (22 to 25), and pressures in the respective chambers (22 to 25) are adjusted based on the film thickness measured by the film thickness measuring device (200).
    Type: Grant
    Filed: January 15, 2010
    Date of Patent: December 21, 2010
    Assignee: Ebara Corporation
    Inventors: Tetsuji Togawa, Koichi Fukaya, Mitsuo Tada, Taro Takahashi, Yasunari Suto