Capacitor Patents (Class 324/548)
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Publication number: 20130002263Abstract: A method of reliability testing of a semiconductor device is described. The embodiment, includes providing a capacitor including an insulating layer interposing two conductive layers. A plurality of voltages are provided to the capacitor including providing a first voltage and a second voltage greater than the first voltage. A leakage associated with the capacitor is measured while applying the second voltage. In an embodiment, the leakage measured while applying the second voltage indicates that a failure of the insulating layer of the capacitor has occurred. In an embodiment, the capacitor is an inter-digitated metal-oxide-metal (MOM) capacitor. The reliability testing may be correlated to TDDB test results. The reliability testing may be performed at a wafer-level.Type: ApplicationFiled: July 1, 2011Publication date: January 3, 2013Applicant: Taiwan Semiconductor Manufacturing Company, Ltd., ("TSMC")Inventors: Huang Jiun-Jie, Chi-Yen Lin, Ling-Sung Wang, Chih-Fu Chang
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Patent number: 8344735Abstract: The solid electrolytic capacitor includes a solid electrolyte type capacitor element including a dielectric layer intervening between an anode section and a cathode section, and an insulating substrate. The insulating substrate includes a first surface on which the capacitor element is mounted and a second surface opposite to the first surface. The first surface is provided thereon with a first anode layer to which the anode section is electrically connected and a first cathode layer to which the cathode section is electrically connected. The second surface is provided thereon with a second anode layer electrically connected to the first anode layer and a second cathode layer electrically connected to the first cathode layer. Here, a pad member with electrical insulation property projects on the first surface of the insulating substrate, and the first anode layer is formed on a tip end surface of the pad member.Type: GrantFiled: July 30, 2010Date of Patent: January 1, 2013Assignee: SANYO Electric Co., Ltd.Inventor: Keiko Matsuoka
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Publication number: 20120299602Abstract: An open circuit detecting system configured to connect to an object circuit for getting an electrical signal through a virtual ground induced by characteristic impedance of a parasitic capacitor and determining whether the object circuit is open according to the electrical signal.Type: ApplicationFiled: November 23, 2011Publication date: November 29, 2012Inventors: Jui-Jung CHIU, Yi-Kun LI
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Publication number: 20120268413Abstract: A test system for testing a capacitive-sense touchscreen is disclosed. Specifically, the test system may be incorporated within a controller that is also used to control operations of the touchscreen. The controller may include an Integrated Circuit and the test system may correspond to a test capacitor embedded into the Integrated Circuit.Type: ApplicationFiled: April 22, 2011Publication date: October 25, 2012Applicant: AVAGO TECHNOLOGIES ECBU IP (SINGAPORE) PTE. LTD.Inventors: Sarangan Narasimhan, Mercedes E. Gil
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Publication number: 20120271572Abstract: Variable frequency motor drives and control techniques are presented in which filter capacitor faults are detected by measuring filter neutral node currents and/or voltages and detecting changes in a frequency component of the measured neutral condition and/or based on input current unbalance.Type: ApplicationFiled: June 26, 2012Publication date: October 25, 2012Applicant: ROCKWELL AUTOMATION TECHNOLOGIES, INC.Inventors: Yuan Xiao, Navid Zargari, Manish Pande, Vijay Khatri
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Patent number: 8294604Abstract: Test system and method for analog-to-digital converter (ADC) based on a loopback architecture are provided to test an M-bit ADC. In the invention, an N-bit digital-to-analog converter (DAC) converts a digital input to a basic test signal, a segmentation circuit scales the basic test signal and superposes it with segmentation DC levels for providing corresponding segmented test signals, such that the ADC converts the segmented test signals to reflect result of testing. With the invention, practical loopback architecture of low-cost can be adopted for testing.Type: GrantFiled: March 24, 2011Date of Patent: October 23, 2012Assignee: Faraday Technology Corp.Inventor: Tsung-Yu Lai
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Patent number: 8264175Abstract: The present invention is directed to methods for forming an inverter circuit for operating a drive motor of an electric vehicle, which can more effectively reduce the switching noise generated by a power module during the operation of an inverter.Type: GrantFiled: April 26, 2010Date of Patent: September 11, 2012Assignees: Hyundai Motor Company, Kia Motors CorporationInventors: Jeong Yun Lee, Dong Min Shin, Woo Yong Jeon, In Pil Yoo, Ki Young Jang, Sang Cheol Shin, Jin Hwan Jung, Jung Hong Joo
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Patent number: 8253424Abstract: A topology for surveying the integrity of a plurality of capacitors connected in series between a pair of bus lines arranged to be connected to a DC-power source comprises a plurality of resistors connected in series between the pair of bus lines, the plurality of resistors being connected in parallel to the plurality of capacitors; and a comparator comparing the electric potential of an intermediate point between two capacitors of the plurality of capacitors with the electric potential of an intermediate point between two resistors of the plurality of resistors. The comparator provides a signal signaling a difference between these two electric potentials, which indicates a loss of integrity of one capacitor of the plurality of capacitors.Type: GrantFiled: September 11, 2009Date of Patent: August 28, 2012Assignee: SMA Solar Technology AGInventors: -Ing. Henrik Wolf, Thomas Wegener, Daniel Clemens, Harald Drangmeister
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Publication number: 20120194202Abstract: The present techniques include methods and systems for detecting a failure in a capacitor bank of an electrical drive system. Embodiments include using discharge resistors to discharge capacitors in the capacitor bank, forming a neutral node of the capacitor bank. In different capacitor configurations, the neutral node is measured, and the voltage is analyzed to determine whether a capacitor bank unbalance has occurred. In some embodiments, the node is a neutral-to-neutral node between the discharged side of the discharge resistors and a neutral side of the capacitor bank, or between the discharged side of the discharge resistors and a discharged side of a second set of discharge resistors. In some embodiments, the node is a neutral-to-ground node between the discharged side of the discharge resistors and a ground potential.Type: ApplicationFiled: January 28, 2011Publication date: August 2, 2012Applicant: ROCKWELL AUTOMATION TECHNOLOGIES, INC.Inventors: Yuan Xiao, Lixiang Wei, Doyle F. Busse
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Patent number: 8215151Abstract: A MEMS stiction testing method applies a first electrical signal to a MEMS device having two opposing surfaces to cause the two opposing surfaces to make physical contact. The two opposing surfaces produce a second electrical signal when in physical contact. The method then substantially mitigates the first electrical signal after detecting that the second electrical signal has reached a prescribed maximum value.Type: GrantFiled: June 24, 2009Date of Patent: July 10, 2012Assignee: Analog Devices, Inc.Inventors: Firas N. Sammoura, William Sawyer, Kuang L. Yang
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Publication number: 20120161781Abstract: A measurement circuit includes a switch unit with a number of keys selectively pressed to output different resistance regulating signals. A resistance setting circuit receives the resistance regulating signals and connects different resistances to a voltage circuit and a current circuit. The voltage circuit outputs different voltages. The current voltage receives a voltage from the voltage circuit and outputs a current to a capacitor. A detecting circuit measures a temperature of the capacitor and outputs the temperature to the resistance setting circuit. The resistance setting circuit compares the received temperature with a preset temperature. If the received temperature is equal to or greater than the preset temperature, the resistance setting circuit outputs short-circuit information of the capacitor. If the received temperature is less than the preset temperature, the resistance setting circuit outputs normal information of the capacitor. A display unit displays the information of the capacitor.Type: ApplicationFiled: December 30, 2010Publication date: June 28, 2012Applicants: HON HAI PRECISION INDUSTRY CO., LTD., HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.Inventors: QI-YAN LUO, SONG-LIN TONG, PENG CHEN, YUN BAI
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Publication number: 20120153964Abstract: A circuit system includes a first circuit for receiving an input signal, a second circuit for interfacing with a user, a signal path connecting the first circuit to the second circuit, the signal path including a first isolator and a second isolator serially connected to the first isolator, and a capacitance detector that detects a change in a combined capacitance of the first and second isolators as an indicator of a breakdown of one of the first and second isolators.Type: ApplicationFiled: December 21, 2010Publication date: June 21, 2012Applicant: ANALOG DEVICES, INC.Inventors: Baoxing CHEN, Adam GLIBBERY
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Publication number: 20120153965Abstract: A DC capacitor degradation alarm circuit is a capacitor degradation detection device including two filter circuits and a degradation detection element. The two filter circuits, which receive a rectified voltage and perform filtering operation, are coupled in parallel and include a plurality of capacitor modules coupled in series. Each capacitor module can be a single capacitor or includes a plurality of capacitors coupled in series or parallel to allow users to arrange construction thereof to receive required capacitance. The degradation detection element electrically bridges the two filter circuits with connection nodes located between the capacitor modules to instantly detect a voltage difference value of the two filter circuits online and perform operation by incorporating with total output voltage to get voltage difference value percentage.Type: ApplicationFiled: December 21, 2010Publication date: June 21, 2012Inventor: Jui-Kun HUANG
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Publication number: 20120153966Abstract: An apparatus for detecting a fault of a flying capacitor of an insulated condition detecting unit measures (step S1), at the start of discharge of the flying capacitor, a discharge voltage of the flying capacitor according to a charge voltage of a read capacitor. After a period from the start of discharge, the apparatus measures (step S3) a discharge voltage of the flying capacitor according to a charge voltage of the read capacitor. According to a difference between the measured discharge voltages, the apparatus obtains (step S5) a discharge amount of the flying capacitor, compares the discharge amount with a reference threshold, and diagnoses (step S7) an open fault of four capacitors that constitute the flying capacitor.Type: ApplicationFiled: December 19, 2011Publication date: June 21, 2012Inventor: Yoshihiro KAWAMURA
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Publication number: 20120133374Abstract: A method for detecting a capacitor loss is applicable to detecting a plurality of by-pass capacitors connected in parallel to each other. The detection method includes the following steps, an alternating current (AC) signal is input into the by-pass capacitors, in which the AC signal has a plurality of test frequencies; test voltages of the by-pass capacitors at each of the test frequencies are recorded, so as to form a test result table; it is determined whether the test result table is the same as a standard voltage table; and when a result of the determination is NO, a fail signal is output. By applying the detection method, whether a loss exists in the by-pass capacitors can be effectively identified, thereby solving the problem that small capacitors are undetectable when large capacitors are connected in parallel to the small capacitors.Type: ApplicationFiled: March 23, 2011Publication date: May 31, 2012Applicant: INVENTEC CORPORATIONInventors: Chih-Jen Chin, Quan-Jie Zheng, Ping Song, Chih-Feng Chen
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Patent number: 8175824Abstract: A circuit testing apparatus for testing capacitance of a capacitor of a device under test is provided. The circuit testing apparatus includes a measuring module, a first converting module, a processing module and a second converting module. The measuring module provides a testing signal, and determines the capacitance of the capacitor according to a signal measuring result of the testing signal. The first converting module is coupled to the measuring module for converting the testing signal to generate a testing input signal. The processing module is coupled to the first converting module and the device under test for transmitting the testing input signal to the capacitor, and amplifies an output signal generated by the capacitor to generate an amplified signal. The second converting module is coupled to the processing module and the measuring module for converting the amplified signal to generate the signal measuring result.Type: GrantFiled: May 18, 2009Date of Patent: May 8, 2012Assignee: Princeton Technology CorporationInventors: Cheng-Yung Teng, Li-Jieu Hsu
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Publication number: 20120063900Abstract: The invention relates to a method for examining an electric energy accumulator (31) for a blade angle adjustment drive (14) of a wind turbine (1), comprising an inverter (21), at least one electric motor (20) which is fed by the inverter (21) and the energy accumulator (31). Said electric motor (20) is blocked, the energy accumulator (31) is charged by the blocked electric motor (20) by means of the inverter (21) and the discharging of the thus charged energy accumulator (31) is observed.Type: ApplicationFiled: May 3, 2010Publication date: March 15, 2012Applicant: SSB WIND SYSTEMS GMBH & CO. KGInventor: Hermann Kestermann
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Publication number: 20120049857Abstract: Embodiments of an apparatus for measuring the leakage current of capacitive components is taught. One embodiment includes a first stage amplifier configured to receive an input from a serially-connected capacitive component at an inverting input and a feedback resistor in a feedback path of the first stage amplifier. A resistance value of the feedback resistor is programmable based on an expected value of the leakage current and a corresponding voltage output.Type: ApplicationFiled: November 8, 2011Publication date: March 1, 2012Applicant: ELECTRO SCIENTIFIC INDUSTRIES, INC.Inventors: Brian Johansen, Brandon J. McCurry
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Patent number: 8116990Abstract: A method and system for performing continuous (real-time) physics based prognostics analysis as a function of actual engine usage and changing operating environment. A rule-based mission profile analysis is conducted to determine the mission variability which yields variability in the type of thermal-mechanical loads that an engine is subjected to during use. This is followed by combustor modeling to predict combustion liner temperatures and combustion nozzle plane temperature distributions as a function of engine usage which is followed by off-design engine modeling to determine the pitch-line temperatures in hot gas path components and thermodynamic modeling to compute the component temperature profiles of the components for different stages of the turbine.Type: GrantFiled: October 19, 2007Date of Patent: February 14, 2012Inventor: Ashok Koul
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Publication number: 20120013347Abstract: The present invention relates to a capacitor bank monitoring system for monitoring the status of a capacitor bank in a power distribution system. The capacitor bank monitoring system includes a current transformer, a metering connection, and a housing for an electric utility meter. The current transformer is in electrical communication with a neutral terminal of the distribution system and can measure the current carried by the neutral terminal. The meter connection subsystem can provide electrical communication between the electric utility meter and the current transformer, such that the electric utility meter communicates the status of the capacitor bank.Type: ApplicationFiled: July 19, 2011Publication date: January 19, 2012Applicant: The Southern CompanyInventor: VAN L. HOLSOMBACK
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Patent number: 8093905Abstract: A smoothing unit includes a first and a second smoothing capacitors, a first and a second discharge resistors connected in parallel to both ends of the first and the second smoothing capacitors, respectively. During a normal operation, both the first and the second smoothing capacitors are connected electrically to a live line. On the other hand, during a degradation diagnosis, the first and the second smoothing capacitors are alternately connected electrically to the live line at a predetermined timing, and a smoothing capacitor not electrically connected to the live line is subjected to the degradation diagnosis.Type: GrantFiled: July 31, 2007Date of Patent: January 10, 2012Assignee: Mitsubishi Electric CorporationInventor: Takahiko Yamanaka
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Patent number: 8090551Abstract: An electrical test system for providing a power source to each of a plurality of electrical components under electrical test includes a grouped circuitry module. The grouped circuitry module includes a plurality of individually-programmable power sources, each coupled to an output channel, a controller configured to program each of the power sources to a respective stimulus output value and to read a measured value at each corresponding output channel and random access, non-volatile, memory for storing information and for providing read/write capability for the controller. A host computer is in communication with the controller for running a self test program that sequentially programs each of the power sources to its respective stimulus output value and reads the measured value at each corresponding output channel using the controller to determine if the tested complete subsystem is operating properly.Type: GrantFiled: March 22, 2010Date of Patent: January 3, 2012Assignee: Electro Scientific Industries, Inc.Inventor: Kenneth V. Almonte
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Patent number: 8090548Abstract: A method and device for predicting defects of a capacitor, the method including determining the ripple voltage (Udc), the temperature (TP), and the current (Ic) of the capacitor, determining the value of an equivalent series resistance (ESR) of the capacitor, and the capacitance value (C) of the capacitor using a digital filter, determining information representative of the state of aging of the capacitor according to the temperature of the capacitor, and displaying that information and information representative of the value of the capacitance (C) and/or information representative of a cause associated with the state of aging according to the capacitance value. The device may include a converter and an uninterruptible power supply.Type: GrantFiled: October 8, 2008Date of Patent: January 3, 2012Assignee: MGE UPS SystemsInventors: Karim Abdennadher, Christophe Rosset, Gérard Rojat, Pascal Venet
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Patent number: 8089284Abstract: An impedance measuring method uses an impedance measuring device for measuring an impedance of a measured electronic component, a coaxial connector electrically connected to the impedance measuring device, and a measurement substrate which can be housed in the coaxial connector. The coaxial connector has a center conductor and an outer conductor located outside the center conductor. The measurement substrate has an insulating substrate and first and second conductors each formed on a first principal surface of the insulating substrate. The measurement substrate with the measured electronic component being mounted on the first and second conductors is housed in the coaxial connector connected to the impedance measuring device, so as to electrically connect the first conductor to the center conductor and electrically connect the second conductor to the outer conductor. Then the impedance of the measured electronic component is measured by the impedance measuring device.Type: GrantFiled: June 5, 2009Date of Patent: January 3, 2012Assignee: TDK CorporationInventor: Masaaki Togashi
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Publication number: 20110292696Abstract: Variable frequency motor drives and control techniques are presented in which filter capacitor faults are detected by measuring filter neutral node current and/or voltages and detecting changes in the fundamental frequency component of the measured neutral condition at the fundamental frequency of the input power and/or based on input current unbalance.Type: ApplicationFiled: May 28, 2010Publication date: December 1, 2011Applicant: ROCKWELL AUTOMATION TECHNOLOGIES, INC.Inventors: Yuan Xiao, Navid Zargari, Manish Pande, Vijay Khatri
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Publication number: 20110291665Abstract: A timer circuit is provided with a comparator CMP1, a control unit and a comparator CMP2. The comparator CMP1 compares a potential of the capacitance element with the potential of a reference voltage VREF_H, and if the potential of the capacitance element reaches the potential of the reference voltage VREF_H, outputs a pre-specified time-up signal. The control unit performs control such that the potential of the capacitance element is higher than a potential of a reference voltage VREF_S, which is higher than the ground potential and lower than the potential of the reference voltage VREF_H. The comparator CMP2 compares the potential of the capacitance element with the potential of the reference voltage VREF_S, and if the potential of the capacitance element is lower than the potential of the reference voltage VREF_S, outputs a short circuit detection signal indicating that a short circuit state of the capacitance element has been detected.Type: ApplicationFiled: May 2, 2011Publication date: December 1, 2011Applicant: OKI SEMICONDUCTOR CO., LTD.Inventor: Koji SUZUKI
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Patent number: 8054085Abstract: Embodiments of an apparatus for measuring the leakage current of capacitive components is taught. One embodiment includes a first stage amplifier configured to receive an input from a serially-connected capacitive component at an inverting input and a feedback resistor in a feedback path of the first stage amplifier. A resistance value of the feedback resistor is programmable based on an expected value of the leakage current and a corresponding voltage output.Type: GrantFiled: March 31, 2008Date of Patent: November 8, 2011Assignee: Electro Scientific Industries, Inc.Inventors: Brian Johansen, Brandon John McCurry
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Publication number: 20110241695Abstract: A method of monitoring a capacitor bank comprising a plurality of capacitor strings connected in parallel, each capacitor string comprising a plurality of capacitors connected in series is provided. The method includes energizing the capacitor bank. The method includes determining dissipation factors of each of the plurality of the capacitor strings. The method further includes comparing each of the determined dissipation factors with an expected dissipation factor and estimating a health state of the plurality of the capacitor strings based, at least in part, on the comparison of the determined and expected dissipation factors.Type: ApplicationFiled: March 31, 2010Publication date: October 6, 2011Applicant: GENERAL ELECTRIC COMPANYInventors: Karim Younsi, Yingneng Zhou, Samar Shaker Soliman
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Patent number: 8022716Abstract: A time-to-breakdown for a dielectric layer in a semiconductor device is determined based upon a sudden change in capacitance. An alternating voltage, greater in magnitude than an operating voltage of the device, is applied to the semiconductor device, capacitance is measured across the dielectric layer during the application of the voltage until a sudden change in capacitance occurs, thereby indicating a breakdown in the dielectric layer, and the breakdown time is scaled to the operating voltage.Type: GrantFiled: July 21, 2009Date of Patent: September 20, 2011Assignee: GLOBALFOUNDRIES IncInventors: Kok Yong Yiang, Rick Francis, Amit P. Marathe, Van-Hung Pham
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Patent number: 8004288Abstract: The present subject matter provides apparatus and methods for testing high dielectric capacitors. A testing process whereby voltage and temperature is varied to provide temperature dependent plots to determine the reliability of a capacitor is provided. A testing system is demonstrated to measure capacitor reliability and/or relative capacitor reliability.Type: GrantFiled: May 13, 2008Date of Patent: August 23, 2011Assignee: Cardiac Pacemakers, Inc.Inventors: Gregory J. Sherwood, Francis Wang, Keith R. Maile, Ignacio Chi
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Publication number: 20110199094Abstract: A method, system (100), and computer program product for age compensation for a gas sensor (101) are provided. The method includes determining an impedance spectrum for the gas sensor (101) by an impedance analyzer (103); determining a set of principle parameters based on the impedance spectrum by a principle parameter identifier (104); constructing an age compensation model for the gas sensor (101) using the set of principle parameters by an age compensation modeler (105); and applying the age compensation model to an output of the gas sensor (101). Gas sensor (101) failure detection is also provided.Type: ApplicationFiled: February 16, 2010Publication date: August 18, 2011Applicant: HAMILTON SUNDSTRAND CORPORATIONInventor: Yiming Lou
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Publication number: 20110198725Abstract: The present invention relates to an electric component comprising at least one first MIM capacitor having a ferroelectric insulator with a dielectric constant of at least 100 between a first capacitor electrode of a first electrode material and a second capacitor electrode of a second electrode material. The first and second electrode materials are selected such that the first MIM capacitor exhibits, as a function of a DC voltage applicable between the first and second electrodes, an asymmetric capacity hysteresis that lets the first MIM capacitor, in absence of the DC voltage, assume one of at least two possible distinct capacitance values, in dependence on a polarity of a switching voltage last applied to the capacitor, the switching voltage having an amount larger than a threshold-voltage amount. The invention is applicable for ESD sensors, memories and high-frequency devices.Type: ApplicationFiled: October 24, 2009Publication date: August 18, 2011Applicant: NXP B.V.Inventors: Aarnoud Laurens Roest, Mareike Klee, Rudiger Mauczox, Klaus Reimann, Michael Joehren
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Patent number: 7977952Abstract: A method for monitoring a component formed of a polymer material, and the polymer component. The component includes an electrically-conductive polymer sensing element integrally incorporated into the component. An electric potential is applied to the polymer sensing element, and an electric signal generated by the polymer sensing element is sensed in response to the polymer sensing element physically responding to a transitory or permanent distortion of the component. A signal can then be generated if the electric signal exceeds a predetermined threshold value for the component.Type: GrantFiled: December 22, 2008Date of Patent: July 12, 2011Inventors: Gary Krutz, Keith Harmeyer, Michael Holland, Timu W. Gallien
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Patent number: 7969160Abstract: The electrolytic capacitor has an insulating casing, at least one capacitor element and multiple external terminals. The casing has multiple through holes and mounting protrusions. The at least one capacitor element is mounted in the casing and has multiple inner conductive pins connecting to a coil. Each external terminal is attached to a bottom panel of the insulating casing, connects to a corresponding inner conductive pin and has a main body, a connecting portion and two fixing portions. The connecting portion is formed on and extends from a side of the main body and has a conducting hole attached to a corresponding conductive pin. The fixing portions respectively extend from two ends of the main body and engage with the mounting protrusions. Each external terminal provides a soldering surface being flat and having large soldering area, therefore the electrolytic capacitor can be firmly soldered on a circuit board.Type: GrantFiled: May 20, 2009Date of Patent: June 28, 2011Assignee: Gemmy Electronics Co., Ltd.Inventor: Chieh-Fu Lin
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Patent number: 7940058Abstract: An apparatus and method for measuring the leakage current of capacitive components. A switch that grounds a terminal of a component being tested is closed while the component is charged to a desired test voltage. When this charging is complete, the switch opens so that the diode terminal is at the same potential as the input amplifier's virtual ground. An accurate and fast measurement of the leakage current of the component can be measured.Type: GrantFiled: May 24, 2007Date of Patent: May 10, 2011Assignee: Electro Scientific Industries, Inc.Inventors: David W. Newton, Kenneth V. Almonte
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Publication number: 20110094945Abstract: A system for acquiring multiple images of objects, the system includes: four longitudinal transferor that comprise multiple tunnels through which the objects propagate to four imaging areas; wherein the four longitudinal transferor utilize gas pressure differentials to convey the electrical circuits through the tunnels; wherein at least one longitudinal transferor has a movable portion that when placed in a certain position exposes at least a substantial portion of at least one tunnel; three rotation modules configured to rotate objects about a longitudinal axis of the objects; wherein each rotating is located between two longitudinal transferor; and imager, configured to obtain, in each of the four imaging areas, an image of the objects.Type: ApplicationFiled: February 5, 2009Publication date: April 28, 2011Applicant: CAMTEK LTD.Inventors: Shy Cohen, Ilan Greenberg
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Patent number: 7932728Abstract: A method of fabricating a MEMS device includes conditioning of an insulating layer by applying a voltage across the insulating layer via a conductive sacrificial layer for a period of time, prior to removal of the conductive sacrificial layer. This conditioning process may be used to saturate or stabilize charge accumulated within the insulating layer. The resistance across the insulating layer may also be measured to detect possible defects in the insulating layer.Type: GrantFiled: June 16, 2009Date of Patent: April 26, 2011Assignee: QUALCOMM MEMS Technologies, Inc.Inventors: Chen-Jean Chou, Chun-chen Wu, Patrick F. Brinkley
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Publication number: 20110062962Abstract: A topology for surveying the integrity of a plurality of capacitors connected in series between a pair of bus lines arranged to be connected to a DC-power source comprises a plurality of resistors connected in series between the pair of bus lines, the plurality of resistors being connected in parallel to the plurality of capacitors; and a comparator comparing the electric potential of an intermediate point between two capacitors of the plurality of capacitors with the electric potential of an intermediate point between two resistors of the plurality of resistors. The comparator provides a signal signaling a difference between these two electric potentials, which indicates a loss of integrity of one capacitor of the plurality of capacitors.Type: ApplicationFiled: September 11, 2009Publication date: March 17, 2011Applicant: SMA SOLAR TECHNOLOGY AGInventors: -Ing. Henrik Wolf, Thomas Wegener, Daniel Clemens, Harald Drangmeister
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Patent number: 7903386Abstract: In a method for drive controlling a micro machine device including two electrodes opposing each other and a dielectric layer sandwiched therebetween, a control voltage in a rectangular waveform in which positive and negative polarities are alternately inverted is applied between the two electrodes. A current passing through the micro machine device due to the application of the control voltage are detected with respect to positive and negative sides, and parameters related to a capacitance of the micro machine device are acquired with respect to the positive and negative sides on the basis of the detected current. The control voltage is controlled so that the parameters acquired with respect to the positive and negative sides accord with each other. Thus, variation of the capacitance between the positive side and the negative side can be suppressed in switching drive of a variable capacitance device.Type: GrantFiled: February 28, 2008Date of Patent: March 8, 2011Assignee: Fujitsu LimitedInventors: Yu Yonezawa, Takeaki Shimanouchi, Naoyuki Mishima, Satoshi Ueda, Xiaoyu Mi, Masahiko Imai
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Patent number: 7898268Abstract: A circuit and method for capacitor effective series resistance measurement. One embodiment provides a method for measuring the effective series resistance of a capacitor having a capacitor voltage. The method includes amplifying the capacitor voltage with an AC coupled amplifier yielding a first amplified signal. The capacitor is discharged with a constant current for a measurement time thus causing a voltage swing of the capacitor voltage due to a voltage drop across the effective series resistance. The capacitor voltage is amplified with the AC coupled amplifier yielding a second amplified signal being dependent on the voltage swing. The effective series resistance is calculated from the first and the second amplified signals.Type: GrantFiled: February 15, 2008Date of Patent: March 1, 2011Assignee: Infineon Technologies AGInventors: Derek Bernardon, Dieter Haerle
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Patent number: 7888949Abstract: An electronic testing machine includes a plurality of test modules. Each test module has a plurality of contact pairs for testing electronic components. An apparatus and process for electrical test setup and calibration of the electronic testing machine includes a plate having at least one contact per track movable between test positions to electrically insert a test device selectively between any one contact pair, and a control program. The test device can be selected from a group consisting of a volt meter, a current meter, a precision voltage/current source, a calibration resistor, and a calibration capacitor. The control program can perform at least one test function through the plate. The test function can be selected from a group consisting of alignment verification, voltage/current source verification, insulation resistance (IR) leakage measurement verification, part-present contact check verification, capacitance and dissipation (CD) measurement verification, IR/CD compensation, and IR/CD calibration.Type: GrantFiled: March 21, 2008Date of Patent: February 15, 2011Assignee: Electro Scientific Industries, Inc.Inventors: Spencer B. Barrett, Brandon J. McCurry, Kenneth V. Almonte
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Patent number: 7884625Abstract: Apparatus, method and program product may detect an attempt to tamper with a microchip by detecting an unacceptable alteration in a measured capacitance associated with capacitance structures proximate the backside of a microchip. The capacitance structures typically include metallic shapes and may connect using through-silicon vias to active sensing circuitry within the microchip. In response to the sensed change, a shutdown, spoofing, self-destruct or other defensive action may be initiated to protect security sensitive circuitry of the microchip.Type: GrantFiled: July 29, 2008Date of Patent: February 8, 2011Assignee: International Business Machines CorporationInventors: Gerald K Bartley, Darryl J Becker, Paul E Dahlen, Philip R Germann, Andrew B Maki, Mark O Maxson
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Publication number: 20110018551Abstract: The degradation of an electrical storage device 30 such as a capacitor can be determined by a system which is not an external device but is installed in hybrid construction equipment 1 in a state that the electrical storage device 30 such as a capacitor is mounted. To achieve this objective, it is at least checked that the working machine has stopped. Next, when it has been checked that the working machine has stopped, a degradation state determination time control mode is entered, a motor-generator is driven at the prescribed rotational speed and the prescribed torque, and the electrical storage device rises from the prescribed start charging voltage to the prescribed end charging voltage (Step 102).Type: ApplicationFiled: March 16, 2009Publication date: January 27, 2011Applicant: KOMATSU LTD.Inventors: Jun Yamane, Takayoshi Endou, Tomohisa Sato
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Publication number: 20100295554Abstract: Method and system for monitoring the condition of the capacitor arrangement (14-16) of the DC-voltage intermediate circuit of a power electronics appliance, such as of a frequency converter, at the place of usage, in which method the discharge voltage over the capacitor arrangement as a function of time is measured, and in which method the intermediate circuit is pre-charged with a pre-determined DC voltage, the pre-charging is removed from the intermediate circuit, the voltage of the intermediate circuit is measured by sampling at regular intervals, the voltage drop as a function of time is determined on the basis of the measured voltage of the intermediate circuit, the capacitance or the relative change in it is determined on the basis of the voltage drop, the value of the determined capacitance or of the relative change in it is compared to a pre-determined limit value on the basis of the voltage drop, and the necessary condition monitoring procedure is performed when the value determined with the measuremType: ApplicationFiled: January 15, 2009Publication date: November 25, 2010Inventor: Timo Alho
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Patent number: 7839151Abstract: A capacitor inspection device includes a substrate made of an insulating material, a first conductor unit and a second conductor unit arranged on the substrate, a signal input unit and a signal output unit attached to the substrate, a network analyzer and a pressurizing unit. The network analyzer has an input port connected to the signal input unit and an output port connected to the signal output unit. The first and second conductor units make contact with an anode and a cathode of a capacitor, respectively. The pressurizing unit presses the anode of capacitor onto the first conductor unit and the cathode onto the second conductor unit.Type: GrantFiled: April 18, 2006Date of Patent: November 23, 2010Assignee: Panasonic CorporationInventors: Junichi Kurita, Hiroshi Higashitani, Kazuo Kawahito, Tsuyoshi Yoshino
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Patent number: 7830269Abstract: A method for detecting a performance degradation of a capacitor in a power converter is disclosed. The method includes monitoring a voltage across the capacitor, detecting the performance degradation of the capacitor based on the monitored voltage, and generating a warning signal after detecting the performance degradation of the capacitor. A power converter is including at least one capacitor and a processor operably coupled to the at least one capacitor for monitoring a voltage across the at least one capacitor is also disclosed. The processor is configured for detecting a performance degradation of the capacitor based, at least in part, on the monitored voltage, and for generating a warning signal after detecting the performance degradation of the at least one capacitor.Type: GrantFiled: September 14, 2007Date of Patent: November 9, 2010Assignee: Astec International LimitedInventors: Wing Ling Cheng, Zhe Wang, Huai Gang Jiang, Lin Guo Wang
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Patent number: 7817051Abstract: A power converter including a processor, at least one component whose health in the power converter will degrade over time, and at least one alarm is disclosed. The processor is configured for monitoring the health of the component over time, and for activating the alarm when the monitored health of the component reaches a threshold level.Type: GrantFiled: September 14, 2007Date of Patent: October 19, 2010Assignee: Astec International LimitedInventors: Wing Ling Cheng, Zhe Wang, Huai Gang Jiang, Lin Guo Wang
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Patent number: 7804415Abstract: A power converter including a processor and at least one component whose health in the power converter will degrade over time is disclosed. The processor is configured for monitoring the health of the component over time, and for generating a warning signal when the monitored health of the component reaches a threshold level. A method for monitoring the health of at least one component in a power converter is also disclosed. The method includes monitoring at least one performance characteristic of the power converter. The performance characteristic represents the health of the component. The method further includes comparing the monitored performance characteristic with stored data to determine whether the health of the component has reached a predetermined level, and generating a warning signal after determining the health of the component has reached the predetermined level.Type: GrantFiled: September 14, 2007Date of Patent: September 28, 2010Assignee: Astec International LimitedInventors: Wing Ling Cheng, Zhe Wang, Huai Gang Jiang, Lin Guo Wang
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Publication number: 20100219839Abstract: A method of testing a capacitive transducer circuit, for example a MEMS capacitive transducer, by applying a test signal via one or more capacitors provided in the transducer circuit.Type: ApplicationFiled: December 30, 2009Publication date: September 2, 2010Inventors: Colin Findlay Steele, John Laurence Pennock
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Publication number: 20100188099Abstract: A method for screening electrolytic capacitors places a capacitor in series with a resistor, applying a test voltage and following the charge curve for the capacitor. A high voltage drop across the capacitor indicates high reliability and a low voltage drop is used to reject the piece. The leakage current is not adversely affected during the test.Type: ApplicationFiled: March 31, 2010Publication date: July 29, 2010Inventors: Jonathan Paulsen, Erik Reed, Yuri Freeman