Capacitor Patents (Class 324/548)
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Publication number: 20100169029Abstract: A method of evaluating one or more capacitor banks in an electrical power system includes: (a) acquiring data representing a signal of interest of the power system, where the data describes a plurality of power system events; and (b) based on one or more patterns contained in the data, identifying at least one of the power system events as being associated with capacitor operation.Type: ApplicationFiled: December 31, 2008Publication date: July 1, 2010Inventors: Carl L. Benner, Karthick Muthu-Manivannan, Alexandre Perera-Lluna, Peng Xu, Billy Don Russell
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Patent number: 7714590Abstract: A method is provided for testing a built-in component including multiple terminals in a multi-layered circuit board. At least one signal pad is provided on a top surface of the multi-layered circuit board for signal transmission. Each of the signal pads are electrically connected to one of the multiple terminals. At least one test pad is provided on the top surface of the multi-layered circuit board and each of the test pads is electrically connected to one of the multiple terminals. Then, detection occurs regarding one of the signal pads and one of the test pads that are electrically connected to a same one of the multiple terminals in order to determine a connection status of an electric path extending from the one signal pad through the same one terminal to the one test pad.Type: GrantFiled: February 20, 2007Date of Patent: May 11, 2010Assignee: Industrial Technology Research InstituteInventors: Uei-Ming Jow, Min-Lin Lee, Shinn-Juh Lay, Chin-Sun Shyu, Chang-Sheng Chen
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Publication number: 20100079150Abstract: Embodiments of the invention generally provide methods, systems, and apparatus for testing decoupling capacitors of an integrated circuit. A decoupling capacitor may be disconnected from the power grid of the integrated circuit during testing. The voltage of the decoupling capacitor may be compared to the voltage of a reference capacitor to determine whether the decoupling capacitor is defective. If the decoupling capacitor is determined to be defective, the decoupling capacitor is not reconnected to the power grid, thereby reducing the leakage currents in the integrated circuit.Type: ApplicationFiled: September 26, 2008Publication date: April 1, 2010Inventors: Jochen Hoffmann, Steffen Loeffler
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Patent number: 7683630Abstract: A rotary capacitor electrical test system for providing a power source to a capacitor under electrical test can include at least one programmable voltage source, at least one programmable current source, and a controller for programming the voltage and current sources. Random access, non-volatile, memory can be provided for storing information and for providing read/write capability for the controller. At least one digital/analog converter can communicate between the controller and the programmable voltage and current sources. A diagnostic program is operable through the controller for testing internal integrity of basic input/output functions of at least some subsystems. A circuit health monitoring program can operate through the controller for periodically testing and determining internal integrity of at least some subsystems. A self test program can operate through the controller for determining if at least some internal subsystems are working properly on a test/fail basis.Type: GrantFiled: November 30, 2006Date of Patent: March 23, 2010Assignee: Electro Scientific Industries, Inc.Inventor: Kenneth V. Almonte
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Publication number: 20100070212Abstract: A method of inverter capacitance diagnosis for detecting an imminent failure of one or more inverter capacitors in an electric power supply system for a machine detects that the generator has ceased generating electrical power takes a plurality of current samples on the DC link between predetermined voltage points. The plurality of current samples are integrated as a function of time to create a discharge integral, which is compared to a previously obtained discharge integral if available. The process sets a diagnostic flag to indicate an imminent failure of the one or more inverter capacitors if the discharge integral varies from the previously obtained discharge integral by more than a predetermined value.Type: ApplicationFiled: September 15, 2008Publication date: March 18, 2010Applicant: Caterpillar Inc.Inventor: Johsua Williams
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Patent number: 7671603Abstract: A method for screening electrolytic capacitors places a capacitor in series with a resistor in series with a resistor, applying a test voltage and following the charge curve for the capacitor. A high voltage drop indicates high reliability and a low voltage drop is used to reject the piece. The leakage current is not adversely affected during the test.Type: GrantFiled: December 18, 2006Date of Patent: March 2, 2010Assignee: Kemet Electronics CorporationInventor: Yuri Freeman
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Patent number: 7663382Abstract: Systems and methods according to aspects of the present invention are described. The systems and methods enable charging, soaking, and measuring of capacitors to be conducted quickly. Charging and soaking typically occurs in parallel and certain embodiments facilitate the measuring of capacitor leakage by sequentially disconnecting each capacitor and measuring the time for voltage on the capacitor to reach a predetermined threshold. Further, all capacitors can be disconnected from a charging source simultaneously and voltages can be measured for each capacitor simultaneously. Monitoring can be periodic in nature. Substantial time savings in the calculation device of leakage values and parameters can be attained.Type: GrantFiled: January 29, 2007Date of Patent: February 16, 2010Assignee: Rudolph Technologies, Inc.Inventors: Charles Corulli, Gregory Olmstead, Donald B. Snow
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Publication number: 20100026313Abstract: Apparatus, method and program product may detect an attempt to tamper with a microchip by detecting an unacceptable alteration in a measured capacitance associated with capacitance structures proximate the backside of a microchip. The capacitance structures typically comprise metallic shapes and may connect using through-silicon vias to active sensing circuitry within the microchip. In response to the sensed change, a shutdown, spoofing, self-destruct or other defensive action may be initiated to protect security sensitive circuitry of the microchip.Type: ApplicationFiled: July 29, 2008Publication date: February 4, 2010Applicant: International Business Machines CorporationInventors: Gerald K. Bartley, Darryl J. Becker, Paul E. Dahlen, Philip R. Germann, Andrew B. Maki, Mark O. Maxson
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Patent number: 7649361Abstract: Making process test capacitors simultaneously with circuit capacitors that are to be embedded into a printed wiring board and firing the test capacitors to result in fired-on-foil test capacitors for the purpose of using the test capacitors as test substitutes for the embedded circuit capacitors to predict whether capacitance, dissipation factor or insulation resistance of the circuit capacitors will fall within acceptable specified ranges prior to and after embedment.Type: GrantFiled: December 18, 2006Date of Patent: January 19, 2010Assignee: E.I. du Pont de Nemours and CompanyInventors: William Borland, Saul Ferguson, Diptarka Majumdar, Daniel I. Amey
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Publication number: 20100004885Abstract: Provided is an abnormality detecting device for detecting an abnormality of electric storage devices such as a battery pack. Comparators (140-1) to (140-n) detect a time when a voltage reaches a prescribed voltage, for each block of a battery pack (100). A judging section (160) detects a current at a time when the voltage reaches the prescribed voltage, and a representative current value is calculated for each block. The deviation of the representative current value of each block is compared with the threshold value, and when the deviation is large, it is judged that there are abnormalities such as short-circuiting, minute short-circuiting, IR (internal resistance) increase, capacitance reduction, and the like.Type: ApplicationFiled: February 6, 2008Publication date: January 7, 2010Applicant: PANASONIC EV ENERGY CO., LTD.Inventor: Toshiaki Nakanishi
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Patent number: 7609070Abstract: A manufacturing method of an electronic device includes applying a direct voltage having a first polarity to a capacitor that has an insulating layer including nitrogen and silicon as a capacitor dielectric layer, testing the capacitor to which the direct voltage having the first polarity is applied and determining a nondefective capacitor and a defective capacitor, and applying a direct voltage having a second polarity to the nondefective capacitor. The second polarity is opposite to the first polarity.Type: GrantFiled: September 21, 2007Date of Patent: October 27, 2009Assignee: Eudyna Devices Inc.Inventors: Tomohiro Kagiyama, Yasuhiro Tosaka, Norikazu Iwagami
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Patent number: 7609072Abstract: A method of conditioning tantalum capacitors on printed wire assemblies is disclosed. According to the method, each of the capacitors on an assembly is subjected to the same conditioning level during testing. To condition the tantalum capacitors, surge currents are induced in the capacitors in a controlled manner as a way of aging the capacitors so that they can be used without de-rating rating with low failure rates. The level of voltage, timing and current levels are set by circuitry used to perform the testing. The same circuits that are used with the capacitors in a system application are also used for the tantalum capacitor test circuit during the conditioning process.Type: GrantFiled: April 5, 2007Date of Patent: October 27, 2009Assignee: General Electric CompanyInventors: Allen Michael Ritter, Todd David Greenleaf
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Patent number: 7602192Abstract: A power distribution system for a rotary capacitor electrical tester includes a power source, an active station having plurality of test channels powered by the power source through cables connected to one side an upper contact module of the active station, and an opposition side a lower contact module of the active station being connectable to a test measurement device. A separate additional cable conductor inlet is located on the active station for receiving power from the power source. The power supplied through the extra additional cable is passed through the upper contact module of the active station without connecting to test channel and presents a power conductor outlet interface to a passive station immediately adjacent to the active station in order to reduce the number of cables required to connect between the power source and the various passive stations incorporated into the rotary capacitor electrical tester.Type: GrantFiled: November 30, 2006Date of Patent: October 13, 2009Assignee: Electro Scientific Industries, Inc.Inventor: Kenneth V. Almonte
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Publication number: 20090251011Abstract: A Medium Voltage Circuit Breaker that has at least a pair of contact mutually coupleable and uncoupleable to carry out an opening/closing operation, a magnetic actuator operatively connected to at least one of the contacts, and a capacitor bank that has one or more capacitors that deliver power to the magnetic actuator for carrying out the opening/closing operation and a control device. The Medium Voltage Circuit Breaker further has a supervisor device of the capacitor bank which measures the Equivalent Series Resistance and/or the Capacitance of the capacitor bank system.Type: ApplicationFiled: April 2, 2009Publication date: October 8, 2009Applicant: ABB Technology AGInventors: Gabriele Suardi, Massimo Bresciani
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Publication number: 20090237088Abstract: A method for inspecting insulation property of a capacitor, comprises the steps of: applying a DC voltage V1 higher than a voltage V0 to a capacitor to be inspected, in which the voltage V0 is predetermined for inspection of insulation property of the capacitor, to generate an electric current in the capacitor; lowering the DC voltage V1 to the voltage V0 at a lapse of a time t1, to convert the electric current in the capacitor into a continuously unvaried electric current; determining a value i0 of the continuously unvaried electric current; and comparing the value i0 with an upper limit of a leakage current which is predetermined for the capacitor.Type: ApplicationFiled: March 18, 2009Publication date: September 24, 2009Applicant: HUMO LABORATORY, LTD.Inventors: Satoshi Nonaka, Yoshinori Kubo
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Patent number: 7589538Abstract: A circuit for measuring an unknown capacitance includes a reference capacitor having a known capacitance, an oscillator timing circuit, a variable frequency oscillator and a microcontroller. The oscillator timing circuit includes switches which selectively couple the unknown capacitance and the reference capacitor to the oscillator timing circuit. The variable frequency oscillator generates time varying signals which vary in frequency proportionally to the unknown capacitance and reference capacitor selectively coupled to the oscillator timing circuit. The microcontroller receives the time varying signals from the oscillator, and compares the periods of the time varying signals to determine the value of the unknown capacitance.Type: GrantFiled: December 21, 2006Date of Patent: September 15, 2009Assignee: Weiss Instruments, Inc.Inventors: Lenny M. Novikov, Lenworth Anderson
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Publication number: 20090224770Abstract: A method for screening electrolytic capacitors places a capacitor in series with a resistor in series with a resistor, applying a test voltage and following the charge curve for the capacitor. A high voltage drop indicates high reliability and a low voltage drop is used to reject the piece. The leakage current is not adversely affected during the test.Type: ApplicationFiled: September 10, 2008Publication date: September 10, 2009Inventor: Yuri Freeman
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Patent number: 7576357Abstract: A method of detecting damage to at least one dielectric layer in an IC die by determining a capacitance factor. The capacitance factor can be used to determine damage in a low-k dielectric material. A system for detecting damage can include a conductive line structure for measuring capacitance and software or a device for determining the capacitance to determine the damage.Type: GrantFiled: October 26, 2005Date of Patent: August 18, 2009Assignee: Advanced Micro Devices, Inc.Inventors: Jianhong Zhu, David Wu
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Publication number: 20090189616Abstract: A method for monitoring a component formed of a polymer material, and the polymer component. The component includes an electrically-conductive polymer sensing element integrally incorporated into the component. An electric potential is applied to the polymer sensing element, and an electric signal generated by the polymer sensing element is sensed in response to the polymer sensing element physically responding to a transitory or permanent distortion of the component. A signal can then be generated if the electric signal exceeds a predetermined threshold value for the component.Type: ApplicationFiled: December 22, 2008Publication date: July 30, 2009Applicant: Purdue Research FoundationInventors: Gary Krutz, Keith Harmeyer, Michael Holland, Timu W. Gallien
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Publication number: 20090167617Abstract: There is provided with an antenna device includes a conductive ground plane; an antenna including a radiating element; at least one variable capacitor having one end connected to the conductive ground plane; a plurality of switch elements having one ends connected to the other end of said at least one variable capacitor and other ends connected to the antenna at different locations; a switch controlling unit configured to control an ON/OFF state of each of the switch elements; and a capacitor controlling unit configured to control a capacitance of said at least one variable capacitor.Type: ApplicationFiled: October 20, 2008Publication date: July 2, 2009Applicant: KABUSHIKI KAISHA TOSHIBAInventor: Masaki Nishio
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Patent number: 7541816Abstract: In a capacitive sensor, a sensing electrode is positively charged, the sensing electrode and a sensing capacitor are charge-balanced, the sensing electrode is negatively charged, and then the sensing electrode and the sensing capacitor are again charge-balanced. The sensing electrode is positively and negatively charged in the same period when the capacitive sensor is sensed. So, the invention can not only effectively improve the high-frequency external interference but also effectively resist the interference when an external direct current electrical field approaches.Type: GrantFiled: August 27, 2008Date of Patent: June 2, 2009Assignee: Generalplus Technology Inc.Inventors: Tung-Tsai Liao, Li Sheng Lo
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Patent number: 7540885Abstract: A method of processing a ceramic capacitor includes a first step of applying a DC voltage to a ceramic capacitor by a first DC voltage source, and a second step of applying a DC voltage by a second DC voltage source to generate in the ceramic capacitor a polarization in a direction opposite to a direction of a polarization generated by the application of the DC voltage in the first step, thereby reducing electric charge remaining in the ceramic capacitor.Type: GrantFiled: August 15, 2002Date of Patent: June 2, 2009Assignee: Murata Manufacturing Co., Ltd.Inventor: Gaku Kamitani
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Publication number: 20090072839Abstract: An apparatus and method to detect failure of an electrolytic capacitor that smoothes a DC voltage in an inverter circuit. The apparatus detects failure of a smoothing electrolytic capacitor in a motor drive inverter circuit that rectifies and smoothes an AC voltage through a rectifier and the smoothing electrolytic capacitor and converts a rectified and smoothed DC voltage into a 3-phase voltage to drive a motor. The apparatus includes a voltage meter, a current sensing unit, and a controller. The voltage meter measures a DC voltage of an inverter when the motor is not in operation. The current sensing unit measures a phase current of the motor when the motor is not in operation. The controller estimates an ESR value of the smoothing electrolytic capacitor from the DC voltage of the inverter and the motor phase current to detect failure of the smoothing electrolytic capacitor.Type: ApplicationFiled: April 8, 2008Publication date: March 19, 2009Applicant: Samsung Electronics Co., Ltd.Inventors: Myung Chul Kim, Jae Young Choi, Jang Ho Yoon, Song Bin Lee, Kwong Woon Lee
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Patent number: 7482816Abstract: In a voltage monitor that measures voltages applied to the terminals of each of a plurality of capacitors constituting a storage section, the each voltage applied to a connecting point between terminals of the capacitors in charging operation, is divided by resistors and the divided voltage is fed into a selector switch. The resistance values used for dividing the each voltage are determined in advance so that a short-circuit between adjacent input terminals of the selector switch allows the divided voltage to have a voltage shift remarkably larger or smaller than the divided voltage obtained under the normal charging operation.Type: GrantFiled: August 23, 2006Date of Patent: January 27, 2009Assignee: Panasonic CorporationInventors: Yoshimitu Odajima, Kazuki Morita, Junji Takemoto
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Publication number: 20090001370Abstract: The present invention provides a novel solution for simultaneously extracting the properties of the interconnect wires and the inter-wire dielectrics exposed to the IC planarization process.Type: ApplicationFiled: June 28, 2008Publication date: January 1, 2009Inventor: Wallace W. Lin
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Patent number: 7464283Abstract: Systems and methods are provided for providing precision timing signals. A first register bank, driven by a first clock signal, provides a first delay along a first signal path. A second register bank, driven by a second clock signal related to the first clock signal, provides a second delay along a second signal path. A system control controls at least one of the first and second banks of registers to control the first and second delays, as to provide a desired skew between the output of the first signal path and the second signal path.Type: GrantFiled: June 28, 2004Date of Patent: December 9, 2008Assignee: Texas Instruments IncorporatedInventors: Alexander Noam Teutsch, Mohammad Al-Shyoukh, Nicole Cunningham
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Publication number: 20080290879Abstract: An apparatus and method for measuring the leakage current of capacitive components. A switch that grounds a terminal of a component being tested is closed while the component is charged to a desired test voltage. When this charging is complete, the switch opens so that the diode terminal is at the same potential as the input amplifier's virtual ground. An accurate and fast measurement of the leakage current of the component can be measured.Type: ApplicationFiled: May 24, 2007Publication date: November 27, 2008Applicant: ELECTRO SCIENTIFIC INDUSTRIES, INC.Inventors: David W. Newton, Kenneth V. Almonte
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Publication number: 20080284350Abstract: A bulb detection circuit is associated with a dimmer circuit for a lighting system. The bulb detection circuit is operable to detect whether an incandescent or a fluorescent bulb is received in an electric light socket. The socket may be hardwired to the circuit, or could be plugged into an electrical outlet. The bulb detection circuit may utilize a separately inventive method of measuring the resistance by looking at an RC circuit time constant. Further, the bulb detection circuit may utilize a separately inventive method of identifying a short circuit by again looking at the RC circuit time constant.Type: ApplicationFiled: May 17, 2007Publication date: November 20, 2008Inventors: Jian Xu, Jeffrey Iott, Thomas Alan Barnett
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Publication number: 20080284449Abstract: A power converter includes a controller and at least one circuit component. The controller is configured for monitoring stress on the circuit component during operation of the power converter and estimating a remaining life of the circuit component based on the monitored stress.Type: ApplicationFiled: May 15, 2007Publication date: November 20, 2008Inventors: Vijay Phadke, Gordon Currie, Arlaindo Asuncion
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Publication number: 20080246492Abstract: A method of conditioning tantalum capacitors on printed wire assemblies is disclosed. According to the method, each of the capacitors on an assembly is subjected to the same conditioning level during testing. To condition the tantalum capacitors, surge currents are induced in the capacitors in a controlled manner as a means of aging the capacitors so that they can be used without de-rating rating with low failure rates. The level of voltage, timing and current levels are set by circuitry used to perform the testing. The same circuits that are used with the capacitors in a system application are also used for the tantalum capacitor test circuit during the conditioning process.Type: ApplicationFiled: April 5, 2007Publication date: October 9, 2008Applicant: General Electric CompanyInventors: Allen Michael Ritter, Todd David Greenleaf
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Patent number: 7432616Abstract: In the inverter device of the invention, when a power source connected to an electrolytic capacitor 5 is interrupted, a switching control circuit 6a controls switching elements of an inverter main circuit 7a to operate to supply a current to a load, thereby discharging charges of the electrolytic capacitor 5, and an electrolytic capacitor electrostatic capacitance calculator 10a calculates the electrostatic capacitance of the electrolytic capacitor, on the basis of: a discharged charge amount which is obtained from an outflow current Ic from the electrolytic capacitor 5, and a discharge time; and a discharge voltage ?V which is a voltage drop from beginning of discharging of the electrolytic capacitor 5.Type: GrantFiled: March 17, 2003Date of Patent: October 7, 2008Assignee: Mitsubishi Denki Kabushiki KaishaInventors: Akira Hatai, Mahito Unno, Masakatsu Daijou, Kiyoshi Eguchi
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Patent number: 7425834Abstract: Techniques are disclosed to select functional parameters and/or operating modes of a circuit based on a time measurement are disclosed. One example integrated circuit includes a threshold detection and timing circuit that is coupled to measure a signal during an initialization period of the integrated circuit from a multifunction capacitor that is to be coupled to a first terminal of the integrated circuit. A selection circuit is coupled to the threshold detection and timing circuit to select a parameter/mode of the integrated circuit in response to the measured signal from the multifunction capacitor during the initialization period of the integrated circuit. The multifunction capacitor is coupled to provide an additional function for the integrated circuit after the initialization period of the integrated circuit is complete.Type: GrantFiled: August 26, 2005Date of Patent: September 16, 2008Assignee: Power Integrations, Inc.Inventors: David Michael Hugh Matthews, Alex B. Djenguerian, Kent Wong, Balu Balakrishnan
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Publication number: 20080218176Abstract: A power supply device has a capacitor unit in which capacitors are interconnected in series, a charging unit for charging the capacitor unit at a constant current, a detecting unit for detecting voltage on the high potential side of each of the capacitors, a determining unit for determining the existence of an abnormality based on the voltage detected by the detecting unit. The determining unit determines the abnormality when the difference between respective voltages on the high potential sides of some adjacent capacitors exceeds upper-limit voltage value Va, when the difference is lower than lower-limit voltage value Vb, or when a voltage is negative.Type: ApplicationFiled: December 13, 2005Publication date: September 11, 2008Inventors: Toshihiko Ohashi, Yohsuke Mitani, Kazuki Morita, Yoshimitu Odajima, Junji Takemoto
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Publication number: 20080200748Abstract: The inventive technique includes methods, devices and computer-readable media for monitoring a magnetic device. One such device includes a magnetic core for generating a magnetic field, a power supply and a capacitor bank that is charged by the power supply and is for pulsing the magnetic core. The device also includes a processor that measures a charging response of the capacitor bank during charging and determines whether the measured charging response is within a predetermined tolerance of a predetermined charging response.Type: ApplicationFiled: February 20, 2007Publication date: August 21, 2008Applicant: Neuronetics, Inc.Inventors: Anthony Testani, Mark Edward Riehl, Frank C. Klingshirn
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Publication number: 20080157783Abstract: State of a high voltage capacitor is monitored to detect partial discharge within the capacitor and approaching end-of-life of the capacitor. Partial discharge may be detected through an increased capacitance of the capacitor, and the resulting increase in the alternating current through the capacitor. Partial discharge may also be detected by presence of high frequency components in the current. Moreover, partial discharge may be detected through an increase in the internal pressure of the capacitor. When partial discharge is detected, a warning is generated, and the capacitor may be replaced in response to the warning. Periodic or random checks of the capacitor state, as indicated by the current or pressure, may also be performed. Warnings may be, for example, visual and/or audio, and may be transmitted to remote locations by radio frequency, infrared signals, or via power lines.Type: ApplicationFiled: January 1, 2007Publication date: July 3, 2008Applicant: Maxwell Technologies, Inc.Inventors: Etienne Savary, Pierre Papaux
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Publication number: 20080143342Abstract: A method for screening electrolytic capacitors places a capacitor in series with a resistor in series with a resistor, applying a test voltage and following the charge curve for the capacitor. A high voltage drop indicates high reliability and a low voltage drop is used to reject the piece. The leakage current is not adversely affected during the test.Type: ApplicationFiled: December 18, 2006Publication date: June 19, 2008Inventor: Yuri Freeman
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Patent number: 7385404Abstract: An arrangement for testing a plurality of capacitances in a capacitance array of an integrated circuit includes a power supply and a means for cyclically charging and discharging at least one of the capacitances. In this arrangement, the cycle frequency is dependent on the value of the capacitance. The cycle frequency or a quantity characteristic associated therewith is measured by a means to ascertain a value of the capacitance under test.Type: GrantFiled: September 15, 2004Date of Patent: June 10, 2008Assignee: Infineon Technologies AGInventors: Giuseppe Li Puma, Duyen Pham-Stäbner, Elmar Wagner
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Publication number: 20080133153Abstract: A rotary capacitor electrical test system for providing a power source to a capacitor under electrical test can include at least one programmable voltage source, at least one programmable current source, and a controller for programming the voltage and current sources. Random access, non-volatile, memory can be provided for storing information and for providing read/write capability for the controller. At least one digital/analog converter can communicate between the controller and the programmable voltage and current sources. A diagnostic program is operable through the controller for testing internal integrity of basic input/output functions of at least some subsystems. A circuit health monitoring program can operate through the controller for periodically testing and determining internal integrity of at least some subsystems. A self test program can operate through the controller for determining if at least some internal subsystems are working properly on a test/fail basis.Type: ApplicationFiled: November 30, 2006Publication date: June 5, 2008Applicant: ELECTRO SCIENTIFIC INDUSTRIES, INC.Inventor: Kenneth V. Almonte
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Publication number: 20080129312Abstract: A power distribution system for a rotary capacitor electrical tester includes a power source, an active station having plurality of test channels powered by the power source through cables connected to one side an upper contact module of the active station, and an opposition side a lower contact module of the active station being connectable to a test measurement device. A separate additional cable conductor inlet is located on the active station for receiving power from the power source. The power supplied through the extra additional cable is passed through the upper contact module of the active station without connecting to test channel and presents a power conductor outlet interface to a passive station immediately adjacent to the active station in order to reduce the number of cables required to connect between the power source and the various passive stations incorporated into the rotary capacitor electrical tester.Type: ApplicationFiled: November 30, 2006Publication date: June 5, 2008Applicant: ELECTRO SCIENTIFIC INDUSTRIES, INC.Inventor: Kenneth V. Almonte
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Patent number: 7380891Abstract: A power supply apparatus for a vehicle. An electronic controller outputs information for controlling braking of a vehicle. A battery supplies electric power to a brake via the electronic controller. A power supply backup unit as an auxiliary power supply includes a capacitor unit formed of a plurality of capacitors and a detection unit for detecting an abnormality in the capacitor unit, and supplies electric power to the brake when the battery is in an abnormal state. In charging or discharging the capacitor unit, the detection unit measures an internal resistance value of the capacitor unit, and measures an internal capacitance value from the rate of change of voltage per unit time. The detection unit judges whether or not the capacitor unit is in a normal state based on the internal resistance value and the internal capacitance value.Type: GrantFiled: July 1, 2004Date of Patent: June 3, 2008Assignee: Matsushita Electric Industrial Co., Ltd.Inventors: Toshihiko Ohashi, Yousuke Mitani
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Publication number: 20080100283Abstract: Methods for determining capacitance values of a metal on semiconductor (MOS) structure are provided. A time domain reflectometry circuit may be loaded with a MOS structure. The MOS structure may be biased with various voltages, and reflectometry waveforms from the applied voltage may be collected. The capacitance of the MOS structure may be determined from the reflectometry waveforms.Type: ApplicationFiled: October 25, 2006Publication date: May 1, 2008Inventors: Kin P. Cheung, Dawei Heh, Byoung Hun Lee, Rino Choi
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Publication number: 20080088318Abstract: An inexpensive process for verifying that a capacitor, which would be difficult to detect using in-circuit testing techniques if the capacitor were a conventional two-terminal capacitor, has been properly installed on a circuit board involves incorporating into the circuit a feedthrough capacitor having at least two internally electrically connected terminals, and testing for electrical continuity between points on the circuit electrically connected to the internally connected terminals of the feedthrough capacitor.Type: ApplicationFiled: October 17, 2006Publication date: April 17, 2008Inventor: Balakrishnan V. Nair
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Patent number: 7307485Abstract: An apparatus that may be used to sense capacitance, as well as other functions. The apparatus includes a comparator circuit with hysteresis, a capacitor, and a current driver. The comparator circuit with hysteresis includes a first input and an output. The capacitor is coupled to the first input of the comparator circuit with hysteresis. The current driver is coupled to the output of the comparator circuit with hysteresis and to the capacitor. The current driver reciprocally sources and sinks a drive current through a terminal of the capacitor to oscillate a voltage potential at the terminal of the capacitor between a low reference potential and a high reference potential. The current driver is responsive to the output of the comparator circuit with hysteresis.Type: GrantFiled: November 14, 2005Date of Patent: December 11, 2007Assignee: Cypress Semiconductor CorporationInventors: Warren S. Snyder, David Van Ess
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Patent number: 7253604Abstract: An assembled capacitor polarity automatic inspecting method and system is proposed, which is designed for use to perform an automatic inspecting procedure to check whether an array of polarized capacitor are mounted correctly in polarity on a circuit board; and which is characterized by the use of computerized technology to automatically check whether each assembled capacitor on the circuit board is mounted correctly in polarity and automatically generate an inspection report in electronic form to show the result of inspection. This feature allows the QA/QC procedure on the circuit board not only to save labor and time but also to be much more accurate and efficient than the prior art.Type: GrantFiled: February 28, 2006Date of Patent: August 7, 2007Assignee: Inventec CorporationInventors: Sonic King, Bg Fan
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Patent number: 7236113Abstract: A pressure transmitter having a capacitance-to-digital modulator produces an output as a function of sensor capacitance and a reference capacitance. Transmitter also includes a sensor failure mode detector produces an output signal and identifies failure modes of the sensor capacitance and reference capacitance.Type: GrantFiled: January 26, 2006Date of Patent: June 26, 2007Assignee: Emerson Process ManagementInventor: Rongtai Wang
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Patent number: 7230434Abstract: According to the present invention, a multi-layered capacitor includes a first capacitive element having a first conductor plate formed on a first layer, a second conductor plate formed on a second layer and an insulator arranged between the first and second conductor plates; and a second capacitive element which is arranged just on a layer above or below the first capacitive element.Type: GrantFiled: May 30, 2006Date of Patent: June 12, 2007Assignee: Oki Electric Industry Co., Ltd.Inventor: Seiichiro Sasaki
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Patent number: 7215127Abstract: A detecting fixture for detecting a capacitor with leakage current among a capacitor group in parallel connection includes a reference voltage generator, an impedance converter, a comparator and a display unit. Wherein, the reference voltage generator is used for outputting a first voltage, the impedance converter is used for converting the impedance of the capacitor group in parallel connection into a second voltage and the comparator is respectively coupled with the outputs of the reference voltage generator and the impedance converter for comparing the first voltage with the second voltage. The display unit is coupled with the output of the comparator, wherein the second voltage is altered by heating a capacitor among the capacitor group in parallel connection and the comparator outputs a voltage difference in response to the altered second voltage, so that the display unit is able to indicate whether or not the corresponding capacitor has leakage current.Type: GrantFiled: August 17, 2006Date of Patent: May 8, 2007Assignee: Advanced Semiconductor Engineering, Inc.Inventor: Pei-Yen Lu
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Patent number: 7212011Abstract: A method for determining the deterioration of a capacitor that increases the measurement accuracy to have an improved reliability is disclosed. In this method for determining the deterioration of a capacitor, the deterioration of a capacitor including a pair of electrode bodies and electrolytic solution provided between the electrode bodies is determined by applying an AC voltage to the capacitor to measure an impedance characteristic at a frequency of the AC voltage. An inflection point appearing in the impedance characteristic due to the deterioration of the electrolytic solution is previously calculated to make comparison with an impedance value in the frequency region lower than the inflection point, thereby determining the deterioration.Type: GrantFiled: June 14, 2005Date of Patent: May 1, 2007Assignee: Matsushita Electrid Industrial Co. Ltd.Inventors: Toshiaki Shimizu, Toshihiko Oohashi
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Patent number: 7199590Abstract: A laminated ceramic capacitor C has a plurality of internal electrodes embedded in a dielectric base substance in a stratified manner, the internal electrodes are caused to conduct to a pair of terminal electrodes provided on an outer surface of the dielectric base substance, and the terminal electrode has an outermost layer containing Sn as a main component. There is provided a step of setting the laminated ceramic capacitor in a temperature environment which is not less than 125° C. and not more than 180° C. and applying a direct-current voltage between the terminal electrodes in order to measure a direct-current insulation resistance. The step of applying the direct-current voltage includes a first step and a second step. A direct-current voltage V1 (V/?m) which falls within a range of 20 to 40 (V/?m) is applied at the first step, and a direct-current voltage V2 (V) with a rated voltage being taken into consideration is applied at the second step after termination of the first step.Type: GrantFiled: September 22, 2004Date of Patent: April 3, 2007Assignee: TDK CorporationInventors: Kazunori Ito, Yuusaku Horie, Kazuyuki Hasebe
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Patent number: 7173432Abstract: A method automatically tests a parameter of an electronic component to determine whether the component has an acceptable value. The method employs an automatic electronic component testing machine having at least first and second measurement positions where the parameter can be measured. The testing process itself may falsely cause the value to appear to be unacceptable when the value is actually acceptable. The method places the component in a first measurement position and measures the parameter in the first position, thereby generating a first measured parameter value. The method also places the component in a second measurement position and measures the parameter in the second position, thereby generating a second measured parameter value. The method rejects the component only if all measured values are unacceptable, whereby the probability of falsely rejecting the component is less than if only a single measuring step were performed.Type: GrantFiled: November 21, 2005Date of Patent: February 6, 2007Assignee: Electro Scientific Industries, Inc.Inventors: Douglas John Garcia, Kyung Young Kim, Locke Lowman