To Determine Dimension (e.g., Distance Or Thickness) Patents (Class 324/699)
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Patent number: 11952907Abstract: A sensor system for a turbomachine having an axis is disclosed. The sensor system includes a mounting member including a body configured to be mounted to only a circumferential portion of a circumferential interior surface of a casing of the turbomachine. A plurality of sensors are coupled to the mounting member and configured to measure an operational parameter of the turbomachine.Type: GrantFiled: March 17, 2022Date of Patent: April 9, 2024Assignee: GE Infrastructure Technology LLCInventors: Kurt Kramer Schleif, Andrew David Ellis, Michael Allen Ball
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Patent number: 11899246Abstract: A communications connection system includes an adapter module defining at least first and second ports and at least one media reading interface mounted at one of the ports. The first adapter module is configured to receive a fiber optic connector at each port. Some type of connectors may be formed as duplex connector arrangements. Some types of adapters may include ports without media reading interfaces. Some types of media reading interfaces include contact members having three contact sections.Type: GrantFiled: July 5, 2022Date of Patent: February 13, 2024Assignee: COMMSCOPE TECHNOLOGIES LLCInventors: John Anderson, Steven J. Brandt, Joseph C. Coffey, Kamlesh G. Patel, Cyle D. Petersen, Michael D. Schroeder, John Stasny
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Patent number: 11700678Abstract: A fixture configuration module comprises a connector configured to be removably coupled with a light fixture. The fixture configuration module also comprises fixture control circuitry communicatively coupled to the connector and configured to control the light fixture to produce light in accordance with a range of a lighting parameter. The range includes at least a subset of values supported by the light fixture for producing light. The fixture configuration module further comprises range control circuitry communicatively coupled to the fixture control circuitry and configured to wirelessly receive the range at least while the connector is uncoupled from the light fixture, and designate the range to the fixture control circuitry while the connector is coupled to the light fixture.Type: GrantFiled: March 28, 2022Date of Patent: July 11, 2023Assignee: IDEAL Industries Lighting LLCInventors: Robert Bowser, John Roberts, Kory Liszt, Michael James Harris, Paul Pickard
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Patent number: 11636445Abstract: A system and a method include at least one control unit that determines a de-icing time for an aircraft within a de-icing area of an airport, predicts a de-icing time for an aircraft within a de-icing area of an airport, schedules de-icing times for a plurality of aircraft within a de-icing area of an airport, and/or predicts demand for future de-icing operations of aircraft within a de-icing area of an airport.Type: GrantFiled: November 18, 2019Date of Patent: April 25, 2023Assignee: THE BOEING COMPANYInventors: Jakub Dziecielski, Piotr Marian Mazuz, Jonasz Rudnik, Michal Ruminski, Aleksander Rydzewski, Jason W. Clark
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Patent number: 11628699Abstract: A suspension arm bushing provided in a vehicle includes coils. First magnetic viscoelastic elastomers are arranged at both ends in an axial direction of a housing, respectively, to sandwich the coils. A second magnetic viscoelastic elastomer is arranged in the housing so as to be sandwiched between the coils. A controller selectively switches directions of magnetic fields generated by the coils between the same direction and opposite directions.Type: GrantFiled: December 20, 2021Date of Patent: April 18, 2023Assignee: HONDA MOTOR CO., LTD.Inventors: Yuho Ito, Toshio Inoue
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Patent number: 11474020Abstract: A sensing element includes a substrate including an electrically non-conductive surface, at least one high surface energy region, and an electrode pair structure disposed on the electrically non-conductive surface. The electrode pair structure includes at least one pair of electrodes having a gap therebetween. At least one of the electrodes is at least partially within the at least one high surface energy region. The sensing element is configured to sense fluid-soluble particulate matter.Type: GrantFiled: August 28, 2018Date of Patent: October 18, 2022Assignee: 3M Innovative Properties CompanyInventors: Richard C. Webb, Andrew S. Viner, Deepti Gopalakrishnan, Andrew P. Bonifas, Adam J. Mueler, Moses M. David, James P. Endle, Nicholas G. Amell
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Patent number: 11434814Abstract: A turbocharger for a machine is disclosed. The turbocharger may comprise a turbine section including a turbine housing and a turbine wheel, a compressor section including a compressor housing and a compressor wheel with a plurality of blades, and a shaft rotatably coupling the turbine wheel and the compressor wheel. The turbocharger may further comprise a health sensor mounted to the compressor housing and including a plurality of wire loops. The plurality of wire loops may be consecutively broken upon impact with the blades of the compressor wheel or a structure assembled on the compressor wheel as the turbocharger wears over time. The health monitor may be configured to detect a number of wire loops broken by impact with the blades of the compressor wheel or the structure, and the number of wire loops broken may indicate a wear condition of the turbocharger.Type: GrantFiled: January 2, 2019Date of Patent: September 6, 2022Assignee: Caterpillar Inc.Inventors: Timothy Gibbs Sidles, Kyle B. Walton
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Patent number: 11334003Abstract: A binary ink developer (BID) may include a power supply electrically coupled to an electrode, a developer roller, and a cleaner roller. The BID may also include a controller to determine a level of image ghosting based on a sum of currents at the electrode, the developer roller and the cleaner roller, and instruct the power supply to provide an adjusted voltage to the cleaner roller in response to a determination of the level of image ghosting.Type: GrantFiled: December 18, 2018Date of Patent: May 17, 2022Assignee: Hewlett-Packard Development Company, L.P.Inventor: Eric G. Nelson
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Patent number: 11302544Abstract: A method for measurement of misregistration in the manufacture of semiconductor device wafers, the method including measuring misregistration between layers of a semiconductor device wafer at a first instance and providing a first misregistration indication, measuring misregistration between layers of a semiconductor device wafer at a second instance and providing a second misregistration indication, providing a misregistration measurement difference output in response to a difference between the first misregistration indication and the second misregistration indication, providing a baseline difference output and ameliorating the difference between the misregistration measurement difference output and the baseline difference output.Type: GrantFiled: May 6, 2019Date of Patent: April 12, 2022Assignee: KLA-TENCOR CORPORATIONInventors: Roie Volkovich, Renan Milo, Liran Yerushalmi, Moran Zaberchik, Yoel Feler, David Izraeli
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Patent number: 11060993Abstract: The disclosure describes techniques for detecting a crack or defect in a material. The technique may include applying an electrical signal to a first electrode pair electrically coupled to the material. The technique also may include, while applying the electrical signal to the first electrode pair, determining a measured voltage between a second, different electrode pair. At least one electrode of the second, different electrode pair is electrically coupled to the material. The technique may further include determining a corrected measured voltage by suppressing a thermally induced voltage from the measured voltage and determining whether the material includes a crack or other defect based on the corrected measured voltage.Type: GrantFiled: November 15, 2017Date of Patent: July 13, 2021Assignee: 3M INNOVATIVE PROPERTIES COMPANYInventors: David H. Redinger, Christopher R. Yungers, Jennifer F. Schumacher
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Patent number: 10359578Abstract: A connector assembly includes an adapter, a housing device, a ferrule assembly, and a sensor. The housing device is received by the adapter and has a bore, a front end, and a rear end opposite the front end. A ferrule of the ferrule assembly is within the bore of the housing device and has a mating end extending beyond the front end of the housing device. The sensor is mounted on the rear end of the housing, the rear end of the ferrule assembly, or on the adapter confronting and spaced apart from the housing device or the ferrule assembly. The sensor is configured for detecting a force applied by the housing device or the ferrule assembly, respectively. An electrical characteristic of the sensor changes to indicate a predetermined force has been applied by the housing device or the ferrule assembly, respectively.Type: GrantFiled: January 5, 2018Date of Patent: July 23, 2019Assignee: Go!Foton Holdings, Inc.Inventors: Kenichiro Takeuchi, Haiguang Lu, Chi Kong Paul Ng
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Patent number: 9940952Abstract: A method according to one embodiment includes measuring an initial coating thickness on a tape bearing surface of a module in a carrier, running a tape across the tape bearing surface, and at intervals, measuring a residual thickness of the coating.Type: GrantFiled: September 21, 2015Date of Patent: April 10, 2018Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Robert G. Biskeborn, Jason Liang, Calvin S. Lo
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Patent number: 9934807Abstract: A magnetic recording head includes a plurality of writers and at least one reader. The plurality of writers and the reader define a plurality of close points of the head. The plurality of writers are spaced apart from one another in a cross-track direction and positioned in the same plane of the head. A plurality of contact sensors are positioned proximate the plurality of writers and the reader. The contact sensors are coupled together and to a pair of electrical bond pads of the head and configured to sense for head-disk contact at each of the close points.Type: GrantFiled: June 29, 2016Date of Patent: April 3, 2018Assignee: SEAGATE TECHNOLOGY LLCInventors: Declan Macken, Paul Sonda, Erik Hutchinson, Jin Fang, John Wolf
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Patent number: 9786568Abstract: A method of manufacturing a wafer. The method includes providing a wafer that includes a plurality of semiconductor device structures, and testing at least one of the plurality of semiconductor device structures. Based on a test result, a substance is provided on a selected portion of the wafer to selectively configure a circuit element within the at least one of the plurality of semiconductor device structures.Type: GrantFiled: February 19, 2016Date of Patent: October 10, 2017Assignee: Infineon Technologies AGInventors: Claudia Sgiarovello, Martin Mischitz, Andrew Wood
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Patent number: 9719951Abstract: A method and apparatus for detecting moisture that includes at least three conductors. One of the conductors has a different resistance than the other conductors. A liquid extends between the conductors. The difference between the impedance through a pair of conductors and the liquid and the impedance of through another pair of conductors and the liquid may be used to determine the position of the liquid along a length of the conductors. Similar methods may be used to determine an area of a liquid with respect to the conductors.Type: GrantFiled: July 10, 2014Date of Patent: August 1, 2017Assignee: Helvetia Wireless LLCInventors: Brian C. Woodbury, Roc Lastinger
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Patent number: 9453878Abstract: Disclosed is a test structure that can be used to characterize a specific interface resistance within a multi-layer conductive structure, such as a multi-layer ohmic contact. In the test structure first and second transmission line model (TLM) structures both incorporate a row of essentially identical contact pads separated by spaces with progressively increasing lengths. Conductive mesas, also with progressively increasing lengths, are positioned within the spaces between all but the initial pair of adjacent contacts pads. The first and second TLM structures differ only with respect to the presence of a single conductive layer on each of the conductive mesas. System, method and computer program product embodiments are able to extract resistance parameters associated with the first and second TLM structures, including conductive mesa to conductive layer interface resistances, based current-voltage measurements acquired from both of the TLM structures.Type: GrantFiled: February 26, 2013Date of Patent: September 27, 2016Assignee: GLOBALFOUNDRIES INC.Inventors: John B. Campi, Jr., Robert J. Gauthier, Jr., Junjun Li, Souvick Mitra
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Patent number: 9293152Abstract: A system according to one embodiment includes a carrier for receiving a module; a transport mechanism for running a tape across a tape bearing surface of the module; and a measuring device for measuring an extent of wear of a coating on a tape bearing surface of the module. A module according to one embodiment includes a body having a tape bearing surface, the body having an approximate tape bearing surface profile and dimensions as a module of interest; and a coating on the tape bearing surface. A method according to one embodiment includes measuring an initial coating thickness on a tape bearing surface of a module in a carrier; running a tape across the tape bearing surface; and at intervals, measuring a residual thickness of the coating.Type: GrantFiled: January 25, 2012Date of Patent: March 22, 2016Assignee: International Business Machines CorporationInventors: Robert G. Biskeborn, Jason Liang, Calvin S. Lo
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Patent number: 9079280Abstract: The invention refers to an apparatus for monitoring the operation of an electrically conductive tool (120) of a machine tool (100, 400) having at least one electrically conductive spindle (110) for holding the tool (120) and a detector (140, 545, 645) which determines an electrical resistance (190, 290, 390) between the spindle (110) and the electrically conductive work piece (130) to be processed, and wherein the spindle (110) is electrically isolated from the machine tool (100, 400) and/or the apparatus is adapted to electrically isolate the work piece (130) to be processed from the machine tool (100, 400).Type: GrantFiled: January 10, 2012Date of Patent: July 14, 2015Assignee: ARTIS GmbHInventors: Dirk Lange, Volker Redecker, Heribert Josef Messing
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Patent number: 9075334Abstract: An image forming apparatus includes: a photosensitive member driven rotary; a charging unit configured to charge the photosensitive member; an exposure unit configured to form an electrostatic latent image on the photosensitive member by exposing the charged photosensitive member; a detecting unit configured to detect a current flowing between the charging unit and the photosensitive member; and a correction unit configured to determine a fluctuation location and a fluctuation amount of the charged potential of the photosensitive member, according to a fluctuation amount of the current detected by the detecting unit, and to correct an amount of light irradiated by the exposure unit onto the photosensitive member at the fluctuation location of the charged potential according to the determined fluctuation amount of the potential.Type: GrantFiled: May 16, 2013Date of Patent: July 7, 2015Assignee: CANON KABUSHIKI KAISHAInventor: Go Araki
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Publication number: 20150109008Abstract: A method is provided for precisely enlarging a nanopore formed in a membrane. The method includes: applying an electric potential across the nanopore, where the electric potential has a pulsed waveform oscillating between a high value and a low value; measuring current flowing though the nanopore while the electric potential is being applied to the nanopore at a low value; determining size of the nanopore based in part on the measured current; and removing the electric potential applied to the membrane when the size of the nanopore corresponds to a desired size.Type: ApplicationFiled: May 7, 2013Publication date: April 23, 2015Inventors: Michel Godin, Eric Beamish, Vincent Tabard-Cossa, Wing Hei Kwok
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Publication number: 20150087090Abstract: A method and apparatus for estimating a height of an epitaxially grown semiconductor material in other semiconductor devices. The method includes epitaxially growing first, second, and third portions of semiconductor material on a first semiconductor device, measuring a height of the third portion of semiconductor material and a height of the first or second portion of semiconductor material, measuring a first saturation current through the first and second portions of semiconductor material, measuring a second saturation current through the first and third portions of semiconductor material, and preparing a model of the first saturation current relative to the height of the first or second portion of semiconductor material and the second saturation current relative to an average of the height of the first and third portions of semiconductor material. The model is used to estimate the height of an epitaxially grown semiconductor material in the other semiconductor devices.Type: ApplicationFiled: November 26, 2014Publication date: March 26, 2015Inventors: Chih-Sheng Chang, Chia-Cheng Ho, Yi-Tang Lin
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Patent number: 8957694Abstract: An integrated circuit includes a monitoring circuit and a monitored circuit connected with the monitoring circuit. The monitoring circuit is operable to determine during fabrication if a resistance of a connection between an in-fab redistribution layer connector and a post-fab redistribution layer connector exceeds a threshold.Type: GrantFiled: May 22, 2012Date of Patent: February 17, 2015Assignee: Broadcom CorporationInventors: Kunzhong Hu, Chonghua Zhong, Edward Law
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Publication number: 20150042367Abstract: Disclosed herein are a thickness measurement device and a method for measuring a thickness. The thickness measurement device includes: a four-terminal probe including a first probe through a fourth probe which are in contact with a metal film; a contact pressure controlling unit each controlling the first probe through the fourth probe so that the metal film and the first probe through the fourth probe have the same contact pressure; a current supplying unit supplying a current to the four-terminal probe; a voltage measuring unit measuring a voltage across the four-terminal probe; and a thickness calculating unit calculating a thickness of the metal film using a current value supplied from the current supplying unit and a voltage value measured by the voltage measuring unit.Type: ApplicationFiled: July 14, 2014Publication date: February 12, 2015Applicant: SAMSUNG ELECTRO-MECHANICS CO., LTD.Inventors: Ji Hoon KIM, Sung Yeol Park
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Patent number: 8947110Abstract: Embodiments of suspension clamps for use in testing membrane samples used in fuel cells are provided. One example of a suspension clamp comprises a frame, a clamp member, a plurality of electrodes, and a suspension component. The clamp member is hingedly attached to one end of the frame. Each of the plurality of electrodes extends along a membrane-facing surface of at least one of the clamp member and the frame. A suspension component is attached to at least one of the clamp member and the frame and is configured to suspend the suspension clamp during testing of a membrane sample. The suspension clamp can be used to measure one or more of resistance, impedance, conductance, proton permeability and through-thickness of the membrane sample.Type: GrantFiled: September 22, 2011Date of Patent: February 3, 2015Assignee: Nissan North America, Inc.Inventors: Gregory James DiLeo, Kevork Adjemian
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Publication number: 20150015280Abstract: A method of wear detection of a coated belt or rope includes connecting a wear detection unit to one or more monitoring strands and/or cords of a coated belt or rope. The coated belt or rope includes one or more baseline strands and/or cords exhibiting a first change in electrical resistance as a function of bending cycles of the belt or rope and one or more monitoring strands and/or cords exhibiting a second change in electrical resistance as a function of bending cycles of the belt or rope, greater than the first change in electrical resistance. An electrical resistance of the one or more monitoring strands and/or cords is measured via the wear detection unit. Using at least the measured electrical resistance of the one or more monitoring strands and/or cords, a wear condition of the belt or rope is determined.Type: ApplicationFiled: February 7, 2012Publication date: January 15, 2015Applicant: Otis Elevator CompanyInventors: Brad Guilani, Hong Yang
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Patent number: 8917089Abstract: A device for detecting metal elements in slab form such as metal plates or sheets, includes an emission coil powered by suitable control elements and generating a magnetic field, a reception coil placed so as to enable generation via induction of a voltage across the terminals of the coil under the action of the magnetic field, and elements for processing and evaluating the voltage signal delivered by the at least one reception coil, enabling delivery of an information signal indicating the absence or presence of one or more metal elements near the coils. The emission coil (3) and the reception coil (5) are both mounted in a housing or a sensor head having an active detection face having an associated detection region, and are positioned at a defined inclination one relative to the other and relative to the face.Type: GrantFiled: May 10, 2011Date of Patent: December 23, 2014Assignee: Senstronic (Societe par Actions Simplifiee)Inventor: Rémy Kirchdoerffer
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Patent number: 8906710Abstract: A method and apparatus for estimating a height of an epitaxially grown semiconductor material in other semiconductor devices. The method includes epitaxially growing first, second, and third portions of semiconductor material on a first semiconductor device, measuring a height of the third portion of semiconductor material and a height of the first or second portion of semiconductor material, measuring a first saturation current through the first and second portions of semiconductor material, measuring a second saturation current through the first and third portions of semiconductor material, and preparing a model of the first saturation current relative to the height of the first or second portion of semiconductor material and the second saturation current relative to an average of the height of the first and third portions of semiconductor material. The model is used to estimate the height of an epitaxially grown semiconductor material in the other semiconductor devices.Type: GrantFiled: December 23, 2011Date of Patent: December 9, 2014Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Chih-Sheng Chang, Chia-Cheng Ho, Yi-Tang Lin
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Patent number: 8890551Abstract: A test key structure for use in measuring step height includes a substrate, and a pair of test contacts. The substrate includes an isolation region and a diffusion region. The test contact pair includes a first test contact and a second test contact for measuring electrical resistances. The first test contact is disposed on the diffusion region and the second test contact is disposed on the isolation region.Type: GrantFiled: November 1, 2011Date of Patent: November 18, 2014Assignee: United Microelectronics Corp.Inventors: Chih-Kai Kang, Shu-Hsuan Chih, Sheng-Yuan Hsueh, Chia-Chen Sun, Po-Kuang Hsieh, Chi-Horn Pai, Shih-Chieh Hsu
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Patent number: 8884636Abstract: Disclosed is a sensor that can accurately detect displacement and prevents the phenomenon of a contact section between a shaft member and a sliding element receiver being shifted. The sensor comprising: a case having a through hole; a resistance substrate fixed at an inside of said case; a shaft member having a first end portion which is one end of the shaft member placed within said case and a second end portion which is other end of the shaft member exposed to an outside of said case from said through hole, said shaft member being placed at said through hole in a movable manner in an axial direction; and a sliding element receiver having a bearing end contacting with said second end portion of said shaft member, and attached with a brush sliding together with said resistance substrate, said sliding element receiver being capable of moving relatively against said resistance substrate with said shaft member. A hemispherical end face is formed at said first end portion.Type: GrantFiled: June 13, 2011Date of Patent: November 11, 2014Assignee: Eagle Industry Co., Ltd.Inventor: Mikio Nitta
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Patent number: 8836054Abstract: A semiconductor chip includes a semiconductor chip body having a first surface and a second surface that faces away from the first surface, and including a plurality of bonding pads disposed on the first surface. Also, the semiconductor chip includes a distance maintaining member attached to the first surface of the semiconductor chip body and electrically connected with a circuit pattern.Type: GrantFiled: September 23, 2011Date of Patent: September 16, 2014Assignee: SK Hynix Inc.Inventor: Kwon Whan Han
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Patent number: 8823401Abstract: A particulate matter sensor includes a first pair of sensing electrodes with a gap therebetween and a second pair of sensing electrodes with a gap therebetween. A method for determining an amount of soot on the particulate matter sensor includes determining the electrical resistance between the first pair of electrodes and the electrical resistance between the second pair of electrodes. The amount of soot deposited on the particulate matter sensor is determined based on the electrical resistance values. The time rate of change of resistance between the first pair of electrodes and the time rate of change of resistance between the second pair of electrodes are determined. The first and second rates of change are compared to each other and to threshold values, and the determination of soot amount may be modified depending on the results of these comparisons.Type: GrantFiled: March 30, 2012Date of Patent: September 2, 2014Assignee: Delphi Technologies, Inc.Inventors: Gregory T. Roth, Lary R. Hocken
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Patent number: 8776579Abstract: A substance detection sensor includes an insulating layer; two electrodes spaced in opposed relation to each other on the insulating layer; and conductive layers formed between the two electrodes on the insulating layer so as to electrically connect the two electrodes, and of which a swelling ratio varies depending on the type and/or amount of a specific gas. The conductive layers are formed by dividing into plural layers between the two electrodes.Type: GrantFiled: July 16, 2013Date of Patent: July 15, 2014Assignee: Nitto Denko CorporationInventors: Hiroshi Yamazaki, Toshiki Naito, Hiroyuki Hanazono
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Publication number: 20140139236Abstract: A test layout structure including a first series of parallel metal lines in a first level, and a first series of contact structures in a second level, the second level being positioned above the first level, the first series of contact structures being positioned at known increments, where the increments are in a direction perpendicular to a length of the first series of parallel metal lines, and where one or more of the first series of contact structures is in electrical contact with one or more of the first series of parallel metal lines.Type: ApplicationFiled: November 19, 2012Publication date: May 22, 2014Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Thomas W. Dyer, Stephen E. Greco
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Publication number: 20140111228Abstract: A position detection device having a first electrode pair, an electrically conductive body that forms an electrical resistor which is electrically connected to the electrodes of the first electrode pair and extends in a first direction (y), between them, and with a measurement electrode which is in electrically conductive contact with the surface of a measurement area of the body located between the electrodes of the first electrode pair and can move relative thereto. The body is electrically connected to the electrodes of a second electrode pair and extends between them in a second direction (x) such that the measurement area is located between the electrodes of the second electrode pair.Type: ApplicationFiled: July 9, 2012Publication date: April 24, 2014Applicant: ZF Friedrichshafen AGInventors: Ralf Hartrampf, Andreas Giefer, Ludger Rake
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Publication number: 20140046629Abstract: The present invention concerns an apparatus for deposition monitoring in a water system comprising a deposition measurement system, a DC power supply connected to a conductive deposition monitoring surface and a counter electrode, the apparatus has a first treatment configuration and a second treatment configuration, wherein one of the treatment configurations removes biofilm from the conductive deposition monitoring surface, and the other treatment configuration removes inorganic scale deposition from the conductive deposition monitoring surface.Type: ApplicationFiled: May 4, 2011Publication date: February 13, 2014Inventors: Kaikai Wu, Linna Wang
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Publication number: 20140015552Abstract: A method for determining a distance (Y) between a first position on and an electrical boundary (34) of a test sample by a multi-point probe comprising four contact elements, comprising: contacting the test sample with the four contact elements (20,22,24,26) at the first position, applying a magnetic field at the first position, performing a first and a second four-point measurement and deriving a first and a second resistance value, calculating a first resistance difference from the first and second resistance values, performing a third and a fourth four-point measurement and deriving a third and a fourth resistance value, calculating a second resistance difference from the third and fourth resistance values, defining a first relation including parameters representing the first resistance difference, the second resistance difference, and the distance between the first position and the electrical boundary, determining the distance by using the first and the second resistance differences in the first relation.Type: ApplicationFiled: December 21, 2011Publication date: January 16, 2014Applicant: CAPRES A/SInventors: Fei Wang, Dirch Hjorth Petersen, Ole Hansen
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Patent number: 8629688Abstract: A method for performing corrosion testing is provided. The method includes applying a thin film of silicone to an electrical device to be tested, positioning the device in a chamber, connecting the device to electrical testing equipment for determining any change in electrical resistance of the device, and disposing a gaseous compound of sulfur in the chamber. The method also comprises monitoring the device for any change in electrical resistance for indicating failure of the device.Type: GrantFiled: September 29, 2010Date of Patent: January 14, 2014Assignee: International Business Machines CorporationInventors: King M. A. Chu, Steven R. Nickel, Timothy J. Tofil
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Publication number: 20130321009Abstract: The invention relates to means for detecting and recognizing gestures, particularly different hand gestures. A gesture detection device (110) according to the invention comprises at least one electrode (120A-120E) for measuring an electrical property of the skin of a user, for example the electrical conductance of the skin and/or its change. From these measurement data, different gestures assumed by the body can be recognized.Type: ApplicationFiled: February 6, 2012Publication date: December 5, 2013Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.Inventor: Dzmitry Viktorovich Aliakseyeu
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Publication number: 20130300441Abstract: A substance detection sensor includes an insulating layer; two electrodes spaced in opposed relation to each other on the insulating layer; and conductive layers formed between the two electrodes on the insulating layer so as to electrically connect the two electrodes, and of which a swelling ratio varies depending on the type and/or amount of a specific gas. The conductive layers are formed by dividing into plural layers between the two electrodes.Type: ApplicationFiled: July 16, 2013Publication date: November 14, 2013Inventors: Hiroshi YAMAZAKI, Toshiki NAITO, Hiroyuki HANAZONO
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Publication number: 20130299289Abstract: A wear distance sensor detects wear distance of a brake pad, in particular of a friction brake, and includes a housing having a friction side and a connecting side and a probe having two electrical conductor elements in combination with at least one electrical resistance element. Two dimensions of the resistance element are not constant depending on the wear distance. A third dimension of the resistance element, which has a three-dimensional design, is not constant depending on the wear distance.Type: ApplicationFiled: September 15, 2011Publication date: November 14, 2013Applicant: KNORR-BREMSE SYSTEMS FUER NUTZFAHRZEUGE GMBHInventor: Thomas Eichler
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Publication number: 20130257460Abstract: A particulate matter sensor includes a first pair of sensing electrodes with a gap therebetween and a second pair of sensing electrodes with a gap therebetween. A method for determining an amount of soot on the particulate matter sensor includes determining the electrical resistance between the first pair of electrodes and the electrical resistance between the second pair of electrodes. The amount of soot deposited on the particulate matter sensor is determined based on the electrical resistance values. The time rate of change of resistance between the first pair of electrodes and the time rate of change of resistance between the second pair of electrodes are determined. The first and second rates of change are compared to each other and to threshold values, and the determination of soot amount may be modified depending on the results of these comparisons.Type: ApplicationFiled: March 30, 2012Publication date: October 3, 2013Applicant: DELPHI TECHNOLOGIES, INC.Inventors: GREGORY T. ROTH, LARY R. HOCKEN
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Patent number: 8521471Abstract: A system and method by which thickness of a dielectric film on substrates can be noninvasively determined is invented. The system and method are especially applicable to areas and applications where traditional techniques have proven unsuccessful or limited. According to embodiments of the present invention the present system and method can be used to measure film thickness in confined and inaccessible locations, and on substrates of complex geometry. The method can be used with an arbitrary and time varying orientation of the substrate-film interface. The measurements of the film thickness on the inside of open or enclosed channels of an arbitrary geometry, and on flexible substrates are possible. With multiple embedded sensors, the film thickness in different lateral locations can be simultaneously measured. The dielectric permittivity of the FUT as a function of the distance from the substrate of the film can also be measured.Type: GrantFiled: March 24, 2007Date of Patent: August 27, 2013Assignee: University of Utah Research FoundationInventor: Mikhail Skliar
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Patent number: 8511142Abstract: A substance detection sensor includes an insulating layer; two electrodes spaced in opposed relation to each other on the insulating layer; and conductive layers formed between the two electrodes on the insulating layer so as to electrically connect the two electrodes, and of which a swelling ratio varies depending on the type and/or amount of a specific gas. The conductive layers are formed by dividing into plural layers between the two electrodes.Type: GrantFiled: December 22, 2009Date of Patent: August 20, 2013Assignee: Nitto Denko CorporationInventors: Hiroshi Yamazaki, Toshiki Naito, Hiroyuki Hanazono
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Patent number: 8513959Abstract: An integrated sensory system for a lithography machine with a projection lens system (132) for focusing one or more exposure beams onto a target, a moveable table (134) for carrying the target (9), a capacitive sensing system (300) for making a measurement related to a distance between a final focusing element of the projection lens system (104) and a surface of a target (9), and a control unit (400) for controlling movement of the moveable table (134) to adjust a position of the target (9) based at least in part on a signal from the capacitive sensing system. The capacitive sensing system (300) has a plurality of capacitive sensors (30), each having a thin film structure. The capacitive sensors and the final focusing element (104) of the projection lens system are mounted directly to a common base (112), and the sensors are located in close proximity to an edge of the final focusing element of the projection lens system.Type: GrantFiled: December 23, 2010Date of Patent: August 20, 2013Assignee: Mapper Lithography IP B.V.Inventors: Guido De Boer, Johnny Joannes Jacobus Van Baar, Kaustubh Prabodh Padhye, Robert Mossel, Niels Vergeer, Stijn Willem Herman Karel Steenbrink
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Patent number: 8482306Abstract: A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. A reduction in a cross-sectional area of the at least one resistive due to wearing out of the shroud results in a change in a resistance of the at least one resistive. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element.Type: GrantFiled: September 14, 2012Date of Patent: July 9, 2013Assignee: General Electric CompanyInventors: Emad Andarawis Andarawis, Chukwueloka Obiora Umeh
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Publication number: 20130120007Abstract: An apparatus for detecting a pipe length in an air conditioning system includes a detector to detect a signal traveled through a pipe; and a processor to determine a pipe length based on the detected signal.Type: ApplicationFiled: November 2, 2012Publication date: May 16, 2013Inventors: Jun-Tae Kim, Chi-Sun Ahn, Seung-Hwan Jung, Sang-Chul Youn, Duck-Gu Jeon
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Publication number: 20130106446Abstract: A method for determining the roughness of an internal surface of a metal substrate or a metal layer is provided. By the correlation of a single destructive measurement in order to determine the roughness and the conductivity measurement of a transition region, the roughness is determined for other samples without destructive measurement.Type: ApplicationFiled: October 31, 2012Publication date: May 2, 2013Inventor: Matthias Jungbluth
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Publication number: 20130082723Abstract: In various embodiments, a support system includes a cover sheet with an electrically conductive spacer material.Type: ApplicationFiled: October 2, 2012Publication date: April 4, 2013Inventor: Christopher Locke
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Patent number: 8410800Abstract: In a method for determining the size and shape value (M) for a solid material (S), in particular scrap metal, in an arc furnace (1), an electrode flow fed to an electrode (3a, 3b, 3c) for forming an arc furnace (L) between the electrode (3a, 3b, 3c) and the solid (S) is measured (30) and from the measured electrode flow (I (t)), an effective measurement value of the electrode flow is determined (31) and from the measured electrode flow (I (t)) (32), a flow part associated with a frequency range of the measured electrode flow is determined (32), and a quotient of the flow part and an effective measurement value is formed as a measurement of the shape and size value of the flow (M). Thus, a method is provided that enables a property of a fusible element introduced into one of the arc furnaces to be determined.Type: GrantFiled: January 12, 2009Date of Patent: April 2, 2013Assignee: Siemens AktiengesellschaftInventors: Arno Döbbeler, Klaus Krüger, Thomas Matschullat, Detlef Rieger
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Publication number: 20130077189Abstract: According to one embodiment, a magnetic data system includes a magnetic disk medium, a magnetic head having a writer element and/or a reader element, an exothermic resistor element for thermal fly-height control (TFC), a contact detection sensor having a resistor element and at least one contact detection electrode, and an insulating film on a medium facing side of the magnetic head to protect the contact detection sensor, the insulating film having a thickness greater than the contact detection electrode, a drive mechanism for passing the magnetic disk medium over the magnetic head, and a controller electrically coupled to the magnetic head for controlling operation of the magnetic head, wherein the controller adjusts magnetic spacing between the magnetic head and the magnetic disk medium via thermal distortion of the exothermic resistor element. The contact detection sensor may be used as a second TFC resistor element.Type: ApplicationFiled: September 28, 2011Publication date: March 28, 2013Applicant: Hitachi Global Storage Technologies Netherlands B.V.Inventors: Atsushi Kato, Hideaki Tanaka, Ichiro Oodake, Takao Yonekawa