To Determine Dimension (e.g., Distance Or Thickness) Patents (Class 324/699)
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Publication number: 20070285110Abstract: A system for monitoring the displacement of turbine blades that includes a turbine blade with a cutting tooth and one or more sensor wires, each sensor wire including a severable portion, that become severed by the cutting tooth as turbine blade displacement occurs. The sensor wires may be embedded in a honeycomb, which may be an area of abradable material attached to turbine shrouds. The sensor wires may include a plurality of radial sensor wires embedded in the honeycomb at varying predetermined radial distances from a turbine rotor. The sensor wires also may include a plurality of axial sensor wires embedded in the honeycomb at varying predetermined axial locations along the length of the honeycomb.Type: ApplicationFiled: June 13, 2006Publication date: December 13, 2007Applicant: GENERAL ELECTRIC COMPANYInventors: Tagir R. Nigmatulin, Ariel Caesar-Prepena Jacala, Charles A. Bulgrin
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Patent number: 7164276Abstract: A method for determining the wall thickness of a metal tube is described. This method has the following features: (a) preparation of a metal tube of a determined length; (b) arrangement of two clamp contacts on the metal tube with an exactly defined distance of separation; (c) connection of the ends of the metal tube with a power source; and (d) measurement of the voltage drop in the metal tube between the clamp contacts.Type: GrantFiled: October 26, 2005Date of Patent: January 16, 2007Inventors: Klaus Porcher, Christian Frohne
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Patent number: 7018165Abstract: Method of minimizing the gap between a wheel and a casing of a turbine, a turbine, and a method of determining the wear behavior of a wheel of a rotor. To minimize the gap between a wheel and a casing in a turbine, optical methods are also often used in order to minimize the gap. However, this is very expensive. The method according to the invention proposes that the wheel and the casing (be part of an electric circuit, so that an electrical parameter, such as resistance for example, can be measured, the value of which shows whether a contact is present.Type: GrantFiled: October 12, 2004Date of Patent: March 28, 2006Assignee: Siemens AktiengesellschaftInventor: Mirko Milazar
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Patent number: 7019538Abstract: A measurement apparatus which measures a distance between a sensor probe and a target to be measured by using an electrostatic capacitance sensor, comprises first and second sensor probes (101, 102) which are arranged at respective predetermined gaps to the target (4), and first and second sensor amplifiers (111, 112) which are connected respectively to the first and second sensor probes, wherein when the distance between the target and the first or second sensor probe is measured, said first amplifier supplies a first current with the first sensor probe and said second amplifier supplies a second current which is different phase and/or amplitude from the first current.Type: GrantFiled: January 26, 2004Date of Patent: March 28, 2006Assignee: Canon Kabushiki KaishaInventor: Atsushi Kitaoka
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System and method for measuring the thickness or temperature of a circuit in a printed circuit board
Patent number: 7002360Abstract: System for measuring a thickness of a circuit component on a printed circuit board (PCB). The system includes a first circuit, a power plane, a power strip, a calibration strip, a temperature sensor, and a second circuit. The power plane is coupled to the first circuit. The power strip is for providing power to the power plane and is disposed in the PCB connected to the power plane. The power strip has at least two vias. The calibration strip has a predetermined width and is disposed in said PCB. The calibration strip has at least two vias for measuring a voltage drop. The temperature sensor is coupled to the calibration strip and configured to measuring a temperature of the calibration strip. The second circuit is coupled to the temperature sensor and configured to determine the thickness of the calibration strip based on at least the temperature of the calibration strip.Type: GrantFiled: March 22, 2004Date of Patent: February 21, 2006Assignee: Broadcom CorporationInventor: James M. Kronrod -
Patent number: 6972576Abstract: A system for testing a reticle used in semiconductor wafer fabrication is provided. The system includes a reticle that has an opaque metal layer over a translucent substrate. The reticle includes one or more test features containing probe points operable for electrical contact. The system includes a reticle test system that is capable of applying a voltage to the probe points, measuring the resulting current, calculating the corresponding resistance of the test features, and determining the critical dimensions of the test features. The system is also capable of determining defects based on the resistance measurements. The critical dimension information and defect information can then be used to refine the processes used in the fabrication of subsequent reticles.Type: GrantFiled: May 31, 2002Date of Patent: December 6, 2005Assignee: Advanced Micro Devices, Inc.Inventors: Christopher F. Lyons, Khoi A. Phan, Cyrus E. Tabery, Bhanwar Singh
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Patent number: 6954062Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 30, 2003Date of Patent: October 11, 2005Assignee: Bently Nevada, LLCInventor: Richard D. Slates
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Patent number: 6922070Abstract: An evaluating pattern includes a conductive pattern formed on a substrate, an insulating layer which is formed on the conductive pattern, a plurality of contact holes formed in a rectangular area through the insulating layer, and a conductive material filled into the contact holes to the conductive pattern.Type: GrantFiled: April 29, 2004Date of Patent: July 26, 2005Assignee: Oki Electric Industry Co., Ltd.Inventor: Tadashi Narita
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Patent number: 6919731Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 29, 2003Date of Patent: July 19, 2005Assignee: Bently Nevada, LLCInventor: Richard D. Slates
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Patent number: 6861852Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: June 3, 2003Date of Patent: March 1, 2005Assignee: Bently Nevada, LLCInventor: Richard D. Slates
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Patent number: 6850078Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 30, 2003Date of Patent: February 1, 2005Assignee: Bently Nevada, LLCInventor: Richard D. Slates
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Patent number: 6825676Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 27, 2003Date of Patent: November 30, 2004Assignee: Bently Nevada, LLCInventor: Richard D. Slates
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Patent number: 6822460Abstract: A system for determining a level of a combustible fuel in an aircraft fuel tank with a thermistor bead comprises: apparatus for disposing the thermistor bead at a height in the fuel tank; a temperature sensor disposed in the fuel tank for measuring a temperature in proximity to the thermistor bead; a first circuit for conducting a constant bias current of less than thirty milliamps into the fuel tank and through the thermistor bead; a second circuit for generating a reference voltage in proportion to the measured temperature of the sensor; a third circuit for measuring a voltage across the thermistor bead in response to the bias current, and also coupled to the second circuit for detecting the dry/wet state of the thermistor bead based on the measured and reference voltages and generating a signal indicative thereof; and a fourth circuit for determining the level of fuel in the tank based on the bead height and dry/wet state signal.Type: GrantFiled: December 9, 2002Date of Patent: November 23, 2004Assignee: Simmonds Precision Products, Inc.Inventor: William H. Pelkey
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Patent number: 6819122Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibrations method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 29, 2003Date of Patent: November 16, 2004Assignee: Bently Nevada, LLCInventor: Richard D. Slates
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Patent number: 6798194Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 30, 2003Date of Patent: September 28, 2004Assignee: Bently Nevada, LLCInventor: Richard D. Slates
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Patent number: 6768323Abstract: For locating an extrusion from an interconnect, an extrusion monitor structure is formed to surround the interconnect and is separated from the interconnect by a dielectric material. A first via is coupled to the interconnect, and a second via is coupled to the extrusion monitor structure and separated from the first via by a via distance (Lv). The extrusion is located at an extrusion site distance (Lextrusion) from the first via and between the first and second vias to short-circuit the interconnect to the extrusion monitor structure. A resistance (Rtotal) between the first and second vias is measured, and the Lextrusion is determined from a relationship with Rtotal, Lv, and resistivities and dimensions of the interconnect and the extrusion monitor structure.Type: GrantFiled: October 30, 2002Date of Patent: July 27, 2004Assignee: Advanced Micro Devices, Inc.Inventors: Christine Hau-Riege, Stefan Hau-Riege
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Patent number: 6768321Abstract: A component position indicating system which provides an indication when a first component is at the same position relative to a second component as it was at some historical reference time has a cable (11) fixed to the first component and a sheath (6) which surrounds part of the cable (11) and is connected to the second component. In this way relative movement between the first and second components produces movement of the cable within the sheath. One end of the cable (6) is wound around a cable drum (7) which is freely rotatably mounted in a chassis (2) such that movement of the cable (11) within the sheath (6) causes cable to wind onto or off of the drum (7), causing rotation of the drum (7) in the process. Sensing means senses the resulting movement of the drum (7) and records an output characteristic indicative of the position of the drum (7) relative to the chassis (2) so as to enable a particular relative position between said first and second components to be identified and accurately reproduced.Type: GrantFiled: January 15, 2003Date of Patent: July 27, 2004Assignee: Ctex Seat Comfort LimitedInventors: Robert Edwin Wain, Adrian Robert Noyes
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Publication number: 20040140816Abstract: Ramp arrangements and methods in accordance with the present invention can provide the position or velocity of an actuator assembly in a rotating media data storage device while loading or unloading a head connected with the actuator assembly from a disk. One such arrangement comprises a conductive ramp electrically coupled to a conductive suspension lift tab such that a closed circuit is formed when the head is unloaded from the disk. As the suspension lift tab slides along the ramp, the resistance of the circuit changes. By measuring multiple positions at multiple times, a head velocity can be determined. This description is not intended to be a complete description of, or limit the scope of, the invention. Other features, aspects, and objects of the invention can be obtained from a review of the specification, the figures, and the claims.Type: ApplicationFiled: January 22, 2003Publication date: July 22, 2004Inventors: Fernando A. Zayas, Richard M. Ehrlich
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Publication number: 20040140795Abstract: Ramp arrangements and methods in accordance with the present invention can provide the position or velocity of an actuator assembly in a rotating media data storage device while loading or unloading a head connected with the actuator assembly from a disk. One such arrangement comprises a conductive ramp electrically coupled to a conductive suspension lift tab such that a closed circuit is formed when the head is unloaded from the disk. As the suspension lift tab slides along the ramp, the resistance of the circuit changes. By measuring multiple positions at multiple times, a head velocity can be determined. This description is not intended to be a complete description of, or limit the scope of, the invention. Other features, aspects, and objects of the invention can be obtained from a review of the specification, the figures, and the claims.Type: ApplicationFiled: February 14, 2003Publication date: July 22, 2004Inventors: Fernando A. Zayas, Richard M. Ehrlich
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Patent number: 6765395Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 29, 2003Date of Patent: July 20, 2004Assignee: Bently Nevada, LLCInventor: Richard D. Slates
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Apparatus for determining a gap between a proximity probe component and a conductive target material
Patent number: 6756794Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 30, 2003Date of Patent: June 29, 2004Assignee: Bently Nevada, LLCInventor: Richard D. Slates -
Patent number: 6731110Abstract: A magneto-resistive device with built-in test structure. The magneto-resistive device includes a slider having first and second lower termination pads and first and second upper termination pads. A first conductive trace element electrically couples the first lower termination pad to the first upper termination pad and a second conductive trace element electrically couples the second lower termination pad to said second upper termination pad. The magneto-resistive device also includes a magneto-resistive transducer deposited on the slider and the resistance of the magneto-resistive transducer is obtained by passing an electrical current between the first and second lower termination pads and measuring a voltage across the first and second upper termination pads.Type: GrantFiled: May 28, 2002Date of Patent: May 4, 2004Assignee: International Business Machines CorporationInventor: Mark A. Church
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Patent number: 6724201Abstract: A resistance-type liquid level measuring apparatus which suppresses a detection voltage error due to silver sulfide within a permissible range in practical use and enables measurement indication with accuracy, and comprises a resistance-type sensor including a float 9 floating according to a liquid level, an insulating substrate 6 having a plurality of conductor electrodes 4 connected with a resistor 5, and a movable contact interlocked with a movement of the float 9 to come in contact with the conductor electrodes 4 on the insulating substrate 6, in which a material containing silver is used as a material of the conductor electrodes 4 or the movable contact, a voltage dividing resistance 11 is connected with a power source BA in series with the resistor 5, and a voltage of a connection point between the voltage dividing resistance 11 and the resistor 5 is outputted as a signal corresponding to the liquid level, and resistance values of the voltage dividing resistance 11 and the resistor 5 are set so that a vType: GrantFiled: March 27, 2002Date of Patent: April 20, 2004Assignee: Nippon Seiki Co., Ltd.Inventors: Koichi Sato, Kiyoshi Enomoto
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System and method for measuring the thickness or temperature of a circuit in a printed circuit board
Patent number: 6714026Abstract: System for measuring a thickness of a circuit component on a printed circuit board (PCB). The system includes a first circuit, a power plane, a power strip, a calibration strip, a temperature sensor, and a second circuit. The power plane is coupled to the first circuit. The power strip is for providing power to the power plane and is disposed in the PCB connected to the power plane. The power strip has at least two vias. The calibration strip has a predetermined width and is disposed in said PCB. The calibration strip has at least two vias for measuring a voltage drop. The temperature sensor is coupled to the calibration strip and configured to measuring a temperature of the calibration strip. The second circuit is coupled to the temperature sensor and configured to determine the thickness of the calibration strip based on at least the temperature of the calibration strip.Type: GrantFiled: February 27, 2002Date of Patent: March 30, 2004Assignee: Broadcom CorporationInventor: James M. Kronrod -
Publication number: 20040055360Abstract: A slider assembly for use in a linear or rotary position sensor having a board that includes at least one ink strip. The slider assembly includes a housing for attachment to an object whose position is being detected. The housing includes standoffs for contacting portions of the board which are adjacent the ink strip. An arm extends the housing, wherein the arm includes finger elements which contact the ink strip. The assembly further includes a spring for biasing the standoffs against the board to then bias the finger elements against the ink strip so as to provide a predetermined contact pressure.Type: ApplicationFiled: September 20, 2002Publication date: March 25, 2004Inventors: Russell Miles Modien, Kenneth Peter Nydam
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Patent number: 6677766Abstract: A method for measuring the step height of a STI structure is described. The method involves measuring the change in resistance of a polysilicon structure as the step height changes. The resistance of the polysilicon structure is measured by applying a voltage and measuring the resulting current.Type: GrantFiled: October 26, 2001Date of Patent: January 13, 2004
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Publication number: 20040002792Abstract: An lighting energy management system and method for controlling lighting fixtures in a building, uses lighting fixtures, photo and occupancy sensors, personal lighting commands and an energy control unit. The energy control unit receives information from the photo and occupancy sensors and the personal controller and determines an optimal brightness command for each lighting fixture using a coordinated system of zone and fixture objects. Each zone object is associated with a building zone and each fixture object is associated with a light fixture. Each zone object ensures that lighting fixture lighting level is adjusted when a physical zone is unoccupied. Each fixture object uses sensors and personal inputs to determine a desired brightness level and uses a load shedding and daylight compensation to determine a daylight adjusted brightness level. The energy control unit determines an optimal brightness command based on these levels to minimize the energy required by the lighting fixtures.Type: ApplicationFiled: April 30, 2003Publication date: January 1, 2004Applicant: Encelium Technologies Inc.Inventor: Marc O. Hoffknecht
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Publication number: 20030197516Abstract: A slider assembly for use in a linear or rotary position sensor having a board that includes ink strips. The slider assembly includes a base element having a plunger for attachment to an object whose position is being detected. Finger elements extend from the base element, wherein the finger elements contact the ink strips and are biased against the ink strips. A spring device having first and second spring elements is also included, wherein the first and second spring elements contact portions of the board that do not include the ink strips. The contact portions are biased against the board to reduce relative motion between the finger elements and the ink strips.Type: ApplicationFiled: September 20, 2002Publication date: October 23, 2003Inventors: Don Bird, Russell Miles Modien, Kenneth Peter Nydam
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Patent number: 6608491Abstract: A monitoring system for the affirmative measurement of feed levels in a bin includes a vertically disposed series of pressure sensors carried on a flexible detector strap releasably mounted at the center of the feed bin. The sensors include radially projecting blades that deflect and actuate in response to the downward flow of material being discharged. The signals from the sensors are routed to a local monitoring site permitting on-site determination of fill level. The signals from plural bins may also be routed to a central monitoring site. The local monitoring site is preferably provided with a programmable logic controller for periodically recording the level of the feed bin. The fill data is remotely retrievable for use in determining resupply needs. The system may also beneficially incorporate a modem communications link with a remote service monitoring site.Type: GrantFiled: March 4, 2002Date of Patent: August 19, 2003Inventor: Robert James Salmon, Jr.
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Patent number: 6597186Abstract: A method is provided for creating a spectral EM frequency to calculate the thickness of a material with unknown permeability and conductivity using metallic transparencies. The method comprises the steps of testing empirically to approximate the conductivity, testing empirically to approximate the permeability, creating a first set of electromagnetic waves adjacent to the material to be measured of a relatively low frequency, impinging the first set of electromagnetic waves on the material for saturating the material, creating a second set of electromagnetic waves having specific constant amplitude of a higher frequency than the first set of electromagnetic waves, the second set of electromagnetic waves for engaging the material and generating a sensing signal having modified characteristics, and receiving the sensing signal through the saturated material such that the modified characteristics of the sensing signal are processed to determine the thickness of the material.Type: GrantFiled: December 11, 2000Date of Patent: July 22, 2003Assignee: EM-Tech Sensors LLCInventor: Bijan K. Amini
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Patent number: 6593729Abstract: The invention comprises a fixed platform (1) and a displaceable platform (2) that are coupled by six tension springs (3) and an elastic spacer member (6). The spacer member forms with each platform, for instance, a ball-and-socket joint, such that the platforms can be displaced in a total of five to six degrees of freedom in respect to each other. The displacement is detected by measurements at the tension springs (3) or at the spacing member (6). This is preferably done by measuring the inductivity of the tension springs (3), thereby making it possible to easily determine the relative position of the platforms.Type: GrantFiled: July 26, 2001Date of Patent: July 15, 2003Assignee: Sundin GmbHInventor: Martin Sundin
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Publication number: 20030117154Abstract: Using an array of electrically isolated electrode pairs in combination with a specially configured processor, e.g., a personal computer, continuous real-time acquisition, processing, mapping and visualization of an object's interaction with its environment are provided. In a specific application, washover data are collected on salient electrical characteristics of seawater accumulating between electrodes of an electrode pair, one of which may be a common ground plane. For example, in one embodiment, the resistance of seawater is measured dynamically at each electrode pair. These data are then processed using specialized software to yield representation of the dynamics of selected washover events on a surface of interest. Described systems specifically provide real-time spatial and temporal representations of interaction, including two and three-dimensional visualization of the interaction, e.g., washover, as well as recording selected data for future use.Type: ApplicationFiled: December 13, 2002Publication date: June 26, 2003Inventors: Norbert E. Yankielun, James H. Clark
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Publication number: 20030107386Abstract: This invention relates to an apparatus for, and method of, making electrical measurements on objects, in particular cells, liposomes or similar small objects, in a medium. More particularly the invention relates to an apparatus for, and method of, making electrophysiological measurements on cells, liposomes or similar small objects, in a medium.Type: ApplicationFiled: October 1, 2002Publication date: June 12, 2003Inventors: John Dodgson, Lars Thomsen
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Patent number: 6529014Abstract: The subject of the invention is a coating thickness gauge with at least one measuring probe (14) which has at least one sensor (15, 15′) as well as a device for the zero adjustment and/or calibration. The coating thickness device (10) is equipped with means to automatically activate zero adjustment and/or calibration when an interaction especially a contact or a relative movement between a sensor (15, 15′) and a reference plate (11, 11′).Type: GrantFiled: April 19, 2000Date of Patent: March 4, 2003Assignee: Automation Hans Nix GmbHInventor: Norbert Nix
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Patent number: 6525548Abstract: The present invention provides a check pattern for evaluating the result of via openings during fabrication of a semiconductor device. The check pattern uses a Wheatstone bridge circuit so as to eliminate any influence of variation of wiring resistance and/or contact resistance. In the bridge circuit, four terminals are provided, namely first, second, third and fourth terminals. Each of four sides of the bridge circuit is defined by connecting an upper conductor layer including one terminal, a sub-group of via openings belonging to one group, a lower conductor layer, the other sub-group of via openings belonging to the same group, and an upper conductor layer including another terminal.Type: GrantFiled: November 10, 2000Date of Patent: February 25, 2003Assignee: NEC CorporationInventor: Nobuya Nishio
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Publication number: 20030020496Abstract: The invention concerns a play measuring sensor by multiple depth abrasion comprising a probe (7) capable of being mounted on a housing (5) enclosing a gas turbine engine blade rim (2), made of a material capable of being abraded by the tops (3) of the blades (2). The probe (7) comprises a printed circuit having a plurality of U-shaped electric systems whereof the bases (22a to 22e) are arranged in the end of the probe (7) facing the blades (2) and located at different depths (3a to 3e) relative to a reference level defining the inner wall (4) of the housing (5). The sensor is connected to means identifying the intact circuits and the electric circuits cut by abrasion.Type: ApplicationFiled: August 1, 2002Publication date: January 30, 2003Inventors: Jean-Louis Eyraud, Franck Patrone
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Patent number: 6504386Abstract: The present invention includes capacitive film thickness measurement devices and measurement systems used in machines or instruments. A capacitance measurement device and technique useful in determining lubricant film thickness on substrates such as magnetic thin-film rigid disks. Using the present invention, variations in lubricant thickness on the Angstrom scale or less may be measured quickly and nondestructively.Type: GrantFiled: October 21, 1999Date of Patent: January 7, 2003Assignee: The Ohio State UniversityInventors: Bharat Bhushan, Christopher D. Hahm
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System and method for measuring the thickness or temperature of a circuit in a printed circuit board
Publication number: 20030001593Abstract: System for measuring a thickness of a circuit component on a printed circuit board (PCB). The system includes a first circuit, a power plane, a power strip, a calibration strip, a temperature sensor, and a second circuit. The power plane is coupled to the first circuit. The power strip is for providing power to the power plane and is disposed in the PCB connected to the power plane. The power strip has at least two vias. The calibration strip has a predetermined width and is disposed in said PCB. The calibration strip has at least two vias for measuring a voltage drop. The temperature sensor is coupled to the calibration strip and configured to measuring a temperature of the calibration strip. The second circuit is coupled to the temperature sensor and configured to determine the thickness of the calibration strip based on at least the temperature of the calibration strip.Type: ApplicationFiled: February 27, 2002Publication date: January 2, 2003Applicant: Broadcom CorporationInventor: James M. Kronrod -
Publication number: 20030001592Abstract: A position sensor comprises a resistive element positionable on a first surface. A pair of leads are on the resistive element, the pair of leads adapted to supply a first voltage, such as by being grounded. An intermediate lead is positioned on the resistive element between the pair of leads, the intermediate lead being adapted to provide a second voltage. A contact element is positionable on a second surface, the contact element adapted to contact at least a portion of the resistive element to detect a voltage at a contact position, the detected voltage being related to the position or movement of the second surface relative to the first surface. In another version, a position sensor comprises a resistive element comprising first and second resistive strips. A plurality of leads are positioned on each resistive strip to provide a voltage to each resistive strip.Type: ApplicationFiled: June 27, 2001Publication date: January 2, 2003Applicant: Virtual Technologies, Inc.Inventors: Allen R. Boronkay, Bruce M. Schena, Christopher J. Hasser
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Patent number: 6498500Abstract: An apparatus and method for determining a position and/or orientation of a conductor disposed in a conductive fluid. A plurality of electrodes disposed about the conductor and preferably being in contact with the conductive fluid are used to provide an electrical path between each electrode and the conductor. In one embodiment, resistances between each electrode and conductor are determined through use of a signal processing circuit. In another embodiment, capacitances between each electrode and the conductor are determined using a similar signal processing circuit. Once the resistances or capacitances are determined, the position of the conductor can be determined based on these values in combination with parameters relating to the configuration of the electrodes and conductor, as well as characteristics of the conductive fluid. In one implementation, the invention may be used in free space optical communication systems, whereby the position of the end portion of the fiber optic cable can be determined.Type: GrantFiled: March 13, 2001Date of Patent: December 24, 2002Assignee: Terabeam CorporationInventor: Eric Lawrence Upton
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Publication number: 20020149380Abstract: There is provided a resistance-type liquid level measuring apparatus which suppresses a detection voltage error due to silver sulfide within a permissible range in practical use and enables measurement indication with accuracy, and comprises a resistance-type sensor including a float 9 floating according to a liquid level, an insulating substrate 6 having a plurality of conductor electrodes 4 connected with a resistor 5, and a movable contact interlocked with a movement of the float 9 to come in contact with the conductor electrodes 4 on the insulating substrate 6, in which a material containing silver is used as a material of the conductor electrodes 4 or the movable contact, a voltage dividing resistance 11 is connected with a power source BA in series with the resistor 5, and a voltage of a connection point between the voltage dividing resistance 11 and the resistor 5 is outputted as a signal corresponding to the liquid level, and resistance values of the voltage dividing resistance 11 and the resistor 5 aType: ApplicationFiled: March 27, 2002Publication date: October 17, 2002Inventors: Koichi Sato, Kiyoshi Enomoto
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Patent number: 6429667Abstract: A monitor for electrically testing energy beam dose or focus of a layer formed on a substrate by lithographic processing. The monitor comprises a substrate having in a lithographically formed layer an array of electrically conductive elements comprising a plurality of spaced, substantially parallel elements having a length and a width, with the individual elements being electrically connected, and the lengths of the elements being sensitive to dose and focus of an energy beam in lithographically forming the layer. The monitor further includes at least one pad electrically connected to the array to apply current through the array elements. Upon applying a voltage across the array elements, the suitability of dose or focus of the lithographically formed layer may be determined by the resistance of the array. Preferably, ends of the individual elements are aligned along essentially straight lines to form an array edge.Type: GrantFiled: June 19, 2000Date of Patent: August 6, 2002Assignee: International Business Machines CorporationInventors: Christopher P. Ausschnitt, Christopher E. Obszarny
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Patent number: 6429668Abstract: A switching element of foil construction is presented, with a triggering layer of first resistive material applied to a first carrier-foil and a sensor layer of a second resistive material applied to a second carrier-foil. The two carrier-foils are arranged a certain distance from each other by means of spacers, in such a way that the triggering layer and the sensor layer are opposite each other and, when the switching element is not operated, are not in contact with each other, whereas, when the switching element is triggered, the triggering layer and the sensor layer are initially in contact with each other at a first point of their surface, and the area of contact increases as the pressure on the switching element is increased.Type: GrantFiled: July 21, 2000Date of Patent: August 6, 2002Assignee: I.E.E. International Electronics & Engineering S.A.R.L.Inventors: Karl Billen, Laurent Federspiel, Edgard Theiss
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Patent number: 6414584Abstract: An electrical brush wiper for use in a position sensor to contact an electrically resistive surface. The wiper has a metallic beam having a channel. The channel is formed from a pair of parallel extending flanges. One of the flanges is attached to the beam. Carbon fibers are secured within the channel between the flanges. The flanges have several tabs for securing the fibers in the channel. The tabs can be welded to the flanges.Type: GrantFiled: September 24, 1999Date of Patent: July 2, 2002Assignee: CTS CorporationInventors: Shengli Liu, John Zdanys, Norman C. Weingart
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Publication number: 20020070735Abstract: A displacement detecting device includes a power supply line made of a conductor on a substrate, an earth line made of a conductor on the substrate, a plurality of output lines made of a conductor on the substrate, a resistance formed between the power supply line and the earth line on the substrate, and a brush sliding on the resistance and at least one of the output lines electrically connecting between the resistance and at least one of the output lines, the displacement detecting device generating the output signal from the output lines based on the position of the brush, wherein one of the power supply line and the earth line is disposed between the output linesType: ApplicationFiled: November 19, 2001Publication date: June 13, 2002Inventors: Yuji Hiraiwa, Keiji Yasuda, Kouji Akashi
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Publication number: 20020060575Abstract: A method for measuring the step height of a STI structure is described. The method involves measuring the change in resistance of a polysilicon structure as the step height changes. The resistance of the polysilicon structure is measured by applying a voltage and measuring the resulting current.Type: ApplicationFiled: October 26, 2001Publication date: May 23, 2002
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Patent number: 6384611Abstract: An ice detector includes a pair of electrodes connected by a pair of leads to a control unit which measures the admittance between leads to thereby sense and detect the presence of ice and other contaminants formed on top thereof utilizing a detection circuit. The electrodes are integrated into patch which can be placed at different locations on an aircraft.Type: GrantFiled: November 17, 1997Date of Patent: May 7, 2002Assignee: The B. F. Goodrich CompanyInventors: Randall W. Wallace, Allen D. Reich, David B. Sweet, Richard L. Rauckhorst, III, Michael J. Terry, Marc E. Holyfield
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Patent number: 6329812Abstract: The invention comprises a fixed platform (1) and a displaceable platform (2) that are coupled by six tension springs (3) and an elastic spacing element (6), which forms with each platform, for instance, a ball-and-socket joint, so that the platforms can be displaced in a total of five to six degrees of freedom with respect to each other. Displacement is detected by measuring at the tension springs (3) or at the spacing element (6). This is preferably done by measuring the inductivity of the tension springs (3), thereby making it possible to easily determine the relative position of the platforms.Type: GrantFiled: July 6, 1999Date of Patent: December 11, 2001Assignee: Sundin GmbHInventor: Martin Sundin
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Patent number: 6277438Abstract: The invention involves a method for locating the probe of a scanning tunneling micrograph a predetermined distance from its conducting surface, and specifically the deposition of a monolayer of fullerene C60 onto the conducting plate. The Fullerene C60 molecule is approximately spherical, and a monolayer of fullerene has a thickness of one nanometer. By providing a monolayer of fullerene on the conducting surface and locating the probe on the surface of the monolayer, a distance of one nanometer can be established between the probe tip and the conducting surface.Type: GrantFiled: May 3, 1999Date of Patent: August 21, 2001Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventor: John D. Olivas
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Patent number: 6218847Abstract: A test pattern for use in measuring thickness of insulating layer comprising a wiring pattern provided in an insulating layer and a dummy pattern provided in the insulating layer. The wiring pattern has a electrical resistant value depending on the thickness of the insulating layer. The dummy pattern is provided so as to be adjacent to the wiring layer. The dummy pattern allows the thickness of the insulating layer thereon to be directly measured. By using the test pattern, characteristic chart showing a relationship between the electrical resistance value and the thickness of the insulating layer.Type: GrantFiled: November 25, 1997Date of Patent: April 17, 2001Assignee: Oki Electric Industry Co., Ltd.Inventor: Kinichi Matsushita