To Determine Dimension (e.g., Distance Or Thickness) Patents (Class 324/699)
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Patent number: 6067025Abstract: An apparatus and method for controlling the height of packaging above an integrated circuit package (30) comprising, a substrate (12), a silicon chip (16) and a signal wire (20), one or more height detection wires (32) extending above the top surface (26) of the silicon chip (16) and the signal wire (20) and a detector electrically connected to the height detection wire (32), wherein the height detection wire (32) and the detector form an electric circuit that is affected when a polisher of encapsulant (40) is in proximity to the height detection wire (32), is disclosed.Type: GrantFiled: December 3, 1997Date of Patent: May 23, 2000Assignee: STMicroelectronics, Inc.Inventors: Anthony M. Chiu, Alan H. Kramer
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Patent number: 6034531Abstract: The method of monitoring the wear of at least one sliding electrical contact of a brush, sliding over a track which can move with respect to the brush, comprises the measurement of the electrical resistance of this contact, the delivery of an image signal corresponding to this resistance, the following of its variations, the construction of a reference signal indicative of a state of wear of the contact, the comparison of the image signal with the reference signal and the derivation of a signal, resulting from this comparison, corresponding to the state of wear of the contact. The resistance is measured by the ratio of the variations in the voltage across the terminals of the contact to the variations in the current flowing through this contact.Type: GrantFiled: July 14, 1997Date of Patent: March 7, 2000Assignee: EurocopterInventors: Jean-Paul Senglat, Daniel De Frutos
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Patent number: 5864241Abstract: A wear indicator is incorporated on the slider of a magnetic transducer in a magnetic storage system for in operation on-the-fly detection of the state of wear of the transducer. The wear indicator involves monitoring a change in an electrical property of an electrical circuit structure as the transducer is worn by abrasion against the magnetic disk medium. In one aspect of the present invention, the resistance (or conductance) of the circuit is monitored during disk drive operations. Part of the resistance (conductance) circuit structure is mounted on the slider and it is physically worn along with the wearing of the transducer. A predetermined change in resistance (or conductance) gives an indication of the predetermined wear limit at which the transducer should be replaced prior to its actual failure. In a specific embodiment, the circuit is configured such that an open circuit (infinite resistance or zero conductance) indicates that the wear limit has been reached.Type: GrantFiled: August 8, 1996Date of Patent: January 26, 1999Assignee: International Business Machines CorporationInventors: Erhard Theodor Schreck, Clinton David Snyder, Mike Suk
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Patent number: 5814999Abstract: A method and apparatus for measuring displacement and force transferred through an elastomeric member, such as a suspension bushing (17) as used in a suspension of a motor vehicle, comprises an inner cylinder (26) fixedly connected to a suspension member (23), and an outer cylinder (28) fixedly connected to a chassis member (29). A magnetorheological elastomer (32), having particles embedded therein, is interposed between the inner (26) and outer (28) cylinders, and an electrode (44) is disposed about the inner cylinder (26). When the electrode (44) is energized by electrical current provided from module (18), a preselected electrical state resulting from the dielectric properties of the magnetorheological elastomer (32) varies in a predetermined manner in response to changes in displacement of the elastomeric material (32).Type: GrantFiled: May 27, 1997Date of Patent: September 29, 1998Assignee: Ford Global Technologies, Inc.Inventors: Larry Dean Elie, John Matthew Ginder, Joseph Steven Mark, Mark Edward Nichols
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Patent number: 5751156Abstract: A micromechanical sensor in which the impedance of a gap in a conductor, under tunnelling current conditions, is sensed to provide an indication of deflection in the conductor. This provides a new way to sense acceleration, strain, and other parameters which can be translated into a deflection.Type: GrantFiled: June 7, 1995Date of Patent: May 12, 1998Assignee: Yale UniversityInventors: Christiaan Muller, Chong Wu Zhou, Mark A. Reed
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Patent number: 5746905Abstract: The organic coating deposited on a metallic substrate is quantitatively euated by measurement of electrical signals through an electrochemical cell having an electrode separated from the deposited coating by a porous pad within which a liquid medium is absorbed. Quality determining parameters of the coating are rapidly calculated through a data processor to which electrical current and phase shift measurements are fed together with data from the electrochemical cell. The method may be used to evaluate the quality of the coating on the steel hull of a marine vessel exposed to seawater.Type: GrantFiled: February 14, 1996Date of Patent: May 5, 1998Assignee: The United States of America as represented by the Secretary of the NavyInventor: John N. Murray
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Patent number: 5708370Abstract: A depth sensor for detecting a depth, when grinding the magnetic head in order to set the depth of the magnetic head to a predetermined length including an analog sensor having a resistor whose resistance changed continuously by being ground together with the magnetic head when grinding the magnetic head in a depth direction and for detecting the depth from said continuously changed resistance, and a digital sensor having a resistor whose resistance is changed non-continuously by being ground together with the magnetic head when grinding the magnetic head in the depth direction and for detecting the depth from the non-continuously changed resistance.Type: GrantFiled: April 26, 1996Date of Patent: January 13, 1998Assignee: Sony CorporationInventors: Takuji Shibata, Takashi Watanabe
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Patent number: 5699282Abstract: Imaging instruments for inspecting products, such as semiconductor chips, e calibrated by providing a reference test structure having features which can be located by electrical measurements not subject to tool-induced shift and wafer-induced shift experienced by the imaging instrument, and by the imaging instrument. The reference test structure is first qualified using electrical measurements, and is then used to calibrate the imaging instrument. The electrical measurements are made by forcing a current between a plurality of spaced reference features and a pair of underlying conductors. Conductive connectors formed in vias in an insulating layer overlying the pair of conductors and individually connected to a respective conductive element formed on the insulating layer are each spaced at progressively greater distances relative to the centerline of the space between the pair of conductors, such that a null-overlay element may be identified.Type: GrantFiled: July 8, 1996Date of Patent: December 16, 1997Assignee: The United States of America as represented by the Secretary of CommerceInventors: Richard A. Allen, Michael W. Cresswell
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Patent number: 5657552Abstract: A map or globe is provided with a transparent thin covering capable of conducting electricity. The transparent thin covering envelopes the globe or overlies the map. An electrical resistance measuring means would be employed to determine a measure of electrical resistance between any two points on the map or globe. The electrical resistance measuring means would include a first probe and a second probe. The first probe would be placed on a first location on the map or globe and the second probe would be placed on a second location on the map or globe. A measure of electrical resistance will be generated by the electrical resistance measuring means reflecting the resistance of the conductive thin covering between the first location and the second location. This electrical resistance is proportionally related to the distance separating the two points on the map or globe.Type: GrantFiled: November 9, 1995Date of Patent: August 19, 1997Inventors: Rollin Reineck, Jerome M. Comcowich
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Patent number: 5623200Abstract: Particle measuring apparatus 1 comprising slide plate 3 set between tanks 2a and 2b and having through-holes 8 to 11 passing through slide plate 3 and a pair of electrodes 4a and 4b, wherein through-holes 8 to 11 on slide plate 3 are formed by a group of through-holes with different diameters. When one of the through-holes 8 to 11 is brought to a position corresponding to connective holes 2c and 2d by driving unit 7, particle distribution is measured and analyzed in accordance with the electrical impedance when a sample suspension passes through the through-hole.Type: GrantFiled: May 8, 1995Date of Patent: April 22, 1997Assignee: Toa Medical Electronics Co., Ltd.Inventor: Shinichi Ogino
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Patent number: 5602488Abstract: Methods of measuring, adjusting and uniformalizing a sectional area ratio of a metal-covered electric wire, a method of cleaning an electric wire, a method of manufacturing a metal-covered electric wire, an apparatus for measuring a sectional area ratio of a metal-covered electric wire, and an apparatus for electropolishing a metal-covered electric wire.Electric resistance values of first and second materials are previously stored respectively so that a sectional area ratio of a metal-covered electric wire is calculated on the basis of the as-stored values and an actually measured electric resistance value of the metal-covered electric wire. Measurement and uniformalization of a sectional area ratio of a metal-covered electric wire and cleaning of an electric wire are carried out by dissolving surface layer parts of the electric wires by electropolishing.Type: GrantFiled: January 22, 1996Date of Patent: February 11, 1997Assignee: Sumitomo Electric Industries, Ltd.Inventors: Akira Mikumo, Kenichi Takahashi, Masanobu Koganeya
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Patent number: 5602486Abstract: An apparatus and method for sensing impedances of materials placed in contact therewith. The invention comprises a plurality of drive electrodes and one or more sense electrodes. Both rotating electric fields and differently shaped electric fields are provided for, as are analysis of structure and composition at different orientations and depths.Type: GrantFiled: November 10, 1994Date of Patent: February 11, 1997Assignee: Sandia CorporationInventor: James L. Novak
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Patent number: 5559429Abstract: A system for lapping a magnetoresistive (MR) sensor on a slider to a proper height is disclosed. The system comprises simultaneously lapping the MR lap monitor and the MR sensor positioned on the slider until a resistance of a variable resistor located within the MR lap monitor is approximately equal to a resistance of a target resistor located within the MR lap monitor. During the lapping process, a reference resistor located within the lap monitor is compared to both the variable and target resistors to prevent a lapping failure. In one preferred embodiment, the reference, target, and variable resistors are formed from a ferromagnetic metal alloy. The MR lap monitor and the MR sensor are lapped until a height of the ferromagnetic metal alloy forming the variable resistor is approximately equal to a height of the ferromagnetic metal alloy forming the target resistor.Type: GrantFiled: April 13, 1995Date of Patent: September 24, 1996Assignee: Seagate Technology, Inc.Inventors: Gregory S. Mowry, Phillip E. Gorka, Brian D. Strayer, Alan G. Kracke
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Patent number: 5552718Abstract: This describes a test pattern and method for measuring dimensional characteristics of features formed on a surface. This is realized and provided by forming a space, defined by the feature, in intersecting relationship with a pair of conductive lines of a test pattern configuration such that the lines are altered at the intersection with the space in accordance with the dimensions of that space, measuring the resistance of at least one of the lines in a region remote from the intersection with the space and the resistance of each line in the region of its intersection with the space, and comparing the resistance of the remote region with the resistances for the region of each of the lines where they intersect the space to thereby establish the position of, and at least one dimension of that space.Type: GrantFiled: January 4, 1995Date of Patent: September 3, 1996Assignee: International Business Machines Corp.Inventors: James A. Bruce, Michael S. Hibbs, Robert K. Leidy
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Patent number: 5499807Abstract: An automatic paper feeding apparatus is designed to separate and feed originals by means of a separation pad and a feeding roller. A pressure sensitive conductive rubber is used for the separation pad to convert a change in thickness of an original into an electrical signal, thereby detecting a conveyed state, e.g., a multiple paper-conveying error, of the original.Type: GrantFiled: March 18, 1994Date of Patent: March 19, 1996Assignee: Kabushiki Kaisha ToshibaInventors: Hajime Nakamura, Jun Sakakibara
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Patent number: 5485401Abstract: The present invention resides in a probe excitation and testing ("PET") system that can apply either a normal excitation or a "small" bias test excitation to overfill protection probes mounted within storage and transport tanks used to store, e.g., flammable fluids. The PET system applies the normal excitation for normal operation of the probes to provide overfill protection, and applies a "small" bias test excitation to the probes for performing diagnostic tests, including anti-cheating. The PET system can also perform a probe signature validation test under normal excitation to ascertain whether the probes are responding thereto in accordance with specifications relating to characteristic parameters of the probes' output waveforms, e.g., duty cycle, magnitude, and period.Type: GrantFiled: June 14, 1993Date of Patent: January 16, 1996Assignee: Scully Signal CompanyInventor: Gary R. Cadman
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Patent number: 5458324Abstract: It is an object of this invention to allow detection of multiple paper-conveying of an original sheet in image reading or forming operation and facilitate a recovery operation. An automatic original feeding apparatus of this invention uses pressure sensitive conductive rubber in a feeding roller, and changes in length and thickness of a sheet are changed into electrical signals, so that the conveyed state such as multiple paper-conveying of the sheet can be detected.Type: GrantFiled: March 21, 1994Date of Patent: October 17, 1995Assignee: Kabushiki Kaisha ToshibaInventors: Hajime Nakamura, Jun Sakakibara
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Patent number: 5243298Abstract: A corrosion monitoring system having one or more anode elements made of a suitable anodic material that corrodes preferentially with respect to the structure being protected. The resistance of each anode wire is continuously or periodically monitored. The presence of moisture between an anode and the structure being monitored creates a current path and causes galvanic corrosion. The anode wire will begin to corrode, but the structural members will remain uncorroded until the anode has been completely consumed. The monitoring system uses the rate of change in anode resistance to extrapolate a prediction of the time remaining before the structure being protected begins to corrode.Type: GrantFiled: November 4, 1991Date of Patent: September 7, 1993Assignee: Teledyne Ryan Aeronautical, Division of Teledyne Industries, Inc.Inventor: Jack A. Runner
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Patent number: 5227731Abstract: A crack length sensor is fabricated in a rectangular or other geometrical form from a conductive powder impregnated polymer material. The long edges of the sensor are silver painted on both sides and the sensor is then bonded to a test specimen via an adhesive having sufficient thickness to also serve as an insulator. A lead wire is connected to each of the two outwardly facing silver painted edges. The resistance across the sensor changes continuously as a function of the crack length in the specimen and sensor.Type: GrantFiled: May 24, 1991Date of Patent: July 13, 1993Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: Ramamurthy Prabhakaran, Osvaldo F. Lopez
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Patent number: 5225785Abstract: A rotatable capacitance sensor preferably constructed of a generally cylindrical body mounted on bearings to a carriage assembly. The body has a number of parallel, spaced apart conductive plates having edges extending through the exterior body surface, and alternate ones of the plates are connected via a bearing to a conductor in one part of the carriage assembly, and the remaining ones of the plates are connected via a bearing to a second conductor in another part of the carriage assembly.Type: GrantFiled: November 12, 1992Date of Patent: July 6, 1993Assignee: Modern Controls, Inc.Inventors: Daniel W. Mayer, Roger C. Oestreich
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Patent number: 5223797Abstract: A rotatable capacitance sensor for detecting film thickness of a moving film web, the rotatable sensor having a capacitive element arranged to contact the moving web film, the capacitive element electrically connected to projecting shaft ends of the rotatable sensor, resilient conductors urged against the respective shaft ends, and an electrical shield overlaying the resilient conductors and the rotatable shaft, to electrically isolate shaft wobble from the surrounding housing.Type: GrantFiled: October 2, 1992Date of Patent: June 29, 1993Assignee: Modern Controls, Inc.Inventors: Daniel W. Mayer, Roger C. Oestreich
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Patent number: 5057781Abstract: A method of for manufacturing a coated optical fiber includes depositing a conductive coating on the optical fiber and measuring a value of conductance of that coating. Featured within the manufacturing method is a method for measuring the thickness of the conductive coating on an insulator, e.g., carbon on an optical fiber, including the following steps. An electromagnetic field is established by an input signal. The conductively coated insulator is moved through the energized electromagnetic field. The conductive coating on the insulator is oriented with respect to the electric field so that their interaction increases transmission loss from input to output. An output signal is extracted from the electromagnetic field. From changes in the output signal with respect to a predetermined standard, or reference, the conductance and the thickness of the conductive coating are determined.Type: GrantFiled: July 31, 1989Date of Patent: October 15, 1991Assignee: AT&T Bell LaboratoriesInventors: Robert M. Atkins, George E. Peterson, Raymond D. Tuminaro
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Patent number: 5032794Abstract: Changes in underwater sediment level in a marine environment are monitored electronically using a probe embedded in the sediment. The probe includes an electrical current source to generate an electric field extending across the sediment interface. Voltage measurements are taken at at least three sensors on the probe whose positions are known relative to the current source. The height of the sediment interface relative to the current source can then be calculated, and logged, and changes in sediment level can be monitored. The conductivities of the sediment and seawater can also be calculated by taking additional voltage measurements.Type: GrantFiled: May 7, 1990Date of Patent: July 16, 1991Assignees: James Cook University of Northern Queensland, Australian Institute of Marine ScienceInventors: Peter V. Ridd, John L. Nicol, Eric Wolanski
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Patent number: 4996493Abstract: Method and apparatus for the real time detection of the formation of ice on a surface in which a sensor having spaced electrodes along the surface is embedded in the surface for which detection is to be provided. Resistance between the electrodes is monitored and electrode temperature is monitored. When a sharp rise in resistance on the surface due to the presence of ice is detected at the same time that the surface temperature is at or below the freezing temperature of water, then a computer provides a signal to indicate the formation of ice.Type: GrantFiled: August 21, 1989Date of Patent: February 26, 1991Inventors: Seymour M. Monat, Robert A. Monat
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Patent number: 4980646Abstract: Disclosed is a container holding a partially conductive ionic fluid with a flexible tactile surface covering the fluid and sealing the container. Along the bottom of the container a series of parallel conductors are located with the farthest spaced apart conductors being connected to a voltage source. Measurements of changes in voltages between individual pairs of conductors will provide an indication of any localized deformation of the flexible tactile surface. Such a tactile sensor can be utilized in any device where an electrical output is desired which is indicative of the surface or surface characteristics of the object to be contacted.Type: GrantFiled: March 30, 1988Date of Patent: December 25, 1990Assignee: The Trustees of the University of PennsylvaniaInventor: Jay N. Zemel
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Patent number: 4978923Abstract: A method for measuring the width and profile of structures in a semiconductor wafer comprises the step of constructing test structures on the wafer shaped to function as moats for confining electrically conductive liquid. The moats have an elongated shape. By measuring the electrical resistance exhibited by the liquid within the moat, the dimensions of the moat and, thus, the other structures on the wafer can be measured. In an alternative embodiment, the conductive liquid is used to facilitate electrical contact to the various structures formed in the wafer.Type: GrantFiled: May 17, 1990Date of Patent: December 18, 1990Inventor: Ron Maltiel
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Patent number: 4956611Abstract: A method for measuring the width of structures in a semiconductor wafer comprises the step of constructing test structures on the wafer shaped to function as moats for confining electrically conductive liquid. The moats have an elongated shape. By measuring the electrical resistance exhibited by the liquid within the moat, the dimensions of the moat and, thus, the other structures on the wafer can be measured.Type: GrantFiled: April 26, 1989Date of Patent: September 11, 1990Inventor: Ron Maltiel
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Patent number: 4947132Abstract: The method is based on the exploitation of the "skin effect" occuring in any current-conducting material as a function of the current frequency going through said material. A transformer (5) is supplied from a generator (2) and an amplifier (4) to produce the current intended to supply the tube (T) and to measure the voltage at the terminals of a shunt (6). This voltage which is characteristical of the energization current is amplified by an amplifier (8) and brought to the reference input of a phase correlation amplifier (1). The resistive component of the signal on the tube is then measured by said amplifier (1) by just measuring the signal phase component.Type: GrantFiled: July 25, 1988Date of Patent: August 7, 1990Assignee: Battelle Memorial InstituteInventors: Alain Charoy, Jacques Vermot-Gaud, Jean-Louis Prost, Michel Kornmann, Dieter Gold
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Patent number: 4939469Abstract: A method for evaluating characteristics of a printed wiring board by measuring the alternating current impedance spectra of the printed wiring board conductor pattern. The method is useful in evaluating a number of different characteristics, such as moisture content, delamination, interlayer thickness and surface characteristics.Type: GrantFiled: August 1, 1988Date of Patent: July 3, 1990Assignee: Hughes Aircraft CompanyInventors: Frank A. Ludwig, John McHardy