Abstract: A testing apparatus and a method for testing a semiconductor devices array, which includes a plurality of rows and a plurality of columns, are provided. The testing apparatus includes a first testing circuit and a second testing circuit. The first testing circuit connects and transmits a clock signal, an input command signal and a data signal to at least one of the rows of the semiconductor devices array. The second testing circuit connects and transmits a selecting signal to at least one of the columns of the semiconductor devices array. Between two devices in a row, a difference in arrival times of the clock signal, a difference in arrival times of the input command signal, and a difference in arrival times of the data signal are equal.

Abstract: Some embodiments of the present invention describe an apparatus that includes an oscillator, a ramp generator, and an inverter. The apparatus includes an oscillator, an inverter, and a ramp generator. The oscillator is configured to generate a waveform comprising a low time and a high time. The inverter is configured to receive the waveform generated by the oscillator, and invert the waveform. The ramp generator configured to increase a gate control voltage of a transistor connected to a solar cell, and rapidly decrease the gate control voltage of the transistor. During the low time of the waveform, a measurement of a current and a voltage of the solar cell is performed as the current and voltage of the solar cell are transmitted through a first channel and to a second channel.

Abstract: A method for determining the parameters of a photovoltaic device having at least one multi-junction solar cell is provided. The solar cell includes at least two subcells layered on top of one another and connected electrically and optically in series, each having a p-conductive layer, an intrinsic layer, and an n-conductive layer. At least one reference cell is produced for each subcell. One subcell of each reference cell corresponds to one subcell of the at least one multi-junction solar cell. In contrast, the subcell of each reference cell has at least one layer which corresponds to the i-layer of the multi-junction solar cell, but which is converted into an electrically conductive layer by doping. The spectral sensitivity of the reference cells is measured. For determining the parameters of the solar cell, the reference cells and the solar cell are measured using a solar simulator calibrated to the reference cells.

Abstract: Embodiments of the present invention relate to a solar simulator module of a solar cell production line. In one embodiment the solar simulator receives a solar cell module in a horizontal position and reorients the module into a vertical position. A light source is oriented to emit a flash of light in a substantially horizontal orientation toward the vertically oriented solar cell module. In one embodiment, an automated labeling device affixes a label including the electrical characteristics measured onto a back surface of the solar cell module. In one embodiment, a plurality of solar cell modules are received and tested simultaneously.

Abstract: Method of diagnosis for a photovoltaic generator characterized in that it implements a step of observing the evolution of its voltage when it passes from a short-circuit mode of operation to an open-circuit mode or vice versa.

Abstract: A method and system for monitoring a photovoltaic module. The method includes initiating a monitoring process for a photovoltaic module at a predetermined time. The photovoltaic module is connected to at least another module in a photovoltaic string as a part of a photovoltaic array. Additionally, the method includes measuring one or more parameters of the photovoltaic module by a monitoring circuit. The one or more parameters include a module current flowing through the photovoltaic module, a module voltage across the photovoltaic module, and a module temperature of the photovoltaic module. Also, the method includes collecting one or more measurement results of the one or more parameters, transmitting the one or more collected results using one or more radio-frequency signals, and processing information associated with the one or more transmitted results.

Abstract: A photovoltaic (PV) monitoring system measures the health of PV installations by measuring, calculating, and reporting the passive (dark) and active (illuminated) electrical characteristics of the PV strings, substrings, and modules that comprise the installation.

Abstract: Methods for simultaneously making quantum efficiency measurements at multiple points in a photovoltaic cell are provided. A light beam (e.g,. monochromatic light) can be directed to a first beam splitter, where it is split into a first reflected portion and a first passthrough portion such that the first reflected portion is directed to a first point on the photovoltaic cell. The first reflected portion can then be chopped at a first frequency between the first beam splitter and the first point. The first passthrough portion of the light beam can be reflected at a second beam splitter to a second point on the photovoltaic cell. The second reflected portion can then be chopped at a second frequency between the second beam splitter and the second point. Finally, the quantum efficiency can be calculated at both the first point and the second point. Systems are also generally provided for simultaneously making quantum efficiency measurements at multiple points in a photovoltaic cell.

Abstract: An inspection method, including: measuring an impedance of a cell structure of an inspection object that includes one or a plurality of serially-connected cell structures each including a transparent electrode layer formed on a substrate, a porous semiconductor layer formed on the transparent electrode layer, a porous insulator layer formed on the porous semiconductor layer, and a counter electrode layer formed on the porous insulator layer; and judging a quality of the inspection object based on the measured impedance of the cell structure.

Abstract: A combiner that calculates energy produced by each panel feed during the daytime, and calculates a resistance value needed to calculate the energy by injecting a known current into each panel feed at nighttime and measuring the resulting voltage across a resistive element in each panel feed. A voltage tap across the protection device in each panel feed allows logic and control circuitry to measure the voltage across each protection device. At nighttime, a known current is injected into each panel feed and the voltage across each protection device is measured. Plugging the current and voltage into Ohm's Law, a resistance of each protection device is calculated, then that resistance value is used during the daytime to calculate energy produced by each string in real time and to monitor each string's performance. When an individual string's performance wanes, an alarm is indicated to help the operator troubleshoot which individual panel(s) within the string is responsible for that string's underperformance.

Abstract: An in-process measurement apparatus can be used to determine characteristics of a photovoltaic module. Capacitance measurements of the photovoltaic module are conducted before, during, or after execution of a high-potential leakage test, a performance test, or other tests of the module. The capacitance measurements are used to determine the characteristics of the photovoltaic module, including information regarding depletion width, doping density, film layer thickness, trap concentrations and absorber thickness. The apparatus can also be used to ensure that photovoltaic modules conform to product specifications.

Abstract: A method of processing of solar cells includes determining that a back-contact solar cell is defective. The back-contact solar cell includes a first plurality of interconnect pads at a first edge thereof, and a second plurality of interconnect pads at a second, opposed thereof, the first and second pluralities of interconnect pads having opposite operational charges. The back-contact solar cell is then diced to define at least first and second back-contact solar cell sections. The first back-contact solar cell section has at least two interconnect pads, of the plurality of interconnect pads, at respective opposed edges thereof.

Abstract: A solar battery panel inspection apparatus is an apparatus for inspecting a solar battery panel including a transparent insulating substrate having a main surface, and a transparent electrode layer, a semiconductor photoelectric conversion layer and a back electrode layer which are sequentially stacked and having an outer circumferential insulating region in which the main surface is exposed, to check the insulation performance of the outer circumferential insulating region.

Abstract: A Micro-Electro-Mechanical-Systems (MEMS) probe is fabricated on a substrate for use in a probe card. The probe has a bonding surface to be attached to an application platform of the probe card. The bonding surface is formed on a plane perpendicular to a surface of the substrate. An undercut is formed beneath the probe for detachment of the probe from the substrate.

Abstract: A solar cell characteristic measuring device measures the output characteristics of a solar cell while avoiding junction capacitance. The device provides a solar cell load circuit by connecting the solar cell with an electronic load device setting a load current or voltage variably, and a measurement circuit connecting voltage and current detectors with the load. An operation point control element divides the magnitude of the load, taken from the solar cell, of the electronic load device into a plurality ranging from states of opening to short-circuiting, while driving the load device in the load circuit periodically and intermittently, changing the load magnitude stepwise and controlling the operation point of the solar cell, and a processing element reading and processing the detected values of the voltage and current detectors at each drive period of the electronic load device and for the period of the stable output voltage of the solar cell.

Abstract: The present invention discloses a method for extracting of solar cell parameters. After illuminating the solar cell by different simulated solar luminosity with different illumination intensity, measured current and measured voltages of the solar cell are acquired and the series resistance of the solar cell is extracted based on the measured current and measured voltages. The root mean square error (RMSE) is used to determine the series resistance of the solar cell. Therefore, the parameters of the solar cell are extracted without presuming current-voltage functional form.

Abstract: A solar cell includes a semiconductor substrate and an antireflection layer arranged on the light incidence side on the front-side surface of a semiconductor substrate. The antireflection layer has a limit voltage of less than 10 volts, less than 5 volts, or less than 3 volts, along a layer thickness of the antireflection layer.

Abstract: Measuring current-voltage (I-V) characteristics of a solar cell using a lamp that emits light, a substrate that includes a plurality of solar cells, a positive electrode attached to the solar cells, and a negative electrode peripherally deposited around each of the solar cells and connected to a common ground, an articulation platform coupled to the substrate, a multi-probe switching matrix or a Z-stage device, a programmable switch box coupled to the multi-probe switching matrix or Z-stage device and selectively articulating the probes by raising the probes until in contact with at least one of the positive electrode and the negative electrode and lowering the probes until contact is lost with at least one of the positive electrode and the negative electrode, a source meter coupled to the programmable switch box and measuring the I-V characteristics of the substrate.

Abstract: A method of measuring the efficiency with which a solar cell converts incident photons into charge carriers, including the following steps: (a) illuminating the solar cell with a broadband light source; (b) illuminating the solar cell with the broadband light source of which the intensity of a selected range of wavelengths has been reduced; (c) determining the change in the number of photons incident on the cell and the change in the number of charge carriers produced by the cell between steps (a) and (b); and (d) using the changes determined in step (c) to calculate the said efficiency measure.

Abstract: A system for improving dynamic response in a power supply includes a mainframe module having a memory and a mainframe microprocessor, the mainframe processor configured to calculate a plurality of tables in which each table represents a current/voltage (I/V) characteristic curve for the power supply, at least two power supply modules coupled to the mainframe module, each power supply module having a random access memory element, the random access memory element configured to receive and store a first table and a second table, wherein the mainframe microprocessor transfers the first table to each power supply module, and wherein each power supply module executes a respective first table while the mainframe processor calculates the second table for each power supply module and while the mainframe processor transfers the second table to each power supply module.

Abstract: A measurement system having a light source, a holding device, and a measurement device. The light source includes a plurality of light emitting diodes (LEDs) configured to generate light beams with different wavelengths, and the emission spectrum of the light source complies with a predetermined standard. The holding device is configured to hold an object under test. The measurement device is configured to measure the electrical properties of the object under test after the object under test is illuminated by the light source.

Abstract: A method and an apparatus for carrying out the method are proposed for identifying defective photovoltaic modules. Two clamp-on ammeters are provided which are connected to a test data acquisition unit for simultaneous measurement of two DC currents. The position of the clamp-on ammeters at the time of the measurement is determined with a position registration means, and measured data and position data are transmitted via an antenna to a data processing center or recorded in a data memory element for further processing.

Abstract: The present invention relates to an apparatus and a method for inspecting quantum efficiency homogeneity of a solar cell using a spatial light modulating device. The apparatus includes a light emitting device configured to radiate predetermined light; a spatial light modulating device configured to change a light path of rays emitted from the light emitting device according to individual control of a plurality of pixels; a spatial light modulating device controller configured to individually control the states of the plurality of pixels; a solar cell which the rays passing through or reflected from the spatial light modulating device irradiate; and a calculation controller configured to calculate quantum efficiency of the solar cell based on a photocurrent signal generated from the solar cell.

Abstract: A method and a device for carrying out the method are disclosed in order to aid in the search for faulty photovoltaic modules. In a photovoltaic system comprising multiple PV units electrically connected in parallel, each PV unit is assigned its own fixed current sensor. Furthermore, each PV unit can be removed from the parallel circuit by a switching device.

Abstract: A back sheet comprises an interconnect circuit coupling a plurality of solar cell tiles. A tiled solar cell, comprising a solar cell and encapsulating and glass layers, is inserted into the solar cell tiles. Each solar cell is individually addressable through the use of the interconnect circuit. As such, each solar cell may be individually monitored through the utilization of the interconnect circuit of the back sheet.

Abstract: Provided is an inspecting apparatus for inspecting a photovoltaic devices by applying a current to the photovoltaic devices in a forward direction to make the photovoltaic devices emit EL light which is simple in structure and capable of shortening inspection time in inspecting a defect from a photographed image with a perfect resolution. The inspecting apparatus of the present invention includes a darkroom (110) provided with an upper surface (111) having an opening portion (112), a support means provided at the upper surface of the darkroom (110) to support the photovoltaic devices as an inspecting object (200) on the opening portion (112), a plurality of cameras (121, 122 and 123) disposed inside the darkroom (110) for photographing the inspecting object (200), and a moving means configured to move the cameras in the darkroom (110). The moving means includes an x-axial guiding portion (140), a motor (142) and a timing belt (144).

Abstract: A method for testing a photovoltaic panel connected to an electronic module. The electronic module includes an input attached to the photovoltaic panel and a power output. The method activates a bypass to the electronic module. The bypass provides a low impedance path between the input and the output of the electronic module. A current is injected into the electronic module thereby compensating for the presence of the electronic module during the testing. The current may be previously determined by measuring a circuit parameter of the electronic module. The circuit parameter may be impedance, inductance, resistance or capacitance.

Abstract: In a positioning method and apparatus capable of preventing a solar battery panel from suffer damage during inspection, the method includes steps of providing a transport platen, a set of positioning device, a first probe row and a second probe row; transporting the solar battery panel to an inspecting region by the transport platen; moving the positioning devices to position the solar battery panel step by step; the first probe row pressing an electrode line on one surface of the solar battery panel; the second probe row pressing an electrode line on the other surface of the solar battery panel, thereby electrically connecting the first probe row and the second probe row. In this way, the solar battery panel can be inspected accurately without suffering damage.

Abstract: The present invention relates to a location-adjusting inspecting apparatus and method for a solar battery panel inspecting system. The inspecting apparatus includes an image-fetching device and a set of rotatable probe devices. A transport platen of the inspecting system transports a solar battery panel to an inspecting region. The image-fetching device fetches an image of electrode lines on the battery panel, and calculates an offset data by comparing the fetched image with a correct data representing the position and angle of electrode lines. Finally, the probe devices are controlled to generate a corrective rotation based on the calculated offset data. In this way, when pressing the solar battery panel, the probes of the probe devices can be aligned with and contact the electrode lines of the solar battery panel correctly, thereby increasing the accuracy in the inspection of the solar battery panel.

Abstract: Photovoltaic module failure detection devices and methods provide reliable, low cost, and effective solutions with visual indication of a temperature of diodes during installation, commissioning, operation, and/or maintenance. Indication of diode temperatures and/or detection of diode failures assures proper installation, improves output, expedites maintenance, increases safety, and/or raises reliability. A photovoltaic module for converting light into electricity includes one or more solar cells, and a transparent front sheet disposed over the one or more solar cells. The photovoltaic module includes a back sheet opposite the transparent front sheet, and one or more electrical circuits with one or more diodes connected to at least a portion of the one or more solar cells. The module includes one or more temperature indication devices in communication with at least a portion of the one or more diodes and disposed between the transparent front sheet and the back sheet.

Abstract: A method and apparatus for detecting a fault of a solar panel and an inverter in a solar array includes a monitoring device to detect and to identify a fault of a solar panel and an inverter in a solar array. The method generates a normal operation profile by extracting median values of operation profiles from multiple solar panels in a solar array and then compares an individual operation profile against a normal profile to determine a fault in a solar panel. The method and apparatus can detect a fault in a combination of solar panel and inverter and can identify a fault in an inverter. The method and apparatus can store faulty profiles in a database for particular faults in a solar panel. The method and apparatus can then compare an operation profile from a faulty solar panel with a number of faulty profiles in a database to identify the type of the fault and then generate and report the fault and suggest corrective action.

Abstract: [Object] To provide a solar cell output characteristic evaluation apparatus and a method thereof capable of accurately measuring an open-circuit voltage Voc by applying a forward bias current with a minimum power consumption without requiring a bipolar power supply discharging a large current causing a cost increase. [Organization] A solar cell output characteristic evaluation apparatus measuring output characteristic of a solar cell, including: a solar cell; a voltmeter measuring a voltage of the solar cell; an ammeter measuring a current value flowing in the solar cell; a variable resistor part connected to the solar cell; a forward bias circuit connected to the solar cell; and a reverse bias circuit connected to the solar cell is provided.

Abstract: A method of inline inspection of photovoltaic material for electrical anomalies. A first electrical connection is formed to a first surface of the photovoltaic material, and a second electrical connection is formed to an opposing second surface of the photovoltaic material. A localized current is induced in the photovoltaic material and properties of the localized current in the photovoltaic material are sensed using the first and second electrical connections. The properties of the sensed localized current are analyzed to detect the electrical anomalies in the photovoltaic material.

Abstract: A circuit and method that provides an inexpensive and easily implemented rapidly-changing load test circuit for photovoltaic cells, which can be under pulsed light conditions. Embodiments of the present invention permit the testing of photovoltaic cells by causing a sweeping voltage across the photovoltaic cell in a very short time period.

Abstract: A system and method are provided for mimicking a bioluminescent signal from an animal or an insect, such as a firefly. A first version includes a controller, an electrical energy battery, a solar energy collector and a light emitting device. The solar energy collector receives sunlight and converts the sunlight to electrical energy that is stored in the battery. The electrical energy battery provides electrical energy to the light emitting device under management by the controller, and may comprise two or more battery cells or circuits. A time sequence for energizing the light emitting device may be applied to cause the light emitting device to mimic a bioluminescent lighting pattern generally exhibited by a selected species of insect or animal. A light emitting diode may be used with a voltage source and a voltmeter to detect the approximate intensity of light of an ambient environment surrounding the device.

Abstract: The present invention relates to apparatus rating solar units and to a method for rating solar units that comprises multiple acquisition of at least one input parameter and a corresponding multiple acquisition of at least one output parameter in acquisition intervals, at least one acquisition interval being varied for purposes of subsequently acquiring at least one output parameter as a function of the minimum of one acquired input parameter. The invention also relates to a solar unit, to a computer program and to a computer program product with means implementing the rating method.

Abstract: The present invention provides an inspection apparatus for photovoltaic devices which electrifies the photovoltaic devices in a forward direction thereof to make the photovoltaic devices emit electro-luminescence light and which has a simple-structured and cheap darkroom. The inspecting apparatus of the present invention includes a darkroom (110) provided with a flat upper surface (111), a transparent plate (112) which is provided in the upper surface of the darkroom for disposing the photovoltaic devices as an inspecting object (200), a reflector (140) which is disposed in the darkroom (110) at an oblique angle to the transparent plate, and a shading member for covering a camera (120) which is provided in the darkroom (110), the photovoltaic devices as the inspecting object on the darkroom and a guide member for transporting the photovoltaic devices.

Abstract: A measuring method for characterizing a semiconductor component (1) having at least one pn junction and a measuring surface, which is the front and/or rear of the semiconductor component and which has at least one contacting subarea, which is covered by a metallization or is intended for coverage by a metallization, The method includes the following steps: A. Planar application of electromagnetic excitation radiation onto the measuring area of the semiconductor component (1) for separating charge carrier pairs in the semiconductor component (1), and B. spatially resolved measurement of electromagnetic radiation originating from the semiconductor component (1) using at least one detection unit.

Abstract: A diagnostic and self-healing treatment system for a semiconductor device, the system provides: i) a shunt busting/blocking treatment, ii) self-healing treatment, and iii) an in-situ non-contact diagnostic determination.