Abstract: A method of accelerating the aging of a laser to thereby determine the reliability of the laser. The method includes an act of providing a laser die for reliability testing, an act of applying a plurality of short signal pulses to the laser die so as to simulate the aging of the laser die, and an act of ascertaining the reliability of the laser die based on its response to the plurality of short signal pulses.

Abstract: A photodetector array (142) includes a plurality of photodetector cells (202) such as avalanche photodiodes (208) and readout circuits (210). An array self-tester (226) tests a dark count or other performance characteristic of the cells (202). The test is performed in connection with the manufacture of the array (142) or following the installation of the array (142) in a detection system (100).

Abstract: A circuit includes a power supply circuit and a measuring circuit. The measuring circuit includes a voltage meter, a current meter, and a connector connected to a zener diode under test. The voltage meter is connected to the connector in parallel. The current meter is configured to measure a current flowing through the zener diode. The power supply circuit is capable of providing an output voltage that becomes greater gradually. The voltage meter is capable of obtaining a breakdown voltage of the zener diode when the current flowing through the zener diode increases and a voltage across the zener diode is unchanged.

Abstract: The present invention provides an LED chip testing device that measures characteristics of an LED chip. The LED chip testing device includes: a rotation member that supports the LED chip and rotates the LED chip to a testing position where the characteristics of the LED chip are tested; and a tester installed next to the rotation member and serving to measure the characteristics of the LED chip at the testing position.

Abstract: Disclosed is an outage detection circuit for detecting a defective light source, such as a LED coupled to a DC-DC converter circuit for receiving a power signal. The outage detection circuit includes a top voltage detector coupled to the LED for detecting a voltage across the LED. The top voltage detector has a top voltage terminal for supplying a top voltage signal. The detection circuit further includes a differential amplifier coupled to the top voltage terminal for receiving the top voltage signal as a first input signal and coupled to a reference voltage terminal. The reference voltage terminal is configured to supply a reference voltage as a second input signal. The differential amplifier includes an output terminal for supplying an outage detection signal.

Abstract: An ESD detection circuit for detecting a level of an ESD voltage on a power rail is provided. The ESD detection circuit includes a resistive component, a diode unit, and a controller. The resistive component is coupled between a detection node and a ground node corresponding to the power rail. The diode unit is coupled between the power rail and the detection node in a forward direction toward the power rail. The controller, coupled to the detection node, is used for determining the level of the ESD voltage based on the voltage of the detection node and the breakdown voltage of the diode unit.

Abstract: The present invention provides a method for measuring the PN-junction temperature of a light-emitting diode (LED), which uses a reference voltage to establish the function of current, real power, power factor, or driving-time interval on temperature. The initial and thermal-equilibrium values of current, real power, power factor, or driving-time interval are measured, and hence the variations thereof are calculated. Referring to the pre-established function, the temperature change is given. By the temperature change and the initial temperature, the PN-junction temperature of the LED is thereby deduced.

Abstract: A circuit for detecting faulty diode is disclosed, wherein the circuit for detecting faulty diode comprises a diode having an anode connecting to a voltage supply; a first switch having a first end connected to a cathode of the diode; a testing current source connected to the second end of the first switch; a one-shot circuit connected to a control end of the first switch, by which an output signal is generated and transmitted to the control end; and a comparator connected to a reference voltage input terminal for receiving a reference voltage and connected to the second end of the first switch. When the one-shot circuit closes the first switch for a maintaining period to urge the comparator comparing the reference voltage with the voltage applied to the second end of the first switch, whereby a signal used to discriminate whether the diode is fail or not is generated.

Abstract: An LED package interface inspection apparatus for an LED device comprises a current source, a voltage measuring unit, and a testing control unit. The testing control unit provides at least one control signal to command the current source to output at least one current for the LED device. The testing control unit also provides at least two signals to command the voltage measuring unit to measure a first forward voltage of the LED device at a first time and a second forward voltage of the LED device at a second time. The testing control unit calculates a voltage difference between the first forward voltage and the second forward voltage, and determines that the LED device is defective if the voltage difference is larger than a predetermined threshold value.

Abstract: An apparatus and a method for measuring a diode chip are provided. The diode chip is placed on a thermal conductive element. The apparatus measures an instant starting current and a first temperature, which is associated with the instant starting current, of the thermal conductive element. After the diode chip operates, the apparatus adjusts the temperature of the thermal conductive element to a second temperature, such that the current of the diode chip is adjusted to be equal to the instant starting current. The apparatus calculates a property of the diode chip according to a real power of the diode chip and a difference between the first temperature and the second temperature.

Abstract: A system and method are provided for mimicking a bioluminescent signal from an animal or an insect, such as a firefly. A first version includes a controller, an electrical energy battery, a solar energy collector and a light emitting device. The solar energy collector receives sunlight and converts the sunlight to electrical energy that is stored in the battery. The electrical energy battery provides electrical energy to the light emitting device under management by the controller, and may comprise two or more battery cells or circuits. A time sequence for energizing the light emitting device may be applied to cause the light emitting device to mimic a bioluminescent lighting pattern generally exhibited by a selected species of insect or animal. A light emitting diode may be used with a voltage source and a voltmeter to detect the approximate intensity of light of an ambient environment surrounding the device.

Abstract: A curve tracer signal conversion device is provided. The signal conversion device has an input connected to the curve tracer base port to accept a repeating sequence of stepped base signals. The conversion device has a signal input connected to either the curve tracer collector or emitter port, typically the collector. The conversion device has a plurality of signal outputs, where each signal output is sequentially connected to the selected (i.e. collector) curve tracer port in response to a corresponding base step signal. The signals outputs may be provided to a test fixture, for testing a multi-pin integrated circuit (IC).

Abstract: A system automatically detects singular faults in diode or'd power bus circuit comprised of a plurality of diodes. The system includes a diode test circuit that selectively applies a voltage pulse to one of the plurality of diodes and detects the presence of singular faults based on the monitored response to the voltage pulse.