Abstract: A driver is disposed in a display panel, and includes a plurality of stages. At least one stage of the plurality of stages includes an input circuit which transfers an input signal to a first node in response to at least one of a clock signal and an inverted clock signal, and inverters which generate an output signal based on a voltage of the first node. At least one of the inverters includes a p-type metal-oxide-semiconductor (“PMOS”) transistor and an n-type metal-oxide-semiconductor (“NMOS”) transistor connected in series between a line transferring a relatively high gate voltage and a line transferring a relatively low gate voltage. A first active region of the PMOS transistor includes a material different from a material of a second active region of the NMOS transistor.

Abstract: A circuit may include (1) an external input, (2) an external output, (3) a flip-flop subcircuit including (A) a first sequential subcircuit for reading data-input signals from the external input, the first sequential subcircuit including a first internal input coupled to the external input and a first internal output and (B) a second sequential subcircuit for outputting data-output signals to the external output, the second sequential subcircuit including a second internal input coupled to the first internal output of the first sequential subcircuit and a second internal output coupled to the external output, and (4) a hysteresis subcircuit coupled to the external output and configured to reduce a short-circuit current of the circuit. Various other devices, systems, and methods are also disclosed.

Abstract: A low-power retention flip-flop is provided. The low-power retention flip-flop may include: a master latch configured to output an input signal based on first control signals; a slave latch configured to output the signal from the master latch based on second control signals; and a control logic configured to generate the first control signals based on a clock signal, and provide the generated first control signals to the master latch, and generate the second control signals based on the clock signal and a power down mode signal, and provide the generated second control signals to the slave latch.

Abstract: In a semiconductor integrated circuit in which a pair of signal lines is wired, the wiring shape of these signal lines is simplified. An output circuit outputs a predetermined differential signal from a positive output terminal and a negative output terminal. A plurality of positive transistors and a plurality of negative transistors are disposed in a logic circuit. Gates of the plurality of positive transistors are arranged in a predetermined direction. Gates of the plurality of negative transistors are arranged in a predetermined direction. A positive signal line is wired from the positive output terminal along the predetermined direction, and connects each of the gates of the plurality of positive transistors and the positive output terminal. A negative signal line is wired from the negative output terminal along the predetermined direction, and connects each of the gates of the plurality of negative transistors and the negative output terminal.

Abstract: Disclosed is a semiconductor device which includes at least one flip-flop. The flip-flop includes a first latch that includes a first data path receiving input data in response to a transmission signal and outputting middle data, and a first feedback path feeding back the middle data, and a second latch that includes a second data path receiving the middle data in response to the transmission signal and outputting output data, and a second feedback path feeding back the output data, and at least one of the first feedback path and the second feedback path is disabled prior to the first data path or the second data path.

Abstract: An integrated circuit includes a first clocked forwarding-switch and a second clocked forwarding-switch each implemented with strong transistors in at least one strong active-region structure. The integrated circuit also includes a first clocked inverter and a second clocked inverter each implemented with weak transistors in at least one weak active-region structure. The integrated circuit further includes a first inverter cross coupled with the first clocked inverter and a second inverter cross coupled with the second clocked inverter. An output of the first clocked forwarding-switch is conductively connected with an output of the first clocked inverter, and an output of the second clocked forwarding-switch is conductively connected with an output of the second clocked inverter.

Abstract: A flip-flop includes a first input circuit, a first NOR logic gate, a stacked gate circuit, a first NAND logic gate and an output circuit. The first input circuit generates a first signal responsive to at least a first data signal, a first or a second clock signal. The first NOR logic gate is coupled between a first and a second node, and generates a second signal responsive to the first signal and a first reset signal. The stacked gate circuit is coupled between the first and a third node, and generates a third signal responsive to the first signal. The first NAND logic gate is coupled between the third and a fourth node, and generates a fourth signal responsive to the third signal and a second reset signal. The output circuit is coupled to the fourth node, and generates a first output signal responsive to the fourth signal.

Abstract: A flip-flop circuit includes a clock generator configured to generate first and second clock signals having different phases relative to each other, and a master-slave latch circuit including master and slave latches. The master latch includes a scan path configured to output a scan path signal in response to a scan enable signal and a scan input signal, and a data path configured to output a first latch signal in response to a data signal and the scan path signal. A feedback path is provided, which includes a tri-state inverter responsive to the first and second clock signals. The tri-state inverter has an input terminal connected to an output terminal of the data path and an output terminal connected to a node of the scan path.

Abstract: In some examples, command decoders may have multiple command paths. In some examples, command signals from one command path may be provided to another command path from a node located between two latches of the command decoder, such as two latches of a flip-flop. In some examples, the command decoder may include separate flip-flops for different command modes. In some examples, the separate flip-flops may be tristate flip-flops. In some examples, the command decoder may include alternate logic circuits rather than a multiplexer.

Abstract: The present disclosure provides a semiconductor device which includes a multiplexer, a master latch, and a slave latch. The multiplexer outputs an inverse of an input data signal or an inverse scan input signal according to a scan enable signal. The master latch is coupled to an output terminal of the multiplexer, and is configured to latch the inverse of the input data signal based on an input clock signal in response to the scan enable signal being in a low-logic state. The slave latch is coupled to the output terminal of the multiplexer through a first clocked CMOS inverter, and is configured to receive the input data signal and to output a latched slave latch data based on the input clock signal. A leakage-free dummy cell is disposed in a non-critical path of the master latch and the slave latch.

Abstract: Systems, methods, and devices are described herein for pre-setting scan flip-flops using combinational logic circuits. A system includes a plurality of flip-flop devices and a first pre-setting combinational logic circuit. The plurality of flip-flop devices are coupled together in series and configured to receive a scan input signal, capture data output from each flip-flop device of the plurality of flip-flop devices based on the scan input signal, and generate a scan output signal comprising the captured data. The first pre-setting combinational logic circuit is coupled to a first flip-flop device of the plurality of flip-flop devices. The first pre-setting combinational logic circuit includes a plurality of transistors and is configured to override and set either the scan input signal to the first flip-flop device or the scan output signal of the first flip-flop device based on selective operation of the plurality of transistors.

Abstract: A flip flop standard cell that includes a data input terminal configured to receive a data signal, clock input terminal configured to receive a clock signal, a data output terminal, and a latch. A bit write circuit is configured to receive a bit write signal. The received data signal is latched and provided at the output terminal in response to the bit write signal and the clock signal. A hold circuit is configured to receive a hold signal, and the received data signal is not latched and provided at the data output terminal in response to the hold signal and the clock signal.

Abstract: A flip-flop circuit includes a first inverter configured to receive a first clock signal and output a second clock signal, a second inverter configured to receive the second clock signal and output a third clock signal, a master stage, and a slave stage including a first feedback inverter and a first transmission gate. The first feedback inverter includes a first transistor configured to receive the first clock signal and a second transistor configured to receive the second clock signal, and the first transmission gate includes first and second input terminals configured to receive the second and third clock signals.

Abstract: A flip flop includes a precharge circuit configured to charge a first node by bridging a power voltage node and the first node, the charging of the first node by the precharge circuit according to a voltage level of a clock signal, the charging of the first node by the precharge circuit based on at least two PMOS transistors arranged in series, a discharge circuit configured to discharge the first node by bridging the first node and a ground node, the discharging of the first node according to an input signal and the clock signal, and a second node configured to be charged or discharged, the charging and the discharging of the second node according to a voltage level of the first node.

Abstract: A circuit comprises a first pulse-width modulator configured to generate a first pulse based on a first input, a second pulse-width modulator configured to generate a second pulse based on a second input, a first differential circuit comprising a first transistor, a second transistor, a first resistor, and a second resistor, and a second differential circuit comprising a first transistor, a second transistor, a first resistor, and a second resistor. A gate of the first transistor of the first differential circuit and a gate of the second transistor of the first differential circuit, and a gate of the first transistor of the second differential circuit and a gate of the second transistor of the second differential circuit are configured to be controlled by the first and second pulse width modulators based on the first input and the second input.

Abstract: A scan chain architecture with lowered power consumption comprises a multiplexer selecting between a functional input and a test input. The output of the multiplexer is coupled to a low threshold voltage latch and, in test mode, to a standard threshold voltage latch. The low threshold voltage latch and standard threshold voltage latch are configured to store data when a clock input falls, using a master latch functional clock M_F_CLK, master latch test clock M_T_CLK, slave latch functional clock S_F_CLK, and slave latch test clock S_T_CLK. The slave latch has lower power consumption than the master latch.

Abstract: A mixed-signal in-memory computing sub-cell only requires 9 transistors for 1-bit multiplication. A computing cell is constructed from a plurality of such sub-cells that share a common computing capacitor and a common transistor. A MAC array for performing MAC operations, includes a plurality of the computing cells each activating the sub-cells therein in a time-multiplexed manner. A differential version of the MAC array provides improved computation error tolerance and an in-memory mixed-signal computing module for digitalizing parallel analog outputs of the MAC array and for performing other tasks in the digital domain. An ADC block in the computing module makes full use of capacitors in the MAC array, allowing the computing module to have a reduced area and suffer from fewer computational errors.

Abstract: The disclosed method of operation for a data latch (DLATCH) circuit may include receiving, by an input component of the DLATCH circuit, an input signal. The method may additionally include storing, by a combinatorial gate of the DLATCH circuit, a state of the input signal, wherein the combinatorial gate corresponds to at least one of an AND-OR-inverted (AOI22) cell or an OR-AND-inverted (OAI22) cell. The method may further include providing an output signal, by an output component of the DLATCH circuit, wherein the output signal has the state stored by the combinatorial gate. Various other methods, systems, and circuits are also disclosed.

Abstract: Circuits, methods, and systems for generating data outputs based on sampled data inputs. One circuit includes a first clock-activated transistor electrically coupled to a first shared clock node, a second clock-activated transistor coupled to a second shared clock node, a third clock-activated transistor coupled to a third shared clock node, a plurality of flip-flops, a latch electrically coupled to the second shared clock node and the third shared clock node, and a first keeper sub-circuit electrically coupled to the third shared clock node and at least one of a first output or a second output of the latch. Each flip-flop of the plurality of flip-flops includes a latch electrically coupled to the second shared clock node and the third shared clock node and a first keeper sub-circuit electrically coupled to the third shared clock node and at least one of a first output or a second output of the latch.

Abstract: Disclosed is a fault event detector configured to detect a fault injection event in an area of a chip that includes a vulnerable digital circuit. Such a fault event detector may include a bistable device that changes state at least partially in response to a presence of a fault injection event in a surrounding area of the fault event detector. Such a fault event detector may be arranged relative to a vulnerable digital circuit such that the vulnerable digital circuit is substantially located within the surrounding area of the first fault event detector.

Abstract: A semiconductor device and a method of manufacturing the same are provided. The semiconductor device includes a first conductive pattern disposed within a first region from a top view perspective and extending along a first direction, a first phase shift circuit disposed within the first region, a first transmission circuit disposed within a second region from the top view perspective, and a first gate conductor extending from the first region to the second region along a second direction perpendicular to the first direction. The first phase shift circuit and the first transmission circuit are electrically connected with the first conductive pattern through the first gate conductor.

Abstract: A fast Mux-D scan flip-flop is provided, which bypasses a scan multiplexer to a master keeper side path, removing delay overhead of a traditional Mux-D scan topology. The design is compatible with simple scan methodology of Mux-D scan, while preserving smaller area and small number of inputs/outputs. Since scan Mux is not in the forward critical path, circuit topology has similar high performance as level-sensitive scan flip-flop and can be easily converted into bare pass-gate version. The new fast Mux-D scan flip-flop combines the advantages of the conventional LSSD and Mux-D scan flip-flop, without the disadvantages of each.

Abstract: A flip-flop circuit includes a clock generator configured to generate first and second clock signals having different phases relative to each other, and a master-slave latch circuit including master and slave latches. The master latch includes a scan path configured to output a scan path signal in response to a scan enable signal and a scan input signal, and a data path configured to output a first latch signal in response to a data signal and the scan path signal. A feedback path is provided, which includes a tri-state inverter responsive to the first and second clock signals. The tri-state inverter has an input terminal connected to an output terminal of the data path and an output terminal connected to a node of the scan path.

Abstract: A latch circuit includes a latch module, a set control module, a reset control module and a clock module, wherein the latch module is employed for latching data input by a data module, the set control module is employed for controlling the latch module to output a high-level signal, the reset control module is employed for controlling the latch module to output a low-level signal, and the clock module is employed for providing a readout clock signal to the latch module.

Abstract: A complementary clock gate, includes a NOR gate configured to receive a data signal D and a signal QI; a first P-type transistor gated by an output value of the NOR gate; and a NAND gate, connected in series to the first P-type transistor, configured to receive a clock signal CK and an inverted data signal DN, and output an inverted clock signal CKB.

Abstract: A flip-flop circuit includes first and second latches. The first latch comprises a first inverting logic element and a second inverting logic element. The first inverting logic element has a first logic threshold voltage. The second inverting logic element is connected in antiparallel to the first inverting logic element and has a second logic threshold voltage. The first and second logic threshold voltages are set with respect to one half of a power supply voltage. The second latch comprises a third inverting logic element and a fourth inverting logic element. The third inverting logic element is connected to the first latch and has a third logic threshold voltage. The fourth inverting logic element is connected in antiparallel to the third inverting logic element and has a fourth logic threshold voltage. The third and fourth logic threshold voltages are set with respect to one half of the power supply voltage.

Abstract: A master-slave flip-flop includes a first latch, a second latch and a tristate driver. The first latch has a combined input/output that is coupled with a common node, a pm output, and an nm output. The tristate driver has pm and nm inputs coupled with the pm and nm outputs of the first latch, and a tristate output coupled with the common node. A pm input signal prevents the tristate driver from pulling the common node high, and an nm input signal prevents the tristate driver from pulling the common node low. The second latch is directly coupled with the common node. The first latch generates an nm signal and a pm signal in response to a signal on the first latch clk input and a state of the common node, wherein the pm signal and the nm signal have opposite polarities when the signal on the first latch clk input has a first value, and equal polarities when the signal on the first latch clk input has a second value.

Abstract: Methods and systems include memory devices having multiple memory cells configured to store data. The memory devices also include control circuitry including retry circuitry. The retry circuitry is configured to receive a read command having a target address. The retry circuitry is also configured to determine that the target address of the data stored in the memory cells is to be reused from a previous read operation. Additionally, the retry circuitry is configured to cause reading of the data from a sense amplifier latch from the previous read operation by reusing the target address. Specifically, reusing the target address includes bypassing rereading the data into the sense amplifier latch from the memory cells for a current read operation.

Abstract: A flip-flop with glitch protection is disclosed. The flip-flop includes a differential amplifier circuit that generates amplifier output signals based on an input data and clock signals and precharges a true data node when a clock signal is inactive. A latch circuit is coupled to the differential amplifier and includes a latch node. Responsive to a current value of the input data signal having a first logic state, the latch node is set at a logic value equivalent to the precharged value during an active phase of the clock signal. Responsive to the current value of the input data signal having a second logic state complementary to the first, during the active phase of the clock signal, the latch circuit causes the latch node to be set to a logic value complementary to the precharged value, using the clock signal and the current value of the input data signal.

Abstract: Various implementations described herein are directed to a device having multiple stages. The device may have a first stage that provides a data path for an input data signal. The first stage may receive the input data signal, receive feedback signals, and provide an intermediate data signal based on the input data signal and/or the feedback signals. The device may have a second stage that provides set/reset signals based on the intermediate data signal and/or a clock signal. The second stage may receive the intermediate data signal, receive the clock signal, and generate the set/reset signals based on the intermediate data signal and the clock signal. The second stage may also provide the set/reset signals as the feedback signals to the first stage.

Abstract: A clocked driver circuit can include a level shifter latch and a driver. The level shifter latch can be configured to receive an input signal upon a clock signal and generate a level shifted output signal. The driver can be configured to receive the level shifted output signal from the level shifter and drive the output signal on a line. The signal levels of the output signal can be greater than the signal level of the input signal.

Abstract: A scan flip-flop includes a selection circuit, a primary latch, a secondary latch, and a data retention latch. The selection circuit selects and outputs one of functional data, first reference data, scan data, and first control data as second reference data. The primary latch receives the second reference data and outputs third reference data, whereas the secondary latch receives the third reference data and outputs second control data. The second control data is then provided to a subsequent scan flip-flop of a scan chain. The data retention latch receives one of the third reference data and the second control data, and outputs and provides the first reference data to the selection circuit. The first reference data corresponds to functional data retained in the scan flip-flop during a structural testing mode associated with the scan chain.

Abstract: A new family of shared clock single-edge triggered flip-flops that reduces a number of internal clock devices from 8 to 6 devices to reduce clock power. The static pass-gate master-slave flip-flop has no performance penalty compared to the flip-flops with 8 clock devices thus enabling significant power reduction. The flip-flop intelligently maintains the same polarity between the master and slave stages which enables the sharing of the master tristate and slave state feedback clock devices without risk of charge sharing across all combinations of clock and data toggling. Because of this, the state of the flip-flop remains undisturbed, and is robust across charge sharing noise. A multi-bit time borrowing internal stitched flip-flop is also described, which enables internal stitching of scan in a high performance time-borrowing flip-flop without incurring increase in layout area.

Abstract: A pre-discharging based flip-flop having a negative setup time can include a flip-flop with an inverted output QN. The flip-flop includes a master section and a slave section. The master section latches a data input or a scan input signal based on a scan enable signal, and the slave section retains a previous value of the inverted output QN when a clock signal is at a low logic level. The master section retains a previously latched value of the data input or the scan input signal and the slave section fetches the latched value of the master section and provides a new inverted output QN when the clock signal is at a high logic level. Further, the master section includes sub-sections that are operated using a negative clock signal. An output of the master section is discharged to zero for a half of a phase of the clock cycle.

Abstract: A flip-flop is provided. The flip-flop includes: a first inverter including an input terminal to receive data signal and an output terminal coupled to an input terminal of the master latch, a second inverter, a master latch including an output terminal coupled to an input terminal of a slave latch, and the slave latch including an output terminal coupled to an input terminal of the second inverter. An output terminal of the second inverter is configured as an output terminal of the flip-flop. A duration of the first clock signal inputted to the master latch is greater than a duration of the first clock signal inputted to the slave latch. A duration of the second clock signal inputted to the master latch is greater than a duration of the second clock signal inputted to the slave latch.

Abstract: A fast Mux-D scan flip-flop is provided, which bypasses a scan multiplexer to a master keeper side path, removing delay overhead of a traditional Mux-D scan topology. The design is compatible with simple scan methodology of Mux-D scan, while preserving smaller area and small number of inputs/outputs. Since scan Mux is not in the forward critical path, circuit topology has similar high performance as level-sensitive scan flip-flop and can be easily converted into bare pass-gate version. The new fast Mux-D scan flip-flop combines the advantages of the conventional LSSD and Mux-D scan flip-flop, without the disadvantages of each.

Abstract: Integrated circuit devices are provided. The devices may include a substrate including a first region, a second region and a boundary region between the first and second regions. The first and second regions may be spaced apart from each other in a first horizontal direction. The devices may also include a first latch on the first region, a second latch on the second region, and a conductive layer extending in the first horizontal direction and crossing over the boundary region. The first latch may include a first vertical field effect transistor (VFET), a second VFET, a third VFET, and a fourth VFET. The second latch may include a fifth VFET, a sixth VFET, a seventh VFET, and an eighth VFET. The first and seventh VFETs may be arranged along the first horizontal direction. Portions of the conductive layer may include gate electrodes of the first and seventh VFETs, respectively.

Abstract: A processing circuit includes an input circuit and a follow-up circuit. The input circuit includes a first transistor, a second transistor, and a delay element. The first transistor has a control terminal, a first connection terminal, and a second connection terminal. The control terminal of the first transistor is arranged to receive a data signal. A first connection terminal of the second transistor is coupled to the second connection terminal of the first transistor, and a control terminal of the second transistor is arranged to receive a first non-data signal. The delay element is coupled between the control terminal and the second connection terminal of the first transistor. A data input is received at an input node of the follow-up circuit, and the input node of the follow-up circuit is coupled to the second connection terminal of the second transistor.

Abstract: Memory devices receive a data signal and an accompanying data strobing signal, which informs the device that data is ready for latching. The data strobing signal enables capturing the data while the data signal transitions from a logic high to a logic low or vice versa, resulting in an indeterminate output (e.g., between 0 and 1). The indeterminate value may cause metastability in memory operations using the indeterminate output. To prevent or reduce metastability, a cascaded timing arbiter latch includes cascaded alternating NAND timing arbiters and NOR timing arbiters. In some embodiments, these logic gates are connected to transistors above and below the cascaded timing arbiters. The cascaded timing arbiters and/or transistors provide amplification on a feedback path of the latch. In other embodiments, the cascaded timing arbiters are isolated by inverters and are not connected to transistors. This embodiment reduces capacitive loading on nodes of the internal feedback path.

Abstract: The invention provides a dynamic D flip-flop, and a data operation unit, a chip, a hash board and a computing device using the same. The dynamic D flip-flop comprises: an input terminal, an output terminal and at least one clock signal terminal; a first latch unit for transmitting data of the input terminal and latching the data under control of a clock signal; a second latch unit for latching data of the output terminal and inversely transmitting the data latched by the first latch unit under control of a clock signal; and an output driving unit for inverting and outputting the data received from the second latch unit; wherein the second latch unit outputs in high level, low level and high impedance states by means of a single element under control of a clock signal. Therefore, the invention can effectively reduce chip area, power consumption, and logic delay.

Abstract: Design and operation of a processing device is configurable to optimize wake-up time and peak power cost during restoration of a machine state from non-volatile storage. The processing device includes a plurality of non-volatile logic element arrays configured to store a machine state represented by a plurality of volatile storage elements of the processing device. A stored machine state is read out from the plurality of non-volatile logic element arrays to the plurality of volatile storage elements. During manufacturing, a number of rows and a number of bits per row in non-volatile logic element arrays are based on a target wake up time and a peak power cost. In another approach, writing data to or reading data of the plurality of non-volatile arrays can be done in parallel, sequentially, or in any combination to optimize operation characteristics.

Abstract: A master-slave D flip-flop is disclosed having gates configured to supply two second intermediate signals as a function of first intermediate signals and a clock signal, and a slave circuit connected to a transfer circuit to form at least one output signal of the flip-flop from the second intermediate signals. The slave circuit is configured, when the second intermediate signals have, after a preceding pair of states, a predetermined pair of states, to maintain the at least one output signal as given by the preceding pair of states. The transfer circuit has a control input and is configured to generate the second intermediate signals to have the predetermined pair of states in response to a predetermined control signal state at the control input.

Abstract: Examples generally relate a programmable device having a unified programmable computational memory (PCM) and configuration network. In an example, a programmable device includes a die that includes a PCM integrated circuit having a PCM tile. The PCM tile includes a configuration memory (CM) and combinational logic (CL). The CM is capable of storing configuration data received via a node in the PCM tile. The CL is configured to receive internal control signal(s) and first and second input signals and to output a result signal. The CL is capable of outputting the result signal resulting from a logic function that is responsive to the internal control signal(s) and a signal of a group of signals including the first and second input signals. The CL is configured to receive the first input signal via the node in the PCM tile.

Abstract: A master latch includes a latch input node and a latch output node, a first inverter with an input and an output, the input coupled to the latch input node and the output coupled to the latch output node, and a second inverter with an input and an output, the input coupled to the latch output node and the output coupled to the latch input node. The master latch further includes a first pull-up device connected between a source voltage and the latch input node, the first pull-up device configured to pull the latch input node up towards the source voltage when the latch output node is low, and a first pull-down device connected between the latch input node and a ground voltage, the first pull-down device configured to pull the latch input node towards the ground voltage when the latch output node is high.

Abstract: A dual-edge aware clock divider configured to generate an output clock based on the input clock and a ratio of an integer M over an integer N is disclosed herein. The frequency of the output clock is based on a frequency of the input clock multiplied by the ratio (M/N), wherein M may be set to a range up to N. The output clock includes M pulses within a sequence time window having a length of N periods of the input clock. The output clock includes one or more rising edges that are substantially time aligned with one or more rising edges and one or more falling edges of the input clock, respectively. The dual-edge aware clock divider is configured to generate the output clock based on inverted and non-inverted portions of the input clock. A hybrid clock divider including the dual-edge and single-edge aware techniques is provided.

Abstract: Examples described herein generally relate to devices that include a pulsed flip-flop capable of being implemented across multiple voltage domains. In an example, a device includes a pulsed flip-flop. The pulsed flip-flop includes a master circuit and a slave circuit sequentially connected to the master circuit. The master circuit includes a pre-charge input circuit and a first latch. A first node is connected between the pre-charge input circuit and the first latch. The slave circuit includes a resolving circuit and a second latch. The first node is connected to an input node of the resolving circuit. A second node is connected between the resolving circuit and the second latch. The resolving circuit is configured to selectively (i) pull up or pull down a voltage of the second node and (ii) be disabled.

Abstract: Systems, methods, and software are disclosed herein that enhance data storage operations. In various implementations, a preserve write process identifies one or more regions of the solid-state memory components that qualify to be relocated prior to a data storage device entering a data retention state. Prior to the data retention state, the process changes one or more values, of one or more write settings, to one or more new values. With the write settings changed to the one or more new values, the process relocates data from the one or more regions to one or more new regions. After having relocated the data, the process returns the one or more new values, of the one or more write settings, to one or more earlier values.

Abstract: A technique is provided for routing access requests within an interconnect. An apparatus provides a plurality of requester elements for issuing access requests, and a slave element to be accessed in response to the access requests. An interconnect is used to couple the plurality of requester elements with the slave element, and provides an intermediate element that acts as a point of serialisation to order the access requests issued by the plurality of requester elements via the intermediate element. Communication channels are provided within the interconnect to support communication between each of the requester elements and the intermediate element, and between the intermediate element and the slave element.

Abstract: Systems, apparatuses, and methods for implementing low voltage clock swing sequential circuits are described. An input signal is coupled to the gates of a first P-type transistor and a first N-type transistor of a first transistor stack. A low voltage swing clock signal is coupled to the gate of a second N-type transistor of the first transistor stack. An inverse of the input signal is coupled to the gates of a second P-type transistor and a third N-type transistor of a second transistor stack. The low-swing clock is coupled to the gate of a fourth N-type transistor of the second transistor stack. A first end of one or more enabling P-Type transistors with gates coupled to the low-swing clock is coupled to the first P-type transistor's drain, and a second end of the one or more enabling P-Type transistors is coupled to the second P-type transistor's drain.

Abstract: A circuit includes a master latch circuit and a slave latch circuit. The master latch circuit is configured to receive an input data signal associated with an input data voltage domain and generate a first output data signal associated with an output data voltage domain different from the input data voltage domain. The slave latch circuit is configured to receive, from the master latch circuit, the first output data signal and generate a second output data associated with the output data voltage domain.