Abstract: A semiconductor integrated circuit device for minimizing clock skew over clock wiring shortened for reduced wiring delays. A plurality of stages of clock drivers are provided on clock wiring paths ranging from a clock generator to flip-flops. Clock lines connecting upper stage clock drivers are equalized in length in the form of a tree structure, and clock lines connecting lower stage clock drivers are made as short as possible.

Abstract: One or more main programmed delay circuits (PDCs) are compensated to provide constant delays despite variations in environmental factors, such as temperature and power supply, by means of a dummy PDC that emulates the main PDCs in environmental sensitivity. While the main PDCs have dynamically changing programmed inputs, the dummy PDC has a constant programmed input. Changes in the dummy PDC's delay due to environmental changes are monitored and a correction signal is applied to the dummy PDC to maintain its delay substantially constant, with the same correction provided to the main PDCs to correct for the same changes in the delay of these circuits. The dummy PDC is preferably initially calibrated so that its fixed delay period coincides with an integer number of clock periods. Both the main and dummy PDCs preferably produce respective delays equal to the linear sum of a programmed delay and their correction delays.

Abstract: There is provided a circuit for controlling the setup/hold time of a semiconductor device, including: a setup/hold on signal generator for generating a setup/hold on signal of the semiconductor device; a comparison signal generator for converting the difference between pulse widths of the setup on signal and hold on signal of the setup/hold on signal generator into the voltage difference across an inner capacitor, to generate a comparison signal for the setup/hold time; a comparison signal detector for detecting the comparison signal generated by the comparison signal generator and amplifying it to a predetermined level; a clock delay path selection signal generator for generating a clock delay path selection signal according to the level of the signal detected by the comparison signal detector; and a clock/command signal processor for outputting a clock signal and command signal applied to input pads as an inner clock signal and inner command signal whose delays are compensated according to the clock delay p

Abstract: A low power pulse amplifier with low duty cycle errors. The amplifier provides several differential amplifier stages with a biasing and canceling network. To minimize duty cycle errors for large input signals, cascode transistors are added between the drains of the differential amplifiers and the outputs. The result is an amplifier having a duty cycle error of less than 5% at amplitude input ranges from 5 millivolts to the supply voltage.

Abstract: A clock generation circuit comprises a clock wiring having opposed first and second ends, through which a clock is transmitted from the first end to the second end, and a plurality of clock phase adjustment circuits for generating internal clocks in accordance with the clock supplied from the clock wiring. Each of the clock phase adjustment circuits comprises a first-end side terminal and a second-end side terminal which are connected to a first-end side point and a second-end side point of the circuit, respectively, the points being positioned on both sides of a reference point of the clock wiring; a delay line for delaying a clock supplied from one of the terminals and outputting an internal clock; and a delay control circuit for performing feedback control on a delay of the clock in the delay means in accordance with the phase of the clock supplied from the other terminal so that the phase of the internal clock matches the phase of the clock at the reference point of the cock wiring.

Abstract: A delay circuit is provided for delaying signals. The delay circuit includes: at least one inverter having a time delay; at least one current source coupled to the at least one inverter, the at least one current source providing charging current to the at least one inverter; and a voltage biasing circuit coupled to the at least one current source, the voltage biasing circuit providing a biasing voltage to the at least one current source such that the at least one current source varies the charging current so as to maintain the time delay of the at least one inverter substantially constant.

Abstract: A ring oscillator is formed by connecting three or more odd gate circuits in a ring. Each gate circuit includes a precharge dynamic gate. An output signal from the precharge dynamic gate of one gate circuit is used to precharge the precharge dynamic gates of all the remaining gate circuits. In measuring the gate delay time of the ring oscillator formed by connecting, in a ring, three or more odd gate circuits each including a precharge dynamic gate, the oscillation frequency of the ring oscillator is measured, and the reciprocal of the oscillation frequency is divided by the number of gate circuits constituting the ring oscillator.

Abstract: An apparatus that includes a driver circuit and an active load circuit coupled to an output of the driver circuit. The active load circuit is configured to actively adjust the slew rate of a signal outputted by the driver circuit.

Abstract: The present invention provides an apparatus and method for repairing or improving the behavior of a tunable circuit of an integrated circuit (IC) when a target parameter exceeds a predetermined range due to a design and/or fabrication problem. The tunable circuit includes one or more tuning controllers for tuning a corresponding number of target circuits. Each tuning controller includes one or more registers and an optional decoder. Each target circuit includes a tunable portion and a functional portion. The functional portion can have one or more of a wide variety of functions including but not limited to logical gates, buffers, signal generators and amplifiers. The selectable parameters of the tunable circuit include timing delays, trip voltages, rise/fall times and/or output impedances. When a circuit designer wishes to tune the target parameter, an appropriate tuning pattern is latched into registers of the tuning controller.

Abstract: A circuit for calibration of the NLTS correction value provided for the NLTS correction circuit to realize its high precision of the amount of the NLTS correction. The circuit for calibrating the NLTS correction value of the present invention comprises a duty cycle-voltage converter (D/V converter) for receiving the output signals of the NLTS correction circuit and converting the duty cycle of the signals to voltage values, an A/D converter for converting the analog output from the D/V converter to digital values, and an delay line control device for controlling the amount of delay of each delay line in accordance with the output of the A/D converter. To providing the circuit for calibrating the NLTS correction value of the present invention for the NLTS correction circuit, the amount of delay of the delay lines is required to be controllable with the delay line control device.

Abstract: An input buffer includes a first CMOS inverter (400) made up of a PMOS transistor (602) connecting Vdd to the buffer output and an NMOS transistor (604) connecting the buffer output to Vss. NMOS transistors (404) and (414) have with series connected source to drain paths to connect the buffer output to Vss in conjunction with transistor (604) of inverter (400). PMOS transistors (402) and (412) have series connected source to drain paths connecting Vdd to the buffer output in conjunction with transistor (602). To control transistors (402, 404, 412 and 414) an inverter (420) is connected from the buffer output to the gates of transistors (402 and 404), and inverters (431, 432, 433, and 440) are connected between the buffer input and the gates of transistors (412 and 414).

Abstract: The present invention relates to, more specifically, an electronic circuit apparatus having a main system portion and a subsystem portion connected to the main system portion. In the electronic circuit apparatus, at least either the main system or the subsystem comprises a clock source, a clock wire having an outgoing path and an incoming path, wherein a clock signal from the clock source is inputted from one end of the outgoing path, and at least one receiver connected to an optional position of the outgoing path, further connected to a position of the outgoing path adjacent to the optional position, for supplying a clock signal having an optional delay level relative to the clock signal from the clock source according to a delay level between each clock signal at the positions.

Abstract: A precise timing delay method and apparatus. A phase-locked loop (PLL) in combination with a timing reference is used to calibrate a precise delay. These delays are then duplicated throughout the chip and controlled by the same current as in the PLL. This makes the delays process, voltage, and temperature insensitive. The delays can be programmed by selecting the desired delay through a multiplexer. Providing high precision delays are particularly advantageous for use in devices such as computer bus isolators.

Abstract: A differential clock receiver for a SynchLink-type Synchronous Dynamic Random Access Memory (SLDRAM) includes a differential amplifier with a novel method for biasing its NMOS and PMOS current sources. A differential clock received and amplified by the differential amplifier switches a set of multiplexers, which respond by outputting a differential output clock. The multiplexers can be "disabled" by an inactive enable signal so they output a constant "0" level for the differential output clock. This disabling feature of the differential clock receiver is particularly useful with the intermittent data clocks found in SLDRAMs. Also, the novel biasing method for the current sources of the differential amplifier gives the clock receiver very low skew.

Abstract: At least two level detectors compare a multilevel signal to respective prescribed voltage levels to produce corresponding streams of bits. These bit streams are repeatedly delayed in respective digital delay lines, and bits from the digital delay lines are output in parallel to multilevel decoder logic. The multilevel decoder logic converts the parallel bits into a plurality of corresponding two-level decoded bits and performs error detections for an invalid transition in the multilevel signal. The decoded bits may be descrambled and block decoded.

Abstract: The present invention provides an technique for compensating a operation speed variation based on a principle that a circuit operation speed is adjusted by reflecting a delay time of an internal circuit itself that is an object of the operation speed fluctuation compensation.An internal circuit (1 in FIG. 1) has a critical path with an output terminal pair that outputs the identical logical values till its each operation is finished, and data in a complementary signal format as soon as its each operation is finished. A logical gate (2 in FIG. 1) can detect its operation end by sensing the signal transition into a complementary signal format at the output terminal pair of the internal circuit.

Abstract: A delay circuit which is capable of maintaining a constant delay time. The circuit includes a plurality of first delay circuits connected in series and each having an inverter for inverting an input voltage signal, and a variable capacitor connected to an output terminal of the inverter.

Abstract: A delay signal generating apparatus incorporated in an integral circuit, includes a plurality of serially-connected delay elements for delaying an input signal successively and for outputting plural delay signals, a heat generating circuit for heating the plurality of delay elements, and a heat controller for controlling a heat amount generated by the heat generating circuit so as to change the delay time of each of the plural delay signals.

Abstract: An oscillating means having an oscillator outputs a reference clock, and a frequency-dividing means sequentially frequency-dividing the reference clock into a half frequency. A temperature correction data creating means detects a temperature, calculates logical delaying/advancing data for a temperature change, and outputs the logical delaying/advancing data in every predetermined period. A temperature correction data input means receives the delaying/advancing data outputted by the temperature correction data creating means and outputs the logical delaying/advancing data to a logical delaying/advancing means. The logical delaying/advancing means operates a state of the frequency-dividing means in every predetermined period on the basis of the set logical delaying/advancing data to control the period of the frequency-divided output signal of the frequency-dividing means so as to be coincident with a desired period.

Abstract: This invention relates to an asymmetrical delay network connected between first and second voltage references and having an input terminal for receiving a trigger signal, and an output terminal. The network is of the type which includes at least one charge control transistor and at least one delay capacitor, connected in series with each other between the first and second voltage references. In particular, the charge control transistor has a control terminal connected to a generator of a constant current, and the output terminal delivers a delay signal which is synchronized to a first edge of the trigger signal. The invention also concerns a constant pulse generator including at least a first and a second of such asymmetrical delay networks.

Abstract: An interface circuit providing a high speed bus. According to one embodiment, the interface circuitry includes a plurality of I/O pins coupled to a plurality of bus drivers, wherein each bus driver is configured to adjust the rise time, fall time, and drive strength of outputs signal on the I/O pins based on process-voltage-temperature ("PVT") conditions. The circuitry used to adjust the I/O outputs includes a slew rate control circuit, a current control circuit, and a delay lock loop ("DLL").

Abstract: Signal-controlled oscillator structures are provided that are substantially insensitive to temperature, supply voltages and fabrication processes. They include a plurality of time-delay stages that are serially connected in a closed feedback ring and each of the stages includes an amplifier, at least one capacitor and at least one signal-controlled impedance element that couples the capacitor to the amplifier. Accordingly, the frequency of the oscillator is a function of a control signal applied to the impedance elements of the stages. In an oscillator embodiment, each of the amplifiers is a differential pair of transistors, the capacitor comprises first and second capacitors and the signal-controlled impedance element comprises first and second coupling transistors that each couples a respective one of the capacitors to a different side of the differential output.

Abstract: A delay circuit provides a substantially constant delay over a range of power-supply voltages. The delay circuit includes an input terminal that receives an input signal, an output terminal that provides an output signal, and a supply terminal that receives a supply voltage. A delay stage is coupled between the input and the output terminals and, when the supply voltage has a predetermined value, generates the output signal a predetermined delay time after it receives the input signal. A control stage is coupled between the supply terminal and the delay stage and regulates the supply current that flows between the supply terminal and the delay stage such that the delay time of the delay stage remains substantially equal to the predetermined delay time as the supply voltage varies from the predetermined value.

Abstract: A delay circuit is to produce a delay timing which is larger than one cycle time of a reference clock while the resolution of which is smaller than the one cycle time of the reference clock.

Abstract: A delay circuit comprises a tapped delay element line constructed from delay elements with fixed delay intervals and a multiplexer for selecting the signal at one of the taps to produce a variable delay through the circuit. The multiplexer is controlled by a selection circuit which receives an input indicative of the actual delay time through the delay circuit from an oscillator constructed from the same fixed delay elements as the delay line.

Abstract: A power consumption control circuit for CMOS circuit for achieving a constant signal propagation delay time in the CMOS circuit by maintaining the same power consumption all the time. A leading edge heater and a trailing edge heater are provided in close proximity to the CMOS circuit. During a time period for a leading edge of an input pulse propagates through the CMOS circuit, the leading edge heater is turned off. During a time period for a trailing edge of the input pulse propagates through the CMOS circuit, the trailing edge heater is turned off. As result, an overall current flowing in the CMOS circuit, leading and trailing edge heaters is unchanged regardless of the repetition rate of the input pulse provided to the CMOS circuit.

Abstract: According to the preferred embodiment of the present invention, an ATD pulse generating mechanism is provided that overcomes the limitations of the prior art by compensating for process and power supply voltage variations that would normally effect the pulse width. In particular, the delays used to create the pulse width are adjusted to compensate for the effects of process and environmental variations, thereby providing a pulse width that is relatively constant over these variations.

Abstract: A clock for digital devices. Ordinarily, when multiple digital devices are clocked by a common clock, the clock signals frequently arrive at the digital devices at different times, due to propagation delays. The devices are thus not clocked synchronously. Under the invention, the multiple devices are connected to a common transmission line. A standing wave is generated on the transmission line, and the periodic collapse of the standing wave is used to clock the devices. Synchronous clocking to within about 1.0 nano-seconds has been attained, in a transmission line about ten feet long, wherein a clock signal ordinarily takes about 15 nanoseconds to travel from one end to the other.

Abstract: There is provided an adjustment circuit which delays a first and a second signal by a desired delay. After the first and the second signal are inputted to the adjustment circuit via a first and a second signal line, respectively, the first and the second signal are exchanged and are inputted via the second and the first signal line, respectively. A detection circuit receives the first and the second signal from the adjustment circuit, and detects the phase differences of these signals, before and after the exchange. The holding circuit holds a first phase difference detected by the detection circuit before the exchange, and holds a second phase difference detected by the detection circuit after the exchange. When the holding circuit holds the first and the second phase difference, a comparison circuit compares these phase differences. A counter counts in accordance with the comparison results of the comparison circuit, and sets the desired delay of the adjustment circuit.

Abstract: A delay circuit having standby state and active state and designed to output at least one signal obtained by delaying an input signal. The delay circuit comprises a storage circuit and at least one amplifier circuit. In operation, the storage circuit receives an input signal, generates a first voltage when the input signal is inverted, and generates a second voltage from a difference between the first voltage and a first supply voltage. The amplifier circuit amplifies the difference between the first voltage and the second voltage.

Abstract: A temperature compensation circuit for an IC device delay circuit compensates fluctuations of delay time in the IC device caused by temperature changes. The temperature compensation circuit accurately compensates the temperature even when there exist deviations of electrical characteristics in the circuit components in the IC device delay circuit, such as heat dissipation by a heater. The temperature compensation circuit includes a heater to generate heat to raise temperature of the IC device delay circuit when the heater is on, a flip-flop for turning the heater off when an input signal is provided to an input terminal of the IC device delay circuit and turns the heater on when the input signal returns to the flip-flop after a selected delay time, a plurality of delay elements each having a predetermined delay time for producing delayed signals, and a selector circuit for selecting one of the delayed signals from the delay elements.

Abstract: The output (3) of a level shifter (1) is split into two paths (4,5) with a delay (.tau..sub.1, .tau..sub.2) being introduced into at least one path to enable rise delay and fall delay to be controlled independently of one another. In the context of an integrated circuit which includes a memory device, the use of an additional path allows control of the set-up and hold times in that one transition can be speeded up or slowed down independently of the other transition to achieve the best possible set-up and hold times.

Abstract: A temperature protection device determines the operating temperature of an integrated circuit chip. The temperature monitor includes a delay line made up of serially connected delay cells. The propagation time of a signal through the delay cells is determined and this value is correlated to chip temperature. The chip temperature is compared to an operating range for the chip, and if the value is outside a predetermined range, an alert signal is produced.

Abstract: Digital signal delay lines with electrically programmable and trimmable delay times, including electrically erasable and reprogrammable delay times. Floating gate field effect transistors are programmed to select current, capacitance, and/or threshold and thereby set a delay time determined by acurrent charging of a capacitor up to a threshold voltage. Trimming after packaging avoids package offsets. Temperature and power supply voltage compensation by current combining gives compensation compatible with the electrical programming.

Abstract: A delay circuit includes a charge/discharge circuit and a logic circuit. The charge/discharge circuit is used to moderate a slope of change of an input signal. The logic circuit receives a charge/discharge signal output from the charge/discharge circuit, and is used to change an output signal of the logic circuit when the charge/discharge signal exceeds a threshold value of the logic circuit. A time constant in the charge/discharge circuit is varied in accordance with the change in the output signal of the logic circuit. This serves to alleviate the malfunctioning and timing constraint problems that occur after the threshold value of the next-stage circuit (logic circuit) is exceeded.

Abstract: A semiconductor integrated circuit has a de-skew circuit for reducing a skew of an incoming signal from a specific circuit with respect to a synchronous clock signal. The de-skew circuit controls the phase of an outgoing signal to be transmitted from the semiconductor integrated circuit to the specific circuit in response to the skew of the input signal. This arrangement decreases not only a skew of incoming signals from the specific circuit but also a skew of outgoing signals to the specific circuit.

Abstract: A delay line formed by a set of series-connected logic gates produces a sequence of output pulses in delayed response to a sequence of input pulses. The delay provided by a delay line changes with the frequency of its input pulse sequence because of temperature change in the gates due to changing power usage. Therefore a pulse stuffing circuit is provided to monitor the sequence of input pulses supplied to the delay line and to generate one or more stuff pulses when a period between successive input pulses exceeds a target maximum period. Each stuff pulse is sent as an additional input pulse to the delay circuit to decrease the period between input signal pulses. Although the delay circuit adds extra pulses to its output pulse sequence in response to the stuff pulses, the pulse stuffing circuit includes a gating circuit for removing those extra pulses from the output pulse sequence.

Abstract: The present invention discloses a delay circuit which obtains constant a delay time of delay circuit using an output capacitor by making the resistance of MOS transistor lowest, at the low voltage, middle at the intermediate voltage, and largest at the high voltage, so that the delay time of delay circuit using an output capacitor is kept constant regardless of the change in power source voltage.

Abstract: A delay circuit provides a substantially constant delay over a range of power-supply voltages. The delay circuit includes an input terminal that receives an input signal, an output terminal that provides an output signal, and a supply terminal that receives a supply voltage. A delay stage is coupled between the input and the output terminals and, when the supply voltage has a predetermined value, generates the output signal a predetermined delay time after it receives the input signal. A control stage is coupled between the supply terminal and the delay stage and regulates the supply current that flows between the supply terminal and the delay stage such that the delay time of the delay stage remains substantially equal to the predetermined delay time as the supply voltage varies from the predetermined value.

Abstract: A dynamic voltage reference circuit for generating one or more control signals for use in controlling a delay circuit or other circuit that requires compensation for process variations. The control signals are generated without drawing DC current at times other than when the active edge is propagating through the delay circuit. As a result, a reference generator with reduced power consumption is realized.

Abstract: A delay circuit which employs a Miller effect to delay a signal while driving a subsequent amplifier stage. The Miller effect is dependent upon loading of the circuits on an integrated circuit upon which the delay circuit is implemented, which allows the delay circuit to compensate its delay in relation to other process variation delays present on the integrated circuit. The delay circuit has a first delay stage which delays an input signal and drives a second stage. The delay circuit incorporates a dummy drive stage which adds loading to the first delay stage. In addition, the dummy stage experiences dynamic loading of the delay chain between the first and second stages which allows the coupling of the effect of this dynamic loading back to the first stage through the Miller effect.

Abstract: A temperature compensation circuit which includes a signal detecting circuit provided on a signal supply path which outputs logic signals to a target circuit. Also included are switch elements which turn current on/off to heater elements each time the signal detecting circuit detects that the logic signals are being applied to the target circuit. The power source of the invention therefore only needs to endure the same amount of current applied to the target circuit which leads to a reduction in power consumption.

Abstract: A current sensing circuit which provides for accurate in-line current sensing with extremely low insertion loss. A low valued resistor (e.g., 0.005 ohms) is connected in series with the source and load of the current to be measured. An analog-to-digital converter (ADC) is used to measure the resulting voltage generated across the resistor. In order to minimize inaccuracies due to voltage offsets introduced by the measurement circuitry when measuring the low voltages generated across such a low resistance, the ADC is "chopped," thereby causing self cancellation of any such offset voltages. A voltage source which provides a reference voltage for the ADC has a temperature coefficient which is approximately equal in magnitude to the temperature coefficient of the resistor. Hence, for a given current through the resistor, the reported voltage as measured across the resistor remains constant over temperature.

Abstract: A semiconductor integrated circuit, having circuit blocks to be evaluated in AC performance, includes a first circuit for inputting a first signal and a second signal generated in the interior of the semiconductor integrated circuit. The first circuit outputs a transient current when the first signal and the second signal change simultaneously. In the semiconductor integrated circuit, the transient current (third signal) is output to a external terminal of the semiconductor integrated circuit for evaluating the AC performance of the block.

Abstract: A temperature balanced circuit is provided which is capable of, in case a CMOS.cndot.IC is utilized as a delay circuit, giving a constant delay time to an input signal to the delay circuit even if the frequency of the input signal is varied. A delay circuit 11 and a dummy circuit 11 having the same construction as that of the delay circuit are provided in a CMOS.cndot.IC. There are provided a counter counting first pulse signals CP1 supplied to the delay circuit during a fixed time interval and arithmetic unit finding a difference between a count value of this counter and a predetermined value, and the same number of second pulse signals as the difference value found by the arithmetic unit is supplied to the dummy circuit, thereby to define to a constant value both the number of the first pulses and the number of the second pulses supplied to the CMOS.cndot.IC within a unit time interval, which results in uniformity of an amount of heat generated in the CMOS.cndot.IC.

Abstract: The present invention concerns a delay circuit that provides a fixed amount of delay that is generally independent of process variations. An input resistance is provided that may be presented to a threshold device, such as an inverter, that may then be presented as an output. The output of the threshold device may also be presented through a feedback path comprising a capacitive device to the input of the threshold device. The feedback through the capacitive load actively resists the movement of the load. As a result, the delay provided by the circuit is generally resistant to process variations.

Abstract: A composite load circuit for use within another circuit includes at least one amplifying transistor. The composite load circuit includes first and second transistors connected in parallel. Each load transistor has a gate that receives a common control voltage. Each load transistor also has a different turn-on threshold voltage. A resistor, connected in parallel with the load transistors, limits an effective impedance of the load transistors.

Abstract: A delay circuit comprising at least one capacitor with one electrode thereof is connected to a fixed potential, a signal transmission line, and at least one switch means between the other electrode of the capacitor and the signal transmission line. The switch means makes electrical connection or disconnection between the capacitor and the signal transmission line in accordance with an actual supply voltage value.

Abstract: A delay circuit provides a substantially constant delay over a range of power-supply voltages. The delay circuit includes an input terminal that receives an input signal, an output terminal that provides an output signal, and a supply terminal that receives a supply voltage. A delay stage is coupled between the input and the output terminals and, when the supply voltage has a predetermined value, generates the output signal a predetermined delay time after it receives the input signal. A control stage is coupled between the supply terminal and the delay stage and regulates the supply current that flows between the supply terminal and the delay stage such that the delay time of the delay stage remains substantially equal to the predetermined delay time as the supply voltage varies from the predetermined value.

Abstract: A control transistor is connected in parallel with an input transistor of a bias generation circuit in a voltage control delay circuit. A power supply potential Vcc is divided by voltage divider resistors to be applied to the gate of the control transistor. Reduction in the power supply potential Vcc causes reduction in a current Ib flowing to the control transistor, and a current Ic=Ia+Ib flowing to a delay time variable element. When the power supply potential Vcc is reduced, the factor of a delay time period of delay time variable elements becoming shorter due to a smaller amplitude of a clock signal is canceled with the factor of the delay time period of the delay time variable elements become longer due to a smaller current Ic flowing thereto. Therefore, variation in the delay time period can be suppressed to a low level.