Movable Contact Probe, Per Se Patents (Class 33/559)
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Patent number: 11738462Abstract: A coordinate calibration method of a manipulator is provided and includes steps of: (a) controlling the manipulator to move in accordance with a movement command, and acquiring the reference anchor points reached by the manipulator; (b) acquiring a rotation matrix and a translation vector according to the reference anchor points, and acquiring a reference coordinate system accordingly; (c) when the manipulator returning to the work space after temporarily leaving, controlling the manipulator to move in accordance with the movement command, and acquiring the actual anchor points reached by the manipulator; (d) acquiring a rotation matrix and a translation vector according to the actual anchor points, acquiring a corresponding actual coordinate system accordingly, and acquiring a coordinate compensation information by comparing the rotation matrixes and the translation vectors; and (e) adjusting the manipulator according to the coordinate compensation information, and maintaining the manipulator to operate in tType: GrantFiled: May 18, 2021Date of Patent: August 29, 2023Assignee: DELTA ELECTRONICS, INC.Inventors: Chi-Huan Shao, Chi-Shun Chang
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Patent number: 11702316Abstract: Disclosed is an elevator inspection system, having: a sensor implement; a robotic platform supporting the sensor, the robotic platform configured to inspect a hoistway; a controller operationally connected to the robotic platform and the sensor, wherein the controller is configured to define hoistway model data for the hoistway, from sensor data, corresponding to locations and shape boundaries of the hoistway and doorway openings formed in the hoistway.Type: GrantFiled: March 16, 2020Date of Patent: July 18, 2023Assignee: OTIS ELEVATOR COMPANYInventors: Tadeusz Pawel Witczak, Joseph Crute
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Patent number: 11644298Abstract: An inductive position detector for stylus position measurement in a scanning probe comprises a coil board configuration located along a central axis in the probe. The coil board configuration includes a field generating coil configuration that surrounds a hole in the coil board configuration, a top axial sensing coil configuration and a bottom axial sensing coil configuration, and N top rotary sensing coils and N bottom rotary sensing coils. A stylus-coupled disruptor configuration includes a cylindrical disruptor element that is configured to move and fit within the hole of the coil board configuration, and moves along Z (axial) and X-Y (rotary) directions in a motion volume. The field generating coil configuration generates a changing magnetic flux (e.g., encompassing all or at least part of the cylindrical disruptor element), and coil signals indicate the cylindrical disruptor element and/or stylus positions.Type: GrantFiled: December 28, 2020Date of Patent: May 9, 2023Assignee: Mitutoyo CorporationInventor: Christopher Richard Hamner
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Patent number: 11543899Abstract: An inductive position detector for stylus position measurement in a scanning probe comprises a coil board configuration located along a central axis in the probe. The coil board configuration includes a field generating coil configuration and top and bottom axial and rotary sensing coil configurations. The field generating coil configuration generates a changing magnetic flux, and coil signals indicate conductive disruptor element and/or stylus positions. At least one misalignment compensation element is configured to reduce a signal offset that results from a misalignment of at least one coil of the coil board configuration (e.g., the coil board configuration may comprise a printed circuit board with a plurality of layers in which the coils are located and the misalignment of the at least one coil may result from a registration error, such as within manufacturing tolerances, in a layer to layer registration as part of a fabrication process).Type: GrantFiled: December 28, 2020Date of Patent: January 3, 2023Assignee: Mitutoyo CorporationInventor: Christopher Richard Hamner
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Patent number: 11409258Abstract: An information processing device is connected to a measurement device provided in the vicinity of a machine tool for machining a workpiece using a tool and a numerical control device configured to control the machine tool. The information processing device includes: a display unit configured to display information; a first acquisition unit configured to acquire, from the measurement device, measurement information measured by the measurement device; a second acquisition unit configured to acquire, from the numerical control device, state information indicating a state of the machine tool; and a display control unit configured to cause the display unit to display the measurement information and the state information.Type: GrantFiled: February 24, 2020Date of Patent: August 9, 2022Assignee: FANUC CORPORATIONInventor: Sichen Liu
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Patent number: 11300396Abstract: A non-Cartesian coordinate positioning machine that includes an extendable leg assembly for positioning a component such as a measurement probe within a working volume of the machine. The extendable leg assembly includes a first member and a second member which move relative to one another when the extendable leg assembly changes length. The first member including an axial arrangement of magnets forming part of a linear motor for extending and retracting the extendable leg assembly, and at least one resilient member for absorbing at least some of any axial thermal expansion or contraction of the magnets in use.Type: GrantFiled: October 8, 2020Date of Patent: April 12, 2022Assignee: RENISHAW PLCInventor: Stephen Mark Angood
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Patent number: 11204229Abstract: An articulating probe head for a measuring system comprising cooling elements. The cooling elements are modulated in response to the temperature of or the power dissipated in the probe head such that its temperature remains stable during operation.Type: GrantFiled: February 20, 2020Date of Patent: December 21, 2021Assignee: TESA SAInventors: Dikran Antreasyan, Laurent Demierre
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Patent number: 11118889Abstract: In a method for measuring a gauge (20), the invention provides a standard (30). The standard has a calibrated standard distance (33) between a standard reference plane (31) and a standard detection line (35), being mutually parallel. When the standard is placed with its standard reference plane onto a gauge reference plane (21), the standard is traced with a tracing point (12) of a measuring apparatus (10). Thereby it is possible to reliably measure the distance (43) between the standard detection line (35) and the apparatus reference plane (11), and hence the distance between the gauge reference plane (21) and the apparatus reference plane (11). The invention allows to reliably measure gauges in an affordable, non-complex measuring apparatus, in cases where, in order to reliably measure gauges in the apparatus, such gauges cannot be placed with their gauge reference planes onto the apparatus reference plane.Type: GrantFiled: October 17, 2017Date of Patent: September 14, 2021Inventor: Reginald Galestien
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Patent number: 11105605Abstract: A metrology device with automated compensation and/or alert for orientation errors. The device may include a processor, a probe portion and at least one orientation sensor. The probe provides an output representative of a raw measurement of a characteristic of a device under test and the orientation sensor provides a sensor output representative of an orientation of the metrology device to the device under test. The processor applies a correction factor to the raw measurement in response to the sensor output to establish a compensated measurement to compensate for misalignment of the metrology device to the device under test. In addition, or alternatively, the processor provides an alert indicating the existence and/or extent of the misalignment.Type: GrantFiled: February 15, 2019Date of Patent: August 31, 2021Assignee: THE L.S. STARRETT COMPANYInventor: Jeffrey M. Wilkinson
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Patent number: 10969298Abstract: A multi-dimensional vibration control method based on piezoelectric ceramic actuator applied to wind tunnel test of aircraft model. The pitch and yaw acceleration sensors arranged on the center of mass of the aircraft model are used to measure the two components of the main vibration acceleration of the aircraft model, and the main vibration vector of the aircraft model is obtained and the real-time vibration plane of the strut is determined. Inertia is introduced to solve the dynamic bending moment on the active section of the multi-dimensional vibration damper, and then the stress distribution on the active section is obtained. The multi-dimensional active vibration control system is adopted to improve the stability and reliability of the active vibration control system of wind tunnel model, extend the service life of piezoelectric ceramic actuator, and ensure the quality of wind tunnel test data and the safety of wind tunnel test.Type: GrantFiled: September 20, 2019Date of Patent: April 6, 2021Assignee: DALIAN UNIVERSITY OF TECHNOLOGYInventors: Wei Liu, Mengde Zhou, Bing Liang, Linlin Tang, Zhuang Yao, Zhengquan Wen, Yang Zhang, Likun Si, Zhenyuan Jia
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Patent number: 10724841Abstract: There are provided a detector, a surface property measuring machine and a roundness measuring machine for automatically measuring a plurality of surfaces to shorten the time necessary for measurement. This problem is solved by a detector provided with a stylus for supporting a contact coming in contact with a surface of an object to be measured, a holder configured to hold the stylus, a measuring part configured to hold the holder to be capable of swinging by a rotating shaft and detect a displacement of the holder, and a body configured to accommodate the measuring part, wherein the holder holds the stylus such that a stylus axis as an axis of the stylus and a body axis as an axis of the body are in parallel, and the stylus axis and the body axis are offset in a first direction perpendicular to the body axis and the rotating shaft.Type: GrantFiled: August 19, 2019Date of Patent: July 28, 2020Assignee: Tokyo Seimitsu Co., Ltd.Inventor: Hideki Morii
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Patent number: 10605581Abstract: An articulating probe head for a measuring system comprising cooling elements. The cooling elements are modulated in response to the temperature of or the power dissipated in the probe head such that its temperature remains stable during operation.Type: GrantFiled: November 21, 2016Date of Patent: March 31, 2020Assignee: TESA SAInventors: Dikran Antreasyan, Laurent Demierre
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Patent number: 10591271Abstract: A method for calibrating a rotating device attached to a movable part of a coordinate measuring device having a first part secured to the movable part and a second part rotatable relative to the first part about an axis of rotation of the turning device, on which second part a measuring sensor for measuring workpieces can be attached. The rotating device or a body connected to the second part is moved to a local area of a position determining device by a drive system of the coordinate measuring device, which position measuring device is connected to the coordinate measuring device, by means of at least one sensor of the position determining device. A position of the rotating device or of the body connected to the second part is determined relative to the position determining device, and the rotating device is calibrated in accordance with the determined position.Type: GrantFiled: September 12, 2017Date of Patent: March 17, 2020Assignee: Carl Zeiss Industrielle Messtechnik GmbHInventors: Tobias Held, Rainer Sagemueller, Dominik Seitz
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Patent number: 10514257Abstract: There is provided a detecting device which detects a contact with an object, which includes, a fixed portion provided in the detecting device, a shaft portion, and a base portion which is connected to the shaft portion and configured to move relative to the fixed portion, a sensor which measures a displacement resulting from an inclination of the base portion relative to the fixed portion caused by a contact between an object and the shaft portion, and a control portion which determines if a contact between an object and the shaft portion occurs or not based on the measured displacement.Type: GrantFiled: September 19, 2017Date of Patent: December 24, 2019Assignee: DMG MORI Company LimitedInventors: Ken Onoe, Akira Kimura, Ryosuke Kamiko
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Patent number: 10011491Abstract: A polycrystalline CVD diamond material comprising a surface having a surface roughness Rq of less than 5 nm, wherein said surface is damage free to the extent that if an anisotropic thermal revealing etch is applied thereto, a number density of defects revealed by the anisotropic thermal revealing etch is less than 100 per mm2.Type: GrantFiled: April 13, 2015Date of Patent: July 3, 2018Assignee: Element Six Technologies LimitedInventors: Chee-Leong Lee, Erdan Gu, Geoffrey Alan Scarsbrook, Ian Friel, Martin David Dawson
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Patent number: 9983107Abstract: The field of the invention generally relates to probes, related devices and methods for measuring material properties. In an embodiment, the present invention provides a test probe for use in a reference point indentation device. The test probe has an end proximal to a tip and an end distal to the tip. The distal end of the test probe has a self-centering mate comprising a countersink of about 90 degrees to about 100 degrees to a depth of between 0.010 in. and 0.035 in.Type: GrantFiled: July 22, 2013Date of Patent: May 29, 2018Assignee: The Regents of the University of CaliforniaInventors: Paul K. Hansma, Connor Randall, Daniel Bridges
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Patent number: 9874439Abstract: Multidirectional roughness measurement insert for determining a measured variable that is characteristic of the roughness of a surface, having a carrier body on which a stylus holder is arranged for holding a stylus, an analog sensor, which converts the movements of the carrier body into measurement signals that are characteristic of the roughness of a surface of workpiece, a stylus to be coupled to the carrier body, comprising a rod-shaped shaft and a scanning head mounted on the shaft, wherein the scanning head is at least one section of a test body, which is essentially rotationally symmetrical to at least one section of the rod-shaped shaft, or wherein the scanning head is at least one section of an essentially rotationally symmetrical test body, which is arranged on a distal end of at least one section of the rod-shaped shaft.Type: GrantFiled: September 3, 2014Date of Patent: January 23, 2018Assignee: Blum-Novotest GmbHInventors: Heribert Bucher, Wolfgang Reiser, Norbert Moersch
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Patent number: 9869537Abstract: A contact probe includes a stylus, a spring, a magnetic body, and a permanent magnet. The stylus is displaceable in an X direction and a tip of the stylus makes contact with a measured object. A first end of the spring is fixated and a second end provides spring force along the X direction. A position of the magnetic body is fixated with respect to the stylus. The permanent magnet is arranged separated from the magnetic body so as to generate a magnetic force along the X direction between the magnetic body and the permanent magnet.Type: GrantFiled: March 3, 2016Date of Patent: January 16, 2018Assignee: MITUTOYO CORPORATIONInventors: Kazuhiko Hidaka, Takeshi Yamamoto
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Patent number: 9835433Abstract: A touch probe for a coordinate measuring machine with a processor which is programmed to generate a trigger signal signalling a contact between a stylus of the probe and a workpiece, whenever one of a plurality displacement signals exceeds a corresponding threshold. In addition, or in alternative, a delayed trigger is generated based on a processing a plurality of samples of displacement signals that are stored in a buffer. The processor is programmed to minimize anisotropy of the probe response. Furthermore, the thresholds can be modified during operations based on commands received from the CMM controller.Type: GrantFiled: May 9, 2017Date of Patent: December 5, 2017Assignee: TESA SAInventors: Dikran Antreasyan, Christophe Jaquet, Serge Mariller
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Patent number: 9599446Abstract: A small sealing gauge may include a body that is attached to a site to be measured, a lever that linearly moves by contact with a moving part while moving in a state of being inserted into a hole of the body, and a dial gauge that is inserted to a back side of the hole in the body to measure an amount of movement of the lever through contact with the lever.Type: GrantFiled: December 15, 2014Date of Patent: March 21, 2017Assignee: Hyundai Motor CompanyInventors: Tae Il Min, Si Yoon Lee
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Patent number: 9551559Abstract: The 3D contact measuring device senses work pieces in machine tools for adjusting the zero point of a numerically controlled machine tool or for positioning tasks. The device comprises a preferably elongated housing, a sensing arm projecting from the housing and bearing a sensing tip. The sensing arm being movable in the direction of a measuring axis and pivotable in all directions about the measuring axis. A sensing lever is connected to the sensing arm and forms the first universal joint, and a measuring device for detecting a parameter, which characterizes the displacement and/or the pivoting of the sensing arm. A further control surface forms a second universal joint. An elongated toothed rack of a gear transmission is aligned along the measuring axis and is movably supported and is coupled to the sensing lever via the second universal joint.Type: GrantFiled: December 12, 2012Date of Patent: January 24, 2017Assignee: Tschorn GmbHInventor: Ralf Tschorn
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Patent number: 9303968Abstract: A lever-type measuring machine swinging around a supporting point includes a stylus measuring a shape of a measured object, an arm having a first end connected to the stylus and a second end connected to the supporting point, and a balancer having a first end connected to the supporting point. The balancer is formed of a material having high specific flexural rigidity. The lever-type measuring machine enables more accurate measurement.Type: GrantFiled: September 11, 2014Date of Patent: April 5, 2016Assignee: MITUTOYO CORPORATIONInventors: Yasunori Mori, Takeshi Yamamoto, Atsushi Shimaoka, Tomoyuki Miyazaki, Kazuhiko Hidaka
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Patent number: 9038282Abstract: A method of operating a coordinate positioning apparatus comprising an articulated head having at least one rotational axis. The method comprises, in any suitable order, loading at least one interchangeable task module onto the articulated head; and loading at least one interchangeable task module counterweight on the articulated head. The at least one interchangeable task module counterweight at least partially counterbalances the weight of the at least one task module on the articulated head about the at least one axis.Type: GrantFiled: April 19, 2011Date of Patent: May 26, 2015Assignee: RENISHAW PLCInventors: David R. McMurtry, Nicholas J. Weston, Richard G. Dewar, Matthew H. Freeman
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Patent number: 9009985Abstract: A probe deployment mechanism of a coordinate measuring machine provides for extending and retracting a probe. The probe is displaceable with respect to the actuator body connected to the measuring machine. A locator coupling secures the probe to the actuator body at the extended position for taking measurements. A drive coupled to the probe displaces the probe between the extended and retracted positions but at the extended position, the drive is releasable from the probe for kinetically isolating the locator coupling.Type: GrantFiled: April 30, 2013Date of Patent: April 21, 2015Assignee: Quality Vision International, Inc.Inventors: William E. Stevens, Jason Patti, David E. Lawson
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Patent number: 8991246Abstract: A gear measuring method allows multi-point continuous measurement using a touch probe and is capable of reducing measuring time compared with known methods. For example, a base action for moving a sensing element of a touch probe along an ideal tooth form line of a workpiece (gear; W) or a tooth form line determined by calculation by controlling the movement of the sensing element and the rotation of the workpiece (W) and, in addition, an oscillation action for receiving first signals (ON signals or OFF signals) from the touch probe by bringing the sensing element into contact with the tooth surface of the workpiece during the base action and subsequently for receiving second signals (OFF signals or ON signals) from the touch probe by moving the touch probe in a direction along which the sensing element is separated from the tooth surface of the workpiece are continuously performed.Type: GrantFiled: September 15, 2010Date of Patent: March 31, 2015Assignee: Mitsubishi Heavy Industries, Ltd.Inventors: Yoko Hirono, Takahide Tokawa, Naohiro Otsuki, Yoshihiro Nose
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Patent number: 8832953Abstract: An improved coordinate measuring apparatus is provided. The coordinate measuring apparatus has a device that holds a CMM adapter plate in a way that simulates the locating points on the electromagnetic device in the CMM. Once in place, the threaded cube on the adapter plate is aligned to the CMM machine axes by holding a sliding V-block on the device against any corner of the cube. The screws that hold the threaded cube in the adapter plate are then tightened, and the adapter plate is released from the device. The threaded cube is now square to the CMM X-Y-Z axes.Type: GrantFiled: November 7, 2011Date of Patent: September 16, 2014Assignee: Q-Mark Manufacturing, Inc.Inventors: Mark Osterstock, Clinton S. Clark
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Patent number: 8782915Abstract: A measuring device (10) and method for measuring a surface profile of a workpiece. A measuring carriage (15) is moved in a straight line at a distance from the workpiece surface in a moving direction (x), without accelerating a carried probe tip (25). The free probe end (40) of the probe tip (25) rests on the workpiece surface (11) with a measuring force (Fm) and is deflected during the measurement in a measuring direction (z), transverse to moving direction (x), the surface profile causes a track-dependent deflection (zT) of the probe end (49). A measured value receiver (45) detects the deflecting value (s) describing the deflection of the probe end (40) in measuring direction (z). In an analyzing unit (21), a measuring force change value describing the change of the measuring force (Fm) between the probe end (40) and the workpiece surface (11) is formed for detecting measuring errors/inaccuracies.Type: GrantFiled: November 4, 2011Date of Patent: July 22, 2014Assignee: Carl Mahr Holding GmbHInventors: Matthias Reitemeyer, Heinz-Joachim Kedziora
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Publication number: 20140173924Abstract: A soft collision grating scale and measuring method thereof comprises a fixed scale, a sliding auxiliary scale slidably disposed relative to the fixed scale, and a moving pin sliding relative to the sliding auxiliary scale. The moving pin and the sliding auxiliary scale move synchronically. A buffering mechanism is disposed on the moving pin. When the moving pin sliding relative to the sliding auxiliary scale cooperates with a buffering force of the buffering mechanism, a collision between the moving pin and stopping faces of an inspected target is automatically offset to attain a soft collision effect, which prevents the moving pin from breaking to keep an normal measurement operation and increases the precision of measurement by the fact that the sliding auxiliary scale does not rebound and an offset distance caused by reversely moving the moving pin relative to the sliding auxiliary scale can be computed.Type: ApplicationFiled: September 8, 2011Publication date: June 26, 2014Applicant: GUANGDONG RATIONAL PRECISION INSTRUMENT CO., LTD.Inventor: Mengliang Wu
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Patent number: 8726409Abstract: A method for operating a scanning probe microscope at elevated scan frequencies has a characterization stage of sweeping a plurality of excitation frequencies of the vertical displacement of the scanning element; measuring the value attained by the reading parameter at the excitation frequencies; and identifying plateau regions of the response spectrum of the reading parameter. The reading parameter variation is limited within a predetermined range over a predefined frequency interval, thereby defining corresponding fast scanning frequency windows in which the microscope assembly is sufficiently stable to yield a lateral resolution comparable to the one obtained during slow measurements. The measurement stage includes driving the scanning element along at least a scanning trajectory over the surface of the specimen at a frequency selected among the frequencies included in a fast scanning frequency window.Type: GrantFiled: September 12, 2011Date of Patent: May 13, 2014Assignee: Consiglio Nazionale Delle RicercheInventors: Friedrich Esch, Carlo Dri, Giovanni Comelli, Cristina Africh, Alessio Spessot
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Publication number: 20140068958Abstract: There are provided a first (Y-axial direction) moving unit, a movement auxiliary unit for moving in substantially parallel with the first moving unit, and a second (X-axial direction) moving unit for moving substantially perpendicular to the first moving unit. Force generated for moving the second moving unit is received by the movement auxiliary unit to perform driving of the XY directions. Thus, when a measuring probe provided on the second moving unit is scanned in the XY directions, vibrations of the first moving unit can be suppressed without the first moving unit receiving a counteraction of force that acts in a direction substantially perpendicular to the moving direction of the first moving unit.Type: ApplicationFiled: September 10, 2013Publication date: March 13, 2014Applicant: Panasonic CorporationInventor: Keishi KUBO
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Patent number: 8578619Abstract: A contact type prove achieves a high-precision measurement of a shape of even a steeply-inclined surface in the vicinity of vertical by controlling a contact force stably. In a shape measuring method for measuring the shape of the surface of a measured object by moving a contact type probe along the surface of the measured object, a slope of the measured object surface is estimated depending on the magnitude of a component force of the contact force applied to the probe and when it is determined that the slope is in the vicinity of vertical, a probe supporting unit is moved in a direction perpendicular to the moving direction of the probe supporting unit.Type: GrantFiled: January 30, 2012Date of Patent: November 12, 2013Assignee: Canon Kabushiki KaishaInventor: Ryusuke Nakajima
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Patent number: 8533970Abstract: An apparatus for measuring objects, in particular to a coordinate measuring unit, is provided. The unit has a probe which is movable relative to an object to be measured by means of an actuator to sample the surface of the object in a contacting manner, wherein a sampling body, whose front end is designed as a measuring tip for a contact with the object is supported at the probe. The relative position of the measuring tip with respect to the probe is determined. The sampling body is supported at the probe with movement play along at least one direction. A change in the inclination of the sampling body relative to the probe, or vice versa, can be detected via a measurement of a test parameter.Type: GrantFiled: April 6, 2011Date of Patent: September 17, 2013Assignee: Stotz Feinmesstechnik GmbHInventor: Milan Stamenkovic
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Patent number: 8468707Abstract: A diamond element (10) having a convex surface is disclosed, the convex surface including a spherical segment for which the maximum peak to valley deviation from a perfect spherical surface is less than about 5 ?m. The diamond element (10) may be a solid polycrystalline diamond material and/or may comprise base material which is coated with diamond. Alternatively or in addition, the RMS deviation from a perfect spherical surface may be less than about 500 nm, or the RMS roughness less than about 30 nm. A diamond element (10) with a radius of curvature less than about 20 mm is also disclosed. In one aspect a diamond element (10) having a conical half-angle greater than about 10° is described. Diamond elements (10) of this type are intended for use as metrology tips.Type: GrantFiled: January 18, 2008Date of Patent: June 25, 2013Assignee: Element Six LimitedInventors: Geoffrey Alan Scarsbrook, Timothy Peter Mollart
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Publication number: 20130108725Abstract: An injection unit includes a cylinder casing comprising an inner cylindrical surface extending along an axis, and a piston housed in the casing and translatable along the axis between an advanced and a retracted position. The piston includes a piston radial surface in facing relation to the inner cylindrical surface, and the piston radial surface has a measurement detection feature. A probe is fixed relative to the cylinder casing, the probe communicating with the measurement detection feature when the piston is in and moving between the advanced and retracted positions to measure the translation of the piston.Type: ApplicationFiled: May 17, 2011Publication date: May 2, 2013Applicant: ATHENA AUTOMATION LTD.Inventors: Robert D. Schad, Carsten Link, Stephen Mracek
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Patent number: 8402668Abstract: An improved coordinate measuring apparatus is provided. The coordinate measuring apparatus has a device that holds a CMM adapter plate in a way that simulates the locating points on the electromagnetic device in the CMM. Once in place, the threaded cube on the adapter plate is aligned to the CMM machine axes by holding a sliding V-block on the device against any corner of the cube. The screws that hold the threaded cube in the adapter plate are then tightened, and the adapter plate is released from the device. The threaded cube is now square to the CMM X-Y-Z axes.Type: GrantFiled: January 6, 2009Date of Patent: March 26, 2013Assignee: Q-Mark Manufacturing, Inc.Inventors: Mark David Osterstock, Clinton Scott Clark
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Patent number: 8290695Abstract: Probe data is analyzed to derive Longitudinal Speed Profiles (LSPs) and an Optimal Longitudinal Speed Profile (18) for each road segment or link in a digital map network. The Longitudinal Speed Profiles (LSPs) profiles are calculated during defined time spans whereas the Optimal Longitudinal Speed Profile (18) is based on the LSP for the time span corresponding only to free flow traffic conditions. All of the LSPs can used to create a respective energy cost for each time span, or only the OLSP (18) can be used (or alternatively the RRDSL 16 or LRRDSL 17) to calculate an energy cost for the free flow conditions only. The energy cost can be used to predict the energy required by a vehicle to traverse the link. Navigation software can use the energy cost to plan the most energy efficient route between two locations in the digital map. Sensory signals can be activated if a driver strays from the Optimal Longitudinal Speed Profile (18) to achieve extremely high levels of energy efficiency.Type: GrantFiled: January 13, 2010Date of Patent: October 16, 2012Inventors: Volker Hiestermann, Robert Joannes Van Essen, Edwin Bastiaensen, Stephen T'Siobbel
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Patent number: 8261461Abstract: A linear guiding mechanism includes a fixed member, a moving member, a first double parallel leaf spring mechanism and a second double parallel leaf spring mechanism arranged between the fixed member and the moving member and configured to movably support the moving member. The first double parallel leaf spring mechanism and the second double parallel leaf spring mechanism are arranged at an angle other than 180° (for example, 90°) about an axis of movement of the moving member.Type: GrantFiled: January 14, 2010Date of Patent: September 11, 2012Assignee: Mitutoyo CorporationInventors: Atsushi Shimaoka, Takeshi Yamamoto
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Patent number: 8240057Abstract: A method of manufacturing a self-aligned stylus with high sphericity includes the steps of: forming a polymeric layer on a substrate; placing a sphere on the polymeric layer; softening the polymeric layer to make a portion of the sphere sink into the polymeric layer; forming a specific light absorbing layer on the polymeric layer; illuminating the sphere and the specific light absorbing layer with specific light such that the specific light is focused by the sphere to expose the polymeric layer to form an exposed portion and an unexposed portion; removing the specific light absorbing layer; and baking the polymeric layer and then removing the unexposed portion. A self-aligned stylus with high sphericity is also disclosed.Type: GrantFiled: April 22, 2008Date of Patent: August 14, 2012Assignee: National Taiwan UniversityInventors: Wen-Pin Shih, Yao-Chuan Tsai, Duo-Ru Chang, Li-Chi Tsao, Ming-Dao Wu, Po-Jen Shih
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Patent number: 8225519Abstract: A contact type measurement device performs measurement with displacement of a probe, while a contact member attached to the probe is in contact with an object to be measured. Data on the relationship of a contact force of the probe to the object to be measured with an angle between the central axis of the probe and the direction of gravity, the amount of displacement of the probe, and a fluid pressure for applying a pushing-out or pulling-in force to the probe is stored in advance and, on the basis of this data, the fluid pressure or the amount of displacement of the probe is controlled to automatically and precisely adjust a fine contact force of the probe to the object to be measured.Type: GrantFiled: February 24, 2011Date of Patent: July 24, 2012Assignee: Fanuc CorporationInventors: Yonpyo Hon, Kenzo Ebihara, Masayuki Hamura
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Publication number: 20120096728Abstract: A measuring device (10) and method for measuring a surface profile of a workpiece. A measuring carriage (15) is moved in a straight line at a distance from the workpiece surface in a moving direction (x), without accelerating a carried probe tip (25). The free probe end (40) of the probe tip (25) rests on the workpiece surface (11) with a measuring force (Fm) and is deflected during the measurement in a measuring direction (z), transverse to moving direction (x), the surface profile causes a track-dependent deflection (zT) of the probe end (49). A measured value receiver (45) detects the deflecting value (s) describing the deflection of the probe end (40) in measuring direction (z). In an analyzing unit (21), a measuring force change value describing the change of the measuring force (Fm) between the probe end (40) and the workpiece surface (11) is formed for detecting measuring errors/inaccuracies.Type: ApplicationFiled: November 4, 2011Publication date: April 26, 2012Inventors: Matthias Reitemeyer, Heinz-Joachim Kedziora
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Patent number: 8144340Abstract: A surface sensing device for use in position determining apparatus has an elongate stylus with a tip for scanning the surface of a workpiece to be measured. Lateral displacements of the stylus tip are detected by a light beam which passes along the stylus from a light source to a retroreflector. This reflects the beam back via a beamsplitter to a position sensitive detector. The stylus is mounted for longitudinal displacement on a carriage. The longitudinal displacement is measured by another light beam projected by the beamsplitter onto a second position sensitive detector.Type: GrantFiled: October 26, 2010Date of Patent: March 27, 2012Assignee: Renishaw PLCInventors: Geoffrey McFarland, Kevyn Barry Jonas
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Patent number: 8140178Abstract: In a simultaneous multi-axis measuring machine tool system including linear drive axes and rotation axes to measure a surface shape of an object to be measured by using an on-board measuring device having a probe mounted, at one end thereof, with a spherical contactor, a numerical controller controls driving of the linear drive axes and the rotation axes so that a central axis of the probe is always oriented in a direction perpendicular to the surface of the object to be measured and that the spherical contactor of the probe comes in contact with and follows a surface of the object to be measured.Type: GrantFiled: June 4, 2009Date of Patent: March 20, 2012Assignee: Fanuc LtdInventors: Yonpyo Hon, Kenzo Ebihara, Akira Yamamoto, Masayuki Hamura
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Patent number: 8051576Abstract: An attitude arm mounted to a support arm is rotatable about a pivot. The attitude arm holds a stylus gauge, which generates a signal representing deflection of the stylus in a measurement direction as the stylus follows a surface of a workpiece rotated on a turntable. An attitude switching mechanism allows switching between a first stylus attitude generally aligned with the turntable spindle axis and a second stylus attitude generally aligned perpendicular to the turntable spindle axis. To enable alignment of the measurement direction with the spindle axis, first and second adjusters enable the stylus tip to be moved perpendicular to the spindle axis and the measurement direction when in the first and second stylus attitudes, respectively. An orientation mechanism is provided to rotate the measurement direction of the stylus. A stylus tilt mechanism is provided to tilt the stylus about a tilt axis parallel with the measurement direction.Type: GrantFiled: May 1, 2007Date of Patent: November 8, 2011Assignee: Taylor Hobson LimitedInventors: Ivor McDonnell, Jeremy Ayres
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Publication number: 20110232118Abstract: A contact type measurement device performs measurement with displacement of a probe, while a contact member attached to the probe is in contact with an object to be measured. Data on the relationship of a contact force of the probe to the object to be measured with an angle between the central axis of the probe and the direction of gravity, the amount of displacement of the probe, and a fluid pressure for applying a pushing-out or pulling-in force to the probe is stored in advance and, on the basis of this data, the fluid pressure or the amount of displacement of the probe is controlled to automatically and precisely adjust a fine contact force of the probe to the object to be measured.Type: ApplicationFiled: February 24, 2011Publication date: September 29, 2011Applicant: FANUC CORPORATIONInventors: Yonpyo HON, Kenzo EBIHARA, Masayuki HAMURA
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Patent number: 8006402Abstract: A moving vector calculation unit calculates a moving vector M representing a quantity and a direction of movement of a probe on basis of a stylus displacement vector, a stylus displacement vector D, and a direction change angle ? of the stylus displacement vector D that is caused by a frictional force between a stylus 32 and the measuring surface 5a during scanning of the measuring surface 5a by the stylus 32. The stylus displacement vector D is a vector including a quantity and a direction of position displacement of the stylus 32 relative to the probe 5. Movement of an XY-stage 7 is controlled so that the probe 6 moves in accordance with the moving vector M.Type: GrantFiled: June 2, 2009Date of Patent: August 30, 2011Assignee: Panasonic CorporationInventors: Keiichi Yoshizumi, Masateru Doi, Takayuki Kurata
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Patent number: 7954250Abstract: The present invention relates to an apparatus for a Robust CMM Arm with Exoskeleton is provided comprising an Internal CMM Arm and an Exoskeleton driving the Internal CMM Arm through a plurality of transmission means such that one or more internal volumes are sealed against ingress of solid objects and fluids. It also relates to a haptic control of an RCA.Type: GrantFiled: August 7, 2006Date of Patent: June 7, 2011Assignee: Nikon Metrology N.V.Inventor: Stephen James Crampton
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Patent number: 7950164Abstract: A roundness measuring apparatus includes: a stylus having a contact part; a holding member that holds the stylus while allowing displacement of the contact part; an elastic member that presses the contact part against a measurement target object; a detector holder that supports the holding member rotatably; a motor; an elastic force adjustment member that is rotatable and concentric with the holding member; a joining section that joins the elastic force adjustment member with the holding member to maintain relative rotational positions; and a restricting section that restricts rotation of the elastic force adjustment member at a predetermined rotational position. The displacement direction of the contact part is adjusted in a first rotation range. The rotational position of the holding member relative to the rotational position of the elastic force adjustment member changes with the rotation of the elastic force adjustment member being restricted in a second rotation range.Type: GrantFiled: July 7, 2010Date of Patent: May 31, 2011Assignee: Mitutoyo CorporationInventors: Tatsuki Nakayama, Hideki Shindo
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Patent number: 7934323Abstract: The invention relates to a method and a device for the positioning of a displaceable component in an examining system, particularly a measuring or an analytic system wherein, during the process, the displaceable component is displaced with the support of an actuating element coupled to the displaceable component from a home position into an end position, wherein the actuating element is moved by means of a drive force and the displaceable component is impacted with a fixation force fixating the displaceable component in the end position by way of a fixation component connected to the displaceable component, where the fixation component is submerged at least partially in a reservoir of a medium and is fixated in the medium by means of the transformation of the medium from a liquid state into a solidified state, wherein the medium is transformed from the liquid state into the solidified state by means of the impact-application with a manipulating variable.Type: GrantFiled: September 29, 2006Date of Patent: May 3, 2011Assignee: JPK Instruments AGInventors: Detlef Knebel, Torsten Jähnke
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Patent number: RE43250Abstract: Disclosed is a method of moving an articulating mechanism (22,410) for a measuring device, comprising the steps of: releasing two bodies (14,16, 410a,410b) which form the articulating mechanism allowing relative movement thereof; moving one of the bodies with respect to the other until a desired position is reached; and re-constraining the two bodies so they are relatively fixed, perhaps as part of a locking process, characterised in that relative movement prior to re-constraining at the desired position occurs under particular conditions. The particular conditions including moving from the same direction; and stopping, slowing down or maintaining the condition at a position adjacent to the desired position. Also disclosed is a method of positioning an articulating mechanism (22,410) for a measuring device which is controlled by a potentiometer and a controller (11) for a measuring device.Type: GrantFiled: March 31, 2010Date of Patent: March 20, 2012Assignee: Renishaw plcInventors: Peter G. Lloyd, David S. Wallace, David R. McMurtry, James L. Chase, David Jones
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Patent number: RE45211Abstract: A surface sensing device for use in position determining apparatus has an elongate stylus (74) with a tip (82) for scanning the surface of a workpiece to be measured. Lateral displacements of the stylus tip are detected by a light beam which passes along the stylus from a light source (66) to a retroreflector (78). This reflects the beam back via a beamsplitter (70) to a position sensitive detector (76). The stylus is mounted for longitudinal displacement on a carriage (72). The longitudinal displacement is measured by another light beam projected by the beamsplitter (70) onto a second position sensitive detector (84).Type: GrantFiled: December 7, 2012Date of Patent: October 28, 2014Assignee: Renishaw PLCInventors: Geoffrey McFarland, Kevyn Barry Jonas