Abstract: An analog-to-digital converting device includes N-stage first analog-to-digital converters (ADCs), a second ADC, a first calibration circuit, a data recovery circuit and an output circuit. The N-stage first ADCs has a first sampling frequency that is (N+1)/N times of a second sampling frequency, and converts an input signal into first quantized outputs. The second ADC has the second sampling frequency, and converts the input signal into a second quantized output. The first calibration circuit calibrates offsets of the first quantized outputs and the second quantized output to generate third quantized outputs and a fourth quantized output. The data recovery circuit outputs, by the second sampling frequency, one of the third quantized outputs as a fifth quantized output, and subtracts the fifth quantized output from the fourth quantized output to generate output data. The output circuit generates an output signal according to the third quantized outputs and the output data.

Abstract: System and method for integrating an input signal to generate an output signal. The system includes a first integrator configured to receive the input signal and generate an integrated signal based on at least information associated with the input signal, a second integrator configured to receive the integrated signal and generate the output signal based on at least information associated with the integrated signal, and a compensation capacitor coupled to the first integrator and the second integrator. The first integrator includes a first integration capacitor and a first operational amplifier including a first input terminal and a first output terminal, the first integration capacitor being coupled between the first input terminal and the first output terminal. The second integrator includes a second integration capacitor and a second operational amplifier including a second input terminal and a second output terminal.

Abstract: An AD converter includes: an integration unit that uses an input voltage as an initial value and repeats an operation of integrating one or both of two types of unit voltages with the input voltage, thereby generating an integrated voltage; a switching threshold voltage unit that includes two types of threshold voltages causing the operation of integrating to be terminated; a comparator that compares the integrated voltage with the threshold voltages; an integration determination unit that, before the operation of integrating is started, causes the comparator to compare the input voltage with a rough adjustment threshold voltage corresponding to a larger one of the unit voltages; a unit voltage switching control unit that, when the rough adjustment threshold voltage is larger than the input voltage, controls the integration unit to generate the integrated voltage by using the two types of unit voltages; and a single unit voltage control unit that, when the rough adjustment threshold voltage is smaller than th

Abstract: Examples of clock generators with very low duty cycle distortion (DCD) are provided. A clock source and driver generate a main clock signal and a complementary clock signal that are input to a chopper circuit, which also receives complementary chopper control signals from a non-overlapping generator circuit. The chopper circuit is controlled to pass the main clock signal as a first output signal when the chopper circuit is in a first state, and pass the complementary clock signal as a second output signal when the chopper circuit is in a third state. In a second state, which occurs during each of the falling edges of the main clock signal, the chopper circuit holds the previous state, and does not transmit the falling edges of the main clock signal. The rising edges of the main clock signal is used to derive the rising and falling edges of the output signals.

Abstract: The concept described herein relates to a device and a method for determining the transfer function of an angle sensor in the course of operation. For this purpose, a sequence of angle output signals of the angle sensor is received during at least one time interval in which the angle sensor is exposed to a rotating magnetic field. Furthermore, the transfer function of the angle sensor is determined on the basis of the sequence of angle output signals. The method can be carried out during regular operation of the angle sensor.

Abstract: An analog-to-digital (ADC) converter system and method of using the system that can be used in low power situations. The converter can periodically or recurrently turn off a reference standard in order to conserve power and instead using a stable supply source as a reference voltage. A precise conversion for signal from the analog to the digital domain while maintaining a low quiescent current.

Abstract: This document describes techniques and apparatuses directed at detecting and preventing light-based injection attacks. In aspects, a computing device includes executable instructions of an input manager, an audio sensor having subtracting circuitry, and a light sensor. One or more processors executing instructions of the input manager is configured to receive and analyze signals generated by the audio sensor, the light sensor, and the subtracting circuit. Upon analysis, the input manager can detect and prevent light-based injection attacks.

Abstract: A failure determination device: acquires a second digital value indicating a difference between an analog electrical output generated by inputting a first digital value incremented at a first time interval to a DA conversion circuit and a target output indicated by the first digital value at a second time interval; and determines whether the DA conversion circuit has a failure based on a signal strength in a predetermined frequency of the second digital value that is a discrete signal.

Abstract: An ADC device includes a DAC circuit, a comparator circuit, a SAR decision circuit, an oscillator circuit having a delay unit, and a processing circuit. The oscillator circuit is used for generating the clock signal according to a reset signal and a delay of the delay unit. The processing circuit is used for sequentially generating multiple bit conversion signals associated with multiple different bits of the decision signal, for generating at least one guard signal which follows the multiple bit conversion signals, and then for comparing the at least one guard signal with the reset signal to adjust the delay generated by the delay unit of the oscillator circuit.

Abstract: A digital-to-analog converter for generating an analog output voltage in response to a digital value comprising a plurality of bits, the converter including: (i) a first switched resistor network having a first configuration and for converting a first input differential signal into a first analog output in response to a first set of bits in the plurality of bits; and (ii) a second switched resistor network, coupled to the first switched resistor network, having a second configuration, differing from the first configuration, and for converting a second input differential signal into a second analog output in response to a second set of bits in the plurality of bits.

Abstract: A biopotential measurement device includes: a branching section that branches a biopotential into plural analog potentials; a first conversion section that converts one of the analog potentials branched by the branching section into a digital potential on the basis of a designated first conversion condition; and a second conversion section that converts the other of the analog potentials branched by the branching section into a digital potential on the basis of a second conversion condition. The amount of data obtained after a conversion with the second conversion condition is smaller than the amount of data obtained after a conversion with the first conversion condition.

Abstract: A circuit for measuring an unknown resistance of a resistive element comprises a sensor circuit to generate a differential voltage dependent on the resistance of the resistive element and a reference circuit to generate a differential reference voltage and a sigma-delta converter comprising a first stage, wherein a first capacitor is selectively coupled to one of the output terminals of the sensor circuit and a second capacitor is coupled to one of the output terminals of the reference circuit. The circuit generates logarithmically compressed values.

Abstract: An integrated circuit includes a capacitance element to be tested and a test circuit in the same semiconductor substrate, the test circuit includes a capacitance element for testing, and a comparison circuit for comparing a voltage of a node with a voltage of a signal, electrically connects another end of the capacitance element to be tested to the node, applies the voltage of the signal to the node in a first period, changes the voltage of the node based on a capacitance ratio of the capacitance element to be tested and the capacitance element for testing, and tests a capacity size of the capacitance element to be tested based on a comparison result of the comparison circuit in a second period after the first period.

Abstract: An integrated circuit connectable to a sensor includes a transconductance element and a current-input analog-to-digital converter (I-ADC). The transconductance element is connectable to the sensor and is configured to generate a current signal representative of an output of the sensor. The I-ADC is configured to sample and quantize the current signal to generate a corresponding digital sensor signal. The I-ADC includes a continuous-time (CT) integrator stage, a discrete-time (DT) integrator stage, and a feedback digital-to-analog converter (FB-DAC). The CT integrator stage is configured to receive the current output and the I-ADC is configured to generate the digital sensor signal based on an output of the CT integrator stage and an output of the DT integrator stage. The FB-DAC is configured to provide a feedback signal based on the digital sensor signal for adding to the current signal.

Abstract: Embodiments included herein generally relate to managing low frequencies of an output signal. For example, a method may include: measuring a sound pressure level (SPL) of a speaker; dynamically selecting a cutoff frequency for operating a first filter configured to provide a first bass component of a bass element of an output signal and a second filter configured to provide a second bass component of the bass element; providing the cutoff frequency to the first filter to configure the first filter to generate the first bass component based on the cutoff frequency; providing the cutoff frequency to the second filter to configure the second filter to generate the second bass component based on the cutoff frequency; and generating an output signal based on at least one of the first and second bass components.

Abstract: An integrated circuit includes an analog-to-digital converter (ADC) configured to receive input voltage, and first and second reference voltages, and outputs digital code representing ratios between the input voltage and the first and the second reference voltages. The first and second reference voltages are generated by a reference generator using different current densities. During a first stage, the ADC samples the first input voltage and the first reference voltage and transfers equivalent charge of the sampled first input voltage and first reference voltage to an integration capacitor. During a second stage, the ADC samples the second reference voltage and transfers equivalent charge of the sampled second reference voltage to the integration capacitor. The ADC provides one bit of digital code based on total charge stored on the integration capacitor after the transfers of charge of the sampled input voltage, and the sampled first and second reference voltages.

Abstract: The present description concerns a converter comprising: a circuit (C1) supplying a first pulse (P1) determined by an interval between an active edge of a first signal (S1) and an active edge of a second signal (S2); a circuit (INT) which, at each first pulse (P1), integrates the first pulse (P1), a second pulse (P2) starting after the first pulse (P1) in synchronism with a clock signal (clk), and a third pulse (P3) starting after the third pulse (P3) in synchronism with the clock signal (clk); a circuit (C3) sampling over one bit (OUT1) an output signal (RES1) of the integrator circuit (INT) at the beginning of each third pulse (P3); and two circuits (C2, C4) generating, for each first pulse (P1), respectively the corresponding second pulse and the third corresponding pulse based on the first bit (OUT1).

Abstract: A method of converting an analog input signal to a digital output signal includes adding a digitally controlled offset voltage into a comparison stage of a successive approximation analog-to-digital converter circuit, wherein the digitally controlled offset voltage has a periodic pattern including at least 2(K+1) steps, each of which has a value equal to an integer multiplying 2(?K) of an analog voltage corresponding to a least significant bit (LSB) of an N-bit digital signal, operating the successive approximation analog-to-digital converter circuit to sequentially generate at least a 2(K+1) number of N-bit digital signals based on the at least 2(K+1) steps of the digitally controlled offset voltage, summing the at least the 2(K+1) number of N-bit digital signals to obtain a summing result, and dividing the summing result through a divider block to obtain a digital signal having (N+K) bits.

Abstract: In accordance with the present invention a system and method for calibration of the current steering DAC is elaborated which helps to reduce design complexity and reduce silicon area required in the design. Present invention is utilising a clocked comparator and plurality of switch transistors 405,305 and AUX DAC in conjunction with digital estimator and digital compensator blocks to estimate the errors in the current sources 406 and compensate the errors using same AUX DAC during normal operation mode.

Abstract: Analog calibration (ACAL) circuits supporting iterative measurement of an input signal from a measured circuit, and related methods are disclosed. The ACAL circuit includes a voltage reference generation circuit and a comparator circuit. The voltage reference generation circuit is configured to provide an input reference voltage. The comparator circuit is configured to compare the input reference voltage to an input circuit voltage of a measured circuit and generate a digital measurement signal based on the comparison. To provide for the ACAL circuit to more precisely measure the input circuit voltage, the voltage reference generation circuit is programmable and is configured to a generate the input reference voltage based on a programmed reference voltage selection. In this manner, the ACAL circuit can be used to measure the input circuit voltage in an iterative manner based on different programmed input reference voltages for a more precise measurement of the input circuit voltage.

Abstract: A device is provided for time measurement of a clock-based signal comprising a sample stage comprising a switching device that is driven by a control signal and a capacitance (Cs), wherein the sample stage is arranged to transform an analog input signal in an analog output signal, the device further comprising an analog-to-digital converter to convert the analog output signal into a digital output signal, wherein the input signal applied to the sample stage is a reference signal and wherein the clock-based signal is applied to the control signal. Also, an according method is suggested.

Abstract: An apparatus includes a sampling circuit, a sense circuit, and a tuning circuit. The sampling circuit samples an input signal according to a sampling clock signal to produce a sampled signal. The sense circuit determines a scaling factor based on a distortion in the sampled signal caused by the sampling clock signal. The tuning circuit generates an offset signal based on the sampling clock signal and the scaling factor. The offset signal reduces the distortion in the sampled signal caused by the sampling clock signal.

Abstract: An image sensor includes: a pixel outputting a pixel signal; a ramp voltage generation circuit suitable for generating a ramp voltage that changes at a first slope in a first section and generating the ramp voltage that changes at a second slope having a greater absolute value than the first slope in a second section following the first section; an operation amplifier suitable for comparing the pixel signal with the ramp voltage during the first section and the second section; and a counter circuit suitable for generating a digital code corresponding to the pixel signal in response to an output of the operation amplifier.

Abstract: An analog-to-digital converter, ADC, circuitry, comprises: an integrator connected to a capacitor, the integrator being configured to switch between integrating an analog input signal for ramping an integrator output and integrating a reference input signal for returning integrator output towards a threshold; a comparator for comparing integrator output to the threshold; and a timer for determining a time duration during which the reference input signal is integrated, the time duration providing a digital representation of an analog input signal value; the ADC circuitry further comprising a feedforward noise shaping loop configured to store a quantization error signal based on digitizing a first sample, the comparator being configured to receive a feedforward noise shaping signal for changing the threshold for digitizing a later sample of the analog input signal following the first sample.

Abstract: A semiconductor device performs sequential comparison of an analog input signal and a reference voltage to digitally convert the analog input signal. The semiconductor device includes an upper DAC generating a high-voltage region of the reference voltage based on a predetermined code, a lower DAC generating a low-voltage region of the reference voltage based on the code, and an injection DAC having the same configuration as that of the lower DAC and adjusting the low-voltage region of the reference voltage.

Abstract: Disclosed is a successive approximation register (SAR) analog to digital converter (ADC) that uses two or more comparators. This allows the output of one comparator to be latched while the other comparators are comparing and switching. Statistical measures are used to correct the offsets of one or more of the comparators. If a statistically significant mismatch in the number of 1's and 0's occurs in a subset of the bits, adjustments to the offsets of one or more of the comparators are made until there is roughly an equal number of 1 and 0 values. This can reduce or eliminate the need for dedicated offset correction cycles.

Abstract: A system and method of replicating and cancelling chopping folding error in delta-sigma modulators. The modulator may include a loop filter coupled to a quantizer providing a digital signal, chopper circuitry that chops analog signals of the loop filter at a chopping frequency, and chopping folding error cancellation circuitry that replicates and cancels a chopping folding error of the chopper circuitry to provide a corrected digital signal. A digital chopper or multiplier chops the digital signal to provide a chopped digital signal, and the chopped digital signal is either amplified or multiplied by a gain value or digitally filtered to replicate the chopping folding error, which is then subtracted from the digital signal for correction. The timing and duty cycle of the chopping frequency may be adjusted. Timing and duty cycle adjustment may be calibrated along with the filtering.

Abstract: The number of bits in the quantizer can be decoupled from the number of bits in the feedback digital-to-analog converter (DAC) A delta-sigma analog-to-digital converter circuit can include a first quantizer to generate an output having a first number of bits and a second quantizer coupled to an output of the first quantizer, where the second quantizer can receive the output of the first quantizer and generate an output having a second number of bits. The feedback DAC can be coupled to the second quantizer to receive a representation of the output of the second quantizer, where the output of the feedback digital-to-analog converter circuit has the second number of bits. These techniques can reduce the area of the feedback DAC, e.g., 4 or 5 bits, and the techniques can achieve a higher maximum stable amplitude (MSA) because it is effectively a second order loop.

Abstract: An apparatus includes a plurality of signal processing stages configured to convert a digital baseband signal into an analog radio frequency signal for transmission. The signal processing stages are configured to be operatively coupled to a positive supply voltage and a negative supply voltage. At least one signal processing stage of the plurality of signal processing stages is configured to generate an analog voltage signal which comprises a voltage level that is outside of a voltage range defined by the positive supply voltage and the negative supply voltage.

Abstract: The present invention provides a wide-area sample-based reader design which serves as a diagnostic detection device for bio-particles.

Abstract: An analog to digital converter (ADC) receives first and second analog input signals. A charge sampling demultiplexer includes multiple capacitors that sample the first and second analog input signals, and generates multiple input samples representative of charge stored on the capacitors. A plurality of sub-ADCs each include first and second charge-to-time converters, which receive from the charge sampling demultiplexer respective first and second input sample of the first and second analog input signals and output respective first and second pulse-width-modulated (PWM) signals responsively to the respective first and second input samples. Temporal processing circuitry processes the PWM signals to generate a digital value indicative of a temporal difference between the first and second PWM signals. Output reordering circuitry receives the digital value from each of the sub-ADCs and generates a digital output indicative of a difference between the first and second analog input signals.

Abstract: A translation device, a test system, and a memory system are provided. The translation device includes plural first input/output (I/O) circuits that respectively transmit and receive first signals through plural pins based on a pulse amplitude modulation (PAM)-M mode, a second I/O circuit that transmits and receives a second signal through one or more pins based on a PAM-N mode, and a translation circuit that translates the first signals into the second signal and translates the second signal into the first signals. M and N are different integers of 2 or more.

Abstract: A method for differentiator-based compression of digital data includes (a) multiplying a tap-weight vector by an original data vector to generate a predicted signal, the original data vector comprising N sequential samples of an original signal, N being an integer greater than or equal to one, (b) using a subtraction module, subtracting the predicted signal from a sample of the original signal to obtain an error signal, (c) using a quantization module, quantizing the error signal to obtain a quantized error signal, and (d) updating the tap-weight vector according to changing statistical properties of the original signal.

Abstract: An A/D conversion circuit includes a comparison-reference-signal generator section configured to generate a comparison reference signal synchronized with a sampling clock signal, a comparator configured to compare a voltage of an input signal and a voltage of the comparison reference signal to thereby generate a trigger signal, a time to digital converter configured to calculate a first time digital value, and a digital-signal generator section configured to generate, based on the first time digital value and a second time digital value, a digital signal corresponding to the voltage of the input signal.

Abstract: A ratiometric analog-to-digital conversion circuit includes a first voltage range operation circuit configured to use a first power supply voltage of a first voltage range, and output an analog signal corresponding to an external input signal; and a second voltage range operation circuit configured to use a second power supply voltage of a second voltage range, generate a digital value by analog-to-digital converting the analog signal, feed back the digital value for analog-to-digital conversion, and output a digital signal corresponding to the digital value and proportional to the input signal.

Abstract: A sensor arrangement includes a switchable voltage source having a source output for alternatively providing a first and a second excitation voltage, an integrator having an integrator input and an integrator output, a sensor resistor having a first terminal coupled to the source output, a reference resistor having a first terminal coupled to a second terminal of the sensor resistor and a second terminal coupled to the integrator input, and a comparator having a first comparator input coupled to the integrator output.

Abstract: A time-interleaved analog to digital converter (TI-ADC) includes a first sub-ADC configured to sample and convert an input analog signal to generate a first digital signal and a second sub-ADC configured to sample and convert said input analog signal to generate a second digital signal. Sampling by the second sub-ADC occurs with a time skew mismatch. A multiplexor interleaves the first and second digital signals to generate a third digital signal. A time skew mismatch error determination circuit processes the first and second digital signals to generate a time error corresponding to the time skew mismatch. A slope value of said third digital signal is determined and multiplied by the time error to generate a signal error. The signal error is summed with the third digital signal to generate a digital output signal which eliminates the error due to the time skew mismatch. This correction is performed in real time.

Abstract: Disclosed herein are some examples of analog-to-digital converters (ADCs) that can perform auto-zeroing with amplifying a signal for improvement of a signal-to-noise ratio. The ADCs may produce a first digital code to represent an analog input signal and a second digital code based on a residue from the first digital code, and may combine the first digital code and the second digital code to produce a digital output code to represent the analog input signal. The ADC may utilize a first observation and a second observation of an analog residue value representing the residue to produce the second digital code.

Abstract: An analog to digital converter (ADC) device includes ADC circuits, a calibration circuit and a skew adjusting circuit. The ADC circuits convert an input signal according to clock signals, to generate first quantized outputs. The calibration circuit calibrates the first quantized outputs to generate second quantized outputs. The skew adjusting circuit includes an estimating circuit and a feedback circuit. The estimating circuit analyzes the second quantized outputs to generate detection signals, wherein the detection signals are related to time difference information of the clock signals. The skew adjusting circuit outputs the detection signals as adjustment signals, wherein the adjustment signals are configured to reduce a clock skew of the ADC circuits. The feedback circuit analyzes the detection signals generated by the estimating circuit, to generate a feedback signal to the estimating circuit, wherein the estimating circuit is configured to adjust the detection signals according to the feedback signal.

Abstract: A signal converting apparatus includes a comparing device, a first digital-slope quantizer, and a second digital-slope quantizer. The comparing device having a first input terminal and a second input terminal for receiving a first received signal and a second received signal, and for generating an output signal at an output port. The first digital-slope quantizer generates a first set of digital signals to monotonically adjust the first received signal and the second received signal at the first input terminal and the second input terminal during a first phase according to a first quantization unit. The second digital-slope quantizer generates a second set of digital signals to monotonically adjust the first received signal and the second received signal at the first input terminal and the second input terminal during a second phase after the first phase according to a second quantization unit.

Abstract: A calibratable switched-capacitor voltage reference and an associated calibration method are described. The voltage reference includes dynamic diode elements providing diode voltages, input capacitor(s) for sampling input voltages, base-emitter capacitor(s) for sampling one diode voltage with respect to a ground, dynamically trimmable capacitor(s) for sampling the one diode voltage with respect to another diode voltage, and an operational amplifier coupled to the capacitors for providing reference voltage(s) based on the sampled input and diode voltages and on trims of the trimmable capacitor(s). The voltage reference can be configured as a first integrator of a modulator stage of a delta-sigma analog-to-digital converter.

Abstract: Embodiments may provide a radiation hardened low-power data acquisition system-on-chip (SOC) suitable for space flight. The various embodiments may provide the radiation hardened low-power data acquisition SOC having a radiation hardened semiconductor die, a radiation hardened multiplexer integrated on the radiation hardened semiconductor die and configured to receive a plurality of analog signals and selectively output an analog signal of the plurality of analog signals, at least one radiation hardened analog to digital converted integrated on the radiation hardened semiconductor die and configured to convert the analog signal to a digital signal, and a radiation hardened serial communication interface integrated on the radiation hardened semiconductor die and configured to output the digital signal.

Abstract: A circuit having an array of Analog-to-Digital Converters (ADCs); a sampling order selector configured to select a sampling order of the ADCs and output corresponding sampling order control words; sampling pulse generators coupled between the sampling order selector and the respective ADCs, and configured to output respective sampling pulses based on the respective sampling order control words, wherein the ADCs are configured to sample and convert analog data into digital data in response to the sampling pulses; and a single clock generator configured to distribute a delay-matched clock to each of the ADCs in parallel, to each of the sampling pulse generators in parallel, and to the sampling order selector.

Abstract: Analog gain correction circuitry and analog switching clock edge timing correction circuitry can provide coarse correction of interleaving errors in radio-frequency digital-to-analog converters (RF DACs), such as may be used in 5G wireless base stations. The analog correction can be supplemented by digital circuitry configured to “pre-cancel” an interleaving image by adding to a digital DAC input signal a signal equal and opposite to an interleaving image created by the interleaving DAC, such that the interleaving image is effectively mitigated. Error correction control parameters can be periodically adjusted for changes in temperature by a controller coupled to an on-chip temperature sensor. A model useful for understanding the sources of error in interleaving DACs is also described.

Abstract: A dual-loop analog to digital converter (ADC) includes an asynchronous inner loop including first and second comparators and a state machine, where outputs of the first and second comparators are coupled to inputs of the state machine, and where outputs of the state machine are cross-coupled to enable ports of the first and second comparators. The ADC includes a synchronous outer loop including a successive approximation register (SAR), a digital to analog converter (DAC), and the first and second comparators, where the outputs of the first and second comparators are coupled to inputs of the SAR, an N-bit output of the SAR is coupled to an N-bit input of the DAC, and a differential output of the DAC is coupled to inputs of the first and second comparators, where a state of the state machine is independent of the state of the SAR.

Abstract: In the field of fault location within a power transmission network, a method of determining a fault location in a power transmission conduit includes: (a) sampling at an original sampling frequency a signal propagating through the power transmission conduit to establish a first data set including a plurality of sampled signal characteristics; (b) interpolating the first data set to establish a second data set including an increased number of signal characteristics whereby the second data set has an equivalent sampling frequency higher than the original sampling frequency; (c) identifying a fault wave signal within the second data set; and (d) utilising the propagation characteristics of the fault wave signal to determine the origin of the fault wave signal within the power transmission conduit.

Abstract: A memory system may include a memory device and a memory controller. The memory device may include input/output pads. The memory controller may control an operation of the memory device through the input/output pads. The memory controller may generate an offset adjustment command and transmit the offset adjustment command to the memory device. The memory device may store an offset of a signal received to the input/output pads, in response to the offset adjustment command.

Abstract: An image sensor includes a pixel sensor outputting an analog sampling signal; a sampling unit comparing the sampling signal and a ramp signal, and outputting a comparison signal that is time-axis length information; and a counter counting a length of the comparison signal based on a clock signal and first and second complement control signals. The counter includes an AND gate ANDing the comparison signal and the clock signal; and a counting unit triggered at a falling edge of the AND gate output to output a count value. The counting unit includes a complement operation controller storing an inverted count value that is an inversion of the count value in response to the first complement control signal, and outputting the inverted count value in response to the second complement control signal; and a D-flip-flop that is set or reset depending on the inverted count value, and outputs the count value.

Abstract: Examples of clock generators with very low duty cycle distortion (DCD) are provided. A clock source and driver generate a main clock signal and a complementary clock signal that are input to a chopper circuit, which also receives complementary chopper control signals from a non-overlapping generator circuit. The chopper circuit is controlled to pass the main clock signal as a first output signal when the chopper circuit is in a first state, and pass the complementary clock signal as a second output signal when the chopper circuit is in a third state. In a second state, which occurs during each of the falling edges of the main clock signal, the chopper circuit holds the previous state, and does not transmit the falling edges of the main clock signal. The rising edges of the main clock signal is used to derive the rising and falling edges of the output signals.

Abstract: An integrated circuit can include an amplifier coupled to receive an analog input signal, an anti-aliasing filter (AAF) coupled to an output of the amplifier, a buffer circuit coupled to an output of the AAF, a sigma-delta modulator configured to generate a digital data stream in response to an output of the buffer, and a plurality of chopping circuits nested within one another, including a first pair of chopping circuits having at least the amplifier disposed therebetween and configured to remove offset in the analog input signal, and a second pair of chopping circuit having at least the first pair of chopping circuits disposed therebetween. The amplifier, AAF, sigma-delta modulator, and chopping circuits can be formed with the same integrated circuit substrate. Corresponding methods and systems are also disclosed.