Abstract: Embodiments disclosed herein relate to improving a power output of a transmitter of an electronic device. To do so, the transmitter may include signal selection circuitry to adjust a sign selection signal to accurately transition between polarities of a quadrature (e.g., I or Q) component signal stored in or for which an indication is stored in a storage cell of a radio frequency digital-to-analog converter. The sign selection signal may generate a separate adjusted sign selection signal for each polarity of each quadrature component signal such that a transition of the selection signal between a first value and a second value (e.g., logic high and low) occurs when the respective quadrature (e.g., +/? and I/Q) component signal is a logic low. In this way, the signal selection circuitry reduces an error pulse in the output of the transmitter.

Abstract: A DAC, for use in an iADC, is configured for converting a multi-bit word to an analog feedback signal. The DAC comprises a MMS logic block. It further comprises a plurality of output elements configured to generate respective analog portions based on a selection vector and a signal combiner for combining the analog portions to the analog feedback signal. In the MMS logic block switching blocks are arranged cascaded. Each switching block receives at least a portion of the multi-bit word, splits the portion into two sub-portions and forwards them to one subsequent switching block or to one output element. A weight factor is adjusted by multiplying it with the difference of the two sub-portions. A weight accumulator accumulates successive adjusted weight factors, wherein the way of splitting the portion of a further multi-bit word is determined based on the sign of the weight accumulator.

Abstract: In accordance with an embodiment, a method for digital-to-analog conversion includes: mapping a uniformly distributed input code to a non-uniformly distributed input code of a switched capacitor digital-to-analog converter (DAC), the non-uniformly distributed input code including a most significant code (MSC) and a least significant code (LSC); transferring a first charge from a set of DAC capacitors to a charge accumulator based on the MSC; forming a second charge based on the LSC; and transferring the second charge from the set of DAC capacitors to the charge accumulator, where each capacitor of the set of DAC capacitors is used for each value of the non-uniformly distributed input code, each capacitor of the set of DAC capacitors provides a same corresponding nominal charge within each value of the non-uniformly distributed input code, and where the same nominal charge is proportional to a value of the non-uniformly distributed input code.

Abstract: A signal detection circuit includes: a first capacitor having a first terminal connected with a first main terminal of a switching element; a second capacitor having a first terminal connected with a second main terminal of the switching element; and a detection circuit having a differential circuit configuration. The detection circuit receives, as input signals, a signal from a second terminal of the first capacitor and a signal from a second terminal of the second capacitor, detects detection target signals based on the input signals. The detection target signals include a signal of the first main terminal of the switching element and a signal of the second main terminal of the switching element.

Abstract: A reference buffer has many legs each with an upper transistor, a lower transistor, and a resistor or current source as a tail device in series. The source or emitter of the upper (lower) transistor generates an upper (lower) reference voltage. This source follower transistor configuration has a low output impedance and high current. The gate or base of the upper (lower) transistors are driven by a first (second) control node. A control leg has an upper transistor, a lower transistor, and a tail device in series. The source and gate, or emitter and base, are connected together for the upper and lower transistors and generate the upper and lower control nodes. Alternately, the gate or base of the upper (lower) transistor is driven by an op amp receiving an upper (lower) bandgap voltage and the upper (lower) control node as negative feedback.

Abstract: A dynamic element matching (DEM) encoder is provided that converts an N-bit digital codeword into a pattern of 1-bit values. The DEM encoder includes a binary switching tree that includes plurality of switching blocks interconnected between an encoder input and a plurality of encoder outputs. The plurality of switching blocks are configured to receive a plurality of first control signals such that each switching block receives a respective first control signal and is independently programmable based on the respective first control signal into a first mode or a second mode. Each switching block includes a splitting circuit programmed into the first mode or the second mode to split a digital input into two digital outputs using either both a first splitting operation and a second splitting operation that is different from the first splitting operation or the first splitting operation over the plurality of sampling intervals.

Abstract: Provided are an analog-to-digital (AD) converter, a sensor system, and a test system capable of reducing the time for test processing. AD converter includes input part, AD conversion part, first output part, and second output part. The analog signal output from sensor is input to input part. AD conversion part digitally converts an analog signal to generate first digital data and second digital data. First output part outputs the first digital data to control circuit. Second output part outputs the second digital data to test controller before first output part outputs the first digital data. In the test mode, test controller determines whether or not sensor system including sensor is in an abnormal state on the basis of the second digital data.

Abstract: A variable capacitance circuit includes a capacitor array having a first capacitor in which a plurality of MIM capacitors are coupled in parallel and a second capacitor in which a plurality of MIM capacitors are coupled in series, and a switch array having a first switch and a second switch. A shape pattern of at least one of a first electrode of the first capacitor, a first ground shield, a second electrode of the second capacitor, and a second ground shield is set so that a first capacitance difference per 1 LSB between first capacitance values of the first capacitor when the first switch is turned on and off and a second capacitance difference per 1 LSB between second capacitance values of the second capacitor when the second switch is turned on and off are close to each other.

Abstract: A voltage ladder is used to generate reference voltages. The voltage ladder is used by multiple digital-to-analog converters (DACs). In particular, the voltage ladder is used by multiple pulse-width modulation (PWM) DACs. Having multiple DACs utilize a common voltage ladder for their reference voltages reduces mismatched output voltages between DACs. Having multiple DACs utilize the common voltage ladder helps ensure that the reference voltages used by different DACs are not affected by process, voltage, and/or temperature variations in the reference voltages that would occur when using different voltage ladders for each DAC.

Abstract: A semiconductor device includes a level conversion circuit. The level conversion circuit includes a first transistor, a second transistor, a current limiting element, and a voltage adjusting circuit. The first transistor includes a gate connected to an input node. A signal corresponding to a first power supply voltage is input to the input node. The second transistor has a source connected to a drain of the first transistor, a drain connected to a second power supply voltage that is higher than the first power supply voltage, and a gate connected to a first node. The current limiting element is electrically connected between the first node and an output node. The voltage adjusting circuit adjusts a voltage of the first node in accordance with the signal input to the input node.

Abstract: Nonvolatile memory device includes memory cell region including first metal pad, peripheral circuit region including second metal pad, memory cell array, input current generator, operation cell array and analog-to-digital converter. Peripheral circuit region is vertically connected by first and second metal pads. Memory cell array in memory cell region includes NAND strings storing multiplicand data, wherein first ends of NAND strings are connected to bitlines and second ends of NAND strings output multiplication bits corresponding to bitwise multiplication of multiplicand data stored in NAND strings and multiplier data loaded on bitlines. Input current generator generates input currents. Operation cell array in memory cell region includes switching transistors. Gate electrodes of switching transistors are connected to second ends of NAND strings. Switching transistors selectively sum input currents based on multiplication bits to provide output currents.

Abstract: A voltage regulation loop includes a voltage reference generation block that includes a bandgap voltage reference circuit; a linear voltage regulator block that includes a first and second linear voltage regulators, wherein the first linear voltage regulator provides a first regulated power supply to the bandgap voltage reference circuit in the voltage reference generation block, and the second linear voltage regulator provides a second regulated power supply to a load; and a soft startup circuit connected between the voltage reference generation block and the linear voltage regulator block, wherein a selector functions with a control block to output a selected voltage reference to pass to the soft startup circuit, wherein the soft startup circuit smooths the selected voltage reference and produces a smoothed voltage reference to pass to the linear voltage regulator block to prevent overshoots at startup.

Abstract: A delta-sigma modulator generates a bitstream signal from a differential input signal including a first input signal and a second input signal by repeating a first operation and a second operation alternately. The delta-sigma modulator includes a first sampling capacitor, a second sampling capacitor, a third sampling capacitor, a fourth sampling capacitor, an operational amplifier, a first feedback capacitor, a second feedback capacitor, and a quantizer.

Abstract: A nonvolatile memory device includes a memory cell array, an input current generator, an operation cell array and an analog-to-digital converter. The memory cell array includes NAND strings storing multiplicand data, wherein first ends of the NAND strings are connected to bitlines and second ends of the NAND strings output multiplication bits corresponding to bitwise multiplication of the multiplicand data stored in the NAND strings and multiplier data loaded on the bitlines. The input current generator generates input currents. The operation cell array includes switching transistors. Gate electrodes of the switching transistors are connected to the second ends of the NAND strings. The switching transistors selectively sum the input currents based on the multiplication bits to output the output currents. The analog-to-digital converter converts the output currents to digital values.

Abstract: An AD conversion circuit includes a comparison circuit, a first DA conversion circuit including a plurality of resistance elements, and a first voltage output circuit. A comparator of the comparison circuit outputs a signal that represents a result of comparing a first voltage of a first input terminal with a second voltage of a second input terminal. A first combined resistance value of the first DA conversion circuit and the first voltage output circuit seen from a second terminal of the first capacitance element is a first value when the first capacitance element holds a first signal. The first combined resistance value is a second value when the comparator compares the first voltage with the second voltage. The first value is less than the second value.

Abstract: A multiplying digital to analog converter (MDAC) includes a first resistor configured to be selectively connected to a current output node based on a first bit of a first portion of an input digital code and a second resistor configured to be selectively connected to the current output node based on a second bit of the first portion of the input digital code. A resistance of the second resistor is a resistance of the first resistor scaled by a factor. The MDAC further includes a first capacitor configured to be selectively connected to the current output node based on the first bit of the first portion and a second capacitor configured to be selectively connected to the current output node based on the second bit of the first portion. A capacitance of the second capacitor is a capacitance of the first capacitor scaled by an inverse of the factor.

Abstract: Apparatus and associated methods relate to providing a regulation loop using a digital representation of a loop error signal along with a flexible multiplying capacitive digital-to-analog converter (MC-DAC) circuit to control one or more power switches (e.g., transistors) delivering required power (including voltage and/or current) to a load circuit. In an illustrative example, the MC-DAC circuit may include a digital-to-analog converter (DAC) configured to selectively couple to two different reference voltages in response to switch control signals generated by a digital filter. A capacitive level shifter may be coupled to the output of the DAC. A re-sampling circuit may be coupled to the output of the capacitive level shifter to generate a gate control signal to control the one or more power switches. The regulation loop may advantageously generate the gate control signal using a substantially reduced die area.

Abstract: An analog-to-digital converter (ADC) device includes capacitor arrays, successive approximation register (SAR) circuitries, and noise shaping circuitries. The capacitor arrays sample an input signal by turns, in order to provide a sampled input signal. The SAR circuitries perform an analog-to-digital conversion by turns according to a combination of the sampled input signal, a first residue signal, and a second residue signal, in order to generate digital outputs. The noise shaping circuitries receive a corresponding residue signal of the first residue signal the second residue signal in response to the analog-to-digital conversion, and to shape and transmit the corresponding residue signal to the SAR circuitries.

Abstract: An ADC is disclosed. The ADC includes a SAR logic circuit, a DAC, a comparator, and a voltage generator. The voltage generator includes a first switch connected to the comparator configured to selectively connect a second input terminal of the comparator to a reference voltage, a capacitor connected to the second input terminal of the comparator, and a second switch connected to the capacitor and selectively connected to either of a ground voltage and the reference voltage. The second switch is configured to selectively connect the capacitor to either of the ground voltage and the reference voltage, and the SAR logic circuit is further configured to receive the comparator output voltage, and to generate a digital input word for the DAC based on one or more comparator output voltages received from the comparator.

Abstract: The present invention relates to a display apparatus which drives a display panel to display an image, and a driving circuit thereof. The display apparatus includes a timing controller configured to provide a control option having a value for compensating for pixel data and a gray scale, and a driving circuit configured to combines the control option and the pixel data and output an output voltage.

Abstract: An adder circuit can be fabricated within an integrated circuit (IC) and can be configured to draw a sum output node to a voltage proportional to a sum of received N-bit binary numbers. The adder circuit includes sets of N inputs that receive N-bit binary numbers, each set of N inputs indexed by an integer bit number “n.” The adder circuit includes sets of scaled capacitors, each capacitor connected to an nth input of the corresponding set of N inputs and to the sum output node. Each scaled capacitor has a capacitance equal to 2(n)*a unit capacitance (CUNIT). The adder circuit includes a reference capacitor connected to ground and the sum output node, and a reset circuit configured to draw, in response to a received RESET signal, the sum output node to ground.

Abstract: A touch display device and a driving circuit are disclosed in which the driving circuit is included in the touch display device. The driving circuit may be capable of reducing a chip size and power consumption by configuring an amplifier disposed in an output terminal of a data voltage to be electrically coupled with a feedback capacitor through a switch, and enabling both display driving and touch sensing to be performed through ON/OFF control of the switch. Further, the accuracy and performance of touch sensing may be improved by adjusting an ON/OFF operation of a switch and the number of amplifiers electrically coupled with the feedback capacitor, and a circuit structure for touch driving may be further simplified by generating a load-free driving voltage output in a touch driving period using the amplifiers and a digital-to-analog converter within the driving circuit.

Abstract: A successive approximation type AD converter includes an in-phase voltage detection and supply circuit that supplies an in-phase voltage obtained by impedance voltage division of a first input analog signal and a second input analog signal to a first capacitance DA converter and a second capacitance DA converter. The first capacitance DA converter samples the first input analog signal with reference to the in-phase voltage, and the second capacitance DA converter samples the second input analog signal with reference to the in-phase voltage. After the sampling period ends, a comparator compares the output of the first capacitance DA converter and the output of the second capacitance DA converter, output voltages of the first capacitance DA converter and the second capacitance DA converter are changed by the control signal of a successive approximation logic unit on the basis of a comparison result, and comparison processing is repeated.

Abstract: The present disclosure provides a laser touch panel, a laser touch method for a laser touch panel, a laser touch display device, a laser touch display system and a laser touch panel. The laser touch panel includes a first conductive layer, a second conductive layer, and a light-induced resistance change material layer. The light-induced resistance change material layer is disposed between the first conductive layer and the second conductive layer and is electrically connected to the first conductive layer and the second conductive layer. The light-induced resistance change material layer is configured to generate a resistance change at a touch position subjected to laser irradiation.

Abstract: A sample-and-hold amplifier includes: a switched capacitor network for conducting a sample-and-hold operation on an input signal to generate a first signal; and an operational amplifier coupled with the switched capacitor network and including multiple candidate capacitors; wherein the operational amplifier is arranged to operably generate an output signal based on the first signal, and to operably switch coupling relationship of the multiple candidate capacitors based on the magnitude of the input signal, so that only a portion of the multiple candidate capacitors could be participated in the generation of the output signal at a time.

Abstract: Disclosed is a high-speed and low-power pipelined analog-digital converter (ADC) using a dynamic reference voltage and a 2-stage S/H. The pipelined ADC includes a 2-stage sample-and-hold (S/H) configured to secure a conversion time corresponding to a clock cycle per stage and to apply only a buffer to an input signal path, a reference voltage generator configured to receive the output of the D flip-flop of a previous stage as an input signal and to generate a required reference voltage during a half cycle of a sample frequency, and a comparator configured to include a linear transconductor (LT), a rail-to-rail latch (R2R) and a D flip-flop and to generate the output of the ADC and input to the reference voltage generator of a next stage for generating a reference voltage using the output of the D flip-flop.

Abstract: An adder circuit can be fabricated within an integrated circuit (IC) and can be configured to draw a sum output node to a voltage proportional to a sum of received N-bit binary numbers. The adder circuit includes sets of N inputs that receive N-bit binary numbers, each set of N inputs indexed by an integer bit number “n.” The adder circuit includes sets of scaled capacitors, each capacitor connected to an nth input of the corresponding set of N inputs and to the sum output node. Each scaled capacitor has a capacitance equal to 2(n)* a unit capacitance (CUNIT). The adder circuit includes a reference capacitor connected to ground and the sum output node, and a reset circuit configured to draw, in response to a received RESET signal, the sum output node to ground.

Abstract: A successive approximation register analog-to-digital converter with improved kick-back linearization includes a signal input terminal, a capacitive digital-to-analog converter, a first switch, and a second switch. The signal input terminal is configured to receive a signal to be digitized. The capacitive digital-to-analog converter includes a first capacitor array, a second capacitor array, and a coupling capacitor. The first capacitor array includes a plurality of capacitors. The second capacitor array includes a plurality of capacitors. The coupling capacitor connects the first capacitor array to the second capacitor array. The first switch is configured to switchably connect a bottom plate of each of the capacitors of the first capacitor array to the signal input terminal. The second switch is configured to conduct a voltage on the bottom plate of the coupling capacitor to the signal input terminal.

Abstract: A charge transfer digital-to-analog converter includes a differential reference voltage, a pair of capacitors, and switches including a shorting switch. The switches are configured to be switched in successive phases to generate a charge transfer through the capacitors to generate an output corresponding to a digital input. The specific switches activated and deactivated in each phase are selected according to the digital input. Each capacitor of the pair of capacitors is connected to a respective pin for the output. The shorting switch is configured to short the pair of capacitors to create a zero-differential charge on a first side of the capacitors. The shorting switch is implemented with a bootstrap circuit to maintain a constant common mode voltage of the first side of the capacitors while the shorting switch is activated.

Abstract: Disclosed is a successive-approximation register (SAR) analog-to-digital converter (ADC). The SAR ADC may include a capacitor-resistor hybrid digital-to-analog converter (DAC), and apply a low-power switching method and an input signal range scaling method to the DAC, thereby significantly reducing surface area and power consumption.

Abstract: A front-end circuit includes a multiplexer, a circulator, reception ports, and variable filters. A port in the multiplexer is connected to an antenna. A port in the circulator is connected to a port in the multiplexer. The reception ports are connected to a port in the circulator with the variable filters interposed therebetween. The multiplexer outputs a communication signal having a frequency in a low band to the port and outputs a communication signal having a frequency in a middle band to a port. Each of the low band and the middle band includes a plurality of frequency bands. The middle band is a range of frequencies higher than those in the low band and does not overlap the low band.

Abstract: A SAR ADC is disclosed. The SAR ADC includes a plurality of SAR-capacitors. For each of the SAR-capacitors, a sampling-switching-block is configured to connect a first plate of the associated SAR-capacitor to either: v-ref-low, v-ref-high or an input-voltage. The SAR ADC also includes an offset-capacitor and an offset-switching-block configured to connect a first plate of the offset-capacitor to either: v-ref-low, or v-ref-high. The SAR ADC further includes a SAR machine configured to provide signals to the sampling-switching-blocks and the offset-switching-block in order to define a calibration-sampling-mode-of-operation, a calibration-conversion-mode-of-operation, a sampling-mode-of-operation and a conversion-mode-of-operation. A code converter is also includes and is configured to subtract the offset-value from the raw-digital-word in order to provide a digital-output-signal.

Abstract: A digital-to-analog converter (DAC) for converting an M bit digital value to an analog signal includes a capacitive DAC and a resistive DAC. The capacitive DAC is configured to convert N most significant bits of the digital value to an analog signal. The resistive DAC is configured to covert M-N least significant bits (LSBs) of the digital value to an analog signal. The resistive DAC includes a coarse DAC and a fine DAC. The coarse DAC is configured to convert a most significant R bits of the M-N least significant bits to an analog signal. An output of the coarse DAC is switchably coupled to a first capacitor of the capacitive DAC. The fine DAC is configured to convert M-N-R least significant bits of the M-N least significant bits to an analog signal. An output of the fine DAC is switchably coupled to a second capacitor of the capacitive DAC.

Abstract: During operation of a SAR ADC, several of the MSBs can be preloaded with predetermined bit decisions prior to carrying out bit trials. A system and method can be provided for incrementally preloading the predetermined bit decisions such as to maintain voltages present at comparator inputs within a limited range of acceptable input voltages.

Abstract: A voltage sampling circuit is provided that may directly connect a non-zero power supply voltage VDD to switching circuits during input voltage sampling, setting a common mode voltage without using reference voltages produced by a reference voltage generator circuit, and without requiring a common mode buffer circuit. The voltage sampling circuit may be used in an operational amplifier input stage such as for a pipelined ADC circuit, or in a comparator circuit. A SAR ADC circuit is also provided, comprising a control circuit, the voltage sampling circuit, a capacitor array, and a comparator circuit for comparing outputs occurring from charge redistributions. The voltage sampling circuit may enable increased power efficiency, avoid leakage concerns, and increase maximum input voltage swing. Reference plate switches in the voltage sampling circuit may include gate-boosted devices or thicker-oxide I/O devices.

Abstract: In accordance with an embodiment, a radio frequency integrated circuit (RFIC) includes an adjustable capacitance coupled to an input terminal of the RFIC, and a first single-pole multiple-throw (SPMT) radio frequency (RF) switch having an input coupled to the adjustable capacitance and a plurality of output nodes coupled to a corresponding plurality of second output terminals of the RFIC.

Abstract: The system has: a set of at least two electric current generators, at least one capacitor and activation/deactivation devices for the electric current generators; the electric current generator being connected in parallel with one another and the capacitor being connected in series with the electric current generators, the activation/deactivation devices controlling the generators by a digital stream allowing control of the intensity of the electric current entering the capacitor and generating a trapezoidal voltage signal at the terminals of the capacitor, the analog signal being reconstructed through interpolation of the trapezoidal signal.

Abstract: In one implementation, a digital analog converter (DAC) is monotonic because the output moves only in the direction of the input and segmented because a more significant portion of the DAC is separated from a less significant portion. The DAC receives an input binary word that includes multiple most significant bits and multiple least significant bits. The DAC decodes the input binary word to an intermediate signal that includes a bit width equal to or greater than a bit width of the binary word. The intermediate signal sets output switches and current source switches. The DAC provides an analog output signal that represents the input binary word.

Abstract: An analog to digital converting apparatus and an initial method thereof are provided. The analog to digital converting apparatus includes a first and a second switching capacitor units, a circuit unit, a first and a second initialization switches, a third and a fourth capacitors and a logic buffer. The first and the second switching capacitor units respectively couple first capacitors and second capacitors to a first logic voltage, a second logic voltage or a first or a second input voltage according to a first control signal, and respectively generate a first and a second voltage. The circuit unit compares the first voltage and the second voltage to generate the first control signal. The first and the second initialization switches are respectively connected in series between the first and the second voltage and a common-mode endpoint. The logic buffer outputs the first or the second logic voltage to the common-mode endpoint.

Abstract: In one implementation, a digital analog converter (DAC) is monotonic because the output moves only in the direction of the input and segmented because a more significant portion of the DAC is separated from a less significant portion. The DAC receives an input binary word that includes multiple most significant bits and multiple least significant bits. The DAC decodes the input binary word to an intermediate signal that includes a bit width equal to or greater than a bit width of the binary word. The intermediate signal sets output switches and current source switches. The DAC provides an analog output signal that represents the input binary word.

Abstract: A tunable DCO (digitally controlled oscillator), for example, includes a clock generator that is arranged to provide a converter clock signal for driving a frequency-to-voltage (F2V) converter. The F2V converter, for example, includes a frequency target control input for selecting an operational frequency and in response generates a frequency control signal using a DAC (digital-to-analog converter). The example F2V converter is arranged using a split capacitor DAC to provide a linear voltage response over a range of trim codes. The clock generator is arranged to generate the converter clock signal in response to the frequency control signal.

Abstract: Provided is a switched-capacitor integrator, a method of operating the switched-capacitor integrator, and apparatuses including the switched-capacitor integrator. The switched-capacitor integrator including an amplifier including a first input terminal, a second input terminal, and an output terminal, a first capacitor disposed between the first input terminal and the output terminal, and a switched capacitor circuit configured to sample an input signal in response to control signals, and to integrate a difference between a feedback signal and the input signal while sampling the input signal.

Abstract: Some examples relate to a digital to analog converter (DAC). The DAC includes a digital signal input configured to receive a multi-bit digital input signal, and an array of cells. Respective cells in the array comprise respective capacitors. The DAC also includes a control circuit configured to, based on the multi-bit digital input signal, selectively induce one or more corresponding capacitors to discharge current to an output terminal of the DAC.

Abstract: A circuit for implementing a charge/discharge switch in an integrated circuit is described. The circuit comprises a supply bias path coupled to a first node, wherein the supply bias path provides a charging bias current to the first node; a charge transistor connected between the first node and a first terminal of a capacitor; a charge switch coupled between the first node and a ground potential, wherein the charge switch enables charging of the capacitor by way of the first node; a discharge transistor connected between the first terminal of the capacitor and a second node; a discharge switch coupled between the second node and a reference voltage, wherein the discharge switch enables discharging of the capacitor by way of the second node; and a ground bias path coupled between the second node and ground, wherein the ground bias path provides a discharging bias current to the second node. A method of implementing a charge/discharge switch in an integrated circuit is also described.

Abstract: A two-stage digital-to-analog converter for outputting an analog voltage in response to a M-bit digital input code includes a one-bit serial charge redistribution digital-to-analog converter having a high reference voltage input node for receiving a high reference voltage and a low reference voltage input node for receiving a low reference voltage. A voltage selector sets the high reference voltage and low reference voltage to selected levels depending on at least a portion of the M-bit digital input code.

Abstract: A charge canceling multiplying digital-to-analog converter (MDAC) is provided with a reference block having inputs to accept reference voltages each sample clock cycle. The MDAC includes a sampling block having inputs to accept differential analog input voltage signals each sample clock cycle. A differential amplifier has a negative input and positive input connected to the reference block and sampling block to receive differential amplifier input signals, and a positive output and a negative output to supply differential output voltage signals each amplify clock cycle. The sampling section includes a first pair of feedback capacitors connected between the differential amplifier negative input and positive output, and a second pair of feedback capacitors connected between the differential amplifier positive input and negative output each amplify clock cycle. A capacitor from the first pair of parallel feedback capacitors is swapped with a capacitor from the second pair prior to each sample clock cycle.

Abstract: A digital-to-analog conversion circuit operates by selectively discharging members of a plurality of capacitors. Charging of the capacitors occurs during a reset period while digital-to-analog conversion occurs as the capacitors are discharged. Those capacitors that are discharged are selected from the plurality of capacitors based on a digital input. The analog output includes the charge discharged from the capacitors. The capacitors are optionally divided into separate capacitor banks.

Abstract: Aspects of the present disclosure relate to floating point timers and counters that are used in a variety of contexts. In some implementations, a floating point counter can be used to generate a wave form made up of a series of pulses with different pulse lengths. An array of these floating point counters can be used to implement a pool of delays. In other implementations, an array of floating point counters can be used to analyze waveforms on a number of different communication channels. Analysis of such waveforms may be useful in automotive applications, such as in wheel speed measurement for example, as well as other applications.

Abstract: A current memory cell includes an amplifier, transistor, first and second capacitors, and first to third switching units. The amplifier includes first to third terminals. The transistor is coupled to first and second nodes, and ground. The first capacitor is coupled between the second node and ground. The second capacitor is coupled between a third node and ground. The first unit couples a current source to the first node during a first period and an output line to the first node during a second period. The second unit couples the first node to the second node during the first period. The third unit couples the first terminal to the second node and couples the second and third terminals to the third node during the first period, and couples the first terminal to the third node and couples the second and third terminals to the second node during the second period.

Abstract: An amplification circuit includes an amplifier, a first capacitor including a first terminal connected to an input terminal of the amplifier, a second capacitor including a first terminal connected to the input terminal of the amplifier and a second terminal connected to an output terminal of the amplifier, and a correction unit configured to correct a difference in bias dependency between capacitance values of the first and second capacitors.