Abstract: Machine vision inspection devices and machine vision methods for inspecting objects, such as objects with shiny surfaces. Device embodiments include an illumination housing with a central aperture and a specialized aperture cover. Use of the claimed device embodiments to inspect objects eliminates the void (dark spot) common to known machine vision inspection methods.

Abstract: In various embodiments, an image sensor and method of using an image sensor are described. In an example embodiment, the image sensor comprises a semiconductor substrate and a plurality of pixel regions with each pixel region comprising an optically sensitive material over the substrate and positioned to receive light. There is a bias electrode for each pixel region, with the bias electrode configured to provide a bias voltage to the optically sensitive material of the respective pixel region. Also included is a pixel circuit for each pixel region with each pixel circuit comprising a charge store formed on the semiconductor substrate and a read out circuit, the charge store being in electrical communication with the optically sensitive material of the respective pixel region.

Abstract: Methods and systems are described for building and using a support vector machine for classifying a new sample. Training samples of one class or another class are used to build the machine by mapping the angle space to a set of angle vectors and, for each angle vector, finding candidate hyperplanes that are orthogonal to a vector at the angle vector and radiating from an origin point to the hyperplane. An optimal pair of candidate hyperplanes at one of the angle vectors is selected on the basis of the distance between the pair and the number of samples between them. The selection may be based on hard margin or soft margin approaches. A matrix-based implementation is presented. New training samples may be added, removed, or reclassified without requiring recalculation of the entire support vector machine.

Abstract: A bar-typed double-row LED lighting includes an elongate shell, a first row LED lamp, a second row LED lamp, a first cover, and a second cover. Each of the LED chips of the first row LED lamp is staggered from that of the second row LED lamp. The first cover includes a plurality of first depressions. The second cover includes a plurality of second depressions. Since each of the LED chips of the first row LED lamp is staggered from that of the second row LED lamp and the first, second covers respectively include a plurality of first, second depressions which are configured for avoiding or preventing the first, second covers from stopping the travel of the light emitted from the second first row LED lamps. As a result, the bar-typed double-row LED lighting can extend effective illumination area and improve luminous efficiency thereof.

Abstract: A method and apparatus for obtaining 2D silhouettes from one or more 3D objects, which uses an image acquisition unit having a telecentric lens system that is able to fully scan an object in one dimension.

Abstract: A control system executes a first control operation, and then executes a second control operation. In the first control operation, the image processing section obtains the image data and specifies a position of a characteristic part. The control section determines a control instruction for accelerating an object to a predetermined first speed based on the specified position of the characteristic part and then decelerating the object to a predetermined second speed lower than the first speed, to move the object to an intermediate target position away from the final target position by a predetermined margin distance. In the second control operation, the image processing section obtains the image data during movement of the moving mechanism and specifies the position of the characteristic part, and the control section determines a control instruction for positioning the object to the final target position based on the specified position of the characteristic part.

Abstract: Image analysis methods for quantifying cracks in a road surface from a road surface image recorded as a digital image, and quantify the degree of deterioration of the road surface. An object image is prepared, in which its region is divided into a plurality of pixels and the grayscale value of each of the pixels is inverted. An image analysis technique may include, on the basis of an image obtained by applying a Gabor filter to a multiple resolution image, containing images with multiple scales obtained by scaling, cracks in a road surface can be detected and distinguished from white lines and characters on the road surface. It is possible to solve various problems, in which visually detected cracks do not appear as edges and edges of white lines and characters on the road surface are detected as line segment vectors.

Abstract: Embodiments relate to using a UAV for assisting drivers of large wheeled vehicles when backing up in reverse and for conducting pre-trip inspections of the wheeled vehicle prior to driving. The UAV can be a multirotor copter using simultaneous localization and mapping technology to maneuver autonomously. Alternatively, the driver of the wheeled vehicle may use remote control to maneuver the UAV.

Abstract: An image display apparatus capable of providing a luminance unevenness correction capability that allows a user to readily visually grasp the correction is provided. An image display apparatus that includes an OSD display section that displays pattern images showing areas for luminance adjustment in an image, a pattern image selection operation section that accepts selection of any of the displayed pattern images, a luminance adjustment operation section that accepts operation of adjusting the luminance of the image, and a luminance correction section that adjusts the luminance of the image in the area for luminance adjustment corresponding to the selected pattern image.

Abstract: A system, that includes a hybrid sensor that comprises: a monochromatic portion that is arranged to obtain a monochromatic image of a first area of an object; a multiple-color portion that is arranged to obtain a multi-colored image of a second area of the object; wherein the monochromatic portion comprises monochromatic sensing elements that sense radiation of a same frequency band; wherein the multiple-color portion comprises color sensing elements of different types, wherein different types of color sensing elements are associated with different frequency bands.

Abstract: A method, non-transitory computer readable medium, and apparatus for detecting defective brakes are disclosed. For example, the method detects that a wheel of a vehicle is in a position to be read by an infrared (IR) thermometer, signals the IR thermometer to take a temperature measurement of a brake of the wheel, receives the temperature measurement of the brake and determines that a defective brake condition exists when the temperature measurement of the brake is outside a temperature range.

Abstract: A fiber inspection system for inspecting optical-fiber endfaces of a multiple-fiber connector is provided that includes a housing structure, a mating interface fixed relative to the housing structure for interfacing with the multiple-fiber connector, and an imaging assembly. The imaging assembly is enclosed in the housing structure and defines an inspection plane and an image plane, at least a plurality of the optical-fiber endfaces being disposed on the inspection plane, to within a focusing range, when the multiple-fiber connector is mated to the mating interface. The imaging assembly also defines an imaging axis between an inspection point on the inspection plane and a detection point on the image plane, and includes an alignment module disposed between the inspection plane and the image plane and controllable to move the inspection point across the inspection plane for selectively inspecting one or more of the optical-fiber endfaces.

Abstract: An inspection station identifies defects such as artifacts (e.g., dust, hair, particles) in the sealing areas of sealed sterile packages. A multi-head optical scanner can include at least two fiber optic sensors each comprised of a bundle of optical fibers arranged into a linear face coupled to an image processing module and oriented towards a scanning area of sealed packages moving through a conveyance system. An image processing module can analyze input from the at least two fiber optic sensor arrangements to identify artifacts in the sealing areas of the sealed packages.

Abstract: A method and apparatus for inspecting an object. In response to a presence of the object in an inspection area, a volume containing the object is identified. The volume has a plurality of portions. A number of sensor systems is assigned to the plurality of portions of the volume. Each sensor system in the number of sensors systems is assigned to a number of portions in the plurality of portions of the volume based on whether each sensor system is able to generate data with a desired level of quality about a surface of the object in a particular portion in the plurality of portions. Data about the surface of the object is generated using the number of sensor systems assigned to the plurality of portions of the volume. A determination is made as to whether a number of inconsistencies is present on the surface of the object using data.

Abstract: A cable safety and maintenance vision system includes an imaging unit comprising at least one imaging device configured to capture images of a side profile portion of a cable. The cable forms a continuous cable loop. A cable defect detection processor is in communication with the at least one imaging device. The cable defect detection processor is configured to receive images from the at least one imaging device, to identify features in the images that indicate potential defects, and to output a location on the continuous cable loop of the features in the images that indicate potential defects.

Abstract: An inspection module for inspection of a target object is disclosed. The inspection module includes an inspection module comprising a housing, a sensor adapted to provide sensor data relating to the target object, an inspection module processor adapted to receive the sensor data from the sensor and to provide corresponding packaged data, and an inspection module interface adapted to output the packaged data from the inspection module processor.

Abstract: A computer-implemented method for designating a portion of a machine-vision analysis to be performed on a worker. A set of machine-vision algorithms is obtained for analyzing a digital image of a product. An overall time estimate is determined that represents the processing time to analyze the digital image using the entire set of machine-vision algorithms. If the overall time estimate is greater than a threshold value, then an algorithm time estimate for each of two or more algorithms of the set of machine-vision algorithms is obtained. A rank associated with each of the two or more algorithms is computed based on the algorithm time estimates. A designated algorithm to be performed on the worker is selected based on the rank associated with each of the two or more algorithms. The digital image may then be analyzed on the worker using the designated algorithm.

Abstract: The present invention relates to a diamond screening apparatus, comprising: a working platform comprising a working plane; a conveyer disposed on the working plane of the working platform for carrying a diamond matrix unit; an image capture device forming one or a plurality of captured images in different regions of the diamond matrix unit; a display device; and an image recognition module, which is electrically connected to the image capture device and the display device, performs a geometric feature parameter analysis on the captured images to determine one or a plurality of risk diamonds of the diamond matrix unit.

Abstract: Disclosed are methods and apparatus for inspecting an extreme ultraviolet (EUV) reticle is disclosed. An optical inspection tool is used to obtain a phase defect map for the EUV reticle before a pattern is formed on the EUV reticle, and the phase defect map identifies a position of each phase defect on the EUV reticle. After the pattern is formed on the EUV reticle, a charged particle tool is used to obtain an image of each reticle portion that is proximate to each position of each phase defect as identified in the phase defect map. The phase defect map and one or images of each reticle portion that is proximate to each position of each phase defect are displayed or stored so as to facilitate analysis of whether to repair or discard the EUV reticle.

Abstract: A solution for monitoring an area for the presence of a flame and/or a leak, such as from a pressurized fluid, is provided. An imaging device can be used that acquires image data based on electromagnetic radiation having wavelengths only corresponding to at least one region of the electromagnetic spectrum in which electromagnetic radiation from an ambient light source is less than the electromagnetic radiation emitted by at least one type of flame for which the presence within the area is being monitored. An acoustic device can be used that is configured to acquire acoustic data for the area and enhance acoustic signals in a range of frequencies corresponding to a leak of a pressurized fluid present in the area.

Abstract: A system for detecting stress in rails includes a railcar, having a rail temperature detector, and a rail imaging device oriented to produce images of rail joints and rail anchors. The imaging device and temperature detector are connected to a computer controller, which is programmed to provide an output signal indicative of estimated axial stress in the rail based upon rail temperature and the images of at least one of the rail joints and rail anchors.

Abstract: Methods are presented for improved detection of persistent or systematic defects induced during the manufacture of a product. In particular, the methods are directed to the detection of defects induced systematically in the manufacture of photovoltaic cells and modules. Images acquired from a number of samples are combined, enhancing the systematic defects and suppressing random features such as variations in material quality. Once a systematic defect is identified, steps can be taken to locate and rectify its cause.

Abstract: The invention relates to apparatus monitoring test media used in or applicable to magnetic testing, said apparatus comprising a test element fitted with an artificial defect and a test medium feed and a test return as well as a magnetic field generator, further a magnetic field adjustment unit to adjust the magnetic field strength acting on the test element and/or the artificial defect, being adjustable at different magnetic field intensities to check the test medium, and to a corresponding method.

Abstract: A display system for a working machine displays warning information while also displaying a high-quality camera image. The display redisplays a reduced camera image at a reduction scale of 60% according to an abnormality information signal. An open area 44 outside the area displaying the camera image. The display control device displays a warning icon (large size), corresponding to abnormality information regarding a filter of a DPF device, in the open area. The operator recognizes the warning and immediately stops the operation, moves to a place where the filter regeneration is possible while checking the safety of the surroundings by viewing the camera image, and then carries out the filter regeneration. After finishing, the operator confirms that the warning icon has disappeared, moves to the site of the operation while checking the safety of the surroundings by viewing the camera image (for normal times), and then restarts the operation.

Abstract: An optical inspection method including the following steps is disclosed. A tester is utilized to obtain an image of an inspection object. A target image region of the image is determined. Multiple central coordinates of multiple inspection ranges of a target image region are obtained. The central coordinates are filled to an array, and then the central coordinates are reordered according to relative relationships of the central coordinates to obtain a reordered coordinate array. The reordered coordinate array is compared with an original coordinate array to inspect whether parts of the inspection object corresponding to the inspection ranges are missed.

Abstract: Machine vision inspection systems and methods for inspecting objects, such as objects with shiny surfaces, as well as illuminators with aperture covers for use therewith. Use of such an aperture cover eliminates the void (dark spot) in the illumination field that inherently results from the presence of an aperture through which an associated camera views an object to be inspected.

Abstract: A method for inspecting a composite structure includes acquiring an image of the composite structure. The composite structure includes at least a first ply and a second ply adjacent the first ply. The method also includes transforming the image into a binary image, and determining a first boundary line between the first ply and the second ply. The method further includes characterizing an irregularity in the composite structure based at least partially on the first boundary line.

Abstract: A method of inspecting two or more sides of an object is provided. The method includes generating one set of image data of two or more sides of the object, such as by using spherical mirror segments that project all sides of the object onto a single image and generating an X by Y array of image data of the single image. The projection of the image data is then compensated for, such as by identifying inspection processes to locate defects of the object in the projected image data or by converting the image data from the projected inspection coordinates to Cartesian coordinates. Predetermined inspection processes are then performed on the compensated image data, such as by using the inspection processes that are optimised for use with the projected image data or by converting the projected image data into a Cartesian format and using Cartesian image data inspection processes.

Abstract: A method and system for probe-based pattern matching including an apparatus for synthetic training of a model of a pattern. The apparatus comprises a sensor for obtaining an image of the pattern and a processor for receiving the image of the pattern from the sensor and running a program. In the steps performed by the program a boundary of the pattern in the image is identified. A plurality of positive probes are placed at selected points along the boundary of the pattern and at least one straight segment of the boundary of the pattern is identified. The at least one straight segment of the boundary is extended to provide an imaginary straight segment and a plurality of negative probes are placed at selected points along the imaginary straight segment, where each negative probe has a negative weight.

Abstract: An inspection station identifies defects such as artifacts (e.g., dust, hair, particles) in the sealing areas of sealed sterile packages. A multi-head optical scanner can include at least two fiber optic sensors each comprised of a bundle of optical fibers arranged into a linear face coupled to an image processing module and oriented towards a scanning area of sealed packages moving through a conveyance system. An image processing module can analyze input from the at least two fiber optic sensor arrangements to identify artifacts in the sealing areas of the sealed packages.

Abstract: The present disclosure is directed to a system for inspecting a sample with multiple wavelengths of illumination simultaneously via parallel imaging paths. The system may include at least a first detector or set of detectors configured to detect illumination reflected, scattered, or radiated along a first imaging path from a selected portion of the sample in response to the first wavelength of illumination and a second detector or set of detectors configured to concurrently detect illumination reflected, scattered, or radiated along a second imaging path from the selected portion of the sample (i.e. the same location on the sample) in response to the second wavelength of illumination, where the second imaging path may at least partially share illumination and/or detection optics with an autofocus channel.

Abstract: A system, device, and method for inspecting the cosmetic and operational features of electronic devices, including computing and telecommunications devices. The cosmetic inspection system includes an image capture unit for capturing the images of the electronic devices, and a user interface for processing the captured images and providing relevant information to the user of the system. Images of the external components such as external casing materials or touch screens of electronic devices are captured and the cosmetic inspection system uses baseline images to make determinations to identify defective components of the electronic devices. Based on these determinations, the system may conclude which, if any, replacement components of the devices are needed to restore the electronic device. In one embodiment, a user of the system may then be provided with information through a user interface about defective components and options for ordering replacement components.

Abstract: An apparatus for optically inspecting a test specimen has an at least partly reflective surface including a camera having a number of pixels and an illumination device having a multiplicity of spatially distributed light sources. A workpiece receptacle serves for positioning the test specimen relative to the illumination device and the camera, such that light from the light sources is reflected by the surface to the camera. An evaluation and control unit generates a series of different illumination patterns on the surface, wherein in the course of the series different light sources are switched on. An individual light origin region is determined on the basis of the images recorded by the camera for at least one pixel, whereby the region represents a spatial distribution of individual light contributions generated by the light sources via the surface on the at least one pixel.

Abstract: An appearance inspection device and an appearance inspection method, capable of teaching a line pattern having an arbitrary shape as a portion to be inspected, in relation to a captured image of an inspection object, by a simple teaching operation. The device has an image storing part, a teaching part, an inspecting part and an inspection factor storing part. The teaching part obtains an image of the inspection object in the teaching process, and teaches the position of an inspection point, the position and the angle of an inspection region relative to the inspection point, the inspection factor and a judgment condition. The teaching factor storing part stores a setting parameter and a teaching factor. The inspecting part executes inspection based on the teaching factor in the inspecting process.

Abstract: Apparatus for monitoring a print result in a rotary printing press, includes a web monitoring system including a matrix camera (20) that is movable in transverse direction over a web printed in the printing press, the matrix camera being adapted to capture an excerpt of the printed image in synchronism with a repeat of the printed image during a print run, an inspection system for a complete inspection of the printed image, the inspection system including a line camera that extends over the entire widths of the web, and an integrated control desk for the web monitoring system and the inspection system.

Abstract: A system and method for detecting defects on a reticle is disclosed. The method may comprise determining a best focus setting for imaging the reticle; obtaining a first image of the reticle, the first image obtained at the best focus setting plus a predetermined offset; obtaining a second image of the reticle, the second image obtained at the best focus setting minus the predetermined offset; generating a differential image, the differential image representing a difference between the first image and the second image; and identifying a defect on the reticle based on the differential image. The method in accordance with the present disclosure may also be utilized for detecting defects on at least a portion of the reticle.

Abstract: Described are computer-based methods and apparatuses, including computer program products, for wafer identification fault recovery. A digital image is received that includes a data symbol comprising a message encoded in a set of data cells. The digital image is processed to form a set of classified data cells, wherein one or more classified data cells from the set of classified data cells comprises an error. User interface data is transmitted comprising the digital image and interactive graphics, the interactive graphics including at least one data cell control. Interaction data is received from the interactive graphics that modifies a data cell location, a data cell state, or both, of at least one classified data cell from the set of classified data cells to form a modified set of classified data cells. An error free decoded message string is generated based on the modified set of classified data cells.

Abstract: A reverse vending machine, including: a chamber adapted to receive an object returned to the reverse vending machine; a plurality of cameras arranged around the perimeter of the chamber for viewing said object; a transparent or translucent plate arranged such that the cameras in use view the object obliquely through the transparent or translucent plate; and means adapted to couple light into the plate such that the light undergoes total internal reflection in the plate. Also, a method of detecting dirt in a reverse vending machine.

Abstract: Disclosed herein is an inspection method for a display panel according to the present embodiments comprising driving the display panel so as to display a first color having a first reference brightness level; photographing the display panel to obtain a first image including at least one particle region; deriving a first particle brightness level of the particle region contrasted to the first reference brightness level from the first image; driving the display panel so as to display a second color having a second reference brightness level higher than the first reference brightness level; photographing the display panel to obtain a second image containing the particle region; deriving a second particle brightness level of the particle region contrasted to the second reference brightness level; and if the second particle brightness level is higher than the first particle brightness level, determining the particle region to be an internal particle.

Abstract: A system and method for capturing debug information are disclosed. In one aspect, a method comprises connecting a portable test device having a memory and no processor to a television, the test device having stored therein a debug program configured to be executed by a control unit of the television to capture debug information from the television and store the captured debug information on the test device.

Abstract: Image data pertaining to substrate transfer is efficiently collected and stored for use in analyzing transfer errors. A substrate processing device includes a first control part for stopping a transfer part upon detecting a transfer error in the transfer part for transferring a substrate; a storage part for storing substrate transfer operations of the transfer part as image data; and a second control part for accumulating the image data in an accumulation part at a predetermined period. The first control part obtains information indicating a state of the substrate from the transfer part or a processing part, and notifies the second control part that the transfer part is stopped due to the transfer error. The second control part retrieves image data of a predetermined period of time including the time that the transfer error occurs from the accumulation part, and converts the image data into a file.

Abstract: The disclosure provides an inspection device including a light source module, an image receiving module and a processing unit. The light source module emits a first incident light and a second incident light to a device under test (DUT). The image receiving module receives a first image corresponding to the DUT irradiated by the first incident light, and receives a second image corresponding to the DUT irradiated by the second incident light. The processing unit calculates the contrast ratio of the first image and the second image to obtain a high-contrast image for inspection.

Abstract: A solder printing inspection apparatus for inspection of solder printed on a circuit board has a multiplicity of lands for mounting of electronic components. The apparatus includes an irradiation unit for irradiating a light on the circuit board, an imaging unit for imaging the circuit board irradiated by the light, a solder bridge detection unit for detecting a solder bridge connecting two of the lands based on an image data imaged by the imaging unit, a distance calculation unit for calculating a bridge distance as distance between two lands contacting the solder bridge or solder bridging regions or solder detection frames corresponding to the two lands contacting the solder bridge, and a distance determination unit for determination of whether or not the bridge distance is within a permissible range.

Abstract: The detecting method and detecting device provided in the present disclosure is used for detecting an array substrate, including: scanning a defect on the array substrate and determining a size of the defect; generating a switching controlling command according to the size of the defect and switching a lens to a magnification adapted to the size of the defect; and capturing an image of the defect using the switched lens. In the embodiment, by analyzing the size of the scanned defect and switching the camera lens according to the size of the defect, the switched lens is allowed to capture a complete and clear image of the defect, which eases the analysis of the type of the defect, effectively improves the analyzing accuracy of the defect, and improves the monitoring effect of the manufacturing process.

Abstract: A method of inspecting a substrate for a defect on a basis of a substrate image imaged by an imaging apparatus, includes: imaging a substrate being an imaging object under a predetermined imaging condition; extracting a mode of pixel values of the imaged substrate image; calculating a correction value for the imaging condition on a basis of the extracted pixel value and preset imaging condition correction data; then changing the imaging condition on a basis of the correction value, and imaging again the substrate being the imaging object under the changed imaging condition; and inspecting the substrate for a defect on a basis of a substrate image imaged under the changed imaging condition.

Abstract: An inspection system is provided that can calculate highly accurate data for inspection having a high S/N ratio with high freedom. In order to attain this, an imaging timing is adjusted to synchronize a time for a projected image of an object to move by “m” pixels (“m” is an integer number greater than or equal to 1) in the X-axis direction on imaging elements, with an imaging time interval, and partial image data imaged at the identical inspection position on the object is specified from each unit of two-dimensional image data based on the object appearing deviated by “m” pixels in the X-axis direction in each unit of the two-dimensional image data imaged at each of the imaging timings, and data for inspection in which a noise reducing processing is conducted at the inspection position is produced based on each section of the partial image data.

Abstract: A method and apparatus for testing a number of display devices. Images displayed on the number of display devices are received by a computer system for a platform during a performance of a number of tests at a number of test locations for the platform. A portion of the images from the images are identified as a number of images of interest using a policy.

Abstract: Devices and methods for monitoring test results for testing components that are obstructed from the tester's view are provided. One such device is a video apparatus for monitoring a vehicle component undergoing testing comprising a plurality of video cameras; a light source coupled to each of the video cameras and configured to direct light in a direction that a lens of the video camera is directed; a power source electrically coupled to the plurality of video cameras and the light sources; and a controller. The controller is configured to receive video signals from each of the plurality of video cameras and control a display to simultaneously display each of the video signals.

Abstract: An apparatus for inspecting a glass substrate is provided, which comprises at least one support arm including an optical sensor that senses incident light and supporting the glass substrate, and a control portion determining whether the glass substrate and the optical sensor overlap each other or a state of the glass substrate based on characteristics of the light sensed by the optical sensor.

Abstract: A method and apparatus for optimizing high-speed optical inspection of parts using intelligent image analysis to determine optimal focus using high numerical aperture (NA) optics, achieve a superior signal-to-noise ratio, resolution, and inspection speed performance with very limited depth of field lenses.