Quality Inspection Patents (Class 348/92)
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Patent number: 12055380Abstract: A method for determining a distance of a sample reference plane of a sample carrier from a reference plane of a microscope, the microscope including a sample stage for the sample carrier and a camera, comprises the following steps: taking an overview image of the sample carrier by means of the camera; evaluating the overview image and thus detecting at least one characteristic of the sample carrier; ascertaining contextual data of the characteristic from a data set; and determining the distance of the sample reference plane from the reference plane based on the characteristic and the contextual data of the sample carrier. A microscope configured to determine the distance of the sample reference plane of the sample carrier from the reference plane is also described.Type: GrantFiled: July 14, 2021Date of Patent: August 6, 2024Assignee: Carl Zeiss Microscopy GmbHInventors: Manuel Amthor, Daniel Haase
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Patent number: 12023722Abstract: A method of inspecting stamped blanks on a stamping line includes identifying at least one target defect location for a given stamped blank configuration where a unique defect type is associated with each of the at least one target defect locations. One or more images of each of the least one identified target defect locations on blanks stamped per the given stamped blank configuration are acquired with one or more cameras assigned to each of the identified target defect locations. The method includes analyzing the one or more images of each of the least one identified target defect locations and detecting if the unique defect type associated with each of the at least one target defect locations is present. Also, each unique defect type is identified with a corresponding unique defect identification algorithm.Type: GrantFiled: October 23, 2020Date of Patent: July 2, 2024Assignee: Ford Global Technologies, LLCInventors: Raj Sohmshetty, Tanveer Shaik, Elizabeth Bullard, Francis Maslar, Brodie Schultz
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Patent number: 12025531Abstract: A rapid detection tool for a coaxial relationship based on a photosensitive material and a detection method using the same are used to detect coaxiality of two through-holes in the same workpiece to be detected. An image processing unit and a control unit are mounted outside a light-shielding box. Light sources, cameras, sensors, and an air cylinder are mounted in the light-shielding box. A photosensitive plate coated with a photosensitive resin is placed between the two holes, and two sides are irradiated by the light sources. Coordinates of centers of circular patterns formed on the photosensitive plate are calculated so that a coaxial relationship between the two holes can be accurately obtained. An output rod of the air cylinder is controlled to extend outward to reject a workpiece to be detected not meeting requirements.Type: GrantFiled: February 25, 2022Date of Patent: July 2, 2024Assignee: JIANGSU UNIVERSITYInventors: Yun Wang, Lihui Ren, Fuzhu Li, Zhenying Xu, Kun Zhang, Wang Ni, Ying Yan, Weili Liu, Peiyu He, Xu Ding
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Patent number: 12014485Abstract: A method for the nondestructive inspection of a surface structure, including: preparing the surface structure; wetting a portion of the surface structure with a liquid, the variation in the thickness of the liquid above the portion of the surface structure being at most 50% of the maximum thickness of the liquid above the surface structure, so that the liquid forms a light guide which has, and is bounded by, the inverse shape of the surface structure at a first large surface and is bounded by air at a second large surface; coupling light into the light guide so that the inverse shape of the surface structure at the first large surface is impinged by light such that light coupled into the light guide is coupled out of the light guide via the second large surface; capturing an image of the light coupled out and; evaluating the captured image.Type: GrantFiled: May 4, 2022Date of Patent: June 18, 2024Assignee: siOPTICA GmbHInventors: Markus Klippstein, André Heber, Eric Günl
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Patent number: 11913345Abstract: A system and method of using a tool assembly is provided. The system includes a body, a first camera and a second camera fixed to the body, and a controller. The controller is configured to receive data indicative of images of a reference feature from the first camera, determine data indicative of a first spatial position of the first camera based at least in part on the received data indicative of the images of the reference feature, and determine data indicative of a second spatial position of the second camera based on the first spatial position, a known spatial relationship between the first location and the second location, or both. Further, the controller may be configured to receive data indicative of images of a target feature using the second camera, derive dimensions of the target feature based on the images, and generate a three-dimensional representation of the target feature.Type: GrantFiled: September 10, 2021Date of Patent: February 27, 2024Assignees: General Electric Company, Oliver Crispin Robotics LimitedInventors: Mandar Diwakar Godbole, Byron Andrew Pritchard, Jr., Kirti Arvind Petkar, Vamshi Krishna Reddy Kommareddy, Sandeep Kumar, Andrew Crispin Graham
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Patent number: 11768071Abstract: An apparatus for inspecting a surface comprises a light source and a camera. When a light beam is generated by the light source, a centerline of the light beam is coincident with a line of sight of the camera when viewed in a direction, perpendicular to a first plane that contains one of the centerline of the light beam or the line of sight of the camera. The centerline of the light beam is parallel to the line of sight of the camera when viewed in a direction, perpendicular to a second plane that is perpendicular to the first plane and that contains the centerline of the light beam and the line of sight of the camera.Type: GrantFiled: February 8, 2022Date of Patent: September 26, 2023Assignee: The Boeing CompanyInventor: Amir Afrasiabi
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Patent number: 11656181Abstract: An inspection apparatus for inspecting a light-emitting diode wafer is provided. The inspection apparatus includes a Z-axis translation stage, a sensing probe, a height measurement module, a carrier, an illumination light source, and a processing device. The sensing probe is integrated with the Z-axis translation stage. The Z-axis translation stage is adapted to drive the sensing probe to move in a Z axis. The sensing probe includes a photoelectric sensor, a beam splitter, and a photoelectric sensing structure. One of the photoelectric sensor of the sensing probe and the height measurement module is adapted to receive a light beam penetrating the beam splitter, and the other one of the photoelectric sensor of the sensing probe and the height measurement module is adapted to receive a light beam reflected by the beam splitter. The carrier is configured to carry the light-emitting diode wafer. The illumination light source is configured to emit an illumination beam to irradiate the light-emitting diode wafer.Type: GrantFiled: December 28, 2020Date of Patent: May 23, 2023Assignee: Industrial Technology Research InstituteInventors: Yan-Rung Lin, Chih-Hsiang Liu, Chung-Lun Kuo, Hsiang-Chun Wei, Yeou-Sung Lin, Chieh-Yi Lo
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Patent number: 11631164Abstract: Generally described, one or more aspects of the present application correspond to systems and techniques for spectral imaging using a multi-aperture system with curved multi-bandpass filters positioned over each aperture. The present disclosure further relates to techniques for implementing spectral unmixing and image registration to generate a spectral datacube using image information received from such imaging systems. Aspects of the present disclosure relate to using such a datacube to analyze the imaged object, for example to analyze tissue in a clinical setting, perform biometric recognition, or perform materials analysis.Type: GrantFiled: November 19, 2021Date of Patent: April 18, 2023Assignee: SPECTRAL MD, INC.Inventors: Brian McCall, Wensheng Fan, Jason Dwight, Zhicun Gao, Jeffrey E. Thatcher, John Michael DiMaio
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Patent number: 11631170Abstract: A non-transitory computer readable recording medium has an estimation model according to one aspect of the present invention recorded thereon, and the estimation model is included in a program to be executed by a computer and outputs output data estimated based on input data received. In response to receiving, as the input data, a change over time in an intensity of energy emitted from a sealing part of an object subjected to a sealing process through bonding, the estimation model estimates at least one of whether sealing of the object is good or whether the sealing of the object is defective and outputs an estimation result as the output data, the change over time being calculated based on an intensity of energy emitted at each of a first time point and a second time point that is later than the first time point.Type: GrantFiled: July 17, 2020Date of Patent: April 18, 2023Assignee: KYOTO SEISAKUSHO CO., LTD.Inventor: Keisuke Noda
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Patent number: 11599738Abstract: Method for examining a multiplicity of distributed objects (1) by using an overview image (200) of the area (2) in which the objects (1) are distributed, wherein the overview image (200) is converted (110) into a binary image (210) by virtue of the intensity values (202) of the pixels (201) of the overview image (200) being classified (202a, 202b) as to whether they are on the near or far side of a prescribed threshold (208); the binary image (210) is cleared (120) of structures (219) that are smaller than the objects (1), so that a cleared image (220) is produced; and the cleared image (220) is morphologically closed (130), so that a binary object mask (230) is produced that indicates which locations in the area (2) belong to objects (1) and which locations in the area (2) do not belong to an object.Type: GrantFiled: March 17, 2017Date of Patent: March 7, 2023Assignee: Leibniz-Institut FÜR Photonische Technologien E.V.Inventors: Iwan W. Schie, Christoph Krafft, Jürgen Popp
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Patent number: 11583951Abstract: The invention relates to a method for collision avoidance of a laser machining head (102) in a machining space (106) of a laser machining tool (100), having the steps of: —Monitoring a workpiece (112) in the machining space (106) with at least one optical sensor; —Capturing images of the workpiece (112); —Detecting a change in an image of the workpiece (112); —Recognising whether the change comprises an object standing upright relative to the workpiece (112); —Checking for a collision between the upright object and the laser machining head (102) based on a predetermined cutting plan and/or the current position (1016) of the laser machining head; —Controlling the drives for moving the laser machining head (102) for collision avoidance in case of recognised risk of collision.Type: GrantFiled: September 23, 2019Date of Patent: February 21, 2023Assignee: BYSTRONIC LASER AGInventors: Christoph Fahrni, Seyed Amin Mazloumian
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Patent number: 11585721Abstract: A displacement component detection apparatus 10 is provided with: a displacement distribution calculation unit 11 configured to calculate, from time-series images of a measurement target region of an object 30 output from an image capturing device 20 configured to capture the images of the measurement target region, a displacement distribution in a region that corresponds to the measurement target region in the images; a movement amount calculation unit 12 configured to calculate, based on the displacement distribution and image capturing information, a movement amount in the surface direction of the measurement target region and a movement amount in the normal direction of the measurement target region; and a surface displacement calculation unit 13 configured to calculate, from the displacement distribution, a surface displacement component in the measurement target region, using the movement amount in the surface direction of the measurement target region and the movement amount in the normal direction ofType: GrantFiled: November 14, 2017Date of Patent: February 21, 2023Assignee: NEC CORPORATIONInventor: Masahiko Ohta
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Patent number: 11538234Abstract: Information about a drug-containing vessel is determined by capturing image data of the curved surface of a cylindrical portion of a drug-containing vessel. The image data is unfurled from around the curved surface, binarised, and a template matching algorithm employed to determine that the label information comprises candidate information about the vessel and/or the drug.Type: GrantFiled: May 3, 2018Date of Patent: December 27, 2022Assignee: Ares Trading S.A.Inventors: Robert Jones, Robert F. Marchington, David Rimmer, Bogdan-Alexandru Cociu, William D. Addison, Matthew J. Hayes, Ruairi Duffy, Quentin Le Masne
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Patent number: 11474144Abstract: An inspection apparatus including an illumination light source, a sensing probe and a processing device is provided. The illumination light source emits an illumination beam to simultaneously irradiate the plurality of light-emitting diode. The sensing probe is configured to measure a charge distribution, an electric field distribution, or a voltage distribution on the plurality of light-emitting diodes simultaneously irradiated by the illumination beam. The processing device determines a plurality of electro-optical characteristics of the plurality of light-emitting diodes through the charge distribution, the electric field distribution, or the voltage distribution on the plurality of light-emitting diodes simultaneously irradiated by the illumination beam. Moreover, a method of for inspecting light-emitting diodes is also provided.Type: GrantFiled: June 19, 2020Date of Patent: October 18, 2022Assignee: Industrial Technology Research InstituteInventors: Yan-Rung Lin, Chung-Lun Kuo, Chih-Hsiang Liu, Shie-Chang Jeng
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Patent number: 11474149Abstract: A test apparatus includes a test chamber in which a plurality of the semiconductor packages having a plurality of component dies is secured, an operation tester configured to conduct an operation test to the plurality of semiconductor packages to detect whether at least one semiconductor package is an operation fault package having a fault and identify a fault package point at which the operation fault package is located, a fault heat detector configured to detect a fault heat generated from the fault, and a test controller configured to control the operation tester to conduct the operation test to the plurality of semiconductor packages and control the fault heat detector subsequent to the operation test to detect the fault heat generated from the fault of the operation fault package to determine a vertical point of the fault and to determine a fault die having the fault.Type: GrantFiled: June 30, 2020Date of Patent: October 18, 2022Assignee: Samsung Electronics Co., Ltd.Inventors: Chansik Kwon, Junyoung Ko, Jongkeun Moon, Jinduck Park, Jiyeon Han
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Patent number: 11370111Abstract: A system and method for automatically moving one or more items between a structure at a source location and a destination using a robot is provided. The system includes first and second vision systems to identify an item and to determine the precise location and orientation of the item at the source location and the precise location and orientation of the destination, which may or may not be in a fixed location. A controller plans the best path for the robot to follow in moving the item between the source location and the destination. An end effector on the robot picks the item from the source location, holds it as the robot moves, and places the item at the destination. The system may also check the item for quality by one or both of the vision systems. An example of loading and unloading baskets from a machine is provided.Type: GrantFiled: September 20, 2018Date of Patent: June 28, 2022Assignee: MAGNA INTERNATIONAL INC.Inventor: Alexander Zak
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Patent number: 11350024Abstract: Image data from a camera is used to identify one or more items in a dynamic field of view for item identification and tracking. The camera focus setting may be adjusted to different depth of field based on estimated distances to the items within the image data. After adjusting the focus setting, additional image data may be collected to capture a sharper image of the item and ensure sufficient clarity for item recognition based on item identifiers visible on the items within the image data.Type: GrantFiled: March 4, 2021Date of Patent: May 31, 2022Assignee: Amazon Technologies, Inc.Inventors: Timothy Stallman, Frank Preiswerk, Michael R Calder
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Patent number: 11301989Abstract: A method of quantifying wear data on a well tool includes identifying the well tool based on a solid model file and a data file corresponding to the well tool, wherein the solid model and data files are stored on a computer system and separately identify wear parts of the well tool, scanning the well tool with a scanner and thereby generating a scanned file of the well tool, the scanner being in communication with the computer system, aligning the scanned file with the solid model file to obtain an overlay output, creating digital features on the wear parts of the scanned file, and calculating deviation between the solid model file and the scanned file at the digital features for the wear parts and thereby determining material removed from the wear parts of the well tool.Type: GrantFiled: May 14, 2021Date of Patent: April 12, 2022Assignee: Taurex Drill Bits, LLCInventors: Dustin Lyles, Jerry Rhoades, Warren Dyer, Matthew Mumma
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Patent number: 11250553Abstract: A deposit detection device according to an embodiment includes a calculation module, an extraction module, and a decision module. The calculation module calculates a brightness average for each of small regions into which a predetermined region of an image captured by an imaging device is divided. The extraction module extracts, as a high-brightness region, the small region in which the brightness average calculated by the calculation module is equal to or larger than a predetermined value. The decision module decides on a brightness threshold value for detecting a deposit region corresponding to a deposit adhering to the imaging device, based on the area of the high-brightness region extracted by the extraction module.Type: GrantFiled: September 14, 2020Date of Patent: February 15, 2022Assignee: DENSO TEN LimitedInventors: Nobunori Asayama, Nobuhisa Ikeda, Takashi Kono, Yasushi Tani, Daisuke Yamamoto, Tomokazu Oki, Teruhiko Kamibayashi
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Patent number: 11230015Abstract: The robot system for which the position of a camera attached to the arm is changeable to multiple positions. The robot system memorizes offset information between the arm and the camera for each of multiple positions. Further, the robot system moves the arm to the position offset by the offset information corresponding to the attachment position of the selected camera. As a result, even when the mounting position of the camera is changed, the robot system can move the camera to an appropriate position when imaging and perform imaging without requiring troublesome teaching.Type: GrantFiled: March 23, 2017Date of Patent: January 25, 2022Assignee: FUJI CORPORATIONInventors: Masato Suzuki, Takashi Taneike, Satoru Nishiyama
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Patent number: 11215525Abstract: A wafer-grade LED detection device and a wafer-grade LED detection method are provided. The wafer-grade LED detection device includes a light-generating module for providing a first light beam that passes through an LED wafer to be converted into a second light beam, a light-filtering module adjacent to the LED wafer for receiving the second light beam that passes through the light-filtering module to be converted into a third light beam, and a light-detecting module adjacent to the light-filtering module for receiving and detecting the third light beam. A wavelength range of the second light beam is restricted by the light-filtering module, so that a wavelength range of the third light beam is smaller than the wavelength range of the second light beam. When the third light beam is received by the light-detecting module, the light-detecting module can detect the third light beam for obtaining relevant information.Type: GrantFiled: March 23, 2020Date of Patent: January 4, 2022Assignee: ASTI GLOBAL INC., TAIWANInventors: Chien-Shou Liao, Te-Fu Chang, Chun-An Lu
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Patent number: 11182888Abstract: Generally described, one or more aspects of the present application correspond to systems and techniques for spectral imaging using a multi-aperture system with curved multi-bandpass filters positioned over each aperture. The present disclosure further relates to techniques for implementing spectral unmixing and image registration to generate a spectral datacube using image information received from such imaging systems. Aspects of the present disclosure relate to using such a datacube to analyze the imaged object, for example to analyze tissue in a clinical setting, perform biometric recognition, or perform materials analysis.Type: GrantFiled: August 7, 2020Date of Patent: November 23, 2021Assignee: SPECTRAL MD, INC.Inventors: Brian McCall, Wensheng Fan, Jason Dwight, Zhicun Gao, Jeffrey E. Thatcher, John Michael DiMaio
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Patent number: 11164305Abstract: A device for inspecting a display device includes a camera to photograph a substrate and generate image information, a pixel value setter to set pixel values corresponding to respective luminances of a plurality of pixels from the image information, and to detect a crack region based on the pixel values, a stress calculator to calculate a critical stress of a crack included in the crack region, and a determiner to check whether the critical stress is equal to or greater than a first threshold value and to determine whether the substrate has defects. The stress calculator calculates a critical stress of the substrate by using fracture toughness, a shape factor, and a crack depth. The shape factor is set to increase as a compressive stress of the substrate increases.Type: GrantFiled: October 28, 2019Date of Patent: November 2, 2021Assignee: SAMSUNG DISPLAY CO., LTD.Inventor: Jong-Hoon Yeum
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Patent number: 11158037Abstract: Embodiments of present invention provide a method for checking integrity of a device selection process. The method includes placing multiple devices in a device tray that has multiple cells arranged in a matrix of M-rows and N-columns; separating the multiple devices into a first group and a second group; causing a machine to memorize locations of at least the first group; removing the second group from the device tray; after the removing, causing the machine to capture an image of devices remaining in the device tray and identify locations of the remaining devices based upon the image; comparing locations so identified with locations of the first group of devices memorized by the machine; and taking a corrective action when a discrepancy is found between the locations identified and locations memorized. An apparatus for performing the above method is also provided.Type: GrantFiled: July 24, 2019Date of Patent: October 26, 2021Assignee: Auyora (Shenzhen) Inc.Inventors: Jinghui Li, Honggan Zhu, Yaxing Yao
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Patent number: 11147201Abstract: In the component mounting device, a control device includes a model data storage section for storing model data related to a component, an error determining section for determining whether a processing error has occurred, and a confirmation-necessity storage section for storing whether confirmation of the validity of the model data is necessary when the processing error has occurred in a series of processes performed based on each piece of model data stored in the model data storage section. When it is determined that a processing error has occurred, the control device temporarily suspends the operation of the component transfer device when the model data, related to the target component held by the component transfer device, stored in the confirmation-necessity storage section indicates that confirmation is necessary, but continues the operation of the component transfer device when the model data stored in the confirmation-necessity storage section indicates that confirmation is unnecessary.Type: GrantFiled: October 6, 2016Date of Patent: October 12, 2021Assignee: FUJI CORPORATIONInventors: Mitsuru Sanji, Kenji Hara
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Patent number: 11137738Abstract: A method for calibrating a computer-numerically-controlled machine can include capturing one or more images of at least a portion of the computer-numerically-controlled machine. The one or more images can be captured with at least one camera located inside an enclosure containing a material bed. A mapping relationship can be created which maps a pixel in the one or more images to a location within the computer-numerically controlled machine. The creation of the mapping relationship can include compensating for a difference in the one or more images relative to one or more physical parameters of the computer-numerically-controlled machine and/or a material positioned on the material bed. Related systems and/or articles of manufacture, including computer program products, are also provided.Type: GrantFiled: November 27, 2017Date of Patent: October 5, 2021Assignee: Glowforge Inc.Inventors: Daniel Shapiro, Mark Gosselin, Anthony Wright, Kevin McVey, Jared Kofron, Daniel Martinec, Brian Fioca, Taylor Vaughn
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Patent number: 11119008Abstract: A method for checking tyres. A shift is determined along an acquisition direction between an acquisition point on a surface of a tyre to be checked and a position occupied by the acquisition point following a rotation of the tyre about its rotation axis. A linear laser beam is projected on a linear portion of surface of the tyre, and propagates in a direction parallel to the acquisition direction. A matrix image of a matrix portion of surface of the tyre containing the linear portion of surface is acquired; the image containing a laser line reflected by the linear portion of surface. A sub-portion of the matrix image is determined as a function of the determined shift, containing the reflected laser line. The sub-portion of the matrix image is then processed to determine an elevation profile of the linear portion of surface.Type: GrantFiled: June 4, 2018Date of Patent: September 14, 2021Assignee: PIRELLI TYRE S.P.A.Inventors: Marco Cantu′, Fabio Regoli, Vincenzo Boffa, Luca Tersi
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Patent number: 11055532Abstract: A system that includes computer executable instructions that, when executed by the processor, cause the processor to perform operations including receiving a first 2D map of a location. The first 2D map was generated at a first time based on first scan data from a coordinate measurement scanner and a portable computing device. The coordinate measurement scanner includes a light source, a first image sensor, and a controller. The portable computing device includes a second image sensor. A second 2D map of the location is received. The second 2D map was generated at a second time based on second scan data from the coordinate measurement scanner and the portable computing device. The first 2D map is aligned with the second 2D map, and their contents are compared. Any differences in the contents of the first 2D map and the second 2D map are output.Type: GrantFiled: April 29, 2019Date of Patent: July 6, 2021Assignee: FARO TECHNOLOGIES, INC.Inventors: Aleksej Frank, Oliver Zweigle, Ahmad Ramadneh, Joao Santos
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Patent number: 11002783Abstract: A method for inspecting light-emitting diodes (LEDs) including following steps is provided. A plurality of LEDs are provided. A charge distribution, an electrical field distribution, or a voltage distribution on the LEDs that are irradiated by an illumination beam at the same time are inspected by a sensing probe, so as to determine electro-optical characteristics of the LEDs. Besides, an inspection apparatus is also provided.Type: GrantFiled: December 24, 2018Date of Patent: May 11, 2021Assignee: Industrial Technology Research InstituteInventors: Yan-Rung Lin, Chih-Hsiang Liu, Shie-Chang Jeng
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Patent number: 10976262Abstract: A mobile and automated apparatus for the detection and classification of damages on the body of a vehicle, specifically meaning by “damage” a dent or a depression on the vehicle body caused by pressure applied on such body by an external object (hail-stone or other), characterized in that it comprises a support structure defining a passage area for a motor vehicle having a body; the support structure comprises: lighting means adapted to project a grid pattern on the surfaces of the body, speed sensor means adapted to measure the speed of the vehicle, distance sensor means adapted to measure the distance of the body surfaces from the support structure, and image recording means adapted to capture moving images of the pattern reflected by the surfaces; the apparatus comprises a unit processing the moving images of the pattern reflected by the surfaces and captured by the image recording means, and simultaneously processing the signals from the sensor means of distance and speed, in order to detect, count, classType: GrantFiled: January 8, 2018Date of Patent: April 13, 2021Assignee: AUTOSCAN GMBHInventor: Matej Ozim
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Patent number: 10964241Abstract: A Mura correction system which detects and corrects Mura in a detection image obtained by photographing a display panel. The Mura correction system detects a Mura block by checking, based on a brightness value, detection images obtained by photographing test images displayed on a display panel, generates coefficient values of coefficients of a Mura correction equation, and generates Mura correction data including a position value of the Mura block and the coefficient values of the coefficients of the Mura correction equation.Type: GrantFiled: December 20, 2019Date of Patent: March 30, 2021Assignee: Silicon Works Co., Ltd.Inventors: Ki Taek Kim, Jun Young Park, Doo Hwa Jang, Seung Wan Yu, Do Yeon Kim
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Patent number: 10944891Abstract: A vision system camera, and associated methods of operation, having a multi-core processor, high-speed, high-resolution imager, FOVE, auto-focus lens and imager-connected pre-processor to pre-process image data provides the acquisition and processing speed, as well as the image resolution that are highly desirable in a wide range of applications. This arrangement effectively scans objects that require a wide field of view, vary in size and move relatively quickly with respect to the system field of view. This vision system provides a physical package with a wide variety of physical interconnections to support various options and control functions. The package effectively dissipates internally generated heat by arranging components to optimize heat transfer to the ambient environment and includes dissipating structure (e.g. fins) to facilitate such transfer. The system also enables a wide range of multi-core processes to optimize and load-balance both image processing and system operation (i.e.Type: GrantFiled: December 10, 2018Date of Patent: March 9, 2021Assignee: Cognex CorporationInventors: Laurens Nunnink, Richard Reuter, Frank Winzen, Mario Joussen, Joerg Kesten, James A. Negro
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Patent number: 10814417Abstract: A method for the machining of workpieces (11) and inspection of the processed workpiece surface in a machine tool (1), preferably a die sinking electrical discharge machine. The method uses at least one machining process interruption during which the processed surface of the workpiece (11) is inspected. Within said machining process interruption, at least one image of the processed workpiece surface is captured on the machine tool (1) by means of a digital camera (12). The images are processed by one or two pattern recognition algorithm (PRA D, PRA S), which were previously trained to determine the surface characteristics such as roughness parameters, functional surface features and/or characteristic defects of the processed workpiece surface captured on that at least one image. The determined surface characteristics are used to resume the processing of the workpiece surface with or without adjusting the processing parameters.Type: GrantFiled: November 20, 2017Date of Patent: October 27, 2020Assignee: Agie Charmilles SAInventors: Marco Boccadoro, Alessandro Giusti, Luca Maria Gambardella
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Patent number: 10780585Abstract: A robot for performing hand-eye calibration is provided. The robot includes a robot arm including a plurality of joints, a plurality of arm sections, and an end effector, a communication interface, and a control circuit. The control circuit controls the robot arm to place the external object on a worktable after the external object is grasped by the end effector, acquires coordinates of a central point of the external object in a coordinate system of the camera from an image of the external object, and calculates a calibration parameter for defining a relation between a coordinate system of the end effector and the coordinate system of the camera, based on coordinates of the end effector in a base coordinate system of the robot and coordinates of the central point of the external object in the coordinate system of the camera when the external object is placed on the worktable.Type: GrantFiled: January 2, 2018Date of Patent: September 22, 2020Assignee: Samsung Electronics Co., Ltd.Inventors: Soon Yong Park, Kyung Shik Roh, Sung Hwan Ahn, Suk June Yoon, So Hee Lee, Young Pil Jeon
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Patent number: 10679425Abstract: In an AR environment in which the pointing direction of the video camera is slaved to field technician motion to capture a video signal within a camera FOV of an object at arm's length from the technician and remotely-generated hand gestures for manipulation of the object are overlaid on the video signal to instruct the technician in manipulation of the object, a customer-defined key code and FOV limitations are used to exclude portions of a scene for data capture and transmission compliance. If the video camera pointing direction does not satisfy an alignment condition to a marker in the scene, the camera is controlled to exclude at least a portion of the camera FOV that lies outside a user-defined allowable FOV from capture within the video signal. The customer-defined key code includes at least technician identification, marker pairing and specified tolerance fields that define the allowable FOV.Type: GrantFiled: May 20, 2019Date of Patent: June 9, 2020Assignee: Raytheon CompanyInventors: Richard M. Pinti, Sam Mohan, Greg Piper, John A. Cogliandro, Monica L. Giffin
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Patent number: 10675816Abstract: A method for detecting object border of 3D printer (4) includes following steps: obtaining a basic locating point (420) of a printing platform (42) of the 3D printer (4); projecting an imported 3D object onto a 2D plane of the 3D printer (4) for obtaining a plurality of 2D coordinates of the 3D object; calculating a 2D convex hull (60) according to the plurality of 2D coordinates; obtaining all vertexes (601) of the 2D convex hull (60); determining the position of the 3D object based on the basic locating point (420) in company with all the vertexes (601) of the 2D convex hull (60); and, permitting the 3D printer (4) to activate a printing procedure only if the 3D object is determined fully locating inside an effective range of the printing platform (42).Type: GrantFiled: April 11, 2019Date of Patent: June 9, 2020Assignees: XYZPRINTING, INC., KINPO ELECTRONICS, INC.Inventor: Chung-Kang Chu
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Patent number: 10591880Abstract: Methods and apparatuses for repairing a broken object. A processor retrieves information describing the size and shape of a broken object. A processor retrieves information describing the size and shape of an intact object, wherein the intact object includes a part missing from the broken object. A processor generates a first three-dimensional model of the broken object based, at least in part, on the information describing the size and shape of the broken object. A processor generates a second three-dimensional model of the intact object based, at least in part, on the information describing the size and shape of the intact object. A processor generates a third three-dimensional model based, at least in part, on a difference between the first and second three-dimensional model. A processor sends one or more instructions to a three-dimensional printer to create an object based, at least in part, on the third three-dimensional model.Type: GrantFiled: November 29, 2017Date of Patent: March 17, 2020Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: James E. Bostick, John M. Ganci, Jr., Martin G. Keen, Sarbajit K. Rakshit, Kimberly G. Starks, Craig M. Trim
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Patent number: 10585045Abstract: An inspecting device includes: an image acquiring unit which acquires a light-emitting surface image as a photographed image of the light-emitting surface; an inspecting unit which sets an inspecting range in a position of the light-emitting surface image in which the failure may appear, detects, from the inspecting range, a bright region which is brighter than a lower limit threshold value, calculates an evaluation value evaluating both the size and luminance of the bright region, and determines the presence or absence of the failure on the basis of the evaluation value; and an output unit which outputs information obtained by the inspecting unit.Type: GrantFiled: October 26, 2017Date of Patent: March 10, 2020Assignee: OMRON CorporationInventor: Yoshinori Konishi
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Patent number: 10549921Abstract: A metallic beverage container body inspection apparatus processes a plurality of metallic beverage container bodies along an index path. An indexer sequentially transfers metallic beverage container bodies from the manufacturing queue through the apparatus while maintaining an orientation of the container bodies. A dwell position is located on the index path wherein the indexer delivers metallic beverage container bodies to the dwell position. An inspection position is vertically aligned with and horizontally offset from the dwell position. An image recorder is aimed the inspection position and captures a plurality of images about a circumference of each metallic beverage containers.Type: GrantFiled: May 19, 2016Date of Patent: February 4, 2020Assignee: REXAM BEVERAGE CAN COMPANYInventors: Douglas Leitzen, Robert P. Perez, James E. Sluis, III, Thomas Kitowski, Eric D. Baune
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Patent number: 10546071Abstract: A method provides for measuring an assembled component including two or more parts, the method including the steps of: providing the component with a plurality of unique markers for detection during a scanning process; defining a first of the unique markers and aligning the first defined unique marker with a first element of the component; defining a second of the unique markers and aligning the second defined unique marker with a second element of the component; scanning the component and unique markers to capture a digitised version of the component and the relative positions of the first and second defined unique markers; and aligning a nominal CAD model of a part of the component with the equivalent part of the digitised version of the component using the relative positions of the first and second defined unique markers.Type: GrantFiled: March 17, 2016Date of Patent: January 28, 2020Assignee: ROLLS-ROYCE plcInventors: Karl Huckerby, Eoin Stock
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Patent number: 10466181Abstract: The present invention aims at providing a defect inspection technique capable of setting parameters used for detecting a defect with a less burden to a user. A defect inspection device according to the present invention receives multiple reference values input by the user and calculates a defect extraction condition so as to optimize an evaluation value calculated with the use of the reference values, the number of actual reports, and the number of false reports (refer to FIG. 8).Type: GrantFiled: March 30, 2016Date of Patent: November 5, 2019Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Toshifumi Honda, Takahiro Urano, Mamoru Kobayashi, Hisashi Hatano, Hironori Sakurai
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Patent number: 10379062Abstract: A detection system (S) for detecting and determining an integrity of pharmaceutical/parapharmaceutical articles includes a conveyor device (1), for conveying and advancing articles having an advancement section (10) along which the articles are advanced on a flat plane, in a line one after another in an advancement direction (A). The system (S) has a processor (E) for data processing; at least one color matrix video camera (2) for acquiring images of the articles advancing along the advancement section, a laser projector (P) able to emit and project a laser beam (L) so that the laser beam (L) crosses the advancement section (10) and a high-speed linear three-dimensional video camera (3) for acquiring the images of the cut profiles of the articles crossing the laser beam.Type: GrantFiled: February 16, 2016Date of Patent: August 13, 2019Assignee: MARCHESINI GROUP S.P.A.Inventor: Giuseppe Monti
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Patent number: 10350752Abstract: A robot system includes a robot including a hand for holding a workpiece; a sensor for measuring a work area in which the workpiece exists to obtain a three-dimensional shape in the work area as measurement data; a measurement data processing device including a model data storage unit, a measurement data correction unit, a position and orientation calculation unit; and a robot control unit for control the robot based on an output from the position and orientation calculation unit, wherein the measurement data correction unit in a learning stage, creates teacher data by arranging the model data in the position and the orientation calculated by the position and orientation calculation unit and adjusts a parameter for correcting the measurement data based on the measurement data and the teacher data, and in a picking stage, outputs corrected measurement data obtained by correcting the measurement data using the adjusted parameter.Type: GrantFiled: February 26, 2018Date of Patent: July 16, 2019Assignee: FANUC CORPORATIONInventor: Taiga Satou
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Patent number: 10337656Abstract: Methods and systems are provided for a quick connect device. In one example, a connector may include a first visual cue for coupling an outer portion to a middle portion and a second visual cue for coupling an inner portion to the middle portion.Type: GrantFiled: October 27, 2015Date of Patent: July 2, 2019Assignee: Ford Global Technologies, LLCInventor: Samuel Jeffrey Tomlinson
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Patent number: 10313523Abstract: Techniques for conducting a support session and determine suitable instructions for resolving a certain technical mal-function in a device/equipment of a user. Imagery data associated the technical mal-function is received from a user's device and used for determining at least one improperly setup property associated with the mal-function in the mal-functioning device/equipment based on a comparison of the received imagery data with reference data. Instructions comprising augmented imagery for resolving the mal-function can be then generated, or fetched form a database, based on the determined at least one improperly setup property. A new database record can be generated comprising the augmented imagery data for use in future support sessions associated with the mal-function.Type: GrantFiled: November 20, 2018Date of Patent: June 4, 2019Assignee: TechSee Augmented Vision Ltd.Inventors: Yoffe Amir, Eitan Cohen
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Patent number: 10314217Abstract: A component supply device that images stage on which multiple leaded components are supported in a scattered state, and holds a component supported on the stage using a component holding tool based on the image data, wherein multiple stages of different colors are prepared, and a stage from among the multiple stages a stage with a color different to a component that is planned to be supplied is removably attached to component support member. By this, for example, in a case in which a component planned to be supplied is white, by attaching a black stage to the component support section, due to the contrast between the background and the target object, it is possible to clearly recognize the white component supported on the black stage.Type: GrantFiled: March 18, 2015Date of Patent: June 4, 2019Assignee: FUJI CORPORATIONInventors: Toru Matsumoto, Shunji Morikawa
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Patent number: 10303809Abstract: A computer-implemented method and system automatically creates data for use by a computer-aided simulation process. The method and system determine that a CAD model component represents a real-world object that is a fastener. The method and system automatically analyze the CAD component and derive properties for use by the simulation process. The derived properties include size data, location data, and material type data. The method and system automatically calculate a zone of influence of the CAD component on another CAD component. The simulation process utilizes at least one of the properties to calculate the zone of influence to simulate a real-world assembly of which the fastener is a component.Type: GrantFiled: June 20, 2014Date of Patent: May 28, 2019Assignee: Dassault Systemes SolidWorks CorporationInventors: Marlon Robert Leon Banta, Li-Ling Huang, Subbi Reddy Chirla
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Patent number: 10261028Abstract: A device for optically inspecting a surface of a sample includes: a screen providing a first light profile pattern formed with lighter and darker areas wherein the areas form a first spatial intensity profile having a first spatial period, a holder for positioning the sample with the surface relative to the first pattern such that the first pattern is reflected by the surface, an auxiliary lens and/or curved mirror arranged between the screen and the holder for providing a second light profile pattern having areas which form a second spatial intensity profile with a second spatial period when at least a part of the first pattern passes the lens or is reflected by the mirror, an image recording unit for receiving an image of the second pattern reflected from the surface of the sample, and an evaluation unit for determining properties of the surface in dependence on the image.Type: GrantFiled: February 10, 2017Date of Patent: April 16, 2019Assignee: Carl Zeiss Industrial Metrology, LLCInventors: Christopher M. Cilip, Drew Schiltz
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Patent number: 10228681Abstract: A method of generating a machining program that can be interpreted by a physical controller of a numerical control machine tool. The machining program is generated from a prerecorded set of machine parameters representative of the machine tool, and a prerecorded set of machining sequences on the basis of at least some of the said machine parameters and of at least some of the machining sequences, a computer simulation program carries out machining feasibility tests (TST), the machining program being generated in a format that can be executed by the said physical controller only if it passes the machining feasibility tests beforehand.Type: GrantFiled: March 9, 2016Date of Patent: March 12, 2019Assignee: SPRING TECHNOLOGIESInventors: Philippe Legoupi, Olivier Bellaton
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Patent number: 10182153Abstract: Techniques for conducting a support session and determine suitable instructions for resolving a certain technical mal-function in a device/equipment of a user. Imagery data associated the technical mal-function is received from a user's device and used for determining at least one improperly setup property associated with the mal-function in the mal-functioning device/equipment based on a comparison of the received imagery data with reference data. Instructions comprising augmented imagery for resolving the mal-function can be then generated, or fetched form a database, based on the determined at least one improperly setup property. A new database record can be generated comprising the augmented imagery data for use in future support sessions associated with the mal-function.Type: GrantFiled: December 1, 2016Date of Patent: January 15, 2019Assignee: TECHSEE AUGMENTED VISION LTD.Inventors: Yoffe Amir, Eitan Cohen