Quality Inspection Patents (Class 348/92)
  • Publication number: 20140022376
    Abstract: In a method and apparatus for optically inspecting an FPD in a reduced time, the apparatus for inspecting the flat panel display (FPD) comprises a lighting device separated from a top surface of an object and emitting light toward the top surface of the object, a photographing device separated from the top surface of the object and photographing an image using light emitted from the lighting device and then reflected by the top surface of the object, a controller controlling the lighting device and the photographing device to move in a plane separated from and parallel to the top surface of the object, and an image processor connected to the photographing device and processing the photographed image, wherein the image processor samples some of pixels included in the photographed image and converts the sampled pixels to binary form.
    Type: Application
    Filed: February 15, 2013
    Publication date: January 23, 2014
    Applicant: Samsung Display Co., Ltd.
    Inventor: Seung Hwan JUNG
  • Patent number: 8619014
    Abstract: A liquid crystal display device which can reduce a circuit scale of a drive circuit is provided. A TFT substrate of the liquid crystal display device includes a pixel circuit in each pixel, and the pixel circuit includes a thin film transistor, a pixel electrode which is connected to a source side of the thin film transistor, and a common electrode which is one planar transparent electrode extending in a display region in a planar shape. A vertical drive circuit includes a transistor which is driven by a control signal voltage including a clock signal from a drive IC, and constitutes a damper for a high voltage. The drive IC outputs an equalizing switch signal voltage to equalizing switches which connect the common electrode and data signal lines.
    Type: Grant
    Filed: July 14, 2010
    Date of Patent: December 31, 2013
    Assignees: Japan Display Inc., Panasonic Liquid Crystal Display Co., Ltd.
    Inventors: Masahiro Maki, Hideo Sato, Hiroyuki Abe
  • Publication number: 20130341378
    Abstract: A system for inspecting a free air ball (FAB) formed during a wire bonding process includes a torch for forming a FAB at a tip of a bonding wire held by a capillary. A camera is positioned near the FAB formation location and captures a color image of the FAB. A ball formation monitor inspects the image to determine a composition of an outer surface of the FAB and inhibits bonding of the FAB to a contact element based on a result of the inspecting. The system is particularly useful for bonding Copper wire plated with Palladium, where bonding of the FAB to the contact element is inhibited if the Copper is exposed.
    Type: Application
    Filed: June 22, 2012
    Publication date: December 26, 2013
    Applicant: Freescale Semiconductor, Inc.
    Inventors: Seok Khoon Lee, Lai Cheng Law, Weng Foong Yap
  • Patent number: 8610770
    Abstract: This invention is directed to easily set the image sensing conditions of an image sensing apparatus. The image sensing apparatus includes a first control means for controlling to change the image sensing conditions, an image sensing means to sense an image sensing target at every first time interval, and to calculate the evaluation value of the sensed image, and a second control means for controlling to change the image sensing conditions within the range where the evaluation value obtained by the first control means changes from increase to decrease, the image sensing means to sense the image sensing target at every second time interval smaller than the first time interval, and to calculate the evaluation value of the sensed image.
    Type: Grant
    Filed: July 10, 2012
    Date of Patent: December 17, 2013
    Assignee: Canon Kabushiki Kaisha
    Inventors: Masafumi Takimoto, Yusuke Mitarai
  • Patent number: 8605146
    Abstract: An apparatus for optically inspecting an at least partially reflecting surface of an object includes first and second transverse carriers (12, 14) defining respective substantially circular segment-shaped cutouts (32). The transverse carriers (12, 14) are disposed at a longitudinal distance (D) from one another and the longitudinal distance (D) defines a longitudinal direction (17). A plurality of longitudinal members are configured to hold the first and second transverse carriers at the longitudinal distance (D). The longitudinal members are arranged at a defined radial distance to the circular segment-shaped cutouts. A translucent diffusing screen is held in the circular segment-shaped cutouts by the transverse carriers to form a tunnel-shaped inspection space. A multiplicity of light sources are arranged outside of the tunnel-shaped inspection space behind the diffusing screen.
    Type: Grant
    Filed: June 28, 2011
    Date of Patent: December 10, 2013
    Assignee: Carl Zeiss OIM GmbH
    Inventors: Klaus-Georg Knupfer, Joachim Reimann, Volker Huss, Volker Schöllkopf
  • Patent number: 8595918
    Abstract: An image taking system including: (a) a CMOS or CCD image sensor; (b) an interest-region setter configured to set regions of interest within an image taking area of the image sensor; (c) an acquiring-condition determiner configured to determine an image-data acquiring condition required for acquiring at least two image data generated in at least two of the regions of interest; and (d) an image-data acquirer configured to acquire the at least two image data. The acquiring-condition determiner includes an exposure-time determining portion configured to determine, as the image-data acquiring conditions, at least two different exposure times required for acquiring the at least two image data generated in the at least two regions of interest. The image-data acquirer includes an exposure-time-based-image-data acquiring portion configured to acquire the at least two image data, such that the acquired at least two image data are based on the at least two different exposure times.
    Type: Grant
    Filed: February 18, 2010
    Date of Patent: December 3, 2013
    Assignee: Fuji Machine Mfg. Co., Ltd.
    Inventors: Takahiro Jindo, Kimihiko Yasuda, Tetsunori Kawasumi, Yasuhiro Yamashita
  • Patent number: 8593515
    Abstract: A method for quality control of a stretch-blow-molded plastic container by inspecting its base, which method is easy to execute and is not highly susceptible to faults. Such inspection of the container bases includes determining quality features such as the surface area of an unstretched and/or only slightly stretched region of the base of the plastic container.
    Type: Grant
    Filed: August 29, 2006
    Date of Patent: November 26, 2013
    Assignee: Krones AG
    Inventors: Christian Detrois, Peter Lindner, Rainer Kwirandt, Anton Niedermeier, Stefan Piana
  • Publication number: 20130300857
    Abstract: Provided is a flat carrier provided with holders for separated electronic components, comprising: a flat metal platform with a space recessed therein and an epoxy carrier structure which is arranged form-fittingly in this space and which is provided with holders for the separated electronic components. Also provided is a method for visual inspection of separated electronic components located on such a flat carrier.
    Type: Application
    Filed: November 3, 2011
    Publication date: November 14, 2013
    Applicant: BESI NETHERLANDS B.V.
    Inventors: Johannes Gerhardus Augustinus Zweers, Jurgen Hendrikus Gerhardus Huisstede
  • Patent number: 8564655
    Abstract: Images of a work piece in which measurement object is restricted to a specific point or domain are taken by a camera which takes the image of the work piece from a front-view direction and a camera which takes the image from obliquely above, and a height of each measurement object region is measured. Each pixel of the front-view image used in measurement processing is virtually disposed in a three-dimensional coordinate system including x- and y-axes constituting a coordinate system of the image and a z-axis indicating the height, and a perspective transform is performed to produce a processing result image expressing measurement result. A measurement value is set as the z-coordinate at the pixel which is a height measurement object, and the z-coordinates of other pixels are set at other pixels. A mark for identifying a position and an auxiliary line indicating the height are set at measurement object points and measurement object region in the image.
    Type: Grant
    Filed: August 28, 2008
    Date of Patent: October 22, 2013
    Assignee: Omron Corporation
    Inventors: Shiro Fujieda, Hiroshi Yano, Yasuyuki Ikeda
  • Patent number: 8564656
    Abstract: The invention relates to a method for recognizing surface characteristics of metallurgical products, especially continuously cast products and rolled products. According to said method, a defined section of the product surface (12, 12?) is irradiated by at least two radiation sources of different wavelengths, from different directions, and the irradiated surface section is optoelectronically detected. Three light sources (21, 22, 23) are oriented towards the product surface (12, 12?), as radiation sources, under the same angle (a), the positions thereof being in three planes (E1, E2, E3) forming a 120 DEG angle and being perpendicular to the product surface (12, 12?). In this way, instructive information about metallurgical products can be determined and stored in a very short space of time such that the products can be determined in a perfectly identified manner for the reprocessing, in terms of the surface quality or surface structure thereof.
    Type: Grant
    Filed: March 19, 2008
    Date of Patent: October 22, 2013
    Assignee: SMS Concast AG
    Inventor: Tobias Rauber
  • Publication number: 20130265411
    Abstract: A system for inspecting a scraped surface of a workpiece performs steps of: a) capturing an image of the scraped surface to obtain a original image section; b) removing high point regions whose areas are outside of a predetermined area range to obtain a base image; c) processing pixels of the base image using a first imaging mask to generate a judgment image; d) determining whether uniformity of the high point regions in the base image conforms a standard; e) determining whether a number of the high point regions in the base image falls within a predetermined number range; and f) evaluating whether or not a portion of the scraped surface conforms with the standard based on results of determinations made in steps d) and e).
    Type: Application
    Filed: April 9, 2012
    Publication date: October 10, 2013
    Applicants: The Department of Electrical Engineering, National Chang-Hua University of Education, Buffalo Machinery Company Limited
    Inventors: Ching-Wei Wu, Ying-Shing Shiao, Chia-Hui Tang, Paul Chang
  • Publication number: 20130258093
    Abstract: An inspection tool that can acquire large image data at a high speed while suppressing an increase in the size of a circuit, and an image pickup device that is used for the inspection tool, are provided. Image pickup devices that are used for the inspection tool each include: a plurality of photoelectronic devices of a photoelectron output type; a plurality of sample-and-hold circuits, each circuit being connected to corresponding one of the photoelectronic devices; an analog multiplexer connected to the plurality of sample-and-hold circuits; an analog-to-digital converting circuit connected to the analog multiplexer; and a package that stores the photoelectronic devices, the sample-and-hold circuits, the analog multiplexer and the analog-to-digital converting circuit.
    Type: Application
    Filed: February 14, 2013
    Publication date: October 3, 2013
    Applicant: Hitachi High-Technologies Corporation
    Inventor: Takahiro JINGU
  • Publication number: 20130258094
    Abstract: A hardness tester enabling a user to form an indentation in a desired test position, capable of performing an accurate hardness test even when center positions of an indenter and a field lens are offset. The hardness tester includes an XY stage displacing a sample stage in a horizontal direction; a CCD camera capturing images of a sample surface via a field lens; a monitor displaying the images; a turret capable of selectively positioning the indenter or the field lens in a predetermined position opposite the sample; a memory storing an amount of horizontal direction offset between the center positions of the indenter and the field lens when positioned in the predetermined position; and a CPU displaying, based on the amount of offset stored in the memory, a mark indicating the center position of the indenter on the monitor when the field lens is positioned in the predetermined position.
    Type: Application
    Filed: March 15, 2013
    Publication date: October 3, 2013
    Applicant: MITUTOYO CORPORATION
    Inventors: Fumihiro TAKEMURA, Fumihiko KOSHIMIZU
  • Patent number: 8547430
    Abstract: In a method for marking discrepancies of a captured image of an object, an image is captured and compared to a standard image. A discrepant image showing any discrepancies of the captured image is generated, and is separated into an R grayscale image, a G grayscale image, and a B grayscale image. An R channel matrix group, a G channel matrix group, and a B channel matrix group are created. R channel negative matrixes, G channel negative matrixes, and B channel negative matrixes are determined from the RGB channel matrix groups. RGB pixel groups are calculated based on the R channel negative matrixes, the G channel negative matrixes, and the B channel negative matrixes. A target pixel group to be marked is determined by calculating an intersection of the RGB pixel groups. The discrepancies of the digital image are marked out according to the target pixel group.
    Type: Grant
    Filed: July 15, 2011
    Date of Patent: October 1, 2013
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Guang-Jian Wang, Dai-Gang Zhang, Jin-Rong Zhao, Xiao-Mei Liu
  • Publication number: 20130250092
    Abstract: The systems and methods described herein relate to digital light masking systems and methods for automated image inspection. First, a digital light masking system comprising a video signal; a source light which outputs emitted light; a digital light mask which attenuates the emitted light; and a vision system. The systems may inspect a disposable absorbent article. Second, a method for automated image inspection, comprising the steps of: generating a video signal; providing a uniform source light which outputs emitted light; providing a digital light mask which attenuates the emitted light; directing the attenuated light towards an article; and inspecting the article with a vision system. The uniform source light may be an LED light, the digital light mask may be an LCD panel, the attenuated light may be directed towards a disposable absorbent article, and/or the vision system may comprise a camera.
    Type: Application
    Filed: May 8, 2012
    Publication date: September 26, 2013
    Inventor: Jeremy Georges Bertin
  • Publication number: 20130250093
    Abstract: The systems and methods described herein relate to digital light masking systems and methods for automated image inspection. First, a digital light masking system comprising a video signal; a source light which outputs emitted light; a digital light mask which attenuates the emitted light; and a vision system. The systems may inspect a disposable absorbent article. Second, a method for automated image inspection, comprising the steps of: generating a video signal; providing a uniform source light which outputs emitted light; providing a digital light mask which attenuates the emitted light; directing the attenuated light towards an article; and inspecting the article with a vision system. The uniform source light may be an LED light, the digital light mask may be an LCD panel, the attenuated light may be directed towards a disposable absorbent article, and/or the vision system may comprise a camera.
    Type: Application
    Filed: May 8, 2012
    Publication date: September 26, 2013
    Inventors: Jeremy Georges Bertin, Rajesh Kumar Singh
  • Publication number: 20130229511
    Abstract: A machine-vision system for monitoring a quality metric for a product. The system includes a controller configured to receive a digital image from an image acquisition device. The controller is also configured to analyze the digital image using a first machine-vision algorithm to compute a measurement of the product. The system also includes a vision server connected to the controller, and configured to compute a quality metric and store the digital image and the measurement in a database storage. The system also includes a remote terminal connected to the vision server, and configured to display the digital image and the quality metric on the remote terminal.
    Type: Application
    Filed: March 1, 2013
    Publication date: September 5, 2013
    Inventors: Nathan OOSTENDORP, Kurtis Alan DEMAAGD, Anthony Michael OLIVER
  • Patent number: 8520066
    Abstract: An automated optical inspection system for the runout tolerance of circular saw blades comprises a rotating device, a first and a second optical inspection module, and a computing device. The rotating device is used to rotate a circular saw blade. The circular saw blade includes multiple teeth, and each tooth has a side and a back. The first/second optical inspection module is used to capture a side/back image of the tooth. The computing device activates the rotating device to rotate the circular saw blade, and activates the first and the second optical inspection module to capture the side image and the back image of each tooth upon rotation of the circular saw blade. The computing device performs a radial-position-calculating procedure according to the side images, to obtain an amount of radial runout, and performs an axial-position-calculating procedure according to the back images, to obtain an amount of axial runout.
    Type: Grant
    Filed: March 21, 2011
    Date of Patent: August 27, 2013
    Assignee: National Taiwan University of Science and Technology
    Inventors: Wen-Tung Chang, Chin-Hsien Su, Dong-Xie Guo, Geo-Ry Tang, Fang-Jung Shiou
  • Publication number: 20130215259
    Abstract: To analyze an inspection image obtained by taking an image of filter end faces of filter cigarettes horizontally arranged, from an axial direction, and thus inspect an excess cigarette feeding error, there are provided a first judging device that the number of cigarettes according to shape information of the filter end faces obtained from the inspection image, and a second judging device that obtains the centroid positions of the filter end faces from the inspection image, and detects that there is an excess feeding error when difference between a maximum value and a minimum value of the centroid-to-centroid distance of adjacent filter end faces is substantially equal to a previously-known diameter of the filter end face.
    Type: Application
    Filed: March 13, 2013
    Publication date: August 22, 2013
    Applicant: JAPAN TOBACCO INC.
    Inventor: JAPAN TOBACCO INC.
  • Publication number: 20130215261
    Abstract: A method for detecting low-contrast pressing or blowing defects in glassware articles includes the steps of backlighting the article by way of one or several light sources according to at least one pair of similar patterns shifted in space; capturing at least one pair of images of the backlit article according to each of the patterns of the at least one pair of patterns; combining the images of each of the pairs to form at least one composite image; and detecting the areas of stronger contrast within the composite images.
    Type: Application
    Filed: October 12, 2012
    Publication date: August 22, 2013
    Inventors: Majd Rahmani, Christophe Deloly, Philippe Volay
  • Publication number: 20130215260
    Abstract: Inspecting features of an object including measuring features of the master part that represents a desired nominal dimensions to obtain a preliminary set of dimensional data. The preliminary set of data becomes a master data set. The same master part is measured on a second machine to obtain another set of data on the master part. The two data sets are compared and correction data is generated representing differences between the different data sets for the same master part measured on different machines. Subsequent parts are then measured on the second machine to obtain measurement data that is corrected based on the correction data. The application of the correction information provides for the use of 5-axis machines within a desired measurement capability.
    Type: Application
    Filed: March 15, 2013
    Publication date: August 22, 2013
    Applicant: UNITED TECHNOLOGIES CORPORATION
    Inventor: United Technologies Corporation
  • Publication number: 20130208105
    Abstract: An inspection apparatus for examining vessels fixedly arranged on a machine tool. The apparatus includes a camera having a first optical component. The camera is coupled to an image processing unit and is arranged in a positionally fixed manner with respect to a vessel to be inspected. The apparatus has a second, moveably mounted optical element, with the first, positionally fixed optical element and the second, moveably mounted optical element being operatively connected to the camera for image-recording at least one view in the direction of a vessel opening and at least one view in the direction of a side of the vessel to be inspected that faces away from the vessel opening. A manufacturing system for vessels, which includes an inspection apparatus, and a corresponding examination method, which can be carried out using the inspection apparatus, for testing the vessel quality after machining is also disclosed.
    Type: Application
    Filed: July 25, 2011
    Publication date: August 15, 2013
    Applicant: MALL + HERLAN
    Inventors: Anton Schmidt, Michael K. Friedrich, Oliver Zind
  • Patent number: 8502871
    Abstract: A gauge line position measuring device measures a position of a gauge line provided on a test piece by a non-contact video method. The measuring device includes a gauge line mark adapted to be provided on the test piece and has the gauge line and a first continuous harmonious color density arranged line-symmetrically with respect to the gauge line, and a video camera for taking an image of the gauge line mark on the test piece and outputting gauge line mark image data. A calculation device calculates a gauge line position based on the gauge line mark image data.
    Type: Grant
    Filed: February 20, 2009
    Date of Patent: August 6, 2013
    Assignee: Shimadzu Corporation
    Inventor: Hiroshi Tsuji
  • Publication number: 20130194415
    Abstract: Even when a pasting target body to which prepregs are pasted has a shape changed portion such as a curved portion, prepreg pasting states are accurately inspected. A prepreg pasting state inspection apparatus 2 for inspecting a gap G between prepregs 4 adjacent on a pasting target body 3 has a laser 21 for emitting slit light LA along an inclined plane so that a projected pattern X of the slit light is formed across the adjacent prepregs 4, a camera 22 for imaging an irradiation region of the laser 21, a control unit 24 as a determination unit for determining whether the gap G between the adjacent prepregs 4 is within an allowance based on a signal from the camera 22, a range sensor 23 for measuring a distance between a reference position and the irradiation region, and focus adjusting units 25 and 26 for adjusting focus positions of the camera 22 and the laser 21 based on the signal from the range sensor 23.
    Type: Application
    Filed: January 22, 2013
    Publication date: August 1, 2013
    Applicant: SANYO MACHINE WORKS, LTD.
    Inventor: SANYO MACHINE WORKS, LTD.
  • Publication number: 20130194414
    Abstract: A system for verifying medication doses m a filled medication package comprises an imaging unit to produce at least one image of a filled medication package and a verification unit for receiving the image of the filled medication package. The verification unit comprises a dose locator to determine from the image a location of any dose m the filled medication package, and associate a time period to the location. It also comprises a dose verifier to verify an identity of any dose from the visual characteristics of the image as a function of dose reference profiles. The verification unit compares an identity and time period of the doses of the filled medication package to a prescription and has an interface for producing verification output based on the comparison of the verification unit. A method for verifying medication doses m a filled medication package is also provided.
    Type: Application
    Filed: March 4, 2011
    Publication date: August 1, 2013
    Inventors: Frédéric Poirier, Alain Goulet
  • Publication number: 20130183436
    Abstract: A method of manufacturing a bearing device component is provided. The bearing device includes a shaft and a sleeve that surrounds the shaft, and at least either one of the shaft and the sleeve is referred to as a work. The method includes: a process of forming a coating of an anti-sticking-lube polymer on the work; a process of applying a photoluminescence material to a range overlapping a range where the coating of the anti-sticking-lube polymer is formed; and a condition detecting process of causing the photoluminescence material to emit light by causing the work to be irradiated with excitation light that excites the photoluminescence material, and detecting an applied condition of the photoluminescence material based on the light emission of the photoluminescence material, thereby detecting a condition of the coating of the anti-sticking-lube polymer.
    Type: Application
    Filed: March 5, 2013
    Publication date: July 18, 2013
    Applicant: ALPHANA TECHNOLOGY CO., LTD.
    Inventor: Alphana Technology Co., Ltd.
  • Publication number: 20130176421
    Abstract: The present invention addresses the problem of facilitating detection of foreign objects or bubbles trapped in a gob. The problem is solved by generating a gob image A by capturing, with a line scanning camera, an image of a falling gob that has been cut off at an orifice; generating an image B by binarizing the gob image A with a boundary value that turns a general part of the gob black and turns a peripheral lustrous portion and a defect of the gob white; generating an image C by binarizing the gob image A with a boundary value that turns the entire gob white and turns a background black and inverting the black and white; generating an image D by combining the image B and the image C together; setting a region located a given number of pixels inside an outer edge of the black area of the image D as an inspection region; and inspecting the inspection region of the gob image A to determine whether the gob is good.
    Type: Application
    Filed: September 17, 2010
    Publication date: July 11, 2013
    Inventor: Koichi Akaji
  • Publication number: 20130176420
    Abstract: A method for testing casting quality includes collecting sand that has fallen from an internal cavity of the casting at a collection area. The collection area includes a screen and a pad. The method further includes capturing a first image of sand that has fallen onto the pad and analyzing the first image to determine an amount of black sand that has fallen onto the pad. The method further includes capturing a second image of sand that has been retained on the screen and analyzing the second image to determine an amount of black sand chunks retained on the screen.
    Type: Application
    Filed: January 9, 2012
    Publication date: July 11, 2013
    Applicant: HONDA MOTOR CO., LTD.
    Inventors: Karl Schroeder, Richard H. Synder, II, Brad Heitkamp, Donald Rethman, Gregory Staley, Joseph Timmerman
  • Publication number: 20130169791
    Abstract: In a method to measure widths of measured parts placed on a platform, a computing device connects to one or more charge coupled device (CCD) cameras. The method controls each of the CCD cameras to capture a digital image from a measured part that is placed near the CCD cameras, obtains the digital image of the measured part from each of the CCD cameras in a predefined order, and obtains a binary expression from the digital image of the measured part. When the measured part is placed in a correct position on the platform, the method further obtains three points from an upper boundary of the measured part in the binary expression and another three points from a lower boundary of the measured part in the binary expression, and calculates width of the measured part according to the obtained six points.
    Type: Application
    Filed: December 18, 2012
    Publication date: July 4, 2013
    Applicants: HON HAI PRECISION INDUSTRY CO., LTD., HONG FU JIN PRECISION INDUSTRY (Shenzhen) Co., Ltd
    Inventors: HONG FU JIN PRECISION INDUSTRY (Shenzhen) CO., LTD., HON HAI PRECISION INDUSTRY CO., LTD.
  • Publication number: 20130169790
    Abstract: An optical characteristics capturing apparatus includes an adjustable stage for carrying the flexible display, an image capturing device disposed above the adjustable stage, and two first collimated light sources. A part of the flexible display forms a curved surface. An intersection of a receiving optical axis of the image capturing device and the curved surface of the flexible display is an intersection point. The two first collimated light sources project two dot-patterns onto the intersection point along two first optical paths having identical length but different extending directions. An included angle between each of the two first optical paths and the receiving optical axis is an acute angle. The two first optical paths and the receiving optical axis are located in a first virtual plane.
    Type: Application
    Filed: March 30, 2012
    Publication date: July 4, 2013
    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Bo-Wen Xiao, Sheng-Po Wang, Min-Yao Lu
  • Publication number: 20130162810
    Abstract: A computer vision inspection system disclosed for use in inspecting of rotary parts like pulley gear or bearing product with internal slots or rails to determine the fabrication quality of the functional dimension of the slots or rails with the help of inspection balls (11) and ball followers (43). The apparatus includes a vision system with camera (30), lens (32), lighting (35), control computer, the image capturing and imaging processing computer program, and the fixture (40) and jig system for the rotary parts and inspection balls (11) and ball followers (43) to ensure the inspection balls are fully engaged into the ball slots (12) or ball rail of the part during inspection.
    Type: Application
    Filed: September 15, 2010
    Publication date: June 27, 2013
    Inventor: Nai En Wu
  • Publication number: 20130162811
    Abstract: A method for detecting light-emitting diodes using digital images to check whether each light-emitting diode in a to-be-detected computer is normal or not, the method includes shooting a default image for at least one light-emitting diodes in a default computer; selecting one diode as a first initial light source; obtaining default location information according to the locations of the contiguous light-emitting diodes relative to the first initial light source; similarly obtaining light signal information according to the locations of the light-emitting diodes relative to a second initial light source which corresponds to the first initial light source, and comparing the light signal location information with the default location information to judge whether the light-emitting diodes are in normal work.
    Type: Application
    Filed: March 30, 2012
    Publication date: June 27, 2013
    Inventors: Jeff SONG, Tsai-Fa Wang
  • Patent number: 8462206
    Abstract: A system for acquiring images includes a photographing machine. The photographing machine includes a base, a carrier coupled to the base, a camera coupled to the carrier, a camera positioning system, and a background panel coupled to the carrier. The camera can take photographs of an object when the object is in a target zone. The camera positioning system moves the carrier to position the camera and to point the camera at the target zone. When the carrier is moved to position the camera, at least a portion of the background panel moves such that at least a portion of the background panel maintains a position opposite the camera relative to the target zone.
    Type: Grant
    Filed: February 25, 2010
    Date of Patent: June 11, 2013
    Assignee: Amazon Technologies, Inc.
    Inventors: Jonathan G. McGuire, Jeremy David Sawatzky, Jules Cook Graybill
  • Publication number: 20130120556
    Abstract: An on-line automated analyser of macrocontaminants is described. The analyser is for a pulp and/or a white water stream, the analyser comprises: a pulp classifier separating a sample from the stream into a fraction of macrocontaminants; a contaminant chamber enclosing a contaminant cell receiving the fraction; an optical chamber comprising an optical detector connected to the cell capturing at least one detected image; and a control chamber taking the at least one detected image and conducting an image analysis to determine type and quantity of at least one macrocontaminant in the fraction. The method of analysis of macrocontaminants is also described herein, the method comprises: separating a sample from the stream into a fraction of macrocontaminants; producing at least one detected image by optical measurement of the fraction; and analysing the at least one detected image and determining the quantity and type of at least one macrocontaminant in the fraction.
    Type: Application
    Filed: December 17, 2010
    Publication date: May 16, 2013
    Inventors: Gilles Marcel Dorris, Carlos Castro Caloca, Sylvain Gendron, Michelle Agnes Ricard, Natalie Pagé, Denise Filion
  • Publication number: 20130120557
    Abstract: An apparatus comprising an inspection window on which a part can be placed for inspection, a camera positioned to image the part through the inspection window, and one or more illuminators to illuminate the part.
    Type: Application
    Filed: June 25, 2012
    Publication date: May 16, 2013
    Applicant: MICROSCAN SYSTEMS, INC.
    Inventors: Steven J. King, Gerald I. Padnos
  • Publication number: 20130113919
    Abstract: An inspection device comprises a camera assembly including an objective lens that captures and collimates light associated with an object being inspected, an image forming lens that forms an image of the object based on the collimated light, and a camera that renders the image. The camera assembly defines a focal point distance from the objective lens that defines a focal point of the camera assembly. The inspection device comprises an optical sensor positioned to detect an actual distance between the objective lens and the object, an actuator that controls positioning of the objective lens to control the actual distance between the objective lens and the object, and a control unit that receives signals from the optical sensor indicative of the actual distance. Control signals from the control unit can control the actuator to adjust the actual distance such that the actual distance substantially equals the focal point distance.
    Type: Application
    Filed: July 13, 2011
    Publication date: May 9, 2013
    Applicant: 3M INNOVATIVE PROPERTIES COMPANY
    Inventors: Yi Qiao, Jack W. Lai, Jeffrey J. Fontaine, Steven C. Reed, Catherine P. Tarnowski, David L. Hofeldt
  • Patent number: 8437010
    Abstract: A process for determining the position of closed holes in a component is provided. By carrying out laser triangulation measurements on an uncoated component and a coated component with holes, the exact position of the holes to be reopened may be detected following the coating. A device used to carry out this process is also provided.
    Type: Grant
    Filed: October 13, 2010
    Date of Patent: May 7, 2013
    Assignees: Siemens Aktiengesellschaft, Chromalloy Gas Turbine LLC
    Inventors: Georg Bostanjoglo, Torsten Melzer-Jokisch, Andreas Oppert, Dimitrios Thomaidis
  • Publication number: 20130100278
    Abstract: An automated hydrogen bubble detection apparatus includes a horizontal support surface on which a test coupon can be supported, a transparent tube having an open top and an open bottom and operable to contain a test solution when positioned on a test coupon, a camera arranged to view a test solution in the transparent tube, and a controller in communication with the camera and effective to operate the camera such that at least one video segment is recorded by the camera and analyzed to detect first bubble and continuous bubble generation. A method of evaluating corrosion resistance of coatings on aluminum and steel in acidic solution is also included.
    Type: Application
    Filed: October 19, 2011
    Publication date: April 25, 2013
    Applicant: Lam Research Corporation
    Inventors: Josh Cormier, Fangli Hao, Hong Shih, Tuochuan Huang, John Daugherty, Allan Ronne, Fred Dennis Egley
  • Patent number: 8421856
    Abstract: An automatic sorting system is for identifying and sorting non-homogenous material. The system includes a conveyor belt and an identification unit cooperable with the conveyor belt and placed above the conveying surface thereof for identifying material traveling therealong. The identification unit includes at least one projector for projecting a beam of light downwardly towards the conveying surface, at a given height above the conveying surface, and onto a given material to be identified, so that a portion of projected light may be reflected back from the given material and upwardly towards the identification unit. The identification unit also includes at least one lens positioned about the identification unit for receiving the portion of reflected light from the given material to be identified.
    Type: Grant
    Filed: April 4, 2007
    Date of Patent: April 16, 2013
    Assignee: 6511660 Canada Inc.
    Inventors: Bryan W. Sinram, Ian Levasseur, Nathanael Lortie
  • Patent number: 8421858
    Abstract: An inspection machine capable of inspecting optical property and electrical property of a light emitting device is provided. The inspection machine includes a substrate table, a probe mechanism, a heating apparatus, a cooling apparatus, an image-sensing apparatus, a temperature-sensing apparatus and a moving mechanism. The probe mechanism is capable of moving toward the light emitting device to contact therewith. The heating apparatus is capable of heating the light emitting device within a first temperature range. The cooling apparatus is capable of cooling the light emitting device within a second temperature range. The image-sensing apparatus senses a light emitting image provided from the light emitting device. The temperature-sensing apparatus senses the present temperature of the light emitting device. The image-sensing apparatus is disposed on the moving mechanism. The moving mechanism is capable of moving the image-sensing apparatus.
    Type: Grant
    Filed: March 2, 2011
    Date of Patent: April 16, 2013
    Assignee: Lextar Electronics Corp.
    Inventors: Hsiao-Liang Hsieh, Wen-Ti Lin, Hsiang-Cheng Hsieh
  • Patent number: 8421857
    Abstract: There is disclosed an inspection device of a plugged honeycomb structure in which a plugged honeycomb structure is an inspection target, and the inspection device comprises a light source which illuminates one end face of the plugged honeycomb structure as the inspection target; a camera-side lens which condenses light emitted from the light source to the one end face, transmitted through plugged portions of the plugged honeycomb structure and radiated from the other end face; a camera which receives the light condensed by the camera-side lens; and an image processor which processes an image of the light received by the camera to display the contrast of the light transmitted through the plugged portions of the plugged honeycomb structure.
    Type: Grant
    Filed: March 5, 2010
    Date of Patent: April 16, 2013
    Assignee: NGK Insulators, Ltd.
    Inventors: Takayoshi Akao, Akihiro Mizutani, Kensuke Tanaka
  • Patent number: 8416292
    Abstract: In a defect inspection apparatus for inspecting a wafer provided with a circuit pattern for defects, the illuminating direction of illuminating light rays is selectively determined such that an area containing a defect that scatters light of high intensity coincides with the aperture of a dark-field detecting system, and such that regularly reflected light regularly reflected by a pattern, which is noise to defect detection, does not coincide with the aperture of the dark field detecting system.
    Type: Grant
    Filed: February 20, 2009
    Date of Patent: April 9, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yukihiro Shibata, Yasuhiro Yoshitake
  • Patent number: 8416293
    Abstract: A plasma monitoring device includes a plasma supplier including a power supply, a reaction gas supply line, and an emission nozzle for emitting plasma, which is generated therein, toward an object; a camera unit for obtaining an image of the plasma emission state; and a controller for obtaining a measurement value by converting pixel information of the image into a numerical value and comparing it with a reference value, which is a measurement value in a normal emission state, to check the plasma emission state. The camera unit obtains an image of the plasma emission state, and the controller analyzes the image to obtain a measurement value, which is used to monitor the state of plasma in real time and control the amount of reaction gas supplied to the plasma supplier and the plasma discharge condition, so that plasma is evenly emitted from the plasma supplier.
    Type: Grant
    Filed: April 10, 2008
    Date of Patent: April 9, 2013
    Assignee: SNU Precision Co. Ltd.
    Inventors: Heung Hyun Shin, Woo Jung Ahn
  • Patent number: 8405715
    Abstract: Aims to provide an inspection apparatus and an inspection method for detecting an amount of misalignment of a component mounted on a panel through an ACF.
    Type: Grant
    Filed: September 18, 2008
    Date of Patent: March 26, 2013
    Assignee: Panasonic Corporation
    Inventors: Ryuji Hamada, Akira Kameda
  • Patent number: 8390683
    Abstract: The invention relates to a method and a device for the quality control of a rotationally symmetrical body (2, 2, 2?) and a grip (4) of a handling system (5) for gripping a rotationally symmetrical body (2, 2, 2?). The aim of the invention is to improve the quality control of rotationally symmetrical bodies (2, 2, 2?) in such a way that it is faster, reliable and more economical. To this end, the grip (4) comprises grip fingers (26) having rotationally symmetrically holding elements (29, 31) for holding the body (2, 2, 2?), the holding elements (31) being mounted in the grip fingers (26) in such a way that they can be rotated about the rotational axes (29) thereof. In order to grip the body (2, 2, 2?), the grip fingers (26) are displaced on a circular path. A central drive mechanism (22; 35) is respectively provided for the rotational movement of the holding elements (29, 31) of all of the grip fingers and for the rotational movement of all of the grip fingers (26).
    Type: Grant
    Filed: January 11, 2008
    Date of Patent: March 5, 2013
    Assignee: INOS Automationssoftware GmbH
    Inventors: Charalambos Tassakos, Leroklis Savvidis
  • Publication number: 20130050470
    Abstract: A surface inspection method for a steel sheet coated with a resin, includes irradiating the steel sheet with sheet-like light, which has been linearly polarized at a predetermined polarization angle, at an incidence angle different from Brewster's angle of the coating by a predetermined angle or greater; and imaging linearly-polarized light of a polarization angle of 0 degrees at an acceptance angle different from a regular reflection angle of incident light by a predetermined angle. Accordingly, it is not necessary to change the incidence angle and the acceptance angle depending on resin components and it is possible to inspect a substrate steel surface of the steel sheet highly accurately without observing abnormalities in the coating itself.
    Type: Application
    Filed: February 25, 2011
    Publication date: February 28, 2013
    Applicant: JFE STEEL CORPORATION
    Inventors: Akira Kazama, Kaoru Tanaka, Jun Sakai
  • Publication number: 20130050469
    Abstract: Provided is a defect detection apparatus capable of scalably improving processing performance for image processing, even though a plurality of multi-core processors are used therein. The defect detection apparatus comprises: an imaging unit for taking images of a sample forming a pattern, a dividing part 4b for dividing image data taken by the imaging unit into a plurality of image data blocks, and a parallel processing unit 5 for parallelly performing pieces of a defect detection processing for the plurality of the image data blocks to detect a defect in the pattern. Herein, the parallel processing unit uses a plurality of multi-core processors having a plurality of cores. The defect inspection processing of the image data block is performed per the multi-core processor.
    Type: Application
    Filed: August 9, 2012
    Publication date: February 28, 2013
    Applicant: Hitachi High-Technologies Corporation
    Inventors: Masayuki TAKEZAWA, Dai FUJII
  • Patent number: 8379081
    Abstract: Visibility of defects is improved for inspection of structures and the like, by generating an image having higher resolution than pixel resolution of a TV camera itself. An appearance inspection apparatus is provided with a TV camera; a camera driving device for making the TV camera scan an inspection object; an image capture device for capturing the image in the TV camera as a digital image; a camera motion measuring device for measuring scanning motion of the TV camera; a high definition image generating device, which generates a high definition image having a higher pixel resolution than that of the TV camera, based on the digital images captured by the image capture device and the TV camera scanning motion data measured by the camera motion measuring device; and a recording device which records and stores positional information of the inspection object.
    Type: Grant
    Filed: April 24, 2008
    Date of Patent: February 19, 2013
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Tetsuro Aikawa, Yoshinori Satoh, Makoto Ochiai, Hiroyuki Adachi
  • Publication number: 20130033595
    Abstract: This disclosure provides systems, devices, and methods for capturing and measuring surface topography. This disclosure provides a high resolution retrographic sensor comprising a volume of elastomer and a thin, opaque reflective membrane. The reflective membrane is arranged to conform to a specimen that contacts it. The disclosure provides a high resolution visualization system comprising the retrographic sensor and an illumination source. Also provided are high resolution measurement systems comprising the retrographic sensor, an illumination source, an imaging device, and a processing component.
    Type: Application
    Filed: July 30, 2012
    Publication date: February 7, 2013
    Applicant: MASSACHUSETTS INSTITUTE OF TECHNOLOGY
    Inventors: Edward H. Adelson, Micah K. Johnson
  • Patent number: 8368749
    Abstract: An inspection apparatus can be operated to collect files during performance of an inspection. An inspection apparatus can associate metadata to a collected file. In one embodiment metadata associated with a collected file can include an article identifier. In one embodiment metadata that is associated with a collected file can include data input into an inspection apparatus by an inspector. In one embodiment metadata that is associated with a collected media file can include sensor output data. An inspection apparatus in one embodiment can include an application guiding an inspector in the performance of an inspection.
    Type: Grant
    Filed: December 22, 2006
    Date of Patent: February 5, 2013
    Assignee: GE Inspection Technologies LP
    Inventors: Thomas Eldred Lambdin, Bradford Morse, Clark A. Bendall, Edward B. Hubben, Thomas W. Karpen, Bruce A. Pellegrino