Integrating Spheres Patents (Class 356/236)
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Patent number: 11307027Abstract: A method is described in which a reflection is obtained of a laser light pattern reflected from a substrate. A reflection of diffuse light may be obtained from the substrate. A first parameter may be determined, relating to the substrate from the reflected laser light pattern. A second parameter may be determined, relating to the substrate from the reflected diffuse light and a characteristic of the substrate may be determined from the first and second parameters. A print apparatus and a machine-readable medium are also disclosed.Type: GrantFiled: April 25, 2017Date of Patent: April 19, 2022Assignee: Hewlett-Packard Development Company, L.P.Inventors: Peter Morovic, Jan Morovic, Hector Gomez Minano, Marcos Casaldaliga Albisu, Joan Jordi Coll Sicluna
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Patent number: 11099123Abstract: In accordance with an example aspect of the present invention, there is provided a method of obtaining a calibrated measurement of a sample using an integrating cavity, comprising obtaining sample spectral information by using the integrating cavity with the sample placed inside the integrating cavity, obtaining cavity-characterizing spectral information generated by using the integrating cavity with a standard object, and obtaining a measurement result from the sample spectral information by employing a mathematical process that takes the cavity-characterizing spectral information as input.Type: GrantFiled: January 29, 2019Date of Patent: August 24, 2021Assignee: GrainSense OyInventor: Ralf Marbach
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Patent number: 10585116Abstract: A scanning probe microscope includes a tip. A quantum dot is applied to the tip.Type: GrantFiled: January 18, 2016Date of Patent: March 10, 2020Assignee: FORSCHUNGSZENTRUM JUELICH GMBHInventors: Frank Stefan Tautz, Ruslan Temirov, Christian Wagner, Matthew Felix Blishen Green
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Patent number: 10551315Abstract: A fluorescence spectrophotometer includes: a light source; an excitation side spectroscope configured to separate light from the light source to generate excitation light; an integrating sphere having an inner surface configured to scatter the excitation light that has entered the integrating sphere; a sample holder, which is provided at a position on the integrating sphere that is not directly irradiated with the excitation light that has entered the integrating sphere and that is capable of being irradiated with the excitation light that has been scattered by the inner surface, and which is capable of holding a sample to be measured; a detector configured to detect fluorescent light emitted from the sample irradiated with the excitation light that has been scattered by the inner surface; and an imaging device configured to take the sample image of the sample that emits the fluorescent light.Type: GrantFiled: July 20, 2018Date of Patent: February 4, 2020Assignee: HITACHI HIGH-TECH SCIENCE CORPORATIONInventors: Jun Horigome, Rino Nakajima, Yoichi Sato
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Patent number: 10485085Abstract: An extreme ultraviolet light sensor unit according to one aspect of the present disclosure includes a mirror configured to reflect extreme ultraviolet light, a filter configured to transmit the extreme ultraviolet light reflected by the mirror, an optical sensor configured to detect the extreme ultraviolet light having passed through the filter, a purge gas supply unit disposed to supply purge gas to a space between the mirror and the filter, and a pipe part configured to allow plasma light including the extreme ultraviolet light entering from an opening to pass therethrough toward the mirror and allow the purge gas flowing to the space between the mirror and the filter to flow out of the opening.Type: GrantFiled: September 4, 2018Date of Patent: November 19, 2019Assignee: Gigaphoton Inc.Inventors: Hisashi Nara, Hiroshi Someya, Takuya Ishii
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Patent number: 10274307Abstract: A film thickness measurement device includes a light source, an imaging component, and a controller. The controller estimates unknown variables I1(j), I20(j), k(j), and t(i) based on the Formula (1), where i represents an observation point number of an interference image captured by the imaging component, j represents a number for a type of wavelength of monochromatic light, ?(j) represents wavelength of the monochromatic light, n represents a refractive index of a semi-transparent film, g(i,j) represents a brightness value observed at an observation point, I1(j) represents an intensity of reflected light from a front face of the semi-transparent film, I20(j) represents an intensity of reflected light from a rear face of the semi-transparent film when there is no absorption of light in the semi-transparent film, k(j) represents an absorption coefficient of the semi-transparent film, and t(i) represents a film thickness of the semi-transparent film.Type: GrantFiled: February 17, 2016Date of Patent: April 30, 2019Assignee: TORAY ENGINEERING CO., LTD.Inventors: Katsuichi Kitagawa, Masafumi Otsuki
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Patent number: 10215703Abstract: This invention relates to a light delivery and collection device for performing spectroscopic analysis of a subject. The light delivery and collection device comprises a reflective cavity with two apertures. The first aperture receives excitation light which then diverges and projects onto the second aperture. The second aperture is applied to the subject such that the reflective cavity substantially forms an enclosure covering an area of the subject. The excitation light interacts with the covered area of the subject to produce inelastic scattering and/or fluorescence emission from the subject. The reflective cavity reflects the excitation light as well as the inelastic scattering and/or fluorescence emission that is reflected and/or back-scattered from the subject and redirects it towards the subject. This causes more excitation light to penetrate into the subject hence enabling sub-surface measurement and also improves the collection efficiency of the inelastic scattering or fluorescence emission.Type: GrantFiled: August 3, 2018Date of Patent: February 26, 2019Assignee: B&W Tek LLCInventors: Jun Zhao, Xin Jack Zhou, Sean Xiaolu Wang
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Patent number: 10126244Abstract: This invention relates to a light delivery and collection device for performing spectroscopic analysis of a subject. The light delivery and collection device comprises a reflective cavity with two apertures. The first aperture is configured to receive excitation light which then diverges and projects onto the second aperture. The second aperture is configured to be applied close to the subject such that the reflective cavity substantially forms an enclosure covering a large area of the subject. The excitation light enters and interacts with the covered area of the subject to produce inelastic scattering and/or fluorescence emission from the subject. The reflective cavity has a specular reflective surface with high reflectivity to the excitation light as well as to the inelastic scattering and/or fluorescence emission from the subject. The reflective cavity reflects the excitation light that is reflected and/or back-scattered from the subject and redirects it towards the subject.Type: GrantFiled: March 17, 2017Date of Patent: November 13, 2018Assignee: B&W TEK LLCInventors: Jun Zhao, Xin Jack Zhou, Sean Xiaolu Wang
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Patent number: 10119916Abstract: This invention relates to a light delivery and collection device for measuring Raman scattering from a large area of a sample. The light delivery and collection device comprises a reflective cavity made of a material or having a surface coating with high reflectivity to the excitation light and the Raman scattered light. The reflective cavity has two apertures. The first aperture is configured to receive the excitation light which then projects onto the second aperture. The second aperture is configured to be applied close to the sample such that the reflective cavity substantially forms an enclosure covering a large area of the sample. The excitation light produces Raman scattered light from the covered area of the sample. The reflective cavity reflects any excitation light and Raman light scattered from the sample unless the excitation light and the Raman scattered light either emit from the first aperture to be measured with a spectrometer device, or are re-scattered by the sample at the second aperture.Type: GrantFiled: December 14, 2016Date of Patent: November 6, 2018Assignee: B&W TEK LLCInventors: Jun Zhao, Xin Jack Zhou, Sean Xiaolu Wang
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Patent number: 10113969Abstract: This invention relates to a light delivery and collection device for measuring Raman scattering from a large area of a sample. The light delivery and collection device comprises a reflective cavity made of a material or having a surface coating with high reflectivity to the excitation light and the Raman scattered light. The reflective cavity has two apertures. The first aperture is configured to receive the excitation light which then projects onto the second aperture. The second aperture is configured to be applied close to the sample such that the reflective cavity substantially forms an enclosure covering a large area of the sample. The excitation light produces Raman scattered light from the covered area of the sample. The reflective cavity reflects any excitation light and Raman light scattered from the sample unless the excitation light and the Raman scattered light either emit from the first aperture to be measured with a spectrometer device, or are re-scattered by the sample at the second aperture.Type: GrantFiled: November 11, 2016Date of Patent: October 30, 2018Assignee: B&W TEK LLCInventors: Jun Zhao, Xin J. Zhou
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Patent number: 9958317Abstract: A differential goniophotometer includes: an integrating sphere including an interior bounded by an interior wall and that receives, in the interior, a primary light source that provides primary light; and a fisheye lens disposed in the interior of the integrating sphere in optical communication with the primary light source such that the fisheye lens: receives the primary light from the primary light source, and provides a curvilinear image of the interior of the integrating sphere and the primary light.Type: GrantFiled: February 2, 2017Date of Patent: May 1, 2018Assignee: THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCEInventor: Yuqin Zong
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Patent number: 9885561Abstract: An optical inspection system includes a first optical module and a second optical module. The first optical module includes a first light source having a first optical axis and a first image capturing unit having a first image capturing axis. The first optical axis and the first image capturing axis are symmetric relative a normal line of an inspection plane. A first angle is formed between the first optical axis and the first image capturing axis. The second optical module includes a second light source having a second optical axis and a second image capturing unit having a second image capturing axis. The second optical axis and the second image capturing axis are symmetric relative to the normal line. A second angle is formed between the second optical axis and the second image capturing axis and is different from the first angle.Type: GrantFiled: December 15, 2014Date of Patent: February 6, 2018Assignee: Test Research, Inc.Inventors: Liang-Pin Yu, Kuang-Pu Wen, Yeong-Feng Wang
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Patent number: 9702757Abstract: A light measuring system including an integrating sphere having an aperture configured by opposing reflectors selectively aligned with complementary reflectors of at least one light source mounting block having a light source mounting region for mounting a light source thereon.Type: GrantFiled: July 21, 2015Date of Patent: July 11, 2017Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Joon Sub Lee, Seung Won Park
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Patent number: 9587984Abstract: A gonio-spectroradiometer and a measuring method thereof. The gonio-spectroradiometer includes a light source rotating on a light source axis, a first integrating sphere revolving around the light source with respect to a revolving axis perpendicular to the light source axis with a fixed radius and including an entrance formed in a direction to see the light source, a light intensity modulator adapted to modulate light intensity of light received through the first integrating sphere according to the rotation amount of the revolving axis, and a detector adapted to measure output light of the light intensity modulator at each wavelength.Type: GrantFiled: May 26, 2016Date of Patent: March 7, 2017Assignee: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCEInventors: Seongchong Park, Dong-Hoon Lee, Chul-Woung Park, Seung-Nam Park
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Patent number: 9534950Abstract: A visible LED light scattering apparatus comprising a substantially hollow spherical cavity including a light entry port arranged to receive visible light from an LED mounted outside the cavity, a light exit port located opposite the entry port and through which the LED light exits the cavity for analysis, and a baffle located in a central region of the cavity in a direct optical path between the entry port and the exit port to interrupt the passage of visible LED light between the entry and exit ports.Type: GrantFiled: November 8, 2013Date of Patent: January 3, 2017Assignee: Feasa Enterprises LimitedInventors: Eamonn O'Toole, Timothy Davern, Michael Crowley
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Patent number: 9514591Abstract: A paper-sheet recognition apparatus that acquires information from a paper sheet and recognizes the paper sheet based on the information. The apparatus includes one or more light emitting units that output first to n-th lights (n?2) of different wavelengths; an emission controller that performs emission control of the light emitting units; a light receiving unit that receive a component of a light, which has been emitted from the light emitting unit and then reflected from and/or transmitted through the paper sheet; and a paper-sheet recognition processor that recognizes the paper sheet by using an optical signal received by the light receiving unit. The emission controller performs the emission control of the light emitting units such that the number of light emissions per one emission cycle with respect each of to the first to n-th lights differs depending on information desired to be used in recognizing the paper sheet.Type: GrantFiled: March 29, 2007Date of Patent: December 6, 2016Assignee: GLORY LTD.Inventors: Hiroki Hamasaki, Tomohiko Kasuya, Akira Bougaki, Norio Morikawa
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Patent number: 9486136Abstract: An apparatus for use in the measurement of the optical density of macular pigment in the human eye, and an apparatus for the use in measuring the lens optical density of a human eye. The apparatus is particularly applicable to flicker photometers, which are used to measure the macular pigment in the human eye.Type: GrantFiled: February 11, 2013Date of Patent: November 8, 2016Assignee: Guardion Health Sciences, LLCInventor: Richard Bone
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Patent number: 9389188Abstract: A structure for testing a luminescent film includes a Lambertian light source, an integrating sphere having an input port, and a measuring device. The Lambertian light source includes a mixing chamber having an input port and an output port, and a light emitter coupled to the input port. During testing the luminescent film is positioned between the output port of the mixing chamber and the input port of the integrating sphere. The measuring device is optically coupled to the integrating sphere.Type: GrantFiled: May 5, 2015Date of Patent: July 12, 2016Assignee: Koninklijke Philips N.V.Inventors: Dmitri Simonian, Mikhail Fouksman
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Patent number: 9237839Abstract: A device, system, and method for activating and initializing an in vivo imaging device with an RF radiation signal. Functionality of the in vivo imaging device is tested and results may be reported to a user. The in vivo imaging device may include an RF switch to facilitate powering or deactivation of one or more electrical components of the device. The initialization system may include an optical artifact testing unit, a field of illumination testing unit, and a transmission/reception testing unit. The activation system may comprise an in vivo device association unit which may relate a designated device to a single data recorder or to a single controller.Type: GrantFiled: December 16, 2010Date of Patent: January 19, 2016Assignee: GIVEN IMAGING LTD.Inventors: Micha Nisani, Ido Bettesh, Boaz Aizenshtark, Eli Horn
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Patent number: 9140647Abstract: An apparatus for reflectivity measurement is provided. The apparatus generally measures reflectivity characteristics of a reflective surface, such as a reflective cavity of a light array. The apparatus generally comprises a body defining a volume and a light emitting element disposed outside the volume. A sensor coupled to the body detects light reflected from a reflective surface. Various embodiments provide positioning of the apparatus relative to a light array having a reflective cavity.Type: GrantFiled: November 17, 2014Date of Patent: September 22, 2015Assignee: APPLIED MATERIALS, INC.Inventors: Joseph M. Ranish, Joseph Johnson, Mehran Behdjat
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Patent number: 8994949Abstract: A gas detector including an assembly of two hemispherical caps having opposite concavities, and which are reflective on at least a portion of their opposite surfaces, and a wafer arranged in an equatorial plane of the assembly of the two caps, in the vicinity of but spaced apart from the center of the equatorial plane, including, back-to-back: a diverging light emitter directed towards the first cap and a light receiver directed towards the second cap.Type: GrantFiled: September 19, 2013Date of Patent: March 31, 2015Assignee: Commissariat a l'energie atomique et aux energies alternativesInventors: Serge Gidon, Pierre Gidon
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Patent number: 8988674Abstract: Systems and methods for measuring an intensity characteristic of a light beam are disclosed. The methods include directing the light beam into a prism assembly that includes a thin prism sandwiched by two transparent plates, and reflecting a portion of the light beam by total-internal-reflection surface to an integrating sphere while transmitting the remaining portion of the light beam through the two transparent plates to a beam dump. The method also includes detecting light captured by the integrating sphere and determining the intensity characteristic from the detected light.Type: GrantFiled: July 29, 2013Date of Patent: March 24, 2015Assignee: Ultratech, Inc.Inventors: Serguei Anikitchev, David Gaines
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Patent number: 8982345Abstract: In an apparatus for measuring an optical characteristic of a sample, one object of the present invention is to provide an apparatus capable of measuring hemispherical total reflectance, hemispherical total transmittance, and light distribution, and to achieve a reduction in measurement time and an improvement in precision of the quantitative analysis of hemispherical total reflectance (transmittance). In a double ellipsoidal optical system which is an optical system in which one focal points of two ellipsoidal mirrors are positioned as a common focal point, and three focal points are aligned in a straight line, the double ellipsoidal optical system is composed of a partial ellipsoidal mirror 2, such as a quarter ellipsoidal mirror, and a belt-shape ellipsoidal mirror 1.Type: GrantFiled: March 8, 2012Date of Patent: March 17, 2015Assignee: National Institute of Advanced Industrial Science and TechnologyInventors: Etsuo Kawate, Miroslav Hain
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Patent number: 8970835Abstract: An optical characteristic measuring apparatus includes a hemispheric portion having a reflective surface on its inner wall, and a plane portion arranged to close an opening of the hemispheric portion and having a reflective surface on an inner-wall side of the hemispheric portion. The plane portion includes a first window occupying a range including a substantial center of curvature of the hemispheric portion for attaching a light source to the first window. At least one of the hemispheric portion and the plane portion includes a plurality of second windows arranged in accordance with a predetermined rule for extracting light from inside the hemispheric portion.Type: GrantFiled: November 6, 2012Date of Patent: March 3, 2015Assignee: Otsuka Electronics Co., Ltd.Inventors: Kazuaki Ohkubo, Hisashi Shiraiwa
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Publication number: 20150029497Abstract: Systems and methods for measuring an intensity characteristic of a light beam are disclosed. The methods include directing the light beam into a prism assembly that includes a thin prism sandwiched by two transparent plates, and reflecting a portion of the light beam by total-internal-reflection surface to an integrating sphere while transmitting the remaining portion of the light beam through the two transparent plates to a beam dump. The method also includes detecting light captured by the integrating sphere and determining the intensity characteristic from the detected light.Type: ApplicationFiled: July 29, 2013Publication date: January 29, 2015Applicant: Ultratech, Inc.Inventors: Sergeui Anikitchev, David Gaines
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Patent number: 8923352Abstract: One embodiment is directed towards a stabilized laser including a laser to produce light at a frequency and a resonator coupled to the laser such that the light from the laser circulates therethrough. The laser also includes Pound-Drever-Hall (PDH) feedback electronics configured to adjust the frequency of the light from the laser to reduce phase noise in response to light sensed at the reflection port of the resonator and transmission port feedback electronics configured to adjust the frequency of the light from the laser toward resonance of the resonator at the transmission port in response to the light sensed at the transmission port of the resonator, wherein the transmission port feedback electronics adjust the frequency at a rate at least ten times slower than the PDH feedback electronics.Type: GrantFiled: August 10, 2012Date of Patent: December 30, 2014Assignee: Honeywell International Inc.Inventors: Lee K. Strandjord, Tiequn Qiu, Glen A. Sanders
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Patent number: 8896824Abstract: An optical characteristic measuring apparatus includes a hemispheric portion having a reflective surface on its inner wall, and a plane portion arranged to close an opening of the hemispheric portion and having a reflective surface on an inner-wall side of the hemispheric portion. The plane portion includes a first window occupying a range including a substantial center of curvature of the hemispheric portion for attaching a light source to the first window. At least one of the hemispheric portion and the plane portion includes a plurality of second windows arranged in accordance with a predetermined rule for extracting light from inside the hemispheric portion.Type: GrantFiled: April 12, 2013Date of Patent: November 25, 2014Assignee: Otsuka Electronics Co., Ltd.Inventors: Kazuaki Ohkubo, Hisashi Shiraiwa
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Patent number: 8854734Abstract: An integrating optical system having a chamber, the chamber having an aperture and at least one portion having a diffuse reflective material; a light source; and a diffuse transmissive baffle. The baffle is located in relation to the chamber such that it is also located in an optical path between the light source and a treatable target. A light-ray originating from the light source is diffusely transmitted from the diffuse transmissive baffle and impinges on an interior surface of the chamber before impinging on the treatable target.Type: GrantFiled: December 16, 2009Date of Patent: October 7, 2014Assignee: Vela Technologies, Inc.Inventor: Michael W. Ingram
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Patent number: 8773655Abstract: The present invention relates to a total luminous flux measurement system and a method thereof for measuring a total luminous flux of a light emitting component. The total luminous flux measurement system includes a light receiving module, a first light detector and a processing module. The light receiving module is disposed on a central normal of the light emitting component and divides a projection light field to a forward light field and a side light field. The light receiving module receives a beam in the forward light field to obtain a forward luminous flux. The first light detector is disposed on a side of the light receiving module to receive a beam in the side light field to obtain a first side luminous flux. The processing module electrically connects the light receiving module and the first light detector to calculate the total luminous flux at the light emitting component.Type: GrantFiled: September 13, 2012Date of Patent: July 8, 2014Assignee: Chroma Ate Inc.Inventors: Hsu-Ting Cheng, Yueh-Hung Cheng
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Patent number: 8749774Abstract: Provided are an integrating sphere photometer and a measuring method of the same. The integrating sphere photometer includes a plurality of photodetectors, an integrating sphere having through-holes formed to correspond to the photodetectors, baffles disposed inside the integrating sphere in front of the photodetectors to be spaced apart from the photodetectors, a photometer disposed at a through-hole, and an adjustment unit adjusting output signals of the photodetectors to have the same output signal with respect to light illuminated from a point-like standard light source disposed at a center region in the integrating sphere.Type: GrantFiled: July 18, 2011Date of Patent: June 10, 2014Assignee: Korea Research Institute of Standards and ScienceInventors: Seongchong Park, Dong Hoon Lee, Seung Nam Park
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Patent number: 8749773Abstract: Disclosed is a method for testing a light-emitting device comprising the steps of: providing an integrating sphere comprising an inlet port and a first exit port; disposing the light-emitting device close to the inlet port of the integrating sphere; providing a current source to drive the light-emitting device to form an image of the light-emitting device in driven state; providing an image receiving device and to receive the image of the light-emitting device, wherein the image receiving device is connected to the first exit port of the integrating sphere; and determining a luminous intensity of the light-emitting device according to the image. An apparatus for testing a light-emitting device is also disclosed.Type: GrantFiled: January 15, 2013Date of Patent: June 10, 2014Assignee: Epistar CorporationInventors: Tang-Chung Chao, Pei-Hsiang Tseng, Jia-Kuan Kuo, Guan-Hung Wu, Yuan-Hao Su, Chi-Hsin Ho, Chia-Liang Hsu, Chih-Chiang Lu
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Patent number: 8749791Abstract: An apparatus for measuring optical properties of transparent materials with a first illumination device which illuminates the material to be investigated along a pre-set illumination path with a pre-set radiation, with a radiation recording space which records radiation passed on by the material to be investigated. The radiation recording space is arranged so that radiation emitted by the first illumination device first strikes the material and then at least for a time an inner wall of the radiation recording space. A radiation detector device is arranged to record radiation reflected and/or scattered essentially only from the inner wall. A second illumination device suitable for emitting modulated radiation also illuminates the inner wall.Type: GrantFiled: August 9, 2012Date of Patent: June 10, 2014Assignee: BYK-Gardner GmbHInventors: Severin Wimmer, Peter Schwarz
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Publication number: 20140078496Abstract: An optical measuring device includes a case, a reflective layer and a light collecting lens module. A measuring chamber and a channel, which is connected to the measuring chamber and is connected to an opening of the case, reside in the case. The reflective layer is disposed onto an inner surface of the measuring chamber. The light collecting lens module is located inside the channel. A light beam emits into the channel of the optical measuring device through an opening, passes through the light collecting lens module and enters the measuring chamber afterward.Type: ApplicationFiled: September 13, 2013Publication date: March 20, 2014Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTEInventors: Chen-Chin CHENG, Jian-Shian LIN, Min-Chieh CHOU, Yu-Tang CHEN
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Patent number: 8625088Abstract: Provided are an integrating sphere photometer and a measuring method of the same. The integrating sphere photometer includes an integrating sphere including a left hemisphere and a right hemisphere, a photometer disposed on the center surface of the right hemisphere, a photometer baffle disposed in front of the photometer to be spaced apart therefrom, a light source to be tested disposed at the center region of the integrating sphere to illuminate light to at least an illumination region of the left hemisphere, an auxiliary lamp part disposed in the vicinity of a contact region between the left hemisphere and the right hemisphere to illuminate light to the illumination region, and an auxiliary lamp baffle disposed around the auxiliary lamp part to prevent the light emitted from the light source to be tested from being directly illuminated to the auxiliary lamp part and also to prevent the light emitted from the auxiliary lamp part from being directly illuminated to the light source to be tested.Type: GrantFiled: February 2, 2010Date of Patent: January 7, 2014Assignee: Korean Research Institute of Standards and ScienceInventors: Seongchong Park, Dong Hoon Lee, Seung Nam Park
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Patent number: 8611975Abstract: A method and apparatus for the noninvasive detection of a concentration of a substance in a body, such as glucose in the human bloodstream is disclosed. The apparatus measures substance concentration by detecting radiation in the far infrared range emitted by the body using an infrared detected in combination with a set of adequate filters. In order to achieve the accuracy required, the radiation values detected by the detector are corrected for the emissions of the system components. The temperature of each system component including the detector temperature and an ambient temperate is determined using temperature sensors attached to the various system components. These temperatures are correlated with a set of predetermined calibration parameters to correct the detector readings.Type: GrantFiled: October 28, 2009Date of Patent: December 17, 2013Assignee: Gluco Vista, Inc.Inventor: Yonatan Gerlitz
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Publication number: 20130321794Abstract: The present invention relates to a total luminous flux measurement system and a method thereof for measuring a total luminous flux of a light emitting component. The total luminous flux measurement system includes a light receiving module, a first light detector and a processing module. The light receiving module is disposed on a central normal of the light emitting component and divides a projection light field to a forward light field and a side light field. The light receiving module receives a beam in the forward light field to obtain a forward luminous flux. The first light detector is disposed on a side of the light receiving module to receive a beam in the side light field to obtain a first side luminous flux. The processing module electrically connects the light receiving module and the first light detector to calculate the total luminous flux at the light emitting component.Type: ApplicationFiled: September 13, 2012Publication date: December 5, 2013Applicant: CHROMA ATE INC.Inventors: HSU-TING CHENG, YUEH-HUNG CHENG
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Patent number: 8462337Abstract: A spectroscopic measurement apparatus 1A comprises an integrating sphere 20 in which a sample S is located, a spectroscopic analyzer 30 dispersing the light to be measured from the sample S and obtaining a wavelength spectrum, and a data analyzer 50. The analyzer 50 includes an object range setting section which sets a first object range corresponding to excitation light and a second object range corresponding to light emission from the sample S in a wavelength spectrum, and a sample information analyzing section which determines a luminescence quantum yield of the sample S, determines a measurement value ?0 of the luminescence quantum yield from results of a reference measurement and a sample measurement, and determines, by using factors ?, ? regarding stray light in the reference measurement, an analysis value ? of the luminescence quantum yield with the effect of stray light reduced by ?=??0+?.Type: GrantFiled: September 8, 2009Date of Patent: June 11, 2013Assignee: Hamamatsu Photonics K.K.Inventors: Motoyuki Watanabe, Kazuya Iguchi, Kengo Suzuki
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Patent number: 8451438Abstract: An integrating sphere photometer and a measuring method of the same are provided to precisely measure a directional light source. The integrating sphere photometer includes an integrating sphere having a plurality of through-holes, a plurality of photometers disposed at the through-holes, baffles disposed in front of the photometers to be spaced apart therefrom, an auxiliary light source disposed inside the integrating sphere, an auxiliary baffle disposed in front of the auxiliary light source, and a summing unit of output signals of the photometers under the illumination of a light source to be measured disposed in the central area inside the integrating sphere.Type: GrantFiled: August 30, 2012Date of Patent: May 28, 2013Assignee: Korea Research Institute of Standards and ScienceInventors: Seongchong Park, Dong Hoon Lee, Seung Nam Park
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Patent number: 8426800Abstract: Integrating optical systems and methods of use are described herein. In one embodiment, an integrating optical system comprises: a housing having a first and second portions; and a chamber having a diffuse reflective material and a volume formed within the portions when coupled together. The portions are separable to allow insertion and removal of at least one light treatable object in and out of the chamber. At least one aperture is formed in the chamber to couple to a light source and to direct light from the light source to at least a first portion of the diffuse reflective material. At least one holding structure supports the object within the volume at a location, wherein the diffuse reflective material, the aperture and the location ensure that the light is diffusely reflected to integrate the light and impact the object with substantially uniform light without movement of the object.Type: GrantFiled: September 9, 2011Date of Patent: April 23, 2013Assignee: Vela Technologies, Inc.Inventors: Michael W. Ingram, Joseph C. Stumpf, Jon P. Conway
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Patent number: 8363069Abstract: Disclosed examples of optical systems having a plurality of light sources with each source having a different spectral outputs may be calibrated by measuring a spectral characteristic of the combined light with two measurements, e.g., one from a colorimeter and one from a sensor included in the system. Accordingly, one can determine a transform function in response to the two measures that models a feedback response of the optical system for each of a plurality of the inputs that would cause the optical system to generate radiant energy within a predetermined range of a spectrum. In order to calibrate the optical system, the transform function is programmed in the optical system to enable the optical system to transform an input to the optical system to a plurality of unique control signals each for controlling a respective light source of the plurality of light sources.Type: GrantFiled: October 25, 2006Date of Patent: January 29, 2013Assignee: ABL IP Holding LLCInventors: Matthew H. Aldrich, Michael E. Garbus, Jr.
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Publication number: 20120320371Abstract: An integrating sphere photometer and a measuring method of the same are provided to precisely measure a directional light source. The integrating sphere photometer includes an integrating sphere having a plurality of through-holes, a plurality of photometers disposed at the through-holes, baffles disposed in front of the photometers to be spaced apart therefrom, an auxiliary light source disposed inside the integrating sphere, an auxiliary baffle disposed in front of the auxiliary light source, and a summing unit of output signals of the photometers under the illumination of a light source to be measured disposed in the central area inside the integrating sphere.Type: ApplicationFiled: August 30, 2012Publication date: December 20, 2012Inventors: Seongchong Park, Dong Hoon Lee, Seung Nam Park
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Patent number: 8324561Abstract: A photodetecting device 1 includes an integrating sphere 20 for observing light to be measured generated according to irradiation of a sample with excitation light and a sample holder 60 removably attached to the integrating sphere 20, the integrating sphere 20 has an excitation light introducing hole 201 for introducing the excitation light and a sample introducing hole 205 for introducing a cell C held by the sample holder 60, the sample holder 60 is locked to the sample introducing hole 205 and holds the cell C for accommodating the sample, and the cell is disposed so that an entrance surface of the cell C, through which the excitation light enters the cell C, inclines relative to the surface perpendicular to the optical axis L of the excitation light.Type: GrantFiled: March 1, 2007Date of Patent: December 4, 2012Assignee: Hamamatsu Photonics K.K.Inventors: Kazuya Iguchi, Kengo Suzuki
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Patent number: 8294898Abstract: The present invention relates to a rotationally asymmetric chaotic optical multi-pass cavity useful in optical gas sensing spectroscopy, optical delay lines, and laser amplification systems, for example. The cavity may include a single closed mirror having a light reflective surface that is deformed in two orthogonal directions and more particularly, but not exclusively, in the shape of a quadrupole in both horizontal and vertical planes. The cavity includes a light entry port and a light exit port which may be the same or separate ports, as well as a gas inlet and a gas outlet. The optical path length, the beam divergence rate, and the spot pattern are controlled by selecting the cavity deformation coefficients and the input beam direction to achieve the desired beam path and beam quality.Type: GrantFiled: August 25, 2008Date of Patent: October 23, 2012Assignee: Trustees of Princeton UniversityInventors: Dongxia Qu, Claire Gmachl
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Publication number: 20120229801Abstract: Provided are an integrating sphere photometer and a measuring method of the same. The integrating sphere photometer includes an integrating sphere including a left hemisphere and a right hemisphere, a photometer disposed on the center surface of the right hemisphere, a photometer baffle disposed in front of the photometer to be spaced apart therefrom, a light source to be tested disposed at the center region of the integrating sphere to illuminate light to at least an illumination region of the left hemisphere, an auxiliary lamp part disposed in the vicinity of a contact region between the left hemisphere and the right hemisphere to illuminate light to the illumination region, and an auxiliary lamp baffle disposed around the auxiliary lamp part to prevent the light emitted from the light source to be tested from being directly illuminated to the auxiliary lamp part and also to prevent the light emitted from the auxiliary lamp part from being directly illuminated to the light source to be tested.Type: ApplicationFiled: February 2, 2010Publication date: September 13, 2012Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCEInventors: Seongchong Park, Dong Hoon Lee, Seung Nam Park
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Patent number: 8259294Abstract: A method and device are provided for measurement of various transmission and reflection values of transparent measurement objects having transparent layers in an inline coating system, and particularly the turbidity of the measurement object during a relative movement between the measurement object and measuring device. Transmission fractions are measured in two different radiation directions of a lighting source emitting diffuse light by two photodetectors, by which a fraction of diffuse light of the lighting source is suppressed in one direction.Type: GrantFiled: August 11, 2010Date of Patent: September 4, 2012Assignee: Von Ardenne Anlagentechnik GmbHInventors: Holger Proehl, Thomas Knoth, Tina Schoessler, Martin Dimer
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Publication number: 20120140210Abstract: A tray, a testing apparatus and a testing method using the same are disclosed. The testing apparatus includes a tray having a plurality of light sources received therein, the plurality of light sources outputting light when power is applied thereto; a plurality of optical receiver units arranged to correspond to the plurality of light sources and receiving the light outputted from each of the plurality of light sources; a plurality of probe units arranged to correspond to the plurality of light sources and applying power to each of the plurality of light sources; a power supply control unit selectively controlling power applied to the plurality of probe units; and an optical properties analyzing unit analyzing properties of optical signals from the light received by the optical receiver units.Type: ApplicationFiled: November 17, 2011Publication date: June 7, 2012Inventors: Cheol Jun YOO, Young Hee SONG, Seong Deok HWANG
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Patent number: 8144316Abstract: The present invention provides an instrument and method for measuring total luminous flux of luminous elements, which forms an approximately uniform spatial intensity distribution by simultaneously lighting a plurality of luminous elements for measurement in an integrating sphere when comparing a total luminous flux standard lamp with the luminous elements to measure the total luminous flux of the luminous elements, thus not requiring spatial mismatch error correction.Type: GrantFiled: October 1, 2009Date of Patent: March 27, 2012Assignee: Korea Research Institute of Standards and ScienceInventors: Seong Chong Park, Seung Nam Park, Dong Hoon Lee
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Patent number: 8072607Abstract: A measuring device for measuring optical properties of transparent substrates includes a light transmitter and/or light receiver comprising a hollow cylinder having a highly reflective and diffusely dispersive inner surface. The light transmitter comprises a light source arranged in its interior and a light exit opening at a distance from the light source. The light receiver has a light sensor instead of the light source, at a distance from a light entrance opening. The light source and light sensor are arranged at such a distance from the light exit opening and light entrance opening respectively, given a corresponding direction of propagation of the light, that light emitted by the light source or received by the light sensor and multiply reflected in the hollow cylinder emerges as diffuse light from the light exit opening or is incident on the light sensor.Type: GrantFiled: October 30, 2007Date of Patent: December 6, 2011Assignee: Von Ardenne Anlagentechnik GmbHInventors: Jochen Krause, Holger Proehl
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Patent number: 8040496Abstract: An endoscopic illumination tester is provided for testing illumination quality of a light source. The endoscopic illumination tester includes an optical bridge that is removably interlockable with the light source. The endoscopic illumination tester includes an integrating sphere that is removably interlockable with the optical bridge. The endoscopic illumination tester may further engage a light guide connectable between the optical bridge and the light source. An endoscope may be inserted between the optical bridge and the integrating sphere.Type: GrantFiled: March 16, 2007Date of Patent: October 18, 2011Assignee: Lighthouse Imaging CorporationInventors: Dennis C. Leiner, Michael Bush, David J. Biolsi
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Publication number: 20110141476Abstract: A compact, optical measurement system has a non-flat detector array having multiple detector elements arranged on a flexible substrate in a monolithic fashion, one or more illumination sources arranged to provide more than one angle of incidence of light on a subject being measured, and a detection system in electrical communication with the detector array, the detection system arranged to receive inputs from the detector array and provide a measurement from the inputs. A method of measuring reflectance of a surface includes placing the surface adjacent a hemispherical detector array, illuminating the surface from a predetermined angle of incidence, simultaneously detecting reflectance at multiple emission angles using the hemispherical detector array, and repeating the illuminating and detecting processes at different angles of incidence. Optional arrays of lenses, baffles and filters may be employed by the system.Type: ApplicationFiled: December 10, 2009Publication date: June 16, 2011Applicant: PALO ALTO RESEARCH CENTER INCORPORATEDInventors: PHILIPP HELMUT SCHMAELZLE, ROBERT A. STREET