Integrating Spheres Patents (Class 356/236)
  • Patent number: 6369883
    Abstract: The present invention introduces system and method for an enhanced mass splice measurement system for testing a plurality of optical fiber splices and also the reliability of the mass fusion splicer itself. In one embodiment, a first light signal may be transmitted through each of a plurality of optical fibers at one end. At the other end, the plurality of optical fibers may be optically coupled to an integrating sphere using a fiber holder and an adapter. A light meter may be coupled to the integrating sphere for measuring the first light signal received at the integrating sphere. Once the first light signal has been measured, the fiber holder having the ends of the optical fiber may be removed from the integrating sphere and/or adapter and installed in a mass fusion splicer. A second fiber holder having ends of a second fiber cable may be installed in the mass fusion splicer.
    Type: Grant
    Filed: April 13, 2000
    Date of Patent: April 9, 2002
    Assignee: Amherst Holding Co.
    Inventor: Brett G. Clark
  • Patent number: 6346713
    Abstract: Method for inspecting an article for defects, light scattered by the article is collected. A defect in the article gives rise to a pulse scanning response signal, which is fed to a processing unit. The light beam has a wavelength such that the article is transparent thereto. At least two scanning response signals are obtained, which are associated with focal points at different focal depths in the article. The location of the defect in the direction of the light beam is determined from the steepness of the front and rear flanks of the pulse scanning response signals. By this means it is possible to determine whether a defect is on or in the article. The at least two scanning response signals can be obtained by scanning the article at least twice, with different focal depth for each scan.
    Type: Grant
    Filed: December 20, 1999
    Date of Patent: February 12, 2002
    Assignee: Nederlandse Organisatie voor Toegepast-Natuurwetenschappelijk Onderzoek TNO
    Inventor: Antonius Ludovicus Gerardus Van Valkenburg
  • Patent number: 6300621
    Abstract: A calibration apparatus for calibrating a color imager, the calibration apparatus comprising an integrating sphere having at least one port, at least one light emitting diode, and an optical baffle so that light provided by the at least one light emitting diode is reflected upon the inner surface of the integrating sphere before exiting the at least one port.
    Type: Grant
    Filed: December 9, 1998
    Date of Patent: October 9, 2001
    Assignee: Intel Corporation
    Inventors: Lawrence A. Booth, Jr., Craig P. Donovan
  • Patent number: 6275295
    Abstract: The invention provides an improved optical system for determining the physical characteristics of a solar cell. The system comprises a lamp means for projecting light in a wide solid-angle onto the surface of the cell; a chamber for receiving the light through an entrance port, the chamber having an interior light absorbing spherical surface, an exit port for receiving a beam of light reflected substantially normal to the cell, a cell support, and an lower aperture for releasing light into a light absorbing baffle; a means for dispersing the reflection into monochromatic components; a means for detecting an intensity of the components; and a means for reporting the determination.
    Type: Grant
    Filed: April 30, 1999
    Date of Patent: August 14, 2001
    Assignee: Midwest Research Institute
    Inventor: Bhushan L. Sopori
  • Patent number: 6226085
    Abstract: A method and system to measure surface characteristics of a specimen. One implementation involves receiving at a receiver optical radiation reflected or scattered from a specimen, the optical radiation including specular components that are spatially encoded by wavelength according to chromatic aberration of the receiver. A measure of surface characteristics is then provided by processing a signal representing the received optical radiation which includes the specular components that are spatially encoded by wavelength according to chromatic aberration. The invention may be implemented with an integrating sphere, in either SCE or SCI mode, and both color and surface effects of a specimen can be measured simultaneously using a single spectrophotometric instrument. In an alternative embodiment, the size of a port opposite a receiver is varied, and for each of a plurality of port sizes, the receiver receives a corresponding optical radiation signal representing optical radiation reflected by the sample.
    Type: Grant
    Filed: June 26, 1998
    Date of Patent: May 1, 2001
    Assignee: GretagMacbeth LLC
    Inventor: William L. Weber
  • Patent number: 6222623
    Abstract: A document validation subassembly is described. The subassembly includes a light mixer for generating at least one substantially homogenous light spot. The light mixer includes a light mixing chamber, at least one input port for accommodating at least one light source, at least one output, and at least one collimator connected to the output. In an implementation, the light mixing chamber is substantially spherical, but other shapes, such as cylindrical chambers, are also contemplated. Also described are solid core light mixer implementations.
    Type: Grant
    Filed: September 3, 1999
    Date of Patent: April 24, 2001
    Assignee: Mars Incorporated
    Inventor: William B. Wetherell
  • Patent number: 6222172
    Abstract: A light-emitting diode array is driven by a digital control. The digital control modulates the pulse width of pulses applied to the light-emitting diode. The intensity of the output is controlled by controlling the width of pulses applied to the light-emitting diode. Since light-emitting diodes have very low inertial energy, this system can be rapidly turned on and turned off. The output is integrated to produce a uniform output.
    Type: Grant
    Filed: February 4, 1999
    Date of Patent: April 24, 2001
    Assignee: Photobit Corporation
    Inventors: Eric R. Fossum, Gregory Waligorski
  • Patent number: 6147357
    Abstract: An apparatus and a method are provided for inspecting the edge micro-texture of a semiconductor wafer. The apparatus includes a diffuse hemisphere having at least one access port and has a normal axis, a laser target sphere mounted within the hemisphere, and a laser source directing a laser beam to the laser target sphere and forming a laser spot on the laser target sphere. The laser beam is reflected from the laser target sphere. A wafer chuck presents a wafer edge to the reflected laser beam, with the wafer edge being tilted from the normal axis; and there is at least one camera for detecting radiation leaving the access port. The method includes directing a laser beam to a laser target sphere which is mounted within a diffuse hemisphere; the laser beam forming a laser spot on the laser target sphere is reflected from the laser target sphere to the edge of a wafer; and radiation which leaves the hemisphere through at least one access port of the hemisphere is detected with at least one camera.
    Type: Grant
    Filed: February 3, 1999
    Date of Patent: November 14, 2000
    Assignee: Wacker Siltronic Corporation
    Inventor: Claudian R. Nicolesco
  • Patent number: 6088117
    Abstract: A reflection characteristic of a sample is measured using an integrating sphere by: measuring an apparent reflectance of a reference sample by using integrating sphere, the reference sample having a known true reflectance under a given illumination condition; calculating coefficients for rendering a linear combination of a measured apparent reflectance of the reference sample and N-th power (N is 2 or more integer) of the measured apparent reflectance closer to the known true reflectance of the reference sample; storing calculated coefficients in a storage medium as coefficients for the given illumination condition; measuring an apparent reflectance of a desired sample by using the integrating sphere; calculating a true reflectance of the desired sample under the given illumination condition by multiplying the terms of the linear combination of an measured apparent reflectance of the desired sample and N-th power of the measured apparent reflectance of the desired sample by the coefficients stored in the stor
    Type: Grant
    Filed: August 27, 1998
    Date of Patent: July 11, 2000
    Assignee: Minolta Co., Ltd.
    Inventors: Kenji Imura, Masayuki Makino, Wataru Yamaguchi, Hiroshi Kohsaka, Naoki Sagisaka
  • Patent number: 6088091
    Abstract: An optical position tracking system that tracks the position of objects, using light intensity and/or frequency with the application of geometry and ratios of detector responses, is provided, having light distributing and light detecting components that employ the concepts of constructive occlusion and diffuse reflection. Diffusely reflective cavities, masks and baffles are used to improve certain radiating characteristics of the distributing components and certain response characteristics of the detecting components, to tailor the radiation and detection profiles thereof, including them substantially uniform for all angles within a hemispheric area which the distributing and detecting components face. The distributing and/or detecting components are partitioned with specially-configured baffles. A partitioned distributor has distinct emission sections where the sections can emit spectrally-different or distinguishable radiation.
    Type: Grant
    Filed: May 12, 1998
    Date of Patent: July 11, 2000
    Assignee: Advanced Optical Technologies, LLC
    Inventors: David P. Ramer, Jack C. Rains, Jr.
  • Patent number: 6078041
    Abstract: A pixel density detector includes a cylinder (1) having a characteristic of catching incident light, an entrance window (2) provided in a shape of a slit in the longitudinal direction of the cylinder (1), and 2 pieces of light detecting device (4) disposed at a prescribed internal on the cylinder (1) at a prescribed angle against the entrance window (2).
    Type: Grant
    Filed: November 24, 1997
    Date of Patent: June 20, 2000
    Assignee: Nishimoto Sangyo Co., Ltd.
    Inventors: Haruo Kotani, Masakazu Karita
  • Patent number: 6061140
    Abstract: A spectrophotometer providing a sample measurement area of selectable size. The spectrophotometer includes a sphere defining a sample station, a lamp to illuminate the interior of the sphere and therefore the sample station, a color measurement engine including an aperture directed toward the sample station, and a measurement area size selector. The size selector includes a movable plate defining two or more holes of different sizes. The plate can be moved so that only one of the holes is aligned with the aperture to control the size of the measurement area sampled by the color measurement engine.
    Type: Grant
    Filed: May 27, 1999
    Date of Patent: May 9, 2000
    Assignee: X-Rite, Incorporated
    Inventors: Bernard J. Berg, Marc D. Zuiderveen, Thomas J. Boes
  • Patent number: 6040904
    Abstract: An apparatus for measuring diffuse optical transmission density of a photographic films sample uses two integrating spheres and a diffuse light source. Light from the light source is transmitted through a first light modulation system into the first integrating sphere. Light from the first integrating sphere is transmitted through a second light modulation system into the second integrating sphere. A fixed monochromator receives light at an exit port of the second integrating sphere. The light modulation systems take the form of adjustable diaphragms which allow for the modulation of the uniform radiance area located between the two integrating spheres and maintains the geometric and spectral conditions relating to the illumination of the sample located at the output port of the second integrating sphere.
    Type: Grant
    Filed: December 23, 1998
    Date of Patent: March 21, 2000
    Assignee: Eastman Kodak Company
    Inventors: Eric L. Fallet, Michael R. Goodwin, Timothy P. Hahm
  • Patent number: 5963318
    Abstract: A system for performing vertical spectrophotometric determinations uses a vessel which has an upper transparent surface and a lower transparent surface which are spaced apart to define a known fixed pathlength through which a light beam is transmitted. The vessel also includes a portion disposed above the upper surface which may be a spout having an opening for allowing the introduction of substances into the containment portion.
    Type: Grant
    Filed: August 7, 1998
    Date of Patent: October 5, 1999
    Assignee: Bio-Tek Holdings, Inc.
    Inventor: Paul G. Held
  • Patent number: 5956133
    Abstract: A reflection characteristic measuring apparatus is provided with a hollow integrating sphere. The integrating sphere is formed with four apertures: a sample aperture where a sample to be measured is placed; a first illumination aperture for allowing light to enter the sphere from a first illuminator; a second illumination aperture for allowing light to enter the sphere from a second illuminator; and a measurement aperture for allowing light to exit from the sphere. A photoreceptor receives light reflected from the sample that exits the measurement aperture. A reflection characteristic calculator is used to for calculating first and second reflection characteristics of the sample based on the light received by the photoreceptor. A corrector is used to correct the calculated first and second reflection characteristics.
    Type: Grant
    Filed: October 27, 1998
    Date of Patent: September 21, 1999
    Assignee: Minolta Co., Ltd.
    Inventor: Kenji Imura
  • Patent number: 5929994
    Abstract: An integrating sphere ellipsometer includes an incident light polarization control unit, a reflective light polarization analysis unit, an integrating sphere and a total integrated scattered light detector. The incident light polarization control unit and the reflective light polarization analysis unit jointly function as an ellipsometer to obtain information such as film thickness and material complex refractive indices. Concurrently, the identical incident light polarization control unit, the total integrated scattered light detector and the integrating sphere unite to function as an integrating sphere analyzer to measure material defects, surface roughness, surface particulates, micropollutants, etc.
    Type: Grant
    Filed: May 20, 1998
    Date of Patent: July 27, 1999
    Assignee: Ahead Optoelectronics, Inc.
    Inventors: Hsiao-Wen Lee, Chih-Kung Lee, Yun-Chang Yang
  • Patent number: 5914487
    Abstract: A radiant energy transducer system includes a base. The base has a diffusely reflective surface and an optical area defining a horizon district with respect to the transducer system. A mask occludes a portion of the optical area so as to present a substantially constant portion of the optical area over a range of angles above the horizon district. An electromagnetic transducer converts between radiation associated with the optical area and corresponding signals. Examples of the transducing systems provide emission of radiant energy with a tailored intensity distribution over an area illuminated by the system. Other examples of the transducing systems detect radiant energy, and the position of the mask relative to the optical area of the detector system serves to tailor the sensitivity of the detector over a field of view. The emitters and detectors can be used together, for example in a system for tracking the position of an object.
    Type: Grant
    Filed: January 16, 1998
    Date of Patent: June 22, 1999
    Assignee: Advanced Optical Technologies, LLC
    Inventors: David P. Ramer, Harold E. Watson, Michael P. Ritter, Bobby L. Epling, Mark G. Schmitt, Jack C. Rains, Jr.
  • Patent number: 5886351
    Abstract: A single element hemispherical light detector that employs the concept of constructed occlusion to improve its uniformity of detection response across a large range of incident angles, and that incorporates a deflector to provide detection response to low incidence angles. The hemispherical light detector uses one active element or photodiode to achieve a substantially uniform response within a sector of a hemisphere.
    Type: Grant
    Filed: February 20, 1998
    Date of Patent: March 23, 1999
    Assignee: Advanced Optical Technologies, LLC
    Inventors: David P. Ramer, Jack C. Rains, Jr.
  • Patent number: 5859709
    Abstract: An optical characteristic measuring apparatus provided with an integrating sphere measures an optical characteristic of a sample based on an intensity of light from the sample. The apparatus includes the first illuminating system which diffusely illuminates the sample by projecting light to a specified region of the inner surface of the integrating sphere, the second illuminating system which projects light on the sample in such an angle that the light is specularly reflected by the sample to the light measuring system, a storage unit which stores weighting factors in connection with inclusion and exclusion of specular component in the reflection light from the sample, and a calculator which calculates an optical characteristic of the sample based on the measurement data and the weighting factors. The first and second illuminating systems are controlled to operate in a specified sequence.
    Type: Grant
    Filed: August 22, 1996
    Date of Patent: January 12, 1999
    Assignee: Minolta Co., Ltd.
    Inventor: Kenji Imura
  • Patent number: 5838429
    Abstract: The invention relates to an apparatus for measuring physiological parameters of blood conveyed within an extracorporeal circulatory system. Two light sources (1a, 1b) emit light of varying wavelength into a spherical cavity (3) that comprises a reflective inner surface (3a). Light sensor means (2) receives part of the light propagating within the cavity (3). A tube portion of the extracorporeal circulation can be inserted into a second cavity (4) such that the light (La, Lb) emitted by the light sources encounters the boundary surface between the blood and an inner wall of the tube. The light returns to the cavity (3) at least to an extent by means of reflection and/or transmission.
    Type: Grant
    Filed: May 14, 1997
    Date of Patent: November 17, 1998
    Assignee: Stockert Instrumente GmbH
    Inventor: Andreas Hahn
  • Patent number: 5773819
    Abstract: A single element hemispherical light detector that employs the concept of constructed occlusion to improve its uniformity of detection response across a large range of incident angles, and that incorporates a deflector to provide detection response to low incidence angles. The hemispherical light detector uses one active element or photodiode to achieve a substantially uniform response within a sector of a hemisphere.
    Type: Grant
    Filed: January 23, 1996
    Date of Patent: June 30, 1998
    Assignee: Advanced Optical Technologies, LLC.
    Inventors: David P. Ramer, Jack C. Rains, Jr.
  • Patent number: 5760890
    Abstract: The invention provides a device for measuring characteristic quantities of an at least partially transparent sample, comprising: an illumination component including a light source (1) which emits light in a predetermined wavelength range and which is arranged such within this illumination component that the light substantially propagates along a predetermined optical axis, a sample reception space provided between this illumination component and a measuring component and arranged such with respect to this optical axis that the light which emerges from the light source first passes a sample located within that sample reception space and then enters this measuring means, a measuring component including a substantially closed measuring space having an opening through which this optical axis extends and through which the light enters after having passed the sample, and which also includes a photodetector component (2) being sensitive at least within this predetermined wavelength range, including at least two dete
    Type: Grant
    Filed: July 12, 1996
    Date of Patent: June 2, 1998
    Assignee: BYK-Gardner GmbH
    Inventors: Konrad Lex, Peter Schwarz, Ralf Zellner
  • Patent number: 5757479
    Abstract: There is provided an inspection apparatus which illuminates at least part of a sample with diffused light from a diffused light source and inspects the sample based on light reflected from the sample. An illuminating chamber is defined by a wall member. The wall member has an inner wall surface for reflecting diffused light from the diffused light source, a sample-inserting opening formed through the wall member for inserting the at least part of the sample into the illuminating chamber therethrough, and a sample-observing opening formed through the wall member for permitting light reflected from the at least part of the sample to be emitted out of the illuminating chamber. The sample is observed by the use of an object-side telecentric optical system having a lens system for collecting parallel light from the light emitted from the sample-observing opening, and an aperture stop arranged at or in the vicinity of a back focal point of the lens system.
    Type: Grant
    Filed: April 1, 1996
    Date of Patent: May 26, 1998
    Assignee: New Creation Co., Ltd.
    Inventors: Kazumi Haga, Motoshi Sakai, Satoshi Akiyama
  • Patent number: 5748304
    Abstract: A measuring instrument for reflectometric measurements, comprising a spherical measuring chamber (1) provided with a light source (2) and with a specimen aperture (3); a measuring channel (4) which has been provided with optics (5), with a photometer (6), with an optional stop (7) and with an optional filter (8); a reference channel (14) provided with optics (15), with a photometer (16), with an optional stop (17) and with an optional filter (18); and a signal processing and calculating device (20.sub.s, 20.sub.c) for processing and comparing with each other the light intensity values observed by means of the photometers in the measuring and reference channels. As taught by the invention, the measuring instrument comprises at least one visible light light source (2.sub.s) which emits substantially light having a wavelength mainly over about 380 nm, and a UV light source (2.sub.u) which emits substantially light in the UV range having a wavelength mainly under about 380 nm, advantageously 300 to 380 nm.
    Type: Grant
    Filed: November 4, 1996
    Date of Patent: May 5, 1998
    Assignee: Conrex Automation Oy
    Inventor: Aimo Heinonen
  • Patent number: 5745234
    Abstract: A reflectometer and a method for measuring the reflectance and transmittance of material using an integrating sphere and a light concentrator. The reflectance and transmittance measurements are performed as a function of the angle of incidence of a beam of light onto a sample and reference material. In a preferred embodiment, a CHC-lens concentrator having a high f/# and a low index of refraction is used.
    Type: Grant
    Filed: July 31, 1995
    Date of Patent: April 28, 1998
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventors: Keith A. Snail, Leonard Hanssen, David Chenault
  • Patent number: 5715065
    Abstract: In order to provide a method and device for determination of the albedo or light absorption of a particle of random form, it is proposed that a particle is electrostatically charged and is positioned contact-free in an Ulbricht sphere by means of an electric field; that the particle thus positioned is illuminated with a measuring light beam passing through the Ulbricht sphere with defined intensity, defined beam cross-section and defined intensity distribution over this; that the intensity of the solely particle-based diffuse radiation in the Ulbricht sphere is measured by means of a sensor; that the cross-sectional area of the particle illuminated by the measuring light beam is determined; that the intensity of the solely reference particle-based diffuse radiation is measured in the same manner with a reference particle with known albedo; and that the albedo of the particle is determined from the ratio of the intensities of the particle-based and reference particle-based diffuse radiation taking into account
    Type: Grant
    Filed: April 26, 1996
    Date of Patent: February 3, 1998
    Assignee: Deutsche Forschungsanstalt fuer Luft- und Raumfahrt e.V.
    Inventor: Christian Sasse
  • Patent number: 5703691
    Abstract: A remote laser sensor incorporating a single integrated detector. The laser sensor comprises a laser for transmitting laser energy that is applied to a target, and a beamsplitter for sampling of the transmitted laser energy. A telescope is provided for collecting laser energy reflected from the target. The integrated detector comprises an integrating sphere for receiving the sampled transmitted laser energy and for receiving the laser energy reflected from the target, and a detector coupled to the integrating sphere for selectively detecting the sampled transmitted laser energy and the laser energy reflected from the target. A scatter plate may be disposed inside the integrating sphere for preventing photons from entering the detector that result directly from a first scattering event within the sphere. In operation, the laser provides a transmit beam that is directed at the target and reflected energy from the target is collected by the telescope and focused onto the detector.
    Type: Grant
    Filed: March 5, 1996
    Date of Patent: December 30, 1997
    Assignee: Hughes Electronics
    Inventors: Louis F. Klaras, David B. Cohn
  • Patent number: 5661556
    Abstract: A system and method for characterizing a surface are disclosed. The system includes a light source and source optics which direct a beam of light toward the surface. A first optical integrating device is positioned and configured to receive a first portion of the scattered light which corresponds to a first range of spatial frequencies. A second optical integrating device is positioned and configured to receive a second portion of the scattered light corresponding to a second range of spatial frequencies. In one embodiment, an integrating sphere is employed as the first optical integrating device. The sphere includes a sampling aperture which is surrounded by a light absorption region on the interior of the sphere. Total integrated scatter data is generated for each range of spatial frequencies and is used to approximate the spectral scatter function of the surface. RMS roughness is then approximated for any range of spatial frequencies.
    Type: Grant
    Filed: March 20, 1996
    Date of Patent: August 26, 1997
    Assignee: Schmitt Measurement Systems, Inc.
    Inventors: Tod F. Schiff, Marvin L. Bernt
  • Patent number: 5650843
    Abstract: Feedback control of a spatially distributed light source for a light integrating cavity in which the light acceptance angle of the light feedback device is expanded by means of a light diffuser at the feedback port so as to better average the localized light intensity variations on the internal surface area of the cavity caused by arc wander in the spatially distributed light source.
    Type: Grant
    Filed: May 30, 1996
    Date of Patent: July 22, 1997
    Assignee: Eastman Kodak Company
    Inventors: Gregory Oscar Moberg, Allen Davenport Bellinger, Jeffrey George Weber
  • Patent number: 5628559
    Abstract: A spherical illuminator (10, 40, 50, 60) having an upper diffuser (17, 47, 56, 62) with a concave surface, and having either an opposing reflector (18, 41) or an opposing lower diffuser (57, 63) with a concave surface. The two concave surfaces are placed so that their concavities form a substantially spherical viewing area into which the object under inspection is placed. The upper diffuser (10, 40, 50, 60) has a viewing aperture. It transmits light uniformly to the object from approximately two-pi steradians. The reflector (18, 41) or the lower diffuser (57, 63) provides light to the object in another two-pi steradians, resulting in nearly four-pi steradians of illumination.
    Type: Grant
    Filed: June 7, 1995
    Date of Patent: May 13, 1997
    Assignee: Texas Instruments Incorporated
    Inventor: Charles H. Anderson
  • Patent number: 5625451
    Abstract: A system and method for characterizing a surface are disclosed. The system includes a light source and source optics which direct a beam of light toward the surface. A first optical integrating device is positioned and configured to receive a first portion of the scattered light which corresponds to a first range of spatial frequencies. A second optical integrating device is positioned and configured to receive a second portion of the scattered light corresponding to a second range of spatial frequencies. In one embodiment, an integrating sphere is employed as the first optical integrating device. The sphere includes a sampling aperture which is surrounded by a light absorption region on the interior of the sphere. Total integrated scatter data is generated for each range of spatial frequencies and is used to approximate the spectral scatter function of the surface. RMS roughness is then approximated for any range of spatial frequencies.
    Type: Grant
    Filed: November 27, 1995
    Date of Patent: April 29, 1997
    Assignee: Schmitt Measurement Systems, Inc.
    Inventors: Tod F. Schiff, Marvin L. Bernt
  • Patent number: 5613753
    Abstract: A spherical illuminator (10, 40, 50, 60) having an upper diffuser (17, 47, 56, 62) with a concave surface, and having either an opposing reflector (18, 41) or an opposing lower diffuser (57, 63) with a concave surface. The two concave surfaces are placed so that their concavities form a substantially spherical viewing area into which the object under inspection is placed. The upper diffuser (10, 40, 50, 60) has a viewing aperture. It transmits light uniformly to the object from approximately two-pi steradians. The reflector (18, 41) or the lower diffuser (57, 63) provides light to the object in another two-pi steradians, resulting in nearly four-pi steradians of illumination.
    Type: Grant
    Filed: November 10, 1994
    Date of Patent: March 25, 1997
    Assignee: Texas Instruments Incorporated
    Inventor: Charles H. Anderson
  • Patent number: 5600437
    Abstract: Inspection apparatus comprising a light sphere and a translucent conduit passing therethrough. A light source is in communication with the interior of the sphere and is positioned to one side of the conduit. A sensor positioned to the side of the conduit remote from the light source operates to sense variations in the intensity of the light within the sphere caused by objects passing through the conduit.
    Type: Grant
    Filed: March 22, 1995
    Date of Patent: February 4, 1997
    Assignee: Parascan Technologies Limited
    Inventor: Mehmet A. Erdentug
  • Patent number: 5597237
    Abstract: Apparatus adapted for use in measuring emissivity of a semiconductor wafer having a radiant energy reflecting surface includes a hollow integrating sphere having first and second spaced apart openings and having an inner surface upon which radiant energy can be distributed. The wafer is disposed with its reflecting surface adjacent the second opening. A first radiant energy detector is disposed on the inner surface of the sphere to detect the distributed energy. First means directs a beam of radiant energy through the first opening in the sphere in such manner that the beam passes through the sphere and the second opening to strike the wafer reflecting surface and is thereupon reflected into the sphere, the reflected energy being distributed upon the inner surface of the sphere and being detected by said first detector.
    Type: Grant
    Filed: May 30, 1995
    Date of Patent: January 28, 1997
    Assignee: Quantum Logic Corp
    Inventor: Alexander Stein
  • Patent number: 5548120
    Abstract: A highly uniform infrared illumination source for illuminating a stripe of a moving sensitized web for line scan imaging of imperfections in the coating on the web by a CCD imaging camera. A light integrator having an elongated housing formed with side and end walls defines a linear light integrating cavity having diffusely reflecting interior wall surfaces. An elongated array of infrared LEDs is spaced along the side wall for emitting light into the cavity for integration within the cavity. A longitudinally extending slit is formed in the side wall through which a diffuse, linear light beam exits the elongated slit having a varying longitudinal intensity profile. The intensity of the light emitted by the LEDs is modulated in an intensity pattern that alters the varying longitudinal intensity profile of the linear light beam to provide a desired longitudinal intensity profile of the stripe of diffuse illumination.
    Type: Grant
    Filed: November 14, 1994
    Date of Patent: August 20, 1996
    Assignee: Eastman Kodak Company
    Inventors: H. Galen Parker, Robert B. Bilhorn, Martin C. Kaplan, Russell J. Palum
  • Patent number: 5537203
    Abstract: A novel light integrating sphere of a preferably appropriately sintered fluorinated aliphatic long chain addition solid polymer block, hollowed to provide an internal integral diffuse reflectance spherical surface.
    Type: Grant
    Filed: February 16, 1994
    Date of Patent: July 16, 1996
    Assignee: Labsphere, Inc.
    Inventor: Kevin F. Carr
  • Patent number: 5519534
    Abstract: A irradiation attachment for an optical fiber which provides an output of light that has a highly uniform intensity. The device includes a hollow spherical shell having a diffusive reflective surface or target supported therein. Light is directed into the hollow spherical shell so that it reflects off the diffusive reflective surface or target. The reflected light is internally reflected off the inner surface of the hollow spherical shell several times before passing through an output aperture. As a result of the internal reflection within the hollow spherical shell, the light leaving the device has a highly uniform intensity. The device is particularly useful for photodynamic therapy.
    Type: Grant
    Filed: May 25, 1994
    Date of Patent: May 21, 1996
    Assignee: The Government of the United States of America as represented by the Secretary of the Department of Health and Human Services
    Inventors: Paul D. Smith, John Cole, Frank Harrington, Eric F. Bernstein
  • Patent number: 5517315
    Abstract: A reflectometer wherein a light having a predetermined wavelength is projected into an integrating sphere containing a sample whose reflectance is to be measured. As the projected light strikes the sample, rays are reflected back the walls of the integrating sphere; some of which strike the area within the field-of-view of a concentrator. The rays striking within the field-of-view of the concentrator are focused upon a detector element which allows one to determine the reflectance of the sample. A control means is utilized to control the wavelength of the projected light through a spectrophotometer, and calculate the reflectance of the sample.
    Type: Grant
    Filed: October 29, 1993
    Date of Patent: May 14, 1996
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventors: Keith A. Snail, Roy Schiff, David B. Chenault, Leonard M. Hanssen
  • Patent number: 5491336
    Abstract: An arrangement for illuminating documents in a document-processing system wherein a large number of documents are rapidly and continuously transported past one or more imaging stations, each station having, for illumination, an integrating structure which houses one or more cylindrical, integrating Lambertian reflecting/diffusing cavities, each cavity having one or more like light sources, so that each cavity generates and projects a highly intense, highly uniform and highly diffuse beam of illumination, while incorporating imaging camera means and optical guide means to couple the illumination beam to the face of the documents at the imaging station and to couple the image of the document to the imaging camera.
    Type: Grant
    Filed: December 22, 1993
    Date of Patent: February 13, 1996
    Assignee: Unisys Corporation
    Inventors: David J. Concannon, Gary B. Copenhaver, Johan P. Bakker, Clive E. Catchpole, John D. Vala
  • Patent number: 5488473
    Abstract: A technique and apparatus for increased sensitivity fluorescence and luminescence emission measurements in which the emission volume is enclosed in a closely fitting cavity having highly reflecting diffuse material inner walls, and with a detector viewing as much of the radiant cavity walls as possible.
    Type: Grant
    Filed: March 1, 1994
    Date of Patent: January 30, 1996
    Assignee: Labsphere, Inc.
    Inventors: Arthur W. Springsteen, Jeffrey L. Taylor
  • Patent number: 5479009
    Abstract: This invention involves a novel egg-shaped hollow dual-compound conical light-ray concentrator with mirror-like inner walls (preferably tandem substantially inverted paraboloidal and ellipsoidal conical sections) for receiving light through one aperture end, as from an integrating sphere, and concentrating and collecting the rays within said walls and directing them to a detector at an opposite aperture end. This construction attains both high collection efficiency and hemispherical angular response.
    Type: Grant
    Filed: August 12, 1994
    Date of Patent: December 26, 1995
    Assignee: Labsphere, Inc.
    Inventors: Joseph W. Jablonski, Kevin F. Carr
  • Patent number: 5471053
    Abstract: A light collector for use with a photodetector that provides uniform photodetector output response over a polar angular range regardless of the polar angle of incidence of light upon the collector is disclosed. The light collector comprises a generally spheroidally-shaped light direction changer having a light diffusing surface, and a generally spheroidally-shaped polar attenuator. The geometric center of the photosensitive surface of the photodetector is adjacent to the vertex of the generally spheroidally-shaped light direction changer.
    Type: Grant
    Filed: June 24, 1994
    Date of Patent: November 28, 1995
    Assignee: E. I. Du Pont de Nemours and Company
    Inventors: Bruce A. Diner, Steven Gutteridge, Gary L. Peterson, William E. Wolf
  • Patent number: 5430540
    Abstract: A luminous flux measuring apparatus includes an integrating hemisphere which has a hemisphere shape and an inner wall. The inner wall has a light diffusing material applied thereto. A flat mirror is installed to cover the first opening of integrating hemisphere. A second opening is located at the center of the flat mirror and the window has the same configuration of longitudinal cross section of the illuminant to be measured. A light detector which has a light-intercepting window is located inside the integrating hemisphere. Finally, the flux measuring apparatus includes a means for holding the illuminant in the window of the mirror at the center of curvature of the integrating hemisphere.
    Type: Grant
    Filed: November 8, 1993
    Date of Patent: July 4, 1995
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventor: Kazuaki Ohkubo
  • Patent number: 5408312
    Abstract: A device for the qualitative and/or quantitative determination of the composition of a sample to be analyzed. The device includes at least one hollow body which is coated on the inside with an optically reflecting material or is composed completely of an optically reflecting material, and which is provided with at least one aperture. At least one radiation detector is provided proximate to the hollow body in the interior of the hollow body or in the vicinity of the hollow body. At least one ATR (Attenuated Total Reflection) element covers the at least one aperture of the hollow body, and the sample which is to be analyzed is disposed at the side of the ATR element turned away from the hollow body. At least one primary radiation source provides radiation which is received by the ATR element without directly entering the hollow body.
    Type: Grant
    Filed: March 22, 1993
    Date of Patent: April 18, 1995
    Assignee: Kim Yoon-Ok
    Inventors: Ralph H. Pries, Dae-Jin Yoon, Kim Yoon-Ok
  • Patent number: 5399877
    Abstract: An area detection device for use with X-ray or ultraviolet radiation wherein light from an integrating device is passed through an optical fiber to fall on a phosphor-containing film which is capable of storing a diffraction pattern formed by the transmission of X-rays or ultraviolet radiation through a sample when the diffraction pattern is projected onto the film and also being capable of fluorescing in correspondence to the diffraction pattern. Fluoresced light from the film is directed back along the fiber and into the integrating device and is fed from the integrating device to a photomultiplier which sends a signal from which the diffraction pattern can be detected.
    Type: Grant
    Filed: May 6, 1994
    Date of Patent: March 21, 1995
    Assignee: The United States of America as represented by the Administrator of the National Aeronautice and Space Administration
    Inventors: Daniel C. Carter, Diana L. Hecht, William K. Witherow
  • Patent number: 5384641
    Abstract: In the disclosed invention, a device for measuring optical properties of samples has an integrating sphere having an aperture for the placement of the sample and multiple apertures to take in light from light sources, as well as multiple light sources for illuminating the inside of said integrating sphere. As described above, by means of illumination with multiple light sources, errors due to unevenness in luminous intensity of the illuminating light do not occur, and accurate optical measurement of the sample is made possible.
    Type: Grant
    Filed: July 28, 1993
    Date of Patent: January 24, 1995
    Assignee: Minolta Co., Ltd.
    Inventor: Kenji Imura
  • Patent number: 5369481
    Abstract: A portable spectrophotometer includes a small-diameter optical sphere as well as optical detectors and signal processing and display circuitry which allows the instrument to be taken to an object to be measured and which provides a readout of color values at the portable instrument. The instrument is capable of providing specular-included and specular-excluded color readings simultaneously. The interior of the integrating sphere is coated with a highly reflective, color-absorbing material, and light from an incandescent lamp is diffused within the sphere prior to reaching the object to be measured. The sphere is provided with a first aperture which receives spectrally-included light and which is positioned to absorb a spectral component of the diffused source light. A second aperture positioned at a corresponding angular position with respect to the object measures specular-excluded light, excluding the specular component absorbed by the first aperture.
    Type: Grant
    Filed: May 8, 1992
    Date of Patent: November 29, 1994
    Assignee: X-Rite, Incorporated
    Inventors: Bernard J. Berg, Thomas J. Boes, Mark A. Cargill, Patrick S. Rood
  • Patent number: 5359406
    Abstract: A luminous flux measuring apparatus for measuring a spectral radiant flux or a total flux of a lamp includes an integrating sphere having a light sensing window defined therein, a spectrometer for measuring light transmitted through the light sensing window, a spectral radiant flux operation unit, and a total flux operation unit. When a standard lamp is lightened inside the integrating sphere, the output I.sub.std0 (.lambda.) of the spectrometer is measured. Thereafter, the I.sub.std1 (.lambda.) of the spectrometer is measured with a light absorption sheet placed inside the integrating sphere. Likewise, the outputs I.sub.m0 (.lambda.) and I.sub.m1 (.lambda.) of the spectrometer are measured with the light absorption sheet placed inside the integrating sphere and with no light-absorption means placed inside the integrating sphere, respectively. Upon input of I.sub.std0 (.lambda.), I.sub.std1 (.lambda.), I.sub.m0 (.lambda.), and I.sub.m1 (.lambda.
    Type: Grant
    Filed: May 14, 1993
    Date of Patent: October 25, 1994
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventor: Kenichi Suzuki
  • Patent number: 5332904
    Abstract: A broadband radiometer including (a) an optical integrating sphere having a enerally spherical integrating chamber and an entry port for receiving light (e.g., having visible and ultraviolet fractions), (b) a first optical radiation detector for receiving light from the sphere and producing an electrical output signal corresponding to broadband radiation, (c) a second optical radiation detector for receiving light from the sphere and producing an electrical output signal corresponding to a predetermined wavelength fraction of the broadband radiation, and (d) an output for producing an electrical signal which is proportional to the difference between the two electrical output signals. The radiometer is very useful, for example, in measuring the absolute amount of ultraviolet light present in a given light sample.
    Type: Grant
    Filed: October 28, 1992
    Date of Patent: July 26, 1994
    Assignee: The United States of America as represented by the Department of Energy
    Inventor: Theodore W. Cannon
  • Patent number: 5317378
    Abstract: A spherical sample cell (FIG. 4A) bears an external inwardly specular laye defining a hollow imaging mirror 11D and an optical aperture 11E. The mirror acts as an integrator of both the exciting radiation for irradiating the sample and the resulting excited radiation to be analysed, the former entering and the latter exiting through the aperture 11E. Optical integration resulting from multiple internal reflections provides multifold increase in excited radiation compared with bare cells, which is of particular advantage in Raman spectrophotometry. Alternatively, the mirror may be provided in two complementary halves in a two-part cell-holder, in which case any conventional sample cell that fits within the mirror may be used. Spectrophotometers adapted for use with the sample cell or the cell holder as well as methods based on them are described.
    Type: Grant
    Filed: February 15, 1991
    Date of Patent: May 31, 1994
    Assignee: Perkin-Elmer Ltd.
    Inventors: Henry M. Mould, Robert Bennett