With Comparison To Master, Desired Shape, Or Reference Voltage Patents (Class 356/394)
  • Patent number: 11029605
    Abstract: A method for improving a lithographic process for imaging a portion of a design layout onto a substrate using a lithographic apparatus, the method including: obtaining a first source of the lithographic apparatus; classifying the first source into a class among a plurality of possible classes, based on one or more numerical characteristics of the first source, using a machine learning model, by a computer; determining whether the class is among one or more predetermined classes; only when the class is among the one or more predetermined classes, adjusting one or more source design variables to obtain a second source.
    Type: Grant
    Filed: July 31, 2019
    Date of Patent: June 8, 2021
    Assignee: ASML Netherlands B.V.
    Inventor: Xiaofeng Liu
  • Patent number: 10955363
    Abstract: A soldering quality detection platform comprises a 2D image acquisition device adapted to acquire a 2D image of a soldered region of a soldered product, a 3D image acquisition device adapted to acquire a 3D image of the soldered region of the soldered product, and a judgment device. The judgment device is adapted to determine whether a soldering quality is qualified based on the 2D image and the 3D image of the soldered region of the soldered product.
    Type: Grant
    Filed: February 22, 2019
    Date of Patent: March 23, 2021
    Assignees: Tyco Electronics (Shanghai) Co. Ltd., Tyco Electronics (Dongguan) Ltd., TE Connectivity Corporation
    Inventors: Lei Zhou, Dandan Zhang, Roberto Francisco-Yi Lu, Hongzhou Shen, Jian Zeng
  • Patent number: 10906072
    Abstract: An inspection device for inspecting a cable end of a cable, with and without a connected crimp contact, includes a mirror arrangement having a central axis along which the cable end can be arranged for inspection. The mirror arrangement includes a plurality of mirrors arranged at a predetermined angle to one another and at a predetermined angle to the central axis, each mirror viewing the cable end from a different angle. The inspection device includes a camera for generating images of the cable end from the different viewing angles of the mirrors. A transparent disk is arranged between the camera and the mirror arrangement to prevent dirt and/or dust from moving from the mirror arrangement to the camera. A compressed air cleaning device cleans the disk and/or the mirrors with compressed air ejected along the disk and/or along at least a part of the mirrors.
    Type: Grant
    Filed: July 31, 2019
    Date of Patent: February 2, 2021
    Assignee: KOMAX HOLDING AG
    Inventors: Adrian Gisler, Markus Kiser, Martin Stocker
  • Patent number: 10885622
    Abstract: A system and method for using images from a commodity camera for object scanning, reverse engineering, metrology, assembly, and analysis are disclosed. A particular embodiment includes a mobile imaging system to: enable a user to align an object to be analyzed on a turntable with a stencil; issue commands, by use of a data processor, to the turntable for automatic rotation of the turntable and the object thereon to a particular orientation for a camera of a mobile imaging device; capture a plurality of images of the object being analyzed at different automatic rotations of the turntable; upload the plurality of images of the object to a server via a network interface and a data network; and cause the server to generate a three dimensional (3D) model of the object from the plurality of images of the object.
    Type: Grant
    Filed: June 29, 2018
    Date of Patent: January 5, 2021
    Assignee: Photogauge, Inc.
    Inventors: Sankara J. Subramanian, Azhar H. Khan, Sameer Sharma, Arunachalam Muthukaruppan
  • Patent number: 10866091
    Abstract: A concentricity detection system is adapted to detect a concentricity of an annular component. The concentricity detection system includes a support base having a recess on a top surface, a transparent plate received and positioned in the recess, a vision detection device located above the support base and facing the transparent plate, and a backlight source located below the support base and facing the transparent plate. The annular component is disposed in the recess of the support base and supported on a top surface of the transparent plate. The vision detection device is configured to detect the concentricity of the annular component supported on the transparent plate. A through hole is formed in a bottom portion of the recess and a light from the backlight source passes through the support base via the through hole and the transparent plate to provide backlighting for the annular component.
    Type: Grant
    Filed: August 29, 2019
    Date of Patent: December 15, 2020
    Assignees: Tyco Electronics (Shanghai) Co. Ltd., TE Connectivity Corporation
    Inventors: Lei Zhou, Dandan Zhang, Roberto Francisco-Yi Lu
  • Patent number: 10776950
    Abstract: An alignment system for an imaging sensor of a coordinate measuring machine incorporates a reference surface associated with a stage of the measuring machine but instead of imaging the reference surface as a location marker, the reference surface is incorporated into a combined imaging system together with the imaging sensor for imaging a feature associated with the imaging sensor. The imaged feature can be an internal part of the imaging sensor, such as an internal aperture, or an external feature in a fixed relationship with the imaging sensor, such as a lens hood.
    Type: Grant
    Filed: February 19, 2019
    Date of Patent: September 15, 2020
    Inventor: Eric G. Gesner
  • Patent number: 10755405
    Abstract: Methods and systems for diagnosing a semiconductor wafer are provided. A first raw image, a second raw image, and a third raw image of the semiconductor wafer are obtained by an inspection apparatus according to graphic data system (GDS) information regarding layout of a target die. A first image-based comparison is performed by a determining circuitry on the first, second, and third raw images, so as to provide a comparison result. The comparison result indicates whether an image difference is present between the first, second, and third raw images.
    Type: Grant
    Filed: March 13, 2018
    Date of Patent: August 25, 2020
    Inventors: Yen-Liang Chen, Jun-Xiu Liu
  • Patent number: 10748308
    Abstract: A three-dimensional image reconstruction method, in which a cross section preparation step includes: a specimen preparation step of attaching, on a surface of a specimen, a grid-like mark member in which rectangular openings are two-dimensionally arranged, and disposing the grid-like mark member under a shielding member so that a side of each of the rectangular openings of the grid-like mark member forms a 45-degree or 90-degree angle with respect to a direction in which a linear end edge of the shielding member extends; and a processing position determination step of adjusting relative positions of the shielding member and the grid-like mark member by using the grid-like mark member as an index of a processing position.
    Type: Grant
    Filed: August 17, 2018
    Date of Patent: August 18, 2020
    Assignee: JEOL Ltd.
    Inventors: Yusuke Uetake, Shunsuke Asahina, Yuuki Yamaguchi
  • Patent number: 10539514
    Abstract: A method of inspecting a substrate to be repeatedly treated along a predetermined transfer way in a plurality of kinds of different treatment apparatuses, includes: imaging a substrate that has been treated in one of the treatment apparatuses, to acquire a first substrate image; imaging a substrate that has been an object for imaging the first substrate image and further treated in another treatment apparatus different from the one treatment apparatus after treated in the one treatment apparatus, to acquire a second substrate image; then performing defect inspection, based on the first substrate image and the second substrate image; and identifying, depending on whether or not a defect detected from the second substrate image is not detected from the first substrate image, whether or not the defect is caused by a treatment after the first substrate image is acquired and a treatment before the second substrate image is acquired.
    Type: Grant
    Filed: May 13, 2016
    Date of Patent: January 21, 2020
    Assignee: Tokyo Electron Limited
    Inventors: Takuya Mori, Makoto Hayakawa
  • Patent number: 10496950
    Abstract: Various embodiments provide a service cycle management system for intelligently evaluating one or more parameters of a reverse service cycle loop within a supply chain management infrastructure. The system comprises one or more processors configured to: receive the real-time data comprising one or more parameters associated with execution of one or more service tasks; retrieve the simulation data from the one or more memory storage areas; dynamically compare one or more parameters within the real-time data against corresponding one or more parameters within the simulation data to identify one or more discrepancies there-between; in response to identifying one or more discrepancies, and generating one or more representations thereof, so as to inform one or more users of the system of one or more areas for focusing future initiatives. Associated computer program products and computer implemented methods are also provided.
    Type: Grant
    Filed: February 17, 2014
    Date of Patent: December 3, 2019
    Assignee: United Parcel Service of America, Inc.
    Inventor: Carrie Parris
  • Patent number: 10495256
    Abstract: The present invention relates to an access control system for the monitoring of the access of objects to a monitored zone and comprises at least one first optoelectronic sensor that is configured for the recognition of a penetration of an object into the monitored zone; at least one second optoelectronic sensor that is configured for the spatially resolving monitoring of a forefield disposed in front of the monitored zone; and an evaluation unit that is in signal communication with the first and second sensors, with the evaluation unit being configured to trigger a safety function on the penetration of an object into the monitored zone and being configured to suppress the safety function when the penetrating object is classified as a permitted object.
    Type: Grant
    Filed: May 14, 2018
    Date of Patent: December 3, 2019
    Assignee: SICK AG
    Inventor: Frank Böhler
  • Patent number: 10491873
    Abstract: A scanning observation apparatus (10) deflects illumination light with an actuator (25) through an illumination optical system (26) to scan an object (32), subjects light from the object (32) to photoelectric conversion with an optical detector (44), performs processing with an image processor (46), and displays an image of the object (32) on a display (60). A memory (35) stores information on optical characteristics related to chromatic aberration of magnification of the illumination optical system (26) relative to light of predetermined colors. A scanning pattern calculator (45) calculates a scanning pattern, on the object (32), of light of each color using the information. Using the scanning pattern, the image processor (46) calibrates a plot position yielded by a photoelectric conversion signal from the optical detector (44) for light of each color and generates an image of the object (32), thereby more easily correcting the chromatic aberration of magnification.
    Type: Grant
    Filed: September 15, 2017
    Date of Patent: November 26, 2019
    Inventors: Junichi Nishimura, Atsuyoshi Shimamoto
  • Patent number: 10481375
    Abstract: Disclosed is an optical arrangement providing selective plane illumination, including an inverted illumination objective mounted below a sample support in use providing a line or plane of light at the sample support, and at least one image collection objective mounted above the support, said inverted illumination objective having an illumination objective optic axis, and said image collection objective having an image collection objective optical axis, wherein illumination light is arranged to propagate toward the illumination objective lateral offset to the illumination objective optical axis such that the illumination light leaving the illumination objective propagates toward the sample support at an oblique angle relative to the illumination objective optical axis, and wherein the image objective optical axis has an angle ? which is obtuse to the illumination objective optical axis and generally perpendicular to light propagating at the sample support.
    Type: Grant
    Filed: December 8, 2015
    Date of Patent: November 19, 2019
    Assignee: GE Healthcare Bio-Sciences Corp.
    Inventor: Jeremy R. Cooper
  • Patent number: 10467582
    Abstract: A merchandise information system and printing method is disclosed that allows for retail merchandise information to be printed in a web format and separated into merchandise information strips to be wound around a core or self-wound. The wound merchandise information is customized to be printed and wound in an order that corresponds to the layout of a retail establishment. The wound merchandise information is shipped to the retail establishment in wound form and can be easily applied to the shelves within the retail establishment.
    Type: Grant
    Filed: March 10, 2009
    Date of Patent: November 5, 2019
    Inventor: Phillip J Wheeler
  • Patent number: 10449624
    Abstract: Methods and systems for manufacturing a three-dimensional product. Fabrication of a three-dimensional part from a powder spread over a work table as a powder bed can be initiated. The fabrication process can be paused to cool down the work table to room temperature to obtain access to the three-dimensional part for post-processing operations such as, for example, embedding external artifacts. Fabrication can continue by preheating the powder rather than the work table until fabrication of the three-dimensional part is complete. A damaged part may be placed within the powder bed, wherein the fabrication process can be directly initiated to achieve part repair. Additionally, a material of the same part's composition can be used or a different material utilized to render the part better than new. Access to the three-dimensional part allows embedding of a foreign object in the three-dimensional part within the powder bed while the three-dimensional part remains non-finished.
    Type: Grant
    Filed: September 30, 2016
    Date of Patent: October 22, 2019
    Assignee: Board of Regents, The University of Texas System
    Inventors: Jorge Mireles, Mohammad Hossain, Ryan Wicker
  • Patent number: 10444740
    Abstract: Disclosed is a panel sorting device which includes a placement rack, an alignment device, and a classification robotic arm. The placement rack has multiple layers. In each layer of the placement rack, at least one panel is placed according to a predetermined sequence and corresponding position. The alignment device is configured to obtain the positional deviation of the panel moved on a production line. The classification robotic arm is configured to correct the panel position in the placement rack based on the positional deviation acquired by the alignment device, and place the panel in the corresponding layer of the placement rack according to the predetermined sequence and position. The panel sorting device can quickly grab the panel and automatically sort the panels according to the product's specifications. As a result, it can increase demand for automated handling and production yield, and reduce costs and save installation space.
    Type: Grant
    Filed: October 27, 2017
    Date of Patent: October 15, 2019
    Inventors: Peilin Wu, Zhiming Li, Xiangwei Lou
  • Patent number: 10444255
    Abstract: A method for determining the velocity of a moving fluid surface, which comprises the following steps S1 to S5: S1) taking a sequence of images of the moving fluid surface by at least one camera; S2) comparing a first image from the sequence with a second image from the sequence in order to distinguish moving patterns of the fluid surface from non-moving parts and to obtain a first processed image (im_1f) comprising the moving patterns; S3) comparing a third image from the sequence with a fourth image from the sequence in order to distinguish moving patterns of the fluid surface from non-moving parts and to obtain a second processed image (im_2f) comprising the moving patterns; S4) comparing the first and second processed images in order to determine the spatial displacements of the moving patterns; and S5) determining from the spatial displacements the velocity.
    Type: Grant
    Filed: November 2, 2015
    Date of Patent: October 15, 2019
    Assignee: PHOTRACK AG
    Inventors: Beat Lüthi, Thomas Philippe, Salvador Peña-Haro
  • Patent number: 10408640
    Abstract: A magnetometric sensor includes a plurality of magnetometric sensor elements each including a plurality of magneto-sensitive portions arranged, in each of fan-shaped magneto-sensitive regions, intersecting with a radial direction of the magneto-sensitive regions. The magnetometric sensor elements are configured such that the magneto-sensitive regions are arranged rotated at 90° intervals and a bridge circuit is formed by electrically connecting the magnetometric sensor elements to each other. The magneto-sensitive portions each have a shape defined enclosed by two arcs to have a same width such that a resistance value thereof varies according to a change in a direction of a magnetic field.
    Type: Grant
    Filed: November 20, 2017
    Date of Patent: September 10, 2019
    Inventor: Yoshihiko Sato
  • Patent number: 10386468
    Abstract: Provided is a photographing apparatus and photographing method. The photographing apparatus includes a fish eye lens; a plurality of light emitters disposed around the fish eye lens and configured to emit light at different angles with respect to an optical axis of the fish eye lens; and an image sensor configured to receive the light emitted from the plurality of light emitters and reflected by at least one object, and convert the light into an electric signal including depth information about the object.
    Type: Grant
    Filed: August 20, 2015
    Date of Patent: August 20, 2019
    Assignee: HANWHA TECHWIN CO., LTD.
    Inventors: Yeongeol Ryu, Youngmin Baek
  • Patent number: 10360692
    Abstract: The wood tracking system for a production line generally has a wood product optimizer; a wood product trimmer downstream from the optimizer in the production line; a conveyor for moving wood products from the optimizer to the trimmer and across a handling area therebetween, the optimizer being configured to scan each of the wood products in a given order and to generate optimization data for each wood product; and a computer vision system positioned proximate the handling area along the production line, the computer vision system having a camera, a processor in communication with the optimizer and with the trimmer and a computer-readable memory for storing the optimization data, the processor being configured to acquire images of the handling area from the camera, the processor being configured to associate the optimization data of a given wood product across each of the images until it arrives at the trimmer.
    Type: Grant
    Filed: November 5, 2018
    Date of Patent: July 23, 2019
    Inventors: Marc Voyer, Marc-Antoine Paquet
  • Patent number: 10295479
    Abstract: A board inspection apparatus is disclosed, which includes one surface-side irradiator that irradiates a first area on a surface side of a board with first light, a surface-side camera that takes an image of the first area, one rear face-side irradiator that irradiates a second area on a rear face side of the board with second light, a rear face-side camera that takes an image of the second area; and a controller that inspects the first area based on image data obtained from the surface-side camera and the second area based on image data obtained from the rear face-side camera.
    Type: Grant
    Filed: December 21, 2016
    Date of Patent: May 21, 2019
    Assignee: CKD Corporation
    Inventors: Nobuyuki Umemura, Akira Kato, Tsuyoshi Ohyama, Norihiko Sakaida
  • Patent number: 10209698
    Abstract: A calibration method applicable for an automation machining apparatus includes building a first stereoscopic characteristic model corresponding to an object, obtaining a stereoscopic image of the object, building a second stereoscopic characteristic model corresponding to the object based on the stereoscopic image, obtaining at least one error parameter corresponding to the second stereoscopic characteristic model by comparing the second stereoscopic characteristic model with the first stereoscopic characteristic model, and calibrating a machining parameter of the automation machining apparatus based on the at least one error parameter.
    Type: Grant
    Filed: April 24, 2015
    Date of Patent: February 19, 2019
    Inventors: Chung-Li Tai, Yao-Yang Tsai, Jay Huang, Ko-Shyang Wang, Chih-Kai Chiu
  • Patent number: 10200146
    Abstract: The present disclosure provides a data transmission method including: receiving a first-mode optical signal from a first port corresponding to a first port number; converting, according to a correspondence between the first port number and a first mode group number, the received first-mode optical signal into a second-mode optical signal carried in a first mode group identified by the first mode group number, where the second-mode optical signal carried in the first mode group identified by the first mode group number includes an optical signal in one or more modes; and outputting the second-mode optical signal obtained by means of conversion.
    Type: Grant
    Filed: June 29, 2017
    Date of Patent: February 5, 2019
    Assignee: Huawei Technologies Co., Ltd.
    Inventors: Jinrong Yin, Weiyang Wang
  • Patent number: 10168284
    Abstract: A method of analyzing a sample to be tested to determine the presence of or to quantify an analyte in the sample, employing a reaction which produces a reaction medium derived from the sample and which possesses fluorescence properties, the reaction medium being located within a well, the reaction medium and the well forming an analysis assembly which possesses fluorescent properties in response to illumination by a light source producing a light signal, the light source being movable along a surface S1 of the well.
    Type: Grant
    Filed: December 23, 2013
    Date of Patent: January 1, 2019
    Assignee: Biomerieux
    Inventors: Bruno Colin, Laurent Drazek, Frédéric Pinston
  • Patent number: 10163771
    Abstract: In a particular aspect, a device includes a substrate including at least one through-substrate via. A metal structure is disposed on a surface of the substrate. The device further includes a semiconductor layer bonded to the substrate. The semiconductor layer includes at least one complimentary metal-oxide-semiconductor (CMOS) transistor and a metal disposed within a second via. The metal is in direct contact with the metal structure.
    Type: Grant
    Filed: August 8, 2016
    Date of Patent: December 25, 2018
    Assignee: QUALCOMM Incorporated
    Inventors: Chengjie Zuo, Changhan Hobie Yun, David Francis Berdy, Niranjan Sunil Mudakatte, Mario Francisco Velez, Shiqun Gu, Jonghae Kim
  • Patent number: 10151985
    Abstract: A method including determining one or more statistical features from data obtained from a lithography process, a lithography apparatus, a substrate processed by the lithography process or the lithography apparatus, wherein determining the one or more statistical features does not include reconstructing a characteristic of the lithography process, of the lithography apparatus, or of the substrate.
    Type: Grant
    Filed: December 13, 2016
    Date of Patent: December 11, 2018
    Assignee: ASML Netherlands B.V.
    Inventors: Remco Dirks, Seyed Iman Mossavat, Hugo Augustinus Joseph Cramer
  • Patent number: 10127646
    Abstract: Provided is an apparatus for measuring a quality of a holographic image. The apparatus includes: a hologram image reconstruction unit configured to perform a hologram image; a superimposed focus image generation unit configured to collect an area that is in focus from reconstructed images and superimpose into a single image; and a hologram image quality measurement unit configured to perform an image quality evaluation for the superimposed focus image.
    Type: Grant
    Filed: July 26, 2016
    Date of Patent: November 13, 2018
    Inventors: Kwan Jung Oh, Hyon Gon Choo, Jin Woong Kim
  • Patent number: 10089680
    Abstract: Image of a subject is received along with viewable representations of a user selected wearable object having a respective size indicative of physical dimensions of the wearable object. The physical proportions of the subject are determined and a display is generated that shows how the wearable object having a respective size will look when worn by the subject having the determined physical proportions.
    Type: Grant
    Filed: March 12, 2013
    Date of Patent: October 2, 2018
    Assignee: EXALIBUR IP, LLC
    Inventors: Shih-Chiang Lin, Shu-Fang Hsiao
  • Patent number: 9970753
    Abstract: A system includes a light emitting unit, a front mirror, a rear mirror, an imaging unit and a processor. The light emitting unit is configured to emit a collimated light beam. The front mirror is configured to reflect part of the collimated light beam to produce and project a front focused ring of structured light to an object to obtain a front reflected ring of light, and configured to allow part of the collimated light beam to pass by. The rear mirror is positioned downstream of a light transmitting path of the front mirror. The rear mirror is configured to reflect at least part of the collimated light beam passing by the front mirror to produce and project a rear focused ring of the structured light to the object to obtain a rear reflected ring of light.
    Type: Grant
    Filed: September 24, 2015
    Date of Patent: May 15, 2018
    Inventors: Xu Han, Guangping Xie, Kevin George Harding, John Brandon Laflen
  • Patent number: 9933370
    Abstract: When a size of a block on a wafer is equal to or smaller than an optical resolution of imaging optics, room for improvement in a signal-to-noise ratio has not been sufficiently considered in a conventional technique. One feature of the defect determination of the present invention is to include a filter processing for setting a predetermined partial area serving as a predetermined matrix for a first difference image, scanning the first difference image in the partial area, and outputting a second difference image, and a first threshold processing using a first threshold value for the second difference image. As a result, highly sensitive defect detection can be achieved.
    Type: Grant
    Filed: October 16, 2014
    Date of Patent: April 3, 2018
    Inventors: Masaaki Ito, Hisashi Hatano
  • Patent number: 9879982
    Abstract: The invention is directed to a method for measuring an internal thread of a workpiece with a coordinate measuring apparatus and a CCD or CMOS sensor. The sensor records at least two images of a section of the internal thread and the recording conditions for the two images are modified. The data from these two recorded images are used to establish the position, orientation, core diameter and/or the pitch of the internal thread. The invention is also directed to an arrangement for measuring an internal thread of a workpiece and includes a coordinate measuring apparatus and the CCD or CMOS sensor in accordance with the above method.
    Type: Grant
    Filed: March 11, 2016
    Date of Patent: January 30, 2018
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventors: Frank Hoeller, Bernd Spruck
  • Patent number: 9870669
    Abstract: A security device for verifying an authenticity of a security doc-ument comprises an at least partially transparent multilayer substrate with a first surface and a second surface. A first pattern is arranged on the first surface. This first pattern is derivable using a first seed pattern. A second pattern is arranged on the second surface. This second pattern is derivable using a second seed pattern. The security device furthermore comprises a third pattern arranged between a first and a second substrate layer. The third pattern is derivable using an inversion of the first pattern, an inversion of the second pattern, and a non-inverted third seed pattern. Transmit lances and reflectivities of the patterns are selected such that in a reflection viewing mode, only the first or second seed pattern is visible, respectively. In a transmission viewing mode, only the third seed pattern is visible.
    Type: Grant
    Filed: April 24, 2014
    Date of Patent: January 16, 2018
    Inventor: Sylvain Chosson
  • Patent number: 9714904
    Abstract: A light-emitting structure includes two outer shells configured to be joined together to cooperatively define a receiving space therein, a connecting assembly configured to join the two outer shells together, and two light-emitting assemblies coupled to the connecting assembly and configured to emit light inside the receiving space. The two outer shells define a number of viewing holes therein for viewing inside the receiving space. The light-emitting assemblies shine light from a number of different angles inside the receiving space.
    Type: Grant
    Filed: June 8, 2015
    Date of Patent: July 25, 2017
    Assignees: Fu Tai Hua Industry (Shenzhen) Co., Ltd., HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Chih-Kuang Chang, Li Jiang, Dong-Hai Li, Jian-Hua Liu, Dong-Sheng Liu
  • Patent number: 9595091
    Abstract: A method for classification includes receiving an image of an area of a semiconductor wafer on which a pattern has been formed, the area containing a location of interest. At least one value for one or more attributes of the location of interest are computed based upon topographical features of the location of interest in a three-dimensional (3D) map of the area.
    Type: Grant
    Filed: April 19, 2012
    Date of Patent: March 14, 2017
    Assignee: Applied Materials Israel, Ltd.
    Inventors: Idan Kaizerman, Ishai Schwarzband, Efrat Rozenman
  • Patent number: 9586367
    Abstract: A method is provided for the non-contact measurement of variations in thickness of composite materials and structures prepared from composite parts. Metrologic methods are employed to provide a 3D image of the structure or part. Variations that are greater than an acceptable amount can be corrected by adding a compensation layer to the surface of the structure or part.
    Type: Grant
    Filed: November 4, 2008
    Date of Patent: March 7, 2017
    Inventors: Jeffrey T. Drewett, Paul T. Briney, Grady L. White, Gary L. Kelly, Michael L. Hestness, Todd H. Ashton, Peter L. Morken
  • Patent number: 9580932
    Abstract: A key assembly is disclosed. The key assembly may have a blade with a head portion, a shank, and a transition region connecting the head portion to the shank. The key assembly may also have a head configured to receive the blade. The head may have a shoulder located at the transition region to limit engagement of the head with the blade, and at least one tang located at an end of the head opposite the shoulder. The at least one tang may be configured to engage a recess located within a side of the head portion and inhibit removal of the head from the blade.
    Type: Grant
    Filed: December 15, 2015
    Date of Patent: February 28, 2017
    Assignee: The Hillman Group, Inc.
    Inventors: Phillip Gerlings, Michael James Schmidt, Gary Edward Will, Bryan K. Solace
  • Patent number: 9500470
    Abstract: An apparatus and a method for measuring quality of a holographic image are disclosed. The apparatus for measuring the quality of the holographic image may include an obtaining unit to obtain a hologram, a reconstruction unit to reconstruct a three-dimensional (3D) holographic image by irradiating the hologram with a light source, a measuring unit to measure depth of the reconstructed holographic image, and an analysis unit to analyze depth representation quality of the holographic image base on the measured depth of the holographic image.
    Type: Grant
    Filed: May 5, 2015
    Date of Patent: November 22, 2016
    Assignee: Electronics and Telecommunications Research Institute
    Inventors: Soo Hyun Lee, Je Ho Nam, Jin Woong Kim, Kyung Ae Moon, Eun Young Jang
  • Patent number: 9497394
    Abstract: A thermal imaging device includes an optical module gathering infrared radiation of a circuit board and correspondingly providing infrared light, a photo sensor converting the infrared light into a first electrical signal, a processor, and a thermal imaging control system having one or more programs stored in a storage and executed by the processor. The system includes an image processing unit converting the first electrical signal into a thermal image signal, a comparing unit comparing the thermal image signal with circuit diagram of the circuit board to determine at least one abnormal temperature element, and a display control unit controlling a screen to display a thermal image of the circuit board together with a label comprising at least one name of the at least one abnormal temperature element on the screen.
    Type: Grant
    Filed: April 25, 2013
    Date of Patent: November 15, 2016
    Assignees: Fu Tai Hua Industry (Shenzhen) Co., Ltd., HON HAI PRECISION INDUSTRY CO., LTD.
    Inventor: Yang Xin
  • Patent number: 9491448
    Abstract: Systems and methods for measuring a surface of an object. The system, in one embodiment, includes a laser projector device mounted at a fixed location relative to an object being formed by a fabrication process, and a videogrammetry device mounted at another fixed location relative to the object. The laser projector device includes a laser element mounted on a two-axis gimbal assembly, and the gimbal assembly directs laser beams from the laser element onto target points on a surface of the object. The laser projector device measures angles of the laser beams to the target points, while the videogrammetry device simultaneously performs measurements of the target points by capturing video images of the laser beams reflecting off of the target points. A controller processes the measurements from the laser projector device and the videogrammetry device to calculate x, y, z coordinates of the target points in a 3D coordinate system.
    Type: Grant
    Filed: April 1, 2013
    Date of Patent: November 8, 2016
    Assignee: The Boeing Company
    Inventors: William D. Sherman, Mitchell Voth, Jonathan Saint Clair
  • Patent number: 9454702
    Abstract: In one embodiment, a processor can receive data representing a view reflected by a mirror of a plurality of mirrors. The plurality of mirrors may be configured in a space to reflect a plurality of views of structures in the space. The mirror of the plurality of mirrors may include a uniquely identifiable feature distinguishable from other objects in the space. The processor can identify the mirror of the plurality of mirrors according to the uniquely identifiable feature. The processor can also determine an attribute of the structures according to the identified mirror and the data representing the view reflected by the mirror.
    Type: Grant
    Filed: August 15, 2013
    Date of Patent: September 27, 2016
    Assignee: Cisco Technology, Inc.
    Inventors: Mainak Sen, Debojyoti Dutta, Shaun Kirby
  • Patent number: 9427187
    Abstract: A system for analyzing at least one characteristic of the skin (1) and by extension hair, via optics (7, 4) and image processing (4, 5) elements notably include a consumer electronics device (4). The method for analyzing at least one characteristic of the skin notably includes a step wherein at least one digital image is acquired via a consumer electronics device. According to a first aspect, the method notably aims at applications in the field of cosmetics or that of skin cancer screening, and according to a second aspect in the field of assisting with diagnosis of allergies.
    Type: Grant
    Filed: June 30, 2011
    Date of Patent: August 30, 2016
    Assignee: L'OREAL
    Inventor: Jerome Gilbert
  • Patent number: 9349572
    Abstract: An energy dispersive X-ray analyzer is attached to a scanning electron microscope and includes: a SEM controller; a detector; an EDS controller; and a data processor. The data processor generates first and second X-ray mapping image respectively when the SEM controller controls the scanning electron microscope to irradiate the sample with an electron beam under first and second acceleration voltage conditions. The data processor corrects the first X-ray mapping image and the second X-ray mapping image into images that are independent of acceleration voltage condition based on a measurement intensity variation ratio of the X-ray when changed from the first acceleration voltage condition to the second acceleration voltage condition, and controls the display unit to display a difference image between the corrected first X-ray mapping image and the corrected second X-ray mapping image.
    Type: Grant
    Filed: March 20, 2015
    Date of Patent: May 24, 2016
    Assignee: Hitachi High-Tech Science Corporation
    Inventor: Yutaka Ikku
  • Patent number: 9340304
    Abstract: A method and apparatus for comparing aircraft parts. A first model is identified for a first aircraft for assembly. A second model is identified for a second aircraft that has been assembled. First parts for the aircraft in the first model are compared with second parts for the second aircraft in the second model. Graphical representations of the first parts and the second parts are displayed illustrating a difference between the first parts and the second parts from a comparison of the first parts and the second parts.
    Type: Grant
    Filed: April 10, 2013
    Date of Patent: May 17, 2016
    Inventors: Christopher J. Senesac, Ralph P. Heinefield, Michael Honea
  • Patent number: 9332246
    Abstract: A time of flight, TOF, camera unit for an optical surveillance system and an optical surveillance system comprising such a TOF camera is disclosed. The TOF camera unit comprises a radiation emitting unit for illuminating a surveillance area defined by a first plane, a radiation detecting unit for receiving radiation reflected from said surveillance area and for generating a three-dimensional image from said detected radiation, and at least one mirror for at least partly deflecting said emitted radiation into at least one second plane extending across to said first plane and for deflecting the radiation reflected from said second plane to the radiation detecting unit. The TOF camera and the at least one mirror may be arranged on a common carrier element.
    Type: Grant
    Filed: October 23, 2014
    Date of Patent: May 3, 2016
    Assignee: Rockwell Automation Safety AG
    Inventor: Carl Meinherz
  • Patent number: 9319612
    Abstract: An imager may include an array of pixels. The pixel array may be arranged in rows and columns. Each pixel of the pixel array may include a photodiode that is coupled to a floating diffusion region by a transfer gate. A source-follower transistor may be coupled between the floating diffusion region and a pixel output node. The imager may include ramp circuitry that provides a ramp signal to the floating diffusion region. A capacitor interposed between the ramp circuitry and the floating diffusion region may be used in conveying the ramp signal to the floating diffusion region. The pixel may be coupled to a comparator that is implemented using separate circuitry or may include portions of the pixel.
    Type: Grant
    Filed: August 14, 2013
    Date of Patent: April 19, 2016
    Inventors: Hai Yan, Kwang-bo Cho
  • Patent number: 9279774
    Abstract: Systems configured to inspect a wafer are provided. One system includes an illumination subsystem configured to simultaneously form multiple illumination areas on the wafer with substantially no illumination flux between each of the areas. The system also includes a scanning subsystem configured to scan the multiple illumination areas across the wafer. In addition, the system includes a collection subsystem configured to simultaneously and separately image light scattered from each of the areas onto two or more sensors. Characteristics of the two or more sensors are selected such that the scattered light is not imaged into gaps between the two or more sensors. The two or more sensors generate output responsive to the scattered light. The system further includes a computer subsystem configured to detect defects on the wafer using the output of the two or more sensors.
    Type: Grant
    Filed: July 9, 2012
    Date of Patent: March 8, 2016
    Assignee: KLA-Tencor Corp.
    Inventors: Anatoly Romanovsky, Ivan Maleev, Daniel Kavaldjiev, Yury Yuditsky, Dirk Woll, Stephen Biellak, Mehdi Vaez-Iravani, Guoheng Zhao
  • Patent number: 9170503
    Abstract: A method and apparatus for inspection and review of defects is disclosed wherein data gathering is improved. In one embodiment, multiple or segmented detectors are used in a particle beam system.
    Type: Grant
    Filed: October 4, 2006
    Date of Patent: October 27, 2015
    Assignee: KLA-Tencor Corporation
    Inventors: David Adler, Kirk Bertsche, Mark McCord, Stuart Friedman
  • Patent number: 9062966
    Abstract: In order to inspect a three dimensional shape, a predetermined inspection target component formed on a board is selected as the measurement target, a shape of the inspection target component is acquired, a reference point of the inspection target component is detected, relative location information of a polarity mark formed on the inspection target component with respect to the reference point is acquired, and it is judged whether the inspection target component is good or bad by checking whether the polarity mark exists or not by using the relative location information with respect to the reference point. Thus, the location of the polarity mark may be accurately known, and polarity inspection may be more easily and accurately performed.
    Type: Grant
    Filed: January 31, 2011
    Date of Patent: June 23, 2015
    Inventor: Joong-Ki Jeong
  • Patent number: 9046355
    Abstract: A measuring apparatus includes a projection control unit configured to cause a projection unit to project, onto an object, a first light pattern with light and dark portions, a second light pattern, which is smaller in distance between the light and dark portions than that of the first light pattern and has a boundary position between the light and dark portions common to the first light pattern, and a third light pattern in which the light and dark portions of the second light pattern are reversed to each other, an acquisition unit configured to acquire a first captured image of the object onto which the first light pattern is projected, a second captured image of the object onto which the second light pattern is projected, and a third captured image of the object onto which the third light pattern is projected, and a calculation unit configured to calculate the boundary position between the light and dark portions of the first captured image based on the second and the third captured image to measure the po
    Type: Grant
    Filed: July 28, 2010
    Date of Patent: June 2, 2015
    Assignee: Canon Kabushiki Kaisha
    Inventors: Shiki Takabayashi, Hiroshi Yoshikawa
  • Patent number: 9002094
    Abstract: A reference image to serve as a reference for a non-defective determination is previously stored in association with identification information for identifying an inspection object. An image of the inspection object is displayed side by side with the reference image of corresponding identification information. A drawn position of the reference image and a drawn position of the acquired image are aligned, adjustment is made so as to make brightness of the reference image coincide with brightness of the acquired image, and adjustment is made so as to make a focus on the reference image coincide with a focus on the acquired image. Adjustment is made so as to make a focus of the reference image coincide with a focus of the acquired image.
    Type: Grant
    Filed: November 26, 2012
    Date of Patent: April 7, 2015
    Assignee: Kenyence Corporation
    Inventor: Aruto Hirota