With Comparison To Master, Desired Shape, Or Reference Voltage Patents (Class 356/394)
  • Patent number: 10408640
    Abstract: A magnetometric sensor includes a plurality of magnetometric sensor elements each including a plurality of magneto-sensitive portions arranged, in each of fan-shaped magneto-sensitive regions, intersecting with a radial direction of the magneto-sensitive regions. The magnetometric sensor elements are configured such that the magneto-sensitive regions are arranged rotated at 90° intervals and a bridge circuit is formed by electrically connecting the magnetometric sensor elements to each other. The magneto-sensitive portions each have a shape defined enclosed by two arcs to have a same width such that a resistance value thereof varies according to a change in a direction of a magnetic field.
    Type: Grant
    Filed: November 20, 2017
    Date of Patent: September 10, 2019
    Assignee: KABUSHIKI KAISHA TOKAI RIKA DENKI SEISAKUSHO
    Inventor: Yoshihiko Sato
  • Patent number: 10386468
    Abstract: Provided is a photographing apparatus and photographing method. The photographing apparatus includes a fish eye lens; a plurality of light emitters disposed around the fish eye lens and configured to emit light at different angles with respect to an optical axis of the fish eye lens; and an image sensor configured to receive the light emitted from the plurality of light emitters and reflected by at least one object, and convert the light into an electric signal including depth information about the object.
    Type: Grant
    Filed: August 20, 2015
    Date of Patent: August 20, 2019
    Assignee: HANWHA TECHWIN CO., LTD.
    Inventors: Yeongeol Ryu, Youngmin Baek
  • Patent number: 10360692
    Abstract: The wood tracking system for a production line generally has a wood product optimizer; a wood product trimmer downstream from the optimizer in the production line; a conveyor for moving wood products from the optimizer to the trimmer and across a handling area therebetween, the optimizer being configured to scan each of the wood products in a given order and to generate optimization data for each wood product; and a computer vision system positioned proximate the handling area along the production line, the computer vision system having a camera, a processor in communication with the optimizer and with the trimmer and a computer-readable memory for storing the optimization data, the processor being configured to acquire images of the handling area from the camera, the processor being configured to associate the optimization data of a given wood product across each of the images until it arrives at the trimmer.
    Type: Grant
    Filed: November 5, 2018
    Date of Patent: July 23, 2019
    Assignee: TIMBER TECHNOLOGY INC.
    Inventors: Marc Voyer, Marc-Antoine Paquet
  • Patent number: 10295479
    Abstract: A board inspection apparatus is disclosed, which includes one surface-side irradiator that irradiates a first area on a surface side of a board with first light, a surface-side camera that takes an image of the first area, one rear face-side irradiator that irradiates a second area on a rear face side of the board with second light, a rear face-side camera that takes an image of the second area; and a controller that inspects the first area based on image data obtained from the surface-side camera and the second area based on image data obtained from the rear face-side camera.
    Type: Grant
    Filed: December 21, 2016
    Date of Patent: May 21, 2019
    Assignee: CKD Corporation
    Inventors: Nobuyuki Umemura, Akira Kato, Tsuyoshi Ohyama, Norihiko Sakaida
  • Patent number: 10209698
    Abstract: A calibration method applicable for an automation machining apparatus includes building a first stereoscopic characteristic model corresponding to an object, obtaining a stereoscopic image of the object, building a second stereoscopic characteristic model corresponding to the object based on the stereoscopic image, obtaining at least one error parameter corresponding to the second stereoscopic characteristic model by comparing the second stereoscopic characteristic model with the first stereoscopic characteristic model, and calibrating a machining parameter of the automation machining apparatus based on the at least one error parameter.
    Type: Grant
    Filed: April 24, 2015
    Date of Patent: February 19, 2019
    Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Chung-Li Tai, Yao-Yang Tsai, Jay Huang, Ko-Shyang Wang, Chih-Kai Chiu
  • Patent number: 10200146
    Abstract: The present disclosure provides a data transmission method including: receiving a first-mode optical signal from a first port corresponding to a first port number; converting, according to a correspondence between the first port number and a first mode group number, the received first-mode optical signal into a second-mode optical signal carried in a first mode group identified by the first mode group number, where the second-mode optical signal carried in the first mode group identified by the first mode group number includes an optical signal in one or more modes; and outputting the second-mode optical signal obtained by means of conversion.
    Type: Grant
    Filed: June 29, 2017
    Date of Patent: February 5, 2019
    Assignee: Huawei Technologies Co., Ltd.
    Inventors: Jinrong Yin, Weiyang Wang
  • Patent number: 10168284
    Abstract: A method of analyzing a sample to be tested to determine the presence of or to quantify an analyte in the sample, employing a reaction which produces a reaction medium derived from the sample and which possesses fluorescence properties, the reaction medium being located within a well, the reaction medium and the well forming an analysis assembly which possesses fluorescent properties in response to illumination by a light source producing a light signal, the light source being movable along a surface S1 of the well.
    Type: Grant
    Filed: December 23, 2013
    Date of Patent: January 1, 2019
    Assignee: Biomerieux
    Inventors: Bruno Colin, Laurent Drazek, Frédéric Pinston
  • Patent number: 10163771
    Abstract: In a particular aspect, a device includes a substrate including at least one through-substrate via. A metal structure is disposed on a surface of the substrate. The device further includes a semiconductor layer bonded to the substrate. The semiconductor layer includes at least one complimentary metal-oxide-semiconductor (CMOS) transistor and a metal disposed within a second via. The metal is in direct contact with the metal structure.
    Type: Grant
    Filed: August 8, 2016
    Date of Patent: December 25, 2018
    Assignee: QUALCOMM Incorporated
    Inventors: Chengjie Zuo, Changhan Hobie Yun, David Francis Berdy, Niranjan Sunil Mudakatte, Mario Francisco Velez, Shiqun Gu, Jonghae Kim
  • Patent number: 10151985
    Abstract: A method including determining one or more statistical features from data obtained from a lithography process, a lithography apparatus, a substrate processed by the lithography process or the lithography apparatus, wherein determining the one or more statistical features does not include reconstructing a characteristic of the lithography process, of the lithography apparatus, or of the substrate.
    Type: Grant
    Filed: December 13, 2016
    Date of Patent: December 11, 2018
    Assignee: ASML Netherlands B.V.
    Inventors: Remco Dirks, Seyed Iman Mossavat, Hugo Augustinus Joseph Cramer
  • Patent number: 10127646
    Abstract: Provided is an apparatus for measuring a quality of a holographic image. The apparatus includes: a hologram image reconstruction unit configured to perform a hologram image; a superimposed focus image generation unit configured to collect an area that is in focus from reconstructed images and superimpose into a single image; and a hologram image quality measurement unit configured to perform an image quality evaluation for the superimposed focus image.
    Type: Grant
    Filed: July 26, 2016
    Date of Patent: November 13, 2018
    Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
    Inventors: Kwan Jung Oh, Hyon Gon Choo, Jin Woong Kim
  • Patent number: 10089680
    Abstract: Image of a subject is received along with viewable representations of a user selected wearable object having a respective size indicative of physical dimensions of the wearable object. The physical proportions of the subject are determined and a display is generated that shows how the wearable object having a respective size will look when worn by the subject having the determined physical proportions.
    Type: Grant
    Filed: March 12, 2013
    Date of Patent: October 2, 2018
    Assignee: EXALIBUR IP, LLC
    Inventors: Shih-Chiang Lin, Shu-Fang Hsiao
  • Patent number: 9970753
    Abstract: A system includes a light emitting unit, a front mirror, a rear mirror, an imaging unit and a processor. The light emitting unit is configured to emit a collimated light beam. The front mirror is configured to reflect part of the collimated light beam to produce and project a front focused ring of structured light to an object to obtain a front reflected ring of light, and configured to allow part of the collimated light beam to pass by. The rear mirror is positioned downstream of a light transmitting path of the front mirror. The rear mirror is configured to reflect at least part of the collimated light beam passing by the front mirror to produce and project a rear focused ring of the structured light to the object to obtain a rear reflected ring of light.
    Type: Grant
    Filed: September 24, 2015
    Date of Patent: May 15, 2018
    Assignee: GENERAL ELECTRIC COMPANY
    Inventors: Xu Han, Guangping Xie, Kevin George Harding, John Brandon Laflen
  • Patent number: 9933370
    Abstract: When a size of a block on a wafer is equal to or smaller than an optical resolution of imaging optics, room for improvement in a signal-to-noise ratio has not been sufficiently considered in a conventional technique. One feature of the defect determination of the present invention is to include a filter processing for setting a predetermined partial area serving as a predetermined matrix for a first difference image, scanning the first difference image in the partial area, and outputting a second difference image, and a first threshold processing using a first threshold value for the second difference image. As a result, highly sensitive defect detection can be achieved.
    Type: Grant
    Filed: October 16, 2014
    Date of Patent: April 3, 2018
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Masaaki Ito, Hisashi Hatano
  • Patent number: 9879982
    Abstract: The invention is directed to a method for measuring an internal thread of a workpiece with a coordinate measuring apparatus and a CCD or CMOS sensor. The sensor records at least two images of a section of the internal thread and the recording conditions for the two images are modified. The data from these two recorded images are used to establish the position, orientation, core diameter and/or the pitch of the internal thread. The invention is also directed to an arrangement for measuring an internal thread of a workpiece and includes a coordinate measuring apparatus and the CCD or CMOS sensor in accordance with the above method.
    Type: Grant
    Filed: March 11, 2016
    Date of Patent: January 30, 2018
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventors: Frank Hoeller, Bernd Spruck
  • Patent number: 9870669
    Abstract: A security device for verifying an authenticity of a security doc-ument comprises an at least partially transparent multilayer substrate with a first surface and a second surface. A first pattern is arranged on the first surface. This first pattern is derivable using a first seed pattern. A second pattern is arranged on the second surface. This second pattern is derivable using a second seed pattern. The security device furthermore comprises a third pattern arranged between a first and a second substrate layer. The third pattern is derivable using an inversion of the first pattern, an inversion of the second pattern, and a non-inverted third seed pattern. Transmit lances and reflectivities of the patterns are selected such that in a reflection viewing mode, only the first or second seed pattern is visible, respectively. In a transmission viewing mode, only the third seed pattern is visible.
    Type: Grant
    Filed: April 24, 2014
    Date of Patent: January 16, 2018
    Assignee: ORELL FÜSSLI SICHERHEITSDRUCK AG
    Inventor: Sylvain Chosson
  • Patent number: 9714904
    Abstract: A light-emitting structure includes two outer shells configured to be joined together to cooperatively define a receiving space therein, a connecting assembly configured to join the two outer shells together, and two light-emitting assemblies coupled to the connecting assembly and configured to emit light inside the receiving space. The two outer shells define a number of viewing holes therein for viewing inside the receiving space. The light-emitting assemblies shine light from a number of different angles inside the receiving space.
    Type: Grant
    Filed: June 8, 2015
    Date of Patent: July 25, 2017
    Assignees: Fu Tai Hua Industry (Shenzhen) Co., Ltd., HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Chih-Kuang Chang, Li Jiang, Dong-Hai Li, Jian-Hua Liu, Dong-Sheng Liu
  • Patent number: 9595091
    Abstract: A method for classification includes receiving an image of an area of a semiconductor wafer on which a pattern has been formed, the area containing a location of interest. At least one value for one or more attributes of the location of interest are computed based upon topographical features of the location of interest in a three-dimensional (3D) map of the area.
    Type: Grant
    Filed: April 19, 2012
    Date of Patent: March 14, 2017
    Assignee: Applied Materials Israel, Ltd.
    Inventors: Idan Kaizerman, Ishai Schwarzband, Efrat Rozenman
  • Patent number: 9586367
    Abstract: A method is provided for the non-contact measurement of variations in thickness of composite materials and structures prepared from composite parts. Metrologic methods are employed to provide a 3D image of the structure or part. Variations that are greater than an acceptable amount can be corrected by adding a compensation layer to the surface of the structure or part.
    Type: Grant
    Filed: November 4, 2008
    Date of Patent: March 7, 2017
    Assignee: LOCKHEED MARTIN CORPORATION
    Inventors: Jeffrey T. Drewett, Paul T. Briney, Grady L. White, Gary L. Kelly, Michael L. Hestness, Todd H. Ashton, Peter L. Morken
  • Patent number: 9580932
    Abstract: A key assembly is disclosed. The key assembly may have a blade with a head portion, a shank, and a transition region connecting the head portion to the shank. The key assembly may also have a head configured to receive the blade. The head may have a shoulder located at the transition region to limit engagement of the head with the blade, and at least one tang located at an end of the head opposite the shoulder. The at least one tang may be configured to engage a recess located within a side of the head portion and inhibit removal of the head from the blade.
    Type: Grant
    Filed: December 15, 2015
    Date of Patent: February 28, 2017
    Assignee: The Hillman Group, Inc.
    Inventors: Phillip Gerlings, Michael James Schmidt, Gary Edward Will, Bryan K. Solace
  • Patent number: 9500470
    Abstract: An apparatus and a method for measuring quality of a holographic image are disclosed. The apparatus for measuring the quality of the holographic image may include an obtaining unit to obtain a hologram, a reconstruction unit to reconstruct a three-dimensional (3D) holographic image by irradiating the hologram with a light source, a measuring unit to measure depth of the reconstructed holographic image, and an analysis unit to analyze depth representation quality of the holographic image base on the measured depth of the holographic image.
    Type: Grant
    Filed: May 5, 2015
    Date of Patent: November 22, 2016
    Assignee: Electronics and Telecommunications Research Institute
    Inventors: Soo Hyun Lee, Je Ho Nam, Jin Woong Kim, Kyung Ae Moon, Eun Young Jang
  • Patent number: 9497394
    Abstract: A thermal imaging device includes an optical module gathering infrared radiation of a circuit board and correspondingly providing infrared light, a photo sensor converting the infrared light into a first electrical signal, a processor, and a thermal imaging control system having one or more programs stored in a storage and executed by the processor. The system includes an image processing unit converting the first electrical signal into a thermal image signal, a comparing unit comparing the thermal image signal with circuit diagram of the circuit board to determine at least one abnormal temperature element, and a display control unit controlling a screen to display a thermal image of the circuit board together with a label comprising at least one name of the at least one abnormal temperature element on the screen.
    Type: Grant
    Filed: April 25, 2013
    Date of Patent: November 15, 2016
    Assignees: Fu Tai Hua Industry (Shenzhen) Co., Ltd., HON HAI PRECISION INDUSTRY CO., LTD.
    Inventor: Yang Xin
  • Patent number: 9491448
    Abstract: Systems and methods for measuring a surface of an object. The system, in one embodiment, includes a laser projector device mounted at a fixed location relative to an object being formed by a fabrication process, and a videogrammetry device mounted at another fixed location relative to the object. The laser projector device includes a laser element mounted on a two-axis gimbal assembly, and the gimbal assembly directs laser beams from the laser element onto target points on a surface of the object. The laser projector device measures angles of the laser beams to the target points, while the videogrammetry device simultaneously performs measurements of the target points by capturing video images of the laser beams reflecting off of the target points. A controller processes the measurements from the laser projector device and the videogrammetry device to calculate x, y, z coordinates of the target points in a 3D coordinate system.
    Type: Grant
    Filed: April 1, 2013
    Date of Patent: November 8, 2016
    Assignee: The Boeing Company
    Inventors: William D. Sherman, Mitchell Voth, Jonathan Saint Clair
  • Patent number: 9454702
    Abstract: In one embodiment, a processor can receive data representing a view reflected by a mirror of a plurality of mirrors. The plurality of mirrors may be configured in a space to reflect a plurality of views of structures in the space. The mirror of the plurality of mirrors may include a uniquely identifiable feature distinguishable from other objects in the space. The processor can identify the mirror of the plurality of mirrors according to the uniquely identifiable feature. The processor can also determine an attribute of the structures according to the identified mirror and the data representing the view reflected by the mirror.
    Type: Grant
    Filed: August 15, 2013
    Date of Patent: September 27, 2016
    Assignee: Cisco Technology, Inc.
    Inventors: Mainak Sen, Debojyoti Dutta, Shaun Kirby
  • Patent number: 9427187
    Abstract: A system for analyzing at least one characteristic of the skin (1) and by extension hair, via optics (7, 4) and image processing (4, 5) elements notably include a consumer electronics device (4). The method for analyzing at least one characteristic of the skin notably includes a step wherein at least one digital image is acquired via a consumer electronics device. According to a first aspect, the method notably aims at applications in the field of cosmetics or that of skin cancer screening, and according to a second aspect in the field of assisting with diagnosis of allergies.
    Type: Grant
    Filed: June 30, 2011
    Date of Patent: August 30, 2016
    Assignee: L'OREAL
    Inventor: Jerome Gilbert
  • Patent number: 9349572
    Abstract: An energy dispersive X-ray analyzer is attached to a scanning electron microscope and includes: a SEM controller; a detector; an EDS controller; and a data processor. The data processor generates first and second X-ray mapping image respectively when the SEM controller controls the scanning electron microscope to irradiate the sample with an electron beam under first and second acceleration voltage conditions. The data processor corrects the first X-ray mapping image and the second X-ray mapping image into images that are independent of acceleration voltage condition based on a measurement intensity variation ratio of the X-ray when changed from the first acceleration voltage condition to the second acceleration voltage condition, and controls the display unit to display a difference image between the corrected first X-ray mapping image and the corrected second X-ray mapping image.
    Type: Grant
    Filed: March 20, 2015
    Date of Patent: May 24, 2016
    Assignee: Hitachi High-Tech Science Corporation
    Inventor: Yutaka Ikku
  • Patent number: 9340304
    Abstract: A method and apparatus for comparing aircraft parts. A first model is identified for a first aircraft for assembly. A second model is identified for a second aircraft that has been assembled. First parts for the aircraft in the first model are compared with second parts for the second aircraft in the second model. Graphical representations of the first parts and the second parts are displayed illustrating a difference between the first parts and the second parts from a comparison of the first parts and the second parts.
    Type: Grant
    Filed: April 10, 2013
    Date of Patent: May 17, 2016
    Assignee: THE BOEING COMPANY
    Inventors: Christopher J. Senesac, Ralph P. Heinefield, Michael Honea
  • Patent number: 9332246
    Abstract: A time of flight, TOF, camera unit for an optical surveillance system and an optical surveillance system comprising such a TOF camera is disclosed. The TOF camera unit comprises a radiation emitting unit for illuminating a surveillance area defined by a first plane, a radiation detecting unit for receiving radiation reflected from said surveillance area and for generating a three-dimensional image from said detected radiation, and at least one mirror for at least partly deflecting said emitted radiation into at least one second plane extending across to said first plane and for deflecting the radiation reflected from said second plane to the radiation detecting unit. The TOF camera and the at least one mirror may be arranged on a common carrier element.
    Type: Grant
    Filed: October 23, 2014
    Date of Patent: May 3, 2016
    Assignee: Rockwell Automation Safety AG
    Inventor: Carl Meinherz
  • Patent number: 9319612
    Abstract: An imager may include an array of pixels. The pixel array may be arranged in rows and columns. Each pixel of the pixel array may include a photodiode that is coupled to a floating diffusion region by a transfer gate. A source-follower transistor may be coupled between the floating diffusion region and a pixel output node. The imager may include ramp circuitry that provides a ramp signal to the floating diffusion region. A capacitor interposed between the ramp circuitry and the floating diffusion region may be used in conveying the ramp signal to the floating diffusion region. The pixel may be coupled to a comparator that is implemented using separate circuitry or may include portions of the pixel.
    Type: Grant
    Filed: August 14, 2013
    Date of Patent: April 19, 2016
    Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
    Inventors: Hai Yan, Kwang-bo Cho
  • Patent number: 9279774
    Abstract: Systems configured to inspect a wafer are provided. One system includes an illumination subsystem configured to simultaneously form multiple illumination areas on the wafer with substantially no illumination flux between each of the areas. The system also includes a scanning subsystem configured to scan the multiple illumination areas across the wafer. In addition, the system includes a collection subsystem configured to simultaneously and separately image light scattered from each of the areas onto two or more sensors. Characteristics of the two or more sensors are selected such that the scattered light is not imaged into gaps between the two or more sensors. The two or more sensors generate output responsive to the scattered light. The system further includes a computer subsystem configured to detect defects on the wafer using the output of the two or more sensors.
    Type: Grant
    Filed: July 9, 2012
    Date of Patent: March 8, 2016
    Assignee: KLA-Tencor Corp.
    Inventors: Anatoly Romanovsky, Ivan Maleev, Daniel Kavaldjiev, Yury Yuditsky, Dirk Woll, Stephen Biellak, Mehdi Vaez-Iravani, Guoheng Zhao
  • Patent number: 9170503
    Abstract: A method and apparatus for inspection and review of defects is disclosed wherein data gathering is improved. In one embodiment, multiple or segmented detectors are used in a particle beam system.
    Type: Grant
    Filed: October 4, 2006
    Date of Patent: October 27, 2015
    Assignee: KLA-Tencor Corporation
    Inventors: David Adler, Kirk Bertsche, Mark McCord, Stuart Friedman
  • Patent number: 9062966
    Abstract: In order to inspect a three dimensional shape, a predetermined inspection target component formed on a board is selected as the measurement target, a shape of the inspection target component is acquired, a reference point of the inspection target component is detected, relative location information of a polarity mark formed on the inspection target component with respect to the reference point is acquired, and it is judged whether the inspection target component is good or bad by checking whether the polarity mark exists or not by using the relative location information with respect to the reference point. Thus, the location of the polarity mark may be accurately known, and polarity inspection may be more easily and accurately performed.
    Type: Grant
    Filed: January 31, 2011
    Date of Patent: June 23, 2015
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventor: Joong-Ki Jeong
  • Patent number: 9046355
    Abstract: A measuring apparatus includes a projection control unit configured to cause a projection unit to project, onto an object, a first light pattern with light and dark portions, a second light pattern, which is smaller in distance between the light and dark portions than that of the first light pattern and has a boundary position between the light and dark portions common to the first light pattern, and a third light pattern in which the light and dark portions of the second light pattern are reversed to each other, an acquisition unit configured to acquire a first captured image of the object onto which the first light pattern is projected, a second captured image of the object onto which the second light pattern is projected, and a third captured image of the object onto which the third light pattern is projected, and a calculation unit configured to calculate the boundary position between the light and dark portions of the first captured image based on the second and the third captured image to measure the po
    Type: Grant
    Filed: July 28, 2010
    Date of Patent: June 2, 2015
    Assignee: Canon Kabushiki Kaisha
    Inventors: Shiki Takabayashi, Hiroshi Yoshikawa
  • Patent number: 9002094
    Abstract: A reference image to serve as a reference for a non-defective determination is previously stored in association with identification information for identifying an inspection object. An image of the inspection object is displayed side by side with the reference image of corresponding identification information. A drawn position of the reference image and a drawn position of the acquired image are aligned, adjustment is made so as to make brightness of the reference image coincide with brightness of the acquired image, and adjustment is made so as to make a focus on the reference image coincide with a focus on the acquired image. Adjustment is made so as to make a focus of the reference image coincide with a focus of the acquired image.
    Type: Grant
    Filed: November 26, 2012
    Date of Patent: April 7, 2015
    Assignee: Kenyence Corporation
    Inventor: Aruto Hirota
  • Patent number: 8913308
    Abstract: A light collecting member includes a lens to make incident light be collected on a light receiving member, a lens barrel to house the lens, an end portion into which a light enters of the lens barrel being arranged near the light receiving member and a fence member to cover the end portion into which a light enters of the lens barrel and the light receiving member, the fence member having an exhaust port formed in a manner extending in a vertical direction.
    Type: Grant
    Filed: August 5, 2013
    Date of Patent: December 16, 2014
    Assignees: NEC AccessTechnica, Ltd., NEC Engineering, Ltd.
    Inventors: Namie Sugiyama, Koushi Takano, Hiroyuki Okada
  • Patent number: 8879055
    Abstract: The field of view of an objective lens is divided into two areas, and a transmission image of a photomask and a composite image obtained by optically synthesizing a transmission image and a reflection image of the photomask are picked up in parallel. A drop image generated at an edge portion of a pattern portion in the composite image is deleted by limiter processing or masking processing, or is deleted by using primary-differentiated signals of a composite image signal and a transmission image signal.
    Type: Grant
    Filed: May 12, 2014
    Date of Patent: November 4, 2014
    Assignee: Lasertec Corporation
    Inventors: Hironobu Suzuki, Katsuyoshi Nakashima, Kazuhito Yamamoto
  • Patent number: 8723689
    Abstract: A system and a method for detecting availability of a parking space in a parking facility are provided. A first method has the steps of providing a lighting system having at least one visible-light source for illumination of at least part of the parking space. Providing an available space time-of-flight trace. Providing an availability threshold value. Illuminating the at least part of the parking space using the at least one visible-light source. Emitting a status visible-light signal from the visible-light source in the predetermined direction toward the predetermined target in the parking space. Capturing a status reflection trace at the visible-light source. Determining a time-of-flight difference value by comparing the status reflection trace to the available space time-of-flight trace. Comparing the time-of-flight difference value with the availability threshold value and determining a status of the parking space to be one of available and not available.
    Type: Grant
    Filed: December 19, 2008
    Date of Patent: May 13, 2014
    Assignee: Leddartech Inc.
    Inventor: Yvan Mimeault
  • Patent number: 8706300
    Abstract: A method of controlling a robot system includes the steps of providing a tool supported by a moveable mechanism of the robot system, providing a workpiece supported by a holder, generating an image of the workpiece, extracting a data from the image, the data relating to a feature of the workpiece, generating a continuous three-dimensional path along the workpiece using data extracted from the image, and moving the tool along the path.
    Type: Grant
    Filed: February 3, 2010
    Date of Patent: April 22, 2014
    Assignee: Fanuc Robotics America, Inc.
    Inventors: Ken Krause, Bruce E. Coldren, Edward Roney, Steven Prehn, Michael M. Sharpe, Claude Dinsmoor
  • Patent number: 8655616
    Abstract: The present invention discloses a system for testing illuminating elements and a method for testing illuminating elements, wherein the method includes the following steps. Firstly, an illuminating element and an unilluminated area on a circuit board are covered respectively. A reference voltage is obtained according to a brightness of the unilluminated area and a testing voltage is obtained according to a brightness of the illuminating element being driven. Afterwards, whether the illuminating element passes a testing process or not is judged from the reference voltage and the testing voltage.
    Type: Grant
    Filed: June 17, 2011
    Date of Patent: February 18, 2014
    Assignee: Primax Electronics Ltd.
    Inventor: Pei-Ming Chang
  • Patent number: 8643834
    Abstract: When size of a defect on an increasingly miniaturized pattern is obtained by defect inspection apparatus in the related art, a value is inconveniently given, which is different from a measured value of the same defect by SEM. Thus, a dimension value of a defect detected by defect inspection apparatus needs to be accurately calculated to be approximated to a value measured by SEM. To this end, size of the defect detected by the defect inspection apparatus is corrected depending on feature quantity or type of the defect, thereby defect size can be accurately calculated.
    Type: Grant
    Filed: October 9, 2012
    Date of Patent: February 4, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Akira Hamamatsu, Shunji Maeda, Hisae Shibuya
  • Patent number: 8575547
    Abstract: The present invention provides an electron beam measurement technique for measuring the shapes or sizes of portions of patterns on a sample, or detecting a defect or the like. An electron beam measurement apparatus has a unit for irradiating the patterns delineated on a substrate by a multi-exposure method, and classifying the patterns in an acquired image into multiple groups according to an exposure history record. The exposure history record is obtained based on brightness of the patterns and a difference between white bands of the patterns.
    Type: Grant
    Filed: December 30, 2010
    Date of Patent: November 5, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yasunari Sohda, Shoji Hotta, Shinji Okazaki, Muneyuki Fukuda
  • Patent number: 8532395
    Abstract: In one embodiment, a pattern inspection method is disclosed. The method can include predicting an edge shape at a given future time with respect to the same inspection target pattern, setting a threshold corresponding to a required specification of the inspection target pattern, and predicting the time when the inspection target pattern fails to meet the required specification from the predicted edge shape and the threshold. The method can further include taking a plurality of images concerning the inspection target pattern at different times by use of an imaging apparatus, detecting edges of the obtained images, respectively, matching the detected edges of different imaging times, and obtaining a difference between corresponding edges to generate a difference vector after the matching. The edge shape of the future time can be predicted based on the generated difference vector and an interval between the imaging times.
    Type: Grant
    Filed: January 26, 2011
    Date of Patent: September 10, 2013
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Tadashi Mitsui
  • Patent number: 8508710
    Abstract: In accordance with one embodiment of the present disclosure, a difference is detected between a first image and a second image. The second image can include at least a portion of the first image reflected from a display panel and light from an object passing through the display panel.
    Type: Grant
    Filed: December 2, 2004
    Date of Patent: August 13, 2013
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Wyatt A. Huddleston, Michael M. Blythe, Gregory W. Blythe
  • Patent number: 8466966
    Abstract: A video calibration device comprising an elongated image tube having a length, a first opening at one end of the image tube and a second opening at the opposite end of the image tube. The device includes an elongated sensor tube having a length, a first opening at one end of the sensor tube and a second opening at the opposite end of the sensor tube. The first opening of the sensor tube is adapted to support a video calibration sensor. A video calibration sensor is disposed in the first opening of the sensor tube. The sensor tube is sealingly secured to the image tube at an angle whereby the second opening of the sensor tube and the second opening of the image tube are substantially juxtaposed.
    Type: Grant
    Filed: March 11, 2010
    Date of Patent: June 18, 2013
    Inventor: Thomas E. Ciesco
  • Patent number: 8462328
    Abstract: A new architecture for machine vision system that uses area sensor (or line sensor), with telecentric imaging optics compound with telecentric illumination module is described. The illumination module may include a bright field illumination source and/or a dark field illumination source. The telecentric imaging optics includes an upper imaging module having an aperture stop and a lower imaging module positioned between the upper imaging module and object, such that the light source and the aperture stop are located in the back focal plane of the lower imaging module. The lower imaging module images the illumination source into a plane of an aperture stop of the upper imaging module. The optical axis of the upper imaging module is offset with respect to the lower imaging module. The optical axis of the telecentric illumination module is offset with respect to the axis of the lower imaging module in the opposite direction.
    Type: Grant
    Filed: July 21, 2009
    Date of Patent: June 11, 2013
    Assignee: Orbotech Ltd.
    Inventors: David Fisch, Yigal Katzir
  • Publication number: 20120320332
    Abstract: In one embodiment of the present invention a system is provided for allowing a consumer to easily match a suitable pair of primary eyeglasses with a suitable pair of auxiliary eyeglasses. In one example (which example is intended to be illustrative and not restrictive), the suitable pair of primary eyeglasses may be matched with the suitable pair of auxiliary eyeglasses without damaging or opening the package which contains the pair of auxiliary eyeglasses. In another example (which example is intended to be illustrative and not restrictive), the system may comprise a package and/or a displayer.
    Type: Application
    Filed: August 20, 2012
    Publication date: December 20, 2012
    Applicant: Contour Optik, Inc.
    Inventors: David Chao, Yu-Shun Lee
  • Patent number: 8310666
    Abstract: When size of a defect on an increasingly miniaturized pattern is obtained by defect inspection apparatus in the related art, a value is inconveniently given, which is different from a measured value of the same defect by SEM. Thus, a dimension value of a defect detected by defect inspection apparatus needs to be accurately calculated to be approximated to a value measured by SEM. To this end, size of the defect detected by the defect inspection apparatus is corrected depending on feature quantity or type of the defect, thereby defect size can be accurately calculated.
    Type: Grant
    Filed: May 26, 2011
    Date of Patent: November 13, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Akira Hamamatsu, Shunji Maeda, Hisae Shibuya
  • Patent number: 8305432
    Abstract: Scanning beam device calibration using a calibration pattern is disclosed. In one aspect, a method may include acquiring an image of a calibration pattern using a scanning beam device. The acquired image may be compared with a representation of the calibration pattern. The scanning beam device may be calibrated based on the comparison. Software and apparatus to perform these and other calibration methods are also disclosed.
    Type: Grant
    Filed: January 10, 2007
    Date of Patent: November 6, 2012
    Assignee: University of Washington
    Inventor: Richard S. Johnston
  • Patent number: 8279454
    Abstract: A method of measuring a length of sections of extrados or intrados curves of an elongated workpiece travelling in a bending machine along a forwarding direction, the elongated workpiece having cross-sections each of which is separated by a neutral axis in both an extended portion and a compressed portion when the elongated workpiece is subjected to bending, and at least a neutral cross-section, i.e. not subjected to bending, neutral cross-section beyond which the bending of the elongated workpiece begins along the forwarding direction thereof, provides a measuring instrument positioned so that it engages either an extrados or an intrados point of the elongated workpiece near the neutral cross-section, but displaced therefrom in the forwarding direction of the elongated workpiece. Further, a measuring instrument on a bending machine that embodies the method is described.
    Type: Grant
    Filed: August 5, 2010
    Date of Patent: October 2, 2012
    Assignee: CML International S.p.A.
    Inventors: Alessandro Caporusso, Silvio Rea
  • Patent number: 8184152
    Abstract: An apparatus for evaluating a part may include a camera, a camera-holding member for holding the camera in place relative to the part being evaluated, and an indexing surface disposed in a fixed position relative to the camera-holding member. The camera may be positioned to take a simultaneous picture of both the indexing surface and the part in order to evaluate the part using the picture by comparing an indexing surface image with a part image.
    Type: Grant
    Filed: December 1, 2008
    Date of Patent: May 22, 2012
    Assignee: The Boeing Company
    Inventors: John M. Pryor, David P. Banks, Stephen D. Friddell, Nancy J. McGinnis
  • Patent number: 8180143
    Abstract: A gear inspection system and method for a gearbox, wherein an image acquisition unit is oriented proximate the gearbox with a field of view of a section of the gears. The image acquisition unit obtains images of a gear tooth and corresponding contact pattern. In one embodiment a processing unit transforms the images to a gear tooth model so that the gear tooth image and contact pattern image matches the model gear tooth. Metrics are computed for the contact pattern, and based on threshold values, a determination is made as to whether the gearbox is acceptable.
    Type: Grant
    Filed: December 23, 2008
    Date of Patent: May 15, 2012
    Assignee: General Electric Company
    Inventors: Sheri George, Sivaramanivas Ramaswamy, Abhinav Ramnath Bajpai