Spectroscopy Patents (Class 356/451)
  • Publication number: 20140327914
    Abstract: A mechanism that allows for precise motion of the optics of an interferometer is comprised by two or more diaphragm flexures having high lateral stiffness, creating a superior performing Michelson interferometer. When coupled with precise precision control of a mirror surface and a reference laser, the above creates a superior performing Fourier transform spectrometer.
    Type: Application
    Filed: April 28, 2014
    Publication date: November 6, 2014
    Inventor: Richard Jackson
  • Publication number: 20140320863
    Abstract: A method for enhancing a sensitivity of an optical sensor having an optical cavity counter-propagates beams of pump light within the optical cavity to produce scattered light based on Stimulated Brullion Scattering (SBS). The properties of the pump light are selected to generate fast-light conditions for the scattered light, such that the scattered light includes counter-propagating beams of fast light. The method prevents the pump light from resonating within the optical cavity, while allowing the scattered light to resonate within the optical cavity. At least portions of the scattered light are interfered outside of the optical cavity to produce a beat note for a measurement of the optical sensor. The disclosed method is particularly applicable to optical gyroscopes.
    Type: Application
    Filed: April 25, 2014
    Publication date: October 30, 2014
    Inventors: Caleb A. Christensen, Anton Zavriyev
  • Patent number: 8873067
    Abstract: Provided herein is a TSV measuring interferometer that uses a variable field stop that adjusts such that a light is focused at an inlet and at a bottom surface of a TSV when measuring a diameter and depth of the TSV, thereby reducing a measurement time and result data, the interferometer also using a telecentric lens that adjusts the light injected into the TSV to be a straight line, so as to obtain a sufficient amount of light reaching the bottom surface to improve the accuracy of measurement even in a TSV having a large aspect ratio.
    Type: Grant
    Filed: April 13, 2012
    Date of Patent: October 28, 2014
    Assignee: Snu Precision Co., Ltd.
    Inventors: Ki Hun Lee, Heung Hyun Shin, Heui Jae Pahk
  • Publication number: 20140313514
    Abstract: A spectroscopic sensor 1 comprises an interference filter unit 20, having a cavity layer 21 and mirror layers 22, 23 opposing each other through the layer 21, for selectively transmitting therethrough light in a predetermined wavelength range according to an incident position thereof; a light-transmitting substrate 3, arranged on the layer 22 side, for transmitting therethrough light incident on the unit 20; and a light-detecting substrate 4, arranged on the layer 23 side, for detecting the light transmitted through the unit 20. The layer 21 has a filter region 24 held between the layers 22, 23; an annular surrounding region 25 surrounding the region 24 with a predetermined distance therefrom; and an annular connecting region 26 connecting an end part 24e on the substrate 4 side of the region 24 and an end part 25e on the substrate 4 side of the region 25 to each other.
    Type: Application
    Filed: September 10, 2012
    Publication date: October 23, 2014
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Katsumi Shibayama, Takashi Kasahara
  • Publication number: 20140307262
    Abstract: A system including an index assigning section estimating the thickness of a thin film based on the intensity of light reflected on a substrate and a theoretical formula expressing a relationship between the thickness of the thin film and the intensity of an interference light when the spectrum is obtained for the first time, and assigning indexes for each candidate value for the layer thickness; a layer thickness wide-range estimating section estimating the layer thickness within the range of the value of a layer thickness wide-range estimation width including the previously estimated value of the layer thickness based on the theoretical formula; a selecting section selecting an index from the indexes; a determining section determining a layer thickness wide-range estimation result; and a layer thickness determining section determining the thickness of the thin film based on the theoretical formula after calculating the layer thickness wide-range estimation result.
    Type: Application
    Filed: April 10, 2014
    Publication date: October 16, 2014
    Applicant: SHIMADZU CORPORATION
    Inventors: Rui KATO, Yuzo NAGUMO, Hiroomi GOTO
  • Publication number: 20140293288
    Abstract: A device for managing light pulses for measuring the reaction of a sample exposed to a first light pulse, the measurement being performed by analysis of a signal emitted by the sample subjected to a second light pulse, shifted with respect to the first pulse by a determined interval of time, the device including two optical detectors for detecting the pulses of two light beams emitted by two pulsed laser sources, respectively, each beam emitting pulses with respective repetition frequencies that are different, arbitrary and stable over a determined period in the direction of the sample; the detectors being connected to a computer for determining the interval of time between two pulses coming from the first and the second beam, respectively, and constituting the first and second pulses; the computer being connected to an analyzer for measuring the reaction of the sample having as input parameter the interval of time between the two pulses, where the computer uses an algorithm making use of the stability of the
    Type: Application
    Filed: June 28, 2012
    Publication date: October 2, 2014
    Applicant: ECOLE POLYTECHNIQUE / DGAR
    Inventors: Laura Antonucci, Adeline Bonvalet, Manuel Joffre, Xavier Solinas
  • Publication number: 20140268163
    Abstract: Embodiments of the invention include apparatus and methods of non-invasively detecting one or more constituents of a target using multiple wavelength photothermal optical coherence tomography.
    Type: Application
    Filed: November 30, 2011
    Publication date: September 18, 2014
    Inventors: Thomas E. Milner, Roman Kuranov, Timothy Duong
  • Publication number: 20140253923
    Abstract: A spectroscopic sensor 1 comprises an interference filter unit 20, having a cavity layer 21 and first and second mirror layers 22, 23 opposing each other through the cavity layer 21, for selectively transmitting therethrough light in a predetermined wavelength range according to an incident position thereof; a light-transmitting substrate 3, arranged on the first mirror layer 22 side, for transmitting therethrough light incident on the interference filter unit 20; a light-detecting substrate 4, arranged on the second mirror layer 23 side, for detecting the light transmitted through the interference filter unit 20; and a first coupling layer 11 arranged between the interference filter unit 20 and the light-transmitting substrate 3. The cavity layer 21 and the first coupling layer 11 are silicon oxide films.
    Type: Application
    Filed: September 10, 2012
    Publication date: September 11, 2014
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Katsumi Shibayama, Takashi Kasahara
  • Patent number: 8830474
    Abstract: A Fourier Transfer Infrared (FTIR) spectrophotometer having reduced baseline noise. The system and method include internal or external optical adapters having a moveable beamsplitter for splitting the source light beam into a reference beam and a sample beam, and may include a variable bandpass filter, variable preamplifier and reversed biased photodiodes.
    Type: Grant
    Filed: October 6, 2010
    Date of Patent: September 9, 2014
    Assignee: The Curators of the University of Missouri
    Inventor: Zhi Xu
  • Patent number: 8830475
    Abstract: Disclosed is an interferometer comprising a light source, a reflective element, and a photodetector. The light source is configured to emit a light beam, and an angle is formed by inclusion between a direction to which the light beam travels and the reflective element, the photodetector is configured to be substantially perpendicular to the reflective element. The light beam is halved into a first light beam propagating by the included angle, and a second light beam reflected off the reflective element, the first light beam and the second light beam interfere each other to form an interferogram on the photodetector, which detects the interferogram. By benefit of above, the interferometer does not need to reposition its parts in order to make adjustment to interferogram, thereby simplifying optical element setup and minimizing physical volume of the interferomger. Also disclosed is a spectrometer including the same interferometer and a Fourier-transform-capable analyzer.
    Type: Grant
    Filed: August 19, 2013
    Date of Patent: September 9, 2014
    Assignee: National Cheng Kung University
    Inventors: Wei-Chih Wang, Benjamin Estroff, Chih-Han Chang, Fong-Chin Su
  • Publication number: 20140247453
    Abstract: A broadband fiber optic sensor array is formed along a length of single mode optical fiber, with the individual sensing elements formed by introducing local perturbations (e.g., changes in diameter) along the length of the optical fiber. The sensor array requires only a single light source input and a single (conventional) optical spectrum analyzer output and is capable of providing individual measurements (such as local temperature or pressure) for each sensing element disposed along the length of fiber. The individual transmission spectra of the sensing elements forming the array are smooth and strongly overlap, and a method has been developed for determining the characteristics of the individual elements from the variations in the total (combined) transmission spectrum.
    Type: Application
    Filed: October 6, 2012
    Publication date: September 4, 2014
    Applicant: OFS Fitel, LLC
    Inventors: David J. DiGiovanni, Mikhail Sumetsky
  • Publication number: 20140240711
    Abstract: A spectrometry device includes a wavelength-tunable interference filter that is provided with a stationary reflection film, a movable reflection film and an electrostatic actuator which changes a gap dimension between the stationary reflection film and the movable reflection film; a detector that receives incident light; a filter control unit that sets the gap dimension between the stationary reflection film and the movable reflection film to be a first dimension corresponding to light having a first wavelength which is smaller than that of a measurement target wavelength region; a cutoff filter that cuts off the light having a wavelength which is smaller than that of the measurement target wavelength region; and a light quantity acquisition unit that acquires the light quantity of stray light received by the detector when the gap dimension is changed to be the first dimension.
    Type: Application
    Filed: February 24, 2014
    Publication date: August 28, 2014
    Applicant: Seiko Epson Corporation
    Inventor: Tomonori MATSUSHITA
  • Patent number: 8817269
    Abstract: An improved interferometer measurement system is presented. In a preferred embodiment, a chirped fiber Bragg grating is used as a reference surface in a Fizeau interferometer arrangement for optical coherence tomography imaging of the eye. The grating creates a virtual reference surface near the sample and allows for a relatively short reference arm while maintaining close to zero delay interference conditions.
    Type: Grant
    Filed: April 26, 2012
    Date of Patent: August 26, 2014
    Assignee: Carl Zeiss Meditec, Inc.
    Inventor: Alexandre R. Tumlinson
  • Patent number: 8786861
    Abstract: An optical device includes a telecentric optical system, a variable wavelength interference filter, and a detection section, the variable wavelength interference filter includes a first reflecting film, a second reflecting film provided to a movable section, and an electrostatic actuator adapted to displace the movable section, an effective measurement area capable of transmitting a light with a wavelength, which is within a predetermined allowable range centered on a measurement center wavelength when an amount of the displacement of the movable section takes a maximum displacement value, is set in the first reflecting film and the second reflecting film, and the telecentric optical system guides the incident light to the variable wavelength interference filter so that a principal ray of the incident light is parallel thereto and perpendicular to the first reflecting film, and at the same time, collects the incident light in the effective measurement area.
    Type: Grant
    Filed: September 21, 2011
    Date of Patent: July 22, 2014
    Assignee: Seiko Epson Corporation
    Inventor: Tatsuaki Funamoto
  • Publication number: 20140198310
    Abstract: A balanced-detection spectra domain optical coherence tomography system is disclosed. A light beam L emitting from the light source module is passed through the second beam splitter, the first beam splitter in series, and then split to the mirror and the sample respectively, and further simultaneously reflected to the first beam splitter, a light beam L1 and a light beam L2 are refracted by the first beam splitter and the second beam splitter respectively, and then transmitted to the first collimator and the second collimator respectively, and a phase difference between the light beam L1 and the light beam L2 is 180°. Thereby, simple and efficient background noise suppression, including DC noise and the light interferences at each interface of the sample, is provided.
    Type: Application
    Filed: May 1, 2013
    Publication date: July 17, 2014
    Applicant: NATIONAL YANG-MING UNIVERSITY
    Inventor: Wen-Chuan KUO
  • Patent number: 8780354
    Abstract: The present invention relates to a method for analyzing chromosomes through preparing a chromosome preparation, measuring at least one interference characteristic of the chromosome preparation and characterizing at least one chromosome structure by way of the interference characteristic. Also, the invention relates to the use of a near-field microscope for analyzing un-dyed chromosomes.
    Type: Grant
    Filed: February 19, 2009
    Date of Patent: July 15, 2014
    Assignee: Hochschule Reutlingen
    Inventors: Rudolf Kessler, Tobias Merz, Karsten Rebner
  • Patent number: 8780355
    Abstract: According to a first aspect the invention relates to a reconstruction process of a narrow-band signal acquired by an instrument producing irregular sampling, in which two series of samples are acquired at the same sampling period, the two series being offset relative to one another such that the sampling errors are identical or quasi identical over both series. According to a second aspect, the invention relates to an instrument configured to carry out the process according to the first aspect of the invention.
    Type: Grant
    Filed: September 1, 2009
    Date of Patent: July 15, 2014
    Assignee: Centre National Detudes Spatiales
    Inventors: Elodie Cansot, Emmanuel Christophe, Alain Rosak
  • Publication number: 20140192363
    Abstract: A spectroscopy assembly having a first and a second optical ring resonator, each provided with a material having an intensity-dependent refraction index. The spectroscopy assembly further includes at least one waveguide, which is guided along the optical ring resonator at a distance such that the light of a continuous wave laser guided in the waveguide can be coupled into the optical ring resonator, and a frequency comb generated from the light of the continuous wave laser in the optical ring resonator can be coupled out of the waveguide. The optical ring resonators and the at least one waveguide are provided on a common substrate.
    Type: Application
    Filed: April 27, 2012
    Publication date: July 10, 2014
    Inventors: Tobias Kippenberg, Ronald Holzwarth
  • Patent number: 8772693
    Abstract: Hilbert phase microscopy (HPM) as an optical technique for measuring high transverse resolution quantitative phase images associated with optically transparent objects. Due to its single-shot nature, HPM is suitable for investigating rapid phenomena that take place in transparent structures such as biological cells. A preferred embodiment is used for measuring biological systems including measurements on red blood cells, while its ability to quantify dynamic processes on the millisecond scale, for example, can be illustrated with measurements on evaporating micron-size water droplets.
    Type: Grant
    Filed: March 24, 2006
    Date of Patent: July 8, 2014
    Assignees: Massachusetts Institute of Technology, Hamamatsu Photonics K.K.
    Inventors: Gabriel Popescu, Ramachandra Dasari, Takahiro Ikeda
  • Patent number: 8760661
    Abstract: An apparatus includes a spatial light modulator configured to receive an optical pulse train; and output a modulated optical pulse train; a non-linear optical system that receives the modulated optical pulse train and generates a non-linear optical signal; and a power detector that detects a power of the generated non-linear optical signal. A control system outputs a signal to the spatial light modulator to cause it to modulate the optical pulse train by modulating the spectral phase of the optical pulse at wavelengths within a current wavelength range subset and maintain the spectral phase of the optical pulse constant at wavelengths outside the current wavelength range subset; and based on the detected power, extracts values of the spectral phase for the optical pulse at wavelengths within the current wavelength range subset, the values extracted being those that compress the optical pulses.
    Type: Grant
    Filed: May 3, 2012
    Date of Patent: June 24, 2014
    Assignee: Howard Hughes Medical Institute
    Inventor: Meng Cui
  • Publication number: 20140160482
    Abstract: An exemplary arrangement can be provided which can include a lens arrangement which can have at least two reflecting surfaces on opposing sides thereof, each of the reflecting surfaces can have a reflectivity that can be greater than 10%. The lens arrangement can include a gradient index lens, and can have a refractive optical element, a diffractive optical element, a planar convex lens, an aspheric lens, a ball lens or a cylindrical lens.
    Type: Application
    Filed: December 9, 2013
    Publication date: June 12, 2014
    Applicant: The General Hospital Corporation
    Inventors: Guillermo J. Tearney, Tzhai Grunzweig, Kengyeh Ken Chu
  • Patent number: 8749793
    Abstract: An improved apparatus and method for performing Raman spectroscopy in a scattering medium, where the scattering induced phase modulation is compensated by using a spatial light modulator to shape the wavefront of the laser beam. This allows the laser beam to be focused to a spot inside the inhomogeneous material with low distortion, thus stimulating Raman signal from the focus point for spectral analysis.
    Type: Grant
    Filed: January 27, 2012
    Date of Patent: June 10, 2014
    Assignee: BWT Property, Inc.
    Inventor: Sean Xiaolu Wang
  • Publication number: 20140152993
    Abstract: An optical path of measurement light emitted from a measurement light source is overlaid by a beam combiner on an optical path of reference light emitted from a reference light source. The measurement light emitted from the measurement light source includes light in the sensitivity wavelength range (S1) of a measurement light detector and light in the sensitivity wavelength range (S2) of a reference light detector. An interferometer includes a wavelength separation filter that cuts light in at least a part of the sensitivity wavelength range (S2) of the reference light detector, of light included in the wavelength range of the measurement light.
    Type: Application
    Filed: June 14, 2012
    Publication date: June 5, 2014
    Applicant: KONICA MINOLTA, INC.
    Inventor: Yusuke Hirao
  • Patent number: 8742351
    Abstract: When a system is powered on and becomes ready for a measurement, it automatically begins to acquire an interferogram (IFG). When a new IFG is acquired, if a background (BKG) IFG is present in a memory but there is no sample IFG (S2 and S4), the new IFG is compared with the BKG-IFG and, if the two IFGs are identical, the new IFG is added to the BKG-IFG (S5, S6 and S7). When an operator sets a sample in a sample chamber and the new IFG shows a change, the IFG is stored as a sample IFG (S8). Then, a sample measurement is initiated. After that, when a new IFG is found to be identical to the sample IFG stored in the memory (S9 and S10), the new IFG is added to the sample IFG (S13). The sample measurement is completed when the number of sample IFGs stored in the memory has reached a predetermined accumulation number. Thus, the sample measurement is automatically performed, for which the operator only needs to set a sample.
    Type: Grant
    Filed: December 2, 2008
    Date of Patent: June 3, 2014
    Assignee: Shimadzu Corporation
    Inventor: Hisato Fukuda
  • Patent number: 8736844
    Abstract: A Sagnac interferometer can include a beamsplitter arranged to receive an input beam of light of a design wavelength, to split the input beam of light into first and second beams that counter propagate around an optical path, and to recombine the first and second beams into an output beam of light. The optical path can include at least one diffraction grating that is arranged to satisfy an effective Littrow geometry.
    Type: Grant
    Filed: June 6, 2011
    Date of Patent: May 27, 2014
    Assignee: University of Hawaii
    Inventors: Eric Szarmes, Huan Ma
  • Patent number: 8736843
    Abstract: An optical Micro Electro-Mechanical System (MEMS) device provides an optical path retardation multiplier. The MEMS device includes a moveable corner cube reflector, a fixed minor and a MEMS actuator. The moveable corner cube reflector is optically coupled to receive an incident beam and reflect the incident beam through 180 degrees towards the fixed mirror. The fixed minor is optically coupled to reflect a reflected beam back towards the moveable corner cube reflector along a reverse path of the incident beam. The MEMS actuator is coupled to the moveable corner cube reflector to cause a displacement of the moveable corner cube reflector to extend an optical path length of the reflected beam.
    Type: Grant
    Filed: April 16, 2010
    Date of Patent: May 27, 2014
    Assignee: Si-Ware Systems
    Inventors: Mostafa Medhat, Bassam A. Saadany, Diaa A. M. Khalil, Bassem Mortada
  • Publication number: 20140125984
    Abstract: An optical wavelength meter includes: an interferometer; a reference optical source unit with a laser configured to oscillate in a multi-longitudinal mode; and a signal processor configured to calculate a wavelength of a input beam with reference to interference fringe information of reference beam and interference fringe information of the input beam obtained from the interferometer.
    Type: Application
    Filed: November 1, 2013
    Publication date: May 8, 2014
    Applicants: Yokogawa Meters & Instruments Corporation, Yokogawa Electric Corporation
    Inventors: Toshikazu YAMAMOTO, Manabu KOJIMA
  • Patent number: 8711360
    Abstract: A spectral measurement device includes: an optical band-pass filter section that has first to n-th wavelengths (n is an integer of 2 or more) having a predetermined wavelength width as a spectral band thereof; a correction operation section that corrects a reception signal based on an output optical signal from the optical band-pass filter section; and a signal processing section that executes predetermined signal processing based on the reception signal corrected by the correction operation section that corrects the reception signal based on the change in the spectral distribution of the reception signal.
    Type: Grant
    Filed: July 23, 2013
    Date of Patent: April 29, 2014
    Assignee: Seiko Epson Corporation
    Inventor: Tatsuaki Funamoto
  • Patent number: 8711362
    Abstract: A spectrometer includes: a tungsten lamp which emits light with no peak wavelength within a wavelength range of visible light and having a light amount increasing as the wavelength becomes longer; a violet LED which emits light having a peak wavelength within the wavelength range of visible light; a light mixer which mixes light emitted from the tungsten lamp and the violet LED; an etalon which receives light mixed by the light mixer and transmits light contained in the received mixed light and having a particular wavelength; a light receiving unit which receives light transmitted by the etalon; and a measurement control unit which changes the wavelength of light that can pass through the etalon and measures spectral characteristics of the light having passed through the etalon based on the light received by the light receiving unit.
    Type: Grant
    Filed: September 8, 2011
    Date of Patent: April 29, 2014
    Assignee: Seiko Epson Corporation
    Inventor: Tatsuaki Funamoto
  • Patent number: 8699013
    Abstract: Provided is a chromatic dispersion measurement device including a light branching unit that divides a incident measured light signal into a first measured light signal and a second measured light signal and causes a frequency difference between the first measured light signal and the second measured light signal when the signals are output, an optical phase shifter provided in either one of the first branch path and the second branch path having a polarization maintaining characteristic and periodically changing a phase ?i of the measured light signal, an optical combination unit that combines the first measured light signal and the second measured light signal and outputs an interference element of an i-th optical component obtained by interference of the first measured light signal and the second measured light signal when the phase difference is the phase ?i, as a combined measured light signal.
    Type: Grant
    Filed: April 17, 2013
    Date of Patent: April 15, 2014
    Assignee: Fujikura Ltd.
    Inventor: Kensuke Ogawa
  • Publication number: 20140098371
    Abstract: A spectrometer with improved resolution includes a spectral domain modulator having a periodic response in the spectral domain to modulate a wideband source spectrum and cause one or more shifted bursts in the interferogram.
    Type: Application
    Filed: October 7, 2013
    Publication date: April 10, 2014
    Applicant: SI-WARE SYSTEMS
    Inventors: Yasser M. Sabry, Diaa A. M. Khalil, Bassam A. Saadany
  • Patent number: 8693002
    Abstract: A Fourier transform spectrometer (FTS) data acquisition system includes an FTS spectrometer that receives a spectral signal and a laser signal. The system further includes a wideband detector, which is in communication with the FTS spectrometer and receives the spectral signal and laser signal from the FTS spectrometer. The wideband detector produces a composite signal comprising the laser signal and the spectral signal. The system further comprises a converter in communication with the wideband detector to receive and digitize the composite signal. The system further includes a signal processing unit that receives the composite signal from the converter. The signal processing unit further filters the laser signal and the spectral signal from the composite signal and demodulates the laser signal, to produce velocity corrected spectral data.
    Type: Grant
    Filed: December 21, 2010
    Date of Patent: April 8, 2014
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventor: Joel F. Campbell
  • Patent number: 8693003
    Abstract: The disclosure is directed at an interferometric localized surface plasmon resonance sensor (ILSPR) unit comprising an ILSPR sensor chip, the sensor chip including a localized surface plasmon resonance sensor (LSPR) layer; at least one light source for directing light through the ILSPR sensor chip at the LSPR layer; and a photodetector for sensing a level of light intensity after the light has struck the LSPR layer.
    Type: Grant
    Filed: April 21, 2011
    Date of Patent: April 8, 2014
    Inventors: Patricia Marlen Nieva, Ryan Cameron Denomme
  • Publication number: 20140092385
    Abstract: A spectrometer is provided, the spectrometer having an interferometer generating an interferogram by splitting an interferometer input signal between a reference arm and a variable delay arm, and introducing a delay between the split interferometer input signals prior to interfering the split interferometer input signals. The spectrometer additionally has a controllable delay element operable to adjust the delay introduced by the interferometer and a dispersive element outputting a plurality of narrowband outputs representative of a received broadband input signal. The interferometer and dispersive element are optically connected to output a plurality of narrowband interferograms representative of a spectra of a spectrometer input signal received by the spectrometer, and the plurality of narrowband interferograms are received by a detector array for analysis.
    Type: Application
    Filed: May 30, 2012
    Publication date: April 3, 2014
    Applicant: TORNADO MEDICAL SYSTEMS, INC.
    Inventors: Arthur Nitkowski, Arsen Hajian
  • Patent number: 8681340
    Abstract: An analyzer comprising a source of electromagnetic radiation, a detector for said radiation and a drophead comprising a surface which is adapted to receive a drop of liquid to be tested, the drophead being positioned in use relative to the source and detector to illuminate a drop received thereon and to cause an interaction in the path of the electromagnetic radiation between the source and detector, characterized in that said surface of said drophead is dimensioned to constrain the drop to adopt a shape which is dominated more by surface tension forces than by gravitational forces.
    Type: Grant
    Filed: May 10, 2007
    Date of Patent: March 25, 2014
    Inventors: Norman McMillan, Stuart Smith, Martina O'Neill, Michael Baker
  • Publication number: 20140063506
    Abstract: A real-time, dispersion-compensated low coherence interferometric system includes a fiber-optic, a bulk-optic, or a combination of bulk and fiber-optic system comprising a reference path and an observation path; a light source optically coupled to the fiber-optic, bulk-optic, or combination of bulk and fiber-optic system to illuminate the reference and observation paths; an optical detection system arranged to receive combined light returned along the reference and observation paths, the optical detection system providing detection signals; and a data processing system arranged to communicate with the optical detection system to receive the detection signals. The data processing system includes a parallel processor configured to process the detection signals to provide real-time dispersion compensation to numerically compensate for dispersion in the reference path relative to the observation path.
    Type: Application
    Filed: May 4, 2012
    Publication date: March 6, 2014
    Applicant: The Johns Hopkins University
    Inventors: Jin U. Kang, Kang Zhang
  • Patent number: 8665446
    Abstract: An apparatus and a method for coherent multi-dimensional optical spectroscopy employs a beam splitter for splitting a base light pulse into at least first to fourth light pulses, three of which are suitable for interaction with a sample, lens system focuses the first to fourth light pulses at a sample site, and an optical delay varies the arrival times of the first to fourth light pulses at the sample. A detector detects an interference signal. The beam splitter is a non-diffractive optical element. The light pulses, at least along part of their light paths, are guided pairwisely such that changes in the optical path length due to vibration of the beam splitter or due to the delay element are identical for each pair of pulses, where the pulse pairs compensate for any change in the interference signal due to a change of the arrival times of the pair of pulses.
    Type: Grant
    Filed: May 7, 2009
    Date of Patent: March 4, 2014
    Assignee: Julius-Maximilians-Universitat Wurzburg
    Inventors: Tobias Brixner, Ulrike Selig, Florian Langhojer, Frank Dimler
  • Patent number: 8638443
    Abstract: A method for compensating for errors in a spectrometer is provided that includes measuring at least a portion of a path length for a signal traveling through the spectrometer during a measurement scan of a material. A detector signal corresponding to the measurement scan is generated. Compensation for errors in the detector signal is provided based on the measurement of the path length.
    Type: Grant
    Filed: May 24, 2011
    Date of Patent: January 28, 2014
    Assignee: Honeywell International Inc.
    Inventors: Frank M. Haran, Stéphane Savard
  • Publication number: 20140014841
    Abstract: A system for measuring the absorption spectrum of a sample is provided that includes a broadband light source that produces broadband light defined within a range of an absorptance spectrum. An interferometer modulates the intensity of the broadband light source for a range of modulation frequencies. A bi-layer cantilever probe arm is thermally connected to a sample arm having at most two layers of materials. The broadband light modulated by the interferometer is directed towards the sample and absorbed by the sample and converted into heat, which causes a temperature rise and bending of the bi-layer cantilever probe arm. A detector mechanism measures and records the deflection of the probe arm so as to obtain the absorptance spectrum of the sample.
    Type: Application
    Filed: July 9, 2013
    Publication date: January 16, 2014
    Applicant: MASSACHUSETTS INSTITUTE OF TECHNOLOGY
    Inventors: Wei-Chun Hsu, Jonathan Kien-Kwok Tong, Bolin Liao, Brian Burg, Gang Chen
  • Patent number: 8625101
    Abstract: There is provided a method for referencing and correcting the beating spectrum generated by the interference of the components of a frequency comb source. The proposed method allows monitoring of variations of a mapping between the source and the beating replica. This can then be used to compensate small variations of the source in Fourier transform spectroscopy or in any other interferometry application in order to overcome the accuracy and measurement time limitations of the prior art. Constraints on source stability are consequently reduced.
    Type: Grant
    Filed: May 31, 2013
    Date of Patent: January 7, 2014
    Assignee: Université Laval
    Inventors: Philippe Giaccari, Pierre Tremblay, Philippe Saucier, Jérôme Genest, Jean-Daniel Deschênes
  • Patent number: 8622836
    Abstract: A gaming system compatible with patron-controlled portable electronic devices, such as smart phones or tablet computers, is described. The gaming system is configured to detect the presence of portable electronic devices and to determine whether to initiate a wireless communication session with the portable electronic device based on the strength of the signal received from the portable electronic device. If the signal strength exceeds a minimal threshold level, thereby indicating the portable electronic device is near a gaming device, a wireless communication session can be initiated. The signal strength transmitted from the portable electronic device can be monitored during a game play session to determine whether the wireless communication session should remain active or be terminated.
    Type: Grant
    Filed: December 22, 2011
    Date of Patent: January 7, 2014
    Assignee: IGT
    Inventors: Dwayne R. Nelson, Steven G. Lemay
  • Patent number: 8619364
    Abstract: An apparatus for reducing fringe interference of light created in the optical system of a laser spectroscopy system comprising an electromagnetic actuator for generating, along a laser path, physical translational vibration of an optical element of the optical system and a control device for controlling the amplitude and frequency of said vibration. The optical element is arranged on a cantilever body which is, at one end, attached to a base by a flexural pivot and, at the other free end, coupled to the electromagnetic actuator, and the control device includes a controller that controls the amplitude of the vibration and a vibration sensor attached to the cantilever body and providing the actual vibration value to the controller to improve fringe interference reduction, especially with longer wavelengths.
    Type: Grant
    Filed: December 16, 2010
    Date of Patent: December 31, 2013
    Assignee: Siemens Aktiengesellschaft
    Inventors: Pawel Kluczynski, Rikard Larking, Tomas E. Lock
  • Patent number: 8605285
    Abstract: Prior art coherent optical wave mixing has permitted two-dimensional maps from which coupled quantum transitions have been identified in molecular samples. However, extended signal accumulation times and computer processing are required for a detailed molecular analysis, which can lead to sample toxicity and difficulties in interpretation. These and other requirements are reduced by an apparatus arranged for the projection of an image that directly encodes quantum couplings from a sample. Such an apparatus includes a source component 36, a diffractive optical component 25 for generating at least three light fields 1, 2, 3 from one light field 23, one or more optical telescopes 26 and 27 wherein the transverse separation between optical paths is modified from that possible to define with a single telescope between common object and image points, a sample 11 containing said image point, and a means for resolving and detecting the angular variation of light emission from a sample.
    Type: Grant
    Filed: June 1, 2009
    Date of Patent: December 10, 2013
    Inventor: Ian Petar Mercer
  • Publication number: 20130321816
    Abstract: A Fourier Transform Infrared (FTIR) Spectrometer integrated in a CMOS technology on a Silicon-on-Insulator (SOI) wafer is disclosed. The present invention is fully integrated into a compact, miniaturized, low cost, CMOS fabrication compatible chip. The present invention may be operated in various infrared regions ranging from 1.1 ?m to 15 ?m or it can cover the full spectrum from 1.1 ?m to 15 ?m all at once. The CMOS-FTIR spectrometer disclosed herein has high spectral resolution, no movable parts, no lenses, is compact, not prone to damage in harsh external conditions and can be fabricated with a standard CMOS technology, allowing the mass production of FTIR spectrometers. The fully integrated CMOS-FTIR spectrometer is suitable for battery operation; any and all functionality can be integrated on a chip with standard CMOS technology. The disclosed invention for the FTIR spectrometer may also be adapted for a CMOS-Raman spectrometer.
    Type: Application
    Filed: February 14, 2012
    Publication date: December 5, 2013
    Applicant: LUXMUX TECHNOLOGY CORPORATION
    Inventors: Yonathan Dattner, Orly Yadid-Pecht
  • Patent number: 8599384
    Abstract: A handheld wavelength meter that includes a housing that encloses a non-stable reference signal source, an interferometer with rotating retroreflectors, optical-electrical converters, a frequency multiplier, and a controller.
    Type: Grant
    Filed: October 26, 2010
    Date of Patent: December 3, 2013
    Assignee: Lifodas, UAB
    Inventors: Piotr Anatolij Levin, Aleksandr Stepanov, Vadam Gorchakov
  • Patent number: 8599383
    Abstract: The present invention provides optical systems and methods for determining a characteristic of a cell, such as cell type, cellular response to a biochemical event, biological state and the like. The methods typically involve using interferometry to observe membrane properties in a cell and then use this information to determine one or more characteristics of a cell. The methods of the invention are useful for applications such as drug screening as well as diagnostic techniques.
    Type: Grant
    Filed: May 6, 2009
    Date of Patent: December 3, 2013
    Assignee: The Regents of the University of California
    Inventors: Michael A. Teitell, James K. Gimzewski, Jason C. Reed
  • Publication number: 20130314714
    Abstract: An apparatus for acquiring information of an object includes an interferometer and an arithmetic unit. The interferometer includes an optical device that forms an interference pattern with light from a light source, and a detector that detects the interference pattern. The arithmetic unit acquires information related to a phase of an object using a first detection result and a second detection result detected by the detector. The arithmetic unit acquires the information related to the phase of the object using information on distribution of changes of the interferometer acquired from the first detection result and the second detection result.
    Type: Application
    Filed: May 24, 2013
    Publication date: November 28, 2013
    Applicant: CANON KABUSHIKI KAISHA
    Inventor: Kentaro Nagai
  • Publication number: 20130314713
    Abstract: A light interference system and a substrate processing apparatus can suppress loss of reflection spectrum. The light interference system 1 includes a light source 10, a coupler 41, multiple collimators 12A and 12B, a collimator 42, a mirror 43, a spectrometer 14, and an operation unit 15. The collimator 42 and the mirror 43 are provided at a side of multiple input terminals except a first input terminal and configured to send reflected lights from multiple output terminals to the multiple output terminals again.
    Type: Application
    Filed: May 21, 2013
    Publication date: November 28, 2013
    Inventor: Kenji Nagai
  • Publication number: 20130308134
    Abstract: A optical module includes, a wavelength variable interference filter which include reflection films opposite to each other and an electrostatic actuator portion including a first electrostatic actuator and a second electrostatic actuator and changing a gap between the reflection films, and a voltage control portion which controls voltage which is applied to the electrostatic actuator portion, the voltage control portion includes, a bias driving portion which applies bias voltage to the first electrostatic actuator, a gap detector, and a feedback control portion which applies feedback voltage corresponding to a detected gap amount to the second electrostatic actuator.
    Type: Application
    Filed: May 13, 2013
    Publication date: November 21, 2013
    Applicant: Seiko Epson Corporation
    Inventor: Nozomu HIROKUBO
  • Patent number: 8587787
    Abstract: A Micro-Electro-Mechanical Systems (MEMS) interferometer is implemented in a Fourier transform spectrometer, which includes a common housing containing the interferometer and a gas cell, possibly including a preconcentrator. The interferometer system includes an optical bench and at least two mirror structures, being patterned from one or more layers on the optical bench and erected to extend substantially perpendicularly to the bench to define two interferometer arms to provide a MEMS interferometer.
    Type: Grant
    Filed: December 28, 2007
    Date of Patent: November 19, 2013
    Assignee: Block Engineering, LLC
    Inventors: David Reyes, E. Robert Schildkraut, Jinhong Kim