Moire Patents (Class 356/605)
  • Patent number: 12135204
    Abstract: The present disclosure proposes an apparatus for determining a first three-dimensional shape of an object. The apparatus includes one or more first light sources configured to irradiate one or more first pattern lights to the object, a second light source configured to sequentially irradiate one or more second pattern lights having one phase range, a beam splitter and one or more lenses configured to change optical paths of the one or more second pattern lights, an image sensor configured to capture one or more first reflected lights and one or more second reflected lights, and a processor configured to determine the first three-dimensional shape of the object based on the one or more first reflected lights and the one or more second reflected lights.
    Type: Grant
    Filed: June 29, 2020
    Date of Patent: November 5, 2024
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Chan Kwon Lee, Moon Young Jeon, Deok Hwa Hong, Joong Ki Jeong
  • Patent number: 12031811
    Abstract: The disclosure relates to an object size estimation device and method. According to the disclosure, an object size estimation device comprises a reception unit receiving a reception signal reflected by the object, through the reception antenna, an object length calculation unit calculating a reflection point based on a position frequency of measurements included in the reception signal, calculating a horizontal length of the object based on a distance between a first straight line passing through the calculated reflection point and a measurement and calculating a vertical length of the object based on a distance between a second straight line orthogonal to the first straight line and a measurement, and an object size estimation unit estimating a size of the object formed with the horizontal length and the vertical length.
    Type: Grant
    Filed: December 23, 2021
    Date of Patent: July 9, 2024
    Assignee: HL KLEMOVE CORP.
    Inventor: OhCheol Heo
  • Patent number: 11962748
    Abstract: Apparatus for generating a dynamic structured light pattern for optical tracking in three-dimensional space, comprises an array of lasers, such as a VCSEL laser array, to project light in a pattern into a three-dimensional space; and an optical element or elements arranged in cells. The cells are aligned with subsets of the laser array, and each cell individually applies a modulation, in particular an intensity modulation, to light from the laser or lasers of the subset, to provide a distinguishable and separately controllable part of the dynamic structured light pattern. A method of generating a structured light pattern is disclosed, in which light is provided from an array of lasers, and light is individually projected from subsets of the array of lasers to provide differentiated parts of the structured light pattern.
    Type: Grant
    Filed: June 4, 2021
    Date of Patent: April 16, 2024
    Assignee: Meta Platforms Technologies, LLC
    Inventors: Nitay Romano, Nadav Grossinger, Yair Alpern, Emil Alon
  • Patent number: 11187525
    Abstract: A method, system, and computer program product for optical inspection of objects. The method projects an optical test line on a device under test. A frame is captured of the optical test line projected onto the device under test. The method provides a reference line for the device under test and compares the reference line and the optical test line within the frame. The method generates a visual quality determination based on the comparison of the reference line and the optical test line.
    Type: Grant
    Filed: January 6, 2020
    Date of Patent: November 30, 2021
    Assignee: International Business Machines Corporation
    Inventors: Eric V. Kline, Wen Qi Loh, Jon Vitas Elumbaring Guiritan, Lee Leng Tey
  • Patent number: 11155034
    Abstract: According to some embodiments, system and methods are provided comprising generating a nominal computer-aided design (CAD) image of a component; producing a physical representation of the component from the nominal CAD image using an additive manufacturing (AM) process; measuring the physical component to obtain measurement data; determining a deviation between geometry associated with the nominal CAD image and the obtained measurement data; determining a compensation field for the deviation, if the deviation is outside of a tolerance threshold; modifying the nominal CAD image by the compensation field; and producing a physical representation of the component from the modified nominal CAD image. Numerous other aspects are provided.
    Type: Grant
    Filed: June 27, 2016
    Date of Patent: October 26, 2021
    Assignee: General Electric Company
    Inventors: Pinghai Yang, James William Sears, Steven Charles Woods, Michael Evans Graham
  • Patent number: 10531072
    Abstract: The invention relates to a method and a calibration device for calibrating a dental camera (1), which is based on a fringe projection method for optically measuring a dental object (10) in three dimensions, comprising a projection grid (2) for generating a projection pattern (3) that consists of a plurality of fringes (5), and an optical system (4) that projects the generated projection pattern (3) onto the object (10) to be measured. In a first step, a reference surface (74) with known dimensions is measured by the dental camera (1) using the fringe projection method. Actual coordinates (33, 36) of a plurality of measurement points (11) are determined on the reference surface (74), and the determined actual coordinates (33, 36) are compared to target coordinates (34) of the measurement points (11) on the reference surface (74).
    Type: Grant
    Filed: November 4, 2013
    Date of Patent: January 7, 2020
    Assignee: DENTSPLY SIRONA INC.
    Inventors: Bjorn Popilka, Frank Thiel, Frank Forster
  • Patent number: 10416621
    Abstract: An on-demand production system for accessories for use with electronic devices is configured to generate digital templates defining the design of the accessories and provide the digital templates to retail or other locations. The retail or other locations may receive access to the digital templates automatically and/or electronically within a week, a day, or even minutes, of the digital template being created. When a customer requests an accessory, the digital template may be accessed. Using an electronic production machine and a supply of stock material, the accessory can be cut, formed, printed, or otherwise produced based on instructions or designs of the digital template. The electronic production machine may automatically read the digital template to automate the production at a retail location. The electronic production machine may produce the accessory on-demand, and production of the accessory may be completed within two hours, or potentially within ten minutes, of a request.
    Type: Grant
    Filed: January 14, 2013
    Date of Patent: September 17, 2019
    Assignee: ZAGG Intellectual Property Holding Co., Inc.
    Inventor: Randall Hales
  • Patent number: 10206558
    Abstract: The invention relates to a method and to a camera for the three-dimensional measurement of a dental object, comprising at least one light source, which emits an illumination beam, at least one projection means, which produces a projection pattern, focusing optics, which display the projection pattern in a plane of sharp focus at a defined focal distance relative to the dental camera. The projection pattern projected onto the object is reflected by the object as an observation beam and is acquired by means of a sensor. In the measurement of the object, the focusing optics are controlled in such a way that the focal distance of the plane of sharp focus relative to the camera is varied incrementally between a plurality of defined scan positions.
    Type: Grant
    Filed: May 20, 2016
    Date of Patent: February 19, 2019
    Assignee: DENTSPLY SIRONA Inc.
    Inventors: Joachim Pfeiffer, Frank Thiel
  • Patent number: 10019815
    Abstract: Provided herein are methods, systems, devices, and computer-readable storage media for measuring flatness (e.g., along a Z-axis) of a detection stage. In some aspects, measuring flatness of the detection stage includes obtaining two or more images representing different Z coordinates of a first XY coordinate on a substantially flat substrate positioned on the detection stage; determining a sharpest Z coordinate at the first XY coordinate based on sharpness of the two or more images; obtaining two or more images representing different Z coordinates of a second XY coordinate spaced apart from the first XY coordinate on the substantially flat substrate; determining a sharpest Z coordinate at the second XY coordinate based on sharpness of the two or more images; and calculating a difference between the sharpest Z coordinates at the first and the second XY coordinates to measure the flatness of the detection stage.
    Type: Grant
    Filed: March 16, 2017
    Date of Patent: July 10, 2018
    Assignee: PLEXBIO CO., LTD.
    Inventors: Yao-Kuang Chung, Chia-En Tai, Chien Teng Kao
  • Patent number: 9948864
    Abstract: A photography illumination compensation method comprises: obtaining a surface shape characteristic of a photographed side of an object in a photographing field of view; obtaining first relative direction information of the object relative to a photography position related to the photographing field of view, obtaining second relative direction information of the object relative to an illumination array comprising multiple illumination units, and adjusting, according to the surface reflection characteristic, the first relative direction information, the second relative direction information, and a set illumination compensation criterion, an illumination parameter of an illumination unit in the illumination array.
    Type: Grant
    Filed: July 24, 2015
    Date of Patent: April 17, 2018
    Assignee: BEIJING ZHIGU RUI TUO TECH CO., LTD
    Inventors: Lin Du, Zhengxiang Wang
  • Patent number: 9636007
    Abstract: A method of aiding the diagnosis of otitis media in a patient includes obtaining image data in a processor apparatus of a computing device, the image data being associated with at least one electronic image of a tympanic membrane of the patient, calculating a plurality of image features, each image feature being calculated based on at least a portion of the image data, classifying the at least one electronic image as a particular type of otitis media using the plurality of image features, and outputting an indication of the particular type of otitis media. Also, a system for implementing such a method that includes an output device and a computing device.
    Type: Grant
    Filed: June 11, 2013
    Date of Patent: May 2, 2017
    Assignees: Carnegie Mellon University, University of Pittsburgh—Of the Commonwealth System of Higher Education
    Inventors: Alejandro Hoberman, Jelena Kovacevic, Nader Shaikh, Anupama Kuruvilla
  • Patent number: 9605961
    Abstract: Information processing apparatus that performs three-dimensional shape measurement with high accuracy at high speed while taking into account lens distortion of a projection device. An image input unit of an information processing apparatus inputs image data of a measurement object photographed by a camera in a state where a predetermined pattern light is projected by a projector. An association unit calculates associations between coordinates on the image data of the measurement object and coordinates on image data of the predetermined pattern light. A three-dimensional coordinate calculation unit calculates a viewing vector of the camera from which lens distortion thereof has been eliminated and a viewing vector of the projector to which lens distortion thereof has been added. The calculation unit calculates coordinates of a point, in a three-dimensional space, of intersection between the camera viewing vector and the projector viewing vector, for each association.
    Type: Grant
    Filed: April 1, 2013
    Date of Patent: March 28, 2017
    Assignee: Canon Kabushiki Kaisha
    Inventor: Daisuke Kotake
  • Patent number: 9482520
    Abstract: A method for measuring flatness of a sheet includes acquiring a pattern image by projecting a light and dark pattern composed of light portions and dark portions onto a surface of the sheet, which is traveling between adjacent rolling stands, from a projection unit situated between the rolling stands, and capturing an image of the light and dark pattern with an image capture unit situated between the rolling stands, and measuring the flatness by analyzing the acquired pattern image. Arrangement parameters L0, ?, ?, hc and hp satisfy the following mathematical expression (1). 0.75 ? L 0 ? tan ? ? ? + tan ? ? ? 1 / h C - 1 / h P ? 1.
    Type: Grant
    Filed: May 14, 2014
    Date of Patent: November 1, 2016
    Assignee: NIPPON STEEL & SUMITOMO METAL CORPORATION
    Inventors: Yoshito Isei, Tomoya Kato, Yasuhiro Aihara
  • Patent number: 9175948
    Abstract: An optical module, in particular for microlithography, with an optical element unit, a support device, a deformation device and a measuring device is disclosed. The support device is supported on the optical element unit, whereas for deforming an optical surface of the optical element unit, the deformation device engages a deformation section of the optical element unit comprising the optical surface. For determining the position and/or the orientation of the optical element unit with respect to an external reference in at least one degree of freedom, the measuring device comprises at least one measuring element, wherein the measuring element is arranged on a reference section of the optical element unit.
    Type: Grant
    Filed: November 4, 2013
    Date of Patent: November 3, 2015
    Assignee: Carl Zeiss SMT GmbH
    Inventors: Armin Schoeppach, Stefan Hembacher, Guido Limbach, Jens Kugler
  • Patent number: 8908178
    Abstract: A method involves obtaining a first beam image on a focal plane of a first camera and a second beam image on a focal plane of a second camera from light scattered by ambient atmospheric aerosols in the path of a laser beam. First and second projected beam images are formed, representing the respective first and second beam images in the projected scenes of the respective first and second cameras. First and second ambiguity planes are then formed from the respective first and second projected beam images. An intersection of the first and second ambiguity planes is then determined, identifying the position of the laser beam. A source of the laser beam is then determined, along with a camera-source plane. A beam elevation angle with respect to this plane is then determined, as well as beam azimuth angles with respect to lines between the respective camera and the source.
    Type: Grant
    Filed: March 5, 2013
    Date of Patent: December 9, 2014
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventors: Frank E. Hanson, Charles S. Bendall
  • Patent number: 8861833
    Abstract: A system for simultaneous real-time three-dimensional geometry and color texture acquisition. The system includes a system processor for generating at least three phase shifted black and white fringe patterns with a phase shift of 2 ?/3, a light projector adapted to project the fringe patterns onto an object, the projector being electrically connected with the system processor, and a color camera for capturing the fringe patterns to generate at least three raw fringe images. The fringe images are used to calculate a black and white texture image which is further converted to a color image by employing a demosaicing algorithm. The fringe images are also used to calculate a wrapped phase map that is further processed to generate a continuous unwrapped phase map by employing a phase unwrapping algorithm and the unwrapped phase map is converted to co-ordinates using calibrated system parameters for point-by-point three-dimensional shape measurement.
    Type: Grant
    Filed: February 18, 2009
    Date of Patent: October 14, 2014
    Assignee: International Press of Boston, Inc.
    Inventors: Shing-Tung Yau, Song Zhang, Xiangfeng Gu
  • Patent number: 8532340
    Abstract: Camera-based texture extraction in Augmented Reality (AR) systems is enhanced by manipulating projected patterns. One or more fine line patterns are projected onto a textured surface, a Moiré interference pattern measured, and different properties of the projected pattern(s) adjusted until the Moiré interference pattern measurements indicate that a similar texture pattern to that of the three dimensional target is being projected. Thereby, the target texture may be more closely matched even as sub-pixel resolutions, variable lighting conditions, and/or complicated geometries.
    Type: Grant
    Filed: September 30, 2010
    Date of Patent: September 10, 2013
    Assignee: Empire Technology Development, LLC
    Inventor: Ezekiel Kruglick
  • Patent number: 8411284
    Abstract: The present invention provides a method for simultaneous hue phase-shifting and a system for 3-D surface profilometry, wherein a single structured-light fringe pattern with encoded multiple trapezoidal color fringes is projected on an object so as to obtain a color image having deformed fringe patterns and then a hue information extracted from a HSI color model associated with the fringe pattern is transformed into a hue phase-shifting information for restructuring the 3-D surface profile of the object. Since the color structured light is composed of a plurality of colorful light having phase shifts with each other in spatial domain, the single structured-light pattern comprises multiple hue phase-shifting information so that the phase shifting and unwrapping can be performed by one-shot 3-D surface reconstruction process without needs of traditional conventional phase wrapping and Euler's transformation procedures such that the efficiency of phase shifting and 3-D surface measurement can be improved.
    Type: Grant
    Filed: July 30, 2009
    Date of Patent: April 2, 2013
    Assignee: National Taipei University of Technology
    Inventors: Liang-Chia Chen, Yao-Sheng Shu
  • Patent number: 8325331
    Abstract: A method for obtaining an incident angle ?i is provided. The method is used in a panel having at least one icon, wherein the at least one icon has a plurality of protrusions, and a light-emitting source is disposed under the at least one icon. The method includes steps of obtaining a distance W between two centers of two bottoms of two trenches formed at two sides of one of the plurality of protrusions; obtaining a half of the distance W; obtaining a vertical distance H between the light-emitting source and a center of the distance W; and performing an inverse trigonometric function operation for the half of the distance W over the vertical distance H so as to obtain the incident angle ?i.
    Type: Grant
    Filed: September 28, 2009
    Date of Patent: December 4, 2012
    Assignee: Arcadyan Technology Corp.
    Inventors: Sheng Chung Chen, Chin Yi Wu
  • Publication number: 20110310399
    Abstract: A sensor system and method for analyzing a feature in a sensing volume. The system imaging the feature with a first sensor and a second sensor that cooperate to form a contiguous sensing volume.
    Type: Application
    Filed: September 1, 2011
    Publication date: December 22, 2011
    Applicant: Perceptron, Inc.
    Inventors: Shyam P. Keshavmurthy, Chengchih Lin, David Crowther
  • Patent number: 8064684
    Abstract: An interface that allows a user to explore complex three dimensional datasets. The user manipulates a physical modeling material that defines the geometry of a surface that intersects a voxel dataset and the intersected voxel values are projected back onto the surface of the physical material as image data. A position sensor captures position data specifying the geometry of the surface, a processor compares the array of data values with the captured position data to identify selected ones of these data values whose position in the array corresponds to the geometry of the surface, and a projector for illuminates the surface with an image representative of the data at the array/surface intersection.
    Type: Grant
    Filed: October 29, 2003
    Date of Patent: November 22, 2011
    Assignee: Massachusetts Institute of Technology
    Inventors: Carlo Filippo Ratti, Benjamin Tarquinn Fielding Piper, Yao Wang, Hiroshii Ishii
  • Patent number: 8054471
    Abstract: An optical system including a signal processing unit has been developed to study the contours of objects and/or their deformations. The optical system utilizes projectors comprising an illumination source including those outside the visible range and an observation source such as a digital camera. The optical system provides information regarding the object in such a way that renders a complete description of the surface geometry and/or its deformation. The optical system further facilitates a substantial simplification in obtaining the desired result in the form of eliminating the need for point-wise solution of simultaneous equations. The signal processing unit comprises software that, among others, provides a transformation that mimics projection and observation from infinity. The signal processing unit further reduces data processing by recognizing known geometric shapes, and automatically correcting for discontinuities of the object and/or optical system.
    Type: Grant
    Filed: September 11, 2007
    Date of Patent: November 8, 2011
    Inventor: Cesar A. Sciammarella
  • Patent number: 8009298
    Abstract: Disclosed herein is a method of acquiring a reference grating of a three-dimensional measurement system using moiré, wherein the three-dimensional measurement system includes a light source, a projection grating, a grating actuator and a camera, and analyzes the moiré pattern acquired through the camera to measure the shape of the object. The method includes the steps of acquiring an initial reference grating using the light source and the projection grating, confirming whether or not the acquired initial reference grating includes noise through a noise detector, and moving the projection grating through the grating actuator to acquire the next reference grating when the initial reference grating does not include noise and correcting the reference grating when the reference grating includes noise. The method can remove the noise included in the reference grating to improve the accuracy of measurement of an object.
    Type: Grant
    Filed: February 18, 2009
    Date of Patent: August 30, 2011
    Assignees: Industry-University Cooperation Foundation Sunmoon University
    Inventors: Kuk-Won Ko, Yu-Hyun Moon
  • Patent number: 7957007
    Abstract: A projector that illuminates a scene with multiplexed light patterns includes a passive physical mask, and a set of spatially dispersed optical emitters arranged behind the physical mask. The optical emitters are modulated to project a set of unique optical light patterns.
    Type: Grant
    Filed: May 17, 2006
    Date of Patent: June 7, 2011
    Assignee: Mitsubishi Electric Research Laboratories, Inc.
    Inventors: Ramesh Raskar, Paul H. Dietz
  • Patent number: 7901096
    Abstract: The invention is directed to a method for illuminating an object and projecting its image on a ground glass screen. Optical comparators conventionally use incandescent illumination, either mercury arc or halogen. The use of an array of high intensity LED devices, provides many options for packaging the required optical components used in comparators.
    Type: Grant
    Filed: July 16, 2007
    Date of Patent: March 8, 2011
    Assignee: Dorsey Metrology International
    Inventor: Peter Donald Klepp
  • Patent number: 7852492
    Abstract: A device for tomographic scanning objects comprises a source of light for irradiating the object; a first grid arranged in the optical axis of the light beam so that a pattern of the first grid is projected on the object; an optical imaging assembly for imaging the object on a sensor; and a second grid provided in the optical axis of the reflected light beam having a pattern matching the first grid, through said second grid the reflected light beam having the pattern of the first grid being guided so that the sensor senses the light beam reflected by the object with a Moiré pattern resulting from overlying the pattern of the first grid and the pattern of the second grid. The device further comprises a means for moving the first grid and/or the second grid at a frequency causing fluctuations in the intensity of the resulting Moiré pattern.
    Type: Grant
    Filed: October 17, 2008
    Date of Patent: December 14, 2010
    Assignee: Nectar Imaging S.R.L.
    Inventor: Markus Berner
  • Patent number: 7684052
    Abstract: An apparatus, method, and program for measuring the three-dimensional shape of an object by analyzing an optical pattern projected onto the object includes a line sensor and an image analysis unit. The line sensor reads the target object, onto which the optical pattern is projected. The image analysis unit analyzes the optical pattern in the image read by the line sensor based on a spatial fringe analysis method, and the image analysis unit computes the three-dimensional shape information on the target object. The phase of a pixel included in an image taken of the optical pattern is determined based on the brightness values of the pixel and at least one neighboring pixel in the image; thus the height information of the object can be determined. In addition, the height of the target object at a given position can be computed based on how much the phase of the optical pattern projected onto a certain position of the object is shifted from a reference phase.
    Type: Grant
    Filed: October 20, 2006
    Date of Patent: March 23, 2010
    Assignee: OMRON Corporation
    Inventors: Masaki Suwa, Yoshiro Ito, Daisuke Mitsumoto, Masanao Yoshino, Hiroyoshi Koitabashi, Yoshinobu Asokawa
  • Patent number: 7619751
    Abstract: A quantity (or dispersion value) of a distribution of edge position due to random noise is expected to be reduced statistically to 1/N when N edge position data items are averaged. Using this property, the single page image is averaged in a vertical direction with various values of parameter S, and then the edge roughness index is calculated. The S-dependence of the edge roughness index is analyzed and a term of a dispersion value directly proportional to 1/S is determined as being due to noise.
    Type: Grant
    Filed: May 22, 2008
    Date of Patent: November 17, 2009
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Atsuko Yamaguchi, Hiroshi Fukuda, Osamu Komuro, Hiroki Kawada
  • Publication number: 20090279102
    Abstract: Disclosed herein is a method of acquiring a reference grating of a three-dimensional measurement system using moiré, wherein the three-dimensional measurement system includes a light source, a projection grating, a grating actuator and a camera, and analyzes the moiré pattern acquired through the camera to measure the shape of the object. The method includes the steps of acquiring an initial reference grating using the light source and the projection grating, confirming whether or not the acquired initial reference grating includes noise through a noise detector, and moving the projection grating through the grating actuator to acquire the next reference grating when the initial reference grating does not include noise and correcting the reference grating when the reference grating includes noise. The method can remove the noise included in the reference grating to improve the accuracy of measurement of an object.
    Type: Application
    Filed: February 18, 2009
    Publication date: November 12, 2009
    Inventors: Kuk-Won Ko, Yu-Hyun Moon
  • Patent number: 7548324
    Abstract: A three-dimensional (3-D) shape measurement method using a Moire measurement principle and a Stereo vision measurement principle is provided.
    Type: Grant
    Filed: March 1, 2007
    Date of Patent: June 16, 2009
    Assignee: Korea Advanced Institute of Science and Technology
    Inventors: Hyun Ki Lee, Hyung Suck Cho
  • Patent number: 7545516
    Abstract: A method and system for full-field fringe-projection for 3-D surface-geometry measurement, referred to as “triangular-pattern phase-shifting” is disclosed. A triangular grey-scale-level-coded fringe pattern is computer generated, projected along a first direction onto an object or scene surface and distorted according to the surface geometry. The 3-D coordinates of points on the surface are calculated by triangulation from distorted triangular fringe-pattern images acquired by a CCD camera along a second direction and a triangular-shape intensity-ratio distribution is obtained from calculation of the captured distorted triangular fringe-pattern images. Removal of the triangular shape of the intensity ratio over each pattern pitch generates a wrapped intensity-ratio distribution obtained by removing the discontinuity of the wrapped image with a modified unwrapping method. Intensity ratio-to-height conversion is used to reconstruct the 3-D surface coordinates of the object.
    Type: Grant
    Filed: December 1, 2006
    Date of Patent: June 9, 2009
    Assignee: University of Waterloo
    Inventors: Peirong Jia, Jonathan David Kofman, Chad English
  • Publication number: 20090051931
    Abstract: Measurement of sample surface flatness of a continuously moving sample. A conveyor continuously conveys a sample beneath a grating disposed at a non-zero angle with respect to the plane of conveyance. The relative distance between the sample and the angled grating changes with the horizontal translation of the sample. A camera disposed above the sample and the grating captures, at constant time intervals, a sequence of images, each image comprising a shadow moiré fringe pattern that is indicative of the sample's surface flatness. The continuous change in relative distance between the sample and the grating introduces a known or unknown phase step between the shadow moiré fringe patterns of each successive image. A computer associated with the camera processes the images to determine phase values of pixels at, and the relative height of the sample surface at, selected pixel locations of the sample.
    Type: Application
    Filed: March 17, 2008
    Publication date: February 26, 2009
    Inventors: Dirk Adrian Zwemer, Gregory James Petriccione, Sean Patrick McCarron, Jiahui Pan
  • Publication number: 20090051930
    Abstract: A method for detecting surface defects, such as slip line type defects, on a substrate designed to be used in electronics, optoelectronics or analogue, including projection of a pattern of light fringes and dark bands onto the substrate, relative displacement of the substrate relative to the pattern, acquisition of a sequence of at least three images of the pattern reflected by the substrate to a sensor, the images corresponding to displacement of the fringes of the pattern, determination of the gradient of the surface of the substrate using displacements of fringes of the pattern, and determination of the presence of a surface defect on the substrate using variations in the gradient of the surface of the substrate. Another embodiment comprises a device using said method.
    Type: Application
    Filed: March 27, 2008
    Publication date: February 26, 2009
    Applicants: S.O.I. TEC SILICON ON INSULATOR TECHNOLOGIES, ALTATECH SEMICONDUCTOR
    Inventors: Cecile Moulin, Sophie Moritz, Philippe Gastaldo, Francois Berger, Jean-Luc Delcari, Patrice Belin
  • Patent number: 7480061
    Abstract: Disclosed herein is a 3D shape measurement method and apparatus using a stereo moiré technique. The 3D shape measurement method measures the 3D shape of an object to be measured using a digital pattern projector and first and second cameras. The method includes a first step of projecting a phase-shifted fringe pattern onto the object to be measured using the digital pattern projector, a second step of acquiring four fringe images using each of the first and second cameras, and then acquiring two pieces of phase information using a moiré technique, and a third step of acquiring a pair of corresponding points, which satisfy stereo phase conditions for making all 2? ambiguity constants as integers, using the two pieces of phase information and then measuring the 3D shape of the object using the corresponding points.
    Type: Grant
    Filed: November 27, 2007
    Date of Patent: January 20, 2009
    Assignee: Korea Advanced Institute of Science and Technology
    Inventors: Hyun Ki Lee, Hyung Suck Cho
  • Patent number: 7453580
    Abstract: The present invention relates to a three-dimensional image measuring apparatus comprising: an XYZ shaft transfer means mounted onto a base member; a work stage mounted to the base member, for moving a measuring object to a measuring position and thereafter supporting it and having a predetermined reference surface set at a side thereof; an image obtaining means in which it is moved toward X, Y and Z shafts by the XYZ shaft transfer means, scans a grating image by the frequency of N times to a side of the measuring object supported and fixed to the work stage, obtains the changed grating image by the measuring object by N times; a light emitting means mounted to a side of the image obtaining means for generating and emitting light with a predetermined wavelength; and a control unit which irradiates light generated from the light emitting means mounted to a side of the image obtaining means to the reference surface set the side of the work stage, receives the changed grating image obtained from the image obtain
    Type: Grant
    Filed: February 5, 2004
    Date of Patent: November 18, 2008
    Assignee: Koh Young Technology, Inc.
    Inventors: Kwang-Ill Koh, Eun-Hyoung Seong, Moon-Young Jeon
  • Patent number: 7440119
    Abstract: There is provided a three-dimensional shape detecting device comprising: pattern beam projection means which projects a plurality of pattern beams including two pattern beams having different angular widths; image capturing means which captures an image of a subject onto which the pattern beams are projected, from a position a prescribed distance apart from the pattern beam projection means; and three-dimensional shape calculation means which calculates positions of the pattern beams projected on the subject based on the image captured by the image capturing means and thereby determines a three-dimensional shape of the subject.
    Type: Grant
    Filed: December 8, 2005
    Date of Patent: October 21, 2008
    Assignee: Brother Kogyo Kabushiki Kaisha
    Inventor: Takeo Iwasaki
  • Patent number: 7433256
    Abstract: The invention relates to an information carrier (101) intended to be read and/or written by a periodic array of light spots, said information carrier (101) comprising a data area (105) defined by a set of elementary data areas, a first periodic structure (108) intended to interfere with said periodic array of light spots for generating a first moiré pattern, a second periodic structure (109) intended to interfere with said periodic array of light spots for generating a second moiré pattern, said second periodic structure (109) being arranged perpendicularly to said first periodic structure (108). The invention also relates to an apparatus for reading and/or writing said information carrier (101).
    Type: Grant
    Filed: April 21, 2005
    Date of Patent: October 7, 2008
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Thomas Jan De Hoog, Robert Frans Maria Hendriks, Aukje Arianne Annette Kastelijn, Peter Van Der Walle
  • Patent number: 7433255
    Abstract: The invention relates to an information carrier, and a system for positioning such an information carrier in an apparatus. This system comprises an optical element (102) for generating a periodic array of light spots (103) intended to be applied to an information carrier (101), said information carrier (101) comprising a first periodic structure (108) intended to interfere with said periodic array of light spots (103) for generating a first Moiré pattern, and a second periodic structure (109) intended to interfere with said periodic array of light spots (103) for generating a second Moiré pattern, analysis means for deriving from said first and second Moiré patterns, the angle value (S) between said periodic array of light spots (103) and said information carrier (101), and actuation means (AC1-AC2-AC3) for adjusting the angular position of said information carrier (101) with respect to said array of light spots (103), from control signals (114) derived based on said angle value (S).
    Type: Grant
    Filed: April 21, 2005
    Date of Patent: October 7, 2008
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Robert Frans Maria Hendriks, Thomas Jan De Hoog, Peter Van Der Walle
  • Patent number: 7433058
    Abstract: An interferometric method for determining a height profile of regions of the surface area of an object or of several objects, wherein the regions are substantially in different planes, is presented. The optical path of at least one portion of intensity coming from one of the regions is modified while obtaining at least one image, wherein each image contains the portion of intensity and corresponds to an intensity pattern projected on the regions. An object phase associated with the regions is established using the obtained image(s) and a height profile of the regions is determined using the object phase and a reference phase. An optical assembly is used for directing along a common detection axis an intensity coming from said regions that would be otherwise out of sight.
    Type: Grant
    Filed: July 12, 2004
    Date of Patent: October 7, 2008
    Assignee: SolVision Inc.
    Inventors: Michel Cantin, Benoit Quirion
  • Patent number: 7430052
    Abstract: A method for correlating line width roughness of gratings first performs a step (a) generating a characteristic curve of a predetermined grating having a known line width, and a step (b) performing a comparing process to select a matching spectrum from a plurality of simulated diffraction spectrum of known line width, and setting the known line width of the matching spectrum as the virtual line width of the predetermined grating. Subsequently, the method performs a step (c) changing a measuring angle and repeating the steps (a) and (b) to generate a virtual line width curve, and calculating the deviation of the virtual line width curve. The method then performs a step (d) changing the line width roughness of the predetermined grating and repeating the steps (a), (b) and (c), and a step (e) correlating the line width roughness and the deviation of the virtual line width curve to generate a correlating curve.
    Type: Grant
    Filed: April 4, 2007
    Date of Patent: September 30, 2008
    Assignee: Industrial Technology Research Institute
    Inventors: Deh Ming Shyu, Yi Sha Ku
  • Patent number: 7430049
    Abstract: A process for scanning a surface of a substrate, which process takes at least one reflected image of at least one test pattern on the surface and extracts by digital processing local phases in two directions. Variations in local slopes are calculated by digital processing from the local phases to deduce therefrom variations in curvature or variations in altitude of the surface.
    Type: Grant
    Filed: November 21, 2001
    Date of Patent: September 30, 2008
    Assignee: Saint-Gobain Glass France
    Inventors: Thomas Bertin-Mourot, Jean-Pierre Douche, Daniel Germond, Paul-Henri Guering, Yves Surrel
  • Patent number: 7417747
    Abstract: A method and apparatus for measuring contour of a full fielded 3D surface of an object. The apparatus includes a projection device having a mark point and master grating, an imaging device for imaging imaged grating and mark point which are positioned on the object surface, and two rectilinearly movable axles. The method includes steps of: measuring a projected object and image distances, and an imaged object and image distances; determining a position of the zero order phase of the fringe according to an imaged mark point on the object surface; calculating orders of the moire fringes for the full fielded 3D surface of the object based on a phase-shift and unwrapping algorithms; and finally calculating an absolute contour of 3D object surface according to a relationship between altitudes of surface points of the object and the moire fringes referencing to a point of the object surface which is derived as a reference point of 3D coordinates.
    Type: Grant
    Filed: December 31, 2001
    Date of Patent: August 26, 2008
    Inventor: Lang Liu
  • Patent number: 7405835
    Abstract: A quantity (or dispersion value) of a distribution of edge position due to random noise is expected to be reduced statistically to 1/N when N edge position data items are averaged. Using this property, the single page image is averaged in a vertical direction with various values of parameter S, and then the edge roughness index is calculated. The S-dependence of the edge roughness index is analyzed and a term of a dispersion value directly proportional to 1/S is determined as being due to noise.
    Type: Grant
    Filed: June 12, 2007
    Date of Patent: July 29, 2008
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Atsuko Yamaguchi, Hiroshi Fukuda, Osamu Komuro, Hiroki Kawada
  • Patent number: 7400413
    Abstract: A 3D shape measuring apparatus using a shadow moire, which can measure a 3D shape of a test object by selectively switching on/off a plurality of illuminating parts irrespective of a form of the test object is provided.
    Type: Grant
    Filed: March 20, 2007
    Date of Patent: July 15, 2008
    Assignee: Koh Young Technology Inc.
    Inventors: Moon Young Jeon, Sang Kyu Yun
  • Patent number: 7388679
    Abstract: A light irradiation device for irradiating light having a pattern onto a physical object, includes a pattern forming plate provided with a plurality of opening portions; a light irradiation unit for irradiating light towards the pattern forming plate; and a projection lens irradiated by the light irradiation unit, for integrally condensing light passed through an opening of the pattern forming plate and guiding the condensed light to the physical object, wherein the projection lens is arranged such that an image of the pattern forming plate is not focused onto the physical object, but is projected as a sinusoidal wave pattern.
    Type: Grant
    Filed: September 21, 2006
    Date of Patent: June 17, 2008
    Assignee: OMRON Corporation
    Inventors: Masanao Yoshino, Yoshiro Murata, Yoshinobu Asokawa
  • Patent number: 7385709
    Abstract: A method and a microscopy imaging apparatus for generating an optically sectioned image of a specimen are provided. The method comprises the steps of: illuminating the specimen with a modulating, spatially periodic illumination pattern; imaging said specimen on a conjugate image plane; acquiring a plurality of signals at respective positions on said image plane, each signal corresponding to the incident light intensity at that position and having an oscillatory component caused by the modulation of the illumination pattern; and measuring a characteristic of the oscillatory component of each of the signals, whereby the measured characteristics when combined in their relative positions generate an optically sectioned image of the specimen.
    Type: Grant
    Filed: January 15, 2003
    Date of Patent: June 10, 2008
    Assignee: Ecole Polytechnique Federale de Lausanne
    Inventors: Karsten Plamann, Stéphane Bourquin, Mathieu Ducros, Jelena Mitic, Francois Vuille, Theo Lasser, Tiemo Anhut
  • Patent number: 7373270
    Abstract: A diagnostic mat has a texture, which enables avoiding mismatching in diagnosis and calibration, such as uniform and unduplicated patterns, for example, random dot patterns, fractal, natural images, and the like. A robot apparatus placed on the diagnostic mat assumes a stance suitable for taking images of the diagnostic mat, creates a distance image from an image acquired by the stereo camera, and verifies the performance of the stereo camera based on the flatness of the diagnostic mat obtained from this distance image. This assists in diagnosing the offset of the stereo camera mounted on the robot apparatus due to the deterioration over time of the stereo camera, falling of the robot apparatus, and the like.
    Type: Grant
    Filed: March 25, 2004
    Date of Patent: May 13, 2008
    Assignee: Sony Corporation
    Inventors: Takeshi Ohashi, Takayuki Yoshigahara, Masaki Fukuchi, Kenichi Hidai
  • Patent number: 7298499
    Abstract: This process includes arranging a grid on the surface a structure to be inspected, directing a light source onto this grid so as to create a shadow on the structure, recording an image of the pattern observed, displaying a graphic representation of the image recorded, and determining a depth of the damage from this representation. The device enabling the implementation of the process includes a grid or screen, a light sources, an image acquisition device, and a display. Once the images are recorded, the invention calls upon processing devices that permit determining the position in space, in particular, a height, of each point of the image and as such of the surface observed.
    Type: Grant
    Filed: March 25, 2005
    Date of Patent: November 20, 2007
    Assignee: Airbus France
    Inventor: Nicolas Fournier
  • Patent number: 7286246
    Abstract: A non-contact three-dimensional surface measurement method is provided in which a grating pattern projected onto an object being measured, while the phase of the pattern is being shifted, is observed in a different direction from a projection direction to analyze the contrast of a grating image deformed in accordance with the shape of the object and thereby obtain the shape thereof. The method enables measurement of a three-dimensional shape over a large measurement range in a short time in a non-contact manner by successively shifting the focus on the projection and the imaging sides to enlarge the measurement range in the direction of depth.
    Type: Grant
    Filed: March 22, 2004
    Date of Patent: October 23, 2007
    Assignee: Mitutoyo Corporation
    Inventor: Hiroyuki Yoshida
  • Patent number: RE48595
    Abstract: Provided are a method and system for determining an optimal exposure of a structured light based 3D camera. The system includes a projecting means for illuminating a predetermined pattern on a target object, an image capturing means for capturing an image of the target object with the pattern projected, and a processing means for reconstructing 3D data for the target object by identifying the pattern of the captured images from the image capturing means. The system automatically determines an optimal exposure of the structured light based 3D camera system through analyzing the captured image of the target object.
    Type: Grant
    Filed: September 4, 2018
    Date of Patent: June 15, 2021
    Assignee: SUNGKYUNKWAN UNIVERSITY FOUNDATION FOR CORPORATE COLLABORATION
    Inventors: Sukhan Lee, Moon Wook Ryu, Dae Sik Kim