Abstract: An imaging device includes: an area light source including an emission surface from which a sub-terahertz wave is emitted to a measurement target; and a detector including an image sensor that receives a reflected wave generated by the measurement target reflecting the sub-terahertz wave emitted from the emission surface. The area light source includes: at least one point light source that emits a sub-terahertz wave; and a reflector that reflects the sub-terahertz wave emitted from the at least one point light source, to generate a sub-terahertz wave to be emitted from the emission surface. The reflector has a reflection surface that is a bumpy surface which includes two or more frequency components in a spatial frequency range and whose roughness curve element mean length RSm is at least 0.3 mm.

Abstract: The present invention provides a method for calculating a corrected substrate height map of a first substrate using a height level sensor. The method comprises: sampling the first substrate by means of the height level sensor with the first substrate moving with a first velocity, wherein the first velocity is a first at least partially non-constant velocity of the first substrate with respect to the height level sensor, to generate a first height level data, generating a first height map based on the first height level data, and calculating a corrected substrate height map by subtracting a correction map from the first height map, wherein the correction map is calculated from the difference between a first velocity height map and a second velocity height map.

Abstract: The present disclosure describes a system and method for coaxial LiDAR scanning. The system includes a first light source configured to provide first light pulses. The system also includes one or more beam steering apparatuses optically coupled to the first light source. Each beam steering apparatus comprises a rotatable concave reflector and a light beam steering device disposed at least partially within the rotatable concave reflector. The combination of the light beam steering device and the rotatable concave reflector, when moving with respect to each other, steers the one or more first light pulses both vertically and horizontally to illuminate an object within a field-of-view; obtain one or more first returning light pulses, the one or more first returning light pulses being generated based on the steered first light pulses illuminating an object within the field-of-view, and redirects the one or more first returning light pulses.

Abstract: A light detection device may include: a light receiver comprising a plurality of light detectors configured to receive light emitted from a light emitter toward an object and reflected by the object; and a signal processor configured to process an electrical signal according to the light received by the light receiver. The light receiver includes at least one light receiving area, wherein each of the at least one light receiving area includes a plurality of sub-light receiving areas, and the plurality of light detectors are disposed in the plurality of sub-light receiving areas, respectively. The signal processor includes a plurality of transimpedance amplifiers that have a one-on-one correspondence with the plurality of light detectors, and at least one signal summer that has the one-on-one correspondence with the at least one light receiving area.

Abstract: The present disclosure describes a system and method for coaxial LiDAR scanning. The system includes a first light source configured to provide first light pulses. The system also includes one or more beam steering apparatuses optically coupled to the first light source. Each beam steering apparatus comprises a rotatable concave reflector and a light beam steering device disposed at least partially within the rotatable concave reflector. The combination of the light beam steering device and the rotatable concave reflector, when moving with respect to each other, steers the one or more first light pulses both vertically and horizontally to illuminate an object within a field-of-view; obtain one or more first returning light pulses, the one or more first returning light pulses being generated based on the steered first light pulses illuminating an object within the field-of-view, and redirects the one or more first returning light pulses.

Abstract: Detecting material properties such reflectivity, true color and other properties of surfaces in a real world environment is described in various examples using a single hand-held device. For example, the detected material properties are calculated using a photometric stereo system which exploits known relationships between lighting conditions, surface normals, true color and image intensity. In examples, a user moves around in an environment capturing color images of surfaces in the scene from different orientations under known lighting conditions. In various examples, surfaces normals of patches of surfaces are calculated using the captured data to enable fine detail such as human hair, netting, textured surfaces to be modeled. In examples, the modeled data is used to render images depicting the scene with realism or to superimpose virtual graphics on the real world in a realistic manner.

Abstract: Aspects and implementations of the present disclosure address shortcomings of the existing technology by enabling motion pattern-assisted object classification of objects in an environment of an autonomous vehicle (AV) by obtaining, from a sensing system of the AV, a plurality of return points, each return point comprising one or more velocity values and one or more coordinates of a reflecting region that reflects a signal emitted by the sensing system, identifying an association of the plurality of return points with an object in an environment of the AV, identifying, in view of the one or more velocity values of at least some of the plurality of return points, a type of the object or a type of a motion of the object, and causing a driving path of the AV to be determined in view of the identified type of the object.

Abstract: Provided is a method for measuring surface characteristics of at least a portion of an object, including providing a light source; generating a first interference pattern on the at least a portion of the object; capturing an image of the first interference pattern; shifting the phase of the light source to generate a second interference pattern; capturing an image of the second interference pattern; filtering distortion from the interference patterns; extracting a wrapped phase of the at least a portion of the object based on the images; unwrapping the wrapped phase of the at least a portion of the object to generate an unwrapped phase; identifying a computed depth map distance to the at least a portion of the object; and fitting an ideal part to the computed depth map of the at least a portion of the object to measure the surface characteristics.

Abstract: Some implementations described herein provide a laser device. The laser device includes a first portion of the laser device, at a proximal end of the laser device, that includes one or more optical devices, where the first portion is configured to emit first electromagnetic waves having a first wavelength. The laser device includes a second portion of the laser device, at a distal end of the laser device, that includes an optical crystal configured to receive the first electromagnetic waves and to emit second electromagnetic waves having a second wavelength based on reception of the first electromagnetic waves, where the optical crystal includes a thin film coating disposed on an end of the optical crystal, the thin film coating configured to: support emission of the second electromagnetic waves from the optical crystal, and support internal reflection of the first electromagnetic waves within the optical crystal.

Abstract: A method and apparatus are provided for a spectroscopic measurement for determining a lateral recess depth in the sidewall of a microstructure. The structure is formed on a larger substrate with the sidewall in an upright position relative to the substrate, and the recess extends essentially parallel to the substrate. The recess may be an etch depth obtained by etching a first layer relative to two adjacent layers, the layers oriented parallel to the substrate, the etch process progressing inward from the sidewall. An incident energy beam falling on the structure generates a spectroscopic response captured and processed respectively by a detector and a processing unit. The response comprises one or more peaks related to the material or materials of the substrate and the structure. According to the method, a parameter is derived from said one or more peaks, that is representative of the lateral recess depth.

Abstract: A light source device includes: a light-emitting section including a light-emitting element, the light-emitting element including a thyristor; a setter that sets the light-emitting element of the light-emitting section as a light-emitting element that emits light; and a controller that cancels an ON setting received from the setter after shifting the light-emitting element to a state in which the light-emitting element is able to emit light and that causes the light-emitting element to emit light multiple times by turning ON and OFF a light-emitting current, the light-emitting current causing the light-emitting element to emit light.

Abstract: A calibration method of three-dimensional measurement system includes a projection device, a camera and a processor. The projection device projects structural light to a reference object including a first calibration surface and a second calibration surface. The camera photographs the reference object to obtain at least one reference object image. The processor performs decoding according to the at least one reference object image to obtain a plurality of pieces of phase data of the at least one reference object image. The processor computes a first phase corresponding to the first calibration surface and a second phase corresponding to the second calibration surface according to the phase data, calculates a surface phase difference between the first phase and the second phase, and computes according to the surface phase difference and a height of the second calibration surface relative to the first calibration surface to obtain a phase-height conversion parameter.

Abstract: Cameras and lights positioning system for hose inspection during air-to-air refueling, which comprises a substructure that can be attached to a container or capsule or Pod, one or two guidance-substructures (13) that enclose the hose, a toroid volume, to house the cameras (22) and lights (23) and a cameras and lights control subsystem. The system allows for the cameras (22) and lights (23) to maintain a fixed relative position with respect to the hose (1) during moments of imagery acquisition, despite the inclination and the five different movements that the hose has and makes, at the same time allowing protuberances (38) to pass through the system.

Abstract: Techniques, systems and articles are described for preparing electrical cables for connections to a power grid. In one example, a cable-cross-section-measurement tool includes a housing defining a cavity, wherein the housing is configured to position an end-face of an electrical cable within the cavity; a camera disclosed within the cavity of the housing, wherein the camera is configured to capture an image of the end-face of the electrical cable; and a telecentric lens optically coupled to the camera, wherein the telecentric lens comprises a non-angular field of view configured to reduce, in the image, distortion from parallax associated with at least one portion of the end-face of the electrical cable that is oriented at an oblique angle relative to an optical axis of the telecentric lens.

Abstract: An apparatus includes a substrate holder, a first actuator to rotate the substrate holder, a second actuator to move the substrate holder linearly, a first sensor to generate one or more first measurements or images of the substrate, a second sensor to generate one or more second measurements of target positions on the substrate, and a processing device. The processing device estimates a position of the substrate on the substrate holder and causes the first actuator to rotate the substrate holder about a first axis. The rotation causes an offset between a field of view of the second sensor and a target position on the substrate due to the substrate not being centered on the substrate holder. The processing device causes the second actuator to move the substrate holder linearly along a second axis to correct the offset. The processing device determines a profile across a surface of the substrate based on the one or more second measurements of the target positions.

Abstract: A device for measuring a curvature radius includes a sample stage configured to support a sample to be measured, a diffracted light array generation module configured to generate and emit a diffracted light array to the sample, and a detection and analysis module configured to receive a reflected light array emitted from the sample and to obtain the curvature radius of the sample according to a dimension of the received reflected light array. Also disclosed is a method for measuring the curvature radius.

Abstract: A processing apparatus has: a light irradiation apparatus that irradiates a surface of an object with a processing light; and a measurement apparatus that measures a position of an irradiation area, which is formed on the surface of the object by the light irradiation apparatus, relative to the object.

Abstract: According to an embodiment, an optical apparatus includes an illumination unit, a light-receiving unit and a processing unit. The illumination unit can illuminate an object with a plurality of pattern rays including rays with different wavelengths simultaneously. The light-receiving unit includes a pixel that can receive the rays from the object to disperse at least two of the different wavelengths included in the pattern rays. The processing unit acquires information on the object based on a result of the pixel of the light-receiving unit receiving the pattern rays with which the illumination unit illuminates the object simultaneously.

Abstract: A machine vision-based method and system for locating an object within a scene are provided. The method includes uniformly illuminating a target surface of the object within the scene with light having an intensity within a relatively narrow range of wavelengths such that the light overwhelms the intensity of ambient light within the narrow range to obtain reflected, backscattered illumination. The method also includes sensing brightness of the surface due to a diffuse component of the backscattered illumination to obtain brightness information. Backscattered illumination from the target surface is inspected to obtain geometric information. Rotationally and positionally invariant surface albedo of the object is computed based on the brightness and geometric information. The surface albedo and the geometric information may then be used by a matching algorithm.

Abstract: A quartz glass crucible 1 having a cylindrical side wall portion 10a, a bottom portion 10b, and a corner portion 10c connecting the side wall portion 10a and the bottom portion 10b to each other includes a transparent layer 11 made of quartz glass, and a bubble layer 12 made of quartz glass and formed outside the transparent layer 11. A ratio of an infrared transmittance of the corner portion 10c at a maximum thickness position of the corner portion 10c to an infrared transmittance of the side wall portion 10a is 0.3 or more and 0.99 or less, and an absolute value of a rate of change in infrared transmittance in a height direction along a wall surface of the crucible from a center of the bottom portion 10b toward an upper end of the side wall portion 10a is 3%/cm or less.

Abstract: Measuring or inspecting samples through non-destructive systems and methods. Multiple light pulses emitted from a light source. The light pulses are split into pump pulses and probe pulses. A first probe pulse reaches the surface of a sample after a first time duration after a first pump pulse reaches the surface. A second pump pulse reaches the surface after a time duration after the first probe pulse. When the second pump pulse reflects off the sample, the second pump pulse may be altered by an acoustic wave generated by the first probe pulse. The reflected second pump pulse may be analyzed to determine a characteristic of the sample.

Abstract: To suppress occurrence of a delay in detection of a valid address event to be originally detected. An image pickup element includes a plurality of pixels (100), a pixel address event detection unit (120), a region address event detection unit (320), and a pixel selection unit (310). The pixel (100) includes a photoelectric conversion unit (110) that performs photoelectric conversion of incident light. The pixel address event detection unit (120) is arranged in each pixel and detects a pixel address event that is an address event of a pixel itself. The pixel address event is detected based on a change amount of charge generated by the photoelectric conversion. The region address event detection unit (320) detects a region address event that is an address event in a predetermined region. The region address event is detected based on a change in a charge amount generated by the photoelectric conversion in a plurality of pixels in the predetermined region among the plurality of pixels.

Abstract: The information display apparatus includes a sheet display section; a mechanical mechanism that moves the display section, and switches a state of the display section between a deployment state in which a display space is formed and a non-deployment state in which the display space is not formed; a motion sensor that detects a motion of the display section; and a controller that calculates, from data of the detection performed by the motion sensor, at least motion information other than a component related to the movement of the display section that is performed by the mechanical mechanism, and determines an anomaly.

Abstract: A tracker, a surgical tracking system, and a method for operating the tracker are provided. The tracker comprises an interface configured to attach the tracker to a surgical object that is to be tracked. The tracker further comprises circuitry comprising a detector configured to detect electromagnetic radiation, wherein the circuitry is configured to generate a trigger signal upon detection of a change of intensity of electromagnetic radiation by the detector. The circuitry further comprises a plurality of emitters configured to emit electromagnetic radiation, wherein the circuitry is configured to control the plurality of emitters to emit electromagnetic radiation responsive to the trigger signal.

Abstract: Provided are a method and apparatus for locating an obstacle in a semantic map, a computer device, and a storage medium. The method includes: acquiring obstacle coordinates of an obstacle and a travel velocity of the obstacle; selecting an initial region in the semantic map according to a preset selection radius and according to the obstacle coordinates; and performing screening on a plurality of waypoints in the initial region by using a preset screening rule so as to obtain a target waypoint matching a position of the obstacle in the semantic map, and using the target waypoint as the position of the obstacle in the semantic map.

Abstract: An apparatus which analyses a depth of a holographic image is provided. The apparatus includes an acquisition unit that acquires a hologram, a restoration unit that restores a three-dimensional holographic image by irradiating the hologram with a light source, an image sensing unit that senses a depth information image of the restored holographic image, and an analysis display unit that analyzes a depth quality of the holographic image, based on the sensed depth information image, and the image sensing unit uses a lensless type of photosensor.

Abstract: The present disclosure provides a method for calibrating a rotation center based on a blade local leading-edge curve feature. The method acquires a blade local leading-edge curve feature before and after rotation, solves centroid coordinates according to maximum values in the blade local leading-edge curve features in the two times, and then solves a rotation center according to the centroid coordinates, thereby calibrating a coordinate of the rotation center. Compared with a point calibration method in the prior art, the present disclosure has a more accurate result by curve calibration and is more suitable for a real rotation center; and the method also has a more accurate blade measurement result when applied to measuring a blade cross-section curve feature.

Abstract: Methods, systems and devices for optical structural health monitoring of a subject, including the utilization of pointillism to provide a design or painting of the surface of the structure to be monitored, which also serves as a mechanism for conducting SHM, implementing digital image correlation (DIC) by applying a pattern comprising a random dot pattern and/or codes. The subject is imaged using imaging equipment to capture images of the pattern. For some applications, the captured images of the pattern and codes are stored in a CAD file that represents the subject or portion thereof to which the pattern and codes are applied, and includes the locations of the pattern and codes. Indicia applied to a structure may be applied using a paintjet or inkjet, or robotic mechanism, while some applications implement pre-patterning of a composite sheet that is used to form the structure.

Abstract: The invention provides an apparatus configured for determining a distance of the apparatus to an object according to the principle of triangulation. The apparatus comprises a transmissive device with a predefined distance between a first surface and a second surface of the transmissive device, and a detector that is configured to receive at least a portion of a radiation beam after interaction with the transmissive device and the object. The first surface is arranged to reflect a first part of the radiation beam, and the second surface is arranged to reflect a second part of the radiation beam. The predefined distance is used for determining the distance of the apparatus to the object.

Abstract: Described is a metrology system for determining a characteristic of interest relating to at least one structure on a substrate, and associated method. The metrology system comprises a processor being configured to computationally determine phase and amplitude information from a detected characteristic of scattered radiation having been reflected or scattered by the at least one structure as a result of illumination of said at least one structure with illumination radiation in a measurement acquisition, and use the determined phase and amplitude to determine the characteristic of interest.

Abstract: Systems and methods for optically measuring a position of a measurement surface relative to a reference position. The system is a wireless network comprising a centrally located data acquisition computer and a multiplicity of remotely located sensor modules mounted at different locations within wireless communication range of a central receiver. Each sensor module is mounted to a clamp that is made specific to a control surface location and embedded with an RFID tag to denote clamp location. The optical components of the sensor modules are selected to enable indication of the linear position of a measurement surface relative to a reference position and then broadcast the measurement results. The broadcast results are received by the central receiver and processed by the data acquisition computer, which hosts human interface software that displays measurement data.

Abstract: An apparatus to generate data relating to a specular surface of an object, the apparatus including a screen that is movable relative to the object, a graphic rendered on the screen' wherein the graphic is notionally divided into contiguous segments such that the graphic content in each segment allows that segment to be distinguished from a plurality of other segments, at least one camera for capturing successive frames of the object' illuminated by said graphic, during said relative movement of the screen, and a computing device that accepts data from pixels of the captured frames.

Abstract: Automatic selection of region in 3D point cloud is provided. Neighbor points are determined for given seed point of seed points. Responsive to a color difference of a given neighbor point from given seed point being less than neighbor color distance threshold and responsive to an angle between a normal of given neighbor point and a normal of given seed point being less than neighbor normal angle threshold, given neighbor point is added to region in 3D point cloud. Responsive to curvature at given neighbor point being less than curvature threshold, responsive to color difference of given neighbor point from initial seed point being less than initial seed color distance threshold and responsive to an angle between a normal of given neighbor point and a normal of initial seed point being less than an initial seed normal angle, given neighbor point is added to seed points for processing.

Abstract: Systems and methods are disclosed comprising a robotic device, an instrument attachable to the robotic device to treat tissue, a vision device attached to the robotic device or instrument, and one or more controllers. The vision device generates vision data sets captured from multiple perspectives of the physical object enabled by the vision device moving in a plurality of degrees of freedom during movement of the robotic device. The controller(s) have at least one processor and are in communication with the vision device. The controller(s) associate a virtual object with the physical object based on one or more features of the physical object identifiable in the vision data sets. The virtual object at least partially defines a virtual boundary defining a constraint on movement of the robotic device relative to the physical object. In some cases, movement of the robotic device is actively constrained by using the virtual boundary.

Abstract: Provided is a technique capable of more accurately determining a solder protruding defect in an appearance inspection device that acquires an image of an inspection region of an inspection target and measures a height of a predetermined place in the inspection region with a height measurement device. The appearance inspection device includes: an imaging unit (3); a height measurement unit (20); a moving mechanism (5) that moves the imaging unit (3) and the height measurement unit (20). When a restricted region (M) in the inspection target is irradiated with the measurement light emitted from the height measurement unit (20), the determination unit restricts defect determination based on the information on the height of the predetermined place measured by the height measurement unit (20).

Abstract: A three-dimensional measurement apparatus measures measurement targets placed in a target measurement area on a measurement object. The apparatus includes: a measurement module that: is positioned with respect to the target measurement area, and includes: a first irradiator that irradiates the target measurement area with predetermined light for height measurement; a second irradiator that irradiates the target measurement area with predetermined patterned light for three-dimensional measurement; and an imaging device that takes an image of the target measurement area; and a control device that moves the measurement module in a height direction and successively positions the measurement module at a predetermined height position determined by mapping, and performs, based on image data taken by irradiating the target measurement area with predetermined patterned light, three-dimensional measurement to the measurement targets at the predetermined height position.

Abstract: Example implementations relate to an inspection method for training a measurement machine to accurately measure side joint lengths and detecting a defect among a plurality of solder joints. The method includes receiving a first data representing the side joint lengths of the plurality of solder joints measured by a first measurement machine and a second data representing the side joint lengths measured by a second measurement machine. Further, the method includes determining a correlation value based on a statistical analysis of a relationship between the first data and the second data. The method further includes updating an algorithm used by the first measurement machine to measure the side joint lengths, based on the correlation value to reduce deviation between the first data and the second data. Later, the updated algorithm is used as a dimensional metrology in the first measurement machine for detecting the defect in the solder joints.

Abstract: Apparatus and methods to automatically inspect precision tabletops used for vibration isolation are described. An inspection head having an imaging device and/or perturbing device can be positioned automatically at a plurality of locations over a precision tabletop. The inspection head can further include a distance sensor that can be used to determine a flatness of a portion or all of a surface of the precision tabletop. The inspection head may further include marking apparatus to automatically mark non-compliant features formed on the precision tabletop.

Abstract: The present invention is generally directed to systems and methods for preparing and producing a custom-fitted face mask, including, as non-limiting examples, a CPAP nasal mask and a CPAP full face mask. At least one embodiment of the invention utilizes infrared (IR) lasers, such as, for example, those found on smartphone cameras, in order to generate a 3D point cloud model of an individual's face. This point cloud model is then used to produce a custom face mask cushion, which is used to customize a generic face mask to conform to the user's specific facial geometry.

Abstract: A method for measuring a substrate for semiconductor lithography using a measuring device, wherein the measuring device comprises a recording device for capturing at least a partial region of the substrate and, wherein the distance between the substrate and an imaging optical unit of the recording device is varied while the partial region is captured by the recording device.

Abstract: A spatial light modulator (SLM) comprised of a 2D array of optically-controlled semiconductor nanocavities can have a fast modulation rate, small pixel pitch, low pixel tuning energy, and millions of pixels. Incoherent pump light from a control projector tunes each PhC cavity via the free-carrier dispersion effect, thereby modulating the coherent probe field emitted from the cavity array. The use of high-Q/V semiconductor cavities enables energy-efficient all-optical control and eliminates the need for individual tuning elements, which degrade the performance and limit the size of the optical surface. Using this technique, an SLM with 106 pixels, micron-order pixel pitch, and GHz-order refresh rates could be realized with less than 1 W of pump power.

Abstract: A method includes providing a measuring device having a projector, a camera with a photosensitive array, and a processor, projecting with the projector a line of light onto an object, capturing with the camera an image of the projected line of light on the object within a window subregion of the photosensitive array, and calculating with the processor three-dimensional (3D) coordinates of points on the object based at least in part on the projected line of light and on the captured image.

Abstract: When removing portions of a work surface at a worksite with a machine (e.g., such as a cold planer), is useful to know the actual cut depths on each edge of the cold planer and/or the volume of material that has been removed from a work surface. However, determining actual cut depths and/or volume removed is difficult, costly, and can be inaccurate, resulting in increased costs and inefficiencies at the worksite. Accordingly, the present disclosure describes systems and methods for enabling automatic control of cut depth of a machine via a machine-controlled feedback loop and improved determinations of actual volume of material removed by the machine.

Abstract: A metrology apparatus for and a method of determining a characteristic of interest relating to at least one structure on a substrate. The metrology apparatus comprises a sensor and an optical system. The sensor is for detecting characteristics of radiation impinging on the sensor. The optical system comprises an illumination path and a detection path. The optical system is configured to illuminate the at least one structure with radiation received from a source via the illumination path. The optical system is configured to receive radiation scattered by the at least one structure and to transmit the received radiation to the sensor via the detection path.

Abstract: A method for measuring and registering 3D coordinates has a 3D scanner measure a first collection of 3D coordinates of points from a first registration position. A 2D scanner collects horizontal 2D scan sets as 3D measuring device moves from first to second registration positions. A processor determines first and second translation values and a first rotation value based on collected 2D scan sets. 3D scanner measures a second collection of 3D coordinates of points from second registration position. Processor adjusts second collection of points relative to first collection of points based at least in part on first and second translation values and first rotation value. Processor identifies a correspondence among registration targets in first and second collection of 3D coordinates, and uses this correspondence to further adjust the relative position and orientation of first and second collection of 3D coordinates.

Abstract: A calibration method for fringe projection systems based on plane mirrors. Firstly, two mirrors are placed behind the tested object. Through the reflection of mirrors, the camera can image the measured object from the front and other two perspectives, so as to obtain 360-degree two-dimensional information of the measured object. The projector projects three sets of phase-shifting fringe patterns with frequencies of 1, 8, and 64. The camera captures the fringe image to obtain an absolute phase map with a frequency of 64 by using the phase-shifting method and the temporal phase unwrapping algorithm. By using the calibration parameters between the projector and the camera, the absolute phase map can be converted into three-dimensional information of the measured object. Then, the mirror calibration is realized by capturing a set of 3D feature point pairs, so that the 3D information from different perspectives is transformed into a unified world coordinate system.

Abstract: Provided is a method for measuring surface characteristics of at least a portion of an object, including providing a light source; generating a first interference pattern on the at least a portion of the object; capturing an image of the first interference pattern; shifting the phase of the light source to generate a second interference pattern; capturing an image of the second interference pattern; filtering distortion from the interference patterns; extracting a wrapped phase of the at least a portion of the object based on the images; unwrapping the wrapped phase of the at least a portion of the object to generate an unwrapped phase; identifying a computed depth map distance to the at least a portion of the object; and fitting an ideal part to the computed depth map of the at least a portion of the object to measure the surface characteristics.

Abstract: Convenience is improved by enabling an imaging section to capture an image of a measurement element without adjustment of a rotation angle of a measurement object performed by a user. A control unit identifies a reference rotation angle during measurement, and calculates a measurement angle to measure a measurement element based on a relative rotation angle with respect to the reference rotation angle stored in advance. The control unit controls a rotation unit such that a rotation angle of the rotation unit becomes the measurement angle. The control unit executes a process of measuring a dimension of the measurement element based on a measurement object image captured by an imaging section when the rotation angle of the rotation unit becomes the measurement angle.

Abstract: A MEMS scanning device (“Device”) includes at least (1) laser projector(s) controlled by a laser drive to project a laser beam, (2) MEMS scanning mirror(s) controlled by a MEMS drive to scan the laser beam to generate a raster scan, (3) a display configured to receive the raster scan, (4) a thermometer configured to detect a current temperature, (5) a display observing camera configured to capture an image of a predetermined area of the display, and (6) a computer-readable media that stores temperature model(s), each of which is custom-built using machine learning. The device uses the display observing camera to capture image(s) of predetermined pattern(s), which are then used to extract feature(s). The extracted feature(s) are compared with ideal feature(s) to identify a discrepancy. When the identified discrepancy is greater than a threshold, the temperature model(s) are updated accordingly.

Abstract: A substrate manufacturing machine (component mounter) includes a substrate type setting section configured to set next and subsequent substrate types to be manufactured subsequently to a current substrate type currently being manufactured, a substrate type checking section configured to check whether the set next and subsequent substrate types are correct, a manufacturing condition investigation section configured to examine whether a manufacturing condition for manufacturing substrates of the next and subsequent substrate types is satisfied, and a manufacturing authorization section configured to authorize manufacturing of the substrates of the next and subsequent substrate types in a case where the next and subsequent substrate types are correct and the manufacturing condition is satisfied.