Abstract: The present teaching relates to different configurations for facilitating calibration of multiple sensors of different types. A plurality of fiducial markers are arranged in space for simultaneously calibrating multiple sensors of different types. Each of the plurality of fiducial markers has a feature point thereon and is provided to enable the multiple sensors to calibrate by detecting the features points and estimating their corresponding 3D coordinates with respect to respective coordinate systems of the multiple sensors.

Abstract: Disclosed is a 3D scanner for recording the 3D topography of an object, the 3D scanner including: a projector unit configured for projecting a structured beam of probe light onto the object; an imaging unit arranged to acquire 2D images of the object when the object is illuminated by the structured probe light beam; and an actuator unit arranged to control the position of the structured probe light beam at the object by rotating a movable portion of the projector unit around a pivoting axis, the actuator unit including a rotation motor including or arranged to drive a wheel, where the surface of the wheel operatively coupled to the movable portion of the projector unit has a radial distance from the axis of the rotation motor which changes with the rotation.

Abstract: Disclosed herein is a novel technique that employs non-invasive ultrasound for spatiotemporal modulation of the refractive index in a medium to define and control the trajectory of light within the medium itself, thereby creating a virtual sculpted lens. By varying the amplitude of ultrasonic waves in the medium, the numerical aperture (NA) value of the virtual sculpted lens can be changed. The location of the focus of the virtual sculpted lens can be precisely scanned within a scattering tissue.

Abstract: Various methods and systems for securing imaging systems are provided. In one embodiment, a method for an imaging system comprises monitoring usage of the imaging system in real-time while a user is controlling the imaging system, detecting that the usage of the imaging system is an abnormal usage, and performing one or more corrective actions based on the abnormal usage. In this way, an imaging system may be secured from cyber-attacks that may attempt to maliciously execute in an abnormal context while appearing legitimate to typical security controls.

Abstract: A three-dimensional shape measuring method includes: projecting a first grid pattern based on a first light and a second grid pattern based on a second light onto a target object in such a way that the first grid pattern and the second grid pattern intersect each other, the first light and the second light being lights of two colors included in three primary colors of light; picking up, by a three-color camera, an image of the first grid pattern and the second grid pattern projected on the target object, and acquiring a first picked-up image based on the first light and a second picked-up image based on the second light; and performing a phase analysis of a grid image with respect to at least one of the first picked-up image and the second picked-up image and calculating height information of the target object.

Abstract: Embodiments disclosed herein include a semiconductor manufacturing tool with a hybrid model and methods of using the hybrid model for processing wafers and/or developing process recipes. In an embodiment, a method for developing a semiconductor manufacturing process recipe comprises selecting one or more device outcomes, and querying a hybrid model to obtain a process recipe recommendation suitable for obtaining the device outcomes. In an embodiment, the hybrid process model comprises a statistical model and a physical model. In an embodiment, the method may further comprise executing a design of experiment (DoE) on a set of wafers to validate the process recipe recommended by the hybrid process model.

Abstract: A sensor apparatus includes a sensor having a field of view, a sensor window through which the field of view extends; an air nozzle positioned to direct airflow across the sensor window; a surface fixed relative to the sensor window, the surface including a plurality of heat-dissipation fins; and a cover extending over the fins and including an inlet. The inlet is positioned at an opposite edge of the sensor window from the air nozzle. The air nozzle is aimed at the inlet.

Abstract: A point cloud capture system is provided to detect and correct data density during point cloud generation. The system obtains data points that are distributed within a space and that collectively represent one or more surfaces of an object, scene, or environment. The system computes the different densities with which the data points are distributed in different regions of the space, and presents an interface with a first representation for a first region of the space in which a first subset of the data points are distributed with a first density, and a second representation for a second region of the space in which a second subset of the data points are distributed with a second density.

Abstract: A method and apparatus for performing automated supervision and inspection of an assembly process. The method is implemented using a computer system. Sensor data is generated at an assembly site using a sensor system positioned relative to the assembly site. A three-dimensional global map for the assembly site and an assembly being built at the assembly site is generated using the sensor data. A current stage of an assembly process for building an assembly at the assembly site is identified using the three-dimensional global map. A context for the current stage is identified. A quality report for the assembly is generated based on the three-dimensional global map and the context for the current stage.

Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for determining an artificial neural network architecture corresponding to a sub-graph of a synaptic connectivity graph. In one aspect, there is provided a method comprising: obtaining data defining a graph representing synaptic connectivity between neurons in a brain of a biological organism; determining, for each node in the graph, a respective set of one or more node features characterizing a structure of the graph relative to the node; identifying a sub-graph of the graph, comprising selecting a proper subset of the nodes in the graph for inclusion in the sub-graph based on the node features of the nodes in the graph; and determining an artificial neural network architecture corresponding to the sub-graph of the graph.

Abstract: Disclosed herein is a system and method for facilitating estimation of a spatial profile of an environment based on a light detection and ranging (LiDAR) based technique. In one arrangement, the present disclosure facilitates spatial profile estimation based on directing light over one dimension, such as along the vertical direction. In another arrangement, by further directing the one-dimensionally directed light in another dimension, such as along the horizontal direction, the present disclosure facilitates spatial profile estimation based on directing light in two dimensions.

Abstract: This invention provides a system and method for generating camera calibrations for a vision system camera along three discrete planes in a 3D volume space that uses at least two (e.g. parallel) object planes at different known heights. For any third (e.g. parallel) plane of a specified height, the system and method then automatically generates calibration data for the camera by interpolating/extrapolating from the first two calibrations. This alleviates the need to set the calibration object at more than two heights, speeding the calibration process and simplifying the user's calibration setup, and also allowing interpolation/extrapolation to heights that are space-constrained, and not readily accessible by a calibration object. The calibration plate can be calibrated at each height using a full 2D hand-eye calibration, or using a hand-eye calibration at the first height and then at a second height with translation to a known position along the height (e.g. Z) direction.

Abstract: Methods and systems for modelling pipeline construction, include or implement steps of (a) obtaining ranging data of a pipeline construction location including a pipe; (b) processing the ranging data to produce a spatially organized point cloud; and (c) processing the point cloud to identify at least one geometric feature comprising a point or a two-dimensional feature representative of a pipe centreline, and associating the at least one geometric feature with the pipeline construction location. The ranging data may be data obtained from a lidar device. The pipeline construction may be underground construction, where pipe is laid in a ditch. Relevant information, such as depth-of-cover may be calculated from identified geometric features. Relevant information may be determined in real-time or near-real-time and displayed, communicated or recorded as desired.

Abstract: A metrology system may include an imaging sub-system to image a metrology target buried in a sample, where the sample is formed from bonded first and second substrates with a metrology target at the interface. The metrology system may further include an illumination sub-system with an illumination field stop and an illumination pupil, where the illumination field stop includes an aperture to provide that a projected size of the field-stop aperture on a measurement plane corresponding to the metrology target matches a field of view of the detector at the measurement plane, and where the illumination pupil includes a central obscuration to provide oblique illumination of the metrology target with angles greater than a cutoff angle selected to prevent illumination from the illumination source from reflecting off of the bottom surface of the sample and through the field of view of the detector at the measurement plane.

Abstract: A point cloud capture system is provided to detect and correct data density during point cloud generation. The system obtains data points that are distributed within a space and that collectively represent one or more surfaces of an object, scene, or environment. The system computes the different densities with which the data points are distributed in different regions of the space, and presents an interface with a first representation for a first region of the space in which a first subset of the data points are distributed with a first density, and a second representation for a second region of the space in which a second subset of the data points are distributed with a second density.

Abstract: An imaging system comprises multiple light sources, a beam combiner, an optical array sensor, and a computing device. A first light source forms a first beam of light at a first wavelength. A second light source forms a second beam of light at a second wavelength. The beam combiner combines the first beam of light and the second beam of light into a single beam of light and illuminates a specimen with the single beam of light. The optical array sensor detects reflected light that is reflected from the specimen. The computing device accesses sensor data from the optical array sensor, forms a first image based on the first wavelength and a second image based on the second wavelength, and forms a composite image from the first image and the second image.

Abstract: In a method of measuring a flatness of an object, a laser, which may have a wavelength reflectable from the object, may be converted into a laser array. The laser array may be irradiated to the object. The flatness of the object may be measured using a reflected laser array reflected from the object. Thus, the flatness of the object may be accurately measured to decrease process errors of a display device by correcting the flatness of the glass substrate.

Abstract: There are provided an electric resistance welded steel pipe for producing a high strength hollow stabilizer excellent in fatigue resistance and a high strength hollow stabilizer. In an electric resistance welded steel pipe (5) for producing a hollow stabilizer, an internal weld bead cut portion (30) has a three-peak shape and a depth (H) of a trough portion (30a) of the three-peak shape is 0.3 mm or less and an angle (?) formed by a central portion in the circumferential direction of the trough portion (30a) and the top of right and left peak portions (30b, 30c) located on both the right and left sides of the trough portion (30a) is 160° or more and less than 180°.

Abstract: A system and kit for capturing a 3D image of a body a user includes a plurality of pillar segments being configurable between an assembled configuration and a disassembled configuration. In the assembled configuration, the pillar segments are joined to form one or more upstanding sensing pillars. A plurality of sensors operable to capture image data are distributed along the one or more sensing pillars. The plurality of sensors have fields of view that are overlapping when supported on the sensing pillars. In the disassembled configuration, transportation of the pillar segments is facilitated. The system and kit may be suitable for use at a remote location. Additional functionalities may include a power storage unit, solar charging panels, climate control subsystem, and wireless communication submodule. In operation, the sensing pillars may be enclosed within an enclosure.

Abstract: Provided is a method for manufacturing a semiconductor device utilizing the feature that there are a plurality of semiconductor substrates to measure the thickness thereof, when measuring the thickness of a plurality of semiconductor substrates upon the laser annealing treatment. For each of at least one semiconductor substrate of the plurality of semiconductor substrates, a laser annealing treatment is performed by controlling a laser beam irradiating the semiconductor substrate based on self-thickness data being data of a result of measurement of a thickness of the semiconductor substrate and reference thickness data being data of a result of measurement of a thickness of at least one semiconductor substrate other than the semiconductor substrate among the plurality of semiconductor substrates.

Abstract: Described is a metrology system for determining a characteristic of interest relating to at least one structure on a substrate, and associated method. The metrology system comprises a processor being configured to computationally determine phase and amplitude information from a detected characteristic of scattered radiation having been reflected or scattered by the at least one structure as a result of illumination of said at least one structure with illumination radiation in a measurement acquisition, and use the determined phase and amplitude to determine the characteristic of interest.

Abstract: Systems for generating in-focus color images are provided. Related methods and devices are also provided.

Abstract: Systems and methods for optically measuring a position of a measurement surface relative to a reference position. The system is a wireless network comprising a centrally located data acquisition computer and a multiplicity of remotely located sensor modules mounted at different locations within wireless communication range of a central receiver. Each sensor module is mounted to a clamp that is made specific to a control surface location and embedded with an RFID tag to denote clamp location. The optical components of the sensor modules are selected to enable indication of the linear position of a measurement surface relative to a reference position and then broadcast the measurement results. The broadcast results are received by the central receiver and processed by the data acquisition computer, which hosts human interface software that displays measurement data.

Abstract: A measurement system for matching and/or transmission measurements with respect to a device under test comprising an interface is provided. Said measurement system comprises at least one signal generator comprising at least one signal generator signal path, and at least one receiver comprising at least two receiver signal paths. In this context, a signal of a first signal generator signal path of the at least one signal generator signal path and/or a signal of a first receiver signal path of the at least two receiver signal paths is adaptively phase-shifted and/or amplitude-modified with respect to a signal of a second receiver signal path of the at least two receiver signal paths.

Abstract: A pToF sensor, a pToF pixel array and an operation method therefor are provided. The pToF pixel array includes a plurality of pToF pixels distributed in an array, a control circuit, and a conversion circuit. Each of the pToF pixels includes a photo sensitive unit configured to detect a return signal of a light pulse signal, and a first conversion unit configured to convert a time signal corresponding to each of the pToF pixels to an analog signal. The control circuit is connected to each of the pToF pixels, and configured to control an operation mode of each of the pToF pixels. The conversion circuit is connected to each of the pToF pixels, and configured to calculate a time-of-fight corresponding to each of the pToF pixels according to the analog signal corresponding to each of the pToF pixels.

Abstract: A system and method for obtaining a 3D pose of an object using 2D images from multiple 2D cameras. The method includes positioning a first 2D camera so that it is directed towards the object along a first optical axis, obtaining 2D images of the object by the first 2D camera, and extracting feature points from the 2D images from the first 2D camera using a first feature extraction process. The method also includes positioning a second 2D camera so that it is directed towards the object along a second optical axis, obtaining 2D images of the object by the second 2D camera, and extracting feature points from the 2D images from the second 2D camera using a second feature extraction process. The method then estimates the 3D pose of the object using the extracted feature points from both of the first and second feature extraction process.

Abstract: A metrology system includes an optical assembly portion; an adjustment mechanism configured to change a distance and an angular orientation between the optical assembly portion and a workpiece surface; and a processor configured to control the adjustment mechanism to move the optical assembly portion to position a workpiece surface within a focal Z autofocus range; capture an image stack of the workpiece surface wherein each image of the image stack corresponds to a different autofocus height; determine an autofocus height for at least three locations of the workpiece surface; control the adjustment mechanism based on the autofocus heights to rotate the optical assembly portion relative to the workpiece surface to nominally align the optical axis of the optical assembly portion with a surface normal of the workpiece surface and adjust a distance between the optical assembly portion and the workpiece surface; and execute a defined operation on the workpiece surface.

Abstract: A sensor suitable for detecting specific analytes, a method for manufacturing the sensor, and a method for using the sensor in a diagnostic procedure provided. In an embodiment, the sensor device includes a substrate, a dielectric layer disposed on the substrate, and a probe layer disposed on the dielectric layer. The probe layer is configured to react with an analyte. The reaction may include: binding with the analyte, undergoing a change in a chemical property of the probe layer, or undergoing a change in a structural property of the probe layer. In examples, an attribute of the dielectric layer is configured to identify the device during a process that determines whether the probe layer has reacted with the analyte.

Abstract: A metrology system for characterizing a sample formed from a first wafer and a second wafer bonded at an interface with a metrology target near the interface may include a metrology tool and a controller. The metrology tool may include one or more illumination sources and an illumination sub-system to direct illumination from the one or more illumination sources to the metrology target, a detector, and a collection sub-system to collect light from the sample. The light collected from the sample may include light from the metrology target and light from a top surface of the first wafer, and the collection sub-system is may direct the light from the metrology target to the detector. The controller may execute program instructions causing the one or more processors to generate estimates of one or more parameters associated with the sample based on data received from the detector.

Abstract: The present invention relates to ultrasound imaging, and in particular to a device for imaging bodily tissue under load. The device has a platform (10), for at least partially supporting a part of the body (2), at least one ultrasound device (20) for imaging of the part of the body (2) in contact with the platform (10), and means (32) for measuring the pressure exerted on the platform (10).

Abstract: A structured-light scanning system includes a plurality of switchable projectors that respectively generate emitted lights with a predetermined pattern, each switchable projector being capable of switchably generating either a two-dimensional (2D) emitted light or a three-dimensional (3D) emitted light; an optical alignment device that aligns the emitted lights to generate an aligned light, which is projected onto and reflected from a surface of an object, resulting in a reflected light; and an image sensor that detects the reflected light.

Abstract: A 3D measurement method including: projecting a pattern sequence onto a moving object; capturing a first image sequence with a first camera and a second image sequence synchronously to the first image sequence with a second camera; determining corresponding image points in the two sequences; computing a trajectory of a potential object point from imaging parameters and from known movement data for each pair of image points that is to be checked for correspondence. The potential object point is imaged by both image points in case they correspond. Imaging object positions derived therefrom at each of the capture points in time into image planes respectively of the two cameras. Corresponding image points positions are determined as trajectories in the two cameras and the image points are compared with each other along predetermined image point trajectories and examined for correspondence; lastly performing 3D measurement of the moved object by triangulation.

Abstract: Disclosed are methods, circuits, devices, systems and functionally associated computer executable code for image acquisition with depth estimation. According to some embodiments, there may be provided an imaging device including: (a) one or more imaging assemblies with at least one image sensor; (b) at least one structured light projector adapted to project onto a scene a multiresolution structured light pattern, which patterns includes multiresolution symbols or codes; and (3) image processing circuitry, dedicated or programmed onto a processor, adapted to identify multiresolution structured light symbols/codes within an acquired image of the scene.

Abstract: Detecting material properties such reflectivity, true color and other properties of surfaces in a real world environment is described in various examples using a single hand-held device. For example, the detected material properties are calculated using a photometric stereo system which exploits known relationships between lighting conditions, surface normals, true color and image intensity. In examples, a user moves around in an environment capturing color images of surfaces in the scene from different orientations under known lighting conditions. In various examples, surfaces normals of patches of surfaces are calculated using the captured data to enable fine detail such as human hair, netting, textured surfaces to be modeled. In examples, the modeled data is used to render images depicting the scene with realism or to superimpose virtual graphics on the real world in a realistic manner.

Abstract: Methods and systems including a measurement device and a smart mobile device including a camera, a processor, a memory communicatively coupled to the processor, and machine readable instructions stored in the memory that may cause a system to perform at least the following when executed by the processor: use the camera of the smart mobile device to capture an image of a remote product; apply a sizing algorithm to the image of the remote product to generate a relative product size; generate a relative distance to the remote product through the measurement device; and apply triangulation and linear regression algorithms to generate an automated actual product measurement of the remote product based on the relative product size and the relative distance.

Abstract: A 3D scene is acquired using a LIDAR system including a transmitter, a receiver, and a pivotable mirror arrangement between the transmitter and the 3D scene. The transmitter is operated as a laser light source and the receiver is configured as a matrix sensor with an irradiation optical system and light sensors distributed over a surface. Light points reflected in a spatially resolved manner at pixels of a point cloud of the 3D scene are generated by light pulses of the transmitter and by pivoting the mirror arrangement. An input signal is acquired from each of the light points by the light sensors and a distance of the light points to the matrix sensor is determined based on a light propagation time measurement. A defocused input signal of a light point including a plurality of light sensors is displayed by the irradiation optical system and the input signals are compared.

Abstract: A projection pattern is projected onto a surface of an object from a projection point of a distance by projecting a plurality of beams of light from the projection point. The plurality of beams of light creates a plurality of projection artifacts that is arranged in a grid on the surface of the object. A center projection artifact lies at an intersection of a grid longitude line and a grid latitude line. A projection of the plurality of beams is adjusted so that the longitude line and/or the latitude line is rotated by a predetermined amount from an original position to a new position, resulting in an adjusted projection pattern on the surface of the object. An image of the object, including at least a portion of the adjusted projection pattern, is captured. A distance from the distance sensor to the object is calculated using information from the image.

Abstract: Method for targeted application of active agents to a target surface including: creating a digital geometric representation of the target surface; providing an array of applicators; selecting an applicator from the array of applicators based on the target surface; disposing the active agent on the applicator surface of the applicator; disposing the applicator on the target surface so that the active agent is in contact with the target surface; and removing the applicator from the target surface while leaving at least some of the active agent in contact with the target surface.

Abstract: A probe system and a method are provided. The probe system includes an emitter unit, a pattern generation system, and an intensity modulator. The emitter unit is for emitting light. The pattern generation system is for projecting at least one reference structured-light pattern onto an object surface to obtain at least one reference projected pattern, and including a mirror scanning unit for reflecting the light to a plurality of directions. The intensity modulator is for modulating intensity of the light according to the at least one reference projected pattern to provide modulated light to the mirror scanning unit to reflect the modulated light to the plurality of directions to project at least one modulated structured-light pattern onto the object surface to obtain at least one modulated projected pattern.

Abstract: An image processing system includes a first light projection unit that projects, onto an object, a light pattern for specifying a three-dimensional shape; a second light projection unit that projects, onto the object, substantially uniform light, in which illumination energy is substantially uniform in a cross-sectional direction relative to a light projection direction, at substantially the same angle as in projection performed by the first light projection unit; an image capturing unit that captures images of the object; a generation unit that generates a division image by dividing components of a first captured image, which is captured while light is projected onto the object by the first light projection unit, by components of a second captured image, which is captured while light is projected onto the object by the second light projection unit; and a calculation unit that calculates three-dimensional positions on the object with use of the division image.

Abstract: An optical system is provided, including a light source, a light shape adjusting element, a light guiding module, and a driving assembly. The light source emits a light beam in a first direction, and the light shape adjusting element changes a cross-section of the light beam from a first shape to a second shape. The light guiding module includes a base and a light guiding element connected to the base for changing the propagation direction of the light beam from the first direction to a second direction. The driving assembly drives the light guiding element to move relative to the base.

Abstract: A system and method for performing real-time quality inspection of objects is disclosed. The system and method include a transport to move objects being inspected, allowing the inspection to be performed in-line. At least one optical acquisition unit is provided that captured optical images of the objects being inspected. The captured optical images are matched to CAD models of objects, and the matched CAD model is extracted. A laser with an illumination light beam has a wavelength in the violet or ultraviolet range then conducts scans of the objects, which are formed into three-dimensional point clouds. The point clouds are compared to the extracted CAD models for each object, where CTF are compared to user input or CAD model information and the object is determined to be acceptable or defective based on the extent of deviation between the point cloud and the CAD model.

Abstract: A system for use in monitoring parameters of an object includes an illumination unit configured for providing coherent illumination of a predetermined wavelength range and for directing the coherent illumination onto an inspection region of the object, and a collection unit comprising a lens arrangement and a detector array and configured for collecting light returning from the inspection region and for generating one or more image data pieces associated with speckle patterns generated at an intermediate plane between the inspection region and the detector array. The detector array is configured as a rolling shutter type detector unit and the collection unit comprises at least one light splitting element configured for splitting collected light to thereby form a plurality of image replications corresponding to the speckle patterns on the detector array.

Abstract: A highly visible overlay system may include a display system and contrasting visible element configuration components configured to define contrasting visible elements. An imaging component is configured to capture an image of a target scene for display. A processing component is configured to construct the plurality of contrasting visual elements in accordance with a visual acuity factor, and generate an electronic overlay constructed of the contrasting visual elements. A display component is configured to display the constructed overlay in combination with the image of the target scene, with the overlay being displayed as an overlay on the image of the target scene. The contrasting visual elements may include a white block and a black block, configured to satisfy visual acuity factor, display configuration and field of view information.

Abstract: A method for evaluating fit of an applicator can include receiving on a process first and second sets of digital data representing the target area and at least a portion of the applicator, respectively, digitally overlying the second set of digital data over the first set of digital data; calculating in the target area at a plurality of points of the overlay a separation distance between the sets of data and generating an electronic image that includes a visual depiction of the calculated separation distance.

Abstract: The invention relates to a method for the non-destructive inspection of an aeronautical part, by means of acquiring stereoscopic images and determining a three-dimensional model of the part, characterised in that it is used to extinguish one or more portions of the lighting of the part, and subsequently acquire a stereoscopic image of the surface by each of the sensors, these steps being performed by projecting a light on the surface by means of at least two projectors positioned in different locations.

Abstract: The invention relates to a portable device for measuring vertical rail measurements under service to record and report excessive vertical rail movement to prevent a train from derailing. The device may be pivoting with a tilt sensor and light-weight. The device may include a microprocessor, sensors, and a display. The device may be installed on the rail. The device may sense an approaching train, automatically turn on the device, and measure the real-time vertical displacement and the maximum/minimum vertical movement of the rail while the train is operating over the rail at all speeds.

Abstract: A projection device can include: an illuminating unit for emitting light; and a projection unit having a mirror surface, the projection unit being designed to project the light emitted by the illuminating device by means of the mirror surface into an object space and to shape it into different spatially structured light patterns in the object space. The projection device is distinguished in that the mirror surface is deformable, at least in regions, and in that the projection unit, for forming the different spatially structured light patterns in the object space, has at least one actuator for deforming the mirror surface, at least in regions. The present subject matter furthermore relates to a projection method, to a device, and to a method for detecting a three-dimensional contour.

Abstract: Methods for detecting if a Time of Flight (ToF) sensor is looking into a container are disclosed herein. An example method includes capturing a three-dimensional image. The three-dimensional image may comprise three-dimensional point data having a plurality of points. The example method may further include analyzing the plurality of points to determine a plurality of image components. Each image component may be representative of the plurality of points. The example method may further include comparing each image component of the plurality of image components to a threshold value. Each image component may correspond to a respective threshold value. The example method may further include determining that a number of image components N of the plurality of image components satisfy the respective threshold values, and determining the presence or absence of the container by comparing the number of image components N to an agreement threshold X.

Abstract: Systems and methods for scanning of a plurality of objects are disclosed. A laser guided scanning system for scanning includes a laser light configured to switch from a first color to a second color to indicate an exact position to a user for taking a number of shots comprising at least one image of an object. The laser guided scanning system further includes one or more cameras to capture the shots based on an indication from the laser light. The laser guided scanning system also includes a processor to: define a laser center co-ordinate for the object from a first shot of the plurality of shots, wherein the processor defines the exact position for taking the subsequent shot without disturbing the laser center co-ordinate for the object; and stitch and process the plurality of shots to generate at least one 3D model comprising a scanned image of the object.