Abstract: Systems and methods for performing a PASR (partial array self-refresh) operation wherein a refresh operation for recharging stored data is performed on a portion (e.g., ½ ¼, ?, or 1/16) of one or more selected memory banks comprising a cell array in a semiconductor memory device. In one aspect, a PASR operation is performed by (1) controlling the generation of row addresses by a row address counter during a self-refresh operation and (2) controlling a self-refresh cycle generating circuit to adjust the self-refresh cycle output therefrom. The self-refresh cycle is adjusted in a manner that provides a reduction in the current dissipation during the PASR operation. In another aspect, a PASR operation is performed by controlling one or more row addresses corresponding to a partial cell array during a self-refresh operation, whereby a reduction in a self-refresh current dissipation is achieved by blocking the activation of a non-used block of a memory bank.

Abstract: A digital multilevel bit memory array system comprises regular memory arrays and redundant memory arrays. A regular y-driver corresponds to each memory array to read or write contents to a multilevel bit memory cell and compare the read cell content to reference voltage levels to determine the data stored in the corresponding memory cell. Likewise, similar functions are performed by the redundant y-driver circuit for the redundant memory array. During the verification of the contents of the memory cell, if the read voltage is outside a certain margin requirement for a level of the reference voltage, a signal is generated in real time so that data from the bad y-driver is not output and data from the redundant y-driver corresponding to the redundant memory array is read out. The memory array system may also include a fractional multilevel redundancy.

Abstract: An integrated circuit (IC), random access memory on an IC and method of neutralizing device floating body effects. A floating body effect monitor monitors circuit/array activity and selectively provides an indication of floating body effect manifestation from inactivity, including the lapse of time since the most recent activity or memory access. A pulse generator generates a neutralization pulse in response to an indication of inactivity. A neutralization pulse distribution circuit passes the neutralization pulse to blocks in the circuit path or to array cells.

Abstract: One package contains a plurality of memory chips. Each memory chip has an I/O terminal which generates, a busy signal. The busy signal enables a busy state when a power supply voltage value reaches a specified and guaranteed range after a power-on sequence. The busy signal maintains the busy state until completion of initialization operations for the plurality of memory chips. The busy signal releases the busy state after completion of all initialization operations for the plurality of memory chips.

Abstract: A memory controller is provided with a memory to store indications of data/strobe ratios that are required to access memory devices that are coupled to the memory controller. The memory controller is also provided with a memory interface through which the memory controller initiates data transmissions with the memory devices. For a data transmission initiated with a particular one of the memory devices, the ratio of data signals to strobe signals sent/received through the interface is dynamically determined in response to a corresponding indication of a data/strobe ratio stored in the memory.

Abstract: Provided is directed to a semiconductor memory device including a control path for enabling a sense generator signal for delaying time as long as a bitline sense amplifier operates in response to a row active signal and enabling a precharge signal according to the sense generator signal, wherein the control path includes: a first time control unit for varying an enabling time of the sense generator signal by each time, according to a special test mode signal for testing the semiconductor memory device and a specific column address; and a second time control unit for varying an enabling time of the precharge signal by each step, according to a special test mode signal for testing the semiconductor memory device and a specific column address.

Abstract: A plurality of logic circuits access a DRAM block by way of an access circuit. The operation clock for the DRAM block is set at a higher frequency than the system clock for the logic circuits. Outputs of a first bit width from the logic circuits are subjected to serial/parallel conversion into data of a second bit width and the data is written into the DRAM block.

Abstract: There is provided a synchronous memory device having a simplified data input unit for receiving and transferring data to an internal memory cell block, which is adapted to high frequency and can reduce a power consumption.

Abstract: A test circuit for a memory device having a pair of arrays each of which includes a plurality of memory cells arranged in rows and columns. A pair of complementary digit lines is provided for each column of each array. The digit lines are selectively coupled to a pair of I/O lines for each array which are, in turn, coupled to a pair of complementary data lines. The data lines are coupled to respective inputs of a DC sense amplifier, one of which is provided for each array. A multiplexer connects the pair of I/O lines for either one of the arrays to the data lines in a normal operating mode. Thus, in the normal operating mode, data are selectively coupled to the inputs of the DC sense amplifier from the complementary digit lines for an addressed column. In a test mode, the multiplexer connects the I/O lines for both arrays to the data lines to compress the data from the two arrays.

Abstract: A content addressable memory (CAM), system, processing system, router and method of operating the same is provided. A CAM array includes more than one CAM cell with a comparison circuit and a content data storage. A priority encoder logic structure is connected with the CAM array and determines if physically or logically adjacent CAM cells have outputs such that an upper and lower content range is determined.

Abstract: According to the present invention, a state holding unit holds values indicating which process has written which data into a memory and a mask mechanism applies an operation to data stored in memory according to whether data in memory which a process is attempting to read is the data written by that process, thereby improving the security among processes.

Abstract: A re-configurable core cell is provided that can be used as either a content addressable memory cell or a dual-ported static read only memory cell. The re-configurable core cells are pre-diffused on the chip. The core cells may then be configured as CAM or SRAM with a metal layer. The peripheral logic of the CAM or SRAM may be built from gate array devices.

Abstract: A memory circuit generally comprising a bit cell, a sense amplifier, and a control circuit. The bit cell may be configured to generate a bit signal. The sense amplifier may be configured to generate a reset signal in response to sensing the bit signal. The control circuit may be configured to (i) set a control latch in response to a detection signal and (ii) reset the control latch in response to the reset signal, wherein the control latch is set while both the detection signal and the reset signal are in an asserted state.

Abstract: A semiconductor memory device includes a first magneto resistive element disposed in a memory cell portion, a first circuit disposed in the memory cell portion, the first circuit writing data into the first magneto resistive element or reading out data from the first magneto resistive element, and at least a portion of a second circuit disposed in a region below the memory cell portion.

Abstract: A method for providing a shared write driver is provided. The method includes providing a write driver for a memory array. The memory array comprises a plurality of memory columns. The write driver is coupled to the plurality of memory columns.

Abstract: An FCRAM includes first to third circuits. The first circuit generates a first signal based on a command detection signal. The second circuit is configured to receive the command detection signal, an operation mode specifying signal and a selection signal and generate a second signal which causes the start timing of the operation of a row-system circuit to be synchronized with the input timing of a second command. The third circuit is configured to select the first signal when a normal operation mode is specified by the operation mode specifying signal, select the second signal when a test mode is specified, and generate a third signal used to activate at least part of the memory cells in a memory cell array based on a selected one of the first and second signals and the selection signal.

Abstract: A CAM array block is configured to perform a search operation in a staged segment-to-segment manner using a plurality of hybrid comparands that are pipelined into the CAM array block during consecutive stages of the search operation. These hybrid comparands include at least a virtual sector field and a data field. The CAM array block is also responsive to a segment address, which identifies an active segment of CAM cells in said CAM array block. The CAM array block may include a CAM array and a global mask cell sub-array that is electrically coupled to the CAM array. This global mask cell sub-array may be responsive to the segment address and a mode select signal. A bit/data line control circuit is also provided. The bit/data line control circuit is electrically coupled to the CAM array by bit lines and data lines and has inputs that are responsive to signals generated by the global mask cell sub-array. The device may also include an address translation unit that is responsive to an input address.

Abstract: The disclosure is a main row decoder of a semiconductor memory device including: a bank controller for generating an internal RAS signal in response to an active and precharge signal; a first pulse generator for generating a first pulse signal when the internal RAS signal transitions; a second pulse generator for generating a second pulse signal when the internal RAS signal or a self refresh signal transitions; an address latch circuit for latching the least significant bit of a row address in response to the first pulse signal; and a row pre-decoder for decoding outputs of the address latch circuit in response to the second pulse signal.

Abstract: An integrated memory can include a memory cell array, which has word lines for the selection of memory cells, bit lines for reading out or writing data signals of the memory cells, and a sense amplifier connected to bit lines of a bit line pair at one end of the bit line pair. In an activated state during a memory access, at least one activatable isolation circuit which is switched into one of the bit line pairs can isolate a part of the bit line pair, which is more remote from the sense amplifier from the sense amplifier. As a result, the effective capacitance of the bit lines can be significantly reduced during the memory access.

Abstract: The memory system includes a plurality of memory cells that are arranged for forming a column, and the plurality of memory cells are coupled with a first bitline and a second bitline individually. Additionally, the memory system further includes a bitline conditioning circuit to perform the pre-charge procedure thereof; and that includes a plurality of wordlines. Furthermore, the memory system further includes a compensating-circuit to keep the voltage that is requirement for the access procedure, wherein the bitline conditioning circuit and the compensating-circuit couple to receive a pair of complemental signals so as to control the interaction between the pre-charge procedure and the compensation procedure from each other.

Abstract: To improve the efficiency for repairing a defect of an LSI, a semiconductor integrated circuit device is provided which includes a central processing unit, an electrically reprogrammable nonvolatile memory and a volatile memory, sharing a data bus, which utilizes stored information of the nonvolatile memory to repair a defect of the volatile memory. The volatile memory includes a volatile storage circuit for latching the repair information for repairing a defective normal memory cell with a redundancy memory cell. The nonvolatile memory reads out the repair information from itself in response to an instruction initialization, and the volatile storage circuit latches the repair information. A fuse program circuit is not needed for the detect repair, and a defect which occurs after a burn-in can be newly repaired so that the new defect can be repaired even after packaging.

Abstract: A semiconductor integrated circuit makes use of nonvolatile memory cells of a fuse circuit connected to a dedicated signal line without using a nonvolatile memory intended for general purpose use, which is connected to a common bus, in order to store control information for defect relief and the like of circuit modules. The reliability of storage of the control information is not limited to the performance of storage of information in the nonvolatile memory intended for general purpose use, and the reliability of storage of the control information can be easily enhanced. Since a second wiring used in the transfer of the control information is of a wiring dedicated for its transfer, it needs not perform switching between connections to circuit portions used for actual operations in the circuit modules and their control. A circuit configuration for delivering the control information can be simplified.

Abstract: A memory device has interface circuitry and a memory core which make up the stages of a pipeline, each stage being a step in a universal sequence associated with the memory core. The memory device has a plurality of operation units such as precharge, sense, read and write, which handle the primitive operations of the memory core to which the operation units are coupled. The memory device further includes a plurality of transport units configured to obtain information from external connections specifying an operation for one of the operation units and to transfer data between the memory core and the external connections. The transport units operate concurrently with the operation units as added stages to the pipeline, thereby creating a memory device which operates at high throughput and with low service times under the memory reference stream of common applications.

Abstract: It is an object of the invention to provide a circuit configuration wherein a decoder control signal ?2 is rendered unnecessary between an address buffer control signal ?1 and the decoder control signal ?2, thereby implementing speed-up in operation of a decoder circuit. The object is attained by adoption of a configuration wherein a buffer is integrated with a decoder, so that an output current path of transistors making up the address buffer, and that of transistors making up the decoder are connected with each other in series, thereby forming an output current path of decoder output. With the invention, speed-up in operation, lower power consumption, and higher cycle, of decoder circuits, can be achieved. Further, in the case of using the decoder circuits in a semiconductor memory, it is possible to achieve shortening of access time, lower power consumption, and higher cycle with reference to the semiconductor memory.

Abstract: A semiconductor memory device is disclosed which includes an array of memory cells for storing data depending on whether current pull-in is present or absent or alternatively whether it is large or small, a plurality of sense lines with read data of the memory cell array transferred thereto, a reference sense line for common use in data sensing at the plurality of sense lines while being given a reference voltage for the data sense, and a sense amplifier array having a plurality of sense amplifiers for amplifying a difference voltage between the plurality of sense lines and the reference sense line to thereby determine read data.

Abstract: A semiconductor device includes an output impedance control circuit, connected to a ZQ pad and an output buffer circuit, for controlling an impedance of the output buffer circuit according to an impedance of an external resistor connected with the ZQ pad.

Abstract: An information storage portion which stores tuning information is constituted by a plurality of magnetic elements & latch circuits. Each of the magnetic elements & latch circuits has two magneto-resistive effect elements, and the tuning information is stored in these elements. Complementary data are stored in the two magneto-resistive effect elements. After turning on a power supply, a power-on detection circuit outputs a transfer signal and a latch signal. When the transfer signal becomes “H”, the tuning information is transferred to the latch circuit. When the latch signal becomes “H”, the tuning information is latched to the latch circuit and supplied to the internal circuit.

Abstract: Systems and methods are disclosed herein to initialize memory blocks of a programmable logic device. For example in accordance with an embodiment of the present invention, a system bus extension is provided for the memory blocks that functions as a unidirectional broadcasting write bus. A read bus may also be provided to read data stored in the memory blocks.

Abstract: A hierarchical memory structure having memory cells, and sense amplifiers and decoders coupled with the memory cells to form first tier memory module, and subsequent tiers being formed by having (n?1)-tier memory modules, which are coupled with (n)-tier sense amplifiers and (n)-tier decoders. Also provided are a single-ended sense amplifier having sample-and-hold reference, and a charge-share limited-swing-driver sense amplifier; an asynchronously-resettable decoder; a wordline decoder having row redundancy; a redundancy device having redundant memory cells operated by a redundancy controller; a diffusion replica delay circuit; a high-precision delay measurement circuit; and a data transfer bus circuit imposing a limited voltage swing on a data bus. Methods are provided for a write-after-read operation without an interposed precharge cycle, and write-after-write operation with an interposed precharge cycle are provided, either operation being completed in less than one memory access cycle.

Abstract: A flash memory device that can detect short circuits in local and global bit lines. The flash memory device has a plurality of sets of adjacent local bit lines, a plurality of global bit lines and a plurality of select transistors. Each select transistor has a control gate and is coupled between one of the local bit lines in each set of local bit lines and one of the global bit lines. Thus, each local bit line in each set of local bit lines is coupled to a different global bit line. Multiple select lines are used to activate the control gates on the select transistors. Each select line is coupled to the control gates on associated select transistors. The associated select transistors are select transistors that are coupled to the local bit lines in an associated set of local bit lines.

Abstract: A resetable memory is described that includes a memory without reset capability having a data output coupled to a first input of a first multiplexer. A second input of the first multiplexer has a reset value input. A channel select for the first multiplexer is coupled to a resetable storage cell output that indicates whether a storage cell within the memory without reset capability has been written to after a reset or has not been written to after a reset.

Abstract: If a region designated by an address signal is a logic control region, an interface portion transmits/receives data to/from a register instead of a DRAM. A data signal used at that time is a control command for a logic circuit held in the register or input data for a process in the logic circuit. Depending on the content held in the register, the logic circuit performs, for example, an encryption process or a process which takes for a microcomputer a long time to complete such as an image processing. The result of processing is stored in the register and read in a sequence of reading from the DRAM.

Abstract: The Disclosed is a method of reading a memory device in a page mode. The method includes the steps of inputting a row address for selecting the word line, enabling a corresponding word line by the row address, and reading/restoring the level of the cell node connected to the enabled word line, and disabling the enabled word line and sequentially enabling bit line sense amplifiers connected to the disabled word line to perform a read operation, wherein the disabling of the selected word line is performed after a lapse of a certain time period as much as data of a first cell node can be restored. Therefore, it is possible to reduce current consumption in a read operation of a page mode.

Abstract: A memory including a NOR logic gate having an input coupled to a bitline (BL) and an input to receive the complement of the data value (DATABAR). The memory also including a NOR logic gate having an input coupled to the bitline bar (BLBAR) and an input to receive the data value (DATA). A combine stage is also included having an input coupled to an output of the NOR logic gate, an input coupled to an output of the NOR logic gate, and an output to provide a miss indicator (MISS). The miss indicator (MISS) indicates when a value on the bitline (BL) does not match the data value (DATA). The memory also comprising a plurality of bitcells coupled to the bitline (BL) and bitline bar (BLBAR), where each of the plurality of bitcells is coupled to a corresponding word line.

Abstract: Disclosed is a virtual dual-port synchronous RAM device, system, and method, wherein the design requires minimal hardware cost compared with a dual-port RAM architecture or the traditional architecture used with a single-port RAM. Disclosed is a read/write memory device including means to accept signals from a first host and a second host, the first host having a first clock and the second host having a second clock, the signals including a first clock signal and a second clock, a clock switching means for switching between the first clock signal and the second clock signal, a single-port random access memory (RAM) module for storing data, and a RAM clock for synchronizing the clock signals with the RAM module.

Abstract: An output buffer circuit including a programmable impedance buffer configured to match a buffer size thereof with an external impedance, a buffer size decision circuit configured to generate a plurality of buffer size signals for determining the buffer size of the programmable impedance buffer synchronized with a first clock signal, and an impedance adjustment circuit configured to adjust the buffer size based on the buffer size signals in response to a level of an output data signal.

Abstract: A CMOS image sensor having a row decoder capable of shutter timing control is provided, the row decoder addressing to a plurality of pixels arranged in rows and columns in a CMOS image sensor and including a plurality of unit arrays, wherein the unit arrays include a first NAND gate for generating a reset gate signal in response to an address signal and a reset signal, a second NAND gate for generating a selection gate signal in response to the address signal and a selection signal, a latch for resetting an output thereof in response to an address latch signal and latching the address signal as the output in response to the address latch signal and the address signal, a third NAND gate for receiving the address signal and a transmitted signal, a fourth NAND gate for receiving the output of the latch and a shutter transmitted signal, and an OR gate for receiving the outputs of the third and fourth NAND gates and generating a transmitted gate signal; wherein shuttering of a row address is latched in accordance

Abstract: Disclosed is a method and structure that controls an output driver by generating an output data path clock signal from a system clock signal and timing the programmable impedance of the output driver according to the output data path clock signal. The method/structure controls the timing of the line driver circuits according to the output data path clock signal. By timing the programmable impedance according to the output data path clock signal, the timing of delivery of an impedance control signal is coordinated with the timing of delivery of data. The method/structure also performs impedance updates on the output driver more frequently during initialization cycles than in cycles that occur after the initialization cycles expire using at least two differently timed clock dividers and a counter.

Abstract: A standard cell arrangement for a magneto-resistive component, comprising at least one magneto-resistive layer system, preferably in the center of the cell, in addition to at least one input and at least one output on the cell periphery. The input is provided with two input connections which can be connected to each other in order to conduct a current producing a magnetic field used to influence the magneto-resistive layer system. The output has two output connections which can be connected to the magneto-resistive layer system to pick off a signal. The input and output connections are arranged at predetermined points in relation to a rectangular basic shape of said cell (respectively mirror-symmetrical or point-symmetrical to the center of the cell).

Abstract: A semiconductor device is provided including a circuit employing two or more field-effect transistor that are desired to have equal characteristics, capable of realizing high reliability and superior transistor characteristics. The transistors which are desired to have equal characteristics are placed in the semiconductor device so as to have the same STI trench width (the width of shallow trench isolation adjacent to an active area in which the transistor is formed). By such composition, stress growing in the active area due to the shallow trench isolation is equalized among the transistors, and, thereby, the characteristics of the transistors can be equalized.

Abstract: This invention relates to a resistive memory array architecture which incorporates certain advantages from both cross-point and one transistor per cell architectures during reading operations. The fast read-time and higher signal to noise ratio of the one transistor per cell architecture and the higher packing density of the cross-point architecture are both exploited by using a single access transistor to control the reading of multiple stacked columns of resistive memory cells each column being provided in a respective stacked memory layer.

Abstract: A memory device is operable in either a high mode or a low speed mode. In either mode 32 bits of data from each of two memory arrays are prefetched into respective sets of 32 flip-flops. In the high-speed mode, the prefetched data bits are transferred in parallel to 4 parallel-to-serial converters, which transform the parallel data bits to a burst of 8 serial data bits and apply the burst to a respective one of 4 data bus terminals. In the low speed mode, two sets of prefetched data bits are transferred in parallel to 8 parallel-to-serial converters, which transform the parallel data bits to a burst of 8 serial data bits and apply the burst to a respective one of 8 data bus terminals.

Abstract: Provided are an integrated circuit and a method thereof, in which different types of signals can be applied to an internal circuit via one pin. The integrated circuit device includes a distribution unit, a level fixing unit, and an activation unit. The distribution unit receives and outputs a first input signal input via the first input pin, and receives and outputs a second input signal input via the first input pin in response to a control signal. The level fixing unit receives the first input signal from the distribution unit and applies a signal having the same voltage level as the first input signal to a first internal circuit in response to the control signal. The activation unit receives the second input signal input via the second input pin and then applies the second input signal to a second internal circuit or applies the second input signal output from the distribution unit to the second internal circuit in response to the control signal.

Abstract: A system and method is provided for minimizing read-only data retrieval time and/or area through the use of combinatorial logic. In one embodiment of the present invention, two address bits are provided to a binary logic function device. The binary logic function device uses the two address bits and predetermined logic functions (i.e., functions that represent a plurality of read-only data values) to produce a binary value—which is the requested read-only data. In another embodiment, the binary values produced by the binary logic function device are provided to at least one multiplexer. The at least one multiplexer uses at least a portion of the remaining bits (i.e., the address bits not being provided to the binary logic function device) to select (or narrow down) which binary values may be the read-only data requested. If the output of the at least one multiplexer contains more than one binary value, then those values are provided to at least one other multiplexer.

Abstract: In an integrated circuit device that includes a first memory that is capable of inputting data into and/or outputting data from a second memory and a processing unit in which at least part of at least one data flow is changeable, the processing unit includes, in addition to a data processing section that processes data that is inputted from and/or outputted to the first memory, a first address outputting section that outputs a first address of data that is inputted and/or outputted between the first memory and the data processing section and a second address outputting section that outputs a second address of data that is inputted and/or outputted between the first memory and the second memory. By using part of the processing unit, where a data flow can be changed or reconfigured, for configuring a circuit that controls the memories, a cache memory system that is optimal for the processing executed by the integrated circuit device can be configured in the integrated circuit device.

Abstract: A semiconductor memory device includes a data line shift circuit, a plurality of data mask lines connected to the plurality of sense amplifier write circuits, respectively, and a plurality of mask circuits. The plurality of mask circuits each include at least one shift switch circuit and supply a mask signal to a sense amplifier write circuit, which is connected to a mask circuit different from that before a data line is shifted by the data line shift circuit, through the shift switch circuit and supply the mask signal to a sense amplifier write circuit, which is connected to the same mask circuit as that before the data line is shifted, not through the shift switch circuit.

Abstract: The present invention relates to a clamp circuit and a boosting circuit using the same. In order to drop a boosting voltage to a target word line voltage, at least one or more clamp circuit is provided. At least one or more of the clamp circuits are independently driven in a desired sensing period to lower the boosting voltage. Thus, rapid read access time is accomplished upon a data read operation. Current consumption can be minimized and a stabilized word line voltage can be generated.

Abstract: A one time programmable memory circuit includes a one time programmable memory array. A write circuit outputs data to the one time programmable memory array. A power up write controller outputs the data and a write enable signal to the write circuit. A read circuit outputs data from the one time programmable memory array upon a read enable signal received from a read controller. An address decoder communicates with the power up write controller and the read controller, for providing an address to the one time programmable memory array.

Abstract: A semiconductor memory device for enhancing bitline precharge time and method for accelerating precharge time in the device is provided which may reduce overall precharging time, in an effort to guarantee proper high speed operations in the semiconductor memory device. In the method, an equalization enable signal may be applied to an equalizer of the device to precharge a bitline pair connected a memory cell, isolation part and sense amplifier of the device. Isolation control signals, to be applied to one or more of the isolation parts, may be delayed by a given time, so that a time of applying the isolation control signals is after a time of applying the equalization enable signal to the equalizer.

Abstract: A memory system has a memory controller, a plurality of memory modules and a memory bus connected to the memory controller and branching into a plurality of sub-busses, each of which is connected to a memory module. A sub-bus has a diode associated therewith for isolating a memory module connected to that sub-bus from the memory bus.