Abstract: A semiconductor memory device includes a first buffering unit configured to buffer a first clock for an address signal and a command to be input in synchronization with the first clock, a second buffering unit configured to buffer a second clock for a data signal to be in synchronization with the second clock to output a buffered second clock having the same frequency as the first clock, a data output circuit configured to output an internal data in response to the buffered second clock, a delay unit configured to delay the buffered second clock by a predetermined time, and a phase detector configured to detect a phase difference of an output clock of the delay unit and the output clock of the first buffering unit, and to output the detection result.

Abstract: A semiconductor integrated circuit may include: a mode register and a clock delay control circuit. The mode register may store latency information corresponding to a plurality of frequencies. The clock delay control circuit may generate a delay clock signal using an external clock signal and the latency information. The delay clock signal may be used to control a timing margin of output data read during synchronous burst read operations of a non-volatile memory. A non-volatile memory device may include the semiconductor integrated circuit and a data output unit. The data output unit may use the delay clock signal to control the timing margin of the output data read during synchronous burst read operations. A memory system may include the semiconductor integrated circuit. A computing system may the semiconductor integrated circuit, as well as one or more of a memory controller, bus, modem, microprocessor, user interface, and battery.

Abstract: The present invention is directed to realize high-speed operation and low latency of a semiconductor storage device employing the QDR method. A memory cell array, a first buffer, a second buffer, a first circuit, a second circuit, a first DLL circuit, and a second DLL circuit are provided. The first DLL circuit generates a first internal clock signal so as to reduce a phase difference between a first clock signal fetched via the first buffer and the first internal clock signal transmitted to the first circuit. The second DLL circuit generates the second internal clock signal so as to reduce a phase difference between the second clock signal fetched via the second buffer and the second internal clock signal transmitted to the second circuit. With the configuration, input setup and hold time can be shortened, and the frequency of the clock signal can be further increased.

Abstract: The invention provides methods and apparatus. A NAND flash memory device receives command and address signals at a first frequency and a data signal at a second frequency that is greater than the first frequency.

Abstract: A semiconductor memory device using system clock with a high frequency can maintain a constant margin of operation even with a changed operating environment including voltage level, temperature, and process. The semiconductor memory device includes a data output control circuit configured to control data outputted in synchronization with a falling edge of a system clock using a first output source signal corresponding to a rising edge of the system clock, and to control data outputted in synchronization with the rising edge of the system clock using a second output source signal corresponding to a falling edge of the system clock, and a data output circuit configured to output data, the data output circuit being controlled by the data output control circuit.

Abstract: A circuit for eliminating a skew between data and a clock signal in an interface between a semiconductor memory device and a memory controller includes an edge information storage unit which stores edge information output from the semiconductor memory device, a pseudo data pattern generating unit which outputs pseudo data including a pattern similar to actually transmitted data, a phase detecting unit which receives the edge information from the edge information storage unit and the pseudo data from the pseudo data pattern generating unit to detect a phase difference between the data and the clock signal and generate a corresponding detection result, and a phase control unit which controls a phase of the clock signal according to the corresponding detection result from the phase detecting unit, so as to eliminate a per-data input/output pin skew in a data write and read operation of the semiconductor memory device.

Abstract: A semiconductor device includes a system clock input unit configured to receive a system clock for synchronizing input times of an address signal and a command signal from a memory controller, a data clock input unit configured to receive first and second data clocks for synchronizing an input/output time of a data signal from the memory controller, wherein a phase of the second data clock is shifted according to a training information signal, and the second data clock having the shifted phase is inputted to the data clock input unit, and a phase detection unit configured to detect a logic level of the second data clock based on an edge of the first data clock, and generate the training information signal to transmit the generated signal to the memory controller according to the detected logic level.

Abstract: A semiconductor memory device that generates a data strobe reset signal for preventing ring-back of a data strobe signal, and an operation method thereof. The semiconductor memory device includes a pulse signal generating unit for generating first and second pulse signals by synchronizing a write instruction with first and second internal clock signals, a reset signal generating unit for generating a reset signal having an activation width setup in response to the first and second pulse signals, and a data strobe reset signal generating unit for generating a data strobe reset signal by shifting the second pulse signal as much as a predetermined burst length and limiting an activation period of the data strobe reset signal in response to the reset signal.

Abstract: A semiconductor memory device has a data masking function during a write operation. The semiconductor memory device includes a data mask input unit that receives a data mask signal. A data input unit receives data and delays the output of the data more than the output of the data mask signal. A write driver selectively drives the data outputted from the data input unit according to the data mask signal outputted from the data mask input unit. The semiconductor memory device ensures that the data mask signal is inputted into the write driver prior to the input of the data, thus preventing a timing mismatch between data and the data masking signal and poor data masking.

Abstract: In a RAM control device, an arbiter circuit is means for generating BUSY1 and BUSY2 of exclusive logic with CLK1 and CLK2 so as to give a right to access RAM3 to a host which has transmitted the first access clock and requesting a one-shot circuit to generate RAMCLK for deciding the timing to access the RAM3. The one-shot circuit is means for generating one pulse of RAMCLK with CLKRQ from the arbiter circuit and transmitting it to the RAM3. This configuration suppresses increase of the device size and cost and enables appropriate control of access to the RAM according to the access clocks of two systems inputted asynchronously.

Abstract: An electronic system includes at least one reduced-complexity integrated circuit memory coupled to a memory controller. By reducing the complexity of each integrated circuit memory and concentrating the complexity within the memory controller, overall system costs may be greatly reduced and reliability improved.

Abstract: Apparatus and systems for improved PVT invariant fast rank switching in a DDR3 memory subsystem. A clock skew control circuit is provided between a memory controller and a DDR3 SDRAM memory subsystem to adjust skew between the DDR3 clock signal and data related signals (e.g., DQ and/or DQS). A initial write-leveling procedure determines the correct skew and programs a register file in the skew adjustment circuit. The register file includes a register for each of multiple ranks in the DDR3 memory. The values in each register serve to control selection of alignment of the data related signals to align with one of multiple phase shifted versions of a 1× DDR3 clock signal. The phase shifted clock signals are generated by clock divider circuits from a 2× DDR clock signal and use of a single fixed delay line approximating ? of a 1× DDR3 clock period.

Abstract: Methods and arrangements to configure power management systems for integrated circuits are provided herein. A group of IC components that are functionally distinct or have mutually exclusive and/or quasi-mutually exclusive, (ME/QME) operating patterns (i.e. alternate or partially overlapping duty cycles) can be powered with a single power cell. An integrated circuit design tool can identified components in an integrated circuit design that have the ME/QME operating patterns. These cells can be collocated in close proximity to each other and power management system components can be placed in this area such that a multiple signal processing cells can share a single power line and a single power cell. Such a configuration can greatly reduce the size of a power management system for an integrated circuit.

Abstract: A PLL circuit includes a phase comparator for outputting a frequency control signal based on a result of comparison between phases of an input reference clock signal and a fed-back oscillation signal; an oscillation circuit, connected to the phase comparator, for outputting an oscillation signal having a frequency in accordance with the frequency control signal, a power source voltage, and a predetermined reference voltage; and a bias control circuit, connected to the oscillation circuit, for increasing either the potential difference between the reference voltage of the oscillation circuit and a ground voltage or the potential difference between the power source voltage of the oscillation circuit and the ground voltage. A transistor in the oscillation circuit can operate in a saturation area, thereby operating the PLL circuit at a high speed with a low power source voltage, without being easily affected by a variation in the temperature or other process conditions.

Abstract: A semiconductor, which includes a first phase detecting unit configured to detect a phase of a second clock on the basis of a phase of a first clock, and generate a first detection signal corresponding to a result of the detection, a second phase detecting unit configured to detect a phase of a delayed clock, which is generated by delaying the second clock by a predetermined time, on the basis of the phase of the first clock, and generate a second detection signal corresponding to a result of the detection, and a logic level determining unit configured to determine a logic level of a feedback output signal according to the first detection signal, the second detection signal and the feedback output signal.

Abstract: A methodology is disclosed that enables the delay stages of an analog delay locked loop (DLL) or phase locked loop (PLL) to be programmed according to the operating condition, which may depend on the frequency of the input reference clock. The resulting optimized delay stages allow for a broad frequency range of operation, fast locking time over a wide range of input clock frequencies, and a lower current consumption at high clock frequencies. Better performance is achieved by allowing the number of analog delay stages active during a given operation to be flexibly set. The deactivation or turning off of unused delay stages conserves power at higher frequencies. The high frequency range of operation is increased by using a flexible number of delay stages for various input clock frequencies. Because of the rules governing abstracts, this abstract should not be used to construe the claims.

Abstract: A latency counter includes: a frequency-dividing circuit that generates a plurality of divided clocks LCLKE and LCLKO of which the phases differ each other based on an internal clock LCLK; and frequency-divided counter circuits each of which counts a latency of an internal command based on the corresponding divided clocks LCLKE and LCLKO. Thus, the counting of the latency is performed based not on the internal clock LCLK itself but on the divided clocks LCLKE and LCLKO obtained by frequency-dividing the internal clock LCLK. Thus, even when a frequency of the internal clock LCLK is high, an operation margin can be sufficiently secured.

Abstract: A compensatory memory system is described. This memory system substantially improves performance by adapting an associated delay in a way that optimizes circuit performance.

Abstract: A semiconductor memory apparatus according to an embodiment of the invention includes a delay enable unit that generates a delay enable signal in response to an external ODT signal and an idle signal, a delay selecting unit that outputs the idle signal or a delay idle signal, which is obtained by delaying the idle signal by a first delay time, in response to the delay enable signal, and a DLL clock control unit that generates a control signal in response to the idle signal or the delay idle signal during a slow power down exit mode.

Abstract: A method for reading of the state of a non-volatile memory element, including conditioning the frequency of a first oscillatory to the state of this element, and comparing the frequency of the first oscillator with the predetermined frequency of a second oscillator, selected between two possible frequency values for the first oscillator, according to the state of the storage element.

Abstract: The data output control signal generating circuit includes a delay correction signal generating unit that delays an input signal by a phase difference between a clock and a delay locked loop clock, and latches the delayed signal to generate a plurality of output enable signals. A column address strobe latency control multiplexer selects the output enable signal corresponding to column address strobe latency among the plurality of output enable signals, on the basis of the signal obtained by delaying the input signal by the phase difference between the clock and the delay locked loop clock, and outputs the selected signal as the data output control signal.

Abstract: Circuits, memories, and methods for latching a write command and later provided write data including write command and write data timing circuits. One such timing circuit includes internal write command latch to latch an internal write command in response to write command latch signal. The internal write command latch releases the latched write command in response to the write command latch signal after a latency delay. The timing circuit further includes a write leveling flip-flop (FF) circuit and a write data register. The FF circuit latches the internal write command in response to an internal write command FF signal based on a write clock signal and generates an internal write enable signal in response to latching the internal write command. The write data register captures write data in response to the write clock signal and releases the captured write data in response to a delayed internal write enable signal.

Abstract: A column address control circuit comprises a control unit for outputting a control signal in response to a DDR mode signal and a first signal, and an address counting unit configured to receive a start column address and output a start column address in response to the control signal. The first signal is a burst read single write mode signal. The control signal is activated when the first signal is activated in a DDR mode. The control unit includes a first logic unit for performing an AND operation of the DDR mode signal and the first signal, and a second logic unit for performing an OR operation of an output signal of the first logic unit and a SDR mode signal.

Abstract: A clock generator includes a first input end and a second input end. The first input end is capable of receiving a first clock signal including a first state transition and a second state transition defining a first pulse width. The second input end is capable of receiving a second clock signal having a third state transition. A time period ranges from the first state transition to the third state transition. The clock generator can compare the first pulse width and the time period. The clock generator can output a third clock signal having a second pulse width ranging from a fourth state transition to a fifth state transition. The fifth state transition of the third clock signal is capable of being triggered by the second state transition of the first clock signal or the third state transition of the second clock signal depending on the comparison of the first pulse width and the time period.

Abstract: A synchronous memory with a shadow-cycle counter has a counter logic combiner with an address input, a registered processed-address input, an incremented-processed-address input, and a counter control input with an output that contains a processed address. A mask, counter, and mirror registers receives the processed address and has a clock input strobing around a middle of a pre-array clock cycle. An output of the mask, counter, and mirror registers forms a registered internal processed address. A clock phase shifter has a clock input and has an output coupled to the mask, counter, and mirror registers. A plane internal processed-address is coupled to the read/write control logic. An address output enable generated in the counter logic combiner is coupled to the data output enable logic.

Abstract: A delay locked loop circuit is disclosed. The circuit includes a phase detector for comparing the phase of an input clock signal with the phase of a feedback clock signal that is fed back into the phase detector, and for outputting a detection signal. The circuit also includes a control circuit unit for controlling a delay line in response to the detection signal, a delay line for delaying the input clock by a predetermined amount of delay in response to output impedance calibration codes applied to the delay line, and a replica circuit configured to have the same delay conditions as those of an actual clock path to a circuit of the semiconductor device, to receive a delay clock signal of the delay line, and to generate the feedback clock signal.

Abstract: A system, method and apparatus for clock and power fault detection for a memory module is provided. In one embodiment, a system is provided. The system includes a voltage detection circuit and a clock detection circuit. The system further includes a controller coupled to the voltage detection circuit and the clock detection circuit. The system also includes a memory control state machine coupled to the controller. The system includes volatile memory coupled to the memory control state machine. The system further includes a battery and battery regulation circuitry coupled to the controller and the memory control state machine. The battery, battery regulation circuitry, volatile memory, memory control state machine, controller, clock detection circuit and voltage detection circuit are all collectively included in a unitary memory module.

Abstract: A semiconductor memory device includes n stages of memory cell units, sense amplifier units, and shift registers. N units of the shift registers are connected to one another on the left end sides. The signal processing units and the reversed signal processing units are disposed adjacent to one another in each of the n units of the shift registers. The signal processing units located on the odd-numbered positions counted from the input end side are connected to one another. The reversed signal processing units located on the even-numbered positions counted from the input end side are connected to one another. The signal processing units located on the end opposite to the input end side are connected to the reversed signal processing units located on the end opposite to the input end side. Each of the signal processing units includes the logic circuit unit and the flip-flop while each of the reversed signal processing units includes the reversed logic circuit unit and the reversed flip-flop.

Abstract: A system and method for synchronizing a strobed memory system 10. During memory read and/or memory write operations the corresponding data strobe is sampled at the data destination 50/55 according to a local clock signal 71/73. Based on the results of the sampling, the data strobe and local clock signal are synchronized. In this manner, the data is synchronized to the local clock signal so that sampling of data at the data destination can be performed according to the local clock signal rather than the data strobe.

Abstract: An apparatus testing a semiconductor device may include, but is not limited to, a first strobe signal generating circuit and a detecting circuit. The first strobe signal generating circuit generates a first strobe signal in response to a reference clock supplied from the semiconductor device. The detecting circuit detects a data signal, supplied from the semiconductor device, based on the first strobe signal.

Abstract: A semiconductor device includes a latency setting circuit setting the latency, an input command circuit outputting a normal-phase (reverse-phase) command signal obtained by capturing an input command signal using a normal-phase (reverse-phase) clock, first and second counter circuits each including latch circuits sequentially shifting the normal-phase (reverse-phase) command signal based on the normal-phase (reverse-phase) clock, a selector circuit controlling a signal path so that the normal-phase (reverse-phase) command signal is transmitted through the first (second) counter circuit when an even latency is set and the normal-phase (reverse-phase) command signal is transmitted so as to be shifted from the first (second) counter circuit to the second (first) counter circuit when an odd latency is set, and a control circuit controlling so that the latch circuits of the first (second) counter circuit are activated in response to the input command signal and stopped after an operation period is elapsed.

Abstract: A calibration circuit includes replica buffers that have a substantially same circuit configuration as at least a part of an output buffer, an oscillator circuit that generates an internal clock in response to issuance of a calibration command, and a control circuit that controls an impedance of the replica buffers in synchronization with the internal clock. According to the present invention, because a calibration operation that does not depend on an external clock is performed, even when a frequency of the external clock is changed according to an operation mode or the like, it is possible to maintain a constant period of time given to a single adjustment step or a constant time required for a series of calibration operations.

Abstract: A circuit for generating a data I/O control signal used in a semiconductor memory apparatus comprises a delay block for generating a delay signal having a relatively short delay value and a delay signal having a relatively long delay values, and a selection block for selecting any one of the delay signals according to an operational mode. The selection block selects an output signal of the first delay unit in a high-speed operation mode and selects an output signal of the second delay unit in a low-speed operation mode.

Abstract: The present invention discloses a circuit for generating a data strobe signal in a DDR memory device and a method therefor which can precisely distinguish preamble and postamble periods of the data strobe signal by generating pulses for generating the data strobe signal only in a data strobe signal input period by using an internal clock signal according to CAS latency under a read command, and generating the data strobe signal by using the pulses, and which can improve reliability of the circuit operation by precisely controlling operation timing with the internal clock signal.

Abstract: Some embodiments are directed to circuits comprising first and second PLLs. The first PLL generates a first clock signal based on a reference clock signal. The second PLL generates a second clock signal based on the reference clock signal and is synchronized with the first clock signal.

Abstract: Disclosed is a double data rate (DDR) input block comprising first and second input registers corresponding to a DDR input of the DDR input block. The first and second input registers are coupled to the DDR input. The DDR input block is configured to load a first data into the first input register and a second data into the second input register during a single clock cycle of a system clock, thereby operating at double data input during a single clock cycle. A single data rate/double data rate (SDR/DDR) input block may be operated in either SDR or DDR mode. The DDR input block may he used with a scannable output reduction block. The DDR input block may be used in systems utilizing a content addressable memory (CAM) or a random access memory (RAM), or other types of memory devices.

Abstract: A semiconductor memory device adapted to perform a page mode operation comprises a first address transition detector adapted generate a first clock signal upon detecting a transition of a start address, a second address transition detector adapted to generate a second clock signal upon detecting transition of a lower bit of the start address and after the first clock signal is generated, and an address controller adapted to sequentially increment the start address in response to a transition of the second clock signal. The address controller sequentially accesses memory cells selected by the start address and the incremented start address in response to a transition of the second clock signal.

Abstract: Provided are a method and apparatus for controlling a read latency of a high-speed DRAM. A memory device may include a delay measurement unit, a delay locked loop, a latency counter and a data output buffer. The delay measurement unit measures a delay time between when an external clock signal is input and when read data is output to generate measurement signals and generates a first internal clock signal delayed from the external clock signal. The delay locked loop (DLL) receives the first internal clock signal and generates a second internal clock signal synchronized with the external clock signal. The latency counter generates a latency signal from an external read command signal in response to the measurement signals, and the data output buffer outputs the read data in response to the latency signal and the second internal clock signal.

Abstract: To provide a semiconductor memory device including: a first clock generation circuit and a second clock generation circuit that generate a first internal clock and a second internal clock, respectively; a latency counter that counts latency synchronously with the first internal clock; and a recovery counter that counts a write recovery period synchronously with the second internal clock. The second clock generation circuit activates the second internal clock when auto-precharge is designated, and deactivates the second internal clock when the auto-precharge is not designated. With this configuration, the recovery counter does not perform any counting operation when an auto-precharge function is not operated, and thus unnecessary power consumption can be prevented.

Abstract: Apparatus and systems for improved PVT invariant fast rank switching in a DDR3 memory subsystem. A clock skew control circuit is provided between a memory controller and a DDR3 SDRAM memory subsystem to adjust skew between the DDR3 clock signal and data related signals (e.g., DQ and/or DQS). A initial write-leveling procedure determines the correct skew and programs a register file in the skew adjustment circuit. The register file includes a register for each of multiple ranks in the DDR3 memory. The values in each register serve to control selection of alignment of the data related signals to align with one of multiple phase shifted versions of a 1× DDR3 clock signal. The phase shifted clock signals are generated by clock divider circuits from a 2× DDR clock signal and use of a single fixed delay line approximating ? of a 1× DDR3 clock period.

Abstract: A semiconductor device is capable of minimizing data skew among respective data which are transmitted to a receiver through respective data lines. The semiconductor device includes a synchronization unit connected to at least one portion of the respective data lines, for synchronizing time that the plurality of data transferred through the respective data lines take to arrive at the receiver.

Abstract: A semiconductor memory device includes a drive clock supplier and a signal generator. The drive clock supplier supplies a drive clock which is obtained by dividing an internal clock with a divide ratio, wherein the drive clock synchronizes with a rising edge of the internal clock with which an internal write signal synchronizes. The signal generator counts time corresponding to a write-recovery on the basis of the drive clock, to generate a precharge signal.

Abstract: A system is provided with clock skew measurement and correction technology. A first circuit or memory controller 4 includes measuring circuits to measure relative timing or phase offsets of multiple clock signals of a second circuit or memory 6. One measuring circuit is configured for incremental changing of the phase of a transmitted test data sequence to measure and correct timing of a memory receiver circuit's quadrature clocks based on results of a data comparison of transmitted and received test data. Another measuring circuit is configured to scan a received test data sequence for data transitions to measure and correct timing of a memory transmitter circuit's quadrature clocks based on spacing or timing between detected transitions. Individual memory clock generators 30 are controlled with adjustable delay circuits 47 for changing phase of different clock signals of the memory to set the clock signals based on the measurements of the controller.

Abstract: Disclosed is an apparatus for controlling an enable interval of a signal controlling an operation of data buses which connect a bit line sense amplifier with a data sense amplifier according to a variation of an operational frequency of a memory device. The apparatus comprises a pulse width control section for changing the pulse width of an input signal depending on the operational frequency of the memory device after receiving the input signal, a signal transmission section for buffering a signal outputted from the pulse width control section, and an output section for receiving a signal outputted from the signal transmission section so as to output a first signal for controlling the signal to control the operation of the data buses.

Abstract: A system, method and apparatus for clock and power fault detection for a memory module is provided. In one embodiment, a system is provided. The system includes a voltage detection circuit and a clock detection circuit. The system further includes a controller coupled to the voltage detection circuit and the clock detection circuit. The system also includes a memory control state machine coupled to the controller. The system includes volatile memory coupled to the memory control state machine. The system further includes a battery and battery regulation circuitry coupled to the controller and the memory control state machine. The battery, battery regulation circuitry, volatile memory, memory control state machine, controller, clock detection circuit and voltage detection circuit are all collectively included in a unitary memory module.

Abstract: A voltage-controlled oscillator comprises a first oscillator and a second oscillator. The first oscillator may generate a plurality of intermediate clock signals at a plurality of first nodes, multiply connected to a plurality of first ring shape circuits, in response to a control voltage. The plurality of intermediate clock signals may have a different phase from each other and a same phase difference with each other. The second oscillator may generate a plurality of output clock signals at a plurality of second nodes, multiply connected to a plurality of second ring shape circuits, by changing a voltage level of the intermediate clock signals. The plurality of second ring shape circuits may pass the plurality of first nodes.

Abstract: A data writing apparatus includes a distributed transmission unit configured to transmit first data and second data, having been aligned to have the same timing, to data lines at mutually different timings, and a data writing unit configured to synchronize the first data and the second data having been transmitted through the data lines and to write the synchronized data in a memory area.

Abstract: A programmable clock generator circuit receives control signals and a global clock and generates a pulsed data clock and a scan clock in response to gating signals. The clock generator has data clock and scan clock feed-forward paths and a single feedback path. Delay control signals program delay elements in the feedback path and logic gates reshape and generate a feedback clock signal. The global clock and the feedback clock signal are combined to generates a pulsed local clock signal. A scan clock feed-forward circuit receives the local clock and generates the scan clock. A data clock feed-forward circuit receives the local clock and generates the data clock with a logic controlled delay relative to the local clock signal. The feedback clock is generated with controlled delay thereby modifying the pulse width of the data and scan clocks independent of the controlled delay of the data clock feed-forward path.

Abstract: An address counter includes FIFO units and first to third command counters that controls the groups. In the FIFO units, latch circuits including input gates and output gates are connected in parallel. The first command counter conducts any one of the input gates in response to a first internal command; the second command counter conducts any one of the output gates in response to a second internal command; and the third command counter conducts any one of the output gates in response to a third internal command. Thereby, the same address signals can be outputted successively at a plurality of timings, and thus, a circuit scale of the address counter can be reduced.

Abstract: An address synchronous circuit includes an address control signal generating unit for generating a control signal in response to operation mode signals of a semiconductor memory and an internal clock signal, and an address synchronous unit for controlling output of an address which is buffered in accordance with a clock enable signal, in response to the control signal.