Of Susceptibility To Thermally Induced Deteriouration, Flaw, Or Failure Patents (Class 374/57)
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Patent number: 12216085Abstract: The present invention provides a method for eddy current thermography defect reconstruction based on electrical impedance tomography, first, obtaining a thermal reference image of temperature change with time by acquiring a thermogram sequence S of the specimen in the process of heating and fitting a curve for pixels of each location of the thermogram sequence S, then, creating a current matrix and a magnetic potential matrix, and calculating the satisfied conductivity distribution through iterations, so as a reconstructed image is obtained, then taking the low conductivity area of the reconstructed image as the defect profile, thus the defect profile is identified and quantified.Type: GrantFiled: August 29, 2022Date of Patent: February 4, 2025Assignee: UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINAInventors: Libing Bai, Xu Zhang, Chao Ren, Yiping Liang, Ruiheng Zhang, Yong Duan, Jinliang Shao, Yali Zheng, Yuhua Cheng
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Patent number: 12189442Abstract: A method for detecting heat dissipation is provided, including the following steps: sensing a core temperature of a heat emitting component of an electronic device; sensing current power of the heat emitting component when the core temperature is greater than or equal to a warning temperature; and transmitting an assembling check prompt and activating a thermal control circuit (TCC) when the current power is less than thermal design power (TDP) of the heat emitting component. An electronic device is further provided, to execute the method for detecting heat dissipation.Type: GrantFiled: April 21, 2022Date of Patent: January 7, 2025Assignee: ASUSTeK COMPUTER INC.Inventors: Kun-Hsin Chiang, Yu-Chieh Chang, Tang-Hui Liao, Wei-Hsian Chang, Wen-Yen Hsieh, Chih-Wei Kuo, Ming-Yi Huang, Ching-Chan Chu, Shun-Po Chang
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Patent number: 12181441Abstract: The present disclosure discloses a rapid measuring device and a measuring method for permanent magnet failure temperature. The device includes a measurement system (1), an infrared thermal imager (2), a vacuum Hall probe (3) and a laser heating device (4). A permanent magnet (5) is used as a sample. These components work together to achieve rapid and accurate measurement of the failure temperature of the permanent magnet sample (5). The present disclosure uses light heating, infrared thermal imaging and surface magnetic field measurement. The heating speed is fast, the temperature measurement is accurate, and the failure temperature measurement of large permanent magnet materials can be achieved.Type: GrantFiled: March 14, 2024Date of Patent: December 31, 2024Assignee: CHINA JILIANG UNIVERSITYInventors: Hangfu Yang, Qiong Wu, Xiukun Hu, Minxiang Pan, Jieyang Fang, Hongliang Ge
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Patent number: 12111348Abstract: An evaluation module configured to evaluate the lifespan of a multichip module, the multichip module comprising a first substrate and multiple chips under evaluation, includes a second substrate, configured to be the same as the first substrate, and having attachment positions corresponding to the attachment positions on the first substrate, and at least one evaluation chip, configured to be the same as the multiple chips under evaluation. The number of evaluation chips is less than the number of chips under evaluation by at least one. The at least one evaluation chip is arranged at an attachment position on the second substrate, such that the at least one evaluation chip and the chip under evaluation arranged at the corresponding attachment position on the multichip module have the same cooling performance and sustain the same thermal stress. The present disclosure also discloses a method for evaluating the lifespan of a multichip module.Type: GrantFiled: September 23, 2021Date of Patent: October 8, 2024Assignees: Robert Bosch GmbH, Huazhong University of Science and TechnologyInventors: Lin Liang, Lubin Han, Yong Kang, Xudan Liu, Maojun He
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Patent number: 12085516Abstract: Systems and methods for non-contact characterization of semiconductor devices. Systems may include: an infrared radiation source directing radiation towards the semiconductor device; a radiation directing device positioned proximal the infrared radiation source to direct radiation towards an opposing side of the semiconductor device, the semiconductor device receivable between the radiation directing device and the infrared radiation source; and a radiation detector proximal to the infrared radiation source to sense radiation associated with a plurality of infrared wavebands from the semiconductor device for determining a dopant profile property of the semiconductor device. The sensed radiation may include radiation originating from the infrared radiation source reflected from the semiconductor device. The sensed radiation may include radiation originating from the radiation directing device and emerging from the semiconductor device.Type: GrantFiled: December 4, 2020Date of Patent: September 10, 2024Assignee: AURORA SOLAR TECHNOLOGIES (CANADA) INC.Inventors: Hamidreza Ghoddami, Johnson Kai Chi Wong, Gordon Deans
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Patent number: 12067709Abstract: A method for determining an expansion coefficient of a test material comprises: receiving first image data of a compound material, wherein the compound material comprises a plate and a layer of the test material, which is attached to the plate; receiving second image data of the compound material, which has been exposed to an environmental condition, before the second image data has been recorded; determining a measured deformation of the compound material by comparing the first image data and the second image data; and performing a simulated deformation of a model of the compound material exposed to the environmental condition and determining the expansion coefficient of the test material by varying the expansion coefficient until the simulate deformation conforms to the measured deformation.Type: GrantFiled: August 30, 2021Date of Patent: August 20, 2024Assignee: AT&S Austria Technologie & Systemtechnik AGInventors: Markus Frewein, Maike Sagerer, Julia Zuendel, Thomas Krivec
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Patent number: 12055382Abstract: A strain distribution measurement system includes a tensile tester that deforms a test piece to measure mechanical properties of a material of the test piece, and a strain distribution measuring device that measures a strain distribution of the test piece. The strain distribution measuring device measures the strain distribution of the test piece based on a distribution of at least one of a reflectance or a polarization characteristic on the main face of the test piece.Type: GrantFiled: May 20, 2021Date of Patent: August 6, 2024Assignee: SHIMADZU CORPORATIONInventors: Tomotaka Nagashima, Yukimitsu Iwanaga, Norio Hirayama
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Patent number: 12032039Abstract: A control device including a solder joint life predictor includes: a temperature sensor that measures temperature of a solder joint on an electronic circuit board that drives a heater and a motor; a storage that stores a reference acceleration factor that is an acceleration factor based on a test condition of a thermal shock test and a reference condition in an environment in which the electrical appliance is used; a calculator that calculates an actual acceleration factor from a temperature variation range and a maximum reached temperature of the solder joint during one cycle from start to end of driving of the heater or the motor; and a determiner that predicts the life of the solder joint by comparing the integrated value of the acceleration factor ratios with a threshold.Type: GrantFiled: January 18, 2019Date of Patent: July 9, 2024Assignee: MITSUBISHI ELECTRIC CORPORATIONInventor: Takuya Saeki
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Patent number: 12014123Abstract: The disclosure discloses a system and method for predicting a vibration of a bicycle when being rode on a road. The method first uses a pressure film to obtain a contact interface between a road and a bicycle tire, and then, based on the contact interface, a unit bearing area (Bu) and an average stress peak distance (Spa) are calculated. Next, taking the above parameters as variables, a predicted vibration value (Pv) is calculated based on calculation formulas provided by the present disclosure. Finally, the predicted vibration value Pv is compared with a comfort-level threshold perceived by a cyclist of the present disclosure, which can quickly and effectively grade and predict a comfort level when riding a bicycle on a section of an asphalt road.Type: GrantFiled: January 27, 2021Date of Patent: June 18, 2024Assignee: CHANG'AN UNIVERSITYInventors: Aimin Sha, Jie Gao, Bo Luan, Liqun Hu, Wei Jiang
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Patent number: 11892223Abstract: A two-phase immersion cooling device includes an upper box body, a lower box body, a plurality of heating elements, and a condenser. The walls of the upper box body form a first cavity. The lower box body defines a second cavity containing coolant. The heating elements are disposed in the second cavity and immersing in the coolant. The condenser in the upper box body includes multiple rows and columns of condensing tubes, is arranged across or along the upper box body to fill the first cavity. The lower box body is detachably and hermetically connected to the bottom of the upper box body, connecting the second cavity with the first cavity to form an accommodating cavity.Type: GrantFiled: January 24, 2022Date of Patent: February 6, 2024Assignee: Fulian Precision Electronics (Tianjin) Co., LTD.Inventors: Chun Wang, Warm-Horng Yuan
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Patent number: 11830720Abstract: An apparatus for artificial weathering or lightfastness testing of samples or for simulating solar radiation, the apparatus comprises a weathering chamber, an electrodeless lamp provided in the weathering chamber and comprising a bulb filled with a composition that emits light when in a plasma state, and a radio frequency source being arranged so that it radiate a radio frequency field into the bulb to generate a luminous plasma for emitting a radiation comprising spectral emission characteristics similar to natural solar radiation.Type: GrantFiled: December 1, 2021Date of Patent: November 28, 2023Assignee: ATLAS MATERIAL TESTING TECHNOLOGY GMBHInventor: Peter March
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Patent number: 11796394Abstract: The present disclosure has provided an automatic multichannel apparatus for assessing hot coal fallout propensity of burning cigarettes and an assessing method thereof. The apparatus comprises a multichannel rotary plate unit, an automatic supplying unit for cigarette samples, an automatic ignition and burning line detection unit for cigarette samples, a cigarette holding and force applying unit, an automatic hot coal fallout detection and removal unit, a smoke collecting unit during suction, a suction unit, a gas exhaust unit arranged in a main frame, and an electric circuit and air path control unit for controlling actions and processes of the above units. The apparatus operates based on certain steps and performs automatic ignition and burning line detection on cigarette samples inserted into a rotary plate in sequence.Type: GrantFiled: December 26, 2018Date of Patent: October 24, 2023Assignees: ZHENGZHOU TOBACCO RESEARCH INSTITUTE OF CNTC, HEFEI INSTITUTE OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCESInventors: Bin Li, Yi Zhang, Yong Liu, Mingjian Zhang, Long Zhang, Yaoshuo Sang, Liu Hong, Zhigang Li, Min Ji, Zhenyu Xu, Xiaoping Liu, Bing Wang
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Patent number: 11747235Abstract: An electrodynamic vibration test system, also referred to as a shaker apparatus, includes many components but the transmission of vibration to a unit under test is limited to three while testing is performed in the horizontal mode and only two key items in the vertical mode. In the horizontal test mode, the armature is mechanically joined to a driver bar which is also mechanically connected to a slip plate. In the vertical mode the moving parts include a head expander mechanically connected to an armature. With the use of composite materials for the moving elements, total weight is decreased by fifty percent or more resulting in a power usage decrease while simultaneously increasing force capability.Type: GrantFiled: November 14, 2022Date of Patent: September 5, 2023Inventor: Harold Myer Myers
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Patent number: 11747237Abstract: A method and system of providing customizable service for an asset. The method including generating a predictive model for each asset of a fleet, each predictive model based on an operational profile for the asset and including a probability density function associated with the operational durability of the asset, establishing a maintenance strategy associated with the asset, and combining each of the predictive models to generate a compound fleet performance model, the fleet performance model including a combined probability density function. The method also includes collecting actual asset performance and maintenance data to generate actual asset metrics, determining a fleet performance profile based on the actual asset metrics indicative of a health assessment of the fleet, comparing the predicted fleet performance with the actual fleet performance, and ascertaining actionable choices for managing the assets based on a deviation of the predicted and actual fleet performance.Type: GrantFiled: May 16, 2022Date of Patent: September 5, 2023Assignee: RAYTHEON TECHNOLOGIES CORPORATIONInventors: Thomas A. Frewen, Ozgur Erdinc, Hala Mostafa, Mei Chen, Draguna Vrabie
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Patent number: 11722138Abstract: A chiplet system comprises an interposer including interconnect and multiple chiplets arranged on the interposer and interconnected using the interconnect of the interposer. The multiple chiplets include a throttle level bus source chiplet including a throttle level bus drive interface configured to place a throttle level value onto the throttle level bus, and one or more throttle level bus receiver chiplets operatively coupled to the throttle level bus. Each chiplet of the multiple chiplets includes throttling logic circuitry configured to set a throttle level of a chiplet according to the throttle level value.Type: GrantFiled: October 20, 2020Date of Patent: August 8, 2023Assignee: Micron Technology, Inc.Inventors: Dean E. Walker, Tony Brewer, David Patrick, Michael Grassi, Bryan Hornung
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Patent number: 11635359Abstract: An instrument and method for mechanical properties in situ testing of materials under a high temperature and complex mechanical loads are provided. The instrument includes: a support frame module used to provide a stable support and an effective vibration isolation for each functional module of the instrument; a high-frequency fatigue load applying module used to apply a high-frequency fatigue load on a tested sample; a static-dynamic mechanical load applying module used to apply a combination of static-dynamic tension/compression/bending loads on the tested sample; a high/low temperature applying module used to apply a variable temperature environment from a low temperature to a high temperature on the tested sample; and an in-situ monitoring module that may integrate a surface deformation damage measurement assembly, a three-dimensional strain measurement assembly, a microstructure measurement assembly, and an internal damage detection assembly according to a practical testing requirement.Type: GrantFiled: February 17, 2020Date of Patent: April 25, 2023Assignee: JILIN UNIVERSITYInventors: Hongwei Zhao, Jiucheng Zhao, Shizhong Zhang, Lixia Xu, Jie Wan, Xu Jing, Daqing Zhao, Zhenzhang Zhao, Liming Zhou, Yuming Fang, Yu An Mou
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Patent number: 11424169Abstract: Some embodiments include apparatuses and methods of fabricating the apparatuses. One of the apparatuses includes a substrate of a semiconductor die; a memory cell portion located over a first portion of the substrate; a conductive pad portion located over a second portion of the substrate and outside the memory cell portion; and a sensor circuit including a portion located over the second portion of the substrate and under the conductive pad portion. The conductive pad portion includes conductive pads. Each of the conductive pads is part of a respective electrical path coupled to a conductive contact of a base outside the substrate.Type: GrantFiled: August 8, 2019Date of Patent: August 23, 2022Assignee: Micron Technology, Inc.Inventors: Chiara Cerafogli, Kenneth William Marr, Brian J. Soderling, Michael P. Violette, Joshua Daniel Tomayer, James E. Davis
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Patent number: 11421987Abstract: A tool for detecting a covered edge of a structural member through sealant material of a fillet seal includes an edge detection probe mounted to a fixture. The probe outputs an interrogation signal toward the covered edge and receives a return signal indicative of a location of the covered edge. The tool includes an electronic control unit (“ECU”) in communication with the edge detection probe and a display screen. The ECU is configured to generate, from the return signal, one or more XY coordinates indicative of the edge location, and to display the edge location on the display screen. Additionally, the tool includes a seal measurement device. In response to the edge location, the device measures a predetermined dimension of the fillet seal, including a thickness and/or a shape of the fillet seal. A method includes detecting the covered edge using the tool.Type: GrantFiled: January 6, 2020Date of Patent: August 23, 2022Assignee: The Boeing CompanyInventors: William J. Tapia, Gary E. Georgeson
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Patent number: 11397208Abstract: An infrared zero value diagnosis method and system for a porcelain insulator string are provided.Type: GrantFiled: December 31, 2020Date of Patent: July 26, 2022Assignees: State Grid Hubei Electric Power Research Institute, Hunan UniversityInventors: Xueming Zhou, Danhui Hu, Xiaopo Mao, Jungang Yin, Jianjin Fu, Zhiqiang Feng, Yaodong Zhang, Zeqi Huang, Tianru Shi
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Patent number: 11175251Abstract: A product performance test method and system are provided. The product performance test method includes: at least testing a specific heat capacity C of a heat storage material of a sample, a heat transfer coefficient K, an energy efficiency ratio E of a refrigeration system, and a mass m of the heat storage material contained in the sample to detect a performance level of the sample. The method provided tests four key factors: the specific heat capacity C of the heat storage material of a product, the heat transfer coefficient K, the energy efficiency ratio E of the refrigeration system, and the mass m of the heat storage material in a box.Type: GrantFiled: March 25, 2019Date of Patent: November 16, 2021Assignee: CQC INTIME TESTING TECHNOLOGY CO., LTDInventors: Zonghui Yang, Conglin Huang, Jie Wang
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Patent number: 11060962Abstract: Provided is a flow analysis method capable of predicting a flow state of a composite resin material by taking into account a change in filler dispersion degree of the composite resin material. In a flow analysis method for a composite resin material having a filler and a resin, in a certain process of identifying a region in which the composite resin material flows and analyzing a flow, an exothermic reaction speed of the composite resin material in the region is computed using a filler dispersion degree in the composite resin material, a temperature and the filler dispersion degree of the composite resin material in the region is computed using the computed exothermic reaction speed, and an exothermic reaction speed in a process subsequent to a process is computed using the computed filler dispersion degree.Type: GrantFiled: April 18, 2016Date of Patent: July 13, 2021Assignee: HITACHI, LTD.Inventors: Tsutomu Kono, Ryotaro Shimada, Tsubasa Watanabe, Hiroki Nakatsuchi
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Patent number: 10628878Abstract: A method and system for generating content for listings of items for sale on an online marketplace is provided. A user interface for display on a computing device operated by a user of the online marketplace is provided. A listing of an item for sale on the online marketplace can be analyzed to determine one or more characteristics of the listing. A predictive indicator indicating whether the listing will complete can be determined based on the one or more characteristics. Based on the predictive indicator indicating that the listing will not complete, one or more virtual personalities can be selected, based at least in part on a user profile maintained the user, for presentation on the user interface. In response to selecting the one or more virtual personalities, the one or more virtual personalities can be automatically presented within the user interface displayed on the computing device.Type: GrantFiled: December 22, 2017Date of Patent: April 21, 2020Assignee: Auction.com, LLCInventor: Robert Friedman
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Patent number: 10475652Abstract: There is provided a technology includes: heating a heat insulating plate, which is held by a substrate holder configured to hold a substrate, to a processing temperature, at which the substrate is processed, by an electromagnetic wave supplied from a heating device, and measuring a temperature change of the heat insulating plate until the heat insulating plate reaches the processing temperature; heating the substrate, to the processing temperature and measuring a temperature change of the substrate until the substrate reaches the processing temperature; obtaining a correlation between the temperature change of the heat insulating plate and the temperature change of the substrate and heating the substrate by controlling the heating device based on the temperature of the heat insulating plate and the correlation.Type: GrantFiled: March 19, 2018Date of Patent: November 12, 2019Assignee: Kokusai Electric CorporationInventors: Hideto Yamaguchi, Yukitomo Hirochi
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Patent number: 10273887Abstract: In a case where a control device receives a stop signal instructing stopping of an engine and the control device determines that the engine temperature is lower than a predetermined temperature based on a signal from a timer or based on a signal from a cooling water temperature sensor, an operation control is maintained until the control device determines that the engine temperature is the predetermined temperature or higher. This way, an engine is provided which is capable of restraining generation of blowby condensate water without stopping a cooling water pump during the operation of the engine.Type: GrantFiled: March 11, 2016Date of Patent: April 30, 2019Assignee: YANMAR CO., LTD.Inventors: Hideshi Okada, Hirotoshi Kihara
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Patent number: 10201463Abstract: A system for measuring fluid absorption and retention properties of various samples having one or more materials, layers and/or articles. The system includes an optically or radiographically transparent fixture. The system enables measuring voxels having a grayscale value that demonstrate a difference in fluid densities and thereby enable the study of fluid flow and movement within and/or amongst various materials and articles in real time.Type: GrantFiled: November 17, 2016Date of Patent: February 12, 2019Assignee: Edgewell Personal Care Brands, LLC.Inventors: Alexander O'Connor, Richard Timmers
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Patent number: 10180391Abstract: A device for conducting accelerated aging tests of a coating, notably an outer coating for an aircraft, in particular allowing the testing of the durability of the coating after having been subject to all kinds of stresses, is desired. An object of the disclosure thus relates to such a device including test chambers subject to different and/or independently controllable test parameters, and including light for generating photo-oxidation, the device including a support for a sample of the coating, displaceable between the chambers for generating mechanical stresses by thermal shocks. The disclosure herein finds applications in many fields of industry, and preferentially in the field of aeronautics.Type: GrantFiled: December 22, 2015Date of Patent: January 15, 2019Assignee: Airbus Operations (S.A.S.)Inventors: Stéphane Rey, Florent Audoin, Pierre Heberle, Isabelle Multan
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Patent number: 10096236Abstract: In some implementations, techniques are described for detecting abnormal installations in a property monitored by a monitoring (e.g., security) system. For instance, an aberration engine may be used to detect an abnormal sensor or system installation within a property based on comparing detected installation data against local installation patterns of local providers within a certain proximity to the property. In some examples, the attributes (e.g., installation time, components used, number of tests performed, etc.) of a monitoring system installation, including installation of components of the monitoring system, may be compared to average installation times of other nearby installations to detect abnormalities in the installation.Type: GrantFiled: September 18, 2017Date of Patent: October 9, 2018Assignee: Alarm.com IncorporatedInventor: Stephen Scott Trundle
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Patent number: 9897551Abstract: A method of determining degradation of a thermoplastic when exposed to light and heat includes illuminating the thermoplastic with a desired wavelength of light at a desired irradiance while maintaining the thermoplastic at a desired temperature. The method is useful to measure the discoloration rate of transparent, translucent and opaque thermoplastics such as polycarbonates, the discoloration rate being determined by transmission or reflectance spectra of transmitted or reflected white light through or from the thermoplastic.Type: GrantFiled: January 16, 2015Date of Patent: February 20, 2018Assignee: SABIC GLOBAL TECHNOLOGIES B.V.Inventor: Christopher Luke Hein
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Patent number: 9885650Abstract: An accelerated life testing device and method including an accelerated life testing method for a test piece within a test chamber, the method including: establishing a first atmosphere within the test chamber; changing the first atmosphere to a second atmosphere to form a deposition layer on the test piece; changing the second atmosphere to the first atmosphere to remove the deposition layer from the test piece; and repeating the changing the first atmosphere to the second atmosphere and the changing the second atmosphere to the first atmosphere to form an oxidation layer on the test piece.Type: GrantFiled: January 15, 2016Date of Patent: February 6, 2018Assignee: Medtronic MiniMed, Inc.Inventors: Darren Y. K. Yap, Alexander E. Holmes
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Patent number: 9347985Abstract: A via chain testing structure includes: a substrate; a dielectric layer disposed on the substrate; a first via chain disposed on dielectric layer; a second via chain, being disposed on the dielectric on both sides of the first via chain and in thermal proximity with the first via chain; a first heating source disposed under the substrate, for providing thermal heat to the first via chain; and an electrical current source for heating the second via chain so the second via chain acts as a second heating source for the first via chain.Type: GrantFiled: August 4, 2011Date of Patent: May 24, 2016Assignee: NANYA TECHNOLOGY CORP.Inventors: Philip J. Ireland, Wen-Sung Chiang
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Patent number: 9267875Abstract: An accelerated life testing device and method including an accelerated life testing method for a test piece within a test chamber, the method including: establishing a first atmosphere within the test chamber; changing the first atmosphere to a second atmosphere to form a deposition layer on the test piece; changing the second atmosphere to the first atmosphere to remove the deposition layer from the test piece; and repeating the changing the first atmosphere to the second atmosphere and the changing the second atmosphere to the first atmosphere to form an oxidation layer on the test piece.Type: GrantFiled: November 21, 2013Date of Patent: February 23, 2016Assignee: MEDTRONIC MINIMED, INC.Inventors: Darren Y. K. Yap, Alexander E. Holmes
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Patent number: 9200965Abstract: A method of in-situ temperature measurement for a wafer treatment reactor such as a chemical vapor deposition reactor desirably includes the steps of heating the reactor until the reactor reaches a wafer treatment temperature and rotating a wafer support element within the reactor about a rotational axis. The method desirably further includes, while the wafer support element is rotating about the rotational axis, obtaining first operating temperature measurements using a first operating pyrometer that receives radiation from a first portion of the wafer support element, and obtaining first wafer temperature measurements using a wafer temperature measurement device that receives radiation from at least one wafer, the wafer temperature measurement device located at a first position.Type: GrantFiled: March 13, 2013Date of Patent: December 1, 2015Assignee: Veeco Instruments Inc.Inventors: Alexander I. Gurary, Mikhail Belousov, Guray Tas
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Publication number: 20150123512Abstract: Eddy current non-destructive examination and evaluation of physical properties of a component, such as a generator retaining ring, after experiencing potentially degrading thermal exposure during any stage of manufacture, assembly and service use, is performed to determine whether it is acceptable for service use, requires further modification (e.g., additional heat treatment processing) or whether is permanently unsuitable for service. Eddy current test measurements are correlated with component temperature exposure (e.g., absolute temperature and/or cumulative time-temperature heat absorption) and cumulative alteration of the component physical properties, such as, among others, material yield strength (YS), toughness, and tensile ductility. Using the eddy current test measurements and reference data correlating electrical conductivity with ring material thermal exposure, the component's physical properties are evaluated to determine its serviceability.Type: ApplicationFiled: November 5, 2013Publication date: May 7, 2015Inventors: Kalyan Kannan, Kevin P. Bailey, Neil L. Kilpatrick
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Patent number: 8985847Abstract: Monitoring of cooling of an electronic component is provided, which includes: determining a current thermal resistance associated with one or more of the electronic component, a heat sink coupled to the electronic component, or a thermal interface coupling the electronic component and the heat sink; and determining, by a processor, whether the current thermal resistance exceeds a set thermal resistance threshold, and responsive to the current thermal resistance exceeding the set thermal resistance threshold, indicating a thermal resistance fault. As an enhancement, rate of change over time of the thermal resistance is determined, and compared against a rate of change threshold, and if exceeding the threshold, a rate of change thermal resistance warning is provided.Type: GrantFiled: November 21, 2011Date of Patent: March 24, 2015Assignee: International Business Machines CorporationInventors: Levi A. Campbell, Richard C. Chu, Milnes P. David, Michael J. Ellsworth, Jr., Madhusudan K. Iyengar, Robert E. Simons
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Patent number: 8985848Abstract: The method and apparatus to automatically inspect or pre-screen the Equipment of passing CMVs employs the novel application of acquiring, processing and analyzing the temperature data from areas of interest on passing wheels using a computer based imaging system to improve the efficiency of current CMV inspecting and/or pre-screening manual methods that require an inspection system operator. The inspection system includes a triggering device, thermographic camera(s), computer based image acquisition hardware, image processing and analysis software, user interface and operator workspace (herein referred to as the “Inspection System”). The components of the apparatus are not limited to the list above nor are all components required to embody the method for inspection or pre-screening of equipment of passing CMVs. The method is a means of collecting the thermal information of the Equipment as it passes through an Inspection Area and analyzing it to determine or estimate its condition or fitness.Type: GrantFiled: July 2, 2007Date of Patent: March 24, 2015Assignee: BDC Capital Inc.Inventors: Brian Heath, Tse Young (Fred) Ko, Gurcharn Lotey
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Publication number: 20150063410Abstract: A nondestructive inspection apparatus of a structure includes: an inspection apparatus body 1 provided with an infrared light irradiation unit irradiating a structure 3 to be inspected with heating infrared light, a temperature variation measuring unit measuring a variation in temperature of the structure due to the irradiation with infrared light from the infrared light irradiation unit, a drive-control-and-accumulation unit performing drive control of the infrared light irradiation unit and the temperature variation measuring unit and performing data accumulation; and a self-running mechanism unit 2 enabling the inspection apparatus body 1 to move along the structure 3. The structure 3 is inspected for an internal defect by irradiating the structure 3 with heating infrared light while the apparatus moves along the structure 3 through the use of the self-running mechanism unit 2 and measuring the variation in temperature of the structure 3 due to the irradiation with infrared light.Type: ApplicationFiled: September 2, 2014Publication date: March 5, 2015Inventors: Koichi KAJIYAMA, Michinobu MIZUMURA, Yoshinori OGAWA
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Patent number: 8950936Abstract: In a prior-art nail puncture test, it has been difficult to measure the temperature at a short-circuiting portion, which is closely related to the scale of an accident which occurs. As a solution, A nail puncture test device having a temperature measurement function, a sheath thermocouple, and a fixing portion 6 of the sheath thermocouple, wherein a bottomed hole through which the sheath thermocouple is inserted is bored in the axial direction from a head portion to the vicinity of the distal end at the center part of the outer frame, and the sheath thermocouple is fixed to the outer frame by the fixing portion 6 in a state where the sheath thermocouple is inserted into the bottomed hole and the distal end thereof having a temperature measurement point is in contact with the bottom of the hole is provided.Type: GrantFiled: July 10, 2009Date of Patent: February 10, 2015Assignees: Honda Motor Company Limited, Okazaki Manufacturing CompanyInventors: Masaji Sawa, Naoki Maruno, Masaru Yamana
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Publication number: 20150003495Abstract: An apparatus and a process for testing fluid from a heat exchanger. A first fluid from a heat exchanger to be tested is passed through a test heat exchanger. A second fluid is circulated through the test heat exchanger with a pump. The second fluid is heated with a heater so that a temperature in the test heat exchanger can be controlled, for example, to so that conditions in the heat exchanger are close to the conditions in the heat exchanger. After a period of time, the test heat exchanger can be removed and inspected, tested, or both. Also, multiple test heat exchangers may be used to test various process conditions. Additionally, the test heat exchangers may include different materials to test various materials.Type: ApplicationFiled: July 1, 2014Publication date: January 1, 2015Inventor: Laurin Joseph Aspinall
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Publication number: 20140369380Abstract: Embodiments relate to sensor systems and methods that can compensate for thermal EMF effects that can cause residual offset and other errors in sensor systems. In one embodiment, a sensor system comprises at least one temperature sensor arranged proximate a primary sensor element, e.g., a Hall plate in an embodiment in which the sensor system comprises a Hall-effect magnetic field sensing system, though other types of magnetic field and sensors more generally can be used in other embodiments. In another embodiment, a plurality of temperature sensors can be used, with each one arranged proximate a different sensor contact or element. In an example in which the Hall plate is operated according to a spinning operation scheme, the at least one temperature sensor can be configured to sense a temperature in each operating phase, and the individual sensed temperatures can be combined and used to provide a temperature-dependent compensation signal.Type: ApplicationFiled: June 18, 2013Publication date: December 18, 2014Inventor: Udo Ausserlechner
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Patent number: 8911145Abstract: A method of generating a function that correlates semiconductor temperature with semiconductor lifetime including applying resonant frequency laser illumination to the semiconductor.Type: GrantFiled: November 20, 2009Date of Patent: December 16, 2014Assignee: The United States of America as represented by the Secretary of the NavyInventor: Ceber Simpson
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Publication number: 20140341253Abstract: A controlling section 41 receives determined temperature and humidity values, set temperature and humidity values, a heating electric power value, and a humidifying electric power value from a body controller 30. A comparison and determination section 46 compares the heating electric power value and the humidifying electric power value with respective predetermined reference electric power values, and when at least one of the heating electric power value or the humidifying electric power value is less than a corresponding one of the reference electric power values, the comparison and determination section 46 outputs an anomaly signal indicating that the cooling capacity of a refrigeration apparatus 22 has been reduced.Type: ApplicationFiled: August 5, 2014Publication date: November 20, 2014Inventors: Yuichiro KOBAYASHI, Yusuke YAMAMOTO
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Publication number: 20140328369Abstract: Improved methods of detecting thermal exposure are provided herein. The provided methods utilize initially dormant luminescent probes incorporated into a matrix to form a composite. When exposed to heat over a period of time, the luminescent probes are “activated” through a molecular transformation initiated by thermal energy. The activated probes exhibit a luminescent profile based on the extent of thermal exposure, thereby providing an indicator of the thermal exposure experienced by the matrix. When the composite is used to produce a structural component of a vehicle (e.g., an aircraft), the methods provide a convenient, large-area indicator of thermal damage experienced by the structural component.Type: ApplicationFiled: May 1, 2014Publication date: November 6, 2014Applicant: University of Washington through its Center for CommercializationInventors: Brian D. Flinn, Alex Kwan-yue Jen, Sei-Hum Jang, Tucker Howie, Zhengwei Shi
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Publication number: 20140301425Abstract: In accordance with one aspect of the disclosure, a drill and detection system is disclosed. The system may include a drill and a thermal detector spaced apart from the drill. The drill may be directed in a first direction and the thermal detector may be directed in a second direction opposite the first direction.Type: ApplicationFiled: December 18, 2013Publication date: October 9, 2014Applicant: United Technologies CorporationInventor: Richard F. Norman
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Patent number: 8834018Abstract: This disclosure is directed to apparatuses, systems, and methods that can quickly and reliably determine a stationary or non-stationary change in temperature. During a simulated test of, for example, the heater system of an automated and/or high-speed composite material placement machine may be evaluated at any single location along a course whether a lay down material is heated below, at, or beyond its particular temperature requirements. Temperature measurements can be of a heat source that is moving at a rate from zero to over 3000 inches/minute. Temperature measurements of a moving heat source are reliable within a variance of approximately plus or minus 3° F. In addition, temperature measurements of a moving heat source on a laminated material may be had with a plurality of sensors along at least one direction and to various depths.Type: GrantFiled: May 13, 2011Date of Patent: September 16, 2014Assignee: The Boeing CompanyInventor: Mark Kim
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Publication number: 20140247857Abstract: Embodiments are provided herein for testing multichip module (MCM) thermal reliability. An embodiment method includes selecting a chip with higher thermal risk from a plurality of chips in the MCM, and measuring a plurality of predetermined temperature parameters associated with the selected chip. A thermal resistance is then calculated using the predetermined temperature parameters. The thermal resistance is used to determine a thermal performance of the MCM. The predetermined temperature parameters include a junction temperature of the selected chip and at least one of a case temperature above the selected chip, a board temperature below the selected chip, and an ambient air temperature.Type: ApplicationFiled: February 28, 2014Publication date: September 4, 2014Applicant: FUTUREWEI TECHNOLOGIES, INC.Inventors: Qian Han, Junsheng Guo, Yongwang Xiao
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Publication number: 20140241394Abstract: A rechargeable battery is externally heated to induce thermal runaway, and material expelled from the battery is analyzed.Type: ApplicationFiled: February 24, 2014Publication date: August 28, 2014Applicant: The Boeing CompanyInventor: Nels A. Olson
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Patent number: 8783336Abstract: A control system for providing thermal management of electronic equipment housed in a cabinet enclosure. The system can include a plurality of sensors in proximity to the cabinet enclosure for monitoring a temperature, a pressure and a humidity associated with the electronic equipment; and a controller in communication with the sensors for receiving data from the sensors, where the controller adjusts the temperature, the pressure and the humidity associated with the electronic equipment.Type: GrantFiled: November 25, 2009Date of Patent: July 22, 2014Assignee: IO Data Centers, LLCInventor: George Slessman
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Patent number: 8764285Abstract: This invention provides an apparatus for nondestructive residential inspection and various methods for using a thermal imaging apparatus coupled to inspect exterior residential components, interior residential component, for mold. More specifically, this invention provided a computerized method to facilitate inspecting a residential building.Type: GrantFiled: September 12, 2008Date of Patent: July 1, 2014Assignee: Homesafe Inspection, Inc.Inventors: Peng Lee, Kevin J. Seddon
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Patent number: 8762098Abstract: A thermal testing system for an electronic device includes at least one airflow sensor, at least one temperature sensor, a data collecting module, and a computer. The at least one airflow sensor is configured to sense an airflow speed in the electronic device. The at least one temperature sensor is configured to sense temperature information of the electronic device. The data collecting module is connected to the at least one airflow sensor and the at least one temperature sensor, and configured to receive analog signals sensed by the at least one airflow sensor and the at least one temperature sensor and convert the analog signals to digital signals. The computer is connected to the data collecting module, and configured to receive the digital signals from the data collecting module and display a test result.Type: GrantFiled: March 31, 2011Date of Patent: June 24, 2014Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.Inventor: Fu-Ming Liu
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Patent number: 8759770Abstract: A system for qualifying usability risk associated with subsurface defects in a multilayer coating includes a component having a multilayer coating, an infrared detection device for capturing infrared images of the multilayered coating and a processing unit that is in electronic communication with the infrared detection device where the processing unit generates a subsurface defect map of the multilayer coating based on the infrared images. The system further includes a risk map of the component.Type: GrantFiled: April 8, 2013Date of Patent: June 24, 2014Assignee: General Electric CompanyInventors: Steven Charles Woods, James Carroll Baummer