Of Susceptibility To Thermally Induced Deteriouration, Flaw, Or Failure Patents (Class 374/57)
  • Patent number: 10273887
    Abstract: In a case where a control device receives a stop signal instructing stopping of an engine and the control device determines that the engine temperature is lower than a predetermined temperature based on a signal from a timer or based on a signal from a cooling water temperature sensor, an operation control is maintained until the control device determines that the engine temperature is the predetermined temperature or higher. This way, an engine is provided which is capable of restraining generation of blowby condensate water without stopping a cooling water pump during the operation of the engine.
    Type: Grant
    Filed: March 11, 2016
    Date of Patent: April 30, 2019
    Assignee: YANMAR CO., LTD.
    Inventors: Hideshi Okada, Hirotoshi Kihara
  • Patent number: 10201463
    Abstract: A system for measuring fluid absorption and retention properties of various samples having one or more materials, layers and/or articles. The system includes an optically or radiographically transparent fixture. The system enables measuring voxels having a grayscale value that demonstrate a difference in fluid densities and thereby enable the study of fluid flow and movement within and/or amongst various materials and articles in real time.
    Type: Grant
    Filed: November 17, 2016
    Date of Patent: February 12, 2019
    Assignee: Edgewell Personal Care Brands, LLC.
    Inventors: Alexander O'Connor, Richard Timmers
  • Patent number: 10180391
    Abstract: A device for conducting accelerated aging tests of a coating, notably an outer coating for an aircraft, in particular allowing the testing of the durability of the coating after having been subject to all kinds of stresses, is desired. An object of the disclosure thus relates to such a device including test chambers subject to different and/or independently controllable test parameters, and including light for generating photo-oxidation, the device including a support for a sample of the coating, displaceable between the chambers for generating mechanical stresses by thermal shocks. The disclosure herein finds applications in many fields of industry, and preferentially in the field of aeronautics.
    Type: Grant
    Filed: December 22, 2015
    Date of Patent: January 15, 2019
    Assignee: Airbus Operations (S.A.S.)
    Inventors: Stéphane Rey, Florent Audoin, Pierre Heberle, Isabelle Multan
  • Patent number: 10096236
    Abstract: In some implementations, techniques are described for detecting abnormal installations in a property monitored by a monitoring (e.g., security) system. For instance, an aberration engine may be used to detect an abnormal sensor or system installation within a property based on comparing detected installation data against local installation patterns of local providers within a certain proximity to the property. In some examples, the attributes (e.g., installation time, components used, number of tests performed, etc.) of a monitoring system installation, including installation of components of the monitoring system, may be compared to average installation times of other nearby installations to detect abnormalities in the installation.
    Type: Grant
    Filed: September 18, 2017
    Date of Patent: October 9, 2018
    Assignee: Alarm.com Incorporated
    Inventor: Stephen Scott Trundle
  • Patent number: 9897551
    Abstract: A method of determining degradation of a thermoplastic when exposed to light and heat includes illuminating the thermoplastic with a desired wavelength of light at a desired irradiance while maintaining the thermoplastic at a desired temperature. The method is useful to measure the discoloration rate of transparent, translucent and opaque thermoplastics such as polycarbonates, the discoloration rate being determined by transmission or reflectance spectra of transmitted or reflected white light through or from the thermoplastic.
    Type: Grant
    Filed: January 16, 2015
    Date of Patent: February 20, 2018
    Assignee: SABIC GLOBAL TECHNOLOGIES B.V.
    Inventor: Christopher Luke Hein
  • Patent number: 9885650
    Abstract: An accelerated life testing device and method including an accelerated life testing method for a test piece within a test chamber, the method including: establishing a first atmosphere within the test chamber; changing the first atmosphere to a second atmosphere to form a deposition layer on the test piece; changing the second atmosphere to the first atmosphere to remove the deposition layer from the test piece; and repeating the changing the first atmosphere to the second atmosphere and the changing the second atmosphere to the first atmosphere to form an oxidation layer on the test piece.
    Type: Grant
    Filed: January 15, 2016
    Date of Patent: February 6, 2018
    Assignee: Medtronic MiniMed, Inc.
    Inventors: Darren Y. K. Yap, Alexander E. Holmes
  • Patent number: 9347985
    Abstract: A via chain testing structure includes: a substrate; a dielectric layer disposed on the substrate; a first via chain disposed on dielectric layer; a second via chain, being disposed on the dielectric on both sides of the first via chain and in thermal proximity with the first via chain; a first heating source disposed under the substrate, for providing thermal heat to the first via chain; and an electrical current source for heating the second via chain so the second via chain acts as a second heating source for the first via chain.
    Type: Grant
    Filed: August 4, 2011
    Date of Patent: May 24, 2016
    Assignee: NANYA TECHNOLOGY CORP.
    Inventors: Philip J. Ireland, Wen-Sung Chiang
  • Patent number: 9267875
    Abstract: An accelerated life testing device and method including an accelerated life testing method for a test piece within a test chamber, the method including: establishing a first atmosphere within the test chamber; changing the first atmosphere to a second atmosphere to form a deposition layer on the test piece; changing the second atmosphere to the first atmosphere to remove the deposition layer from the test piece; and repeating the changing the first atmosphere to the second atmosphere and the changing the second atmosphere to the first atmosphere to form an oxidation layer on the test piece.
    Type: Grant
    Filed: November 21, 2013
    Date of Patent: February 23, 2016
    Assignee: MEDTRONIC MINIMED, INC.
    Inventors: Darren Y. K. Yap, Alexander E. Holmes
  • Patent number: 9200965
    Abstract: A method of in-situ temperature measurement for a wafer treatment reactor such as a chemical vapor deposition reactor desirably includes the steps of heating the reactor until the reactor reaches a wafer treatment temperature and rotating a wafer support element within the reactor about a rotational axis. The method desirably further includes, while the wafer support element is rotating about the rotational axis, obtaining first operating temperature measurements using a first operating pyrometer that receives radiation from a first portion of the wafer support element, and obtaining first wafer temperature measurements using a wafer temperature measurement device that receives radiation from at least one wafer, the wafer temperature measurement device located at a first position.
    Type: Grant
    Filed: March 13, 2013
    Date of Patent: December 1, 2015
    Assignee: Veeco Instruments Inc.
    Inventors: Alexander I. Gurary, Mikhail Belousov, Guray Tas
  • Publication number: 20150123512
    Abstract: Eddy current non-destructive examination and evaluation of physical properties of a component, such as a generator retaining ring, after experiencing potentially degrading thermal exposure during any stage of manufacture, assembly and service use, is performed to determine whether it is acceptable for service use, requires further modification (e.g., additional heat treatment processing) or whether is permanently unsuitable for service. Eddy current test measurements are correlated with component temperature exposure (e.g., absolute temperature and/or cumulative time-temperature heat absorption) and cumulative alteration of the component physical properties, such as, among others, material yield strength (YS), toughness, and tensile ductility. Using the eddy current test measurements and reference data correlating electrical conductivity with ring material thermal exposure, the component's physical properties are evaluated to determine its serviceability.
    Type: Application
    Filed: November 5, 2013
    Publication date: May 7, 2015
    Inventors: Kalyan Kannan, Kevin P. Bailey, Neil L. Kilpatrick
  • Patent number: 8985848
    Abstract: The method and apparatus to automatically inspect or pre-screen the Equipment of passing CMVs employs the novel application of acquiring, processing and analyzing the temperature data from areas of interest on passing wheels using a computer based imaging system to improve the efficiency of current CMV inspecting and/or pre-screening manual methods that require an inspection system operator. The inspection system includes a triggering device, thermographic camera(s), computer based image acquisition hardware, image processing and analysis software, user interface and operator workspace (herein referred to as the “Inspection System”). The components of the apparatus are not limited to the list above nor are all components required to embody the method for inspection or pre-screening of equipment of passing CMVs. The method is a means of collecting the thermal information of the Equipment as it passes through an Inspection Area and analyzing it to determine or estimate its condition or fitness.
    Type: Grant
    Filed: July 2, 2007
    Date of Patent: March 24, 2015
    Assignee: BDC Capital Inc.
    Inventors: Brian Heath, Tse Young (Fred) Ko, Gurcharn Lotey
  • Patent number: 8985847
    Abstract: Monitoring of cooling of an electronic component is provided, which includes: determining a current thermal resistance associated with one or more of the electronic component, a heat sink coupled to the electronic component, or a thermal interface coupling the electronic component and the heat sink; and determining, by a processor, whether the current thermal resistance exceeds a set thermal resistance threshold, and responsive to the current thermal resistance exceeding the set thermal resistance threshold, indicating a thermal resistance fault. As an enhancement, rate of change over time of the thermal resistance is determined, and compared against a rate of change threshold, and if exceeding the threshold, a rate of change thermal resistance warning is provided.
    Type: Grant
    Filed: November 21, 2011
    Date of Patent: March 24, 2015
    Assignee: International Business Machines Corporation
    Inventors: Levi A. Campbell, Richard C. Chu, Milnes P. David, Michael J. Ellsworth, Jr., Madhusudan K. Iyengar, Robert E. Simons
  • Publication number: 20150063410
    Abstract: A nondestructive inspection apparatus of a structure includes: an inspection apparatus body 1 provided with an infrared light irradiation unit irradiating a structure 3 to be inspected with heating infrared light, a temperature variation measuring unit measuring a variation in temperature of the structure due to the irradiation with infrared light from the infrared light irradiation unit, a drive-control-and-accumulation unit performing drive control of the infrared light irradiation unit and the temperature variation measuring unit and performing data accumulation; and a self-running mechanism unit 2 enabling the inspection apparatus body 1 to move along the structure 3. The structure 3 is inspected for an internal defect by irradiating the structure 3 with heating infrared light while the apparatus moves along the structure 3 through the use of the self-running mechanism unit 2 and measuring the variation in temperature of the structure 3 due to the irradiation with infrared light.
    Type: Application
    Filed: September 2, 2014
    Publication date: March 5, 2015
    Inventors: Koichi KAJIYAMA, Michinobu MIZUMURA, Yoshinori OGAWA
  • Patent number: 8950936
    Abstract: In a prior-art nail puncture test, it has been difficult to measure the temperature at a short-circuiting portion, which is closely related to the scale of an accident which occurs. As a solution, A nail puncture test device having a temperature measurement function, a sheath thermocouple, and a fixing portion 6 of the sheath thermocouple, wherein a bottomed hole through which the sheath thermocouple is inserted is bored in the axial direction from a head portion to the vicinity of the distal end at the center part of the outer frame, and the sheath thermocouple is fixed to the outer frame by the fixing portion 6 in a state where the sheath thermocouple is inserted into the bottomed hole and the distal end thereof having a temperature measurement point is in contact with the bottom of the hole is provided.
    Type: Grant
    Filed: July 10, 2009
    Date of Patent: February 10, 2015
    Assignees: Honda Motor Company Limited, Okazaki Manufacturing Company
    Inventors: Masaji Sawa, Naoki Maruno, Masaru Yamana
  • Publication number: 20150003495
    Abstract: An apparatus and a process for testing fluid from a heat exchanger. A first fluid from a heat exchanger to be tested is passed through a test heat exchanger. A second fluid is circulated through the test heat exchanger with a pump. The second fluid is heated with a heater so that a temperature in the test heat exchanger can be controlled, for example, to so that conditions in the heat exchanger are close to the conditions in the heat exchanger. After a period of time, the test heat exchanger can be removed and inspected, tested, or both. Also, multiple test heat exchangers may be used to test various process conditions. Additionally, the test heat exchangers may include different materials to test various materials.
    Type: Application
    Filed: July 1, 2014
    Publication date: January 1, 2015
    Inventor: Laurin Joseph Aspinall
  • Publication number: 20140369380
    Abstract: Embodiments relate to sensor systems and methods that can compensate for thermal EMF effects that can cause residual offset and other errors in sensor systems. In one embodiment, a sensor system comprises at least one temperature sensor arranged proximate a primary sensor element, e.g., a Hall plate in an embodiment in which the sensor system comprises a Hall-effect magnetic field sensing system, though other types of magnetic field and sensors more generally can be used in other embodiments. In another embodiment, a plurality of temperature sensors can be used, with each one arranged proximate a different sensor contact or element. In an example in which the Hall plate is operated according to a spinning operation scheme, the at least one temperature sensor can be configured to sense a temperature in each operating phase, and the individual sensed temperatures can be combined and used to provide a temperature-dependent compensation signal.
    Type: Application
    Filed: June 18, 2013
    Publication date: December 18, 2014
    Inventor: Udo Ausserlechner
  • Patent number: 8911145
    Abstract: A method of generating a function that correlates semiconductor temperature with semiconductor lifetime including applying resonant frequency laser illumination to the semiconductor.
    Type: Grant
    Filed: November 20, 2009
    Date of Patent: December 16, 2014
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventor: Ceber Simpson
  • Publication number: 20140341253
    Abstract: A controlling section 41 receives determined temperature and humidity values, set temperature and humidity values, a heating electric power value, and a humidifying electric power value from a body controller 30. A comparison and determination section 46 compares the heating electric power value and the humidifying electric power value with respective predetermined reference electric power values, and when at least one of the heating electric power value or the humidifying electric power value is less than a corresponding one of the reference electric power values, the comparison and determination section 46 outputs an anomaly signal indicating that the cooling capacity of a refrigeration apparatus 22 has been reduced.
    Type: Application
    Filed: August 5, 2014
    Publication date: November 20, 2014
    Inventors: Yuichiro KOBAYASHI, Yusuke YAMAMOTO
  • Publication number: 20140328369
    Abstract: Improved methods of detecting thermal exposure are provided herein. The provided methods utilize initially dormant luminescent probes incorporated into a matrix to form a composite. When exposed to heat over a period of time, the luminescent probes are “activated” through a molecular transformation initiated by thermal energy. The activated probes exhibit a luminescent profile based on the extent of thermal exposure, thereby providing an indicator of the thermal exposure experienced by the matrix. When the composite is used to produce a structural component of a vehicle (e.g., an aircraft), the methods provide a convenient, large-area indicator of thermal damage experienced by the structural component.
    Type: Application
    Filed: May 1, 2014
    Publication date: November 6, 2014
    Applicant: University of Washington through its Center for Commercialization
    Inventors: Brian D. Flinn, Alex Kwan-yue Jen, Sei-Hum Jang, Tucker Howie, Zhengwei Shi
  • Publication number: 20140301425
    Abstract: In accordance with one aspect of the disclosure, a drill and detection system is disclosed. The system may include a drill and a thermal detector spaced apart from the drill. The drill may be directed in a first direction and the thermal detector may be directed in a second direction opposite the first direction.
    Type: Application
    Filed: December 18, 2013
    Publication date: October 9, 2014
    Applicant: United Technologies Corporation
    Inventor: Richard F. Norman
  • Patent number: 8834018
    Abstract: This disclosure is directed to apparatuses, systems, and methods that can quickly and reliably determine a stationary or non-stationary change in temperature. During a simulated test of, for example, the heater system of an automated and/or high-speed composite material placement machine may be evaluated at any single location along a course whether a lay down material is heated below, at, or beyond its particular temperature requirements. Temperature measurements can be of a heat source that is moving at a rate from zero to over 3000 inches/minute. Temperature measurements of a moving heat source are reliable within a variance of approximately plus or minus 3° F. In addition, temperature measurements of a moving heat source on a laminated material may be had with a plurality of sensors along at least one direction and to various depths.
    Type: Grant
    Filed: May 13, 2011
    Date of Patent: September 16, 2014
    Assignee: The Boeing Company
    Inventor: Mark Kim
  • Publication number: 20140247857
    Abstract: Embodiments are provided herein for testing multichip module (MCM) thermal reliability. An embodiment method includes selecting a chip with higher thermal risk from a plurality of chips in the MCM, and measuring a plurality of predetermined temperature parameters associated with the selected chip. A thermal resistance is then calculated using the predetermined temperature parameters. The thermal resistance is used to determine a thermal performance of the MCM. The predetermined temperature parameters include a junction temperature of the selected chip and at least one of a case temperature above the selected chip, a board temperature below the selected chip, and an ambient air temperature.
    Type: Application
    Filed: February 28, 2014
    Publication date: September 4, 2014
    Applicant: FUTUREWEI TECHNOLOGIES, INC.
    Inventors: Qian Han, Junsheng Guo, Yongwang Xiao
  • Publication number: 20140241394
    Abstract: A rechargeable battery is externally heated to induce thermal runaway, and material expelled from the battery is analyzed.
    Type: Application
    Filed: February 24, 2014
    Publication date: August 28, 2014
    Applicant: The Boeing Company
    Inventor: Nels A. Olson
  • Patent number: 8783336
    Abstract: A control system for providing thermal management of electronic equipment housed in a cabinet enclosure. The system can include a plurality of sensors in proximity to the cabinet enclosure for monitoring a temperature, a pressure and a humidity associated with the electronic equipment; and a controller in communication with the sensors for receiving data from the sensors, where the controller adjusts the temperature, the pressure and the humidity associated with the electronic equipment.
    Type: Grant
    Filed: November 25, 2009
    Date of Patent: July 22, 2014
    Assignee: IO Data Centers, LLC
    Inventor: George Slessman
  • Patent number: 8764285
    Abstract: This invention provides an apparatus for nondestructive residential inspection and various methods for using a thermal imaging apparatus coupled to inspect exterior residential components, interior residential component, for mold. More specifically, this invention provided a computerized method to facilitate inspecting a residential building.
    Type: Grant
    Filed: September 12, 2008
    Date of Patent: July 1, 2014
    Assignee: Homesafe Inspection, Inc.
    Inventors: Peng Lee, Kevin J. Seddon
  • Patent number: 8759770
    Abstract: A system for qualifying usability risk associated with subsurface defects in a multilayer coating includes a component having a multilayer coating, an infrared detection device for capturing infrared images of the multilayered coating and a processing unit that is in electronic communication with the infrared detection device where the processing unit generates a subsurface defect map of the multilayer coating based on the infrared images. The system further includes a risk map of the component.
    Type: Grant
    Filed: April 8, 2013
    Date of Patent: June 24, 2014
    Assignee: General Electric Company
    Inventors: Steven Charles Woods, James Carroll Baummer
  • Patent number: 8762098
    Abstract: A thermal testing system for an electronic device includes at least one airflow sensor, at least one temperature sensor, a data collecting module, and a computer. The at least one airflow sensor is configured to sense an airflow speed in the electronic device. The at least one temperature sensor is configured to sense temperature information of the electronic device. The data collecting module is connected to the at least one airflow sensor and the at least one temperature sensor, and configured to receive analog signals sensed by the at least one airflow sensor and the at least one temperature sensor and convert the analog signals to digital signals. The computer is connected to the data collecting module, and configured to receive the digital signals from the data collecting module and display a test result.
    Type: Grant
    Filed: March 31, 2011
    Date of Patent: June 24, 2014
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventor: Fu-Ming Liu
  • Publication number: 20140153609
    Abstract: The invention relates to the technical field of LDC fabrication and specifically to a high and low temperature test equipment. The high and low temperature test equipment comprises a housing, and further comprises a partition disposed in the interior of the housing. The partition divides the interior of the housing into a plurality of chambers and is provided with a Peltier effect sheet. The Peltier effect sheet is used for, when it is powered-on, cooling at least one of the chambers and meanwhile heating at least one chamber other than the at least one of the chambers. The high and low temperature test equipment may cool and heat at the same time in an efficient, power conserving way and have uniform heating function.
    Type: Application
    Filed: November 29, 2013
    Publication date: June 5, 2014
    Inventor: Yangkun Jing
  • Patent number: 8727607
    Abstract: A method of calibrating a heater system for heating a surface of a structure, the heater system including a heater element, a temperature sensor proximate the heater element for outputting a signal indicative of the temperature of the heater element, and a controller for controlling the supply of power to the heater element in dependence on the signal to maintain the temperature of the heater element at a first substantially constant temperature. The method comprises: immersing the structure in a fluid for maintaining the surface of the structure at a second substantially constant temperature; supplying an amount of power to the heater element; receiving the signal from the temperature sensor and determining a temperature at the temperature sensor; and determining a setpoint temperature for controlling the heater element in dependence on the signal and the second substantially constant temperature.
    Type: Grant
    Filed: April 25, 2011
    Date of Patent: May 20, 2014
    Assignee: Ultra Electronics Limited
    Inventor: Ian McGregor Stothers
  • Patent number: 8708555
    Abstract: Methods and systems are disclosed for determining an amount of bond between a structure and sensor. A method may include performing a process associated with a sensor bonded to a structure and generating measured data in response to the process. The method may further include comparing the measured data to known reference data to determine integrity of a bond between the sensor and the structure. A system may include a sensor system including at least one sensor bonded to a structure. The system may further include a sensing system configured to initiate an application of one or more stimuli to the at least one sensor and monitor a property associated with the at least one sensor. The sensing system may further be configured to determine an amount of bond between the at least one sensor and the structure based on the monitored property.
    Type: Grant
    Filed: December 4, 2009
    Date of Patent: April 29, 2014
    Assignee: Alliant Techsystems Inc.
    Inventors: John L. Shipley, Jerry W. Jenson, Mark R. Eggett, Sorin V. Teles, Don W. Wallentine
  • Patent number: 8702303
    Abstract: Methods and devices for mounting a sensor are presented herein. A temperature sensor assembly for a capacitor bank is disclosed that includes two opposing substrates, and a plurality of contact temperature sensors attached to each substrate. Each temperature sensor is configured to directly contact a surface of one of the capacitor cans in the capacitor bank and therefrom generate a signal indicative of the temperature of the capacitor can. A biasing member attaches the two substrates together. The biasing member is configured to selectively contract, such that the width of the sensor assembly is less than the gap distance between adjacent sets of tandem capacitor cans and the sensor assembly can insert between the sets of capacitor cans, and expand, such that the width of the sensor assembly is greater than the gap distance and the sensor assembly is tensioned against and thereby secured between the sets of capacitor cans.
    Type: Grant
    Filed: June 29, 2011
    Date of Patent: April 22, 2014
    Assignee: Schneider Electric USA, Inc.
    Inventors: Jeffrey J. Farago, Marcelo Perez, Stewart J. Harding
  • Patent number: 8696196
    Abstract: A bleed leakage detection system includes an arrangement of thermostats that are capable of detecting the place where the bleed air leakage is occurring (e.g., the failed junction in bleed air duct work). The exemplary illustrative non-limiting implementation provides a bleed leakage detection system with continuous monitoring of thermostat sensor wiring during flight and thermostat self-test function (“Initiated Built In Test”—“IBIT”). The IBIT self-testing can be initiated before the aircraft takes off or optionally, during periodic self testing that may be run during predetermined periods such as overnight when the aircraft is not being flown. By the continuous monitoring the pilot is alerted when a bleed leakage has occurred or when the bleed leakage detection system has failed.
    Type: Grant
    Filed: December 22, 2008
    Date of Patent: April 15, 2014
    Assignee: Embraer S.A.
    Inventor: Oswaldo Barthel Monteiro
  • Patent number: 8678643
    Abstract: A method for non-destructive testing of open hollow components for tightness supplies a gas under pressure into the component and cools the component in a punctiform manner. Detecting a leak out of the component using a thermographic camera and using a computer connected downstream of the thermographic camera to visualise the leak, follows. The precise location of each leak is thus detected.
    Type: Grant
    Filed: May 31, 2011
    Date of Patent: March 25, 2014
    Assignee: Inpro Innovationsgesellschaft fur Fortgeschrittene Produktionssysteme in der Fahrzeugindustrie mbH
    Inventor: Robert Strohmeyer
  • Publication number: 20140079092
    Abstract: A method and an apparatus for an arrangement including a power semiconductor module with a cooling interface which is connected to a cooling element. The method first measures a first temperature value of the cooling interface, and then changes an operating mode of the power semiconductor module, wherein the operating mode is selected from an active mode and an inactive mode. The method then waits a determined time, measures a second temperature value of the cooling interface, and determines a temperature difference between the first temperature value and the second temperature value. The method then determines a level of a fault risk on the basis of the temperature difference. The apparatus implements the method.
    Type: Application
    Filed: September 19, 2012
    Publication date: March 20, 2014
    Applicant: ABB Oy
    Inventors: Vesa TiIhonen, Kari Tikkanen
  • Patent number: 8668381
    Abstract: A system for monitoring performance parameters of an apparatus operating at an elevated temperature, such as a gas turbine engine. The system includes sensors for sensing the performance parameters and generating analog sensor outputs, at least one hub unit mounted sufficiently close to the apparatus so as to be subjected to a first temperature in excess of 125° C., a collector unit subjected to a second temperature of less than the first temperature, and a distributor computer unit subjected to a third temperature of less than the second temperature. The hub unit has control and signal conditioning circuit boards that operate together to condition the analog sensor outputs of the sensors and produce corresponding digital data. The collector unit transmits the digital data from the hub unit to the distributor computer unit, which processes the digital data to assess the performance parameters of the apparatus.
    Type: Grant
    Filed: December 23, 2010
    Date of Patent: March 11, 2014
    Assignee: General Electric Company
    Inventors: John David Weickert, Eric John Bair, Gregory Keelen Griffin
  • Patent number: 8668382
    Abstract: Disclosed is a method for estimating, within a short time, the life of a cable insulating coating material containing an antioxidant in a suitable concentration based on the rate of decrease of the antioxidant and on the critical concentration of the antioxidant at which oxidative degradation rapidly proceeds. The method tests the coating material to examine its life, the coating material including a base polymer, and an antioxidant having a functional group suppressing an oxidative deteriorative reaction of the base polymer. The method includes performing a thermal degradation test on the coating material; determining the degradation levels and degradation rates of the coating material at two or more time points in the thermal degradation test, based on the ratio of the absorbance of the functional group of the antioxidant to the absorbance of the base polymer; and thereby evaluating the life of the coating material.
    Type: Grant
    Filed: February 14, 2012
    Date of Patent: March 11, 2014
    Assignee: Hitachi Metals, Ltd.
    Inventors: Kyoko Honbo, Motoko Harada, Hideto Momose, Takanori Yamazaki, Daisuke Abe, Yoshiaki Nakamura
  • Publication number: 20140033799
    Abstract: A method and apparatus for the remote nondestructive evaluation of an object such as a wind turbine blade involves applying mechanical and/or thermal stress to the object and then scanning the object using long-range thermographic and/or laser interferometric imaging. The laser interferometric imaging is preferably performed by a long range shearography camera capable of imaging deformation derivatives at long distances coupled with a blade stressing mechanism incorporating either thermal or internal blade pressurization for the purpose of detecting remotely and at high speed, changes in the structural integrity of an installed wind turbine blade.
    Type: Application
    Filed: October 7, 2013
    Publication date: February 6, 2014
    Inventor: John W. Newman
  • Patent number: 8641273
    Abstract: Faulty battery detecting and locating devices and methods are able to detect and locate a faulty battery cell. The device applies an energy to a sensing member, such as a polymeric tube containing at least two polymer-coated and twisted electric wires. Heat that is generated by a faulty battery triggers an electric communication between the two electric wires by melting at least a portion of the polymer. The resulting change in resistance between the two electric wires is used to detect and locate a faulty battery.
    Type: Grant
    Filed: November 2, 2010
    Date of Patent: February 4, 2014
    Assignee: Sinoelectric Powertrain Corporation
    Inventors: Peng Zhou, Paul Tsao, David Kevin Pariseau
  • Patent number: 8628235
    Abstract: Thermal test apparatus comprising a specimen supported by a fixture, a thermal shroud comprising a flexible insulating fabric forming an enclosure around at least a portion of the specimen, and a temperature controlled air supply connected to an opening formed in the enclosure for delivering a supply of temperature controlled air into the enclosure. Also, a method of conducting a thermal test.
    Type: Grant
    Filed: October 28, 2010
    Date of Patent: January 14, 2014
    Assignee: Airbus Operations Limited
    Inventor: Peter Davies
  • Patent number: 8622612
    Abstract: A focus error signal resulting from the photothermically-induced expansion is measured in a sample of material under analysis. A laser is disposed as a periodically modulated heating source which is directed to the sample and a device for focus error measuring which is directed to the surface being heated. A device measuring focus error generates a signal representative of the displacement of the surface of material in perpendicular direction due to the expansion produced by the periodic heating, which is filtered, either analogically or digitally, to discriminate the displacement component at the frequency in which it was modulated or at any other related frequency, such any harmonic or a sum with any other modulation. The focus error signal, appropriately calibrated, gives a precise and sensitive measure of the magnitude the expansion.
    Type: Grant
    Filed: February 12, 2010
    Date of Patent: January 7, 2014
    Assignee: Consejo Nacional de Investigaciones Cientificas y Tecnicas (Conicet)
    Inventors: Oscar Eduardo Martínez, Esteban Alejo Domené, Nélida Mingolo, Francisco Balzarotti, Andrea Verónica Bragas
  • Patent number: 8600642
    Abstract: A hub unit adapted for use in a monitoring system that monitors engine performance parameters of a gas turbine engine. The hub unit includes a housing, at least one signal conditioning circuit board within the housing and adapted to receive the analog sensor outputs from the sensors, and a control circuit board within the housing, connected to the signal conditioning circuit board, and adapted to produce digital data corresponding to analog sensor outputs. The signal conditioning circuit board multiplexes a plurality of the analog sensor outputs generated by the sensors to produce an individual multiplexed analog output, and has at least one amplifier with adjustable gain for scaling the analog sensor outputs of the individual multiplexed analog output to produce an individual conditioned multiplexed analog output from which the corresponding digital data are produced. The amplifier and the adjustable gain thereof are controlled by the control circuit board.
    Type: Grant
    Filed: December 23, 2010
    Date of Patent: December 3, 2013
    Assignee: General Electric Company
    Inventors: Eric John Bair, John David Weickert, Gregory Keelen Griffin
  • Patent number: 8591728
    Abstract: A conductive fluid detection apparatus for detecting moisture mixed into a coolant comprises: a filter unit having a tubular member through which a coolant can flow, mesh members made of stainless steel etc. and filter paper through which the coolant can pass, but which can hold moisture, the mesh members and the filter paper provided and stacked inside the tubular member, the filter paper interposed between the mesh members; a resistance value measurement circuit measuring the resistance value between mesh members; and a relay stopping the supply of power to the pump when the resistance value between the mesh members falls.
    Type: Grant
    Filed: August 23, 2006
    Date of Patent: November 26, 2013
    Assignee: Advantest Corporation
    Inventors: Seiji Hideno, Seigo Matsunaga
  • Patent number: 8579502
    Abstract: A method for optimizing direct wafer bond line width for reduction of parasitic capacitance in a MEMS device by reducing the width of a bond line between a first and a second wafer, exposing the MEMS device to a water vapor for a predetermined time period and at a first temperature capable of evaporating water, cooling the MEMS device at a second temperature capable of freezing the water, and operating the MEMS device at a third temperature capable of freezing the water to determine if there is discontinuity during operation.
    Type: Grant
    Filed: July 19, 2011
    Date of Patent: November 12, 2013
    Assignee: Northrop Grumman Corporation
    Inventors: Henry C. Abbink, Gabriel M. Kuhn, Howard Ge, Daryl Sakaida
  • Patent number: 8573836
    Abstract: An apparatus evaluates a substrate mounting device adapted to hold a target substrate placed on a mounting surface and to control a temperature of the target substrate. The apparatus includes an evacuatable airtightly sealed chamber accommodating therein the substrate mounting device, a heat source, arranged in a facing relationship with the mounting surface, for irradiating infrared light. The apparatus further includes an evaluation-purpose substrate adapted to be mounted on the mounting surface in place of the target substrate, the evaluation-purpose substrate being made of an infrared light absorbing material, and having a unit for measuring temperatures at plural sites on a surface and/or inside of the substrate.
    Type: Grant
    Filed: October 26, 2007
    Date of Patent: November 5, 2013
    Assignee: Tokyo Electron Limited
    Inventors: Yasuharu Sasaki, Takehiro Ueda, Taketoshi Okajo, Kaoru Oohashi
  • Publication number: 20130223475
    Abstract: To measure an inner temperature of a chamber included in a test handler, self-refresh currents of semiconductor memory devices under test are measured. The semiconductor memory devices are disposed in the chamber and have a function of linear temperature compensated self-refresh (Li-TCSR). Local temperature values are generated based on the self-refresh currents, where each local temperature value indicates a temperature near the corresponding semiconductor memory device of the semiconductor memory devices under test.
    Type: Application
    Filed: February 20, 2013
    Publication date: August 29, 2013
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventor: Samsung Electronics Co., Ltd.
  • Patent number: 8496373
    Abstract: A test specimen having a to-be-photographed surface and an attachment surface which is a back side thereof is produced, and attached to a structure. An artificial abnormal portion is provided between a to-be-inspected surface of the structure and the to-be-photographed surface of the test specimen. The to-be-photographed surface of the test specimen is photographed by the infrared camera. When a surface temperature difference between the abnormal and the sound portions increases to a certain level on the to-be-photographed surface, it is capable of discriminating between the abnormal and the sound portions by an infrared thermal image of the test specimen. In a time zone in which discriminating between the abnormal and the sound portions is capable, the to-be-inspected surface of the structure is photographed by the infrared camera. If there is a damage in the surface layer of the structure, a damaged position can be discriminated by an infrared thermal image.
    Type: Grant
    Filed: August 24, 2009
    Date of Patent: July 30, 2013
    Assignee: West Nippon Expressway Engineering Shikoku Company Limited
    Inventors: Yukio Akashi, Kazuaki Hashimoto, Shogo Hayashi
  • Patent number: 8491185
    Abstract: A method for checking the quality of thermal coupling between a measuring cell and a thermostatted element of an analyzer, where the measuring cell can be exchangeably inserted into an analyzer to measure at least one parameter of a sample, and is provided with at least one sensor element in a measuring channel.
    Type: Grant
    Filed: December 10, 2009
    Date of Patent: July 23, 2013
    Assignee: Roche Diagnostics Operations Inc.
    Inventors: Wolf-Dietrich Steinboeck, Robert Felsberger, Michael Kraker, Friedrich Schneider, Juergen Walla
  • Publication number: 20130156064
    Abstract: A system for testing electronic device includes an electronic device, a temperature detecting module, a testing instrument and a testing computer. The testing electronic includes a main board and a power supply. The main board includes a slot and a card inserted in the slot. A plurality of dummy loads is located on the card. The slot includes at least one voltage interface. The power supply includes at least one power wire electrically connected to the at least one voltage interface. The temperature detecting module detects temperature signals of the plurality of dummy loads. The testing instrument is electrically connected to the at least one power wire to test current signals or power signals of the at least one power wire. The testing computer receives and displays the temperature signals, the current signals and the power signals.
    Type: Application
    Filed: August 13, 2012
    Publication date: June 20, 2013
    Applicants: HON HAI PRECISION INDUSTRY CO., LTD., HONG FU JIN PRECISION INDUSTRY (WUHAN) CO., LTD.
    Inventors: XIA XU, WEN-MING YI, YU-LIN LIU
  • Patent number: 8449173
    Abstract: Some embodiments provide a system that tests a computing system. During operation, the system monitors a temperature of a component in the computing system while running a series of calibrated workloads on the component. Next, the system analyzes a fluctuation of the temperature resulting from the calibrated workloads to determine a thermal performance of the component. The system then uses the determined thermal performance to improve the reliability of the computing system.
    Type: Grant
    Filed: May 5, 2008
    Date of Patent: May 28, 2013
    Assignee: Google Inc.
    Inventor: Jasmine Strong
  • Publication number: 20130128918
    Abstract: Monitoring of cooling of an electronic component is provided, which includes: determining a current thermal resistance associated with one or more of the electronic component, a heat sink coupled to the electronic component, or a thermal interface coupling the electronic component and the heat sink; and determining, by a processor, whether the current thermal resistance exceeds a set thermal resistance threshold, and responsive to the current thermal resistance exceeding the set thermal resistance threshold, indicating a thermal resistance fault. As an enhancement, rate of change over time of the thermal resistance is determined, and compared against a rate of change threshold, and if exceeding the threshold, a rate of change thermal resistance warning is provided.
    Type: Application
    Filed: November 21, 2011
    Publication date: May 23, 2013
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Levi A. CAMPBELL, Richard C. CHU, Milnes P. DAVID, Michael J. ELLSWORTH, JR., Madhusudan K. IYENGAR, Robert E. SIMONS