Abstract: A calibration technique is provided that utilizes a standard sample that allows for calibration in the wavelengths of interest even when the standard sample may exhibit significant reflectance variations at those wavelengths for subtle variations in the properties of the standard sample. A second sample, a reference sample may have a relatively featureless reflectance spectrum over the same spectral region and is used in combination with the calibration sample to achieve the calibration. In one embodiment the spectral region may include the VUV spectral region.

Abstract: An alkali niobate-based piezoelectric/electrostrictive ceramics sintered body including, as a main crystal phase, a perovskite type oxide containing at least one type of element selected from the group consisting of Li, Na and K as A site constituent elements and at least one type of element selected from the group consisting of Nb and Ta as B site constituent elements. The number of lattice-strained layers of the piezoelectric/electrostrictive ceramics sintered body is preferably small. A diffuse scattering intensity ratio, which is a ratio of an intensity of diffuse scattering by a lattice-strained layer present near a domain wall to a sum of an X-ray diffraction intensity of a first lattice plane and that of a second lattice plane different in interplanar spacing from the first lattice plane due to crystallographic symmetry reduction is preferably 0.5 or lower.

Abstract: A method for measuring a pole of a sample, using a reflection method, is effective substantially over all measurement regions ranging from the region of high-tilting-angle ? of a conventional pole measuring to the in-plane diffraction region corresponding to low-tilting-angle ?.

Abstract: On the basis of a preset tilting angle (&agr;) of the sample (S), an incident angle (&ohgr;) of an X-ray with respect to the surface (Sa) of the sample is set to a predetermined position corresponding to the pole measuring position when the sample (Sa) is tilted by the tilting angle (&agr;), by rotating the sample (Sa) about a predetermined axis (&OHgr; axis) passing through a predetermined origin (O). Also, on the basis of the tilting angle (&agr;), an X-ray detector (1) is revolved by an angle (2&thgr;) about the predetermined axis (&OHgr; axis) along a first plane (P1) perpendicular to the predetermined axis (&OHgr; axis) and also revolved by an angle (2&OHgr;102 ) about the origin (O) along a second plane (P2) including the predetermined axis (&OHgr; axis) and perpendicular to the first plane (P1), whereby the X-ray detector (1) is disposed at a predetermined position corresponding to the pole measuring position when the sample (S) is tilted by the tilting angle (&agr;).

Abstract: A method for forming synthetic crystals of proteins in a carrier fluid by use of the dipole moments of protein macromolecules that self-align in the Helmholtz layer adjacent to an electrode. The voltage gradients of such layers easily exceed 10.sup.6 V/m. The synthetic protein crystals are subjected to x-ray crystallography to determine the conformational structure of the protein involved.

Abstract: An electrorheological crystalline mass of a molecule is formed by dispersing the molecule in a dispersion fluid and subjecting the molecule dispersion to a uniform electrical field for a period of time during which time an electrorheological crystalline mass is formed. Molecules that may be used to form an electrorheological crystalline mass include any organic or inorganic molecule which has a permanent dipole and/or which is capable of becoming an induced dipole in the presence of an electric field. The molecules used to form the electrorheological crystalline mass are preferably macromolecules, such as biomolecules, such as proteins, nucleic acids, carbohydrates, lipoproteins and viruses.Molecules are crystallized by a method in which an electric field is maintained for a period of time after the electrorheological crystalline mass has formed during which time at least some of the molecules making up the electrorheological crystalline mass form a crystal lattice.

Abstract: Previous methods for determining internal stress in polycrystalline solids by X-ray diffraction techniques have required that the distance between the X-ray irradiated surface of the sample under investigation and the X-ray detection surface for the diffracted X-rays be known. According to the practice of this invention, stress measurement can be made without determining the sample to detector distance as a separate step. Two or more sets of detection surfaces, i.e., X-ray detector channels, are arranged around the incident X-ray beam, usually on opposite sides of the cone of diffracted X-rays from one another. The invention employs a calibration procedure which provides a set of calibration parameters, which, when used with X-ray stress equations, yields accurate internal stress measurement without the prior art requirement of determining the sample to detector distance.

Abstract: An apparatus and method for precisely measuring the angles of cut of single nd doubly rotated cuts of quartz crystal blanks on a high volume production basis.