Abstract: A non-contact angle measuring apparatus includes a matter-wave and energy (MWE) particle source and a detector. The MWE particle source is used for generating boson or fermion particles. The detector is used for detecting a plurality peaks or valleys of an interference pattern generated by 1) the boson or fermion particles corresponding to a slit, a bump, or a hole of a first plane and 2) matter waves' wavefront-split associated with the boson or fermion particles reflected by a second plane, wherein angular locations of the plurality peaks or valleys of the interference pattern, a first distance between a joint region of the first plane and the second plane, and a second distance between the detector and the slit are used for deciding an angle between the first plane and the second plane.

Abstract: A user-friendly single-crystal X-ray structure analysis apparatus for quickly performing a single-crystal X-ray structure analysis using a crystalline sponge and easily making it possible by including managing related information and a method therefor, are provided. There are provided a sample holder comprising a porous complex crystal capable of soaking a sample in a plurality of fine pores formed therein; a goniometer that rotationally moves, the sample holder being attached to the goniometer; an information acquisition section 600 that acquires invariable information about the porous complex crystal or variable information provided after the sample is soaked therein; and an information storage section 111 that stores the invariable information or the variable information acquired by the information acquisition section 600.

Abstract: User-friendly single-crystal X-ray structure analysis apparatus and method for quickly performing a single-crystal X-ray structure analysis using a crystalline sponge and enabling the analysis including management of related information, and a sample holder and an applicator therefor are provided. There are provided a single-crystal X-ray structure analysis apparatus that performs a structure analysis of a material is provided, the apparatus comprising a sample holder that comprises a porous complex crystal capable of soaking the sample in a plurality of fine pores formed therein and that holds the sample; a goniometer that rotationally moves with the sample holder 250 being attached; and an information acquisition section 600 that acquires information about the porous complex crystal.

Abstract: Systems and methods here may be used for capturing and analyzing spectrometer data of multiple sample gemstones on a stage, including mapping digital camera image data of samples, for both reflective and transmission modes.

Abstract: Mechanisms are provided to implement a multi-layer analytics framework. The multi-layer analytics framework obtains a plurality of analytics from one or more analytics source computing systems, at least two analytics being written in different computer programming languages. The multi-layer analytics framework applies a wrapper to each of the analytics in the plurality of analytics to thereby generate wrapped analytics. The wrapper provides a unified interface for executing the analytics in the plurality of analytics regardless of the particular computer programming language used to create the analytics. The multi-layer analytics framework registers the wrapped analytics in an analytics registry, and executes an analytics pipeline comprising wrapped analytics in the analytics registry to perform an analytics operation based on the unified interface of the wrappers of the wrapped analytics.

Abstract: Provided is an X-ray analysis apparatus including: a goniometer including an incident-side arm extending in a first direction, a fixing portion, and a receiving-side arm; an X-ray source portion, which is arranged on the incident-side arm and generates an X-ray source extending in a second direction, which crosses the first direction; a support base, which is arranged on the fixing portion, and is configured to support a sample; a parallel slit, which is arranged on the fixing portion, and is configured to limit a line width along the second direction of the X-ray source generated by the X-ray source portion; and a detector, which is arranged on the receiving-side arm, and is configured to detect a scattered X-ray generated by the sample.

Abstract: A method of detecting an anomaly in a crystallographic structure, the method comprising: illuminating the structure with x-ray radiation in a known direction relative to the crystallographic orientation; positioning the structure such that its crystallographic orientation is known; detecting a pattern of the diffracted x-ray radiation transmitted through the structure; generating the simulated pattern based on the known direction relative to the crystallographic orientation; comparing the detected pattern to a simulated pattern for x-ray radiation illuminating in the known direction; and, detecting the anomaly in the crystallographic structure based on the comparison.

Abstract: A method for controlling the crystallographic orientation of at least one grain of a turbo engine part. The method includes emitting a beam of electromagnetic radiation through an elementary volume of the part and record diffraction information on the electromagnetic radiation passing through the part. This step is repeated on a given area of the part. The method further includes determining the crystal spatial orientation of each of said elementary volumes and deducing the presence of at least one first crystallographic grain for which the elementary volumes are oriented according to the same crystallographic orientation. The method further includes calculating the angular difference between the crystal spatial orientation of said first grain and a predetermined direction taken from the part and comparing it to a first predetermined threshold value and determining a state of use of the part.

Abstract: An X-ray analysis assistance device with an input and operation device 24 for arbitrarily inputting and setting the value of one from among the distance L between a sample S and a two-dimensional detector 2 and the maximum detection range Xmax for X-rays scattered or diffracted by the sample S, and a central processing unit 20 for automatically setting the other setting item on the basis of the value of the one setting item set by the input and operation device 24. Further, the maximum measurement frame Hmax for the X-rays is displayed on a display screen 22 of a display device 21 on the basis of the distance L and maximum detection range Xmax. Additionally, an X-ray detection area A indicating the range within which it is possible for the detection surface of the two-dimensional detector 2 to detect X-rays is displayed on the display screen 22 of the display device 21.

Abstract: A method of determining a mass flow rate, volumetric flow and test weight of grain during harvesting operations. A sensor is disposed in the harvesting machine against which clean grain piles are thrown by the clean grain elevator flights. The sensor changes the direction of the clean grain pile such that each clean grain pile compresses into a substantially discrete, contiguous shape producing discrete grain forces resulting in discrete signal pulse magnitudes generated by the sensor. The mass flow rate is calculated by summing the signal magnitudes and dividing the summed magnitudes by the sampling period. The volumetric flow rate is calculated by multiplying the pulse width generated by the sensor by a multiplier which relates pulse width to volumetric flow. The test weight of the clean grain is calculated by dividing the mass flow rate by the volumetric flow rate.

Abstract: One embodiment provides a method, including utilizing at least one processor to execute computer code that performs the steps of: receiving, from a user, one or more keywords, wherein the one or more keywords identify, within a social media data set, a subset of social media data; determining, based on social media statistical information, an estimated volume of the subset of the social media data; determining, based on the social media statistical information, an estimated relevance of the subset of social media data to the user; and updating the one or more keywords, to improve the estimated volume and estimated relevance. Other aspects are described and claimed.

Abstract: Provided is an X-ray small angle optical system, which easily achieves a desired angular resolution, including: an X-ray source having a microfocus; a multilayer mirror having an elliptical reflection surface, and being configured to collect X-rays emitted from the X-ray source and to irradiate a sample; and an X-ray detector configured to detect scattered X-rays generated from the sample, in which the elliptical reflection surface of the multilayer mirror has a focal point A and a focal point B, in which the X-ray source is arranged such that the microfocus includes the focal point A, and in which the X-ray detector is arranged on the multilayer mirror side of the focal point B.

Abstract: Methods and systems for estimating values of parameters of interest of structures fabricated on a wafer with a signal response metrology (SRM) model trained based on reference measurement data collected from the same wafer are presented herein. In one aspect, the SRM model is an input-output model trained to establish a functional relationship between reference measurements of structures fabricated on the wafer to raw measurement data collected from the same wafer. The raw measurement data collected from the wafer is employed for training the SRM model and for performing measurements using the trained SRM model. In another aspect, the SRM model uses the entire set of raw measurement data collected from a number of measurement sites across the wafer for both training and subsequent measurement at each individual site. In a further aspect, the SRM model is trained and utilized to measure each parameter of interest individually.

Abstract: A system, method and computer program product for determining suitability of a candidate for a role in an organization. According to an embodiment, the system is configured to generate an ideal candidate profile for the selected role based on performance data, psychometric test results and/or social network or profile data of one or more employees or individuals in an organization. The system is configured to generate a profile for the candidate in the selected role based on psychometric test results and/or social network data. The system compares the profile of the candidate to the ideal candidate profile and the basis of the comparison generates a suitability rating or factor for the candidate in the selected role.

Abstract: A method of X-ray analysis measures X-ray diffraction in transmission. In order to carry out quantitative measurements, a background measurement is taken slightly away from the diffraction peak and the ratio of measured intensities used to correct for variations in sample composition.

Abstract: The present invention includes providing a plurality of standard particles; providing a substantially crystalline material having one or more characteristic spatial parameters, disposing the plurality of standard particles proximate to a portion of the substantially crystalline material, acquiring imagery data of the plurality of standard particles and the portion of the substantially crystalline material, establishing a spatial relationship between the plurality of standard particles and the portion of the substantially crystalline material utilizing the acquired imagery data, and determining one or more spatial parameters of the plurality of standard particles utilizing the one or more characteristic spatial parameters of the substantially crystalline material and the established spatial relationship between the plurality of standard particles and the portion of the substantially crystalline material.

Abstract: A cutting tool having excellent chip treatability and adhesion resistance is provided. The cutting tool includes a hard sintered body in at least a cutting edge and has a rake face and a flank face. The rake face has a chip breaker in a protruded or uneven shape. The hard sintered body contains at least 20% by volume of cubic boron nitride. A region of not more than 20 ?m from a surface of the hard sintered body on the rake face side includes A-structures made of cubic boron nitride and B-structures made of at least one selected from the group consisting of hexagonal boron nitride, amorphous boron nitride, and boron oxide. The volume ratio of the B-structures to the sum of the A-structures and B-structures, B/(A+B), is not less than 5% by volume and not more than 90% by volume.

Abstract: An apparatus for examining the surface of a crystalline sample uses in-plane grazing incidence diffraction with a position-sensitive detector. The x-ray source illuminates an extended region of the sample and, for crystal sections having the appropriate lattice orientation, an elongated diffraction signal is produced. The relative position of the sample and the x-ray beam may then be changed to illuminate different regions of the sample so that the diffraction signal corresponds to these other regions. By scanning across the entire sample, a spatial profile of the sample surface may be generated. The system may be used to locate crystal boundaries, defects, or the presence of attenuating materials on the sample surface.

Abstract: There is provided an X-ray diffraction apparatus comprising an X-ray topography device for providing a spatial geometric correspondence to an X-ray exiting from a planar region of a sample to detect the X-ray as a planar X-ray topograph, and outputting the X-ray topograph as a signal; a two-dimensional imaging device for receiving a light-image of the planar region of the sample and outputting the light-image as a signal specified by planar positional information; and a video-synthesizing arithmetic control device for generating synthesized video data on the basis of an output signal from the X-ray topograph and an output signal from the imaging device.

Abstract: A method for correcting erroneous intensity measurements caused by defective pixels of the detector for a single-crystal X-ray diffraction system uses collected diffraction images and a defective pixel list to modify three-dimensional reflection profiles by replacing profile elements affected by the defective pixels with corresponding profile elements from a model profile. Reflection positions on the detector are predicted using an orientation matrix for the crystal and a three-dimensional observed profile is constructed for each reflection. A model profile is constructed using normalized profile data from multiple reflection profiles. The observed profiles are compared with the defective pixel list to determine which profile elements are affected by defective pixels, and those elements are replaced by corresponding elements from the model profile.

Abstract: A crystallization device for in situ x-ray diffraction of biological samples includes a flat plate made of single crystal quartz, silicon or sapphire and having an array of wells or lanes defined on the plate. The crystallization device may be in the form of a cover slide used with a crystallization plate in a vapor diffusion setup. Also disclosed is a method for preparing biological samples for crystallization and x-ray diffraction, including: obtaining a crystallization device made of single crystal quartz, silicon or sapphire; loading a solution containing biological molecules onto the crystal support device; maintaining the solution in a crystal growth environment to grow crystals of the biological molecules; removing the crystal support device carrying the crystals from the crystal growth environment; exposing the crystals carried on the crystal support device to an X-ray beam; and recording X-ray diffracted by the biological crystals.

Abstract: The present invention consists of an x-ray goniometer which is positioned directly adjacent to processing machines used in the cutting, milling, drilling and shaping of crystal boules and crystal ingots, used in conjunction with an adjustable tilt platform capable of pitch, yaw and roll movement, to allow in-situ measurement and automatic adjustment of crystal orientation with respect to the processing machine. The goniometer may be secured to either the tool itself or a portion of the machine which is adjacent the piece to be worked. Various embodiments include an x-ray goniometer and adjustable tilt platform incorporated into a core drilling machine, wire saw, surface grinder, polishing apparatus, or orientation flat or notch grinder.

Abstract: The invention includes an x-ray goniometer positionable directly adjacent to processing machines used in the cutting, milling, drilling and shaping of crystal boules and crystal ingots, used in conjunction with an adjustable tilt platform capable of pitch, yaw and roll movement, allowing in-situ measurement and automatic adjustment of crystal orientation with respect to the processing machine. The goniometer may be secured to the tool or a portion of the machine which is adjacent the piece to be worked. Various embodiments include an x-ray goniometer and adjustable tilt platform incorporated into a core drilling machine, saw, surface grinder, polishing apparatus, or orientation flat or notch grinder. Incorporating an x-ray goniometer and adjustable tilt platform directly into a crystal processing machine results in a decrease in overall processing time and labor, and a significant increase in precision when processing crystal ingots into a final product, such as a notched wafer.

Abstract: An X-ray multiple spectroscopic analyzer includes an X-ray source, an optical system inputting X-rays to a single-crystal sample, a sample stage supporting the single-crystal sample, an X-ray diffraction detector, a rotation driving system that changes the angle of the X-ray diffraction detector, an X-ray diffraction measurement data storage unit, a structural analysis data analyzing unit, an energy-dispersive X-ray fluorescence detector, an X-ray fluorescence measurement data storage unit, an X-ray fluorescence analyzing unit, an X-ray fluorescence analysis data storage unit, and X-ray fluorescence analysis data acquiring unit. The structural analysis data analyzing unit analyzes the data of the crystal structure further on the basis of the analysis data of the fluorescent X-rays output from the X-ray fluorescence analysis data acquiring unit.

Abstract: In an X-ray detector operating in a rolling shutter read out mode, by precisely synchronizing sample rotation with the detector readout, the effects of timing skew on the image intensities and angular positions caused by the rolling shutter read out can be compensated by interpolation or calculation, thus allowing the data to be accurately integrated with conventional software. In one embodiment, the reflection intensities are interpolated with respect to time to recreate data that is synchronized to a predetermined time. This interpolated data can then be processed by any conventional integration routine to generate a 3D model of the sample. In another embodiment a 3D integration routine is specially adapted to allow the time-skewed data to be processed directly and generate a 3D model of the sample.

Abstract: A method for analyzing a sample by diffractometry and a diffractometer, where the diffractometer includes a collimated source, a detection collimator, and a spectrometric detector, the detection axis of the detector and the collimator form a diffraction angle with the central axis of an incident beam and an energy spectrum is established for each pixel of the detector. and The measured spectra are readjusted by a change in variable that takes into account the energy of the scattered radiation and the angle of observation. measured The spectra are combined and a check is made on the implementation of at least one multi-material criterion representative of the presence of a plurality of layers of materials and groups of pixels are formed according to the results of this check, where each group corresponds to a single layer of material and the measured spectra obtained for the pixels of the group are combined.

Abstract: Disclosed herein is a method of servicing a wellbore comprising the steps of preparing a dry cement blend comprising a base cement and a crystalline component wherein the dry cement blend is based on an initial dry cement blend formulation, obtaining a diffraction pattern of a sample of the dry cement blend, generating a model diffraction pattern, refining the model diffraction pattern using a structural refinement method, determining the type and amount crystalline components present in the dry cement blend, generating a final dry cement blend formulation, and comparing the initial dry cement blend formulation to the final dry cement blend formulation.

Abstract: An X-ray diffraction method of mapping grain structures in a polycrystalline material sample, where an X-ray detector detects spots or line-shaped segments from beams diffracted from at least some of the grains. A processing device analyses values received from the X-ray detector and identifies at least the position of the spots or line-shaped segments. The processing device discretizes an initial three-dimensional model of the polycrystalline material sample into voxels and reconstructs the grains in the model by iterative testing associating crystallographic orientations of the voxels to the detected spots or line-shaped segments.

Abstract: According to aspects of the present disclosure, features of interest in materials are analyzed. The method comprises capturing a morphology of the feature of interest on a surface or an interior of a material under evaluation. The method also comprises selecting targeted spatial locations on the surface or the interior of the material under evaluation based upon the captured morphology. Also, the method comprises capturing information about the local state (e.g., crystallographic orientation) of the surface or the interior of the sample at the selected targeted spatial locations. Still further, the method comprises using the captured local state information to fill in the non-targeted spatial locations in the material corresponding to the captured morphology and or topology.

Abstract: An X-ray diffraction method of mapping grain structures in a polycrystalline material sample, where an X-ray detector detects substantially line-shaped segments from beams diffracted from at least some of the grains. A processing device analyses values received from the X-ray detector and identifies at least the position and the length of the line-shaped segments. The line-shaped segments are paired as originating from diffractions from the same grain and the positions of the paired line-shaped segments are used in determining the crystallographic grain position of this grain within in the polycrystalline material sample. The length of the paired line-shaped segments is used in determining a width of this grain.

Abstract: Embodiments of the disclosure relate to X-ray imaging systems. In one embodiment, the X-ray imaging system features a target configured to receive a focused electron beam from an electron emitter and emit a line source X-ray beam as a result of receiving the focused electron beam; and a monochromator crystal configured to receive the line source X-ray beam from the target and diffract only a portion of the X-rays, wherein the portion of X-rays satisfies the Bragg diffraction condition for the monochromator crystal, and wherein the monochromator crystal is oriented relative to the target such that the portion of the X-rays from the target that satisfy the Bragg condition illuminate an entire length of a surface of the monochromator crystal.

Abstract: A method for analysis includes directing a converging beam of X-rays toward a surface of a sample having an epitaxial layer formed thereon, and sensing the X-rays that are diffracted from the sample while resolving the sensed X-rays as a function of angle so as to generate a diffraction spectrum including a diffraction peak and fringes due to the epitaxial layer. A characteristic of the fringes is analyzed in order to measure a relaxation of the epitaxial layer.

Abstract: A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the sample using an X-ray detector. The X-ray generation source is composed of several metals of different atomic number, respective metals generating several characteristic X-rays of different wavelengths. An X-ray detector is composed of several pixels for receiving X-rays and outputting pulse signals corresponding to X-ray wavelengths. Pixels are respectively furnished with classification circuits. The classification circuits classify and output pixel output signals based on each of characteristic X-ray wavelengths. X-ray intensity is detected on a per-wavelength basis in individual pixels 12. Measurement data based on different wavelength X-rays are acquired simultaneously in just one measurement.

Abstract: The present invention relates to a micro-gripper comprising tweezers, designed to be used for the harvesting of fragile sub-millimeter samples from their production or storage medium. The tweezers may be equipped with removable soft ending elements to prevent the deterioration of the sample. When coupled to a robotic arm, this micro-gripper allows automated flow of operations in a continuous and automated process, from harvesting to sample preparation and analysis. The present invention is particularly used in X-ray crystallography.

Abstract: Plate-like samples each having as a principal plane thereof a cross section perpendicular to the long axis direction of a polycrystalline silicon rod grown by the deposition using a chemical vapor deposition method are sampled; an X-ray diffraction measurement is performed omnidirectionally in the plane of each of the plate-like samples thus sampled; and when none of the plate-like samples has any X-ray diffraction peak with a diffraction intensity deviating from the average value ±2×standard deviation (?±2?) found for any one of the Miller indices <111>, <220>, <311> and <400>, the polycrystalline silicon rod is selected as the raw material for use in the production of single-crystalline silicon. The use of such a polycrystalline silicon raw material suppresses the local occurrence of the portions remaining unmelted, and can contribute to the stable production of single-crystalline silicon.

Abstract: Embodiments of methods and systems for inspecting a structure for a crystallographic imperfection are provided. In the method, an X-ray wavelength that is particularly susceptible to diffraction by the crystallographic imperfection is identified. Then an X-ray source is provided to emit X-rays in the identified X-ray wavelength. While placing the structure at a sequence of positions relative to the X-ray source, X-rays are directed at the structure in multiple, non-parallel arrays to create sequential patterns of diffracted X-rays. The patterns of diffracted X-rays are digitally captured and communicated to a computer that compares them to locate the crystallographic imperfection. For a surface imperfection, the imperfection may be marked with a target to allow for physical removal.

Abstract: An incident X-ray is emitted in a wide angular sector toward an amorphous material specimen which backscatters the X-rays. The method comprises: a step of recording experimental photon intensity measurements as a function of the angle of incidence; a step of correcting the experimental intensity, taking into account at least the absorption phenomena inside the specimen dependent on the penetration length l of the incident wave inside the specimen before reflection; a normalization step referring the corrected intensity arising from the experimental intensity to an electron intensity according to a normalization coefficient (?); a step of calculating a discretized function Q.

Abstract: The methods of the invention determine the unit cell parameters of a crystalline solid form using diffraction data and applying an algorithm. Using the algorithm, the unit cell parameters may be determined, which may allow one to distinguish between different crystalline solid forms of a substance.

Abstract: A goniometer base for X-ray crystallography comprises a magnetic steel part with a cylindrical hole, a compliant cylindrical part that is inserted into this hole, and a cylindrical tube that is press-fit into the hole and holds the compliant part in place, such that when a crystal mounting tool is inserted through the concentric holes in each part, it is positively gripped and held in place at both T=300 K and T=100 K.

Abstract: Methods and apparatus are provided for performing back-reflection energy-dispersive X-ray diffraction (XRD). This exhibits extremely low sensitivity to the morphology of the sample under investigation. As a consequence of this insensitivity, unprepared samples can be analyzed using this method. For example, in a geological context, whole rock samples become amenable to analysis. Modifications of the technique are described to suppress fluorescence signals that would otherwise obscure the diffraction signals.

Abstract: An area detector used in a two-dimensional system is used as a point detector in Bragg-Brentano and other geometries by providing the area detector with a mask the limits the area through which X-rays can enter the detector. Secondary X-ray optics and a monochromator that are part of the diffractometer geometry are attached to the area detector mask to allow a fast and easy switch between the two-dimensional detector mode and the point detector mode. A concave detector mask is used with a spherical detector in order to reduce the secondary beam path and increase detector efficiency and the opening in the detector mask can be offset from the mask center to achieve high 2? angle measurements. Single channel bypath electronics are used to disregard the dimensional position of each X-ray count to increase the efficiency and speed of the system.

Abstract: A method for producing a capsule for protein crystallization is provided. The method comprises adding a solution containing a protein and a gelling agent to an ionic cross-linking solution to form an ionically cross-linked gel capsule that encapsulates a solution of the protein.

Abstract: A radiation detecting apparatus includes a collimator and a detector, the collimator having a material for blocking radiation and a region that is a sector of an annulus or multiple regions in a configuration in the shape of a sector of an annulus for allowing transmission of the radiation. The detector is spaced a distance from the collimator such that when a radiation source and sample crystal material are positioned at suitable positions, the radiation is collimated by the collimator and contacts the sample a predetermined distance from the detector at multiple of locations corresponding to the region or regions of the collimator. The Bragg diffracted radiation from the crystal material at two or more and preferably all of the locations overlap at the detector.

Abstract: An X-ray diffraction contrast tomography system (DCT) comprising a laboratory X-ray source (2), a staging device (5) rotating a polycrystalline material sample in the direct path of the X-ray beam, a first X-ray detector (6) detecting the direct X-ray beam being transmitted through the crystalline material sample, a second X-ray detector (7) positioned between the staging device and the first X-ray detector for detecting diffracted X-ray beams, and a processing device (15) for analysing detected values. The crystallographic grain orientation of the individual grain in the polycrystalline sample is determined based on the two-dimensional position of extinction spots and the associated angular position of the sample for a set of extinction spots pertaining to the individual grain.

Abstract: A method for analysis includes directing a converging beam of X-rays toward a surface of a sample having multiple single-crystal layers, including at least a first layer and a second layer that is formed over and tilted relative to the first layer. The X-rays that are diffracted from each of the first and second layers are sensed simultaneously while resolving the sensed X-rays as a function of angle so as to generate a diffraction spectrum including at least a first diffraction peak due to the first layer and a second diffraction peak due to the second layer. The diffraction spectrum is analyzed so as to identify a characteristic of at least the second layer.

Abstract: An X-ray diffraction contrast tomography system (DCT) comprising a laboratory X-ray source (2), a staging device (5) rotating a polycrystalline material sample in the direct path of the X-ray beam, a first X-ray detector (6) detecting the direct X-ray beam being transmitted through the crystalline material sample, a second X-ray detector (7) positioned between the staging device and the first X-ray detector for detecting diffracted X-ray beams, and a processing device (15) for analysing detected values. The crystallographic grain orientation of the individual grain in the polycrystalline sample is determined based on the two-dimensional position of extinction spots and the associated angular position of the sample for a set of extinction spots pertaining to the individual grain.

Abstract: The invention includes an x-ray goniometer positionable directly adjacent to processing machines used in the cutting, milling, drilling and shaping of crystal boules and crystal ingots, used in conjunction with an adjustable tilt platform capable of pitch, yaw and roll movement, allowing in-situ measurement and automatic adjustment of crystal orientation with respect to the processing machine. The goniometer may be secured to the tool or a portion of the machine which is adjacent the piece to be worked. Various embodiments include an x-ray goniometer and adjustable tilt platform incorporated into a core drilling machine, saw, surface grinder, polishing apparatus, or orientation flat or notch grinder. Incorporating an x-ray goniometer and adjustable tilt platform directly into a crystal processing machine results in a decrease in overall processing time and labor, and a significant increase in precision when processing crystal ingots into a final product, such as a notched wafer.

Abstract: Provided are methods of screening to identify molecules capable of binding to CD4 and capable of activating CD4+CD25+ regulatory T cells. Further provided are antibodies and antibody fragments capable of activating CD4+CD25+ regulatory T cells and methods and uses involving the antibodies and fragments thereof.

Abstract: Embodiments of methods and systems for inspecting a structure for a crystallographic imperfection are provided. In the method, an X-ray wavelength that is particularly susceptible to diffraction by the crystallographic imperfection is identified. Then an X-ray source is provided to emit X-rays in the identified X-ray wavelength. While placing the structure at a sequence of positions relative to the X-ray source, X-rays are directed at the structure in multiple, non-parallel arrays to create sequential patterns of diffracted X-rays. The patterns of diffracted X-rays are digitally captured and communicated to a computer that compares them to locate the crystallographic imperfection. For a surface imperfection, the imperfection may be marked with a target to allow for physical removal.

Abstract: A method for analysis includes directing a converging beam of X-rays toward a surface of a sample having an epitaxial layer formed thereon, and sensing the X-rays that are diffracted from the sample while resolving the sensed X-rays as a function of angle so as to generate a diffraction spectrum including a diffraction peak and fringes due to the epitaxial layer. A characteristic of the fringes is analyzed in order to measure a relaxation of the epitaxial layer.