Abstract: There are provided methods and systems for making or repairing a specified part. For example, there is provided a method for creating a manufacturing process to make or repair the specified part. The method includes receiving data from a plurality of sources, the data including as-designed, as-manufactured, as-simulated, as-operated, as-inspected, and as-tested data relative to one or more parts similar to the specified part. The method includes updating, in real time, a surrogate model corresponding with a physics-based model of the specified part, wherein the surrogate model forms a digital twin of the specified part. The method includes generating a multi-variant distribution including component performance and manufacturing variance, the manufacturing variance being associated with at least one of an additive manufacturing process step and a reductive manufacturing process step.

Abstract: A field-of-view at a first modeled target location of a first target disposed on a specimen can be configured, which can include moving the stage relative to the detector. The first modeled target location is determined by summing a first design target location and a navigational error provided by an online model. A first image of the field-of-view is grabbed using the detector. The field-of-view at a second modeled target location of a second target disposed on the specimen is configured. Concurrent with configuring the field-of-view at the second modeled target location, using a processor, the position of a first actual target location is determined using the first image. The online model is updated with a difference between the first design target location and the first actual target location.

Abstract: A production control system (1) having an arrangement of manufacturer-specific modules, comprising modules for controlling production units, modules for controlling logistics units and/or modules for providing and/or processing product data (6). Proprietary data models of manufacturer-specific modules are linked via at least one ontology unit.

Abstract: The present disclosure generally relates to additive manufacturing or printing of an object using parallel processing of files comprising 3D models of the object and/or portions thereof. A master file comprising a 3D model of the object is divided into subordinate files, wherein each subordinate file comprises a 3D model of a corresponding portion of the object. Each subordinate file is processed in parallel, controlling at least a first laser source to fabricate each portion from a build material. Parallel processing according to the methods of the present disclosure expedites additive manufacturing or printing over conventional methods that build an object in layers completed in series.

Abstract: Provided are systems and methods for identifying manufacturability improvements to a component prior to the design being provided to a manufacturer. In one example, the method may include receiving an image including a geometric design of a component, receiving an identification of a type of manufacturing process for the component from among a plurality of types of manufacturing processes, recognizing a geometric feature of the component from the image based on the type of manufacturing process, determining a modification to one or more of a size, a shape, and a location of the recognized geometric feature for reducing manufacturing complexity, and displaying, via a user interface, a suggestion for modifying the geometric design of the component based on the determined modification of the recognized geometric feature.

Abstract: An information processing apparatus includes a first drawing information acquiring unit that acquires first drawing information used for design, a second drawing information identifying unit that identifies second drawing information associated with the first drawing information, a basic policy information acquiring unit that acquires basic policy information associated with the second drawing information, the basic policy information representing a basic policy for at least one of design and production, and an output unit that, in response to acquisition of information instructing that a design change be made to the first drawing information, outputs a basic policy corresponding to the design change from the basic policy information.

Abstract: A design method of a semiconductor manufacturing apparatus which can satisfy a specification required by a user is disclosed. The design method of the semiconductor manufacturing apparatus includes creating a program setting file; creating a program installer from the program setting file; operating a processing unit of the semiconductor manufacturing apparatus; specifying a sensor corresponding to the processing unit based on the operation of the processing unit; creating a sensor setting file storing information obtained by specifying the sensor; comparing a content of a requirement specification and a content of the sensor setting file to confirm a consistency between the content of the requirement specification and the content of the sensor setting file; and introducing a program into a memory of a controller by the program installer when the content of the requirement specification and the content of the sensor setting file are consistent with each other.

Abstract: A control system for updating a context-driven build plan for production of a physical vehicle. The control system includes a design engineering database, a manufacturing database, and a production database all having pluralities of digital data objects. A criterion module is configured to assign a context criterion to any of the digital data objects. The criterion module assigns the context criterion to a particular digital data object based on properties and/or rules associated with a particular digital data object. A user interface receives an input of a requested change. A mapping module configured to establish a mapping between the particular design digital data object and any other digital data objects. An authority approves the requested change. A change module updates the context-driven build plan with a digital change request. Accordingly, an updated build plan is generated.

Abstract: A system for generating and implementing programmed defects includes a lithography tool configured to form a multi-pattern structure including a first array pattern and a second array pattern on a sample. The first array pattern or the second array pattern contains a programmed defect to differentiate the first array pattern from the second array pattern. The system includes a metrology tool configured to acquire one or more images of the first array pattern and the second array pattern having a field-of-view containing the programmed defect. The system includes a controller including one or more processors. The one or more processors are configured to receive the images of the first array pattern and the second array pattern from the metrology, and determine a metrology parameter associated with the first array pattern or the second array pattern.

Abstract: A measurement method comprising using multiple radiation poles to illuminate a diffraction grating on a mask at a mask side of a projection system of a lithographic apparatus, coupling at least two different resulting diffraction orders per illumination pole through the projection system, using the projection system to project the diffraction orders onto a grating on a wafer such that a pair of combination diffraction orders is formed by diffraction of the diffraction orders, coupling the combination diffraction orders back through the projection system to detectors configured to measure the intensity of the combination diffraction orders, and using the measured intensity of the combination diffraction orders to measure the position of the wafer grating.

Abstract: A method for performing DBO measurements utilizing apertures having a single pole includes using a first aperture plate to measure X-axis diffraction of a composite grating. In some embodiments, the first aperture plate has a first pair of radiation-transmitting regions disposed along a first diametrical axis and on opposite sides of an optical axis that is aligned with a center of the first aperture plate. Thereafter, in some embodiments, a second aperture plate, which is complementary to the first aperture plate, is used to measure Y-axis diffraction of the composite grating. By way of example, the second aperture plate has a second pair of radiation-transmitting regions disposed along a second diametrical axis and on opposite sides of the optical axis. In some cases, the second diametrical axis is substantially perpendicular to the first diametrical axis.

Abstract: A tree search-based scheduling method and an electronic apparatus are provided. In the method, multiple order lists are received and a schedule is initialized, wherein each order list includes multiple production operations. In each order list, a first production operation which has not been joined into the schedule yet is selected, such that multiple prior operations are selected. An execution priority of the prior operations is calculated according to multiple dispatching rules, and multiple candidate operations are selected from the prior operations according to the execution priority. Afterwards, the candidate operations are listed as a next operation of the schedule respectively, and a scheduling simulation is performed according to the dispatching rules to obtain multiple scheduling indicators of the candidate operations. Scheduling is performed according to the scheduling indicators.

Abstract: Wafer geometry measurement tools and methods for providing improved wafer geometry measurements are disclosed. Wafer front side, backside and flatness measurements are taken into consideration for semiconductor process control. The measurement tools and methods in accordance with embodiments of the present disclosure are suitable for handling any types of wafers, including patterned wafers, without the shortcomings of conventional metrology systems.

Abstract: In one embodiment, a system automatically generates a retrofit device based on a three-dimensional (3D) model of a legacy device. In operation, a physical design engine generates component instances based on legacy interface instances included in the legacy device. The physical design engine then generates an enclosure model that specifies an enclosure that houses the component instances. The physical design engine also generates computer code that is associated with a programmable instance as well as relatively simple assembly instructions for assembling a retrofit device that includes the enclosure, the legacy device, the component instances, and the programmable instance. Notably an user may configure an automated fabrication tool to generate the enclosure. Consequently, the system provides an automated design process for retrofitting legacy devices that does not rely on the user possessing any significant technical expertise.

Abstract: Methods of intelligent routing of work assignment includes indexing plurality of pending tasks and indexing a plurality of available employees. A first employee is retrieved from an index of available employees. A next available task assignable to the first employee is determined. A work item from the next available task is assigned to the first employee from the available employee list. The assigned work item is removed from pending task list. The first employee is removed from the available employee list. The next employee is retrieved from the index of available employees.

Abstract: A method for improving a lithographic process for imaging a portion of a design layout onto a substrate using a lithographic apparatus, the method including: obtaining a first source of the lithographic apparatus; classifying the first source into a class among a plurality of possible classes, based on one or more numerical characteristics of the first source, using a machine learning model, by a computer; determining whether the class is among one or more predetermined classes; only when the class is among the one or more predetermined classes, adjusting one or more source design variables to obtain a second source.

Abstract: A manufacturing action is performed on a first part or first component involved in a manufacturing process. The manufacturing action is directed by computer software that is stored in a memory and executed by a processor. The first part or first component is examined to determine results of the manufacturing action. Based upon the results, a structure of the computer software is selectively changed to optimize the results. Subsequently the manufacturing action is performed on a second part or second component. The manufacturing action is directed by the computer software having the changed structure.

Abstract: A method and system for performing closed loop simulation of a computer model of a physical system and a hardware component of the physical system is provided. An input waveform for the component from the simulated model of the physical system using an initial waveform as a response waveform of the component is generated at a simulation processor. The input waveform is sent from the simulation processor through a network to a real-time playback and record device (RTPR). The RTPR plays back the input waveform in real time to the component and receives a response waveform of the component and provides the response waveform to the simulation processor. Waveform relaxation (WR) converging methods are utilized at the simulation processor to enable convergence of the generated waveforms affected by hardware induced distortions. A WR method with the generated waveforms are performed to provide a closed loop response of the component.

Abstract: In a metrology sampling method with a sampling rate decision scheme, a mean absolute percentage error (MAPE) and a maximum absolute percentage error (MaxErr) of visual metrology values of all workpieces in a set of determinative samples (DS), and various index values that can detect various status changes of a process tool (such as maintenance operation, parts changing, parameter adjustment, etc.), and/or information abnormalities of the process tool (such as abnormal process data, parameter drift/shift, abnormal metrology data, etc.) appearing in a manufacturing process are applied to develop an automated sampling decision (ASD) scheme for reducing a workpiece sampling rate while VM accuracy is still sustained.

Abstract: A fast branch-based hybrid Bill of Materials (BOM) system and method is provided that generates a BOM having a plurality of BOM lines that specify component revisions of components stored in a data store that are usable to build a structure. The BOM lines may be configured via at least one baseline branch and at least one live branch that instantiate component revisions for the structure. The system retrieves at high speed BOM lines for the BOM for components having revisions that are not associated with the at least one live branch from at least one index (i.e., cache) of BOM lines generated based on the baseline branch. The system also configures BOM lines for the BOM for components having revisions associated with the at least one live branch via at least one configuration rule. The system also causes a display device to output a list of component revisions based at least in part on the generated BOM.

Abstract: A manufacturing process management (MPM) computer device is provided. The MPM computer device includes a processor and at least one memory device. The processor is in communication with the at least one memory device. The MPM computer device is configured to receive a first engineering design for a first configuration of a product to be assembled including a plurality of features, determine a plurality of parts associated with the plurality of features based on the received engineering design, and prior to completion of a manufacturing process plan, generate a manufacturing bill of materials based on the determined plurality of parts.

Abstract: Methods and systems for sharing information related to operational metrics of a plurality of equipment used in manufacturing of semiconductor wafer includes interfacing a server with the equipment to allow the server to receive a plurality of parameters including operational metrics associated with operation of each of the plurality of equipment. The plurality of parameters are processed to identify event-related data, message-related data and to generate human-readable interpretation for the identified event-related data and the message related data. Users are identified for receiving the operational metrics of each of the plurality of equipment. The event-related data, message-related data and the corresponding human-readable interpretation for the operational metrics associated with each of the equipment are forwarded to a social network service for performing a posting operation to social data streams associated with the identified users.

Abstract: A system for automating the assembly, processing and delivery of documents includes a plurality of transport clients, a work queue, a scheduler, a plurality of rendering objects, a plurality of transport objects and a routing table. The transport clients are each responsible for acquisition of data necessary to generate the response. Once a work item is received from a transport client, it is added to the work queue. The scheduler manages the work queue including sending work items to an identified rendering object and thereafter to a transport client. Each of the rendering objects includes knowledge of the database as well as processes for extracting information from a database and applying rules on the extracted data. The scheduler assigns work items to be processed by the rendering objects, and once completed, the work items are returned to the scheduler for further processing by a transport object.

Abstract: A coating and developing treatment apparatus includes a substrate transfer mechanism; and a defect inspection section. A transfer control part controls transfer of a substrate. A defect classification part classifies a defect based on the state of the defect. A storage part stores a transfer route of the substrate by the substrate transfer mechanism when the substrate has been treated by treatment sections. A defective treatment specification part specifies, based on a kind of the defect classified by the defect classification part and the transfer route of the substrate stored in the storage part, a treatment section which is a cause of occurrence of the classified defect, and judges presence or absence of an abnormality of the specified treatment section. The transfer control part controls the substrate transfer mechanism to transfer a substrate bypassing the treatment section which has been judged to be abnormal by the defective treatment specification part.

Abstract: A method of executing a batch process in a manufacturing environment according to a product recipe, such that the product recipe specifies a plurality of actions and a plurality of parameters, includes performing at least one action of the batch process corresponding to a first version of the product recipe, receiving a second version of the product recipe, such that the second version of the product recipe is distinct from the first version of the product recipe, suspending the execution of the batch process prior to completion of the batch process, and resuming the execution of the batch process according to the second version of the product recipe.

Abstract: A novel and non-obvious method, system and apparatus for tuning order configurator performance by dynamic integration of manufacturing and field feedback information. A method for dynamically tuning order configurator behavior by using product issue data can include collecting product issue data for a manufactured product, the product issue data including performance and attribute information of a part of the manufactured product, analyzing the collected product issue data to identify a problematic part, and, modifying the order configurator using the analyzed product issue data.

Abstract: A method of making a semiconductor device includes collecting process control parameters during operation of a processing tool processing a product. The method further includes calculating a processing tool offset for the processing tool based on the collected process control parameters and calculating a product offset based on the collected process control parameters. The method further includes determining whether the product offset is stable and calculating an offset time for processing the product using the processing tool based on the calculated processing tool offset if the product offset is stable.

Abstract: A fulfillment test of a computing system having components is performed within a build-to-order test phase. Responsive to the fulfillment test failing, the component that most contributed to the fulfillment test failing is replaced, regardless of whether the given component was determined to be suspect or marginally defective pursuant to a fabrication test previously performed within a build-to-plan test phase. Any other component of that contributed to the fulfillment test failing and that was determined to be suspect or marginally defective pursuant to the fabrication test previously performed within the build-to-plan test phase is also replaced.

Abstract: The disclosure describes a method for cutting a food product into slices for producing portions by taking into account the target weight thereof. Information about a remainder of the food product to be sliced is used to control corresponding actuators for a successive food product to be sliced.

Abstract: Correction values (?X1 to ?X4) at the X position (X=xe) of a target point (E (xe, ye)) are calculated by calculating the amounts of shift (?X) in the positions of alignment marks (M11 to M14, M21 to M24, M31 to M34, M41 to M44) in the X direction and plotting first spline curves (SL1) using the amounts of shift. Then, a first sub-spline curve (SL1S) is plotted using the correction values (?X1 to ?X4) in order to calculate a correction value (?Xe) at the Y position (Y=ye) of the target point (E (xe, ye)), and the calculated correction value is taken as the correction amount in the X direction. The correction amount in the Y direction is also calculated in the same manner.

Abstract: System, method and computer program product for configuring and controlling a facility to perform a manufacturing process and updating a tool controlling the process according to a model employed for mapping calculated coefficients that characterize non-linear variations observed of a product to actual control parameters governing the processes/tools used by the facility during the manufacturing process. The method enables real-time control of variation in an exposure step of a patterning process using an exposure tool to minimize a nonlinear variation in one or more pattern attributes by adjusting the exposure tool or the patterning process corresponding to the calculated coefficients. In the method, measurements of product attributes, obtained by finite sampling over a well defined domain, are projected onto a predefined reference mesh spanning the domain, using a physically based model comprised of functions constructed to be orthogonal and normalized over a discrete set of reference mesh locations.

Abstract: A method for operating a production plant having a plurality of work stations to carry out at least one respective work step by a control system allocated to the production plant involves a control system assigning human workers or robots to work stations according to at least one criterion relating to a production requirement, wherein each worker or robot can be assigned to one or several work stations.

Abstract: Disclosed are embodiments of an improved design method, the results of which are a final design structure for an integrated circuit that incorporates, not only layout information, but also client-specific manufacturing information (e.g., import/export information, service requests, processing directives, purchase order requirements, design rule information, etc.) in the same data format in hierarchical form. Also disclosed are embodiments of a manufacturing control method and system. In these embodiments, a final design structure, such as that described above, is received at tape-in. The information contained therein (particularly, the client-specific manufacturing information) is sorted by type and then forwarded to the appropriate tools within the manufacturing facility for processing.

Abstract: The unique advantages of computer-controlled fabrication of a patient-specific orthotic device using an automated fabrication machine capable of following computer instructions to create 3D surface contours and new developments in non-invasive three-dimensional (3D) scanning have made it possible to acquire digital models of freeform surfaces such as the surface anatomy of the human body and to then fabricate such a patient-specific device with high precision. Such a patient-specific device brings significant improvement in patient-specific fit, comfort, and function of medical devices (and, in particular, to orthoses that require a close fit to the wearer's body to act effectively). The combination of these two technologies is ideally suited for the development of patient-specific orthotic devices. A patient specific ankle-foot orthotic device using this technology is disclosed. This exemplary device is used to help stabilize the ankle-foot region, for example, in patients with impaired gait.

Abstract: A method of calculating an overlay correction model in a unit for the fabrication of a wafer is disclosed. The method comprises measuring overlay deviations of a subset of first overlay marks and second overlay marks by determining the differences between the subset of first overlay marks generated in the first layer and corresponding ones of the subset of second overlay marks generated in the second layer.

Abstract: A design-based manufacturing optimization (DMO) server comprises a distributed computing system and a DMO software module incorporating with a design scanner to scan and analyze design data of a semiconductor device for optimizing manufacturing of the semiconductor device. The DMO software module sets up a pattern signature database and a manufacturing optimization database, generates design-based manufacturing recipes, interfaces with manufacturing equipment through a manufacturing interface module, and interfaces with electronic design automation suppliers for the design data through a design interface module. The DMO server executes the design-based manufacturing recipes for manufacturing optimization.

Abstract: A design support system and a method of generating and using a customisable analysis report comprising functional safety data for an electronic component, such as microcontroller, are described.

Abstract: A computer-implemented method of generating reference spectra includes polishing a plurality of set-up substrates, the plurality of set-up substrates comprising at least three set-up substrates, measuring a sequence of spectra from each of the plurality of set-up substrates during polishing with an in-situ optical monitoring system to provide a plurality of sequences of spectra, generating a plurality of sequences of potential reference spectra from the plurality of sequences of spectra, determining which sequence of potential reference spectra of the plurality of sequences provides a best match to remaining sequences of the plurality of sequences, and storing the sequence of potential reference spectra determined to provide the best match as reference spectra, and selecting and storing the sequence of potential reference spectra.

Abstract: Methods and systems for interfacing computer modeled design and manufacture data from an Manufacturing Process Planning (MPP) system to a Manufacturing Execution System (MES) and allowing, via an integration server interface, electronic work instructions of the MPP system to be revised promptly and efficiently in mid-production manufacturing processes.

Abstract: A method for manufacturing an apparatus with a flow passage includes providing a preform apparatus with a preform flow passage. Flow area of the preform flow passage is determined to provide determined flow area data. The determined flow area data is compared to reference flow area data to provide flow area comparison data. The preform apparatus is chemical milled based on the flow area comparison data.

Abstract: One aspect related to design of systems and methods for manufacture of products is configuration. More particularly, this relates to verification of an existing configuration and to reconfiguration of a product following manufacturing. The present invention contemplates an approach to designing a station capable of configuration verification and reconfiguration and of preventing shipment of a product if an undesirable configuration is detected. A preferred approach also includes guiding the operator to take possible remedial action. The preferred approach further includes storing various types of data needed for the verification and reconfiguration in a server, thereby making such data substantially instantly accessible for verification and reconfiguration purposes. Such data preferably includes software capable of adapting the functions of the station itself, i.e., the tasks to be performed at the configuration verification and reconfiguration station.

Abstract: A system for evaluating a manufacturability of a casting design. The system includes at least one of a geometry analyzer, a casting evaluation tool, a residual stress evaluation tool, and a machining evaluation tool. The geometry analyzer analyzes a geometric design of the casting design to determine its geometric design-ability, the casting evaluation tool evaluates the casting design to determine its cast-ability, the residual stress evaluation tool evaluates the casting design to determine its heat treat-ability, and the machining evaluation tool evaluates the casting design to determine a machine-ability of the casting design. If the casting design is determined as not geometrically design-able, not cast-able, not heat treat-able, or not machine-able by the geometry analyzer, the casting evaluation tool, the residual stress evaluation tool, or the machining evaluation tool, respectively, then modifications to the casting design are recommended to optimize the casting design for manufacturing.

Abstract: A method to enable wafer result prediction includes collecting manufacturing data from various semiconductor manufacturing tools and metrology tools; choosing key parameters using an autokey method based on the manufacturing data; building a virtual metrology based on the key parameters; and predicting wafer results using the virtual metrology.

Abstract: A position control apparatus includes a detecting unit configured to detect a position of a control target, a subtracting unit configured to subtract an output of the detecting unit from a target value, an iterative learning control circuit including a filter into which a deviation between the output of the detecting unit and the target value is input, where the iterative learning control circuit feeds forward a control input to the control target, and a parameter computing unit configured to compute a variation in a parameter of the control target. A characteristic of the filter is changed in accordance with the variation in the parameter of the control target.

Abstract: A variety of techniques are disclosed for visual and functional augmentation of a three-dimensional printer.

Abstract: System, method and computer program product for configuring and controlling a facility to perform a manufacturing process and updating a tool controlling the process according to a model employed for mapping calculated coefficients that characterize non-linear variations observed of a product to actual control parameters governing the processes/tools used by the facility during the manufacturing process. The method enables real-time control of variation in an exposure step of a patterning process using an exposure tool to minimize a nonlinear variation in one or more pattern attributes by adjusting the exposure tool or the patterning process corresponding to the calculated coefficients. In the method, measurements of product attributes, obtained by finite sampling over a well defined domain, are projected onto a predefined reference mesh spanning the domain, using a physically based model comprised of functions constructed to be orthogonal and normalized over a discrete set of reference mesh locations.

Abstract: A computer implemented method, system, and/or computer program product assigns work to a software factory for implementing a project. A project model of a project is generated. Project model subcomponents are mapped to work packets that are available to a software factory, thus leading to the generation of a work plan for performing the project via an execution of the available work packets.

Abstract: A computer implemented method for evaluating quality control data of a product manufactured by a partially automated manufacturing process. In the method, a database is generated which includes design specifications for the product. Manufacturing data generated from inspection of the product at each stage of the partially automated process is then received. The manufacturing data is then compared with the design specifications to determine whether the manufacturing data meets the design specifications. In one embodiment, the product is an induction coil used in electric motors.

Abstract: The present disclosure discloses a supply chain management system that can estimate manufactured item delivery times at a facility, manufactured item costs or prices, and dynamically control supply chain performance.

Abstract: A method, apparatus, and computer program product for simulating mobile platforms. In one advantageous embodiment, a method is used to performing operations with a virtual aircraft network. A data processing system with the virtual aircraft network is connected to a ground network. The operations are performed with the virtual aircraft network connected to the ground network.